Test DUT plate based on turret type sorting machine

Abstract

The utility model discloses a testing device under test (DUT) board based on a turret-type sorting machine in the technical field of semiconductor testing, and aims to solve the problems that in the prior art, a testing DUT board is usually connected with a testing piece in a wired mode, so that a testing item is easy to be unstable, and the testing precision is poor. The testing device comprises a PCB, a testing piece is arranged on one side of the front face of the PCB, the testing piece is connected with the PCB through a contact point, a relay is arranged on the other side of the front face of the PCB, pin header holes are formed in the portion, between the testing piece and the relay, of the front face of the PCB, a socket is arranged on the portion, on one side of the relay, of the front face of the PCB, and a plurality of reserved holes used for containing electronic elements are formed in the front face of the PCB. According to the utility model, the test piece and the electronic component are integrated on the PCB, so that the use of connecting wires and adapters is reduced, the impedance in the test process is effectively reduced, the test precision and the test stability are improved, and further, the relay is placed on the PCB, the patch cord is reduced, and the test stability is improved.

Description

Technical Field

[0001] The utility model relates to a test DUT board based on a turret type sorting machine, belonging to the technical field of semiconductor testing. Background Art

[0002] With the development of semiconductors and the advancement of technology, more and more new technologies and equipment are being delivered and put into use. Efficiency development is becoming more and more important, and the use of SOP products is increasing. Therefore, it is particularly important to improve efficiency and test stability. Previously, gravity sorters were used. This equipment has low efficiency and the need to add adapters between the test DUT board and the test piece seriously affects the test stability. In order to solve the problems of gravity sorters, equipment manufacturers have introduced turret sorters. The UPH of this type of equipment is greatly improved compared to gravity sorters.

[0003] The test DUT board in the prior art is usually connected to the test piece by wire connection, which makes the test items unstable and the test accuracy poor, affecting the working effect of the device. Utility Model Content

[0004] The purpose of the utility model is to overcome the deficiencies in the prior art and provide a test DUT board based on a turret sorter to solve the problem that the test DUT board in the prior art is usually connected to the test piece by wire, which makes the test items unstable and the test accuracy poor.

[0005] In order to solve the above technical problems, the utility model is implemented by adopting the following technical solutions:

[0006] The utility model provides a test DUT board based on a turret sorter, comprising a PCB board, a test piece is provided on one side of the front of the PCB board, the test piece is connected to the PCB board through a contact point, a relay is provided on the other side of the front of the PCB board, a row of pin holes is provided on the front of the PCB board between the test piece and the relay, a socket is provided on the front of the PCB board on one side of the relay, and a plurality of reserved holes for placing electronic components are opened on the front of the PCB board.

[0007] Furthermore, the number of the test pieces is two.

[0008] Furthermore, a window is provided on the front side of the PCB board between the two test pieces.

[0009] Furthermore, the contact point is used to reduce the impedance between the test piece and the PCB board.

[0010] Furthermore, a plurality of positioning holes are provided on the front side of the PCB board at one side of the test piece.

[0011] Furthermore, a reserved hole plate is arranged on the front side of the PCB board at one side of the relay.

[0012] Furthermore, the socket is a 64-pin bull-horn socket.

[0013] Furthermore, the number of the relays is eight.

[0014] Compared with the prior art, the utility model has the following beneficial effects:

[0015] 1. The test DUT board based on the turret sorter integrates the test piece and the electronic components on the PCB board, thereby reducing the use of connecting wires and adapters, effectively reducing the impedance during the test process, and improving the test accuracy and test stability. Furthermore, the relay of the present application is placed on the PCB board, reducing the adapter wires and improving the test stability;

[0016] 2. The test DUT board based on the turret sorter is convenient for subsequent test circuit switching by setting pinholes. The pinholes can be used to transfer resources according to actual usage requirements. Combined with the fact that a plurality of reserved holes for placing electronic components are reserved on the PCB board of this application, different electronic components can be installed according to actual work requirements, thereby testing different products. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 It is a schematic diagram of the main structure of a test DUT board based on a turret type sorter provided according to an embodiment of the utility model;

[0018] Figure 2 It is a schematic diagram of the main structure of a test DUT board based on a turret sorter when no test piece is installed according to an embodiment of the utility model.

[0019] In the figure: 1. PCB board; 2. Test piece; 3. Relay; 4. Pin header hole; 5. Socket; 6. Contact point; 7. Positioning hole; 8. Reserved hole plate; 9. Reserved hole; 10. Window. DETAILED DESCRIPTION

[0020] The utility model is further described below in conjunction with the accompanying drawings. The following embodiments are only used to more clearly illustrate the technical solution of the utility model, and cannot be used to limit the protection scope of the utility model.

[0021] In the description of the present utility model, it should be understood that the terms "center", "longitudinal", "lateral", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside" and the like indicate positions or positional relationships based on the positions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present utility model and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present utility model. In addition, the terms "first", "second", etc. are only used for descriptive purposes, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Therefore, features defined as "first", "second", etc. may explicitly or implicitly include one or more of the features. In the description of the present utility model, unless otherwise specified, "multiple" means two or more.

[0022] In the description of the present invention, it should be noted that, unless otherwise clearly specified and limited, the terms "installation", "connection" and "connection" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be an indirect connection through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood by specific circumstances.

[0023] like Figure 1-2 As shown, the utility model provides a test DUT board based on a turret sorter, including a PCB board 1, a test piece 2 is provided on one side of the front of the PCB board 1, the test piece 2 is connected to the PCB board 1 through a contact point 6, a relay 3 is provided on the other side of the front of the PCB board 1, a pin hole 4 is provided on the front of the PCB board 1 between the test piece 2 and the relay 3, a socket 5 is provided on the front of the PCB board 1 on one side of the relay 3, and a plurality of reserved holes 9 for placing electronic components are opened on the front of the PCB board 1.

[0024] Specifically, the socket 5 is used to transfer the test channel of the test machine, and the pin hole 4 adopts the gold-plating process. The pin hole 4 is mainly used to transfer the test channel transferred from the test piece 2 and the test DUT board. The present application sets the pin hole 4 to facilitate the subsequent test circuit switching. According to the actual use requirements, the pin hole 4 can be used to transfer resources. In combination with the PCB board 1 of the present application, a plurality of reserved holes 9 for placing electronic components are reserved, so that the present application can install different electronic components according to actual work requirements, so as to test different products; the present application integrates the test piece 2 and the electronic components on the PCB board 1, thereby reducing the use of connecting wires and adapters, effectively reducing the impedance during the test process, and improving the test accuracy and test stability. Furthermore, the relay 3 of the present application is placed on the PCB board 1, reducing the adapter line and improving the test stability. At the same time, the power line and control line of the relay 3 have been arranged, reducing the production workload of the test DUT board and improving efficiency; in the present application, each foot on the test piece 2 can be freely connected to the channel on the test machine by welding wire.

[0025] In one embodiment, the number of the test pieces 2 is two, and a window 10 is formed on the front side of the PCB board 1 between the two test pieces 2 .

[0026] In one embodiment, the contact point 6 is used to reduce the impedance between the test piece 2 and the PCB board 1, and a gold deposition process is used.

[0027] In one embodiment, a plurality of positioning holes 7 are provided on the front side of the PCB board 1 on one side of the test piece 2. The plurality of positioning holes 7 cooperate to position the test piece 2, thereby ensuring the stability of the device structure.

[0028] In one embodiment, a reserved hole plate 8 is provided on the front side of the PCB board 1 on one side of the relay 3. When subsequent resources are insufficient, some relay transfers or other resource transfers can be added at the reserved hole plate 8 to ensure the practicability of the device.

[0029] In one embodiment, the socket 5 is a 64-pin header socket, and the number of the relays 3 is eight.

[0030] The above is only a preferred embodiment of the present invention. It should be pointed out that for ordinary technicians in this technical field, several improvements and modifications can be made without departing from the technical principles of the present invention. These improvements and modifications should also be regarded as the protection scope of the present invention.

Claims

1. A test DUT board based on a turret sorter, characterized in that: The invention comprises a PCB (1), wherein a test piece (2) is provided on one side of the front of the PCB (1), wherein the test piece (2) is connected to the PCB (1) via a contact point (6), wherein a relay (3) is provided on the other side of the front of the PCB (1), wherein a pin hole (4) is provided on the front of the PCB (1) between the test piece (2) and the relay (3), wherein a socket (5) is provided on the front of the PCB (1) on one side of the relay (3), and wherein a plurality of reserved holes (9) for placing electronic components are provided on the front of the PCB (1).

2. The test DUT board based on the turret sorter according to claim 1, characterized in that: The number of the test pieces (2) is two.

3. The test DUT board based on the turret sorter according to claim 2, characterized in that: A window (10) is provided on the front side of the PCB board (1) between the two test pieces (2).

4. The test DUT board based on the turret sorter according to claim 1, characterized in that: The contact point (6) is used to reduce the impedance between the test piece (2) and the PCB board (1).

5. The test DUT board based on the turret sorter according to claim 1, characterized in that: The front side of the PCB board (1) is provided with a plurality of positioning holes (7) on one side of the test piece (2).

6. The test DUT board based on the turret sorter according to claim 1, characterized in that: A reserved hole plate (8) is arranged on the front side of the PCB board (1) on one side of the relay (3).

7. The test DUT board based on the turret sorter according to claim 1, characterized in that: The socket (5) is a 64-pin bull-horn socket.

8. The test DUT board based on the turret sorter according to claim 1, characterized in that: The number of the relays (3) is eight.

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