Display test circuit and to-be-tested display test device
By designing the display test circuit, including data output control module, data conversion module, expansion module and power supply module, the problem that traditional test chips cannot test 8K resolution monitors is solved, and automated testing and functional verification of the test monitors are realized.
Patent Information
- Application Number
- CN202323384682.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2023-12-11
- Publication Date
- 2024-12-20
- Estimated Expiration
- 2033-12-11
AI Technical Summary
Traditional test chips cannot effectively test monitors with 8K resolution, resulting in the inability to complete functional tests of the monitors being tested.
A display testing circuit is designed, including a data output control module, a data conversion module, an expansion module and a power supply module. By receiving power on-off commands and data to be displayed, serial data is generated and transmitted to the monitor to be tested, test data is collected and Generate monitoring data to realize automated testing of the display.
The test of 8K resolution monitors is realized, which can automatically generate test results to ensure the effectiveness of the monitor's functions before leaving the factory, and is suitable for display testing of other resolutions.
Smart Images

Figure CN222213708U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of display testing, in particular to a display testing circuit and a display testing device to be tested. Background Art
[0002] With the vigorous development and popularization of new energy vehicles, the size of the displays installed in cars is getting larger and larger. In order to ensure the user experience, it is necessary to perform functional tests on the displays before they leave the factory.
[0003] Nowadays, the method for testing a display is to connect the display to a chip for testing to observe whether the display is lit. If it is lit, the display functions properly. However, the applicant found that the traditional test chip cannot light up a display with an 8K resolution. Therefore, how to complete the test of the display to be tested is a technical problem that has yet to be solved by those skilled in the art. Utility Model Content
[0004] The main purpose of the utility model is to provide a display test circuit and a display test device to be tested, aiming to complete the factory test of the display to be tested.
[0005] To achieve the above object, the utility model provides a display test circuit, which includes: a data output control module, a data conversion module, an expansion module and a power module; the data output control module is connected with the data conversion module, the expansion module and the power module; the data conversion module, the expansion module and the power module are connected with a display to be tested;
[0006] The data output control module is used to receive the power on / off instruction and output the data to be displayed, and transmit the data to be displayed to the data conversion module, and transmit the power on / off instruction to the power module;
[0007] The data conversion module is used for generating serial data after receiving the data to be displayed, and transmitting the serial data to the display to be tested;
[0008] The power module is used to turn on or off the power of the display to be tested after receiving the power on / off instruction;
[0009] The expansion module is used to generate monitoring data after collecting the test data of the display to be tested, and transmit the monitoring data to the data output control module;
[0010] The data output control module is also used to receive the monitoring data transmitted by the expansion module and generate a test result.
[0011] Optionally, the data output control module includes:
[0012] A power switch, the power switch is used to receive the power on / off instruction;
[0013] RK3588S chip, the RK3588S chip is connected to the power switch, the expansion module, the data conversion module, and the power module. The RK3588S chip is used to receive the power on / off instruction and the data to be displayed, and transmit the data to be displayed to the data conversion module, and transmit the power on / off instruction to the power module; the RK3588S chip is also used to receive the monitoring data transmitted by the expansion module and generate a test result.
[0014] Optionally, the data output control module further includes:
[0015] A model selection switch, the model selection switch is connected to the RK3588S chip, and is used to receive a display model and transmit the display model to the RK3588S chip;
[0016] A test mode selection switch, the test mode selection switch is connected to the RK3588S chip, and is used to receive the test mode of the display to be tested and transmit the test mode to the RK3588S chip.
[0017] Optionally, the data output control module further includes:
[0018] An Ethernet interface, the Ethernet interface being connected to the RK3588S chip and used for transmitting the test result to a preset data center;
[0019] A USB interface, the USB interface being connected to the RK3588S chip and used to transmit the test result to the data center;
[0020] A serial interface, the serial interface is connected to the RK3588S chip and is used to transmit the test result to the data center.
[0021] Optionally, the serial data includes: first serial data to be displayed or second serial data to be displayed, and the data conversion module includes:
[0022] A first chip, the first chip is connected to the data output control module and the display to be tested, and is used to generate first serial data to be displayed after detecting that the data to be displayed is an EDP signal, and transmit the first serial data to be displayed to the display to be tested;
[0023] The second chip is connected to the data output control module and the display to be tested, and is used to generate second serial data to be displayed after detecting that the data to be displayed is a MIPI signal, and transmit the second serial data to be displayed to the display to be tested.
[0024] Optionally, a model of the first chip is DS90UH983, and a model of the second chip is DS90UH981.
[0025] Optionally, the first chip and the second chip are connected to the display to be tested via an HMTD socket and a coaxial socket.
[0026] Optionally, the expansion module includes:
[0027] An ADC sampling chip, the ADC sampling chip is connected to the display to be tested and is used to collect test data of the display to be tested;
[0028] An ADC monitoring unit, the ADC monitoring unit is connected to the ADC sampling chip and the data output control module, and is used to generate monitoring data after receiving the test data, and transmit the monitoring data to the data output control module.
[0029] Optionally, the power module includes:
[0030] Monitor power supply;
[0031] The DCDC power chip, the display power supply, the display to be tested and the data output control module are connected, and are used to turn on or off the power supply of the display power supply when receiving a power on / off instruction.
[0032] In addition, to solve the above-mentioned purpose, the present application also proposes a display test device to be tested, and the display test device to be tested includes the display test circuit as described above.
[0033] The display test circuit proposed by the utility model comprises: a data output control module, a data conversion module, an expansion module and a power supply module; the data output control module is connected with the data conversion module, the expansion module and the power supply module; the data conversion module, the expansion module and the power supply module are connected with the display to be tested.
[0034] In this way, the data conversion module can generate serial data that can be parsed by the display to be tested after receiving the data to be displayed transmitted by the data output control module, so that the display to be tested can be lit up by the data to be displayed. Then the expansion module can collect the test data of the display to be tested when displaying the data to be displayed and generate monitoring data, and then the data output control module can receive the monitoring data and generate the test results of the display to be tested. Therefore, the display test circuit proposed in the present application can light up the display to be tested, and can automatically generate the test results of the display to be tested, thereby achieving the effect of automated testing of the display to be tested. BRIEF DESCRIPTION OF THE DRAWINGS
[0035] In order to more clearly illustrate the embodiments of the utility model or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the utility model. For ordinary technicians in this field, other drawings can be obtained based on the structures shown in these drawings without paying creative work.
[0036] Figure 1 It is a module schematic diagram of the display test circuit of the utility model;
[0037] Figure 2 It is a first detailed schematic diagram of a data output control module of a display test circuit of the utility model;
[0038] Figure 3 It is a second detailed schematic diagram of the data output control module of the display test circuit of the utility model;
[0039] Figure 4 It is a circuit connection diagram of the display test circuit of the utility model;
[0040] Figure 5 This is a data flow diagram of the display test circuit of the utility model;
[0041] Figure 6 It is a schematic diagram showing the test results of the display test circuit of the utility model.
[0042] Description of Figure Numbers:
[0043]
[0044] The realization of the purpose, functional features and advantages of the utility model will be further explained in conjunction with embodiments and with reference to the accompanying drawings. DETAILED DESCRIPTION
[0045] It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.
[0046] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.
[0047] It should be noted that all directional indications in the embodiments of the present application (such as up, down, left, right, front, back, etc.) are only used to explain the relative position relationship, movement status, etc. between the components under a certain specific posture (as shown in the accompanying drawings). If the specific posture changes, the directional indication will also change accordingly.
[0048] In this application, unless otherwise clearly specified and limited, the terms "connection", "fixation", etc. should be understood in a broad sense. For example, "fixation" can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements, unless otherwise clearly defined. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to specific circumstances.
[0049] In addition, in this application, descriptions such as "first", "second", etc. are only used for descriptive purposes and cannot be understood as indicating or implying their relative importance or implicitly indicating the number of technical features indicated. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of the features. In addition, the technical solutions between the various embodiments can be combined with each other, but they must be based on the ability of ordinary technicians in this field to implement them. When the combination of technical solutions is contradictory or cannot be implemented, it should be deemed that such combination of technical solutions does not exist and is not within the scope of protection required by this application.
[0050] The utility model provides a display test circuit, referring to Figure 1 The module schematic diagram of the display test circuit of the present application comprises: a data output control module 10, a data conversion module 20, an expansion module 30 and a power module 40; the data output control module 10 is connected with the data conversion module 20, the expansion module 30 and the power module 40; the data conversion module 20, the expansion module 30 and the power module 40 are connected with the display 50 to be tested;
[0051] The data output control module 10 is used to receive the power on / off instruction and output the data to be displayed, and transmit the data to be displayed to the data conversion module 20, and transmit the power on / off instruction to the power module 40;
[0052] The data conversion module 20 is used to generate serial data after receiving the data to be displayed, and transmit the serial data to the display 50 to be tested;
[0053] The power module 40 is used to turn on or off the power of the display to be tested 50 after receiving the power on / off instruction;
[0054] The expansion module 30 is used to generate monitoring data after collecting the test data of the display to be tested 50, and transmit the monitoring data to the data output control module 10;
[0055] The data output control module 10 is also used to receive the monitoring data transmitted by the expansion module 30 and generate a test result.
[0056] It should be noted that the display test circuit proposed in this application can not only be used to test displays with 8K resolution, but also can be used to test displays with other resolutions, and this application does not limit this.
[0057] In the present embodiment, the power on / off instruction includes a power-on instruction and a power-off instruction. When testing the display to be tested, first, the data output control module will receive the power-on instruction and pass the power-on instruction to the power module. And the data output control module also outputs the data to be displayed to the data conversion module, and then the display test circuit can generate serial data that can be parsed by the display to be tested through the data conversion module. Thus, under the premise that the power module supplies power to the display to be tested and the display to be tested receives the serial data, the display to be tested can be lit, and then the expansion module can obtain the test data of the display to be tested in the lit state (for example, the data of each chip or each register in the display can be read), and then generate monitoring data, and then pass the monitoring data to the data output control module. Thus, the data output control module can receive the monitoring data and output the test result, that is, obtain the test result of the display to be tested.
[0058] Optionally, in a feasible embodiment, please refer to Figure 2 , the data output control module 10 includes:
[0059] A power switch 101, the power switch 101 is used to receive the power on / off instruction;
[0060] RK3588S chip 102, the RK3588S chip 102 is connected to the power switch 101, the expansion module 30, the data conversion module 20, and the power module 40. The RK3588S chip 102 is used to receive the power on / off instruction and the data to be displayed, and pass the data to be displayed to the data conversion module 20, and pass the power on / off instruction to the power module 40; the RK3588S chip 102 is also used to receive the monitoring data transmitted by the expansion module 30 and generate a test result.
[0061] It is understandable that RK3588S supports video output in the form of HDMI, MIPI, EDP, etc., and supports video output capability up to 8K@60fps, that is, the data to be displayed can be any signal of HDMI, MIPI, and EDP.
[0062] In this embodiment, the power switch can receive an instruction to turn on or off the power. For example, when the display to be tested needs to be tested, the power switch receives an instruction to turn on the power, and when the test is completed, the power switch receives an instruction to turn off the power. After the power switch passes the received power-on instruction to the RK3588S chip, the RK3588S chip can pass the power-on instruction to the power module, so that the power module supplies power to the display to be tested, and outputs the data to be displayed of the signals such as HDMI, MIPI, EDP to the data conversion module. When the display to be tested outputs the data to be displayed, the expansion module can collect the test data such as the register data and the chip data in the display to be tested and generate monitoring data. Then, the RK3588S chip can also receive the monitoring data transmitted by the extension module, and generate the test results corresponding to the display to be tested.
[0063] Optionally, in a feasible embodiment, please refer to Figure 3 , the data output control module 10 also includes:
[0064] A model selection switch 103, the model selection switch 103 is connected to the RK3588S chip 102, and is used to receive a display model and transmit the display model to the RK3588S chip 102;
[0065] The test mode selection switch 104 is connected to the RK3588S chip 102 and is used to receive the test mode of the display to be tested and transmit the test mode to the RK3588S chip 102 .
[0066] Optionally, the data output control module 10 further includes:
[0067] Ethernet interface 105, the Ethernet interface 105 is connected to the RK3588S chip 102, and is used to transmit the test result to a preset data center;
[0068] A USB interface 106, the USB interface 106 is connected to the RK3588S chip 102, and is used to transmit the test result to the data center;
[0069] A serial interface 107 , which is connected to the RK3588S chip 102 and is used to transmit the test result to the data center.
[0070] It is understandable that the display test circuit proposed in the present application can not only test whether the display to be tested can be illuminated by the data to be displayed, but also test whether various functions of the display to be tested are normal. For example, the test mode can be a touch function test, or an optical performance test (i.e., testing whether there are black lines or black dots when the display displays the data to be displayed).
[0071] In this embodiment, the RK3588S chip can also receive the display model transmitted by the model selection switch and the test mode transmitted by the test mode selection switch, so that the RK3588S chip can compare the standard data corresponding to the display model and the test mode with the monitoring data generated by the expansion module to generate a test result. Then, the RK3588S chip can also transmit the test results to a preset data center based on the Ethernet interface and / or the USB interface and / or the serial interface. Therefore, the display test circuit proposed in this application can be compatible with displays of different models and different test modes, and can automatically report the test results through multiple interfaces.
[0072] Optionally, in a feasible embodiment, the serial data includes: first serial data to be displayed or second serial data to be displayed, and the data conversion module includes:
[0073] A first chip, the first chip is connected to the data output control module and the display to be tested, and is used to generate first serial data to be displayed after detecting that the data to be displayed is an EDP signal, and transmit the first serial data to be displayed to the display to be tested;
[0074] The second chip is connected to the data output control module and the display to be tested, and is used to generate second serial data to be displayed after detecting that the data to be displayed is a MIPI signal, and transmit the second serial data to be displayed to the display to be tested.
[0075] Specifically, the model of the first chip is DS90UH983, and the model of the second chip is DS90UH981.
[0076] Specifically, the first chip and the second chip are connected to the display to be tested through an HMTD socket and a coaxial socket.
[0077] In this embodiment, the first chip in the present application generates a first serial data to be displayed after receiving the EDP signal, and the second chip generates a second serial data to be displayed after receiving the MIPI signal, thereby converting the data to be displayed output by the RK3588S chip into serial data that can be transmitted by the serial link, and then transmitting the serial data to the display to be tested through the high-speed serial link, so that the display to be tested can display. Among them, the first chip is used to add a string to the EDP signal, and the model of the first chip can be DS90UH983. Similarly, the second chip is used to add a string to the MIPI signal, and the model of the second chip can be DS90UH981. In addition, the first chip and the second chip can be connected to the display to be tested through an HMTD (High speed-Modular Twisted-PairData) socket and a coaxial socket to realize data transmission.
[0078] Optionally, in a feasible embodiment, the expansion module includes:
[0079] An ADC sampling chip, the ADC sampling chip is connected to the display to be tested and is used to collect test data of the display to be tested;
[0080] An ADC monitoring unit, the ADC monitoring unit is connected to the ADC sampling chip and the data output control module, and is used to generate monitoring data after receiving the test data, and transmit the monitoring data to the data output control module.
[0081] The power module comprises:
[0082] Monitor power supply;
[0083] The DCDC power chip, the display power supply, the display to be tested and the data output control module are connected, and are used to turn on or off the power supply of the display power supply when receiving a power on / off instruction.
[0084] It is understandable that the test data may be storage data, voltage data, current data, etc. of the display to be tested when it outputs data to be displayed, and the present application does not limit this.
[0085] In this embodiment, after the display to be tested outputs the data to be displayed, the ADC sampling chip can collect the storage data, voltage data, current data and other test data of each register and each chip in the display to be tested, and then the ADC monitoring unit generates monitoring data after receiving the test data, and transmits the monitoring data to the data output control module. In addition, the power module includes a display power supply for supplying power to the display to be tested, and the DCDC power chip is used for voltage conversion, so as to supply power to the display to be tested through the converted voltage. When the data output control module transmits the power supply connection instruction, the voltage of the display power supply is converted into the voltage required for the operation of the display through the DCDC power chip, and when the data output control module transmits the power supply disconnection instruction, the connection between the display and the display power supply is disconnected.
[0086] In a feasible embodiment, the ADC sampling chip model may be ADS7822, the ADC monitoring unit may be MCU, and the DCDC power supply chip model may be MP9928.
[0087] Please refer to Figure 4 and Figure 5 When testing the display, after RK3588S outputs the data to be displayed through the LCD interface and outputs the power-on command through the IO control port, the MP9928 chip converts the voltage of the car battery into the power supply voltage required by the display, the DS90UH983 chip adds the EDP signal, and the DS90UH981 chip adds the MIPI signal, and then transmits the added data to the display to be tested based on the FPD-LINK protocol. The display to be tested deserializes the added signal based on the built-in deserializer, and then outputs the deserialized data to the display chip, touch chip and backlight chip based on the built-in MCU, so as to achieve the purpose of outputting the data to be displayed in the display. Then the MAX4723 chip collects the test data (such as power supply information) of each register and each chip in the display to be tested, and generates monitoring data based on the extended MCU, so that RK3588S can generate test results and upload the test results to the external data center through the network port or USB interface. It should be noted that the expansion MCU can also transmit monitoring data to the external data center through the serial port. The test results of the model QCP58 received by the external data center are as follows: Figure 6 shown.
[0088] In addition, the present application also provides a display testing device to be tested, wherein the display testing device to be tested includes the display testing circuit as described above.
[0089] The above are only optional embodiments of the present invention, and do not limit the patent scope of the present invention. All equivalent structural changes made by using the contents of the present invention specification and drawings under the utility model concept, or directly / indirectly used in other related technical fields are included in the patent protection scope of the present invention.
Claims
1. A display test circuit, It is characterized in that The display test circuit comprises: a data output control module, a data conversion module, an expansion module and a power module; the data output control module is connected with the data conversion module, the expansion module and the power module; the data conversion module, the expansion module and the power module are connected with the display to be tested; The data output control module is used to receive the power on / off instruction and output the data to be displayed, and transmit the data to be displayed to the data conversion module, and transmit the power on / off instruction to the power module; The data conversion module is used for generating serial data after receiving the data to be displayed, and transmitting the serial data to the display to be tested; The power module is used to turn on or off the power of the display to be tested after receiving the power on / off instruction; The expansion module is used to generate monitoring data after collecting the test data of the display to be tested, and transmit the monitoring data to the data output control module; The data output control module is also used to receive the monitoring data transmitted by the expansion module and generate a test result.
2. The display test circuit according to claim 1, It is characterized in that The data output control module comprises: A power switch, the power switch is used to receive the power on / off instruction; RK3588S chip, the RK3588S chip is connected to the power switch, the expansion module, the data conversion module, and the power module. The RK3588S chip is used to receive the power on / off instruction and the data to be displayed, and transmit the data to be displayed to the data conversion module, and transmit the power on / off instruction to the power module; the RK3588S chip is also used to receive the monitoring data transmitted by the expansion module and generate a test result.
3. The display test circuit as claimed in claim 2, It is characterized in that The data output control module also includes: A model selection switch, the model selection switch is connected to the RK3588S chip, and is used to receive a display model and transmit the display model to the RK3588S chip; A test mode selection switch, the test mode selection switch is connected to the RK3588S chip, and is used to receive the test mode of the display to be tested and transmit the test mode to the RK3588S chip.
4. The display test circuit as claimed in claim 2, It is characterized in that The data output control module also includes: An Ethernet interface, the Ethernet interface being connected to the RK3588S chip and used for transmitting the test result to a preset data center; A USB interface, the USB interface being connected to the RK3588S chip and used to transmit the test result to the data center; A serial interface, the serial interface is connected to the RK3588S chip and is used to transmit the test result to the data center.
5. The display test circuit according to claim 1, It is characterized in that The serial data includes: first serial data to be displayed or second serial data to be displayed, and the data conversion module includes: A first chip, the first chip is connected to the data output control module and the display to be tested, and is used to generate first serial data to be displayed after detecting that the data to be displayed is an EDP signal, and transmit the first serial data to be displayed to the display to be tested; The second chip is connected to the data output control module and the display to be tested, and is used to generate second serial data to be displayed after detecting that the data to be displayed is a MIPI signal, and transmit the second serial data to be displayed to the display to be tested.
6. The display test circuit as claimed in claim 5, It is characterized in that The model of the first chip is DS90UH983, and the model of the second chip is DS90UH981.
7. The display test circuit according to claim 5, It is characterized in that The first chip and the second chip are connected to the display to be tested through an HMTD socket and a coaxial socket.
8. The display test circuit according to claim 1, It is characterized in that The expansion module comprises: An ADC sampling chip, the ADC sampling chip is connected to the display to be tested and is used to collect test data of the display to be tested; An ADC monitoring unit, the ADC monitoring unit is connected to the ADC sampling chip and the data output control module, and is used to generate monitoring data after receiving the test data, and transmit the monitoring data to the data output control module.
9. The display test circuit according to claim 1, It is characterized in that The power module comprises: Monitor power supply; The DCDC power chip, the display power supply, the display to be tested and the data output control module are connected, and are used to turn on or off the power supply of the display power supply when receiving a power on / off instruction.
10. A display testing device to be tested, It is characterized in that The display test device to be tested comprises the display test circuit according to any one of claims 1 to 9.
