SSD (Solid State Disk) card test equipment and SSD card production line

Abstract

The utility model provides an SSD card test device and an SSD card production line, and relates to the technical field of hard disks. The SSD card test equipment comprises a plurality of test cabinets and a carrying device, wherein each test cabinet is provided with a plurality of test cavities; the carrying device is provided with a plurality of storage cavities, the test carriers can be placed in the storage cavities, and the carrying device can move; when the carrying device moves to the feeding position of the test cabinet, the storage cavities correspond to the test cavities one to one; the feeding position is configured to be capable of pushing the test carrier from the storage cavity to the test cavity and enabling the golden finger of the test carrier to be just inserted into the connector in the test cavity. The SSD card test equipment provided by the utility model can replace manual butt joint of the golden finger and the connector, does not need manual carrying of the test carrier, is time-saving and labor-saving, can realize standardized production, and effectively improves the production efficiency.

Description

Technical Field

[0001] The utility model relates to the technical field of hard disks, and in particular to an SSD card testing device and an SSD card production line. Background Art

[0002] Before SSDs leave the factory, manufacturers need to simulate a normal temperature environment and provide a stable voltage to perform read and write tests on the SSDs. By testing the SSDs in this high temperature environment and stable voltage, products with hidden dangers and instability can be screened out, thereby ensuring that the performance and parameters of the products leaving the factory meet industry usage requirements.

[0003] At present, the market mostly manually inserts SSD cards into test carriers, and then manually loads the test carriers with SSD cards into the card opening cabinet, RDT test cabinet, and BIT test cabinet for testing. Since each cabinet has multiple layers of test chambers, it is necessary to manually carry the test carriers and align the gold fingers of the test carriers with the connectors in the test chambers in the cabinets to ensure that the test carriers can be connected to the connectors. This manual docking method makes the entire testing process time-consuming and labor-intensive, affecting production efficiency. Utility Model Content

[0004] In view of this, the purpose of the utility model is to overcome the shortcomings of the prior art and provide an SSD card testing device that can replace the manual docking of gold fingers and connectors, and does not require manual handling of the test carrier, saving time and effort, and can achieve standardized production and effectively improve production efficiency;

[0005] In addition, a SSD card production line using the above-mentioned SSD card testing device is provided.

[0006] The utility model provides the following technical solutions:

[0007] According to a first aspect of the present utility model, there is provided an SSD card testing device, the SSD card testing device comprising:

[0008] A plurality of test cabinets, each of which has a plurality of test chambers;

[0009] A carrier device, the carrier device having a plurality of storage chambers, the storage chambers being capable of accommodating test carriers, and the carrier device being movable; wherein

[0010] When the carrier moves to the loading position of the test cabinet, the storage cavity and the test cavity correspond one to one; the loading position is configured to be able to push the test carrier from the storage cavity to the test cavity, and make the gold finger of the test carrier just plugged into the connector in the test cavity.

[0011] Further, the plurality of test chambers are arranged vertically in sequence, and the plurality of storage chambers are arranged vertically in sequence.

[0012] Furthermore, the SSD card testing equipment also includes a positioning device, which is installed on the test cabinet, and the positioning device can limit the carrying device moved to the loading position so that each of the storage chambers can form a guide channel with the corresponding test chamber; wherein the guide channel is configured to enable the gold fingers of the test carrier moving along the guide channel to be exactly plugged into the connector.

[0013] Furthermore, the test carrier is provided with guide wheels, and the guide wheels are used to abut against the side walls of the storage cavity.

[0014] Furthermore, the positioning device comprises:

[0015] A positioning pin is installed on the test cabinet; wherein the carrier has a positioning hole that can be gap-matched with the positioning pin.

[0016] Furthermore, the SSD card testing device further includes:

[0017] A pushing device is installed on the carrying device, and the pushing device can drive the test carrier in the storage cavity to move along the guide channel.

[0018] Further, the pushing device comprises:

[0019] a contact portion, the contact portion being capable of clamping or abutting against the test carrier;

[0020] A power part is connected to the contact part, and the power part can drive the contact part to move along the guide channel.

[0021] Further, when the contact portion is capable of clamping the test carrier, the contact portion includes a clamping claw, and the clamping claw is connected to the power portion;

[0022] And / or, the power unit includes a mechanical arm, and the mechanical arm is connected to the contact unit.

[0023] Furthermore, the SSD card testing device further includes:

[0024] A card loading machine, which can insert the SSD card into the test carrier;

[0025] a first clamping device, the first clamping device being capable of clamping the test carrier in the storage cavity to the card loading machine;

[0026] A card removal and sorting machine, which can remove the SSD cards in the test carrier and classify them according to the test results;

[0027] A second clamping device, wherein the second clamping device can clamp the test carrier in the storage cavity to the card loading machine.

[0028] Furthermore, the plurality of test cabinets at least include:

[0029] Card opening cabinet, RDT test cabinet and BIT test cabinet; wherein the card loading machine, card opening cabinet, RDT test cabinet, BIT test cabinet and card removing and sorting machine are arranged in sequence along a set direction.

[0030] Further, the carrier comprises:

[0031] Movable body;

[0032] A plurality of trays, wherein the plurality of trays are arranged in sequence and spaced apart in the vertical direction; wherein the space between adjacent trays forms the storage cavity;

[0033] A self-locking mechanism is installed on the tray, and the self-locking mechanism can limit the test carrier so that the test carrier is kept on the tray.

[0034] Further, the self-locking mechanism comprises:

[0035] A bracket, the bracket being slidably connected to the movable vehicle body, and the bracket being capable of sliding along a first direction;

[0036] A limit block, the limit block is connected to the bracket; in an initial state, the limit block is located on a moving path for pushing the test carrier into and out of the test cavity;

[0037] A driving part, the driving part is installed at the loading position, the driving part has a telescopic end, the telescopic end can abut against the bracket located at the loading position, and can drive the bracket to move along the first direction, thereby moving the limit block to outside the moving path;

[0038] An elastic reset portion, wherein the elastic reset portion can drive the bracket to reset to the initial state.

[0039] According to a second aspect of the present utility model, there is provided an SSD card production line, wherein the SSD card production line comprises any one of the SSD card testing devices.

[0040] The embodiments of the present utility model have the following advantages:

[0041] The SSD card testing device provided by the utility model is adopted to realize batch transfer of test carriers by placing the test carriers in the storage cavity of the carrier device respectively and moving the carrier device; in addition, by limiting the position of the carrier device, it is ensured that the carrier device located at the loading position can accurately dock with the test cabinet, that is, the test cavity and the storage cavity are exactly corresponding, and by pushing the test carrier into the test cavity, the gold finger of the test carrier entering the test cavity can be just inserted into the connector installed in the test cavity, and the gold finger and the connector are plugged in and matched. Therefore, the device can replace the manual handling of the test carrier, and there is no need to manually adjust the position of the test carrier repeatedly so that the gold finger can dock with the connector, which saves time and labor, can realize standardized production, and effectively improve production efficiency.

[0042] In addition, the utility model also relates to an SSD card production line. Since the above-mentioned SSD card testing equipment has the above-mentioned technical effects, the SSD card production line including the SSD card testing equipment should have the same technical effects, which will not be repeated here.

[0043] In order to make the above-mentioned objects, features and advantages of the present invention more obvious and understandable, preferred embodiments are given below and described in detail with reference to the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0044] In order to more clearly illustrate the technical solutions of the embodiments of the utility model, the drawings required for use in the embodiments will be briefly introduced below. It should be understood that the following drawings only show certain embodiments of the utility model and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other relevant drawings can be obtained based on these drawings without paying creative work.

[0045] Figure 1 The structural block diagram of the SSD card testing device provided by the embodiment of the utility model is shown;

[0046] Figure 2 A schematic diagram of the structure of a test cabinet for an SSD card test device provided by an embodiment of the utility model is shown;

[0047] Figure 3 A schematic structural diagram showing another perspective of a carrier device of an SSD card testing device provided by an embodiment of the utility model;

[0048] Figure 4 A schematic structural diagram of a self-locking mechanism of a carrier device of an SSD card testing device provided by an embodiment of the utility model is shown;

[0049] Figure 5 A structural schematic diagram of a test carrier of an SSD card test device provided in an embodiment of the utility model is shown.

[0050] Description of main component symbols:

[0051] 100-test carrier; 110-gold finger; 120-label code; 130-guide wheel; 200-SSD card; 300-carrier; 310-storage cavity; 320-movable body; 330-frame; 340-self-locking mechanism; 341-cross bar; 342-reset spring; 343-limit block; 344-column; 400-test cabinet; 410-test cavity; 500-card loading machine; 600-card removal and sorting machine. DETAILED DESCRIPTION

[0052] The embodiments of the present invention are described in detail below, and examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and cannot be understood as limiting the present invention.

[0053] It should be noted that when an element is referred to as being "fixed to" another element, it may be directly on the other element or there may be a central element. When an element is considered to be "connected to" another element, it may be directly connected to the other element or there may be a central element at the same time. In contrast, when an element is referred to as being "directly on" another element, there is no intermediate element. The terms "vertical", "horizontal", "left", "right" and similar expressions used herein are for illustrative purposes only.

[0054] In the present invention, unless otherwise clearly specified and limited, the terms "install", "connect", "connect", "fix" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0055] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features. In the description of the present utility model, the meaning of "plurality" is two or more, unless otherwise clearly and specifically defined.

[0056] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art to which this application belongs. The terms used in the specification of the template herein are only for the purpose of describing specific embodiments and are not intended to limit the present invention. The term "and / or" used herein includes any and all combinations of one or more of the related listed items.

[0057] In the related art, SSD card 200 generally refers to a solid state drive (Solid State Disk or Solid State Drive, referred to as SSD), commonly known as a solid state drive. A solid state drive is a hard disk made of a solid-state electronic storage chip array. The SSD consists of a control unit and a storage unit (FLASH chip, DRAM chip). Before the solid state drive leaves the factory, the manufacturer needs to simulate a normal temperature environment and provide a stable voltage to perform read and write tests on the SSD. The SSD solid state drive is tested in this high temperature environment and stable voltage to screen out products with hidden dangers and instability, thereby ensuring that the performance and parameters of the products shipped meet the industry requirements.

[0058] Most of the tests on the market are done manually by inserting the SSD card 200 into the test carrier 100, and then manually loading the test carrier 100 with the SSD card 200 into the card opening cabinet, RDT test cabinet 400, and BIT test cabinet 400 for testing. Since each cabinet is provided with a multi-layer test cavity 410, it is necessary to manually carry the test carrier 100 and align the gold finger 110 of the test carrier 100 with the connector in the test cavity 410 in the cabinet to ensure that the test carrier 100 can be connected to the connector. This manual docking method makes the entire testing process time-consuming and labor-intensive, affecting production efficiency. Among them, the card opening cabinet is used for RDT card opening, primary card opening, and secondary card opening of the SSD test carrier 100; the RDT test cabinet 400 is used for RDT testing or BIT testing of the SSD test carrier 100; and the BIT test cabinet 400 is used for BIT testing of the SSD test carrier 100.

[0059] Among them, the RDT test (Reliability Demonstration Test) verifies the mean time between failures (MTBF) of the product through a large sample in product testing. It is also close to the actual usage scenario, ensuring that the product does not have large-scale software and hardware abnormalities during mass production. The RDT test refers to the JEDEC standard: JESD218: Solid-State Drive (SSD) Requirements and Endurance Test Method, which defines the usage conditions and corresponding durability (lifespan) verification requirements for consumer-grade and enterprise-grade SSDs.

[0060] JESD219: Solid State Drive (SSD) Endurance Workloads. This standard defines the workloads for SSD endurance testing. Enterprise-level SSD workloads are used in conjunction with the working conditions defined in JESD218;

[0061] JESD 22-A108: Temperature, Bias, and Operating Life, defines the high temperature operating life (HTOL) test to determine the reliability of devices operating under high temperature conditions for a long time;

[0062] The RDT test uses a mixed IO load of sequential and random reads and writes (this work is complex and is close to the real user scenario through big data capture and analysis), and through theoretical deduction, it is concluded that the TBW acceleration factor corresponds to the amount of data written each day. The test is carried out continuously with power off every day, and some key projects are strictly monitored.

[0063] BIT test (Built-in Test), built-in test (BIT) is a self-diagnostic function embedded in the system or device to detect and report internal faults or abnormal conditions. BIT test mainly tests the power consumption / performance compliance test of SSD products, full disk read and write of each IO, power bias test, power management test, etc.

[0064] The BIB vehicle (BURN IN BOARD, aging test vehicle) is a process that applies external stimuli such as temperature and voltage to solid-state drive (SSD) products in order to detect early failure of products in advance.

[0065] like Figure 1 and Figure 2 As shown, in order to solve the above technical problems, according to the first aspect disclosed in the utility model, an SSD card testing device is provided, which includes a plurality of test cabinets 400 and a carrier 300, each test cabinet 400 has a plurality of test cavities 410; the carrier 300 has a plurality of storage cavities 310, the storage cavities 310 can hold the test carrier 100, and the carrier 300 can move; wherein, when the carrier 300 moves to the loading position of the test cabinet 400, the storage cavities 310 and the test cavities 410 correspond one to one; the loading position is configured to be able to push the test carrier 100 from the storage cavity 310 to the test cavity 410, and to enable the gold finger 110 of the test carrier 100 to be just plugged into the connector in the test cavity 410.

[0066] The test cabinet 400 is provided with a plurality of test chambers 410, and a connector connected to a test module is installed in each test chamber 410; that is, each test cabinet 400 can perform docking tests on a plurality of test carriers 100 at the same time, which is beneficial to improving production efficiency.

[0067] Similarly, by providing a plurality of storage cavities 310 corresponding to the test cavities 410 on the carrier 300 , a plurality of test carriers 100 can be quickly loaded into the test cabinet 400 , and a plurality of test carriers 100 can be transported at one time.

[0068] It should be noted that by limiting the positions of the test cavity 410 and the storage cavity 310, the test cavity 410 and the storage cavity 310 can be connected, and the gold finger 110 of the test carrier 100 can be inserted into the test cavity 410 by pushing the test carrier 100, without manual adjustment of the docking. Among them, the gold finger 110 of the test carrier 100 located in the storage cavity 310 faces the test cavity 410.

[0069] For example, the width dimension of the storage cavity 310 and the width dimension of the storage cavity 310 can be set to be the same, so that the test carrier 100 will not deviate in the width direction after entering the test cavity 410, ensuring that the gold finger 110 can be accurately inserted into the connector.

[0070] By using the SSD card testing equipment provided by the utility model, the test carriers 100 are placed in the storage chambers 310 of the carrier device 300 respectively, and the carrier device 300 is moved to realize batch transfer of the test carriers 100; in addition, the position of the carrier device 300 is limited to ensure that the carrier device 300 located at the loading position can accurately dock with the test cabinet 400, that is, the test chamber 410 and the storage chamber 310 are exactly corresponding, and by pushing the test carrier 100 into the test chamber 410, the gold finger 110 of the test carrier 100 entering the test chamber 410 can be inserted into the connector installed in the test chamber 410, and the gold finger 110 and the connector are plugged in and matched. Therefore, the device can replace the manual handling of the test carrier 100, and there is no need to manually adjust the position of the test carrier 100 repeatedly so that the gold finger 110 can dock with the connector, which saves time and effort, can realize standardized production, and effectively improve production efficiency.

[0071] On the basis of the above embodiment, a smooth coating may be provided on the floor and side of the storage cavity 310 to reduce the friction factor, thereby reducing the friction resistance between the test vehicle 100 and the inner wall of the storage cavity 310 .

[0072] Correspondingly, a smooth coating may also be provided on the inner wall of the test cavity 410 to achieve the same effect as above.

[0073] On the basis of the above embodiment, a plurality of test chambers 410 are arranged in sequence in the vertical direction, and a plurality of storage chambers 310 are arranged in sequence in the vertical direction.

[0074] By vertically arranging the multiple test chambers 410 and correspondingly vertically arranging the multiple storage chambers 310, the floor space of the carrier 300 and the test cabinet 400 can be reduced, the production cost can be reduced, and the flexibility of movement of the carrier 300 can be improved.

[0075] Of course, it is not limited to this one, and it can also be arranged in sequence in the horizontal direction as long as there is enough space.

[0076] On the basis of the above-mentioned embodiment, the SSD card testing equipment also includes a positioning device, which is installed on the test cabinet 400. The positioning device can limit the transport device 300 that moves to the loading position so that each storage cavity 310 can form a guide channel with its corresponding test cavity 410; wherein, the guide channel is configured to enable the gold finger 110 of the test carrier 100 that moves along the guide channel to be exactly plugged into the connector.

[0077] That is to say, the positioning device can limit the position of the carrier device 300 that moves to the loading position, so that the storage cavity 310 can be accurately docked with the test cavity 410, and avoid the carrier device 300 from deviating during the process of pushing the test carrier 100 into the test cavity 410, which causes the gold finger 110 to be unable to be inserted into the connector. Obviously, the positioning device can ensure the integrity of the guide channel formed by the docking of the storage cavity 310 and the test cavity 410, that is, by limiting the moving path of the test carrier 100 in the guide channel, it is ensured that the gold finger 110 can be inserted into the connector. For those skilled in the art, how to limit the moving path of the test carrier 100 through the guide channel is a conventional setting and does not pose a technical problem. For example, ensure that the shape and size of the cross section of the test cavity 410 is the same as the shape and size of the cross section of the storage cavity 310.

[0078] like Figure 5 As shown, on the basis of the above embodiment, the test carrier 100 is provided with a guide wheel 130 , and the guide wheel 130 is used to abut against the side wall of the storage cavity 310 .

[0079] Exemplarily, guide wheels 130 are respectively provided at the four corners of the test carrier 100, so that the test carrier 100 can contact the inner wall of the guide channel (that is, contact the inner wall of the storage cavity 310) through the guide wheels 130, which can not only play a guiding role but also reduce the friction resistance of pushing.

[0080] Exemplarily, the storage cavity 310 may be configured as a through structure to form a front port and a rear port, wherein the front port is used to dock with the open end of the test cavity 410 , and the rear port is used for an operator to reach in and push the test carrier 100 in the storage cavity 310 toward the front port.

[0081] like Figure 5 As shown, based on the above embodiment, the test carrier 100 is a BIB carrier, and the BIB carrier includes a main circuit board, a transfer circuit board and a fixture. The main circuit board and the transfer circuit board are connected through a connector, and a single main circuit board and 16 transfer circuit boards are combined into a single BIB carrier hardware component, and the BIB carrier hardware component is installed in the fixture.

[0082] On the basis of the above-mentioned embodiment, the positioning device includes a positioning pin, which is installed on the test cabinet 400; wherein the carrier 300 has a positioning hole that can be clearance-matched with the positioning pin.

[0083] For example, a positioning pin is installed on the side of the test cabinet 400 facing the carrier 300 at the loading position, and a positioning hole is set on the side of the carrier 300 facing the test cabinet 400. The positioning can be achieved by moving the carrier 300 until the positioning pin is inserted into the positioning hole.

[0084] It should be noted that the clearance fit between the positioning pin and the positioning hole can prevent the carrier 300 from shaking over a large range, and maintain the precise connection between the test cavity 410 and the storage cavity 310 .

[0085] Optionally, the inner wall of the lower end of the test cavity 410 and the inner wall of the lower end of the storage cavity 310 are kept flush, thereby facilitating pushing and pulling the test carrier 100 in and out of the test cavity 410 or the storage cavity 310 .

[0086] On the basis of the above-mentioned embodiment, the SSD card testing device further includes a pushing device, which is installed on the carrying device 300 and can drive the testing carrier 100 in the storage cavity 310 to move along the guide channel.

[0087] That is to say, the pushing device can drive the test carrier 100 in each storage cavity 310 to enter and exit the corresponding test cavity 410, thereby replacing the manual plugging and unplugging of the test carrier 100, with high production efficiency, no need for manual participation, and cost saving.

[0088] On the basis of the above-mentioned embodiment, the pushing device includes a contact portion and a power portion, the contact portion can clamp or abut the test carrier 100; the power portion is connected to the contact portion, and the power portion can drive the contact portion to move along the guide channel.

[0089] If the contact portion can clamp the test carrier 100, the power unit can be used to drive the contact portion to move forward and backward to achieve plugging and unplugging of the test carrier 100. If the contact portion can abut against the end of the test carrier 100 away from the test cavity 410, the contact portion can only be driven to move by the power unit to insert the test carrier 100 into the test cavity 410. When the subsequent test is completed, the test carrier 100 needs to be manually unplugged.

[0090] On the basis of the above embodiment, when the contact portion is capable of clamping the test carrier 100, the contact portion includes a clamping jaw, and the clamping jaw is connected to the power portion; exemplarily, the clamping jaw may be an electric clamping jaw, so as to clamp the test carrier 100 by the electric clamping jaw; wherein, the type of the clamping jaw may be a two-finger clamping jaw.

[0091] On the basis of the above embodiment, the power unit includes a mechanical arm, which is connected to the contact part. As long as it can drive the contact part to move, the power unit can be set as an electric push rod, etc., which is not specifically limited here.

[0092] On the basis of the above-mentioned embodiment, the SSD card testing equipment also includes a card loading machine 500, a first clamping device, a card removal and sorting machine 600 and a second clamping device. The card loading machine 500 can insert the SSD card 200 into the test carrier 100; the first clamping device can clamp the test carrier 100 in the storage cavity 310 to the card loading machine 500; the card removal and sorting machine 600 can pull out the SSD card 200 in the test carrier 100 and classify it according to the test results; the second clamping device can clamp the test carrier 100 in the storage cavity 310 to the card loading machine 500.

[0093] That is to say, through the cooperation of the first clamping device and the card loading machine 500, the test carrier 100 on the carrier device 300 can be inserted into the card, that is, the SSD card 200 is inserted into the test carrier 100, instead of manual card insertion, further improving production efficiency and saving labor.

[0094] In addition, the second clamping device and the card removal and sorting machine 600 cooperate to remove the SSD card 200 that has been tested on the carrier 300 from the test carrier 100 and classify it according to the test results, for example, into qualified products and unqualified products.

[0095] On the basis of the above embodiment, both the first gripping device and the second gripping device can be manipulators, and the manipulators can be used to grip and move. Optionally, the manipulator can be a six-axis manipulator, a seven-axis manipulator, etc.

[0096] like Figure 1As shown, based on the above embodiments, several test cabinets 400 include at least a card opening cabinet, an RDT test cabinet 400 and a BIT test cabinet 400; wherein, a card loading machine 500, a card opening cabinet, an RDT test cabinet 400, a BIT test cabinet 400 and a card removing and sorting machine 600 are arranged in sequence along a set direction.

[0097] For example, the card loading machine 500, the card opening cabinet, the RDT test cabinet 400, the BIT test cabinet 400 and the card removal and sorting machine 600 are arranged in a row.

[0098] On the basis of the above-mentioned embodiment, the card loading machine 500 may be selected as an automatic card loading machine 500, which is docked with the BIB carrier and the cart. The SSD cards 200 to be tested are taken out one by one from the Tray plate and then inserted into the BIB carrier through the visual assistance system and the multi-axis manipulator installed in the automatic card loading machine 500. After the multi-axis manipulator completes the loading of the SSD cards 200 to be tested in a single BIB carrier, it cooperates with the conveyor line to send the BIB carrier fully loaded with the SSD cards 200 to be tested into the cart shelf. The conveyor line then replenishes the empty BIB carrier for product loading. After multiple cycles, the loading of the BIB carrier of the material to be tested in a single material rack is completed.

[0099] On the basis of the above-mentioned embodiment, the card opening cabinet can load one set of BIB carriers and automatically scan the identification QR code on the BIB carrier to realize the transmission of card opening information between the card opening cabinet and the BIB carrier.

[0100] like Figure 2 As shown, on the basis of the above embodiment, the RDT test cabinet 400 is a dual-chamber independent temperature control cabinet, each chamber is divided into 15 layers of rails, each layer can load 1 set of BIB carriers, and the cabinet can load a total of 30 sets of carriers. The 15 layers of BIB carriers in the cart are manually pushed into the test chamber 410 one by one. At this time, the gold finger 110 at the tail end of the BIB carrier is connected to the connector of the RDT test machine in the chamber. After closing the sealed door of the cabinet, the RDT test cabinet 400 operation interface is manually operated to realize the information transmission between the SSD card 200 in the BIB carrier and the test machine in the RDT test cabinet 400. The dual chambers share a set of hot air circulation systems, which can keep all BIB carriers in the test chamber 410 in a constant temperature environment, and the temperature setting range is 0℃~85℃.

[0101] On the basis of the above embodiment, the BIT test cabinet 400 is a dual-chamber independent temperature control cabinet, each chamber is divided into 15 layers of rails, each layer can load 1 set of BIB carriers, and the cabinet can load a total of 30 sets of carriers. The 15 layers of BIB carriers in the cart are manually pushed into the test chamber 410 one by one. At this time, the gold finger 110 at the tail end of the BIB carrier is connected to the connector of the BIT test machine in the chamber. After closing the cabinet sealing door, the BIT test cabinet 400 operation interface is manually operated to realize the information transmission between the SSD card 200 in the BIB carrier and the test machine in the BIT test cabinet 400. The dual chambers share a set of cold air circulation and hot air circulation switching systems, which can keep all BIB carriers in the test chamber 410 in a constant temperature environment, and the temperature setting range is from room temperature -40℃ to 85℃.

[0102] like Figure 1 As shown, on the basis of the above embodiment, the card removal and sorting machine 600 is selected as an automatic card removal and sorting machine 600, which is docked with the BIB carrier and the cart. The visual assistance system and the multi-axis manipulator installed in the automatic card removal and sorting machine 600 take out the tested SSD products from the BIB carrier one by one, and then the multi-axis manipulator moves the tested SSD card 200 to the visual scanner position in the automatic card removal and sorting machine 600, and the visual scanner recognizes and analyzes the QR code on the tested SSD card 200. The visual scanner communicates with the multi-axis robot according to the QR code information of the SSD card 200, and the multi-axis robot then classifies the SSD cards 200 and places them into SSDTrays at different positions. After the multi-axis robot completes the unloading of the tested SSD card 200 from a single BIB carrier, it cooperates with the conveyor line to send the empty BIB carrier into the cart shelf. The conveyor line then replenishes the fully loaded BIB carrier with the tested SSD cards 200 to unload the SSD cards 200. After multiple cycles, the classified collection of the tested SSD cards 200 is completed.

[0103] It should be noted that the SSD card testing equipment also includes a control system, which is electrically connected to the card loading machine 500, the card opening cabinet, the RDT test cabinet 400, the BIT test cabinet 400 and the card removal sorting machine 600, respectively, so that the control system can have information feedback interaction with the card loading machine 500, the card opening cabinet, the RDT test cabinet 400, the BIT test cabinet 400 and the card removal sorting machine 600, and accordingly, the control system can control the operation of the card loading machine 500, the card opening cabinet, the RDT test cabinet 400, the BIT test cabinet 400 and the card removal sorting machine 600, wherein the control system can send control instructions to the card removal sorting machine 600 according to the test results fed back by the card opening cabinet, the RDT test cabinet 400 and the BIT test cabinet 400, and thus can classify the SSD card 200.

[0104] The test carrier 100 has a label code 120. When a test carrier 100 is abnormal, the control system can bind the abnormal information and the label code 120 information of the test carrier 100, and then obtain the test results of each SSD card 200 on the current test carrier 100 by identifying the label code 120, so as to control the card removal and sorting machine 600 for classification.

[0105] like Figure 3 As shown, based on the above embodiment, the carrier 300 includes a movable body 320, a plurality of pallets and a self-locking mechanism 340, the movable body 320 is provided with a frame 330, and the plurality of pallets are vertically arranged in sequence and spaced apart from each other on the frame 330; wherein the space between adjacent pallets forms a storage cavity 310; the self-locking mechanism 340 is installed on the pallet, and the self-locking mechanism 340 can limit the test carrier 100 so as to keep the test carrier 100 on the pallet.

[0106] Exemplarily, the tray may be configured as a U-shaped structure, and then two ends of the tray form a front port and a rear port respectively. Specifically, the tray may be formed by bending sheet metal.

[0107] It should be noted that the self-locking mechanism 340 can prevent the test carrier 100 placed in the receiving cavity from escaping, thereby ensuring the safety of the test carrier 100 .

[0108] For example, Figure 3 As shown, the movable vehicle body 320 can be a trolley to be pushed manually. A frame is provided on the movable vehicle body 320, and a plurality of trays are arranged in sequence from bottom to top. Optionally, 15 layers of trays can be provided, and each layer can hold a set of BIB carriers.

[0109] Of course, in other embodiments, the movable vehicle body 320 is set as an AGV vehicle, and automatic docking with each test cabinet 400 can be achieved through automatic navigation.

[0110] Based on the above embodiments, Figure 4 and Figure 5 As shown, the self-locking mechanism 340 includes a bracket, a limit block 343, a driving unit and an elastic reset unit. The bracket is slidably connected to the movable body 320, and the bracket can slide along a first direction; the limit block 343 is connected to the bracket; in the initial state, the limit block 343 is located on the moving path of the test carrier 100, and the test carrier 100 can move in and out of the tray along the moving path; the driving unit is installed at the loading position, and the driving unit has a telescopic end. The telescopic end of the driving unit can abut against the bracket located at the loading position, and can drive the bracket to move along the first direction, thereby moving the limit block 343 to outside the moving path of the test carrier 100; the elastic reset unit can drive the bracket to reset.

[0111] That is, by controlling the driving unit to push the bracket of the loading position to move in the first direction, so that the limit block 343 moves with the bracket, and then can contact the limit block 343 on the test carrier 100 on the tray, the staff can push the test carrier 100 in and out of the test cavity 410; in the initial state, the limit block 343 can limit the test carrier 100 to prevent the test carrier 100 from detaching from the tray. Among them, when the driving unit detaches from the bracket, under the action of the elastic reset member, the bracket and the limit block 343 are reset to re-limit the test carrier 100 on the tray.

[0112] It should be noted that each loading position is provided with a driving unit. Since the driving unit and the carrier 300 are independently provided and there is no connection between the two, it is possible to avoid providing a power source and a power supply on the carrier 300, which is convenient and practical.

[0113] On the basis of the above embodiment, the elastic restoring part is a restoring spring 342 , and the bracket is connected to the movable vehicle body 320 via the restoring spring 342 .

[0114] Exemplarily, an opening is provided on one side of the tray so that the test carrier 100 can slide out of the tray through the opening, and the opening faces one side of the test cabinet 400. The driving part is installed at the loading position and is located above the carrier 300 at the loading position.

[0115] The driving part is an electric push rod, and the bracket includes a crossbar 341 and a column 344. The crossbar 341 is connected to the upper end of the column 344. The first direction is the vertical direction. The movable body 320 is provided with a sliding sleeve. The column 344 is slidably inserted into the sliding sleeve. The limit block 343 is fixed to the column 344. The return spring 342 is sleeved on the column 344, and the two ends of the return spring 342 are respectively in contact with the crossbar 341 and the sliding sleeve close to the crossbar 341. In other words, after the piston rod of the electric push rod is extended to contact with the crossbar 341, it continues to extend until the limit block 343 is lower than the lowest point of the corresponding test carrier 100, that is, the limit block 343 is located outside the moving path of the test carrier 100. At this time, the contact limit block 343 limits the test carrier 100 located on the tray, and the staff can push the test carrier 100 to slide along the tray into the test cavity 410. When it is necessary to move the carrier 300 out of the loading position, the piston rod of the electric push rod retracts, and under the action of the reset spring 342 restoring the deformation, the reset spring 342 drives the bracket and the limit block 343 to reset to the initial state. In the initial state, the limit block 343 is located between the highest point and the lowest point of the test carrier 100, that is, the limit block 343 is located on the moving path of the test carrier 100.

[0116] Exemplarily, openings are provided on opposite sides of the tray, that is, brackets, limit blocks 343 and elastic reset parts are provided on both sides of the tray, and the brackets on both sides of the tray are connected by connecting parts, that is, the driving part can synchronously control the brackets on both sides of the tray.

[0117] It should be noted that the driving part is not limited to the electric push rod, and a pneumatic cylinder or a hydraulic cylinder may also be used, which is not specifically limited here.

[0118] According to a second aspect disclosed in the utility model, there is provided an SSD card 200 production line, wherein the SSD card 200 production line comprises any one of the SSD card testing devices.

[0119] Since the above-mentioned SSD card testing device has the above-mentioned technical effects, the SSD card 200 production line including the SSD card testing device should have the same technical effects, which will not be repeated here.

[0120] In all examples shown and described herein, any specific values ​​should be interpreted as merely exemplary and not as limiting, and thus other examples of the exemplary embodiments may have different values.

[0121] It should be noted that similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, further definition and explanation thereof is not required in subsequent drawings.

[0122] The above-mentioned embodiments only express several implementation methods of the present invention, and the description is relatively specific and detailed, but it cannot be understood as limiting the scope of the present invention. It should be pointed out that for ordinary technicians in this field, several modifications and improvements can be made without departing from the concept of the present invention, which all belong to the protection scope of the present invention.

Claims

1. An SSD card testing device, characterized in that: The SSD card testing equipment comprises: A plurality of test cabinets, each of which has a plurality of test chambers; A carrier device, the carrier device having a plurality of storage chambers, the storage chambers being capable of accommodating test carriers, and the carrier device being movable; wherein When the carrier moves to the loading position of the test cabinet, the storage cavity and the test cavity correspond one to one; the loading position is configured to be able to push the test carrier from the storage cavity to the test cavity, and make the gold finger of the test carrier just plugged into the connector in the test cavity.

2. The SSD card testing device according to claim 1, characterized in that: The plurality of test chambers are arranged vertically in sequence, and the plurality of storage chambers are arranged vertically in sequence.

3. The SSD card testing device according to claim 1, characterized in that: The SSD card testing equipment also includes a positioning device, which is installed on the test cabinet. The positioning device can limit the carrier device moved to the loading position so that each storage cavity can form a guide channel with its corresponding test cavity; wherein the guide channel is configured to enable the gold fingers of the test carrier moving along the guide channel to be exactly plugged into the connector.

4. The SSD card testing device according to claim 3, characterized in that: The test carrier is provided with guide wheels, and the guide wheels are used to abut against the side walls of the storage cavity.

5. The SSD card testing device according to claim 3, characterized in that: The positioning device comprises: A positioning pin is installed on the test cabinet; wherein the carrier has a positioning hole that can be gap-matched with the positioning pin.

6. The SSD card testing device according to claim 3, characterized in that: The SSD card testing device also includes: A pushing device is installed on the carrying device, and the pushing device can drive the test carrier in the storage cavity to move along the guide channel.

7. The SSD card testing device according to claim 6, characterized in that: The pushing device comprises: a contact portion, the contact portion being capable of clamping or abutting against the test carrier; A power part is connected to the contact part, and the power part can drive the contact part to move along the guide channel.

8. The SSD card testing device according to claim 7, characterized in that: When the contact portion is capable of clamping the test carrier, the contact portion includes a clamping claw connected to the power portion; And / or, the power unit includes a mechanical arm, and the mechanical arm is connected to the contact unit.

9. The SSD card testing device according to claim 1, characterized in that: The SSD card testing device also includes: A card loading machine, which can insert the SSD card into the test carrier; a first clamping device, the first clamping device being capable of clamping the test carrier in the storage cavity to the card loading machine; A card removal and sorting machine, which can remove the SSD cards in the test carrier and classify them according to the test results; A second clamping device, wherein the second clamping device can clamp the test carrier in the storage cavity to the card loading machine.

10. The SSD card testing device according to claim 9, characterized in that: The plurality of test cabinets at least include: Card opening cabinet, RDT test cabinet and BIT test cabinet; wherein the card loading machine, card opening cabinet, RDT test cabinet, BIT test cabinet and card removing and sorting machine are arranged in sequence along a set direction.

11. The SSD card testing device according to claim 1, characterized in that: The carrier comprises: Movable body; A plurality of trays, wherein the plurality of trays are arranged on the movable vehicle body in a vertical direction in sequence and at intervals; wherein the space between adjacent trays forms the storage cavity; A self-locking mechanism is installed on the movable vehicle body, and the self-locking mechanism can limit the position of the test carrier so that the test carrier is kept on the tray.

12. The SSD card testing device according to claim 11, characterized in that: The self-locking mechanism comprises: A bracket, the bracket being slidably connected to the movable vehicle body, and the bracket being capable of sliding along a first direction; A limit block, the limit block is connected to the bracket; in an initial state, the limit block is located on a moving path for pushing the test carrier into and out of the test cavity; A driving part, the driving part is installed at the loading position, the driving part has a telescopic end, the telescopic end can abut against the bracket located at the loading position, and can drive the bracket to move along the first direction, thereby moving the limit block to outside the moving path; An elastic reset portion, wherein the elastic reset portion can drive the bracket to reset to the initial state.

13. An SSD card production line, characterized in that: The SSD card production line comprises the SSD card testing device according to any one of claims 1 to 12.

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