Testing system of laser particle analyzer
By designing a laser particle size meter test system, using the control unit and simulation unit to simulate particle diameter information input to the laser particle size meter, and generating a test report, the problem of small and unstable optical signals in the existing technology is solved, and rapid testing and problem positioning is achieved. Save working hours.
Patent Information
- Application Number
- CN202323490286.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2023-12-20
- Publication Date
- 2024-12-24
- Estimated Expiration
- 2033-12-20
AI Technical Summary
The optical signal of the existing laser particle size meter is small and unstable, making it difficult to determine whether it is caused by errors caused by fluctuations in the input light energy or problems of the instrument itself when testing the particle size, and it is difficult to quickly locate the problem.
A laser particle size meter testing system including a test module, an analysis module and a power supply module is designed. The control unit outputs digital information of the analog particle diameter, and the analog unit converts it into an analog information and inputs it into the laser particle size meter. The analysis module generates a test report. Quickly test and locate issues.
It realizes a rapid test of laser particle size meter, saves working hours, can quickly know the accuracy of test results and locate problems.
Smart Images
Figure CN222232283U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of instrument testing, in particular to a testing system of a laser particle size analyzer. Background Art
[0002] The optical signal of the existing laser particle size analyzer is very small and relatively unstable. When the particle size is actually tested, if the test result fails, it is difficult to determine whether it is caused by the fluctuation of the input light energy or by the problem of the laser particle size analyzer itself. Therefore, a testing system for the laser particle size analyzer is urgently needed. Utility Model Content
[0003] In view of this, an object of the embodiment of the utility model is to provide a testing system for a laser particle size analyzer, which can quickly test the laser particle size analyzer, thereby quickly locating problems and saving work time.
[0004] In a first aspect, an embodiment of the utility model provides a test system for a laser particle size analyzer, including a test module, an analysis module and a power supply module;
[0005] The test module includes a control unit and a simulation unit, wherein the control unit is used to output digital information of simulated particle diameters, and the simulation unit is used to receive the digital information, convert the digital information into analog information, and then input the analog information into the laser particle size analyzer, so that the laser particle size analyzer generates particle size information, and the simulated particle diameters include 0.1um, 1um and 9um;
[0006] The analysis module is used to generate a test report after receiving the particle size information;
[0007] The power supply module is connected to the control unit, the simulation unit and the analysis module respectively.
[0008] Optionally, the simulation unit is used to generate 64 analog voltage signals, and the analog voltage signals are used to simulate the electrical signals generated by the photodiodes on the main detector of the laser particle size analyzer, and the simulation information includes the analog voltage signals.
[0009] Optionally, the analog unit includes an analog circuit, the analog circuit includes an analog chip, an amplifying circuit and an output circuit, the analog chip is used to output the analog voltage signal to the amplifying circuit, the amplifying circuit is used to amplify the analog voltage signal, and the output circuit is used to transmit the analog voltage signal to the laser particle size analyzer.
[0010] Optionally, the analog unit includes 16 analog circuits connected in parallel.
[0011] Optionally, the analog chip includes a chip DAC8565, and the chip DAC8565 outputs four analog voltage signals.
[0012] Optionally, the amplification circuit includes four amplifiers, which are connected to the output port of the analog voltage signal of the chip DAC8565, wherein one amplifier is connected to an output port of the chip DAC8565.
[0013] Optionally, the control unit includes a chip STM32F103RET6 and a chip STM32F103RET6 peripheral circuit.
[0014] Optionally, the peripheral circuit of the chip STM32F103RET6 includes a reset circuit, and the reset circuit is used to send reset information to the chip STM32F103RET6.
[0015] Optionally, the chip STM32F103RET6 peripheral circuit further includes a clock circuit, and the clock is used to send clock information to the chip STM32F103RET6.
[0016] The implementation of the utility model embodiment includes the following beneficial effects: the utility model embodiment provides a test system for a laser particle size analyzer, including a test module, an analysis module and a power module; the test module includes a control unit and a simulation unit, the control unit is used to output digital information of simulated particle diameter, the simulation unit is used to receive the digital information, and convert the digital information into analog information and then input it into the laser particle size analyzer, so that the laser particle size analyzer generates particle size information; the analysis module is used to generate a test report after receiving the particle size information; the power module is connected to the control unit, the simulation unit and the analysis module respectively. The control unit outputs a digital signal of the simulated particle diameter, and after conversion by the simulation unit, it is input into the laser particle size analyzer, and then the test report is obtained by the analysis module, so that the laser particle size analyzer can be quickly tested, the problem can be quickly located, and work hours can be saved. BRIEF DESCRIPTION OF THE DRAWINGS
[0017] Figure 1 It is a structural block diagram of a testing system of a laser particle size analyzer provided in an embodiment of the utility model;
[0018] Figure 2 It is a circuit schematic diagram of a main control unit provided by an embodiment of the utility model;
[0019] Figure 3 It is a circuit schematic diagram of the analog unit provided in the embodiment of the utility model. DETAILED DESCRIPTION
[0020] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.
[0021] In the embodiments of the present invention, words such as "exemplary" or "for example" are used to indicate examples, illustrations or descriptions. Any embodiment or design described as "exemplary" or "for example" in the embodiments of the present invention should not be interpreted as being more preferred or more advantageous than other embodiments or designs. Specifically, the use of words such as "exemplary" or "for example" is intended to present related concepts in a specific way.
[0022] In the following, the terms "first" and "second" are used for descriptive purposes only and are not to be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of the features. In the description of the embodiments of the present utility model, unless otherwise specified, "plurality" means two or more.
[0023] First, refer to Figure 1 , the embodiment of the utility model provides a test system for a laser particle size analyzer, including a test module, an analysis module and a power supply module;
[0024] The test module includes a control unit and a simulation unit, wherein the control unit is used to output digital information of simulated particle diameters, and the simulation unit is used to receive the digital information, convert the digital information into analog information, and then input the analog information into the laser particle size analyzer, so that the laser particle size analyzer generates particle size information, and the simulated particle diameters include 0.1um, 1um and 9um;
[0025] The analysis module is used to generate a test report after receiving the particle size information;
[0026] The power supply module is connected to the control unit, the simulation unit and the analysis module respectively.
[0027] It should be noted that the control method adopted by the control unit is an existing method.
[0028] Specifically, the particle diameter to be simulated is set by the control unit, that is, the collected electrical signal generated when the laser particle size analyzer measures the same particle diameter; then the control unit generates corresponding digital information by simulating the particle diameter, and inputs the digital information into the simulation unit, the simulation unit converts the digital information into analog information, and inputs the analog information into the laser particle size analyzer, and the input analog information is the collected electrical signal generated by the laser particle size analyzer when measuring particles with the same particle diameter. The laser particle size analyzer inverts the simulation information to obtain the particle size information, and inputs the particle size information into the analysis module. The analysis module can generate a test report based on the relationship between the particle size information and the simulated particle diameter, so that the test report can be used to quickly know whether the test of the laser particle size analyzer is accurate, so that problems can be quickly located when there are problems with the test results, saving work time.
[0029] In some optional embodiments, first, the voltage values Vb1-Vb64 of the 64 acquisition channels of the laser particle size analyzer under the background light energy when no particles are added are pre-tested, and then three kinds of particles with diameters of 0.1um, 1um, and 9um are added respectively, so as to obtain 3 groups of sample voltage values of the 64 acquisition channels of the laser particle size analyzer. Through actual testing, the voltage values of the background light energy and the sample are obtained, and this value is used as the standard input signal. Then, this test module will use the analog unit output to respond to the voltage values on each channel according to the background voltage and sample voltage actually measured by these records in conjunction with the test process, and then input it into the laser particle size analyzer to be tested.
[0030] In some optional embodiments, the simulation unit is used to generate 64 analog voltage signals, and the analog voltage signals are used to simulate the electrical signals generated by the photodiodes on the main detector of the laser particle size analyzer, and the simulation information includes the analog voltage signals.
[0031] Specifically, the simulation unit generates three groups of 64 analog voltage signals respectively, and the three groups correspond to particles with simulated particle diameters of 0.1um, 1um, and 9um respectively. The analog voltage signal is used to simulate the electrical signal generated by the photodiode on the main detector of the laser particle size analyzer, that is, the electrical signal generated by the laser particle size analyzer when detecting particles with diameters of 0.1um, 1um, and 9um.
[0032] In some optional embodiments, the control unit includes a chip STM32F103RET6 and a chip STM32F103RET6 peripheral circuit.
[0033] In some optional embodiments, the peripheral circuit of the chip STM32F103RET6 includes a reset circuit, and the reset circuit is used to send reset information to the chip STM32F103RET6.
[0034] In some optional embodiments, the chip STM32F103RET6 peripheral circuit further includes a clock circuit, and the clock is used to send clock information to the chip STM32F103RET6.
[0035] Specifically, refer to Figure 2 The chip STM32F103RET6 has an operating frequency of 72MHz and a 512KB Flash memory, which can meet the needs of most embedded applications, support multiple communication interfaces, and has rich peripheral functions such as timer, ADC and PWM. The reset circuit includes a reset switch RESET, a capacitor C148 and a resistor R51. After the reset switch RESET is pressed, the DC voltage AVCC3V3 connected to terminal 3 is turned on, so that the reset signal is input to pin 7 (NRST) of the chip STM32F103RET6 after matching with resistor R51 and filtering with capacitor C148, thereby resetting the chip STM32F103RET6; the clock circuit includes a clock crystal oscillator Y2, capacitors C138 and C147. After the clock crystal oscillator Y2 generates a clock signal, it is filtered through capacitors C138 and C147 and then input to pin 5 and management pin 6 of the chip STM32F103RET6. The DC voltage AVCC3V3 is respectively input to the chip STM32F103RET6 pins 1, 13, 19, 32, 48 and 64, thereby providing a driving voltage for the chip STM32F103RET6.
[0036] In some optional embodiments, the analog unit includes an analog circuit, which includes an analog chip, an amplifying circuit and an output circuit. The analog chip is used to output the analog voltage signal to the amplifying circuit, the amplifying circuit is used to amplify the analog voltage signal, and the output circuit is used to transmit the analog voltage signal to the laser particle size analyzer.
[0037] In some optional embodiments, the analog unit includes 16 analog circuits connected in parallel.
[0038] In some optional embodiments, the analog chip includes a chip DAC8565, and the chip DAC8565 outputs four analog voltage signals.
[0039] In some optional embodiments, the amplifying circuit includes four amplifiers, and the amplifiers are connected to the output port of the analog voltage signal of the chip DAC8565, wherein one amplifier is connected to an output port of the chip DAC8565.
[0040] Specifically, refer to Figure 2-3DAC8565 is a low-power, voltage-output, four-channel, 16-bit digital-to-analog converter (DAC) that provides very good linearity and minimizes transient voltage (burrs). The DAC8565 uses a versatile three-wire serial interface with an operating clock rate of up to 50MHz. The model of chip U1 is chip DAC8565, which receives digital signals by connecting pin 15 of chip DAC8565 to pin 58 of chip STM32F103RET6; pin 11 of chip DAC8565 is connected to pin 37 of chip STM32F103RET6, and pin 10 of chip DAC8565 is connected to pin 38 of chip STM32F103RET6 to receive clock signals. Pins 1, 2, 7 and 8 of the chip DAC8565 output an analog voltage signal respectively. After the analog voltage signal is input to pin 1 of the chip DAC8565, the noise is filtered through capacitor C150, and then it is input to amplifier A1 for amplification and matched to pin 5 of the input-output unit connection board P23 through resistor R59. After the analog voltage signal is input to pin 2 of the chip DAC8565, the noise is filtered through capacitor C151, and then it is input to amplifier A2 for amplification and matched to pin 7 of the input-output unit connection board P23 through resistor R72. After the analog voltage signal is input to pin 7 of the chip DAC8565, the noise is filtered through capacitor C152, and then it is input to amplifier A3 for amplification and matched to pin 9 of the input-output unit connection board P23 through resistor R61. After the analog voltage signal is input to pin 8 of the chip DAC8565, the noise is filtered through capacitor C153, and then it is input to amplifier A4 for amplification and matched to pin 9 of the input-output unit connection board P23 through resistor R73, and then it is input to the laser particle size analyzer through pin 2 of the connection board P23. The analog circuits of other paths all include the same analog circuits as the above-mentioned ones, which will not be described in detail here.
[0041] In some optional embodiments, the laser particle size analyzer receives the values of 64 channels and then inversely calculates the particle size information of the simulated particles, and inputs the particle size information into the analysis module, which may specifically include a computer, a controller, etc. If the calculated particle size meets the corresponding particle size tested in advance, it is considered that the laser particle size analyzer is working properly, so that the tedious process of directly testing the standard particles can be avoided, and it can be quickly determined whether the acquisition system of the laser particle size analyzer is working normally and reliably.
[0042] The implementation of the utility model embodiment includes the following beneficial effects: the utility model embodiment provides a test system for a laser particle size analyzer, including a test module, an analysis module and a power module; the test module includes a control unit and a simulation unit, the control unit is used to output digital information of simulated particle diameter, the simulation unit is used to receive the digital information, and convert the digital information into analog information and then input it into the laser particle size analyzer, so that the laser particle size analyzer generates particle size information; the analysis module is used to generate a test report after receiving the particle size information; the power module is connected to the control unit, the simulation unit and the analysis module respectively. The control unit outputs a digital signal of the simulated particle diameter, and after conversion by the simulation unit, it is input into the laser particle size analyzer, and then the test report is obtained by the analysis module, so that the laser particle size analyzer can be quickly tested, the problem can be quickly located, and work hours can be saved.
[0043] In the description of this specification, the description with reference to the term "in a specific embodiment" means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the utility model. In this specification, the schematic representation of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described can be combined in any one or more embodiments or examples in a suitable manner.
[0044] The above is a specific description of the preferred implementation of the utility model, but the invention of the utility model is not limited to the described embodiments. Technical personnel familiar with the field can also make various equivalent deformations or substitutions without violating the spirit of the utility model. These equivalent deformations or substitutions are all included in the scope defined by the claims of this application.
Claims
1. A laser particle size analyzer testing system, characterized in that: Including test module, analysis module and power supply module; The test module includes a control unit and a simulation unit, wherein the control unit is used to output digital information of simulated particle diameters, and the simulation unit is used to receive the digital information, convert the digital information into analog information, and then input the analog information into the laser particle size analyzer, so that the laser particle size analyzer generates particle size information, and the simulated particle diameters include 0.1um, 1um and 9um; The analysis module is used to generate a test report after receiving the particle size information; The power supply module is connected to the control unit, the simulation unit and the analysis module respectively.
2. The laser particle size analyzer testing system according to claim 1, characterized in that: The simulation unit is used to generate 64 analog voltage signals, and the analog voltage signals are used to simulate the electrical signals generated by the photodiodes on the main detector of the laser particle size analyzer. The simulation information includes the analog voltage signals.
3. The laser particle size analyzer testing system according to claim 2, characterized in that: The analog unit includes an analog circuit, which includes an analog chip, an amplifier circuit and an output circuit. The analog chip is used to output the analog voltage signal to the amplifier circuit, the amplifier circuit is used to amplify the analog voltage signal, and the output circuit is used to transmit the analog voltage signal to the laser particle size analyzer.
4. The laser particle size analyzer testing system according to claim 3, characterized in that: The analog unit includes 16 analog circuits connected in parallel.
5. The laser particle size analyzer testing system according to claim 3, characterized in that: The analog chip includes a chip DAC8565, and the chip DAC8565 outputs four analog voltage signals.
6. The laser particle size analyzer testing system according to claim 5, characterized in that: The amplifying circuit includes four amplifiers, and the amplifiers are connected to the output port of the analog voltage signal of the chip DAC8565, wherein one amplifier is connected to an output port of the chip DAC8565.
7. The laser particle size analyzer testing system according to claim 1, characterized in that: The control unit comprises a chip STM32F103RET6 and a peripheral circuit of the chip STM32F103RET6.
8. The laser particle size analyzer testing system according to claim 7, characterized in that: The peripheral circuit of the chip STM32F103RET6 includes a reset circuit, and the reset circuit is used to send reset information to the chip STM32F103RET6.
9. The laser particle size analyzer testing system according to claim 8, characterized in that: The peripheral circuit of the chip STM32F103RET6 also includes a clock circuit, and the clock is used to send clock information to the chip STM32F103RET6.