Power frequency high voltage generator inspection device for electroscope

Abstract

The utility model relates to the field of electricity testing equipment, and discloses a power frequency high voltage generator testing device for an electroscope, and the device comprises a contact assembly which comprises a contact point, and the contact point is in contact with a power frequency high voltage generator, so as to introduce the voltage of the power frequency high voltage generator; the voltage dividing assembly is connected with the contact assembly, and the voltage dividing assembly is used for attenuating the voltage, introduced by the contact assembly, of the power frequency high-voltage generator so as to obtain first attenuated voltage; the dynamic sampling assembly is connected with the voltage dividing assembly, a sampling resistor is arranged in the dynamic sampling assembly, and the sampling resistor is used for further attenuating the first attenuation voltage to obtain a second attenuation voltage; the control assembly is connected with the dynamic sampling assembly, and the control assembly is used for calculating the voltage value and / or the voltage frequency and / or the voltage distortion degree of the second attenuation voltage. The utility model provides a power frequency high voltage generator inspection device for an electroscope.

Description

Technical Field

[0001] The present application relates to the field of testing equipment, and in particular to a testing device for an industrial frequency high voltage generator for an electroscope. Background Art

[0002] According to Articles 4, 3, and 1 of the June 2013 revision of the "State Grid Corporation of China Electric Power Safety Work Regulations," when an electroscope cannot be tested on live equipment, it can be tested using a power-frequency high-voltage generator. However, due to the high voltage characteristics of existing power-frequency high-voltage generators, direct measurement poses certain risks. Utility Model Content

[0003] The present application mainly solves the technical problem in the prior art that existing inspection equipment is difficult to inspect the power frequency high voltage generator, and provides a power frequency high voltage generator inspection device for an electroscope.

[0004] In order to solve the above technical problems and achieve the above application objectives, the present application provides a power frequency high voltage generator testing device for an electroscope, which is characterized by comprising:

[0005] A contact assembly, the contact assembly comprising a contact point, the contact point being in contact with the power frequency high voltage generator to introduce the voltage of the power frequency high voltage generator;

[0006] a voltage dividing component connected to the contact component, the voltage dividing component being used to attenuate the voltage of the power frequency high voltage generator introduced by the contact component to obtain a first attenuated voltage;

[0007] A dynamic sampling component, the dynamic sampling component is connected to the voltage divider component, a sampling resistor is provided in the dynamic sampling component, and the sampling resistor is used to further attenuate the first attenuated voltage to obtain a second attenuated voltage;

[0008] A control component is connected to the dynamic sampling component, and is used to calculate the voltage value and / or voltage frequency and / or voltage distortion of the second attenuated voltage.

[0009] In one embodiment, the device further comprises a data output component, wherein the data output component is connected to the control component and is configured to output voltage value and / or voltage frequency and / or voltage distortion data within the control component.

[0010] In one possible implementation manner, the data output component is a Bluetooth module and / or a USB module.

[0011] In one embodiment, the resistance of the voltage divider component is 800 MΩ-1200 MΩ, and the resistance of the dynamic sampling component is 80 kΩ-120 kΩ.

[0012] In one embodiment, the contact assembly includes a contact probe and an insulating structure, the contact probe is wrapped by the insulating structure, and one end of the contact probe extends outward and is located outside the insulating structure to form the contact point.

[0013] In one embodiment, the contact assembly further includes a protective cover, wherein an accommodating cavity is provided in the protective cover along a first direction, and a first opening and a second opening are provided at both ends of the protective cover respectively, and the first opening and the second opening are both connected to the accommodating cavity, and the protective cover is located behind the power plug in the power frequency high voltage generator, and the power plug forms a circumferential limit for the protective cover; the protective cover is movably connected to one end of the insulating structure close to the contact point to form a first state and a second state, wherein,

[0014] In the first state, the contact point is located in the accommodating cavity to protect the contact point;

[0015] In the second state, the protective cover is located in the power socket of the power frequency high voltage generator, the contact point is located in the accommodating cavity, and the contact point contacts the contact position in the power socket to introduce the voltage of the power frequency high voltage generator.

[0016] In one embodiment, when the first state and the second state are switched, the contact point enters and exits the accommodating cavity through the second opening.

[0017] In one embodiment, a first baffle is detachably connected to the second opening of the protective cover; in the first state, the first baffle is used to block the second opening to ensure that the contact point is always located in the accommodating cavity; in the second state, the first baffle is separated from the protective cover to open the second opening.

[0018] In one embodiment, the protective cover is slidably connected to the insulating structure via a sliding device, the sliding device includes a sliding block and a sliding groove, the sliding block is adapted to the sliding groove, the sliding blocks are arranged on both sides of the insulating structure along the first direction, and the sliding groove is arranged in the protective cover along the first direction.

[0019] In one embodiment, a first partition and a second partition are respectively arranged in the accommodating cavity along the first direction, and the first partition and the second partition are spaced apart to divide the accommodating cavity into a first space, a second space and a third space. The second space and the third space are respectively located on both sides of the first space, and the first opening and the second opening are respectively arranged corresponding to the first space. The contact component is located in the first space, and the sliding groove is respectively located on the first partition and the second partition. A second baffle is respectively provided on the side of the first space and the second space close to the second opening. The sliding block extends into the second space and the third space respectively through the sliding groove, and a third baffle is respectively provided in the second space and the third space. The third baffle is connected to the sliding block, and an elastic member is provided between the second baffle and the third baffle, and the elastic member is respectively pressed against the second baffle and the third baffle.

[0020] Compared with the prior art, the power frequency high voltage generator testing device for electroscopes of the present application has the following beneficial effects:

[0021] During specific use, the user inserts the contact component into the socket of the industrial frequency high-voltage generator along the first direction, and further allows the contact point of the contact component to contact the contact position in the socket to introduce the voltage of the industrial frequency high-voltage generator, and gradually reduces the voltage through the voltage divider component and the dynamic sampling component, and finally realizes the calculation and reading of the voltage value and / or voltage frequency and / or voltage distortion in the control component.

[0022] Therefore, the present invention has the characteristics of reasonable structure and convenient use. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] Attachment Figure 1 This is a structural diagram of a power frequency high voltage generator testing device for an electroscope of the present application;

[0024] Attachment Figure 2 This is a structural diagram of the contact assembly of the present application in the first state;

[0025] Attachment Figure 3 This is a schematic structural diagram of the contact assembly of the present application in the second state;

[0026] Attachment Figure 4 This is a structural diagram of the protective cover of this application.

[0027] Description of the numbers in the figure:

[0028] 100, power frequency high voltage generator; 110, power socket; 120, contact position;

[0029] 200, contact assembly; 210, contact point; 220, contact probe; 230, insulation structure;

[0030] 240, protective cover; 241, accommodating cavity; 242, first opening; 243, second opening;

[0031] 244, first baffle; 245, sliding device; 245-1, sliding block; 245-2, sliding groove;

[0032] 251, first partition; 252, second partition; 253, first space; 254, second space;

[0033] 255, third space; 256, second baffle; 257, third baffle; 258, elastic member;

[0034] 300, voltage divider component;

[0035] 400, dynamic sampling component;

[0036] 500, control component;

[0037] 600. Data output component. DETAILED DESCRIPTION

[0038] In order to make the purpose, features, and advantages of this application more obvious and easy to understand, the technical solutions in the embodiments of this application will be clearly and completely described below in conjunction with the drawings in the embodiments of this application. Obviously, the described embodiments are only part of the embodiments of this application, not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by those skilled in the art without making creative efforts shall fall within the scope of protection of this application.

[0039] The technical problem existing in the prior art is that existing testing equipment is difficult to test the power frequency high voltage generator.

[0040] To this end, the present application provides a power frequency high voltage generator testing device for an electroscope, which includes:

[0041] The contact assembly includes a contact point, which contacts the power frequency high voltage generator to introduce the voltage of the power frequency high voltage generator;

[0042] A voltage divider component connected to the contact component, the voltage divider component is used to attenuate the voltage of the power frequency high voltage generator introduced by the contact component to obtain a first attenuated voltage;

[0043] A dynamic sampling component is connected to the voltage divider component. A sampling resistor is provided in the dynamic sampling component. The sampling resistor is used to further attenuate the first attenuated voltage to obtain a second attenuated voltage.

[0044] The control component is connected to the dynamic sampling component, and is used to calculate the voltage value and / or voltage frequency and / or voltage distortion of the second attenuated voltage.

[0045] Example:

[0046] Attachment Figure 1 This is a structural diagram of the power frequency high voltage generator 100 for the electroscope of this application. Figure 1 As shown, the present application provides a device for testing an electrical tester using a power-frequency high-voltage generator 100. The device is used to test the power-frequency high-voltage generator 100. The power-frequency high-voltage generator 100 includes a power socket 110 extending from the upper surface of the power-frequency high-voltage generator 100 along a first direction into the interior thereof. The power socket 110 has an opening on a side near the upper surface of the power-frequency high-voltage generator 100, through which a tester or a test device can enter the power socket 110. The bottom of the power socket 110 is provided with a contact 120 made of a conductive material, which electrically connects the tester or the test device to the power-frequency high-voltage generator 100. When the tester is inserted into the power socket 110 of the power-frequency high-voltage generator 100, the tester is tested by the power-frequency high-voltage generator 100. When the test device is inserted into the power socket 110 of the power-frequency high-voltage generator 100, the tester is tested by the test device.

[0047] Please refer to Figure 1 As shown, the testing device for the power frequency high voltage generator 100 for the electroscope includes a contact component 200, and a contact point 210 is formed at one end of the contact component 200. The contact point 210 is made of a conductive material. When the contact point 210 is in electrical contact with the contact position 120, the voltage of the power frequency high voltage generator 100 can be introduced into the testing device to realize the subsequent testing process of the testing device.

[0048] The contact assembly 200 includes a protective sleeve 240, which is connected to the contact assembly 200. The protective sleeve 240 is adapted to fit the electrical inlet 110. Furthermore, the outer circumference of the protective sleeve 240 is consistent with the dimensions of the electrical inlet 110, and a clearance is provided between the protective sleeve 240 and the electrical inlet 110 to provide circumferential positioning of the protective sleeve 240 by the electrical inlet 110. In one embodiment, the cross-sections of the protective sleeve 240 and the electrical inlet 110 are both rectangular.

[0049] When the contact assembly 200 is inserted into the electrical socket 110, the electrical socket 110 forms a circumferential limit on the protective cover 240, and the protective cover 240 can only move longitudinally within the electrical socket 110. Furthermore, the protective cover 240 can only move longitudinally within the electrical socket 110, which means that the contact point 210 can only move closer to or farther away from the contact position 120 in the longitudinal direction. This solves the problem of the contact point 210 and the contact position 120 being easily misaligned when manually connecting the contact point 210 and the contact position 120, thereby causing poor contact and further causing instability in the inspection device during the inspection process. Therefore, when the contact assembly 200 is inserted into the electrical socket 110 and the contact point 210 is moved to the bottom of the electrical socket 110, the contact point 210 and the contact position 120 are directly connected. After contact, the contact point 210 and the contact position 120 will not produce relative circumferential displacement, thereby ensuring the reliability of the connection between the contact point 210 and the contact position 120, and further ensuring the stability of the contact assembly 200 during the voltage introduction process.

[0050] After the contact point 210 is connected to the contact position 120, the protective cover 240 blocks the socket 110 to enclose the exposed contact point 210 in a closed space formed by the socket 110 and the protective cover 240, preventing external debris from accidentally drawing out the voltage, thereby enhancing the safety of the testing device.

[0051] Please continue to refer to Figure 1 As shown, the device for testing an electrical tester using an industrial frequency high voltage generator 100 includes a voltage dividing component 300 , which is composed of a voltage dividing resistor. The voltage dividing component 300 is used to attenuate the voltage of the industrial frequency high voltage generator 100 introduced by the contact component 200 to obtain a first attenuated voltage.

[0052] The electroscope's power-frequency high-voltage generator 100 testing device includes a dynamic sampling assembly 400 connected to a voltage divider assembly 300. The dynamic sampling assembly 400 includes a sampling resistor, which further attenuates the first attenuated voltage to obtain a second attenuated voltage. The voltage from the power-frequency high-voltage generator 100 introduced by the contact assembly 200 undergoes two voltage attenuations, achieving a measurable pressure range and enhancing detection safety.

[0053] In this embodiment, the testing device can implement the testing of the power frequency high voltage generator 100 for 0.4kV to 110kV electroscope.

[0054] In one embodiment, the resistance of the voltage divider component 300 is 800MΩ-1200MΩ, and the resistance of the dynamic sampling component 400 is 80KΩ-120KΩ. Furthermore, when the resistance of the voltage divider component 300 is 1000MΩ and the resistance of the dynamic sampling component 400 is 100KΩ, the attenuated voltage of the 0.4kV-110kV electroscope power frequency high voltage generator 100 is 0.004V-5V.

[0055] The testing device of the power frequency high voltage generator 100 for the electroscope includes a control component 500, which is connected to the dynamic sampling component 400. After receiving the second attenuated voltage after two voltage attenuations, the control component 500 can further calculate the voltage value and / or voltage frequency and / or voltage distortion of the second attenuated voltage.

[0056] The device for testing an electrical tester using a power frequency high voltage generator 100 includes a data output component 600 , which is connected to the control component 500 and is used to output voltage value and / or voltage frequency and / or voltage distortion data in the control component 500 .

[0057] In one embodiment, the data output component 600 is a Bluetooth module and / or a USB module.

[0058] Attachment Figure 2 1 is a structural diagram of the contact assembly 200 of the present application in the first state. Figure 3 This is a schematic diagram of the structure of the contact assembly 200 in the second state of the present application. Figure 2 and Figure 3 As shown, contact assembly 200 includes a contact probe 220 and an insulating structure 230. Contact probe 220 is made of a conductive material and is encased in insulating structure 230 to prevent leakage when voltage is applied to contact assembly 200. One end of contact probe 220 extends outward and is positioned outside insulating structure 230 to form contact point 210. Except for contact point 210, all other parts of contact probe 220 are encased in insulating structure 230.

[0059] In this embodiment, the protective cover 240 is movably connected to one end of the insulating structure 230 close to the contact point 210 , and the contact assembly 200 cooperates with the industrial frequency high voltage generator 100 to form a first state and a second state.

[0060] Please refer to Figure 2 As shown, the contact assembly 200 and the industrial frequency high voltage generator 100 are in the first state. In this state, the inspection device does not participate in the inspection work and therefore does not contact the industrial frequency high voltage generator 100. The contact point 210 is located in the accommodating cavity 241 to protect the contact point 210 and prevent the contact point 210 from colliding with foreign objects when not working, causing deformation and affecting the subsequent inspection effect.

[0061] Please refer to Figure 3As shown, the contact assembly 200 and the power-frequency high-voltage generator 100 are in the second state. In this state, the testing device is operational, with the protective cover 240 positioned within the power-frequency high-voltage generator 100's power-frequency high-voltage generator 100 and the contact point 210 within the accommodating cavity 241. Pressing the contact assembly 200 downward causes the contact point 210 to move downward and disengage from the protective cover 240, allowing the contact point 210 to contact the contact position 120 within the power-frequency high-voltage generator 100, thereby introducing the voltage from the power-frequency high-voltage generator 100. In this state, the power-frequency high-voltage generator 100 is circumferentially constrained by the power-frequency high-voltage generator 100. The protective cover 240 can only move longitudinally within the power-frequency high-voltage generator 100. Furthermore, the contact point 210 can only move longitudinally toward or away from the contact position 120. This prevents the contact point 210 from being easily misaligned with the contact position 120 when manually connecting the contact point 210 and the contact position 120, resulting in poor contact and further instability of the testing device during testing.

[0062] Attachment Figure 4 This is a schematic diagram of the structure of the protective cover 240 of this application. Figure 4 As shown, the protective cover 240 is provided with a housing cavity 241 along a first direction. A first opening 242 and a second opening 243 are provided at both ends of the protective cover 240, and both the first opening 242 and the second opening 243 are in communication with the housing cavity 241. The protective cover 240 is mounted on the outside of the contact assembly 200 through the housing cavity 241 to protect the contact point 210. Furthermore, the protective cover 240 is mounted on the outside of the end of the insulating structure 230 near the contact point 210. The contact assembly 200 enters the housing cavity 241 through the first opening 242. When switching between the first state and the second state, the contact point 210 enters and exits the housing cavity 241 through the second opening 243.

[0063] In one embodiment, the protective cover 240 and the insulating structure 230 are slidably connected via a sliding device 245, enabling relative movement between the protective cover 240 and the insulating structure 230. The sliding device 245 includes a sliding block 245-1 and a sliding slot 245-2. The sliding block 245-1 is adapted to fit within the sliding slot 245-2, thereby enabling a slidable connection between the sliding block 245-1 and the sliding slot 245-2. The sliding blocks 245-1 are positioned on either side of the insulating structure 230 along a first direction, while the sliding slot 245-2 is positioned within the protective cover 240 along the first direction. In one embodiment, both the insulating structure 230 and the contact probe 220 are shaft-like components. Furthermore, the sliding blocks 245-1 are symmetrically positioned on either side of the insulating structure 230 along its axis.

[0064] Please refer to Figure 4As shown, the accommodating cavity 241 is provided with a first partition 251 and a second partition 252 along a first direction, with the first partition 251 and the second partition 252 spaced apart. In one embodiment, the first partition 251 and the second partition 252 are spaced apart along a second direction, wherein the first direction is perpendicular to the second direction. Furthermore, the first direction is the height direction of the protective cover 240, and the second direction is the length direction of the protective cover 240, with the longitudinal direction being consistent with the height direction of the protective cover 240. The spacing between the first partition 251 and the second partition 252 divides the accommodating cavity 241 into a first space 253, a second space 254, and a third space 255. The second space 254 and the third space 255 are located on either side of the first space 253, i.e., the second space 254 and the third space 255 are adjacent to the first space 253. Furthermore, both sides of the first partition plate 251 and the second partition plate 252 are connected to the side walls of the accommodating cavity 241 to achieve relative isolation among the first space 253 , the second space 254 and the third space 255 .

[0065] The first opening 242 and the second opening 243 are disposed correspondingly to the first space 253, that is, the first opening 242 and the second opening 243 communicate only with the first space 253. The contact assembly 200 is located within the first space 253, and the sliding groove 245-2 is located on the first partition 251 and the second partition 252, respectively. In one embodiment, the sliding groove 245-2 passes through the first partition 251 and the second partition 252, respectively, and is located near the first opening 242 and the second opening 243, respectively. A second baffle 256 is disposed on both the first space 253 and the second space 254 near the second opening 243. Furthermore, a second baffle 256 is also disposed on both the first space 253 and the second space 254 near the first opening 242, thereby forming a relatively sealed first space 253 and second space 254. Furthermore, the upper and lower ends of the first and second partitions 251 and 252 are both disposed on second baffles 256. This allows the second baffles 256 to block the sliding block 245-1 during the switching process between the first and second states, confining the sliding block 245-1 within the sliding groove 245-2 to prevent separation between the protective cover 240 and the contact assembly 200. The sliding block 245-1 is connected to the contact assembly 200 and further connected to the insulating structure 230. The sliding block 245-1 extends through the sliding groove 245-2 into the second and third spaces 254 and 255, respectively. Third baffles 257 are disposed within the second and third spaces 254 and 255, respectively. The third baffles 257 are connected to the sliding block 245-1, allowing the third baffles 257 to move synchronously with the sliding block 245-1. An elastic member 258 is provided between the second baffle 256 and the third baffle 257. The elastic member 258 respectively abuts against the second baffle 256 and the third baffle 257 to achieve isolation between the second baffle 256 and the third baffle 257, and forms elastic storage or elastic release during the conversion process between the first state and the second state.

[0066] During use, the user presses the contact assembly 200 downward, simultaneously driving the sliding block 245-1 downward within the sliding slot 245-2. The elastic member 258 accumulates force, causing the contact point 210 to simultaneously move through the second opening 243 and connect with the contact position 120, thereby establishing the second state. To switch from the second state to the first state, the user releases the pressure on the contact assembly 200. Due to the elastic release of the elastic member 258, the contact point 210 returns to the housing 241, and the protective cover 240 protects the contact point 210.

[0067] In one embodiment, the elastic member 258 is made of an insulating material. Furthermore, the elastic material is made of a rubber material.

[0068] Please refer to Figure 4As shown, a first baffle 244 is detachably connected to the second opening 243 of the protective cover 240. In a first state, the first baffle 244 is used to block the second opening 243 to ensure that the contact point 210 is always located within the accommodating cavity 241. In a second state, the first baffle 244 is separated from the protective cover 240 to open the second opening 243.

[0069] In one embodiment, the first baffle 244 is provided with a sliding groove 245-2 adapted to fit the first baffle 244. The sliding groove 245-2 is open at both ends, and the first baffle 244 can slide out of the sliding groove 245-2. The first baffle 244 and the protective cover 240 are connected and disconnected by the sliding connection between the first baffle 244 and the protective cover 240.

[0070] In the description of this specification, the reference terms "one embodiment," "some embodiments," "example," "specific example," or "some examples" mean that the specific features, structures, materials, or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present application. Moreover, the specific features, structures, materials, or characteristics described may be combined in any appropriate manner in any one or more embodiments or examples. In addition, those skilled in the art may combine and combine different embodiments or examples described in this specification, as well as features of different embodiments or examples, unless they are mutually inconsistent.

[0071] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features being referred to. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. Throughout the description of this application, "plurality" means two or more, unless otherwise specifically defined.

[0072] The above description is merely a specific embodiment of the present application, but the scope of protection of the present application is not limited thereto. Any changes or substitutions that can be easily conceived by a person skilled in the art within the technical scope disclosed in this application should be included in the scope of protection of this application. Therefore, the scope of protection of this application should be based on the scope of protection of the claims.

Claims

1. A power frequency high voltage generator testing device for an electroscope, characterized in that: include: A contact assembly, the contact assembly comprising a contact point, the contact point being in contact with the power frequency high voltage generator to introduce a voltage of the power frequency high voltage generator; A voltage divider component, the voltage divider component is connected to the contact component, and the voltage divider component is used to attenuate the voltage of the power frequency high voltage generator introduced by the contact component to obtain a first attenuated voltage; A dynamic sampling component, the dynamic sampling component is connected to the voltage dividing component, a sampling resistor is provided in the dynamic sampling component, and the sampling resistor is used to further attenuate the first attenuated voltage to obtain a second attenuated voltage; A control component is connected to the dynamic sampling component, and is used to calculate the voltage value and / or voltage frequency and / or voltage distortion of the second attenuated voltage.

2. The power frequency high voltage generator testing device for an electroscope according to claim 1, characterized in that: It also includes a data output component, which is connected to the control component and is used to output the voltage value and / or voltage frequency and / or voltage distortion data in the control component.

3. The power frequency high voltage generator testing device for an electroscope according to claim 2, characterized in that: The data output component is a Bluetooth module and / or a USB module.

4. The power frequency high voltage generator testing device for electroscope according to claim 1, characterized in that: The resistance of the voltage divider component is 800MΩ-1200MΩ, and the resistance of the dynamic sampling component is 80kΩ-120kΩ.

5. The power frequency high voltage generator testing device for electroscope according to claim 1, characterized in that: The contact assembly includes a contact probe and an insulating structure. The insulating structure is wrapped around the contact probe. One end of the contact probe extends outward and is located outside the insulating structure to form the contact point.

6. The power frequency high voltage generator testing device for an electroscope according to claim 5, characterized in that: The contact assembly further includes a protective cover, wherein a housing cavity is arranged in the protective cover along a first direction, and a first opening and a second opening are arranged at both ends of the protective cover respectively, and the first opening and the second opening are both connected to the housing cavity, and the protective cover is located behind the power plug in the power frequency high voltage generator, and the power plug forms a circumferential limit for the protective cover; the protective cover is movably connected to an end of the insulating structure close to the contact point to form a first state and a second state, wherein, In the first state, the contact point is located in the accommodating cavity to protect the contact point; In the second state, the protective cover is located in the power socket of the power frequency high voltage generator, the contact point is located in the accommodating cavity, and the contact point contacts the contact position in the power socket to introduce the voltage of the power frequency high voltage generator.

7. The power frequency high voltage generator testing device for an electroscope according to claim 6, characterized in that: When the first state and the second state are switched, the contact point enters and exits the accommodating cavity through the second opening.

8. The power frequency high voltage generator testing device for an electroscope according to claim 7, characterized in that: A first baffle is detachably connected to the second opening of the protective cover; in the first state, the first baffle is used to block the second opening to ensure that the contact point is always located in the accommodating cavity; in the second state, the first baffle is separated from the protective cover to open the second opening.

9. The power frequency high voltage generator testing device for an electroscope according to claim 6, characterized in that: The protective cover is slidably connected to the insulating structure via a sliding device, the sliding device comprises a sliding block and a sliding groove, the sliding block is adapted to the sliding groove, the sliding blocks are arranged on both sides of the insulating structure along the first direction, and the sliding groove is arranged in the protective cover along the first direction.

10. The power frequency high voltage generator testing device for an electroscope according to claim 9, characterized in that: A first partition and a second partition are respectively arranged in the accommodating cavity along the first direction, and the first partition and the second partition are arranged at intervals to divide the accommodating cavity into a first space, a second space and a third space. The second space and the third space are respectively located on both sides of the first space, and the first opening and the second opening are arranged corresponding to the first space. The contact component is located in the first space, and the sliding groove is respectively located on the first partition and the second partition, and a second baffle is respectively arranged on one side of the first space and the second space close to the second opening. The sliding block extends into the second space and the third space respectively through the sliding groove, and a third baffle is respectively arranged in the second space and the third space, and the third baffle is connected to the sliding block, and an elastic member is arranged between the second baffle and the third baffle, and the elastic member is respectively abutted against the second baffle and the third baffle.

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