Spring probe elongation detection device

Abstract

The utility model discloses a spring probe extension detection device, which is characterized in that a to-be-tested part is mounted in a mounting groove, at least one pair of spring probes are mounted on the to-be-tested part, a sensing part of an induction mechanism is arranged above the mounting groove, and a preset detection distance is formed between the spring probes and the induction mechanism; and when the at least one pair of spring probes are attracted and the extension of the spring probes reaches the preset detection distance, the at least one pair of spring probes are in contact with the sensing part, and the prompting device gives out a qualification prompt, so that the problems that the extension length of the existing spring probes is too long, the impact force on a chip is too large, and the chip is damaged can be solved. Therefore, the extension length of the spring probe is ensured to meet the requirement of the flying probe test, and the chip is ensured not to be damaged during the flying probe test.

Description

Technical Field

[0001] The present application relates to the field of semiconductor testing technology, and in particular to a spring probe elongation detection device. Background Art

[0002] Flying probe testing replaces the bed of nails with probes, using multiple motor-driven, fast-moving electrical probes to contact the pins of the device and perform electrical measurements.

[0003] At present, spring probes are often needed in flying probe tests. However, with the advancement of chip manufacturing technology, chips are getting smaller and smaller, and the impact force that chips can withstand is getting smaller. If the spring probe is extended too long during flying probe testing, the impact force on the chip will become greater, which can easily damage the chip, causing it to break and become scrapped. Summary of the invention

[0004] The embodiment of the present application provides a spring probe elongation detection device, which can solve the problem that the existing spring probe has an excessively long extension length and exerts excessive impact force on the chip, resulting in chip damage and scrapping.

[0005] The present application provides a spring probe elongation detection device, comprising:

[0006] A workbench having a mounting slot thereon;

[0007] The mechanism to be tested is located below the workbench and comprises a part to be tested and a driving part. The part to be tested is installed in the installation groove, and at least one pair of spring probes is installed on the part to be tested.

[0008] A sensing mechanism, comprising a sensing part and a prompting device, wherein the sensing part is arranged above the mounting slot;

[0009] An adjusting mechanism, disposed on the workbench and connected to the sensing mechanism, for adjusting the height of the sensing mechanism;

[0010] Among them, when at least one pair of the spring probes are not attracted, there is a preset detection distance between the spring probes and the sensing mechanism. When at least one pair of the spring probes are attracted and the extension of the spring probes reaches the preset detection distance, at least one pair of the spring probes are in contact with the sensing part, and the prompt device issues a qualified prompt.

[0011] In some embodiments, a probe mounting hole is provided on the part to be tested, and the spring probe is arranged in the probe mounting hole.

[0012] In some embodiments, the driving unit includes a driving power source and a driving coil, wherein the driving power source is connected to one of the spring probes, and when the driving coil is energized, at least one pair of the spring probes is attracted.

[0013] In some embodiments, the sensing portion includes a mounting block and a contact block connected to the mounting block, the mounting block is connected to the adjustment mechanism, and the contact block is disposed above the mounting slot.

[0014] In some embodiments, the sensing portion includes a terminal, the terminal is disposed on the contact block, and the terminal is connected to the prompt device.

[0015] In some embodiments, the sensing mechanism includes a proximity sensor and a distance sensing light, the proximity sensor is disposed on the mounting block, and the proximity sensor is connected to the distance sensing light.

[0016] In some embodiments, the adjustment mechanism includes a mounting structure and an adjustment structure; the mounting structure includes a fixing plate and a mounting plate connected to the fixing plate, the mounting plate is connected to the workbench, the fixing plate is connected to the adjustment structure, and the adjustment structure is used to adjust the height of the sensing mechanism.

[0017] In some embodiments, the adjustment mechanism includes a locking structure, and the locking structure is used to lock the adjustment structure.

[0018] In some embodiments, the spring probe elongation detection device includes a needle adjusting screwdriver, and the needle adjusting screwdriver is used to adjust the elongation of the spring probe.

[0019] In some embodiments, the preset detection distance is 0.14 mm.

[0020] The present application provides a spring probe elongation detection device, which is implemented by installing the part to be tested in the installation groove, and at least one pair of spring probes are installed on the part to be tested, and the sensing part of the sensing mechanism is arranged above the installation groove, and a preset detection distance is provided between the spring probe and the sensing mechanism, so that when at least one pair of the spring probes are attracted and the extension of the spring probes reaches the preset detection distance, at least one pair of the spring probes are in contact with the sensing part, and the prompt device issues a qualified prompt, which can solve the problem that the existing spring probes have too long extension length, and the impact force on the chip is too large, resulting in chip damage and scrapping, and ensure that the extension length of the spring probe meets the needs of the flying probe test, and ensure that the chip will not be damaged during the flying probe test. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] The technical solution and other beneficial effects of the present application will be made apparent by describing in detail the specific implementation methods of the present application in conjunction with the accompanying drawings.

[0022] Figure 1 is a three-dimensional diagram of a spring probe elongation detection device provided in one embodiment of the present application;

[0023] Figure 2 is a three-dimensional diagram of a spring probe elongation detection device provided by another embodiment of the present application;

[0024] Figure 3 This is a structural diagram of the positional relationship between the mechanism to be tested and the sensing mechanism provided in one embodiment of the present application;

[0025] Figure 4 It is a schematic diagram of the assembly of the adjustment mechanism and the sensing mechanism provided in one embodiment of the present application.

[0026] 10. Workbench;

[0027] 20, a mechanism to be tested; 210, a driving unit; 220, a unit to be tested; 2201, a spring probe; 230, a driving power source; 240, a needle screwdriver;

[0028] 30, sensing mechanism; 310, sensing part; 3101, mounting block; 3101A, vertical part; 3101B, horizontal part; 3102, contact block; 3103, terminal; 3104, proximity sensor;

[0029] 40. Adjustment mechanism; 410. Mounting structure; 4101. Mounting plate; 4102. Fixing plate; 420. Adjustment structure; 4201. First adjustment plate; 4202. Second adjustment plate; 4203. Adjustment knob; 430. Locking structure; 4301. Locking mounting plate; 4302. Locking knob. DETAILED DESCRIPTION

[0030] The present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It is to be understood that the specific embodiments described herein are only used to explain the relevant invention, rather than to limit the invention. It is also necessary to explain that, for ease of description, only the parts related to the invention are shown in the accompanying drawings.

[0031] It should be noted that, in the absence of conflict, the embodiments and features in the embodiments of the present application can be combined with each other. The present application will be described in detail below with reference to the accompanying drawings and in combination with the embodiments.

[0032] Flying probe test is mainly used in the printed circuit board industry to detect the on-off characteristics of printed circuit boards. It is an electrical performance testing device. It uses a probe installed on an arm, which moves under the drive of the arm so that the probe contacts different contacts on the circuit board to complete the test.

[0033] Spring probes are often needed in flying probe tests. However, with the advancement of chip manufacturing technology, chips are getting smaller and smaller, and the impact force that chips can withstand is getting smaller. The existing three-dimensional striker detection can only detect objects that are larger than the striker diameter and must be flat. The three-dimensional image measurement is not at the same height, and the error in detecting a 0.07mm flat needle tip is large, which cannot solve the technical difficulties of microchip detection. If the spring probe is extended too long during flying probe testing, the impact force on the chip will increase, which is easy to damage the chip, resulting in chip breakage and scrap.

[0034] In response to the above technical issues, such as Figure 1 , 2 As shown, this embodiment provides a spring probe 2201 elongation detection device, including:

[0035] A workbench 10, on which a mounting groove is provided;

[0036] The test mechanism 20 is located below the workbench 10 and comprises a test part 220 and a driving part 210. The test part 220 is installed in the installation groove, and at least one pair of spring probes 2201 is installed on the test part 220.

[0037] The sensing mechanism 30 comprises a sensing part 310 and a prompting device, wherein the sensing part 310 is arranged above the mounting slot;

[0038] The adjusting mechanism 40 is disposed on the workbench 10 and connected to the sensing mechanism 30, and is used to adjust the height of the sensing mechanism 30;

[0039] Among them, when at least one pair of spring probes 2201 are not attracted, there is a preset detection distance between the spring probes 2201 and the sensing mechanism 30. When at least one pair of spring probes 2201 are attracted and the extension of the spring probes 2201 reaches the preset detection distance, at least one pair of spring probes 2201 contacts the sensing part 310, and the prompt device issues a qualified prompt.

[0040] It should be noted that the workbench 10 is usually provided with legs or mounted on other equipment. The workbench 10 is also provided with mounting holes, which are used to install the adjustment mechanism 40. Usually, there are 4 mounting holes to ensure that the adjustment mechanism 40 remains horizontal after being connected to the workbench 10, thereby ensuring that the sensing mechanism 30 remains horizontal. Ensuring that the sensing mechanism 30 is horizontal can ensure the accuracy of the elongation detection of the spring probe 2201.

[0041] It should be noted that the upper surface of the part to be tested 220 is flush with the upper surface of the workbench 10 to ensure the accuracy and uniformity of the detection distance during detection. When at least one pair of spring probes 2201 are not attracted, the upper ends of the spring probes 2201 are flush with the upper surface of the workbench 10. The material of the part to be tested 220 can be ceramic.

[0042] It should be noted that at least one pair of spring probes 2201 can be multiple pairs of spring probes 2201, and the number of pairs of spring probes 2201 corresponds one-to-one to the number of sensing mechanisms 30, that is, a pair of spring probes 2201 corresponds to one sensing mechanism 30. When multiple pairs of spring probes 2201 and multiple sensing mechanisms 30 are set, multiple pairs of spring probes 2201 can be detected at one time, which helps to improve detection efficiency.

[0043] In some embodiments, a probe mounting hole is disposed on the part to be tested 220 , and the spring probe 2201 is disposed in the probe mounting hole.

[0044] It should be noted that if Figure 3 As shown, the driving part 210 is located on the left side, and the part to be tested 220 is located on the right side. The number of probe mounting holes on the part to be tested 220 corresponds to the number of spring probes 2201, and the probe mounting holes are arranged in a vertical direction. This ensures that the spring probes 2201 installed in the probe mounting holes are in a vertical state to ensure accurate detection. If the probe mounting holes are tilted, the spring probes 2201 installed in the probe mounting holes will be tilted accordingly, which will cause inaccurate detection.

[0045] In some embodiments, the driving unit 210 includes a driving power source 230 and a driving coil. The driving power source 230 is connected to a spring probe 2201 . When the driving coil is energized, at least one pair of spring probes 2201 is attracted.

[0046] It should be noted that the driving power supply 230 can be a wiring clamp, which is used to provide power to the spring probe 2201. The voltage level of the power provided by the wiring clamp can be 24V, and 24V is a safe voltage level, which can provide power to the spring probe 2201 and avoid leakage of electricity to hurt people. The wiring clamp is connected to the tail of the spring probe 2201 (i.e., the lower end).

[0047] In some embodiments, the sensing portion 310 includes a mounting block 3101 and a contact block 3102 connected to the mounting block 3101 , the mounting block 3101 is connected to the adjustment mechanism 40 , and the contact block 3102 is disposed above the mounting slot.

[0048] It should be noted that the contact block 3102 is arranged above the mounting groove, the part to be tested 220 is installed in the mounting groove, and at least one pair of spring probes 2201 are installed on the part to be tested 220, that is, the positions of the contact block 3102 and the spring probes 2201 correspond to each other through the mounting groove, and when the spring probes 2201 are extended, they can move toward the contact block 3102. The contact block 3102 is usually made of conductive material, such as copper, aluminum, etc. When the two spring probes 2201 are in contact with the contact block 3102, since the spring probes 2201 are charged, the contact block 3102 is turned on and charged, so that the elongation (extended length) of the spring probes 2201 can be detected.

[0049] It should be noted that the mounting block 3101 includes a vertical portion 3101A and a horizontal portion 3101B, the vertical portion 3101A is perpendicular to the workbench 10 and connected to the adjustment mechanism 40, the horizontal portion 3101B is parallel to the workbench 10, the left end of the horizontal portion 3101B is connected to the vertical portion 3101A, and the front side of the horizontal portion 3101B is connected to the contact block 3102, wherein the horizontal portion 3101B is parallel to the workbench 10 to ensure that the contact block 3102 is parallel to the workbench 10.

[0050] It should be noted that a level measuring device may be provided on the horizontal portion 3101B or the contact block 3102 to detect whether the contact block 3102 is level, so as to make timely adjustments when the levelness of the contact block 3102 does not meet the requirements.

[0051] In some embodiments, the sensing mechanism 30 includes a proximity sensor 3104 and a distance sensing light. The proximity sensor 3104 is disposed on the mounting block 3101 , and the proximity sensor 3104 is connected to the distance sensing light.

[0052] It should be noted that the proximity sensor 3104 is arranged on the horizontal portion 3101B of the mounting block 3101, and the mounting height of the proximity sensor 3104 is the same as the mounting height of the contact block 3102, so as to detect the distance between the contact block 3102 and the workbench 10, or the upper surface of the part to be tested 220. Since there is a preset detection distance between the sensing portion 310 and the workbench 10, due to the effect of gravity, the sensing portion 310 and / or the mechanism to be tested 20 may move downward to change the preset detection distance. Therefore, the proximity sensor 3104 may be arranged to detect the distance between the contact block 3102 and the workbench 10. If the distance between the proximity sensor 3104 and the upper surface of the workbench 10, or the part to be tested 220 is exactly the preset detection distance, the distance sensing light is always on, indicating a qualified condition; if the distance between the proximity sensor 3104 and the upper surface of the workbench 10, or the part to be tested 220 is greater than or less than the preset detection distance, the distance sensing light is always off, indicating an abnormality.

[0053] In some embodiments, the sensing unit 310 includes a terminal 3103 , which is disposed on the contact block 3102 and connected to the prompting device.

[0054] It should be noted that, when the driving coil in the driving unit 210 is energized to extend the spring probe 2201, if the extension of the spring probe 2201 reaches the preset detection distance, then a pair of spring probes 2201 will contact the contact block 3102, the contact block 3102 will be turned on and energized, and then the terminal 3103 will be energized. By connecting the terminal 3103 to the prompt device, it can be clearly observed whether the extension of the spring probe 2201 reaches the preset detection distance. If the extension of the spring probe 2201 does not reach the preset detection distance, then the pair of spring probes 2201 will not contact the contact block 3102, the contact block 3102 will not be energized, and then the terminal 3103 will not be energized, and the prompt device will not issue a prompt; wherein the prompt device can be a prompt light, a prompt voice, etc.

[0055] In some embodiments, the adjustment mechanism 40 includes a mounting structure 410 and an adjustment structure 420; the mounting structure 410 includes a fixing plate 4102 and a mounting plate 4101 connected to the fixing plate 4102, the mounting plate 4101 is connected to the workbench 10, the fixing plate 4102 is connected to the adjustment structure 420, and the adjustment structure 420 is used to adjust the height of the sensing mechanism 30.

[0056] It should be noted that multiple height knobs can be set on the lower side of the mounting plate 4101, and the height knobs can be used to level, raise or lower the mounting plate 4101. The mounting plate 4101 can be connected to the workbench 10 through the mounting holes on the workbench 10. The mounting plate 4101 is arranged horizontally, and the right side of the mounting plate 4101 is connected to the fixed plate 4102. The fixed plate 4102 is arranged vertically, and the right side of the fixed plate 4102 is connected to the adjustment structure 420.

[0057] It should be noted that if Figure 4 As shown, the adjustment structure 420 includes a first adjustment plate 4201, a second adjustment plate 4202 and an adjustment knob 4203. The first adjustment plate 4201 is fixedly connected to the fixed plate 4102, the second adjustment plate 4202 is fixedly connected to the mounting block 3101, and the adjustment knob 4203 is arranged between the first adjustment plate 4201 and the second adjustment plate 4202. The lower end of the adjustment knob 4203 is connected to a lead screw or a bolt, which is threadedly connected to the second adjustment plate 4202 so that when the adjustment knob 4203 is rotated, the sensor part 310 can be moved up and down.

[0058] It should be noted that when rotating the adjustment knob 4203 to adjust the height of the sensing portion 310 , a feeler gauge or a micrometer may be used for measurement to ensure that the distance between the contact block 3102 and the workbench 10 is a preset detection distance.

[0059] In some embodiments, the adjustment mechanism 40 includes a locking structure 430 , and the locking structure 430 is used to lock the adjustment structure 420 .

[0060] It should be noted that if Figure 4 As shown, the locking structure 430 is arranged on the side (front or back) of the adjustment structure 420, and the locking structure 430 includes a locking knob 4302 and a locking mounting plate 4301. The locking mounting plate 4301 is arranged on the first adjustment plate 4201. The locking mounting plate 4301 is provided with a locking groove, and a locking knob 4302 is provided in the locking groove. After the height of the sensor part 310 is adjusted by the adjustment knob 4203, the locking knob 4302 can be rotated to press against the first adjustment plate 4201 and the second adjustment plate 4202 to prevent the sensor part 310 from moving downward under the action of gravity.

[0061] In some embodiments, the spring probe 2201 elongation detection device includes a needle adjusting screwdriver 240 , and the needle adjusting screwdriver 240 is used to adjust the elongation of the spring probe 2201 .

[0062] In some embodiments, the preset detection distance is 0.14 mm.

[0063] It should be noted that when the prompt device does not issue a prompt, it means that the extension of the spring probe 2201 has not reached the preset detection distance. At this time, the extension of the spring probe 2201 can be adjusted by adjusting the needle screwdriver 240. After the adjustment is completed, re-testing is performed to know that the extension of the spring probe 2201 reaches the preset detection distance.

[0064] It should be noted that in order to detect whether the spring probe 2201 is extended too long, the contact block 3102 can be replaced by a pressure sensor, and the base plate of the pressure sensor can be used as the contact block 3102. When the spring probe 2201 is extended too long, the pressure received by the base plate of the pressure sensor (i.e., the contact block 3102) will be too large. At this time, it can be determined that the spring probe 2201 is extended too long and needs to be adjusted by the needle screwdriver 240. The pressure threshold of the pressure sensor for determining whether the spring probe 2201 is extended too long can be adjusted according to actual needs, and the preset detection distance can be adjusted according to actual needs. This application does not make specific limitations.

[0065] In summary, the embodiment of the present application provides a spring probe 2201 elongation detection device, which installs the part to be tested 220 in the installation groove, and at least one pair of spring probes 2201 is installed on the part to be tested 220, and the sensing part 310 of the sensing mechanism 30 is arranged above the installation groove, and a preset detection distance is provided between the spring probe 2201 and the sensing mechanism 30, so that when at least one pair of spring probes 2201 are attracted and the elongation of the spring probes 2201 reaches the preset detection distance, at least one pair of spring probes 2201 contacts the sensing part 310, and the prompt device issues a qualified prompt, which can solve the problem that the existing spring probe 2201 has a too long extension length and a too large impact force on the chip, resulting in chip damage and scrapping, and ensures that the extension length of the spring probe 2201 meets the needs of the flying probe test, and ensures that the chip will not be damaged during the flying probe test.

[0066] It should be noted that the terms used in this application are only for describing specific embodiments, rather than limiting the scope of this application. As shown in the specification and claims of this application, unless the context clearly indicates an exception, the words "one", "a", "a kind of" and / or "the" do not specifically refer to the singular, but may also include the plural. The terms "include", "comprise" or any other variant thereof are intended to cover non-exclusive inclusion, so that the process, method or device including a series of elements includes not only those elements, but also includes other elements not explicitly listed, or also includes elements inherent to such process, method or device. In the absence of further restrictions, the elements defined by the sentence "including one..." do not exclude the presence of other identical elements in the process, method or device including the elements.

[0067] It should also be noted that the terms "center", "up", "down", "left", "right", "vertical", "horizontal", "inside", "outside", etc., indicating the orientation or position relationship, are based on the orientation or position relationship shown in the drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present application. Unless otherwise clearly specified and limited, the terms "installed", "connected", "connected", etc. should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be an indirect connection through an intermediate medium, or it can be a connection between the two elements. For those of ordinary skill in the art, the specific meanings of the above terms in this application can be understood according to specific circumstances.

[0068] This article uses specific examples to illustrate the principles and implementation methods of this application. The description of the above embodiments is only used to help understand the method and its core ideas of this application. The above is only the preferred implementation method of this application. It should be pointed out that due to the limitations of textual expression and the objective existence of infinite specific structures, ordinary technicians in this technical field can make several improvements, modifications or changes without departing from the principles of the present invention, and can also combine the above technical features in an appropriate manner; these improvements, modifications, changes or combinations, or the direct application of the inventive concept and technical solution to other occasions without improvement, should be regarded as the scope of protection of this application.

[0069] It is understood that the various numbers involved in the embodiments of the present application are only for the convenience of description and are not used to limit the scope of the embodiments of the present application. The size of the sequence number of the above-mentioned processes does not mean the order of execution, and the execution order of each process should be determined by its function and internal logic.

[0070] The above is a detailed introduction to a connection structure and a lamp provided in an embodiment of the present application. Specific examples are used in this article to illustrate the principles and implementation methods of the present application. The description of the above embodiments is only used to help understand the method of the present application and its core idea; at the same time, for general technical personnel in this field, according to the idea of ​​the present application, there will be changes in the specific implementation method and application scope. In summary, the content of this specification should not be understood as a limitation on the present application.

Claims

1. A spring probe elongation detection device, characterized in that: include: A workbench having a mounting slot thereon; The mechanism to be tested is located below the workbench and comprises a part to be tested and a driving part. The part to be tested is installed in the installation groove, and at least one pair of spring probes is installed on the part to be tested. A sensing mechanism, comprising a sensing part and a prompting device, wherein the sensing part is arranged above the mounting slot; An adjusting mechanism, disposed on the workbench and connected to the sensing mechanism, for adjusting the height of the sensing mechanism; Among them, when at least one pair of the spring probes are not attracted, there is a preset detection distance between the spring probes and the sensing mechanism. When at least one pair of the spring probes are attracted and the extension of the spring probes reaches the preset detection distance, at least one pair of the spring probes are in contact with the sensing part, and the prompt device issues a qualified prompt.

2. The spring probe elongation detection device according to claim 1, characterized in that: The part to be tested is provided with a probe installation hole, and the spring probe is arranged in the probe installation hole.

3. The spring probe elongation detection device according to claim 1, characterized in that: The driving part includes a driving power source and a driving coil. The driving power source is connected to one of the spring probes. When the driving coil is energized, it attracts at least one pair of the spring probes.

4. The spring probe elongation detection device according to claim 1, characterized in that: The sensing part comprises a mounting block and a contact block connected to the mounting block, the mounting block is connected to the adjusting mechanism, and the contact block is arranged above the mounting groove.

5. The spring probe elongation detection device according to claim 4, characterized in that: The sensing part comprises a terminal, the terminal is arranged on the contact block, and the terminal is connected to the prompting device.

6. The spring probe elongation detection device according to any one of claims 4 to 5, characterized in that: The sensing mechanism comprises a proximity sensor and a distance sensing lamp. The proximity sensor is arranged on the mounting block, and the proximity sensor is connected to the distance sensing lamp.

7. The spring probe elongation detection device according to claim 1, characterized in that: The adjustment mechanism includes a mounting structure and an adjustment structure; The mounting structure includes a fixing plate and a mounting plate connected to the fixing plate, the mounting plate is connected to the workbench, the fixing plate is connected to the adjusting structure, and the adjusting structure is used to adjust the height of the sensing mechanism.

8. The spring probe elongation detection device according to claim 7, characterized in that: The adjusting mechanism comprises a locking structure, and the locking structure is used to lock the adjusting structure.

9. The spring probe elongation detection device according to claim 1, characterized in that: The spring probe elongation detection device comprises a needle adjusting screwdriver, and the needle adjusting screwdriver is used to adjust the elongation of the spring probe.

10. The spring probe elongation detection device according to claim 1, characterized in that: The preset detection distance is 0.14 mm.

Images