Multi-channel memory chip power consumption analysis test machine
By using a combination of linear slide table, feeding mechanism and feeding mechanism in the multi-channel memory chip power consumption analysis and testing machine, the automated delivery and interface connection of the memory chip are realized, solving the problem of low automation in the existing technology and improving the Test efficiency and accuracy.
Patent Information
- Application Number
- CN202421174237.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-05-28
- Publication Date
- 2024-12-27
- Estimated Expiration
- 2034-05-28
AI Technical Summary
When used, existing multi-channel power consumption analysis and testing machines require manual insertion of memory chips into the interface in sequence, which is low in automation, resulting in increased workload of operators and reduced testing efficiency.
A multi-channel memory chip power consumption analysis and testing machine is designed, using a linear slide table, feeding mechanism and feeding mechanism to realize the automatic delivery and interface connection of the memory chip through components such as driving motors, turntables, feeding grooves and push rods. , and combine the indicator light to indicate whether it is qualified or unqualified.
It improves the degree of automation of tests, reduces the work burden of operators, improves detection efficiency, and quickly and accurately judges the qualified status of the memory chip through indicator lights.
Smart Images
Figure CN222260532U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of memory chip testing, in particular to a multi-channel memory chip power consumption analysis tester. Background Art
[0002] A memory chip is an integrated circuit chip used to store data. It can store various types of data, such as programs, documents, images, audio, and video. The quality of the chip needs to be controlled when it is put into use. Among them, a chip power consumption tester is a device used to test the power consumption of a memory chip.
[0003] In order to improve the efficiency of memory chip power consumption analysis test, existing test machines usually have multiple chip interfaces. After the memory chips are inserted, the power consumption of a large number of memory chips can be tested and analyzed at the same time. Although the existing multi-channel power consumption analysis test machine can detect a large number of memory chips at the same time when in use, it is necessary to manually insert the memory chips into the interface one by one during operation, and the degree of automation is low, which not only increases the workload of operators, but also leads to a decrease in the efficiency of memory chip power consumption test. Therefore, in response to the above problems, we propose a new type of multi-channel memory chip power consumption analysis test machine. Utility Model Content
[0004] The purpose of the utility model is to solve the problem in the prior art that although a multi-channel power consumption analysis test machine can detect a large number of memory chips at the same time when in use, it is necessary to manually insert the memory chips into the interface one by one during operation, and the degree of automation is low, which not only increases the workload of the operator, but also leads to a decrease in the efficiency of the memory chip power consumption test. A multi-channel memory chip power consumption analysis test machine is proposed.
[0005] In order to achieve the above-mentioned purpose, the utility model adopts the following technical scheme: a multi-channel storage chip power consumption analysis test machine, including a test machine body, a linear slide is installed near the top of the front surface of the test machine body, a feeding mechanism is arranged on the front side of the linear slide, a plurality of chip interfaces are equidistantly provided near the middle of the front surface of the test machine body, a loading mechanism is arranged on the front surface of the test machine body, the loading mechanism includes a material receiving shell, a plurality of accommodating grooves are equidistantly provided on the top of the material receiving shell, the positions of the accommodating grooves and the chip interfaces correspond, a push plate is arranged inside the accommodating groove, the feeding mechanism includes a circular shell, a turntable is rotatably connected inside the circular shell, and a plurality of material guide grooves are equidistantly provided on the outer surface of the turntable.
[0006] Preferably, a driving motor is installed on the front surface of the circular shell, and the output end of the driving motor slides through the outer surface of the circular shell and extends to the other side.
[0007] Preferably, the output end of the driving motor is fixedly connected to the center of the front surface of the turntable, and the circular shell is installed on the slide seat of the linear slide.
[0008] Preferably, the top of the circular shell is fixedly connected with a connecting channel, and the top and bottom of the circular shell are both provided with connecting channels.
[0009] Preferably, the top of the circular shell is fixedly connected to a hopper, and an indicator light is embedded on the front surface of the test machine body at a position above the chip interface.
[0010] Preferably, a plurality of electric push rods are equidistantly mounted on the front surface of the material receiving shell, and the telescopic ends of the electric push rods slide through the front surface of the material receiving shell and extend to the rear side.
[0011] Preferably, a pressure sensor is installed at the telescopic end of the electric push rod, and the pressure sensor is connected to the push plate.
[0012] Compared with the prior art, the advantages and positive effects of the utility model are:
[0013] 1. In the utility model, when in use, the storage chips are adjusted in the same direction and then put into the hopper. Then, the storage chips can be put into the receiving slots in sequence by the cooperation of the driving motor, the turntable, the guide trough and the linear slide. Then, the storage chips can be connected with the chip interface of the test machine body by the cooperation of the electric push rod and the push plate. The overall automation level is high, which reduces the workload of the operator and improves the detection efficiency.
[0014] 2. In the utility model, when the power consumption test of the memory chip is completed and qualified, the test machine body will start the corresponding indicator light to light up green, and the indicator light corresponding to the unqualified memory chip will light up red. Then the staff will pull out the memory chip and take it out of the receiving slot upward. The qualified status of the memory chip can be judged quickly and accurately through the indicator light prompt, and the use effect is better. BRIEF DESCRIPTION OF THE DRAWINGS
[0015] Figure 1 A three-dimensional diagram of a multi-channel memory chip power consumption analysis and testing machine is proposed for the utility model;
[0016] Figure 2 A partial structural stereogram of a multi-channel memory chip power consumption analysis and testing machine is provided for the utility model;
[0017] Figure 3 The utility model proposes a schematic diagram of the structure of a feeding mechanism of a multi-channel memory chip power consumption analysis and testing machine;
[0018] Figure 4 The utility model provides a structural schematic diagram of a feeding mechanism of a multi-channel memory chip power consumption analysis test machine.
[0019] Legend: 1. Test machine body; 11. Linear slide; 2. Chip interface; 21. Indicator light; 3. Loading mechanism; 301. Material receiving shell; 302. Receiving slot; 303. Electric push rod; 304. Pressure sensor; 305. Push plate; 4. Feeding mechanism; 401. Round shell; 402. Connecting channel; 403. Turntable; 404. Material guide trough; 405. Driving motor; 406. Hopper. DETAILED DESCRIPTION
[0020] In order to more clearly understand the above-mentioned purpose, features and advantages of the utility model, the utility model is further described below in conjunction with the accompanying drawings and embodiments. It should be noted that the embodiments of the present application and the features in the embodiments can be combined with each other without conflict.
[0021] In the following description, many specific details are set forth to facilitate a full understanding of the present invention. However, the present invention may also be implemented in other ways than those described herein. Therefore, the present invention is not limited to the specific embodiments of the following disclosure.
[0022] Embodiment 1, as Figure 1-Figure 4 As shown, the utility model provides a multi-channel memory chip power consumption analysis test machine, including a test machine body 1, a linear slide 11 is installed near the top of the front surface of the test machine body 1, a feeding mechanism 4 is arranged on the front side of the linear slide 11, a plurality of chip interfaces 2 are equidistantly provided near the middle of the front surface of the test machine body 1, a loading mechanism 3 is arranged on the front surface of the test machine body 1, the loading mechanism 3 includes a material receiving shell 301, a plurality of accommodating grooves 302 are equidistantly provided on the top of the material receiving shell 301, the accommodating grooves 302 and the chip interfaces 2 are corresponding to each other, a push plate 305 is arranged inside the accommodating grooves 302, the feeding mechanism 4 includes a circular shell 401, a turntable 403 is rotatably connected to the inside of the circular shell 401, and a plurality of guide plates 303 are equidistantly provided on the outer surface of the turntable 403 A material trough 404, a driving motor 405 is installed on the front surface of the circular shell 401, and the output end of the driving motor 405 slides through the outer surface of the circular shell 401 and extends to the other side, and the output end of the driving motor 405 is fixedly connected to the center of the front surface of the turntable 403, the circular shell 401 is installed on the slide seat of the linear slide 11, and the top of the circular shell 401 is fixedly connected with a connecting channel 402, and the top and bottom of the circular shell 401 are provided with connecting channels 402, and the top of the circular shell 401 is fixedly connected with a hopper 406, and the front surface of the testing machine body 1 is located above the chip interface 2. An indicator light 21 is embedded in the position, and a plurality of electric push rods 303 are equidistantly installed on the front surface of the material receiving shell 301, and the telescopic ends of the electric push rods 303 slide through the front surface of the material receiving shell 301 and extend to the rear side.
[0023] The effect achieved by the entire embodiment 1 is that when the test machine body 1 is in use, it sends a specific excitation signal to the memory chip under test to put it into working state, and collects data such as the working voltage and current of the memory chips in multiple chip interfaces 2 through the data acquisition module, and then performs power consumption calculation, data analysis, comparison and evaluation procedures to achieve the purpose of testing the power consumption of the memory chips. This is an existing mature technology and will not be described in detail here. When in use, the memory chips are put into the hopper 406 in batches, and then the drive motor 405 is started to drive the turntable 403 inside the circular shell 401 to rotate. When the guide grooves 404 on the surface of the turntable 403 will pass under the hopper 406 in turn, the memory chips in the hopper 406 will fall into different guide grooves 404 in turn. When the guide grooves 404 rotate to the bottom, the memory chips will be connected from the bottom. The storage chip is placed in the receiving slot 302 and then falls into the receiving channel 402. During this process, the linear slide 11 on the front side of the test machine body 1 will drive the circular shell 401 to move from left to right through the matching slide. The linear slide 11 stops after reaching the top of each receiving slot 302, and the drive motor 405 is started, so as to accurately place the storage chip into the receiving slot 302. When all the storage chips are placed in contact, the electric push rod 303 is started to drive the push plate 305 to push the storage chip toward the chip interface 2, so that the storage chip and the chip interface 2 are connected, and then the power consumption is tested. The overall automation level is high, which reduces the workload of operators and improves the detection efficiency. When the storage chip is plugged in, the electric push rod 303 is started again to drive the push plate 305 to reset. When the storage chip is placed into the hopper 406, the plug direction needs to be uniformly adjusted to the rear side.
[0024] Embodiment 2, as Figure 1-Figure 4 As shown, a pressure sensor 304 is installed at the telescopic end of the electric push rod 303, and the pressure sensor 304 is connected to the push plate 305.
[0025] The effect achieved by the entire embodiment 2 is that when the power consumption detection of the storage chip is completed and qualified, the test machine body 1 will start the corresponding indicator light 21 to light up green, and the indicator light 21 corresponding to the unqualified storage chip will light up red. Then the staff will pull out the storage chip in a targeted manner and take it out from the accommodating slot 302 upward. The qualification of the storage chip can be quickly and accurately judged by the prompt of the indicator light 21, and the use effect is better. By setting the pressure sensor 304, the pressure signal generated between the electric push rod 303 and the push plate 305 can be detected, thereby judging the insertion and connection status of the storage chip.
[0026] Working principle: When in use, the memory chips are put into the hopper 406 in batches, and then the driving motor 405 is started to drive the turntable 403 inside the circular shell 401 to rotate. When the guide grooves 404 on the surface of the turntable 403 pass under the hopper 406 in turn, the memory chips in the hopper 406 will fall into different guide grooves 404 in turn. When the guide grooves 404 rotate to the bottom, the memory chips will fall from the connecting channel 402 below. During this process, the linear slide 11 on the front side of the test machine body 1 will drive the circular shell 401 to move from left to right through the matching slide seat. After each arrival above a receiving slot 302, the linear slide 11 stops and the driving motor 405 is started, so as to accurately put the memory chips into In the receiving slot 302, when all the storage chips are put in contact, the electric push rod 303 is started to drive the push plate 305 to push the storage chip toward the chip interface 2, so that the storage chip and the chip interface 2 are connected, and then the power consumption test is performed on it. The overall automation level is high, which reduces the workload of operators and improves the detection efficiency. When the power consumption detection of the storage chip is completed and qualified, the test machine body 1 will start the corresponding indicator light 21 to light up green, and the indicator light 21 corresponding to the unqualified storage chip will light up red. Then the staff will pull out the storage chip in a targeted manner and take it out of the receiving slot 302 upward. The indicator light 21 can be used to quickly and accurately judge the qualification of the storage chip, and the use effect is better.
[0027] The above description is only a preferred embodiment of the present invention and does not limit the present invention in other forms. Any technician familiar with the profession may use the technical content disclosed above to change or modify it into an equivalent embodiment with equivalent changes and apply it to other fields. However, any simple modification, equivalent change and modification made to the above embodiment based on the technical essence of the present invention without departing from the content of the technical solution of the present invention still falls within the protection scope of the technical solution of the present invention.
Claims
1. A multi-channel memory chip power consumption analysis tester, comprising a tester body (1), characterized in that: A linear slide (11) is installed near the top of the front surface of the test machine body (1), a feeding mechanism (4) is arranged on the front side of the linear slide (11), a plurality of chip interfaces (2) are equidistantly provided near the middle of the front surface of the test machine body (1), and a loading mechanism (3) is arranged on the front surface of the test machine body (1); The loading mechanism (3) comprises a material receiving shell (301), a plurality of accommodating grooves (302) are equidistantly provided on the top of the material receiving shell (301), the positions of the accommodating grooves (302) and the chip interface (2) correspond to each other, and a push plate (305) is provided inside the accommodating groove (302); The feeding mechanism (4) comprises a circular shell (401), the interior of which is rotatably connected to a rotating disk (403), and the outer surface of the rotating disk (403) is provided with a plurality of material guide grooves (404) at equal intervals.
2. The multi-channel memory chip power consumption analysis and testing machine according to claim 1, characterized in that: A driving motor (405) is installed on the front surface of the circular shell (401), and an output end of the driving motor (405) slides through the outer surface of the circular shell (401) and extends to the other side.
3. The multi-channel memory chip power consumption analysis and testing machine according to claim 2, characterized in that: The output end of the driving motor (405) is fixedly connected to the center of the front surface of the rotating disk (403), and the circular shell (401) is installed on the sliding seat of the linear slide (11).
4. The multi-channel memory chip power consumption analysis and testing machine according to claim 3, characterized in that: The top of the circular shell (401) is fixedly connected with a connecting channel (402), and the top and bottom of the circular shell (401) are both provided with connecting channels (402).
5. The multi-channel memory chip power consumption analysis and testing machine according to claim 4, characterized in that: The top of the circular shell (401) is fixedly connected to a hopper (406), and an indicator light (21) is embedded in the front surface of the test machine body (1) at a position above the chip interface (2).
6. The multi-channel memory chip power consumption analysis and testing machine according to claim 5, characterized in that: A plurality of electric push rods (303) are equidistantly mounted on the front surface of the material receiving shell (301), and the telescopic ends of the electric push rods (303) slide through the front surface of the material receiving shell (301) and extend to the rear side.
7. The multi-channel memory chip power consumption analysis and testing machine according to claim 6, characterized in that: A pressure sensor (304) is installed at the telescopic end of the electric push rod (303), and the pressure sensor (304) is connected to the push plate (305).