Sample vibration reducing clamp suitable for scanning electron microscope

Abstract

The utility model discloses a sample vibration reducing clamp suitable for a scanning electron microscope, and relates to the technical field of clamps. The supporting seat comprises a base, assembling columns are arranged at the tops of the two ends of the base, studs used for being connected with scanning electron microscope equipment are installed at the tops of the assembling columns, assembling grooves are formed in the sides, corresponding to the assembling columns, of the top of the base, and the bottom ends of the assembling columns extend into the assembling grooves. A fixing piece used for fixing the assembling column is arranged on the side, corresponding to the assembling groove, of the bottom of the base. And a storage table is arranged between the two assembly columns. According to the utility model, the assembling columns are installed on the scanning electron microscope through the studs, then the object placing table is installed on the base through the cooperation of the fastening bolts and the positioning columns, and finally the base is installed on the two assembling columns through the connection of the fixing bolts and the assembling columns, so that the effect of fixing a sample on the object placing table can be realized; the detection accuracy and the detection effect are prevented from being influenced by shaking of the sample.

Description

Technical Field

[0001] The utility model relates to the technical field of clamps, in particular to a clamp suitable for reducing sample vibration in a scanning electron microscope. Background Art

[0002] Scanning electron microscopy is a high-resolution microscopy technology that uses a focused electron beam to scan the sample surface to obtain information about the sample's microscopic morphology. It emits a high-energy electron beam and allows it to interact with the sample to generate signals such as secondary electrons and backscattered electrons. These signals are received by the detector and converted into images, thereby showing the microscopic structure of the sample surface.

[0003] As a powerful microscopic analysis tool, scanning electron microscopy has a wide range of applications in many scientific fields. By accurately analyzing the surface morphology of samples, scanning electron microscopy can not only help scientists reveal the microscopic world of matter, but also play an important role in fields such as material science, biological research and industrial testing.

[0004] During the SEM image acquisition process, the device may be adversely affected by the surrounding environment. The reasons for SEM image jitter or drift may include loose sample fixation, which will affect the accuracy of sample detection. Utility Model Content

[0005] The main purpose of the utility model is to provide a clamp suitable for reducing sample vibration in a scanning electron microscope. The assembly column is installed on the scanning electron microscope through a stud, and then the storage table is installed on the base by the cooperation of the fastening bolt and the positioning column. Finally, the base is installed on the two assembly columns by the connection between the fixing bolt and the assembly column. In this way, the sample on the storage table can be fixed, and the shaking of the sample can be prevented from affecting the detection accuracy and detection effect, which can effectively solve the problems in the background technology.

[0006] In order to achieve the above purpose, the technical solution adopted by the utility model is:

[0007] A fixture for reducing sample vibration in a scanning electron microscope, comprising a support for fixing the sample;

[0008] The support member includes a base, and mounting columns are provided on the tops of both ends of the base, and studs for connecting the scanning electron microscope device are installed on the tops of the mounting columns, a mounting groove is provided on one side of the top of the base corresponding to the mounting column, the bottom end of the mounting column extends into the mounting groove, and a fixing member for fixing the mounting column is provided on one side of the bottom of the base corresponding to the mounting groove;

[0009] A storage platform is provided between the two assembly columns, a positioning column is installed at the bottom of the storage platform, and a positioning hole is provided inside the positioning column, and a positioning groove and a fastening groove are provided on one side of the base corresponding to the storage platform, the fastening groove is provided on the front side of the base, the positioning groove is provided on the top of the base, and the fastening groove and the positioning groove are distributed in a cross shape;

[0010] The bottom end of the positioning column extends into the positioning groove, the interior of the fastening groove is threadedly connected with a fastening bolt, and the rear end of the fastening bolt passes through the positioning hole and extends to the rear side of the positioning column.

[0011] Preferably, the fixing part includes a fixing bolt, which is arranged on one side of the bottom of the base corresponding to the assembly column, and a fixing hole is provided on one side of the bottom of the base corresponding to the fixing bolt, the top end of the fixing bolt passes through the fixing hole and extends into the inside of the assembly column, and the fixing bolt is connected to the assembly column.

[0012] Preferably, an activity cavity is provided inside the storage table, and two support plates are installed inside the activity cavity at intervals, and support columns are provided between the two ends of the two support plates, and the two ends of the support columns respectively penetrate the two support plates and are respectively fixed to the inner walls of the two sides of the activity cavity;

[0013] Springs are sleeved on the exterior of both ends of the support column, and the two springs are respectively located on the sides away from the two support plates.

[0014] Preferably, a connecting plate is installed on one side of the two supporting plates away from each other, and one end of the connecting plate away from the supporting plate passes through the storage table and extends to the outside of the storage table.

[0015] Preferably, the tops of both ends of the storage table are provided with cardboards, and the bottoms of the ends away from the two cardboards are provided with movable plates;

[0016] One end of the connecting plate away from the storage table is fixedly connected to the movable plate.

[0017] Preferably, a finger groove is provided on the top of the card plate.

[0018] Compared with the prior art, the utility model has the following beneficial effects:

[0019] 1. Install the assembly column to the scanning electron microscope through the studs, and then install the storage table to the base by tightening the bolts and positioning columns. Finally, install the base to the two assembly columns by connecting the fixing bolts and the assembly columns. This can achieve the effect of fixing the sample on the storage table and prevent the shaking of the sample from affecting the detection accuracy and detection effect.

[0020] 2. The sample can be placed on the storage table by pulling out the two card plates, and then the connecting plate connected to the support plate is pushed inward by the rebound force of the spring. The connecting plate also drives the card plate on the movable plate to move inward, so that the card plate can squeeze and fix the sample to ensure the stability of the sample when being tested. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] Figure 1 This is a schematic diagram of the overall structure of a fixture for reducing sample vibration in a scanning electron microscope according to the utility model;

[0022] Figure 2 This is an exploded view of the base of a fixture for reducing sample vibration in a scanning electron microscope according to the utility model;

[0023] Figure 3 This is a cross-sectional view of a base of a fixture for reducing sample vibration in a scanning electron microscope according to the utility model;

[0024] Figure 4 This is a cross-sectional view of a mounting table of a fixture for reducing sample vibration in a scanning electron microscope according to the utility model;

[0025] Figure 5 The utility model is a clamp suitable for reducing sample vibration in a scanning electron microscope Figure 4 Enlarged view of part A.

[0026] In the figure: 1. base; 2. assembly column; 3. stud; 4. assembly slot; 5. storage table; 6. positioning column; 7. positioning hole; 8. positioning slot; 9. fastening slot; 10. fastening bolt; 11. fixing bolt; 12. fixing hole; 13. movable cavity; 14. support plate; 15. support column; 16. spring; 17. connecting plate; 18. clamping plate; 19. movable plate; 20. finger slot. DETAILED DESCRIPTION

[0027] In order to make the technical means, creative features, objectives and effects achieved by the present invention easy to understand, the present invention is further described below in conjunction with specific implementation methods.

[0028] like Figure 1-5 As shown, a fixture for reducing sample vibration for a scanning electron microscope comprises a support for fixing the sample;

[0029] like Figure 1-3As shown, the support member includes a base 1, and mounting columns 2 are provided on the tops of both ends of the base 1, and studs 3 for connecting the scanning electron microscope equipment are installed on the tops of the mounting columns 2. A mounting groove 4 is provided on the side of the top of the base 1 corresponding to the mounting column 2, and the bottom end of the mounting column 2 extends into the inside of the mounting groove 4, and a fixing member for fixing the mounting column 2 is provided on the side of the bottom of the base 1 corresponding to the mounting groove 4; a storage table 5 is provided between the two mounting columns 2, and a positioning column 6 is installed at the bottom of the storage table 5, and a positioning hole 7 is provided inside the positioning column 6, and a connected positioning groove 8 and a fastening groove 9 are provided on the side of the base 1 corresponding to the storage table 5, and the fastening groove 9 is arranged on the front side of the base 1, and the positioning groove 8 is arranged on the top of the base 1, and the fastening groove 9 and the positioning groove 8 are distributed in a cross shape; the bottom end of the positioning column 6 extends into the inside of the positioning groove 8, and the fastening bolt 10 is threadedly connected to the inside of the fastening groove 9, and the rear end of the fastening bolt 10 passes through the positioning hole 7 and extends to the rear side of the positioning column 6.

[0030] When in use, the stud 3 on the assembly column 2 is screwed into the objective lens threaded hole of the scanning electron microscope, so as to achieve the effect of fixing the assembly column 2, and then two fingers are used to move the two clamping plates 18 outward, and then the sample is placed on the storage table 5, and the two fingers are released, so that the support plate 14 can drive the clamping plate 18 connected to the connecting plate 17 and the moving plate 19 to move inward by the rebound force of the spring 16, thereby achieving the effect of the clamping plate 18 squeezing and fixing the sample, ensuring the stability of the sample and avoiding the skewed stability of the sample;

[0031] Then, the positioning column 6 on the storage platform 5 is inserted into the positioning groove 8, and the fastening bolt 10 is connected to the positioning column 6 through insertion and threaded connection with the fastening groove 9, so that the fastening bolt 10 can fix the positioning column 6, thereby achieving the effect of limiting and fixing the storage platform 5, ensuring the stability of the sample;

[0032] After the storage table 5 is fixed, the base 1 is mounted on the outside of the assembly column 2 through the assembly groove 4, and then connected to the assembly column 2 by the fixing bolts 11, so that the connection stability and tightness between the assembly column 2 and the base 1 can be enhanced, thereby ensuring the stability of the sample when being tested, and also making it convenient for the staff to disassemble and maintain the overall structure.

[0033] In order to ensure the connection stability between the assembly column 2 and the base 1, Figure 1 and 2As shown, the fixing part includes a fixing bolt 11, and the fixing bolt 11 is arranged on one side of the bottom of the base 1 corresponding to the assembly column 2, and a fixing hole 12 is provided on the side of the bottom of the base 1 corresponding to the fixing bolt 11. The top of the fixing bolt 11 passes through the fixing hole 12 and extends into the inside of the assembly column 2. The fixing bolt 11 is connected to the assembly column 2. By means of the threaded connection between the fixing bolt 11 and the assembly column 2, the fixing bolt 11 can pass through the base 1 and be connected to the assembly column 2, thereby achieving the effect of fixing the assembly column 2 and the base 1 together, thereby ensuring the connection stability of the assembly column 2 and the base 1.

[0034] To improve the convenience of fixing samples, Figure 4 and 5 As shown, an active cavity 13 is opened inside the storage table 5, and two support plates 14 are installed inside the active cavity 13 at intervals, and a support column 15 is provided between the two ends of the two support plates 14, and the two ends of the support column 15 respectively penetrate the two support plates 14 and are respectively fixed to the inner walls of the two sides of the active cavity 13; springs 16 are sleeved on the outside of the two ends of the support column 15, and the two springs 16 are respectively located on the side away from the two support plates 14, and a connecting plate 17 is installed on the side away from the two support plates 14, and the end of the connecting plate 17 away from the support plate 14 penetrates the storage table 5 and extends to the outside of the storage table 5, and a clamping plate 18 is provided on the top of both ends of the storage table 5, and the two A movable plate 19 is installed at the bottom of the end away from each card plate 18; the end of the connecting plate 17 away from the storage table 5 is fixedly connected to the movable plate 19, and the two card plates 18 are pushed outward to facilitate placing the sample on the storage table 5, and then the card plates 18 are released, so that the spring 16 can push the connecting plate 17 connected to the support plate 14 to move inward, and the connecting plate 17 simultaneously drives the card plate 18 on the movable plate 19 to move inward, thereby allowing the card plate 18 to squeeze and fix the sample to ensure the stability of the sample when being tested. Because a finger groove 20 is provided on the top of the card plate 18, the staff can operate the finger groove 20 to move and adjust the card plate 18, thereby improving the convenience of the staff in operating the card plate 18.

[0035] The above shows and describes the basic principle and main features of the utility model and the advantages of the utility model. Those skilled in the art should understand that the utility model is not limited by the above embodiments. The above embodiments and descriptions are only for explaining the principle of the utility model. Without departing from the spirit and scope of the utility model, the utility model may have various changes and improvements, which fall within the scope of the utility model to be protected. The scope of protection claimed by the utility model is defined by the attached claims and their equivalents.

Claims

1. A fixture for reducing sample vibration in a scanning electron microscope, characterized in that: including a support for fixing the sample; The support member comprises a base (1), the tops of both ends of the base (1) are provided with assembly columns (2), and the tops of the assembly columns (2) are provided with studs (3) for connecting to a scanning electron microscope device, a side of the top of the base (1) corresponding to the assembly column (2) is provided with an assembly groove (4), the bottom end of the assembly column (2) extends into the assembly groove (4), and a fixing member for fixing the assembly column (2) is provided on the side of the bottom of the base (1) corresponding to the assembly groove (4); A storage platform (5) is provided between the two assembly columns (2), a positioning column (6) is installed at the bottom of the storage platform (5), and a positioning hole (7) is provided inside the positioning column (6), and a positioning groove (8) and a fastening groove (9) are provided on one side of the base (1) corresponding to the storage platform (5), wherein the fastening groove (9) is provided on the front side of the base (1), and the positioning groove (8) is provided on the top of the base (1), and the fastening groove (9) and the positioning groove (8) are arranged in a cross shape; The bottom end of the positioning column (6) extends into the interior of the positioning groove (8), the interior of the fastening groove (9) is threadedly connected with a fastening bolt (10), and the rear end of the fastening bolt (10) passes through the positioning hole (7) and extends to the rear side of the positioning column (6).

2. A fixture for reducing sample vibration in a scanning electron microscope according to claim 1, characterized in that: The fixing member comprises a fixing bolt (11), wherein the fixing bolt (11) is arranged on a side of the bottom of the base (1) corresponding to the assembly column (2), and a fixing hole (12) is provided on a side of the bottom of the base (1) corresponding to the fixing bolt (11), and a top end of the fixing bolt (11) passes through the fixing hole (12) and extends into the interior of the assembly column (2), and the fixing bolt (11) is connected to the assembly column (2).

3. The fixture for reducing sample vibration in a scanning electron microscope according to claim 2, characterized in that: The storage platform (5) is provided with an active cavity (13) inside, and two support plates (14) are installed inside the active cavity (13) at intervals, and support columns (15) are provided between the two ends of the two support plates (14), and the two ends of the support columns (15) respectively penetrate the two support plates (14) and are respectively fixed to the inner walls of the two sides of the active cavity (13); Springs (16) are sleeved on the outside of both ends of the support column (15), and the two springs (16) are respectively located on the sides of the two support plates (14) that are away from each other.

4. The fixture for reducing sample vibration in a scanning electron microscope according to claim 3, characterized in that: A connecting plate (17) is installed on one side of the two supporting plates (14) that is away from each other, and one end of the connecting plate (17) that is away from the supporting plate (14) passes through the storage platform (5) and extends to the outside of the storage platform (5).

5. The fixture for reducing sample vibration in a scanning electron microscope according to claim 4, characterized in that: The tops of both ends of the storage platform (5) are provided with card plates (18), and the bottoms of the ends away from each other of the two card plates (18) are provided with movable plates (19); One end of the connecting plate (17) away from the storage platform (5) is fixedly connected to the movable plate (19).

6. The fixture for reducing sample vibration in a scanning electron microscope according to claim 5, characterized in that: A finger groove (20) is provided on the top of the clamping plate (18).

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