Semiconductor material detection workbench

Abstract

The utility model relates to the technical field of material detection, and particularly discloses a semiconductor material detection workbench, after a qualified material discharging disc is detected to rotate anticlockwise, a first electric push cylinder is restarted, an ejector rod is pushed upwards, and the ejector rod ejects a material discharging plate open, so that materials on the material discharging plate fall into a material barrel or a conveying belt on the right side; when the disqualified discharging disc rotates clockwise, a second electric push cylinder is started to enable the materials to fall into the material barrels or the conveying belts on the left side and the right side, the adjacent discharging plates can be moved to the position below a detector while the discharging disc rotates, the next material can be detected while discharging is conducted, and the detection efficiency is improved. And after discharging is completed, the ejector rod can reset under the action of the elastic force of the spring, discharging is completed by starting the first electric push cylinder and the second electric push cylinder, the effect of automatically discharging and saving the labor cost is achieved, different materials are classified by rotating the discharging disc forwards and backwards, and the effect of automatically distinguishing the materials of different qualities is achieved.

Description

Technical Field

[0001] The utility model relates to the technical field of material detection, in particular to a semiconductor material detection workbench. Background Art

[0002] Semiconductors refer to materials with electrical conductivity between conductors and insulators at room temperature. Semiconductors are used in integrated circuits, consumer electronics, communication systems, photovoltaic power generation, lighting, and high-power power conversion. With the development of society, people's demand for semiconductor materials continues to increase. In order to meet people's needs, while semiconductor materials are produced quickly, they also need to be tested in a timely manner to ensure their production quality.

[0003] For example, a Chinese patent discloses: a semiconductor material detection workbench, patent number: CN217655033U, specifically including: a workbench body, the upper end surface of the workbench body is fixedly installed with an annular closed conveying slide near the outer position, and several groups of conveying platforms are movably installed on the annular closed conveying slide, and the conveying platform is provided with an adjustment component for changing the angle of the semiconductor material and two groups of limit components for limiting the semiconductor material placement device, and a driving device is provided in the middle position of the upper end surface of the workbench body, and several groups of the conveying platforms are connected to the driving device. A semiconductor material detection workbench described in the present invention can reasonably utilize space so that the workbench body will not be too long, the space required for use is relatively small, the use effect is good, and it can drive the semiconductor material placement device to rotate, thereby changing the position of the semiconductor material, the detection effect is better, and it has a better prospect of use.

[0004] However, in the process of implementing the above technical solution, it was found that there are at least the following technical problems: the existing workbench has no unloading device, and the materials need to be taken out manually after the inspection is completed. The inspection area and the discharge area are located on both sides of the workbench, requiring two people to operate, and unqualified materials need to be removed manually. The whole operation process is time-consuming and labor-intensive. Utility Model Content

[0005] 1. Technical issues to be resolved

[0006] In view of the shortcomings of the prior art, the utility model provides a semiconductor material inspection workbench to solve the technical problem that the existing workbench has no unloading device, and the materials need to be manually taken out after the inspection is completed. The inspection area and the discharge area are located on both sides of the workbench, requiring two people to operate, and the materials with unqualified quality need to be manually removed.

[0007] (II) Technical solution

[0008] In order to achieve the above objectives, the present invention is implemented through the following technical solutions:

[0009] A semiconductor material testing workbench comprises a support seat, a feeding tray is rotatably mounted on the top of the support seat, the feeding tray comprises a turntable, four discharge plates are rotatably mounted on the top of the turntable, four push rods are slidably mounted inside the turntable, springs are mounted on the outer walls of the four push rods, two sliders are slidably mounted on the tops of the four discharge plates, a stepper motor is fixedly mounted on the bottom end of the support seat, a second bevel gear is fixedly mounted on the side end of the stepper motor, a transmission shaft is fixedly mounted on the bottom end of the turntable, a first bevel gear is fixedly mounted on the bottom end of the transmission shaft; the first bevel gear is meshed with the second bevel gear, a detection frame is fixedly mounted on the top end of the support seat, and a detector is fixedly mounted on the top end of the detection frame.

[0010] Preferably: a first electric push cylinder is fixedly mounted on the support seat; the first electric push cylinder is located directly below one of the push rods.

[0011] Preferably: a second electric push cylinder is fixedly mounted on the support seat; the second electric push cylinder is located directly below one of the push rods.

[0012] (III) Beneficial effects

[0013] 1. Connect the detector to the computer and the input end of the PIC controller through wires, connect the first electric push cylinder, the second electric push cylinder, and the stepper motor to the output end of the PIC controller through wires, and the operator places the material to be tested on the unloading plate below the detector. The detector will test the unloading plate. When the test result is qualified, it will send a signal to the PIC, and the PIC will send a signal to make the stepper motor rotate 90 degrees clockwise first. The stepper motor rotates the unloading plate counterclockwise 90 degrees through the engagement of the second bevel gear and the first bevel gear, so that the area with material faces the right side. If the test fails, the unloading plate will rotate 90 degrees clockwise to make the area with material face the left side. By rotating the unloading plate forward and reversely, the classification of different materials is completed, and the effect of automatically distinguishing materials of different qualities is achieved.

[0014] 2. When the qualified unloading disc rotates counterclockwise, the first electric push cylinder starts again and pushes the push rod upward. The push rod will push open the unloading plate, so that the material on the unloading plate falls into the material bucket or conveyor belt on the right. When the unqualified unloading disc rotates clockwise, the second electric push cylinder starts to make the material fall into the material bucket or conveyor belt on the left and right. While the unloading disc rotates, the adjacent unloading plate will be moved to the bottom of the detector, so that the next material can be tested while unloading. After unloading is completed, the push rod will reset under the action of the spring force. Unloading is completed by starting the first electric push cylinder and the second electric push cylinder, so that the effect of automatic unloading and saving labor costs is achieved. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] The above description is only an overview of the technical solution of the utility model. In order to more clearly understand the technical means of the utility model and implement it according to the contents of the specification, the following is a detailed description of the preferred embodiments of the utility model in conjunction with the accompanying drawings.

[0016] Figure 1 This is a structural diagram of the support seat of the utility model;

[0017] Figure 2 This is a structural diagram of the material tray of the utility model;

[0018] Figure 3 This is a cross-sectional structural diagram of a turntable of the utility model;

[0019] Figure 4 This is a front view structural diagram of the utility model;

[0020] Figure 5 This is a structural diagram of the bevel gear of the utility model.

[0021] Legend: 1. Support seat; 2. Unloading tray; 21. Turntable; 22. Unloading plate; 23. Push rod; 24. Spring; 25. Slider; 3. Detection frame; 4. Detector; 5. Transmission shaft; 6. First bevel gear; 7. Second bevel gear; 8. First electric push cylinder; 9. Second electric push cylinder; 11. Stepper motor. DETAILED DESCRIPTION

[0022] The embodiment of the present application provides a semiconductor material testing workbench, which effectively solves the technical problem that the existing workbench has no unloading device, and the material needs to be taken out manually after the test is completed. The testing area and the discharge area are located on both sides of the workbench, and two people are required to operate, and the material that does not meet the quality standards needs to be manually removed. The detector is connected to the computer and the input end of the PIC controller through a wire, and the first electric push cylinder, the second electric push cylinder, and the stepper motor are connected to the output end of the PIC controller through a wire. The operator places the material to be tested on the unloading plate below the detector, and the detector will test the unloading plate. When the test result is qualified, it will send a signal to the PIC controller. C sends a signal, and PIC sends a signal again, causing the stepper motor to rotate 90 degrees clockwise first. The stepper motor rotates the unloading tray 90 degrees counterclockwise through the meshing of the second bevel gear and the first bevel gear, so that the area with material faces the right. If the test fails, the unloading tray will rotate 90 degrees clockwise, so that the area with material faces the left. By rotating the unloading tray forward and reversely, the classification of different materials is completed, achieving the effect of automatically distinguishing materials of different qualities. When the unloading tray rotates counterclockwise after the test is qualified, the first electric push cylinder is started again and pushes upward. The push rod is moved, and the push rod will push open the discharge plate, so that the material on the discharge plate falls into the material bucket or conveyor belt on the right. When the unqualified discharge plate rotates clockwise, the second electric push cylinder is started to make the material fall into the material bucket or conveyor belt on the left and right. While the discharge plate rotates, the adjacent discharge plate will be moved to the bottom of the detector, so that the next material can be tested while unloading. After unloading is completed, the push rod will reset under the action of the spring force, and the unloading is completed by starting the first electric push cylinder and the second electric push cylinder, thereby achieving the effect of automatic unloading and saving labor costs.

[0023] Example

[0024] like Figure 1 , Figure 2 , Figure 3 , Figure 4 and Figure 5 As shown, the technical solution in the embodiment of the present application effectively solves the technical problem that the existing workbench has no unloading device, the material needs to be taken out manually after the inspection is completed, the inspection area and the unloading area are located on both sides of the workbench, two people are required to operate, and the unqualified materials need to be removed manually. The overall idea is as follows:

[0025] In view of the problems existing in the prior art, the utility model provides a semiconductor material testing workbench, including a support seat 1, a discharge tray 2 is rotatably installed on the top of the support seat 1, the discharge tray 2 includes a turntable 21, four unloading plates 22 are rotatably installed on the top of the turntable 21, four push rods 23 are slidably installed inside the turntable 21, and springs 24 are installed on the outer walls of the four push rods 23.

[0026] Two sliders 25 are slidably installed on the top of the four unloading plates 22, a stepper motor 11 is fixedly installed on the bottom end of the support seat 1, a second bevel gear 7 is fixedly installed on the side end of the stepper motor 11, a transmission shaft 5 is fixedly installed on the bottom end of the turntable 21, and a first bevel gear 6 is fixedly installed on the bottom end of the transmission shaft 5; the first bevel gear 6 is meshed with the second bevel gear 7.

[0027] A detection frame 3 is fixedly installed on the top of the support base 1, a detector 4 is fixedly installed on the top of the detection frame 3, a first electric push cylinder 8 is fixedly installed on the support base 1; the first electric push cylinder 8 is located directly below one of the push rods 23, and a second electric push cylinder 9 is fixedly installed on the support base 1; the second electric push cylinder 9 is located directly below one of the push rods 23.

[0028] Working principle:

[0029] In the first step, the detector 4 is connected to the computer and the input end of the PIC controller through a wire, and the first electric push cylinder 8, the second electric push cylinder 9, and the stepper motor 11 are connected to the output end of the PIC controller through a wire. The operator places the material to be tested on the unloading plate 22 below the detector 4. The detector 4 will detect the unloading plate 22. When the test result is qualified, it will send a signal to the PIC. The PIC then sends a signal to make the stepper motor 11 rotate ninety degrees clockwise first. The stepper motor 11 rotates the unloading tray 2 counterclockwise by ninety degrees through the engagement of the second bevel gear 7 and the first bevel gear 6, so that the area with material faces the right side. If the test fails, the unloading tray 2 will rotate ninety degrees clockwise to make the area with material face the left side. By rotating the unloading tray 2 forward and reversely, the classification of different materials is completed, and the effect of automatically distinguishing materials of different qualities is achieved.

[0030] In the second step, when the qualified unloading tray 2 rotates counterclockwise, the first electric push cylinder 8 is started again to push the push rod 23 upward. The push rod 23 will push open the unloading plate 22, so that the material on the unloading plate 22 falls into the material bucket or conveyor belt on the right. When the unqualified unloading tray 2 rotates clockwise, the second electric push cylinder 9 is started to make the material fall into the material bucket or conveyor belt on the left and right. While the unloading tray 2 rotates, the adjacent unloading plate 22 will be moved to the bottom of the detector 4, so that the next material can be tested while unloading. After unloading is completed, the push rod 23 will be reset under the action of the elastic force of the spring 24. The unloading is completed by starting the first electric push cylinder 8 and the second electric push cylinder 9, thereby achieving the effect of automatic unloading and saving labor costs.

[0031] Finally, it should be noted that: Obviously, the above embodiments are only examples for clearly explaining the present invention, and are not intended to limit the implementation methods. For ordinary technicians in the relevant field, other different forms of changes or modifications can be made based on the above description. It is not necessary and impossible to list all the implementation methods here. The obvious changes or modifications derived from this are still within the scope of protection of the present invention.

Claims

1. A semiconductor material testing workbench, comprising a support base (1), characterized in that: A material discharge tray (2) is rotatably mounted on the top of the support seat (1), and the material discharge tray (2) comprises a turntable (21), four material discharge plates (22) are rotatably mounted on the top of the turntable (21), and four ejector rods (23) are slidably mounted inside the turntable (21).

2. A semiconductor material detection workbench as claimed in claim 1, characterized in that: The outer side walls of the four push rods (23) are all installed with springs (24), and the top ends of the four unloading plates (22) are all slidably installed with two sliding blocks (25).

3. A semiconductor material detection workbench as claimed in claim 1, characterized in that: A stepping motor (11) is fixedly mounted on the bottom end of the support seat (1), and a second bevel gear (7) is fixedly mounted on the side end of the stepping motor (11).

4. A semiconductor material detection workbench as claimed in claim 1, characterized in that: A transmission shaft (5) is fixedly mounted on the bottom end of the rotating disk (21), and a first bevel gear (6) is fixedly mounted on the bottom end of the transmission shaft (5); The first bevel gear (6) is meshed with the second bevel gear (7).

5. A semiconductor material detection workbench as claimed in claim 1, characterized in that: A detection frame (3) is fixedly mounted on the top of the support seat (1).

6. A semiconductor material testing workbench as claimed in claim 5, characterized in that: A detector (4) is fixedly mounted on the top of the detection frame (3).

7. A semiconductor material testing workbench as claimed in claim 1, characterized in that: A first electric push cylinder (8) is fixedly mounted on the support seat (1); The first electric push cylinder (8) is located directly below one of the push rods (23).

8. A semiconductor material testing workbench as claimed in claim 1, characterized in that: A second electric push cylinder (9) is fixedly mounted on the support seat (1); The second electric push cylinder (9) is located directly below one of the push rods (23).

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