Wave division infrared temperature measuring device

Abstract

The utility model discloses a partial wave infrared temperature measuring device, which comprises a base shell, an infrared temperature measuring probe, a partial wave assembly and a condensing lens, the infrared temperature measuring probe is arranged on the base shell, the partial wave assembly comprises a mounting base and a filter plate, the filter plate is used for allowing light to pass through in a specific wave band, the mounting base is movably arranged on the base shell, and the condensing lens is arranged on the mounting base. The mounting base is at least provided with a first light passing port and a second light passing port, the filter is arranged in the second light passing port, the mounting base moves in the base shell to at least form a first state and a second state, in the first state, the first light passing port is located in front of the infrared temperature measurement probe, and in the second state, the filter is located in front of the infrared temperature measurement probe. The filter is located in front of the infrared temperature measurement probe; the condensing lens is used for converging light rays, the condensing lens is arranged on the base shell, the condensing lens, the wave division assembly and the infrared temperature measurement probe are sequentially arranged along the path of the infrared temperature measurement light rays, the design can be compatible with more application environments, and the temperature measurement accuracy is improved.

Description

Technical Field

[0001] The utility model relates to the technical field of infrared temperature detection equipment, in particular to a wave splitting infrared temperature measuring device. Background Art

[0002] Infrared temperature detection devices have been widely used today. The principle is that the object itself will generate infrared thermal radiation. The infrared temperature probe receives the infrared rays emitted by the object to be measured and converts them into the corresponding object temperature.

[0003] However, when the existing infrared temperature measuring device is used in an environment with a lot of water mist or dust, water droplets or dust will be deposited on the surface of the object or the air will be filled with dust. The feedback infrared light will be affected by the grayscale and attenuated, and the temperature measurement result of the infrared temperature detection device will be inaccurate. The existing technology cannot solve this problem. Utility Model Content

[0004] The present invention aims to solve at least one of the technical problems existing in the prior art. To this end, the present invention proposes a split-wave infrared temperature measuring device that is compatible with more application environments and improves the accuracy of temperature measurement.

[0005] According to the first aspect of the present invention, a wave splitting infrared temperature measuring device includes: a base shell; an infrared temperature measuring probe for receiving infrared temperature measuring light and converting it into a temperature measuring signal, the infrared temperature measuring probe is arranged on the base shell; a wave splitting component including a mounting base and a filter, the filter is used to allow light to pass through in a specific band, the mounting base is movably arranged on the base shell, the mounting base is provided with at least a first light passage and a second light passage, the filter is installed in the second light passage, the mounting base moves in the base shell to form at least a first state and a second state, in the first state, the first light passage is located in front of the infrared temperature measuring probe, and in the second state, the filter is located in front of the infrared temperature measuring probe; a focusing lens for converging light, the focusing lens is arranged on the base shell, and the focusing lens, the wave splitting component and the infrared temperature measuring probe are arranged in sequence along the path of the infrared temperature measuring light.

[0006] A wave splitting infrared temperature measuring device according to an embodiment of the present invention has at least the following beneficial effects:

[0007] The utility model discloses a split-wave infrared temperature measuring device, which can measure the temperature of an object. During the temperature measurement process, the mounting base is in the first state, and the infrared temperature measuring light passes through the condensing lens and the first light-passing port and is received by the infrared temperature measuring probe to form a first temperature measurement signal. The mounting base is in the second state, and the infrared temperature measuring light passes through the condensing lens and the filter to be received by the infrared temperature measuring probe to form a second temperature measurement signal. The filter can filter out light of other wavebands and allow light of the infrared waveband to pass through. When there is not much dust or water mist in the external environment and the surface of the object is not covered with other interfering substances, the difference between the first temperature measurement signal and the second temperature measurement signal is not large. The first temperature measurement signal and the second temperature measurement signal can be converted to obtain a relatively accurate temperature of the object. When the external environment is not full of dust or water mist, the difference between the first temperature measurement signal and the second temperature measurement signal is large ... There is a lot of dust or water mist in the environment, and the surface of the object may also be covered with other interfering substances, which will affect the accuracy of the temperature measurement results. This is because the presence of interfering substances will cause the feedback infrared temperature measurement light to form grayscale. Therefore, the filter can filter out the grayscale light band for light in other bands, and the first temperature measurement signal is used as a reference signal. By comparing the second temperature measurement signal with the first temperature measurement signal, the interference degree of the interfering substance can be characterized. The interference degree of the interfering substance will cause the infrared temperature measurement light to attenuate. Therefore, by using the interference degree to correct the temperature obtained from the second temperature measurement signal, a relatively accurate temperature of the object can be obtained. This design is compatible with more application environments and improves the accuracy of temperature measurement.

[0008] According to some embodiments of the present invention, the wave splitting infrared temperature measuring device also includes a laser emitter and a spectrometer lens, both of which are arranged on the base shell, the laser emitter is used to emit visible identification light, and the spectrometer lens is located between the focusing lens and the wave splitting component, wherein one of the infrared temperature measuring light and the visual identification light is reflected on the spectrometer lens, and the other of the infrared temperature measuring light and the visual identification light passes through the spectrometer lens, and the path of the infrared temperature measuring light and the path of the visual identification light are coaxial.

[0009] According to some embodiments of the present invention, the beam splitter lens is made of a semi-transparent and semi-reflective material, and includes a first optical surface and a second optical surface facing back to each other. The infrared temperature measuring probe faces the second optical surface, and the infrared temperature measuring light passes through the beam splitter lens from the first optical surface and is emitted from the second optical surface to be fed back to the infrared temperature measuring probe. The laser emitter faces the first optical surface, and the visible identification light is reflected on the first optical surface to be emitted to the focusing lens.

[0010] According to some embodiments of the present invention, the focusing lens is a convex lens.

[0011] According to some embodiments of the present invention, the infrared temperature measuring probe is located at the focus formed by the convex lens on the path of the infrared temperature measuring light, and the laser emitter is located at the focus formed by the convex lens on the path of the visible marking light.

[0012] According to some embodiments of the present invention, the spectrometer is tilted in the base shell so that the exit angle of the infrared temperature measurement light on the second optical surface and the incident angle of the visual marking light on the first optical surface are both 45°.

[0013] According to some embodiments of the present invention, the mounting base is rotatably disposed in the base shell.

[0014] According to some embodiments of the present invention, there are multiple first light openings and multiple second light openings, and the multiple first light openings and the multiple second light openings are alternately arranged and circumferentially arranged around the rotation axis of the mounting base. There are multiple filters and they are arranged in a one-to-one correspondence at the second light openings.

[0015] According to some embodiments of the present invention, a driving assembly is further provided in the base shell, and the driving assembly is connected to the wave splitting assembly to drive the wave splitting assembly to rotate.

[0016] According to some embodiments of the present invention, the wave splitting infrared temperature measuring device further includes a control module, and the control module is connected to the driving component and the infrared temperature measuring probe respectively.

[0017] Additional aspects and advantages of the present invention will be given in part in the following description and will become apparent from the following description or learned through practice of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] The above and / or additional aspects and advantages of the present invention will become apparent and readily understood from the description of the embodiments in conjunction with the following drawings, in which:

[0019] Figure 1 This is a schematic diagram of the optical path structure of one embodiment of the split-wave infrared temperature measuring device of the present utility model;

[0020] Figure 2 for Figure 1 An enlarged schematic diagram of a portion A of one embodiment of the split-wave infrared temperature measuring device of the present invention;

[0021] Figure 3 This is a structural diagram of the wave splitting component.

[0022] Reference numerals:

[0023] Infrared temperature measuring probe 100; wave splitting component 200; mounting base 210; first light opening 211; second light opening 212; filter 220; focusing lens 300; laser emitter 400; beam splitter 500; first light surface 510; second light surface 520; driving component 600; control module 700. DETAILED DESCRIPTION

[0024] The following describes embodiments of the present invention in detail. Examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are intended only to explain the present invention and are not to be construed as limiting the present invention.

[0025] In the description of the present invention, it should be understood that descriptions involving orientation, such as the orientations or positional relationships indicated by terms such as "upper", "lower", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", and "outside", are based on the orientations or positional relationships shown in the accompanying drawings. They are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation. Therefore, they cannot be understood as limitations on the present invention.

[0026] In the description of this utility model, "several" means one or more, "many" means more than two, "greater than," "less than," and "exceed" are understood to exclude the number itself, while "above," "below," and "within" are understood to include the number itself. The use of "first" and "second" in the description is solely for the purpose of distinguishing technical features and is not to be construed as indicating or implying relative importance, implicitly specifying the number of the indicated technical features, or implicitly specifying the order of the indicated technical features.

[0027] In the description of this utility model, it should be noted that, unless otherwise specified or limited, the terms "installed," "connected," and "connected" should be understood in a broad sense. For example, they can refer to fixed connections, detachable connections, or integral connections; they can refer to mechanical connections or electrical connections; they can refer to direct connections or indirect connections through an intermediate medium; and they can refer to internal communication between two components. Those skilled in the art will understand the specific meanings of the above terms in this utility model based on the specific circumstances.

[0028] like Figure 1-Figure 3As shown, a wave splitting infrared temperature measuring device according to an embodiment of the first aspect of the present invention includes a base shell, an infrared temperature measuring probe 100, a wave splitting component 200 and a condensing lens 300. The infrared temperature measuring probe 100 is used to receive infrared temperature measuring light and convert it into a temperature measuring signal. The infrared temperature measuring probe 100 is arranged on the base shell. The wave splitting component 200 includes a mounting base 210 and a filter 220. The filter 220 is used to allow light to pass through in a specific band. The mounting base 210 is movably arranged on the base shell. The mounting base 210 is provided with at least a first light opening 211 and a A second light opening 212, the filter 220 is installed in the second light opening 212, the mounting base 210 moves in the base shell to form at least a first state and a second state. In the first state, the first light opening 211 is located in front of the infrared temperature measuring probe 100, and in the second state, the filter 220 is located in front of the infrared temperature measuring probe 100; a condensing lens 300 is used to converge the light, the condensing lens 300 is set in the base shell, and the condensing lens 300, the wave splitting component 200 and the infrared temperature measuring probe 100 are arranged in sequence along the path of the infrared temperature measuring light.

[0029] Among them, the shape of the base shell (not shown in the figure) is designed according to actual user needs, and can be set in a pistol shape, a rod shape, etc. A cavity is provided inside the base shell to accommodate components such as the infrared temperature measuring probe 100, the wave splitting component 200, and the focusing lens 300, and the cavity is relatively closed to prevent external light from interfering with the infrared temperature measuring light; the infrared temperature measuring probe 100 can be selected from a conventional infrared sensor or an infrared temperature measuring lens; in some embodiments of the present utility model, the focusing lens 300 is a convex lens, which can converge light, so that the temperature measurement position is the focus of the convex lens on the light.

[0030] The utility model discloses a split-wave infrared temperature measuring device, which can measure the temperature of an object. During the temperature measurement process, the mounting base 210 is in the first state, and the infrared temperature measuring light passes through the condensing lens 300 and the first light port 211, and is received by the infrared temperature measuring probe 100 and forms a first temperature measurement signal. The mounting base 210 is in the second state, and the infrared temperature measuring light passes through the condensing lens 300 and the filter 220, and is received by the infrared temperature measuring probe 100 and forms a second temperature measurement signal. The filter 220 can filter out light of other wavelengths and allow light of the infrared wavelength band to pass through. When there is not much dust or water mist in the external environment and the surface of the object is not covered with other interfering substances, the difference between the first temperature measurement signal and the second temperature measurement signal is not large, and a relatively accurate temperature measurement signal can be obtained by converting the first temperature measurement signal and the second temperature measurement signal. The accurate temperature of the object, and when there is a lot of dust or water mist in the external environment, the surface of the object may also be covered with other interfering substances, which will affect the accuracy of the temperature measurement results. This is because the presence of interfering substances will cause the feedback infrared temperature measurement light to form grayscale. Therefore, the filter 220 can filter out the grayscale light band for light in other bands, and the first temperature measurement signal is used as a reference signal. By comparing the second temperature measurement signal with the first temperature measurement signal, the interference degree of the interfering substance can be characterized, and the interference degree of the interfering substance will cause the infrared temperature measurement light to attenuate. Therefore, the temperature obtained by the second temperature measurement signal is corrected using the interference degree, and a relatively accurate temperature of the object can be obtained. This design is compatible with more application environments and improves the accuracy of temperature measurement.

[0031] It can be understood that when there is a lot of dust or water mist in the external environment, for example, the interference level of this situation is quantified as 2, and when there is relatively little dust or water mist in the external environment, the interference level is quantified as 1.2. The higher the interference level, the more the infrared temperature measurement light is attenuated. This can be roughly considered to be a linear relationship. Therefore, the measured temperature can be multiplied by the correction coefficient to obtain the object temperature, that is, T=T0*a, T is the corrected object temperature, T0 is the temperature measured according to the second temperature measurement signal, the greater the interference level, the larger the correction coefficient a is. For example, when there is a lot of dust or water mist in the external environment, the correction coefficient a is 1.6, and when there is less dust or water mist in the external environment, the correction coefficient a is 1.3.

[0032] In some embodiments of the present invention, Figure 1 、 2As shown, when measuring temperature, the user needs to place the object to be measured at the focal position where the focusing lens 300 converges the light, which can improve the accuracy of temperature measurement. However, infrared light is invisible light, and the user cannot accurately know the focal position of the infrared light. Therefore, the wave splitting infrared temperature measurement device also includes a laser emitter 400 and a beam splitter 500, both of which are arranged on the base shell. The laser emitter 400 is used to emit visible identification light. The beam splitter 500 is located between the focusing lens 300 and the wave splitting component 200. Among them, one of the infrared temperature measurement light and the visible identification light is reflected by the beam splitter 500, and the other of the infrared temperature measurement light and the visible identification light passes through the beam splitter 500. The path of the infrared temperature measurement light and the path of the visible identification light are coaxial.

[0033] The laser emitter 400 and the infrared temperature measurement probe 100 are respectively located at different positions of the base shell. The spectrometer lens 500 is used to make the path of the infrared temperature measurement light and the path of the visible identification light from the spectrometer lens 500 to the object to be measured overlap, that is, the path of the infrared temperature measurement light and the path of the visible identification light are coaxial. At this time, when the user is measuring the temperature, the focus of the visible identification light converged by the condenser lens 300 overlaps with the focus of the infrared temperature measurement light. Therefore, the user can know the position of the focus of the infrared temperature measurement light by seeing the focus of the visible identification light, and relatively accurately place the focus position on the surface of the object to be measured to obtain more accurate temperature conditions.

[0034] In some embodiments of the present invention, Figure 1 、 2 As shown, the beam splitter lens 500 is made of a semi-transparent and semi-reflective material, and includes a first optical surface 510 and a second optical surface 520 facing each other. The infrared temperature measuring probe 100 faces the second optical surface 520, and the infrared temperature measuring light passes through the beam splitter lens 500 from the first optical surface 510 and is emitted from the second optical surface 520 to be fed back to the infrared temperature measuring probe 100. The laser emitter 400 faces the first optical surface 510, and the visible identification light is reflected from the first optical surface 510 to be emitted to the focusing lens 300.

[0035] The infrared temperature measuring probe 100 , the beam splitter lens 500 , and the focusing lens 300 may be located on the same straight line, and the laser emitter 400 may be located on the side of the beam splitter lens 500 .

[0036] In some embodiments of the present invention, the infrared temperature measuring probe 100 can also be directed toward the first light surface 510, and the infrared temperature measuring light passing through the condensing lens 300 is reflected by the first light surface 510 and then enters the infrared temperature measuring probe 100, while the laser emitter 400 is directed toward the second light surface 520, and the visible identification light passes through the splitter lens 500 from the second light surface 520 and is emitted from the first light surface 510.

[0037] Specifically, if Figure 1 、 2 As shown, the infrared temperature measuring probe 100 is located at the focus formed by the convex lens on the path of the infrared temperature measuring light, and the laser emitter 400 is located at the focus formed by the convex lens on the path of the visible marking light.

[0038] In some embodiments of the present invention, the beam splitter lens 500 is tilted in the base shell so that the exit angle of the infrared temperature measurement light on the second optical surface 520 and the incident angle of the visual marking light on the first optical surface 510 are both 45°.

[0039] In some embodiments of the present invention, Figure 1-Figure 3 As shown, the mounting base 210 is rotatably disposed in the base shell. During the rotation of the mounting base 210 , it can switch between the first state and the second state, and can save space for arranging the mounting base 210 in the base shell.

[0040] In some embodiments of the present invention, the mounting base 210 may also be arranged in the base shell for translation, and the mounting base 210 may be switched between the first state and the second state through translation.

[0041] In some embodiments of the present invention, Figure 3 As shown, there are multiple first light openings 211 and multiple second light openings 212, and the multiple first light openings 211 and the multiple second light openings 212 are alternately arranged and arranged circumferentially around the rotation axis of the mounting base 210. There are multiple filters 220 and they are arranged in a one-to-one correspondence at the second light openings 212.

[0042] The mounting base 210 can be switched from the first state to the second state by rotating in one direction, and can also be switched from the second state to the first state, and the travel distance for each switching is shortened.

[0043] Specifically, the number of the first light openings 211 and the second light openings 212 are both three, and are alternately and evenly arranged circumferentially around the rotation axis of the mounting base 210. The number of the first light openings 211 and the second light openings 212 can also be other numbers, but usually the number of the first light openings 211 and the second light openings 212 are equal.

[0044] In some embodiments of the present invention, a driving component 600 is further provided in the base shell, and the driving component 600 is connected to the wave splitting component 200 to drive the wave splitting component 200 to rotate. Specifically, the driving component 600 can be a motor or a cylinder. No manual operation is required. The driving component 600 automatically drives the wave splitting component 200 to rotate. In addition, in conjunction with the structure in which multiple first light-passing ports 211 and multiple second light-passing ports 212 are alternately arranged and circumferentially arranged around the rotation axis of the mounting base 210, the driving component 600 only needs to drive the wave splitting component 200 to rotate continuously in one direction to realize the mutual switching between the first state and the second state. There is no need to set the control logic and related structure for forward and reverse rotation, and the structure is simple.

[0045] In some embodiments of the present invention, Figure 1 As shown, the wave splitting infrared temperature measuring device further includes a control module 700 , and the control module 700 is connected to the driving component 600 and the infrared temperature measuring probe 100 respectively.

[0046] Among them, the control module 700 can be selected from a processor such as an MCU or a CPU and its affiliated circuits. The control module 700 can control the rotation of the driving component 600, thereby obtaining a first temperature measurement signal in the first state and a second temperature measurement signal in the second state. By comparing the first temperature measurement signal and the second temperature measurement signal, it can be determined whether correction is needed and a relatively accurate object temperature can be converted.

[0047] The technical features of the above-mentioned embodiments can be combined arbitrarily. In order to make the description concise, not all possible combinations of the technical features in the above-mentioned embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0048] Although the embodiments of the present invention have been shown and described, those skilled in the art will appreciate that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and purpose of the present invention, and that the scope of the present invention is defined by the claims and their equivalents.

Claims

1. A split-wave infrared temperature measuring device, characterized in that: include: base shell; An infrared temperature measuring probe, used for receiving infrared temperature measuring light and converting it into a temperature measuring signal, wherein the infrared temperature measuring probe is arranged on the base shell; The wave splitting component comprises a mounting base and a filter, wherein the filter is used to allow light to pass through in a specific wavelength band, the mounting base is movably arranged on a base shell, the mounting base is at least provided with a first light-through port and a second light-through port, the filter is arranged at the second light-through port, the mounting base moves in the base shell to form at least a first state and a second state, in the first state, the first light-through port is located in front of the infrared temperature measuring probe, and in the second state, the filter is located in front of the infrared temperature measuring probe; The focusing lens is used to converge the light. The focusing lens is arranged on the base shell. The focusing lens, the wave splitting component and the infrared temperature measuring probe are arranged in sequence along the path of the infrared temperature measuring light.

2. A split-wave infrared temperature measuring device according to claim 1, characterized in that: It also includes a laser emitter and a spectroscope lens, both of which are arranged on the base shell, wherein the laser emitter is used to emit visible identification light, and the spectroscope lens is located between the focusing lens and the wave splitting component, wherein one of the infrared temperature measurement light and the visible identification light is reflected on the spectroscope lens, and the other of the infrared temperature measurement light and the visible identification light passes through the spectroscope lens, and the path of the infrared temperature measurement light and the path of the visible identification light are coaxial.

3. A split-wave infrared temperature measuring device according to claim 2, characterized in that: The beam splitter lens is made of a semi-transparent and semi-reflective material, and includes a first optical surface and a second optical surface facing each other. The infrared temperature measuring probe faces the second optical surface, and the infrared temperature measuring light passes through the beam splitter lens from the first optical surface and is emitted from the second optical surface to be fed back to the infrared temperature measuring probe. The laser emitter faces the first optical surface, and the visible identification light is reflected on the first optical surface to be emitted to the focusing lens.

4. A split-wave infrared temperature measuring device according to claim 3, characterized in that: The condensing lens is a convex lens.

5. A split-wave infrared temperature measuring device according to claim 4, characterized in that: The infrared temperature measuring probe is located at the focus formed by the convex lens on the path of the infrared temperature measuring light, and the laser transmitter is located at the focus formed by the convex lens on the path of the visible marking light.

6. A split-wave infrared temperature measuring device according to claim 3, characterized in that: The beam splitter lens is tilted in the base shell so that the exit angle of the infrared temperature measurement light on the second optical surface and the incident angle of the visible marking light on the first optical surface are both 45°.

7. A split-wave infrared temperature measuring device according to claim 1, characterized in that: The mounting base is rotatably disposed in the base shell.

8. A split-wave infrared temperature measuring device according to claim 7, characterized in that: There are multiple first light openings and multiple second light openings, which are alternately arranged and circumferentially arranged around the rotation axis of the mounting base. There are multiple filters and they are arranged in one-to-one correspondence at the second light openings.

9. A split-wave infrared temperature measuring device according to claim 7, characterized in that: A driving component is also arranged in the base shell, and the driving component is connected with the wave splitting component to drive the wave splitting component to rotate.

10. A split-wave infrared temperature measuring device according to claim 9, characterized in that: It also includes a control module, which is connected to the driving component and the infrared temperature measuring probe respectively.

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