SMT (Surface Mount Technology) dual-directional coupler test fixture
By designing an SMT dual-directional coupler test fixture that includes an RF connector, a base, a test board, and half-hole pins, the high cost and complexity of traditional testing methods are solved, achieving low-cost, convenient, high-volume testing and a clear view of the test results.
Patent Information
- Application Number
- CN202420720576.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-04-09
- Publication Date
- 2025-01-28
- Estimated Expiration
- 2034-04-09
AI Technical Summary
Traditional testing methods for SMT dual directional couplers are costly, complex to operate, unsuitable for large-scale testing, and the test results are easily affected by poor contact.
Design a test fixture that includes an RF connector, a base, a test board, and a half-hole pin. The fixture is made of rust-resistant aluminum 5A05 material. The RF connector is fixed with screws and the half-hole pin is used for retractable clamping, simplifying the operation process.
It implements a low-cost and simple testing method, suitable for large-scale testing, with a clear and unobstructed field of view, facilitating debugging and component replacement.
Smart Images
Figure CN222420292U_ABST
Abstract
Description
Technical Field
[0001] The invention relates to the field of radio frequency circuit testing, and in particular to a SMT dual directional coupler testing fixture. Background Art
[0002] SMT dual directional coupler is a universal RF / microwave component that can be used for signal isolation, separation and mixing, such as power monitoring, source output power stabilization, signal source isolation, transmission and reflection sweep frequency testing, etc.
[0003] The testing of SMT dual directional couplers has always been a difficult problem that engineers cannot avoid. Good testing methods and test fixtures can not only improve testing efficiency, but also save a lot of manpower and financial resources.
[0004] Traditional SMT dual directional coupler testing involves soldering and crimping:
[0005] 1. The welding test method is to directly weld the SMT dual directional coupler to the test board for testing. This test method will leave a lot of tin slag on the surface of the SMT dual directional coupler, which has a great impact on the product appearance and is not conducive to product delivery. Welding and disassembling the SMT dual directional coupler also requires a lot of time, so this test method is not suitable for testing large quantities of SMT dual directional couplers, but only for the first test of SMT dual directional couplers.
[0006] 2. The crimping test is to design a crimping fixture to fix and connect the SMT dual directional coupler to the test board by vertical pressing. This test method requires a cleverly designed test fixture. If the size of the SMT dual directional coupler is very limited, then the design of the test fixture will be very difficult and the price will be very expensive. If the size of the SMT dual directional coupler is very small, then the corresponding pressing point of the crimping fixture will also be very small, and the vertical pressure will become smaller, which may cause the SMT dual directional coupler to not be in full contact with the test board, resulting in poor contact and affecting the test results. This crimping test method also has a disadvantage, that is, this crimping fixture will have at least two points in direct contact with the SMT dual directional coupler, which will block the debugging engineer's line of sight and the space for replacing components, which is not conducive to debugging. Summary of the invention
[0007] The purpose of the present invention is to provide a SMT dual directional coupler test fixture which is low in cost, simple in operation and suitable for mass testing in view of the above problems existing in the traditional SMT dual directional coupler test method.
[0008] In order to achieve the above-mentioned purpose, the technical scheme adopted by the present invention is: an SMT dual directional coupler test fixture, comprising a radio frequency connector, a base, a test board and a half-hole needle; the lower part of the connection surface of the radio frequency connector is provided with screws, and the middle part is provided with connection terminals; the connection terminals of the radio frequency connector are arranged on the test board and fixed to the side wall of the base by screws; the test board is fixed to the upper surface of the base; one end of the half-hole needle is fixed on the test board and connected to the microstrip line on the test board, and the other end is used to connect with the SMT dual directional coupler to be tested.
[0009] Furthermore, the base is machined from rust-proof aluminum 5A05.
[0010] Furthermore, the radio frequency connector is a conventional SMA interface.
[0011] Furthermore, the test board is a PCB board configured to meet the test requirements.
[0012] Furthermore, a microstrip line is provided on the test board, and a connecting terminal on the radio frequency connector is welded on the test board and connected to the microstrip line.
[0013] Furthermore, there are a plurality of half-hole needles, which are divided into two groups and symmetrically arranged. One end of the half-hole needle away from the microstrip line can shrink and rebound to clamp the SMT dual directional coupler to be tested.
[0014] Compared with the prior art, the present invention has the following beneficial effects:
[0015] The SMT dual directional coupler test fixture of the present invention adopts rust-proof aluminum 5A05, has low cost and good corrosion resistance; adopts a simple welding process, has a simple structure, a simple process and a low manufacturing cost.
[0016] The SMT dual directional coupler test fixture of the present invention is easy to operate, and can complete the test by simply picking it up and putting it down, so it is convenient to carry out mass testing.
[0017] The SMT dual directional coupler test fixture of the present invention has a clear field of view without obstruction, and is convenient for debugging and replacing components. BRIEF DESCRIPTION OF THE DRAWINGS
[0018] Figure 1 A structural schematic diagram of a SMT dual directional coupler test fixture of the present invention is shown.
[0019] Figure 2 A schematic diagram of the structural decomposition of an SMT dual directional coupler test fixture of the present invention is shown.
[0020] Among them: 1. RF connector; 2. base; 3. test board; 4. half-hole needle; 1-1. connecting terminal; 1-2. screw; 3-1. microstrip line. DETAILED DESCRIPTION
[0021] The preferred embodiments of the present invention will be described in more detail below with reference to the accompanying drawings. Although the preferred embodiments of the present invention are shown in the accompanying drawings, it should be understood that the present invention can be implemented in various forms and should not be limited to the embodiments set forth herein.
[0022] like Figure 1-2 As shown, a SMT dual directional coupler test fixture comprises a radio frequency connector 1, a base 2, a test board 3 and a half-hole needle 4; a screw 1-2 is provided at the lower part of the connection surface of the radio frequency connector 1, and a connection terminal 1-1 is provided in the middle part; the connection terminal 1-1 of the radio frequency connector 1 is welded on the test board 3 and fixed to the side wall of the base 2 by the screw 1-2; the test board 3 is fixed on the upper surface of the base 2; one end of the half-hole needle 4 is fixed on the test board 3 and connected to the microstrip line 3-1 on the test board 3, and the other end is used to connect with the SMT dual directional coupler to be tested.
[0023] Preferably, the base 2 is machined from rust-proof aluminum 5A05.
[0024] Preferably, the RF connector 1 is a conventional SMA interface.
[0025] Preferably, the test board 3 is a PCB board configured to meet the test requirements.
[0026] Preferably, the connection terminal 1 - 1 of the RF connector 1 is connected to a microstrip line 3 - 1 on the test board 3 .
[0027] One end of the half-hole needle 4 is welded on the test board 3, and the other end can shrink and rebound to a certain extent. When the SMT dual-directional coupler is placed, the half-hole needles 4 on both sides shrink and expand outward. When the SMT dual-directional coupler is in full contact with the test board 3, the half-hole needles 4 on both sides rebound, applying pressure to the SMT dual-directional coupler to fix it. The half-hole needle 4 is made of copper plated with gold and can conduct electricity, so the SMT dual-directional coupler can be connected to the test board 3 to achieve intercommunication.
[0028] In actual use, you only need to gently place the SMT dual directional coupler on the test fixture to complete a test, then remove it and replace it with the next one.
[0029] In actual use, when debugging the first SMT dual directional coupler, it is very convenient to debug and replace components because there is no obstruction above the test fixture and the field of view is clear.
[0030] The above describes one embodiment of the present invention, and the above description is exemplary, not exhaustive, and is not limited to the disclosed embodiments. Many modifications and changes will be apparent to those skilled in the art without departing from the scope and spirit of the described embodiments.
Claims
1. A SMT dual directional coupler test fixture, characterized by: The invention comprises a radio frequency connector (1), a base (2), a test board (3) and a half-hole needle (4); the lower part of the connection surface of the radio frequency connector (1) is provided with screws (1-2), and the middle part is provided with a connection terminal (1-1); the connection terminal (1-1) of the radio frequency connector (1) is arranged on the test board (3) and fixed to the side wall of the base (2) by means of screws (1-2); the test board (3) is fixed to the upper surface of the base (2); one end of the half-hole needle (4) is fixed to the test board (3) and connected to the microstrip line (3-1) on the test board (3), and the other end is used to connect to the SMT dual directional coupler to be tested.
2. The SMT dual directional coupler test fixture according to claim 1, characterized in that: The base (2) is machined from rust-proof aluminum 5A05.
3. The SMT dual directional coupler test fixture according to claim 1, characterized in that: The radio frequency connector (1) is a conventional SMA interface.
4. The SMT dual directional coupler test fixture according to claim 1, characterized in that: The test board (3) is a PCB board.
5. The SMT dual directional coupler test fixture according to claim 1, characterized in that: The test board (3) has a microstrip line (3-1), and the connection terminal (1-1) on the radio frequency connector (1) is welded on the test board (3) and connected to the microstrip line (3-1).
6. The SMT dual directional coupler test fixture according to claim 1, characterized in that: The half-hole needles (4) are N in number (N≥3), divided into two groups and symmetrically arranged, and one end of the half-hole needle (4) away from the microstrip line (3-1) can shrink and rebound to clamp the SMT dual directional coupler to be tested.
7. The SMT dual directional coupler test fixture according to claim 1 or 6, characterized in that: The half-hole needle (4) is made of copper plated with gold and is able to conduct electricity.