Backlight testing device

Abstract

The utility model discloses a backlight lamp testing device which comprises a communication module, a control module, a testing switching module, a first backlight lamp interface module and a second backlight lamp interface module. The first backlight lamp interface module is used for being connected with a first backlight lamp interface of a mainboard to be tested; the second backlight lamp interface module is used for being connected with a second backlight lamp interface of the mainboard to be tested; the communication module is used for receiving a test instruction for a first backlight interface or a second backlight interface of the mainboard to be tested; the control module is used for controlling the test switching module to be connected with the first backlight lamp interface module or the second backlight lamp interface module based on a test instruction, and sending the test instruction to the first backlight lamp interface module or the second backlight lamp interface module through the test switching module; therefore, the first backlight lamp interface module or the second backlight lamp interface module obtains an electric signal of the first backlight lamp interface or the second backlight lamp interface of the mainboard to be tested and sends the electric signal to the control module through the test switching module.

Description

Technical Field

[0001] The present application relates to the field of electronic equipment, and in particular to a backlight testing device. Background Art

[0002] With the diversification of electronic equipment business, the colors of keyboard backlights are also diversified. Therefore, in order to support the diversification of keyboard backlight colors, keyboard backlights with multiple modes need to be designed on the motherboard of electronic equipment. In this way, in the functional test of the motherboard, the keyboard backlight functions of these multiple modes must be tested. At present, for each mode, the test is carried out through the corresponding test device, and the motherboard needs to be connected to a keyboard with a corresponding color light, and the tester observes the color of the keyboard backlight to determine whether the keyboard backlight function of the motherboard in this mode is normal. In this way, the operation is cumbersome and the test efficiency is low. Utility Model Content

[0003] In view of this, the embodiments of the present application provide a backlight testing device to at least solve the above-mentioned technical problems existing in the prior art.

[0004] According to a first aspect of the present application, an embodiment of the present application provides a backlight testing device, comprising:

[0005] A communication module, a control module, a test switching module, a first backlight interface module and a second backlight interface module;

[0006] The first backlight interface module is used to connect to the first backlight interface of the mainboard to be tested;

[0007] The second backlight interface module is used to connect to the second backlight interface of the mainboard to be tested;

[0008] The communication module is connected to the control module, and is used to receive a test instruction for the first backlight interface or the second backlight interface of the mainboard to be tested, and send the test instruction to the control module;

[0009] The control module is connected to the test switching module, and is used to control the test switching module to be connected to the first backlight interface module or the second backlight interface module based on the test instruction, and send the test instruction to the first backlight interface module or the second backlight interface module through the test switching module, so that the first backlight interface module or the second backlight interface module obtains the electrical signal of the first backlight interface or the second backlight interface of the mainboard to be tested, and sends it to the control module through the test switching module.

[0010] Optionally, the communication module includes a communication interface submodule, a voltage conversion submodule and a communication submodule;

[0011] The communication interface submodule is used to establish a wired connection with the mainboard to be tested to receive a test instruction and a first voltage provided by the mainboard to be tested;

[0012] The voltage conversion submodule is connected to the communication interface submodule and is used to convert the first voltage provided by the mainboard to be tested into a second voltage to provide power to the communication submodule and the control module;

[0013] The communication submodule is connected to the communication interface submodule and is used to send the test instruction to the control module.

[0014] Optionally, the voltage conversion submodule and the communication submodule are integrated into one communication chip.

[0015] Optionally, the communication interface submodule is a USB interface.

[0016] Optionally, the control module includes a control submodule and a data identification submodule.

[0017] The control submodule is connected to the communication module and the test switching module respectively, and the data identification submodule is connected to the control submodule and the test switching module respectively.

[0018] The control submodule is used to control the test switching module to be connected with the first backlight interface module based on the test instruction, and send the test instruction to the first backlight interface module through the test switching module, so that the first backlight interface module obtains the electrical signal of the first backlight interface of the mainboard to be tested, and sends it to the control submodule through the test switching module; or identifies the specified color information in the test instruction through the data identification submodule, and controls the test switching module to be connected with the second backlight interface module based on the specified color information, and sends the specified color information and the test instruction to the second backlight interface module through the test switching module, so that the second backlight interface module obtains the electrical signal of the pin corresponding to the specified color information in the second backlight interface of the mainboard to be tested, and sends it to the control submodule through the test switching module.

[0019] Optionally, the control submodule includes an analog-to-digital conversion module for converting the acquired electrical signal into a digital signal.

[0020] Optionally, the control submodule is a control chip.

[0021] Optionally, the data identification submodule is a color information identification chip.

[0022] Optionally, the backlight testing device further comprises:

[0023] The display module is connected to the control module and is used to display the test results output by the control module.

[0024] Optionally, the backlight testing device further comprises:

[0025] The interface connection line is used to connect the first backlight interface module with the first backlight interface of the mainboard to be tested; and to connect the second backlight interface module with the second backlight interface of the mainboard to be tested.

[0026] The backlight test device provided in the embodiment of the present application is provided with a communication module, a control module, a test switching module, a first backlight interface module and a second backlight interface module; the first backlight interface module is used to connect to the first backlight interface of the motherboard to be tested; the second backlight interface module is used to connect to the second backlight interface of the motherboard to be tested; the communication module is used to receive a test instruction for the first backlight interface or the second backlight interface of the motherboard to be tested, and send the test instruction to the control module; the control module is used to control the test switching module to connect to the first backlight interface module or to connect to the second backlight interface module based on the test instruction, and communicate with the control module to test the first backlight interface module and the second backlight interface module. The test instruction is sent to the first backlight interface module or the second backlight interface module through the test switching module, so that the first backlight interface module or the second backlight interface module obtains the electrical signal of the first backlight interface or the second backlight interface of the mainboard to be tested, and sends it to the control module through the test switching module; thereby, the functional test of different backlight interfaces of the mainboard to be tested can be completed through a set of backlight testing devices, and it is an automated test. The mainboard to be tested does not need to be connected to a keyboard with lights of corresponding colors, and the tester does not need to observe the color of the keyboard lights. The operation is simple and the test efficiency is high. The test time can be reduced from 5 minutes to 15 seconds.

[0027] The above description is only an overview of the technical solution of the present application. In order to more clearly understand the technical means of the present application, it can be implemented in accordance with the contents of the specification. In order to make the above and other purposes, features and advantages of the present application more obvious and easy to understand, the specific implementation methods of the present application are listed below. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] Figure 1 This is a schematic diagram of the structure of a backlight testing device in an embodiment of the present application;

[0029] Figure 2 It is a structural schematic diagram of another backlight testing device in an embodiment of the present application;

[0030] Figure 3 This is a circuit connection diagram of the communication module and the control module in the embodiment of the present application;

[0031] Figure 4 Schematic diagram of the structure of another backlight testing device in an embodiment of the present application. DETAILED DESCRIPTION

[0032] In order to make the purpose, technical solution and advantages of the embodiments of the present application clearer, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative work are within the scope of protection of the present application.

[0033] The present application embodiment provides a backlight testing device, such as Figure 1 As shown, including:

[0034] A communication module 11 , a control module 12 , a test switching module 13 , a first backlight interface module 14 and a second backlight interface module 15 .

[0035] The first backlight interface module 14 is used to connect to the first backlight interface of the mainboard to be tested.

[0036] The second backlight interface module 15 is used to connect to the second backlight interface of the mainboard to be tested.

[0037] The communication module 11 is connected to the control module 12 , and is used for receiving a test instruction of the first backlight interface or the second backlight interface of the mainboard to be tested, and sending the test instruction to the control module 12 .

[0038] The control module 12 is connected to the test switching module 13, and is used to control the test switching module 13 to be connected to the first backlight interface module 14 or the second backlight interface module 15 based on the test instruction, and send the test instruction to the first backlight interface module 14 or the second backlight interface module 15 through the test switching module 13, so that the first backlight interface module 14 or the second backlight interface module 15 obtains the electrical signal of the first backlight interface or the second backlight interface of the mainboard to be tested, and sends it to the control module 12 through the test switching module 13.

[0039] In this embodiment, when the first backlight interface of the motherboard to be tested needs to be tested, the first backlight interface module 14 can be connected to the first backlight interface of the motherboard to be tested through an interface connection line. When the second backlight interface of the motherboard to be tested needs to be tested, the second backlight interface module 15 can be connected to the second backlight interface of the motherboard to be tested through an interface connection line. The interface connection line can specifically be an FPC cable.

[0040] In this embodiment, the first backlight interface and the second backlight interface of the motherboard to be tested can be single-color backlight interfaces or multi-color backlight interfaces. For example, the first backlight interface of the motherboard to be tested is a white backlight interface, and the second backlight interface is a color (RGB, red, green, and blue) backlight interface.

[0041] In this embodiment, the communication protocol between the motherboard to be tested and the backlight test device can be predefined, and the test instructions for each backlight color are defined by the corresponding communication protocol. For example, the first backlight interface of the motherboard to be tested is a white backlight interface, and the second backlight interface is a color (RGB) backlight interface; white backlight protocol: White->RGB Led1; RGB backlight protocol: Red->RGB Led2, Green->RGB Led3, Blue->RBG Led4. In this way, the control module 12 can determine whether the control test switching module 13 is connected to the first backlight interface module 14 or the second backlight interface module 15 based on the communication protocol.

[0042] In some embodiments, Figure 2 As shown, the backlight test device also includes:

[0043] The interface connection line 16 is used to connect the first backlight interface module 14 with the first backlight interface of the mainboard to be tested; and to connect the second backlight interface module 15 with the second backlight interface of the mainboard to be tested.

[0044] In this embodiment, by setting the interface connection line, when the backlight test device is used to test the first backlight interface and the second backlight interface of the motherboard to be tested, there is no need to find an additional interface connection line, and the test can be performed quickly, thereby improving the test efficiency.

[0045] In this embodiment, the communication module 11 can perform wired or wireless communication with the mainboard under test or the test platform, and receive a test instruction sent by the test platform through the mainboard under test, or receive a test instruction sent by the mainboard under test.

[0046] In some embodiments, Figure 2 As shown, the communication module 11 includes a communication interface submodule 111 , a voltage conversion submodule 112 and a communication submodule 113 .

[0047] The communication interface submodule 111 is used to establish a wired connection with the mainboard to be tested to receive a test instruction and a first voltage provided by the mainboard to be tested.

[0048] The voltage conversion submodule 112 is connected to the communication interface submodule 111 and is used to convert a first voltage provided by the mainboard to be tested into a second voltage to provide power to the communication submodule 113 and the control module 12 .

[0049] The communication submodule 113 is connected to the communication interface submodule 111 and is used to send the test instruction to the control module 12 .

[0050] In this embodiment, in order to stably receive test instructions and not set a power supply module in the backlight testing device to reduce the volume and weight of the backlight testing device, a communication interface submodule 111 can be set in the communication module 11 for establishing a wired connection with the mainboard to be tested to receive test instructions and the first voltage provided by the mainboard to be tested.

[0051] Generally, the voltage provided by the motherboard to be tested is 5V, while the voltage required by the communication submodule 113 and the control module 12 may not be 5V. Therefore, it is necessary to set a voltage conversion submodule 112 in the communication module 11 to convert the first voltage provided by the motherboard to be tested into a second voltage to provide power to the communication submodule 113 and the control module 12. For example, if the voltage required by the communication submodule 113 and the control module 12 is 3.3V, the voltage conversion submodule 112 can convert the 5V voltage into a 3.3V voltage and then provide it to the communication submodule 113 and the control module 12. The circuit diagram of the communication module 11 and the control module 12 is shown in FIG. Figure 3 As shown. Among them, the 5V voltage of the mainboard to be tested is input into the voltage conversion submodule 112 through the communication interface submodule 111, and the voltage conversion submodule 112 outputs a 3.3V voltage, which is then connected to the communication submodule 113 and the control module 12. After the control module 12 detects the 3.3V voltage, it determines that the backlight test device has been turned on and is working. The voltage conversion submodule 112 needs to be grounded (GND).

[0052] In specific implementation, since the current communication chip can have voltage conversion function and communication function, the voltage conversion submodule 112 and the communication submodule 113 can be integrated into one communication chip. In this way, voltage conversion and instruction transmission can be completed through one communication chip, which can reduce the size of the backlight test device.

[0053] In specific implementation, the communication interface submodule 111 can be a USB interface. Thus, since the USB interface is a relatively common interface at present, setting the communication interface submodule 111 as a USB interface can facilitate wired connection with the motherboard to be tested.

[0054] In some embodiments, Figure 2 As shown, the control module 12 includes a control submodule 121 and a data identification submodule 122 .

[0055] The control submodule 121 is connected to the communication module 11 and the test switching module 13 respectively, and the data identification submodule 122 is connected to the control submodule 121 and the test switching module 13 respectively.

[0056] The control submodule 121 is used to control the test switching module 13 to be connected with the first backlight interface module 14 based on the test instruction, and send the test instruction to the first backlight interface module 14 through the test switching module 13, so that the first backlight interface module 14 obtains the electrical signal of the first backlight interface of the mainboard to be tested, and sends it to the control submodule 121 through the test switching module 13; or identifies the specified color information in the test instruction through the data identification submodule 122, and controls the test switching module 13 to be connected with the second backlight interface module 15 based on the specified color information, and sends the specified color information and the test instruction to the second backlight interface module 15 through the test switching module 13, so that the second backlight interface module 15 obtains the electrical signal of the pin corresponding to the specified color information in the second backlight interface of the mainboard to be tested, and sends it to the control submodule 121 through the test switching module 13.

[0057] In this embodiment, the first backlight interface of the motherboard to be tested is a white backlight interface, and the second backlight interface is a color backlight interface. The test switching module 13 can be switched to connect to the first backlight interface module 14 or to connect to the second backlight interface module 15. The test switching module 13 can be a control switch.

[0058] The control submodule 121 does not have the function of identifying the color information specified in the control instruction. Therefore, when the control submodule 121 obtains the test instruction for the first backlight interface, it can control the test switching module 13 to connect with the first backlight interface module 14, and send the test instruction to the first backlight interface module 14 through the test switching module 13. The first backlight interface module 14 obtains the electrical signal of the first backlight interface of the motherboard to be tested, such as the voltage value of the first backlight interface, and then returns it to the control submodule 121 through the test switching module 13. Then the control submodule 121 can compare the obtained voltage value with the voltage threshold of the first backlight interface to determine whether the first backlight function is normal. Or the control submodule 121 sends the electrical signal to the motherboard to be tested or the test platform through the communication module 11 to determine whether the first backlight function is normal in the motherboard or the test platform.

[0059] Since the second backlight interface of the motherboard to be tested is a color backlight interface, the second backlight interface of the motherboard to be tested includes pins of multiple colors, and each color pin needs to be tested separately. When the control submodule 121 obtains the test instruction for the second backlight interface, the test instruction can be sent to the data identification submodule 122 to identify the specified color information in the test instruction. Then the data identification submodule 122 sends the test instruction and the specified color information in the test instruction to the test switching module 13. The test switching module 13 is connected to the second backlight interface module 15 based on the test instruction and the specified color information in the test instruction, and sends the specified color information and the test instruction to the second backlight interface module 15. The second backlight interface module 15 obtains the electrical signal of the pin corresponding to the specified color information in the second backlight interface of the motherboard to be tested, such as the voltage value of the corresponding pin, and sends it to the control submodule 121 through the test switching module 13. The control submodule 121 can compare the voltage value of the corresponding pin with the voltage threshold to determine whether the function of the specified color backlight in the second backlight is normal. Or the control submodule 121 sends the electrical signal of the corresponding pin to the mainboard to be tested or the test platform through the communication module 11, so as to determine whether the function of the designated color backlight in the second backlight is normal in the mainboard or the test platform.

[0060] In specific implementation, the control submodule 121 may be a control chip, and may be a single-chip microcomputer of the STM32 model.

[0061] In specific implementation, the data identification submodule is a color information identification chip, which can be a RGB control chip.

[0062] In specific implementation, the control submodule 121 may include an analog-to-digital conversion module for converting the acquired electrical signal into a digital signal, so as to facilitate comparison of the signals.

[0063] In an optional embodiment, if Figure 4 As shown, the backlight test device also includes:

[0064] The display module 17 is connected to the control module 12 and is used to display the test results output by the control module 12 .

[0065] In this embodiment, the control module 12 can determine whether the first backlight function and the second backlight function are normal based on the electrical signal, and display the test results through the display module for users to view.

[0066] The backlight test device provided in the embodiment of the present application is provided with a communication module, a control module, a test switching module, a first backlight interface module and a second backlight interface module; the first backlight interface module is used to connect to the first backlight interface of the motherboard to be tested; the second backlight interface module is used to connect to the second backlight interface of the motherboard to be tested; the communication module is used to receive a test instruction for the first backlight interface or the second backlight interface of the motherboard to be tested, and send the test instruction to the control module; the control module is used to control the test switching module to connect to the first backlight interface module or to connect to the second backlight interface module based on the test instruction, and communicate with the control module to test the first backlight interface module and the second backlight interface module. The test instruction is sent to the first backlight interface module or the second backlight interface module through the test switching module, so that the first backlight interface module or the second backlight interface module obtains the electrical signal of the first backlight interface or the second backlight interface of the mainboard to be tested, and sends it to the control module through the test switching module; thereby, the functional test of different backlight interfaces of the mainboard to be tested can be completed through a set of backlight testing devices, and it is an automated test. The mainboard to be tested does not need to be connected to a keyboard with lights of corresponding colors, and the tester does not need to observe the color of the keyboard lights. The operation is simple and the test efficiency is high. The test time can be reduced from 5 minutes to 15 seconds.

[0067] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Therefore, a feature defined as "first" or "second" may explicitly or implicitly include at least one of the features. In the description of this application, the meaning of "plurality" is two or more, unless otherwise clearly and specifically defined.

[0068] The above is only a specific implementation of the present application, but the protection scope of the present application is not limited thereto. Any person skilled in the art who is familiar with the present technical field can easily think of changes or substitutions within the technical scope disclosed in the present application, which should be included in the protection scope of the present application. Therefore, the protection scope of the present application should be based on the protection scope of the claims.

Claims

1. A backlight testing device, characterized in that: include: A communication module, a control module, a test switching module, a first backlight interface module and a second backlight interface module; The first backlight interface module is used to connect to the first backlight interface of the mainboard to be tested; The second backlight interface module is used to connect to the second backlight interface of the mainboard to be tested; The communication module is connected to the control module, and is used to receive a test instruction for the first backlight interface or the second backlight interface of the mainboard to be tested, and send the test instruction to the control module; The control module is connected to the test switching module, and is used to control the test switching module to be connected to the first backlight interface module or the second backlight interface module based on the test instruction, and send the test instruction to the first backlight interface module or the second backlight interface module through the test switching module, so that the first backlight interface module or the second backlight interface module obtains the electrical signal of the first backlight interface or the second backlight interface of the mainboard to be tested, and sends it to the control module through the test switching module.

2. The backlight testing device according to claim 1, characterized in that: The communication module includes a communication interface submodule, a voltage conversion submodule and a communication submodule; The communication interface submodule is used to establish a wired connection with the mainboard to be tested to receive the test instruction and the first voltage provided by the mainboard to be tested; The voltage conversion submodule is connected to the communication interface submodule and is used to convert the first voltage provided by the mainboard to be tested into a second voltage to provide power to the communication submodule and the control module; The communication submodule is connected to the communication interface submodule and is used to send the test instruction to the control module.

3. The backlight testing device according to claim 2, characterized in that: The voltage conversion submodule and the communication submodule are integrated in one communication chip.

4. The backlight testing device according to claim 2, characterized in that: The communication interface submodule is a USB interface.

5. The backlight testing device according to claim 1, characterized in that: The control module includes a control submodule and a data identification submodule. The control submodule is connected to the communication module and the test switching module respectively, and the data identification submodule is connected to the control submodule and the test switching module respectively. The control submodule is used to control the test switching module to connect with the first backlight interface module based on the test instruction, and send the test instruction to the first backlight interface module through the test switching module, so that the first backlight interface module obtains the electrical signal of the first backlight interface of the motherboard to be tested, and sends it to the control submodule through the test switching module; Or the data identification submodule identifies the specified color information in the test instruction, and based on the specified color information, controls the test switching module to be connected to the second backlight interface module, and sends the specified color information and the test instruction to the second backlight interface module through the test switching module, so that the second backlight interface module obtains the electrical signal of the pin corresponding to the specified color information in the second backlight interface of the motherboard to be tested, and sends it to the control submodule through the test switching module.

6. The backlight testing device according to claim 5, characterized in that: The control submodule includes an analog-to-digital conversion module, which is used to convert the acquired electrical signal into a digital signal.

7. The backlight testing device according to claim 5, characterized in that: The control submodule is a control chip.

8. The backlight testing device according to claim 5, characterized in that: The data identification submodule is a color information identification chip.

9. The backlight testing device according to claim 1, characterized in that: Also includes: The display module is connected to the control module and is used to display the test results output by the control module.

10. The backlight testing device according to claim 1, characterized in that: Also includes: An interface connection line, used to connect the first backlight interface module with the first backlight interface of the mainboard to be tested; Connect the second backlight interface module to the second backlight interface of the mainboard to be tested.

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