Visual marking device for integrated circuit test
By designing a visual marking device for integrated circuit testing, the side-by-side material tape guide grooves and laser marking heads are used to improve the marking efficiency, and the camera lens group design improves the detection speed, solving the problem of inefficiency of traditional marking mechanisms.
Patent Information
- Application Number
- CN202421185076.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-05-28
- Publication Date
- 2025-02-28
- Estimated Expiration
- 2034-05-28
AI Technical Summary
The traditional integrated circuit marking mechanism is inefficient and requires serial number marking and testing one by one, which takes a long time.
A visual marking device for integrated circuit testing is designed, including four tape guide grooves, laser marking heads and cameras arranged side by side. The laser marking heads can mark four integrated circuits at a time, and the camera is used for visual inspection.
The efficiency of integrated circuit marking is improved. The laser marking head can process four chips at a time. The lens group design of the camera can locate and detect multiple products at one time, which improves the detection speed.
Smart Images

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Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of integrated circuit testing, in particular to a visual marking device for integrated circuit testing. Background Art
[0002] An integrated circuit is a miniature electronic device or component. Using a certain process, the transistors, resistors, capacitors, inductors and other components and wiring required in a circuit are interconnected and made on a small piece or several small pieces of semiconductor wafers or dielectric substrates, and then packaged in a tube shell to become a miniature structure with the required circuit function. The appearance identification and detection of integrated circuits is an indispensable and important link, which directly affects the quality of integrated circuit products and the smooth progress of subsequent testing links.
[0003] The traditional marking mechanism can generally only mark and detect the serial number of one integrated circuit. After completing this process, the next integrated circuit is placed in the mechanism for the process operation. This one-by-one marking and detection takes a long time and is inefficient. To solve this technical problem, in the prior art, a Chinese invention patent with publication number CN110026824A discloses a semiconductor device turret test tape integrated machine marking mechanism, which is characterized in that: it includes a base, a square fixing seat is fixed on the upper surface of the base, and a circular groove for a rotating disc to be embedded is opened from top to bottom on the upper surface of the square fixing seat. The rotating disc is connected to the rotating disc by a servo motor that vertically penetrates the base and the square fixing seat from bottom to top, and then the motor shaft is connected to the rotating disc and driven to rotate. Four semiconductor device placement positions are evenly distributed on the rotating disc. The marking work of the marking mechanism at different placement positions and the detection work of the visual inspection system are realized by the rotation of the rotating disc. The integrated circuit chip test sorting machine marking device and control method have a reasonable structure, stable and efficient.
[0004] However, the existing marking mechanism has a complex structure, high requirements for production and assembly precision, and a long debugging process after assembly, which is demanding and not widely used in factories for testing integrated circuits. Utility Model Content
[0005] In view of the defects in the prior art, the utility model provides a visual marking device for integrated circuit testing to solve the technical problems raised in the background technology.
[0006] A visual marking device for integrated circuit testing, comprising a chassis, a visual marking mechanism arranged in the chassis, a material unwinding mechanism arranged on one side of the chassis, and a material coiling mechanism arranged on the other side of the chassis, a material tape guiding mechanism is arranged between the material coiling mechanism and the material unwinding mechanism, and the material tape guiding mechanism is arranged directly below the visual marking mechanism; wherein,
[0007] The material discharging mechanism comprises four sets of material trays arranged side by side, each of which is wound with a chip material belt, and the chips to be visually marked are evenly arranged on the chip material belt;
[0008] The material belt guide mechanism includes a material belt guide groove and a material belt guide assembly arranged at one end of the material belt guide groove, four material belt guide grooves are arranged side by side, and the two ends of each material belt guide groove are respectively arranged in one-to-one correspondence with the corresponding material tray and the winding mechanism, and the material belt guide assembly includes a material belt pressure roller and a motor that drives the material belt pressure roller to rotate; the material belt pressure roller is arranged across the four material belt guide grooves;
[0009] The visual marking mechanism includes a lifting component, a laser marking head installed on the side of the lifting component close to the feeding mechanism, and a camera installed on the side of the laser marking head away from the feeding mechanism. The galvanometer of the laser marking head and the lens of the camera are both located directly above the material belt guide groove.
[0010] Further, the lifting assembly includes a vertically arranged screw slide and a support platform installed on the screw of the screw slide, the top of the screw slide is provided with a hand wheel for driving the screw to rotate axially, the support platform is arranged close to one side of the discharge mechanism, and the laser marking head is fixedly installed on the support platform;
[0011] The bottom of the lead screw slide is fixedly mounted on the chassis.
[0012] Furthermore, a lens mounting box is provided at the bottom of the camera, a lens group for focusing light from bottom to top along the optical path is installed in the lens mounting box, and the lens mounting box is fixedly mounted on the galvanometer housing of the laser marking head;
[0013] The bottom and top of the lens mounting box are both provided with light holes for light to pass through, and the lens of the camera is arranged vertically opposite to the light hole on the top of the lens mounting box.
[0014] Furthermore, the camera is fixedly mounted on the top of the lens mounting box via a fixing member.
[0015] Furthermore, a fill light source is installed at the bottom of the lens mounting box via a light source bracket.
[0016] Furthermore, the fill light source is an annular aperture.
[0017] Furthermore, the motor is a servo motor.
[0018] Furthermore, a smoke purifier is also arranged in the chassis, and an air suction head of the smoke purifier is arranged close to the material belt guide groove.
[0019] The beneficial effects of the utility model are embodied in:
[0020] The visual marking device for integrated circuit testing provided by the utility model is provided with four material belt guide grooves arranged side by side, and the laser marking head can mark the serial numbers of four integrated circuits at a time, and the marking efficiency is high. After the camera captures the images of all integrated circuits to be inspected within the viewing angle, they are sent to the visual inspection system to detect chip size, cutting gap, chip chipping and other problems. The visual inspection system records the serial numbers of unqualified chips and performs subsequent elimination processing. A lens group is provided at the bottom of the camera, so that the camera can collect more scene information, realize one-time positioning and inspection of multiple products, and effectively improve the inspection speed.
[0021] Compared with the prior art, the structure of the utility model is simpler, the assembly and debugging requirements are low, and it is convenient for the factory to quickly install and put into production. BRIEF DESCRIPTION OF THE DRAWINGS
[0022] In order to more clearly illustrate the specific embodiments of the present invention or the technical solutions in the prior art, the following is a brief introduction to the drawings required for the specific embodiments or the description of the prior art. In all the drawings, similar elements or parts are generally identified by similar reference numerals. In the drawings, the elements or parts are not necessarily drawn according to the actual scale.
[0023] The accompanying drawings herein are incorporated into and constitute a part of the specification, illustrate embodiments consistent with the present application, and together with the specification are used to explain the principles of the present application. For ordinary technicians in this field, other accompanying drawings can also be obtained based on these accompanying drawings without paying creative labor.
[0024] Figure 1 This is a schematic diagram of the overall structure of a visual marking device for integrated circuit testing provided by the utility model;
[0025] Figure 2 The internal structure of a visual marking device for integrated circuit testing provided by the utility model is schematically shown. Figure 1 ;
[0026] Figure 3 The internal structure of a visual marking device for integrated circuit testing provided by the utility model is schematically shown. Figure 2 ;
[0027] Figure 4 The internal structure of a visual marking device for integrated circuit testing provided by the utility model is schematically shown. Figure 3 ;
[0028] The realization of the purpose, functional features and advantages of this application will be further described in conjunction with the embodiments and with reference to the accompanying drawings. The above-mentioned drawings have shown clear embodiments of this application, which will be described in more detail later. These drawings and textual descriptions are not intended to limit the scope of the concept of this application in any way, but to illustrate the concept of this application to those skilled in the art by referring to specific embodiments. DETAILED DESCRIPTION
[0029] The following embodiments of the technical solution of the present invention are described in detail in conjunction with the accompanying drawings. The following embodiments are only used to more clearly illustrate the technical solution of the present invention, and are therefore only used as examples, and cannot be used to limit the protection scope of the present invention.
[0030] It should be noted that, unless otherwise specified, the technical terms or scientific terms used in this application should have the common meanings understood by those skilled in the art to which the present invention belongs.
[0031] In the description of the present application, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as limiting the present invention.
[0032] In addition, the terms "first", "second", etc. are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. In the description of the present invention, the meaning of "plurality" is more than two, unless otherwise clearly and specifically defined.
[0033] In this application, unless otherwise clearly specified and limited, the terms "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.
[0034] In the present application, unless otherwise clearly specified and limited, a first feature being “above” or “below” a second feature may mean that the first and second features are in direct contact, or the first and second features are in indirect contact through an intermediate medium. Moreover, a first feature being “above”, “above”, and “above” a second feature may mean that the first feature is directly above or obliquely above the second feature, or simply means that the first feature is higher in level than the second feature. A first feature being “below”, “below”, and “below” a second feature may mean that the first feature is directly below or obliquely below the second feature, or simply means that the first feature is lower in level than the second feature.
[0035] like Figure 1-Figure 4 As shown, the utility model provides a visual marking device for integrated circuit testing, comprising a chassis 1, a visual marking mechanism 2 arranged in the chassis 1, a material unwinding mechanism 3 arranged on one side of the chassis 1, and a material coiling mechanism 4 arranged on the other side of the chassis 1, a material tape guiding mechanism 5 is arranged between the material coiling mechanism 4 and the material unwinding mechanism 3, and the material tape guiding mechanism 5 is arranged directly below the visual marking mechanism 2. The material coiling mechanism 4 can adopt an existing material tape coiling machine, and the material unwinding mechanism 3 unwinds the rolled material tape, which passes through the material tape guiding mechanism 5 and is re-rolled into a material roll by the material coiling mechanism 4. The chip to be visually marked on the material tape is laser marked and visually identified by the visual marking mechanism 2 when passing through the material tape guiding mechanism 5.
[0036] In this embodiment, the material discharging mechanism 3 includes four groups of material trays 6 arranged side by side, each material tray 6 is wound with a chip tape, and the chips to be visually marked are evenly arranged on the chip tape.
[0037] The material belt guide mechanism 5 includes a material belt guide groove 7 and a material belt guide assembly arranged at one end of the material belt guide groove 7. There are four material belt guide grooves 7 arranged side by side. The two ends of each material belt guide groove 7 are respectively arranged in one-to-one correspondence with the corresponding material tray 6 and the winding mechanism 4. The material belt guide assembly includes a material belt pressure roller 8 and a motor 9 that drives the material belt pressure roller 8 to rotate. The material belt slides along the material belt guide groove 7. The material belt pressure roller 8 is arranged across the four material belt guide grooves 7 to press the material belt in the material belt guide groove 7 so that the entire material belt is in a tensioned state, which is convenient for the visual marking mechanism 2 to package and visually identify the serial number of the chip on the material belt. In this embodiment, the motor 9 can use a servo motor to facilitate accurate control of the speed. The motor 9 drives the material belt pressure roller 8 to rotate through a synchronous belt.
[0038] The visual marking mechanism 2 includes a lifting component, a laser marking head 10 installed on the side of the lifting component close to the feeding mechanism 3, and a camera 11 installed on the side of the laser marking head 10 away from the feeding mechanism 3. The galvanometer 16 of the laser marking head 10 and the lens of the camera 11 are both located directly above the material strip guide groove 7.
[0039] Specifically, the lifting assembly includes a vertically arranged screw slide 12 and a support platform 13 installed on the screw of the screw slide 12. The top of the screw slide 12 has a handwheel 14 for driving the screw to rotate axially. The support platform 13 is arranged near one side of the discharge mechanism 3. The laser marking head 10 is fixedly installed on the support platform 13. The bottom of the screw slide 12 is fixedly installed on the chassis 1.
[0040] The hand wheel 14 is turned to drive the lead screw to rotate, thereby adjusting the height between the support platform 13 and the material guide groove 7, and adjusting the marking accuracy of the laser marking head 10 and the viewing angle of the camera 11.
[0041] A lens mounting box 15 is provided at the bottom of the camera 11. A lens group for focusing light from bottom to top along the optical path is installed in the lens mounting box 15. The lens mounting box 15 is fixedly mounted on the galvanometer housing of the laser marking head 10. Light holes for light to pass through are provided at the bottom and top of the lens mounting box 15. The lens of the camera 11 is arranged vertically opposite to the light hole at the top of the lens mounting box 15.
[0042] After focusing through the lens group, the image taken by the camera 11 includes more integrated circuits, can collect more scene information, and realize one-time positioning and detection of multiple products, effectively improving the detection speed.
[0043] Specifically, the camera 11 is fixedly mounted on the top of the lens mounting box 15 through a fixing member 17. A fill light source 19 is mounted on the bottom of the lens mounting box 15 through a light source bracket 18. The fill light source 19 is used to fill light for the shooting scene of the camera 11, and can improve the brightness of the detection environment during the detection process. The fill light source 19 is an annular aperture, and uses LED for light illumination to make the light distribution more uniform.
[0044] Furthermore, a smoke purifier 20 is also provided in the chassis 1. The suction head 21 of the smoke purifier 20 is arranged close to the material belt guide groove 7. The suction head 21 absorbs the smoke that may be produced during laser marking, thereby preventing the smoke from interfering with the image taken by the camera 11, thereby affecting the detection accuracy of the visual inspection system.
[0045] In summary, the visual marking device for integrated circuit testing provided by the utility model is provided with four material belt guide grooves arranged side by side, and the laser marking head can mark the serial numbers of four integrated circuits at a time, and the marking efficiency is high. After the camera captures the images of all integrated circuits to be inspected within the viewing angle, they are sent to the visual inspection system to detect problems such as chip size, cutting gap, chip chipping, etc. The visual inspection system records the serial numbers of unqualified chips and performs subsequent elimination processing. A lens group is provided at the bottom of the camera, so that the camera can collect more scene information, realize one-time positioning and inspection of multiple products, and effectively improve the inspection speed.
[0046] Compared with the prior art, the structure of the utility model is simpler, the assembly and debugging requirements are low, and it is convenient for the factory to quickly install and put into production.
[0047] Finally, it should be noted that the various technical features of the technical solution of the present application can be combined arbitrarily. In order to make the description concise, not all possible combinations of the various technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of the present application.
[0048] The above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit the same. Although the present invention has been described in detail with reference to the above embodiments, those skilled in the art should understand that the technical solutions described in the above embodiments may still be modified, or some or all of the technical features may be replaced by equivalents. Such modifications or replacements do not deviate the essence of the corresponding technical solutions from the scope of the technical solutions of the embodiments of the present invention, and should all be included in the scope of the claims and specification of the present invention.
Claims
1. A visual marking device for integrated circuit testing, characterized in that: The invention comprises a chassis (1), a visual marking mechanism (2) arranged in the chassis (1), a material unwinding mechanism (3) arranged on one side of the chassis (1), and a material coiling mechanism (4) arranged on the other side of the chassis (1), a material tape guiding mechanism (5) being arranged between the material coiling mechanism (4) and the material unwinding mechanism (3), and the material tape guiding mechanism (5) being arranged directly below the visual marking mechanism (2); wherein: The material discharging mechanism (3) comprises four groups of material trays (6) arranged side by side, each of the material trays (6) being wound with a chip material belt, and the chips to be visually marked are evenly arranged on the chip material belt; The material strip guiding mechanism (5) comprises a material strip guiding groove (7) and a material strip guiding assembly arranged at one end of the material strip guiding groove (7); four material strip guiding grooves (7) are arranged side by side, and the two ends of each material strip guiding groove (7) are arranged one by one with a corresponding material tray (6) and a winding mechanism (4); the material strip guiding assembly comprises a material strip pressing roller (8) and a motor (9) for driving the material strip pressing roller (8) to rotate; the material strip pressing roller (8) is arranged across the four material strip guiding grooves (7); The visual marking mechanism (2) comprises a lifting component, a laser marking head (10) installed on a side of the lifting component close to the material discharge mechanism (3), and a camera (11) installed on a side of the laser marking head (10) away from the material discharge mechanism (3), wherein the galvanometer (16) of the laser marking head (10) and the lens of the camera (11) are both located directly above the material strip guide groove (7).
2. The visual marking device for integrated circuit testing according to claim 1, characterized in that: The lifting assembly comprises a vertically arranged screw slide (12) and a support platform (13) mounted on a screw of the screw slide (12); the top of the screw slide (12) is provided with a hand wheel (14) for driving the screw to rotate axially; the support platform (13) is arranged close to one side of the discharge mechanism (3); and the laser marking head (10) is fixedly mounted on the support platform (13); The bottom of the lead screw slide (12) is fixedly mounted on the chassis (1).
3. The visual marking device for integrated circuit testing according to claim 2, characterized in that: A lens mounting box (15) is provided at the bottom of the camera (11), a lens group for focusing light from bottom to top along the optical path is installed in the lens mounting box (15), and the lens mounting box (15) is fixedly mounted on the galvanometer housing of the laser marking head (10); The bottom and top of the lens mounting box (15) are both provided with light holes for light to pass through, and the lens of the camera (11) is arranged vertically opposite to the light hole at the top of the lens mounting box (15).
4. The visual marking device for integrated circuit testing according to claim 3, characterized in that: The camera (11) is fixedly mounted on the top of the lens mounting box (15) via a fixing member (17).
5. The visual marking device for integrated circuit testing according to claim 3, characterized in that: A fill light source (19) is installed at the bottom of the lens mounting box (15) via a light source bracket (18).
6. The visual marking device for integrated circuit testing according to claim 5, characterized in that: The supplementary light source (19) is an annular aperture.
7. The visual marking device for integrated circuit testing according to claim 1, characterized in that: The motor (9) is a servo motor.
8. The visual marking device for integrated circuit testing according to claim 1, characterized in that: A smoke purifier (20) is also arranged in the chassis (1), and an air suction head (21) of the smoke purifier (20) is arranged close to the material belt guide groove (7).
Citation Information
Patent Citations
Marking device of integrated circuit chip testing sorting machine and control method
CN110026824A