Bidirectional scattering distribution measurement system
By designing a switching mechanism and a bidirectional scattering distribution measurement system using a mirror turning path, the problem that existing systems are difficult to meet the wide-band spectral measurement needs is solved, and the measurement effect is achieved with high accuracy, convenient operation, small size and low cost.
Patent Information
- Application Number
- CN202420493379.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-03-14
- Publication Date
- 2025-02-28
- Estimated Expiration
- 2034-03-14
AI Technical Summary
The existing bidirectional scattering distribution measurement system is difficult to meet the wide band spectral measurement needs, and the device is large in size, inconvenient in operation and high cost.
A two-way scattering distribution measurement system was designed, and a switching mechanism was used to achieve rapid measurement of the spectral distribution of infrared, ultraviolet and visible light bands, and the problem of excessive device size was solved through the mirror turning path.
It achieves the effects of high measurement accuracy, easy operation, small size and low cost, and is suitable for multi-band spectral measurement.
Smart Images

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Abstract
Description
Technical Field
[0001] The utility model relates to the field of scattering distribution measurement, in particular to a bidirectional scattering distribution measurement system. Background Art
[0002] Bidirectional scattering distribution function (BSDF) is a physical quantity that describes the scattering of light in different directions after it hits the surface of a material, including bidirectional reflection distribution function (BRDF) measurement and bidirectional transmission distribution function (BTDF). Traditional methods for measuring bidirectional scattering distribution mainly include the following: the first is to set multiple fixed-angle light sources or detectors. This fixed design method can only measure the reflection distribution or transmission distribution of a few fixed angles; the second is to set the detector or light source on an arc track to achieve the spatial movement of the detector and the light source relative to the sample to be tested, or the spatial relative movement of the detector and the sample to be tested relative to the light source. Hangzhou Yuanfang Optoelectronic Information Co., Ltd. has designed a bidirectional scattering distribution measurement device, patent publication number CN207908363U, which realizes the measurement of bidirectional scattering distribution function in the whole space through a mechanical rotating arm. The device is fixedly equipped with a light source and its corresponding detector, such as a silicon photocell suitable for ultraviolet-visible light detection or an indium gallium arsenide photodiode suitable for near-infrared light detection. However, the above devices can only measure light distribution information in a specific band, which is difficult to meet the needs of wide-band spectral measurement, or need to be equipped with an integrating sphere and a spectrometer, which is inconvenient to test, occupies a large space, and has a high measurement cost. Utility Model Content
[0003] In view of the shortcomings of the prior art, the utility model provides a two-way scattering distribution measurement system and designs a switching mechanism. Only one device can be used to quickly measure the spectral distribution of infrared, ultraviolet and visible light bands. At the same time, a reflector is used to deflect the light path to solve the problem that the switching mechanism causes the device to be too large and hinders the light path measurement. The utility model has the characteristics of high measurement accuracy, convenient operation, small size and low cost.
[0004] To achieve the above-mentioned purpose, the utility model provides a two-way scattering distribution measurement system, including a test base and a data transceiver control unit; the test base includes a light source module, a detection module, a sample stage for placing a sample to be tested, a first rotating mechanism for allowing the sample stage and the light source module to rotate relative to each other, and a second rotating mechanism for allowing the sample stage and the detection module to rotate relative to each other; the light beam emitted by the light source module is incident on the sample to be tested at a certain angle, and the detection module receives the scattered light after being acted on by the sample from another angle; the detection module, the first rotating mechanism, and the second rotating mechanism are respectively communicated with the data transceiver control unit; the detection module includes two or more detection units and a first switching mechanism for switching the detection units.
[0005] The utility model uses electrical switching or mechanical switching through the first switching mechanism to cut different detection units into the optical path to meet the needs of multi-band spectral measurement. It should be noted that the relative rotation of the sample stage and the light source module, and the relative rotation of the sample stage and the detection module in the utility model are all carried out around two mutually perpendicular rotation axes. The detection unit includes but is not limited to any combination of visible light detectors, infrared light detectors, ultraviolet light detectors, and spectral radiation measurement units, wherein the visible light detector is generally a silicon-based detector, such as a PN junction type, a PIN type, and an APD type detector; the ultraviolet light detector can be a third-generation semiconductor, such as gallium nitride, silicon carbide, gallium oxide, etc.; the infrared light detector mainly includes pyroelectric type, photoconductive type, thermoluminescent type, semiconductor type, etc., usually using silicon, germanium, indium cadmium antimonide, gallium arsenide, indium antimonide, etc.; the spectral radiation measurement unit can be a spectrometer.
[0006] Compared with the prior art, the bidirectional scattering distribution measurement system provided by the utility model has the characteristics of high automation, wide measurement range, convenient operation, high measurement accuracy, wide application range, etc.
[0007] The utility model can also be further defined and improved by the following technical solutions:
[0008] As a technical solution, the detection module further includes a first reflector, and the scattered light is received by the detection unit switched by the first switching mechanism after being reflected by the first reflector. The reflector described in the utility model is a plane reflector or a reflecting prism. By using the first reflector to deflect the light path, the problem of the device being too large and hindering the light path measurement caused by the first switching mechanism can be effectively solved.
[0009] As a technical solution, the first rotating mechanism and the second rotating mechanism rotate around the same rotation center; the sample stage rotates around the axis where the normal line of the sample to be tested is located. The rotation center can be the center of the sample to be tested or the center of the area to be tested of the sample.
[0010] As a technical solution, the first rotating mechanism is connected to the light source module, the second rotating mechanism is connected to the detection module, and the first rotating mechanism and the second rotating mechanism both rotate around the same horizontal axis; the sample stage is arranged on the test base and can rotate around the vertical axis; the intersection of the horizontal axis and the vertical axis is at the center of the sample stage or the center of the area to be tested of the sample. Specifically, the test base includes a first base and a second base. A first rotating arm that can rotate around the horizontal axis, i.e., a first rotating mechanism, is arranged on the first base; a second rotating arm that rotates around the vertical axis is arranged on the second base; a sample stage that can rotate around the vertical axis, and a third rotating arm that can rotate around the horizontal axis, i.e., a second rotating mechanism, are arranged on the second rotating arm; the light source module is arranged at one end of the first rotating arm and the detection module is arranged at one end of the third rotating arm; a data transceiver control unit that is communicatively connected to the first rotating arm, the second rotating arm, the third rotating arm, the sample stage, the light source module and the detection module is arranged on the first base; the first rotating arm, the second rotating arm, the third rotating arm and the sample stage are all driven by relatively independent rotation drive mechanisms. The first rotating arm, the second rotating arm, the third rotating arm and the sample stage realize rotation of four degrees of freedom, and through their mutual rotation cooperation, the full-space bidirectional scattering distribution measurement of different objects or materials can be realized. Alternatively, in another technical solution, the detection module is arranged at one end of the first rotating arm and the light source module is arranged at one end of the third rotating arm.
[0011] Furthermore, it also includes a laser positioning unit, which can be set on the first base, and the laser emitted by the laser positioning unit passes through the first rotating arm, and the laser optical axis is coaxial with the horizontal axis. The laser positioning unit is used to position the sample stage to ensure that the light source module and the detection module always rotate around the center of the sample, thereby avoiding alignment errors during system debugging and measurement errors caused by different measurement points of samples to be tested with different thicknesses. In addition, the intersection of the incident light and the laser emitted by the laser positioning unit can be used as a positioning reference point for the center point of the sample to be tested, thereby ensuring that the center points of samples to be tested with different thicknesses are at the same position.
[0012] As another technical solution, during the test process, the light source module is relatively fixed, and the sample stage and the detection module can rotate around the light source module respectively to measure the bidirectional scattering distribution of the sample to be tested. Specifically, the first rotating mechanism is connected to the sample stage, with the center of the measured area of the sample to be tested as the rotation center, the optical axis of the light beam emitted by the light source module passes through the center of the measured area of the sample to be tested, the first rotating mechanism changes the incident angle of the light beam by changing the posture of the sample to be tested, and the sample stage is provided with a third rotating mechanism that rotates the sample to be tested around its normal; the second rotating mechanism is connected to the detection module, with the center of the measured area of the sample to be tested as the rotation center, and the second rotating mechanism changes the posture of the detection module to change the receiving angle of the detection module.
[0013] As a technical solution, the first switching mechanism includes a transmission seat and a fixed seat, the transmission seat is installed on the fixed seat, two or more detection units are respectively arranged on the transmission seat, and the detection units are switched by the transmission seat; the light beam reflected by the first reflector is received by the detection unit switched by the first switching mechanism. For example, the transmission seat is a turntable, and the detection units are respectively arranged on the circumferential surface of the turntable. The turntable rotates to switch the detection units, and the light beam reflected by the first reflector is received by the corresponding detection unit. Or the transmission seat can be switched by moving, and the transmission seat is a conveyor belt, and the detection units are switched by conveyor belt transmission.
[0014] As a technical solution, the light source module includes two or more light source units and a second switching mechanism for switching the light source units. The light source is switched by the second switching mechanism so that the light beam in the corresponding wavelength range is incident on the sample to be tested. Specifically, the second switching mechanism includes a movable or rotatable transmission seat and a fixed seat, and the transmission seat is installed on the fixed seat; the two or more light source units are respectively arranged on the transmission seat, and the light source units are switched by the transmission seat. The transmission seat can be a turntable, and the light source units are scattered or evenly distributed on the circumferential surface of the turntable. The turntable rotates to switch the light source units so that the light beams in the corresponding wavelength bands are incident on the sample to be tested.
[0015] As a technical solution, the light source module further includes a second reflector, and the light beam emitted by the corresponding light source module is reflected by the second reflector and then incident on the sample to be tested.
[0016] As a technical solution, the detection module further includes an aperture stop and a focusing lens, and the aperture stop, the focusing lens, and the first switching mechanism are successively arranged on the optical path after the first reflector. The aperture stop is introduced on the optical path between the first reflector and the focusing lens, on the one hand, to limit the measurement aperture, thereby limiting the measurement solid angle Ω, which is beneficial to the calculation and analysis of the measurement results; on the other hand, the aperture stop can eliminate unnecessary stray light. In this technical solution, the aperture stop can also be arranged on the optical path between the focusing lens and the detection unit.
[0017] As a technical solution, the outgoing light beam of the light source module is a collimated light beam or a convergent light beam. The light source module can illuminate the surface of the sample to be tested in the form of parallel light or convergent light to meet diverse lighting requirements. Preferably, the optical axis of the incident light is always aligned with the center of the sample stage or the center of the measured area of the sample to be tested, further ensuring the consistency of the measurement points.
[0018] As a technical solution, the light source unit includes but is not limited to a laser light source with a monochromatic wavelength, an LED light source, a halogen light source, an LED light source or a xenon light source emitting multi-wavelength or wide-band radiation. In practical applications, different samples to be tested have different requirements for the incident light source, and a light source of a specific wavelength band corresponds to a specific detector. The corresponding light source unit and detection unit can be set according to the specific lighting requirements, or the switch and light power of the light source module can be controlled by a data transceiver control unit, so as to meet the measurement requirements of different types of samples to be tested.
[0019] As a technical solution, it also includes a monitoring unit, which is communicatively connected with the light source module, and the monitoring unit includes a spectroscopic component and a monitoring probe, and the spectroscopic component is arranged on the outgoing light path of the light source module. The introduction of the spectroscopic component can divide the outgoing light beam of the light source module into two parts, one part of the light beam is received and measured by the monitoring probe, and the other part of the outgoing light is incident on the surface of the sample to be measured. By using the monitoring unit to monitor the light source module in real time, the measurement result can be corrected, which can effectively avoid the measurement error caused by the fluctuation of the light source module and improve the measurement accuracy. Preferably, the spectroscopic component is a semi-transparent and semi-reflective mirror or a window mirror. Preferably, the monitoring probe is a spectrometer.
[0020] In the above technical solution, a focusing lens and an aperture can also be arranged on the optical path between the spectroscopic component and the monitoring probe. The focusing lens focuses a part of the light beam separated by the spectroscopic component onto the aperture and transmits it to the monitoring probe. The purpose of setting the aperture is to eliminate unnecessary stray light and improve the measurement accuracy.
[0021] Preferably, the sample stage further comprises a fixture for fixing the sample to be measured. The setting of the fixture can prevent the sample to be measured from moving during the measurement process.
[0022] As a technical solution, the data transceiver control unit includes a human-machine interaction unit, and the human-machine interaction unit is located inside the first base. The human-machine interaction unit is set in the data transceiver control unit, and measurement parameters can be set, such as the wavelength and luminous power of the light source module, the measurement angle range, different detection modules, etc. At the same time, the human-machine interaction unit can also be used to display the measurement results in real time.
[0023] As a technical solution, a front lens, an aperture diaphragm and a collimating lens are sequentially arranged along the outgoing light path of the light source module. The aperture size of the aperture diaphragm is continuously adjustable. By adjusting the aperture size of the aperture diaphragm, incident light beams with different illumination ranges and light intensities can be provided, thereby being suitable for measurement and analysis of different samples to be tested.
[0024] The beneficial effects of the utility model are as follows: the utility model provides a two-way scattering distribution measurement system, which performs two-way scattering distribution measurement by switching and selecting the corresponding detection unit through the first switching mechanism and switching and selecting the light source of a specific wavelength through the second switching mechanism, and the measurement system is economical and feasible; the reflector is used to turn the light path to solve the problem that the switching mechanism causes the system to be too large and hinders the light path measurement; the test process is automatically completed through the data receiving and sending control unit, which is convenient to operate and efficient; the entire measurement system is reasonably designed and is suitable for two-way scattering distribution measurement of various objects or materials, and has the characteristics of convenient operation, wide application range, high measurement accuracy, etc. BRIEF DESCRIPTION OF THE DRAWINGS
[0025] Attached Figure 1 Schematic diagram of the structure of the measurement system of Example 1.
[0026] Attached Figure 2 This is a schematic diagram of the structure of the detection module of Example 1.
[0027] Attached Figure 3 It is a structural schematic diagram of the light source module of Example 1.
[0028] Attached Figure 4 Schematic diagram of the structure of the measurement system of Example 2.
[0029] Attached Figure 5 This is a schematic diagram of the structure of the detection module of Example 2.
[0030] Attached Figure 6 Schematic diagram of the structure of the light source module of Example 2.
[0031] In the figure: test base-1; light source module-2; detection module-3; sample stage-4; first rotating mechanism-5; second rotating mechanism-6; detection unit-7; first switching mechanism-8; first reflector-9; transmission base-10; fixing base-11; light source unit-12; second switching mechanism-13; aperture diaphragm-14; focusing lens-15; first base-16; second base-17; first rotating arm-18; second rotating arm-19; third rotating arm-20; laser positioning unit-21; second reflector-22; data transceiver control unit-23; sample to be tested-24. DETAILED DESCRIPTION Embodiment 1
[0032] like Figure 1 , Figure 2 and Figure 3As shown, this embodiment discloses a bidirectional scattering distribution measurement system, including a test base 1 and a data transceiver control unit 23. The test base 1 includes a first base 16 and a second base 17. A first rotating arm 18 that can rotate around a horizontal axis, i.e., a first rotating mechanism 5, is arranged on the first base 16; a second rotating arm 19 that can rotate around a vertical axis is arranged on the second base 17, a sample stage 4 that can rotate around a vertical axis, and a third rotating arm 20 that can rotate around a horizontal axis, i.e., a second rotating mechanism 6, is arranged on the second rotating arm 19; a light source module 2 is arranged at one end of the first rotating arm 18 and a detection module 3 is arranged at one end of the third rotating arm 20; a data transceiver control unit 23 that is communicatively connected with the first rotating arm 18, the second rotating arm 19, the third rotating arm 20, the sample stage 4, the light source module 2 and the detection module 3 is arranged on the first base 16, and the data transceiver control unit 23 includes a human-machine interaction unit; the first rotating arm 18, the second rotating arm 19, the third rotating arm 20, and the sample stage 4 are all driven by relatively independent rotation drive mechanisms. The sample 24 to be tested is fixed on the sample stage 4 by a clamp, and the sample 24 to be tested is plastic. The first rotating arm 18, the second rotating arm 19, the third rotating arm 20 and the sample stage 4 can realize four degrees of freedom rotation, and through their mutual rotation cooperation, the full-space two-way scattering distribution measurement of different objects or materials can be realized.
[0033] In this embodiment, the rotation range of the first rotating arm 18 and the third rotating arm 20 is -180° to +180°, and the rotation range of the second rotating arm 19 and the sample stage 4 is 0° to 360°; the angular resolution of the first rotating arm 18, the second rotating arm 19, and the third rotating arm 20 is ±0.01°.
[0034] In this embodiment, the light source module 2 includes five light source units 12 with different wavelengths, a second switching mechanism 13 for switching the light source unit 12, and a second reflector 22. The light source unit 12 is a laser light source with wavelengths of 360nm, 450nm, 520nm, 940nm and 1060nm. Figure 3 As shown, the second switching mechanism 13 switches the light path of the light source unit 12 by moving a plane reflector, and the outgoing light path of the light source unit 12 is reflected by the second reflector 22 and then irradiated on the surface of the sample 24 to be tested.
[0035] In this embodiment, the detection module 3 includes a first reflector 9, an aperture diaphragm 14, a focusing lens 15, two or more detection units 7 and a first switching mechanism 8 for switching the detection units. The aperture diaphragm 14, the focusing lens 15, the first switching mechanism 8 and the detection unit 7 are arranged in the optical path after the first reflector 9 in sequence. The first switching mechanism 8 includes a transmission seat 10 and a fixed seat 11. The transmission seat 10 is installed on the fixed seat 11. Two or more detection units 7 are respectively arranged on the transmission seat 10, and the detection unit 7 is switched by the transmission seat. The detection unit 7 is a silicon photocell, an indium gallium arsenide photodiode, a silicon carbide photodiode, or a silicon photodiode. For example, when a 520nm laser light source is used for incident, a silicon photocell is selected for measurement.
[0036] During the measurement process, the data transceiver control unit 23 controls the first rotating arm 18 to drive the light source module 2 to irradiate the sample to be measured at different angles; at the same time, the data transceiver control unit 23 controls the second rotating arm 19 and the third rotating arm 20 to drive the detection module 3 to receive the light after being acted on by the sample to be measured in the corresponding reflection direction or transmission direction and measure it; when the second rotating arm 19 rotates, the third rotating arm 20 and the sample stage 4 both rotate at an angle with the second rotating arm 19. At this time, the sample stage 4 can be controlled to rotate and return to its original position to avoid the influence of the position change of the sample to be measured on the measurement result.
[0037] The bidirectional scattering distribution measurement system described in this embodiment can fully automatically realize the bidirectional scattering distribution measurement of the sample to be measured under ultraviolet, visible and near-infrared monochromatic light irradiation.
[0038] This embodiment also includes a laser positioning unit 21, which can be set on the first base 16. The laser emitted by the laser positioning unit 21 passes through the first rotating arm 18, and the laser optical axis is coaxial with the horizontal axis. The laser positioning unit 21 is used to position the sample stage 4 to ensure that the light source module 2 and the detection module 3 always rotate around the center of the sample stage 4 or the center of the measured area of the sample to be tested, thereby avoiding alignment errors during system debugging and measurement errors caused by different measurement points of samples to be tested with different thicknesses. In addition, the intersection of the incident light and the laser emitted by the laser positioning unit 21 can be used as a positioning reference point for the center point of the measured area of the sample to be tested, thereby ensuring that the center points of samples to be tested with different thicknesses are at the same position.
[0039] In this embodiment, the data transceiver control unit 23 also includes a human-machine interaction unit, and the human-machine interaction unit is located inside the first base 16. The human-machine interaction unit is set in the data transceiver control unit 23, and measurement parameters can be set, such as the wavelength and light power of the light source unit, the measurement angle range, different detection units, etc., and the human-machine interaction unit can also be used to display the measurement results in real time. Embodiment 2
[0040] like Figure 4 , Figure 5 and Figure 6 As shown, this embodiment discloses a bidirectional scattering distribution measurement system, including a test base 1 and a data transceiver control unit 23. The test base 1 includes a light source module 2, a detection module 3, a sample stage 4 for placing a sample to be tested 24, a first rotating mechanism 5 for rotating the sample stage 4 and the light source module 2 relative to each other, and a second rotating mechanism 6 for rotating the sample stage 4 and the detection module 3 relative to each other. The light beam emitted by the light source module 2 is incident on the sample to be tested at a certain angle, and the detection module 3 receives the scattered light after being acted on by the sample to be tested 24 from another angle. The first rotating mechanism 5 is connected to the sample stage 4, with the center of the tested area of the sample to be tested as the rotation center, the optical axis of the light beam emitted by the light source module 2 passes through the center of the tested area of the sample to be tested 24, the first rotating mechanism 5 changes the incident angle of the light beam by changing the posture of the sample to be tested, and the sample stage 4 is provided with a third rotating mechanism for rotating the sample to be tested around its normal line; the second rotating mechanism 6 is connected to the detection module 3, with the center of the tested area of the sample to be tested as the rotation center, and the second rotating mechanism 6 changes the receiving angle of the detection module 3 by changing the posture of the detection module 3. The detection module 3 , the first rotating mechanism 5 , and the second rotating mechanism 6 are respectively connected to the data transceiver control unit 23 for communication.
[0041] In this embodiment, the first rotating mechanism 5 is a robot, and the rotation range of the second rotating mechanism 6 is 0° to 360°.
[0042] In this embodiment, the light source module 2 includes three light source units 12, a second switching mechanism 13 for switching the light source units 12, and a second reflector 22. The three light source units 12 are respectively arranged on the transmission seat of the second switching mechanism, and the second switching mechanism switches the light source units 12 by transmission. The collimated light beam emitted by the light source unit 12 is reflected by the second reflector 22 and then incident on the sample to be tested 24. The light source units 12 are respectively ultraviolet light sources, visible light sources, and infrared light sources.
[0043] In this embodiment, the detection module 3 includes a first reflector 9, an aperture stop 14, a focusing lens 15, three detection units 7, and a first switching mechanism 8 for switching the detection unit 7. The aperture stop 14, the focusing lens 15, and the first switching mechanism 8 are arranged in the optical path after the first reflector 9 in sequence. The first switching mechanism 8 is a turntable, and the three detection units 7 are respectively arranged on the circumferential surface of the turntable, and the detection units 7 are switched by rotating the turntable. The detection units 7 are respectively a visible light detector, an infrared light detector, and an ultraviolet light detector.
[0044] In this embodiment, the sample 24 to be tested is transparent glass.
[0045] The measurement system described in this embodiment can fully automatically realize the bidirectional scattering distribution measurement of the sample to be measured under ultraviolet, visible and near-infrared light irradiation.
[0046] The specific implementation methods of the present invention are described above in conjunction with the accompanying drawings, but those skilled in the art should understand that the above embodiments are only for illustration and are not intended to limit the scope of the present invention. Those skilled in the art should understand that the above embodiments may be modified without departing from the scope and spirit of the present invention. The scope of protection of the present invention is defined by the appended claims.
Claims
1. A bidirectional scattering distribution measurement system, characterized in that: The invention comprises a test base (1) and a data transceiver control unit (23); the test base (1) comprises a light source module (2), a detection module (3), a sample stage (4) for placing a sample to be tested (24), a first rotation mechanism (5) for enabling the sample stage (4) and the light source module (2) to rotate relative to each other, and a second rotation mechanism (6) for enabling the sample stage (4) and the detection module (3) to rotate relative to each other; a light beam emitted by the light source module (2) is incident on the sample to be tested (24) at a certain angle, and the detection module (3) receives scattered light after being acted upon by the sample to be tested (24) from another angle; the detection module (3), the first rotation mechanism (5), and the second rotation mechanism (6) are respectively connected to the data transceiver control unit (23) for communication; the detection module (3) comprises two or more detection units (7) and a first switching mechanism (8) for switching the detection units (7).
2. A bidirectional scattering distribution measurement system according to claim 1, characterized in that: The detection module (3) further comprises a first reflector (9), and the scattered light is received by the detection unit (7) switched by the first switching mechanism (8) after being reflected by the first reflector (9).
3. A bidirectional scattering distribution measurement system according to claim 1 or 2, characterized in that: The first rotating mechanism (5) and the second rotating mechanism (6) rotate around the same rotation center; and the sample stage (4) rotates around the axis where the normal line of the sample to be tested (24) is located.
4. A bidirectional scattering distribution measurement system according to claim 1 or 2, characterized in that: The first rotating mechanism (5) is connected to the sample stage (4) and has the center of the measured area of the sample to be tested (24) as the rotating center. The optical axis of the light beam emitted by the light source module (2) passes through the center of the measured area of the sample to be tested (24). The first rotating mechanism (5) changes the incident angle of the light beam by changing the posture of the sample to be tested (24). The sample stage (4) is provided with a third rotating mechanism for rotating the sample to be tested (24) around its normal. The second rotating mechanism (6) is connected to the detection module (3) and has the center of the measured area of the sample to be tested (24) as the rotating center. The second rotating mechanism (6) changes the receiving angle of the detection module (3) by changing the posture of the detection module (3).
5. A bidirectional scattering distribution measurement system according to claim 1 or 2, characterized in that: The first switching mechanism (8) comprises a transmission seat (10) and a fixed seat (11); the transmission seat (10) is mounted on the fixed seat (11); two or more detection units (7) are respectively arranged on the transmission seat (10); and the detection units (7) are switched via the transmission seat (10).
6. A bidirectional scattering distribution measurement system according to claim 5, characterized in that: The conveying seat (10) is a turntable; the detection units (7) are respectively arranged on the circumferential surface of the turntable, and the turntable rotates to switch the detection units (7).
7. A bidirectional scattering distribution measurement system according to claim 1 or 2, characterized in that: The light source module (2) comprises two or more light source units (12) and a second switching mechanism (13) for switching the light source units (12).
8. A bidirectional scattering distribution measurement system according to claim 2, characterized in that: The detection module (3) further comprises an aperture diaphragm (14) and a focusing lens (15), wherein the aperture diaphragm (14), the focusing lens (15), the first switching mechanism (8), and the detection unit (7) are sequentially arranged on the optical path after the first reflector (9).
9. A bidirectional scattering distribution measurement system according to claim 1 or 2, characterized in that: The detection unit (7) includes, but is not limited to, any combination of a visible light detector, an infrared light detector, an ultraviolet light detector, and a spectral radiation measurement unit.
10. A bidirectional scattering distribution measurement system according to claim 7, characterized in that: The light source unit (12) includes, but is not limited to, a laser light source or an LED light source that emits light of a single wavelength, a halogen light source, an LED light source or a xenon light source that emits radiation of multiple wavelengths or a wide band.
Citation Information
Patent Citations
Two -way scattering distribution measuring device
CN207908363U
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