Conductive particle detection mechanism based on condensation electro-optic

Abstract

The utility model relates to the technical field of conductive particle detection, and discloses a conductive particle detection mechanism based on condensation electro-optic, which comprises an imaging device, the imaging device comprises an objective lens, a condensation point light source is arranged above the objective lens, the condensation point light source is arranged opposite to the objective lens, and the objective lens is arranged above the condensation point light source. A to-be-detected product is arranged between the objective lens and the condensation point light source for detection. By additionally arranging the condensation point light source, the visual field brightness is improved, the brightness and darkness contrast ratio of the surface of a detected object is enhanced, one side of a picture is bright, the other side of the picture is dark, the three-dimensional sense is achieved, bubbles, dirt, scratches, foreign matter and other defects in a conductive particle pressing interval can be shot stably, and therefore the detection capacity of a machine table is improved.

Description

Technical Field

[0001] The utility model relates to the technical field of conductive particle detection, in particular to a conductive particle detection mechanism based on concentrated photoelectricity. Background Art

[0002] As electronic products develop towards being light, thin, short and small, almost all portable electronic products use LCDs as display panels. In addition to the LCD panel, LCDs also need to be connected to driver chips to display signals. ACF (anisotropic conductive adhesive) is a material that can achieve conductive connection in a short time and is the best material for connecting driver chips. After hot pressing ACF, ACF is attached to the glass panel, and then FPC is pressed on it. The bridge module composed of FPC and IC controls the display of each pixel on the CELL, thus forming a colorful picture. The bridge module composed of FPC and IC directly determines whether the bridge control can be completed well, and is also the object of particle detection. The ACF after hot pressing directly affects the bridge module. During the hot pressing process, the curing rate of ACF changes due to the influence of temperature. If the curing rate is insufficient, defects such as poor number of conductive particles, conductive particle offset, poor particle distribution, bubbles, and poor indentation strength (too much or too little pressure) are prone to occur; the materials of ACF are also different, and defects such as scratches, dirt, and foreign matter are prone to occur during the hot pressing process.

[0003] After searching, there is an application number of 202121450046.5, named as an optical mirror for detecting conductive particles in liquid crystal screens, which discloses: a main body, the main body includes a first pipe and a second pipe; a light collecting component, which is arranged in the first pipe, and the light collecting component has a light source, a first light collecting mirror, a second light collecting mirror and a first gluing group arranged from bottom to top; an imaging component, which is arranged inside the second pipe, and the imaging component has a bandpass cutoff mirror, a first tube mirror, a second gluing group, a second tube mirror, a spectroscope, a differential interference prism and an objective lens arranged from bottom to top; a linear array camera, which is arranged at the bottom of the imaging component. Compared with the prior art, the advantages of this utility model are faster detection speed and higher detection accuracy. However, the utility model still has two shortcomings: first, the picture clarity cannot be adjusted in real time. Since the surfaces of most FPCs are uneven and there are slight height differences, and the platforms on which the test items are placed are not completely flat and have certain height differences, the depth of field of the high-magnification objective lens used in this solution is relatively small. When the sum of the height difference of the FPC and the height difference of the platform exceeds the depth of field of the objective lens, the image will not be clear, affecting the detection results; second, the optical mirror has only one light source and a single lighting method, and it is impossible to capture bubbles, foreign matter, dirt, and scratches in the pressing area of ​​the conductive particles. Utility Model Content

[0004] The purpose of the utility model is to provide a conductive particle detection mechanism based on concentrated photoelectricity to solve the problems raised in the above-mentioned background technology.

[0005] To achieve the above-mentioned purpose, the utility model provides the following technical solutions: a conductive particle detection mechanism based on concentrated light, including an imaging device, the imaging device including an objective lens, a focusing point light source is provided above the objective lens, the focusing point light source and the objective lens are arranged opposite to each other, and the product to be detected is arranged between the objective lens and the focusing point light source for detection.

[0006] The following improvement is made in the solution of the present application: the imaging device also includes a first body as a light source, and a second body arranged below the objective lens to cooperate with the imaging.

[0007] The following improvement is made in the solution of the present application: the first main body is arranged on one side of the second main body, and includes a halogen lamp, a polarizer, a Wollaston prism and a condenser arranged in sequence from bottom to top.

[0008] The following improvements are made in the present application: the second main body includes a beam splitter 1, a DIC prism, an analyzer and a linear array camera arranged in sequence from top to bottom.

[0009] The following improvement is made in the present application: one end of the first body close to the condenser is connected to the position of the second body where the beam splitter 1 is located, and the beam splitter 1 is arranged parallel to the condenser.

[0010] The following improvement is made in the solution of the present application: a second beam splitter is provided in the second main body between the first beam splitter and the DIC prism, and the second beam splitter is arranged perpendicular to the first beam splitter.

[0011] The following improvement is made in the solution of the present application: a laser displacement sensor is provided on one side of the objective lens, and the light beam emitted by the laser displacement sensor is higher than the objective lens and lower than the product to be detected.

[0012] The following improvements are made in the present application: a motion module for adjusting the working distance of the objective lens is provided on one side of the objective lens, and the motion module is connected to a laser displacement sensor. By adding a laser displacement sensor and combining the motion module to adjust the picture clarity in real time, the image quality is adjusted to the optimal level, the detection accuracy is improved, the abnormal conditions of missed detection and wrong detection are reduced, and the stability of the mechanism is improved.

[0013] Compared with the prior art, the utility model provides a conductive particle detection mechanism based on concentrated light, which has the following beneficial effects:

[0014] The utility model increases the brightness of the field of view and enhances the light-dark contrast of the surface of the detected object by adding a spotlight light source. One side of the picture is bright and the other side is dark, giving it a three-dimensional sense. It can stably capture defects such as bubbles, dirt, scratches, and foreign matter in the pressing area of ​​the conductive particles, thereby improving the detection capability of the machine. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative labor:

[0016] Figure 1 It is a cross-sectional view of the utility model. DETAILED DESCRIPTION

[0017] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0018] In the present invention, unless otherwise clearly specified and limited, the terms "install", "connect", "connect", "fix" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0019] Example

[0020] like Figure 1As shown, a conductive particle detection mechanism based on concentrated photoelectricity is mainly composed of an imaging device 1 and a focusing point light source 2; wherein the imaging device 1 is divided into two main bodies, the first main body 12 is used as a light source, and includes a halogen lamp 121, a polarizer 122, a Wollaston prism 123 and a condenser 124 arranged in sequence from bottom to top. After the light source is turned on, the halogen lamp 121 lights up, and the scattered light passes through the polarizer 122 to form a beam of polarized light, and the polarized light passes through the Wollaston prism 123 to form two beams of orthogonal linear polarized light, and the two beams of orthogonal linear polarized light are then focused on the product to be detected through the condenser 124, so as to facilitate detection; the second main body 13 is arranged at one end of the first main body 12 close to the condenser 124, and includes a beam splitter 131, a beam splitter 135, a DIC prism 132, an analyzer 133 and a linear array camera 134 arranged in sequence from top to bottom, and an objective lens 11 is arranged above the beam splitter 131, and cooperates with the second main body 13 to perform The image is formed in a row, and a focusing point light source 2 is arranged just above the objective lens 11, the focusing point light source 2 and the objective lens 11 are opposite to each other, a product to be detected is placed between the objective lens 11 and the focusing point light source 2 for detection, one end of the first body 12 close to the condenser 124 is connected to the position of the beam splitter 131 on the second body 13, and the beam splitter 131 and the condenser 124 are arranged in parallel, the beam splitter 135 and the beam splitter 131 are arranged vertically, the focusing point light source 2 is located above the product to be detected, and the emitted light is more concentrated and brighter than the ordinary point light, so as to make up for the lack of light and improve the brightness of the field of view, the light of the focusing point light source 2 and the two beams of polarized light pass through the product to be detected, pass through the objective lens 11 and pass through the beam splitter 131, the beam splitter 135 and the DIC prism 132, the DIC prism 132 merges the transmitted light into one beam, and finally passes through the analyzer 133 to reach the linear array camera 134, and the detection result is displayed.

[0021] The light beam passing through the DIC prism 132 still has a polarization plane, and the two beams of light interfere with each other. The optical path difference between the two beams of light determines the amount of light transmittance. Since the product to be tested is uneven and has a certain height difference, a contrast between light and dark is formed, and the contrast of the image reaches the best state, which maximizes the test effect and can simultaneously detect defects such as conductive particle offset, particle number, indentation strength, particle distribution, and bubbles, foreign matter, dirt, scratches, etc. in the conductive particle pressing area.

[0022] The laser displacement sensor 3 and the motion module 4 are respectively installed on both sides of the objective lens 11, and the motion module 4 is electrically connected to the laser displacement sensor 3; the upper end of the motion module 4 is mounted on the objective lens 11, and the objective lens 11 can be driven to move up and down in the vertical direction to adjust the working distance. The laser displacement sensor 3 is provided with a laser transmitter, a receiver and a linear camera, and the emitted light beam is higher than the objective lens 11 and lower than the product to be detected. When in use, the power is turned on to start the motion module 4, and the laser transmitter emits a visible red laser to the surface of the product to be detected. The laser scattered by the surface of the product to be detected passes through the receiver and is received by the internal linear camera. According to different distances, the linear camera can detect this light spot at different angles. According to this angle and the distance between the laser and the camera, the distance between the laser displacement sensor 3 and the product to be detected is calculated, and the distance result between the laser displacement sensor 3 and the product to be detected is sent to the motion module 4, so that the motion module 4 can be controlled in real time to adjust the working distance between the objective lens 11 and the surface of the product to be detected, so as to improve the clarity and stability of the picture, optimize the detection results, and improve the accuracy of the detection.

Claims

1. A conductive particle detection mechanism based on concentrated photoelectricity, characterized in that: The imaging device (1) comprises an objective lens (11), a focal point light source (2) is arranged above the objective lens (11), the focal point light source (2) and the objective lens (11) are arranged opposite to each other, and a product to be inspected is arranged between the objective lens (11) and the focal point light source (2) for inspection.

2. A conductive particle detection mechanism based on concentrated photoelectricity according to claim 1, characterized in that: The imaging device (1) further comprises a first main body (12) serving as a light source, and a second main body (13) arranged below the objective lens (11) to cooperate with imaging.

3. A conductive particle detection mechanism based on concentrated photoelectricity according to claim 2, characterized in that: The first body (12) is arranged on one side of the second body (13), and comprises a halogen lamp (121), a polarizer (122), a Wollaston prism (123) and a condenser (124) which are arranged in sequence from bottom to top.

4. A conductive particle detection mechanism based on concentrated photoelectricity according to claim 2 or 3, characterized in that: The second main body (13) comprises a beam splitter (131), a DIC prism (132), an analyzer (133) and a linear array camera (134) which are arranged in sequence from top to bottom.

5. The conductive particle detection mechanism based on concentrated photoelectricity according to claim 4, characterized in that: One end of the first body (12) close to the condenser (124) is connected to the portion of the second body (13) where the beam splitter 1 (131) is located, and the beam splitter 1 (131) is arranged in parallel with the condenser (124).

6. A conductive particle detection mechanism based on concentrated photoelectricity according to claim 5, characterized in that: A second beam splitter (135) is disposed in the second main body (13) between the first beam splitter (131) and the DIC prism (132), and the second beam splitter (135) is arranged vertically to the first beam splitter (131).

7. The conductive particle detection mechanism based on concentrated photoelectricity according to claim 1, characterized in that: A laser displacement sensor (3) is provided on one side of the objective lens (11), and a light beam emitted by the laser displacement sensor (3) is higher than the objective lens (11) and lower than the product to be detected.

8. The conductive particle detection mechanism based on concentrated photoelectricity according to claim 7, characterized in that: A motion module (4) for adjusting the working distance of the objective lens (11) is provided on one side of the objective lens (11); the motion module (4) is connected to the laser displacement sensor (3).

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