Test system

Abstract

The utility model relates to a test system, which comprises a test device comprising a test mechanism and a test board, the test mechanism is provided with a sealing cavity, the test board is arranged in the sealing cavity, and the test board is electrically connected with a piece to be tested; the magnetic device is arranged in the sealing cavity and comprises a driving mechanism and a magnetic part which are connected with each other, the driving mechanism is used for driving the magnetic part to rotate, and the rotating magnetic part is used for providing a changing magnetic field environment for the to-be-tested part. The testing system, the testing plate and the magnetic device are all arranged in the sealing cavity, so that when the to-be-tested piece is subjected to low-temperature testing, external gas cannot be in contact with the testing plate, and the surface of the testing plate is prevented from frosting. And meanwhile, the magnetic piece is prevented from being arranged on the pressure head device, so that the size of the pressure head device is reduced. The driving mechanism can drive the magnetic part to rotate, and the rotating magnetic part can provide a variable magnetic field environment for the to-be-tested part so as to test the performance of the to-be-tested part in the variable magnetic field environment.

Description

Technical Field

[0001] The utility model relates to the technical field of testing, in particular to a testing system. Background Art

[0002] With the development of economy and the progress of society, electronic components (such as chips) are widely used in various fields. Before electronic components are put into use, their reliability and stability under various ambient temperatures need to be tested.

[0003] When testing electronic components, the test board is electrically connected to it, and the temperature control mechanism controls the temperature of the electronic components. At the same time, the test machine electrically connected to the test board performs performance tests on the electronic components. When testing magnetic electronic components, magnetic parts need to be set to provide a magnetic field environment for them.

[0004] In the conventional technology, the magnetic part is arranged on the pressing head device, and when the pressing head device drives the electronic components to move so as to be electrically connected with the test board, the magnetic part moves synchronously with the pressing head device, which results in a large volume of the entire pressing head device. Utility Model Content

[0005] Based on this, it is necessary to provide a test system that can improve the problems caused by the traditional method.

[0006] A test system for testing a device under test, comprising:

[0007] A testing device, comprising a testing mechanism and a testing board, wherein the testing mechanism has a sealed cavity, the testing board is arranged in the sealed cavity, and the testing board is electrically connected to the device to be tested;

[0008] The magnetic device arranged in the sealed cavity comprises a driving mechanism and a magnetic part which are connected to each other. The driving mechanism is used to drive the magnetic part to rotate. The rotating magnetic part is used to provide a changing magnetic field environment to the test piece.

[0009] In the above-mentioned test system, the test board and the magnetic device are all arranged in a sealed chamber. In this way, when the test piece is subjected to a low-temperature test, the outside gas will not contact the test board, thereby avoiding frost on the surface of the test board. At the same time, it is avoided to arrange the magnetic part on the pressure head device, thereby reducing the volume of the pressure head device. Moreover, the driving mechanism can drive the magnetic part to rotate, and the rotating magnetic part can provide a changing magnetic field environment to the test piece to test the performance of the test piece in the changing magnetic field environment.

[0010] In one embodiment, the test mechanism includes a test seat, the test seat is electrically connected to the test board through a probe; the test seat is used to carry the device to be tested, and the device to be tested is electrically connected to the test board through the test seat;

[0011] The test seat and the magnetic component are respectively arranged on two opposite sides of the test board, and the magnetic component is used to provide a magnetic field environment to the device to be tested in the test seat.

[0012] In one embodiment, the number of the magnetic members is at least two; the driving mechanism includes a driving member and a transmission assembly, the driving member is connected to all the magnetic members through the transmission assembly, and drives all the magnetic members to rotate synchronously through the transmission assembly;

[0013] Alternatively, the driving mechanism includes driving members, each of which is used to drive one of the magnetic members to rotate.

[0014] In one embodiment, the transmission assembly includes a driving wheel, a synchronous belt and a driven wheel assembly, the driving wheel is connected to the driving member, each of the magnetic members is connected to one of the driven wheel assemblies, and the synchronous belt is sleeved outside the driving wheel and all of the driven wheel assemblies.

[0015] In one embodiment, the driving mechanism further includes a tensioning wheel, and the tensioning wheel is used to tension the synchronous belt.

[0016] In one embodiment, the number of the magnetic members is at least two;

[0017] The magnetic device further comprises a magnetic isolation member, and the magnetic isolation member is used to isolate the magnetism between the magnetic members.

[0018] In one embodiment, the magnetic device further includes a baffle and a sensor, one of which can rotate with the magnetic part, and the other remains relatively fixed with the testing mechanism, and the baffle cooperates with the sensor to reset and find the zero of the magnetic part.

[0019] In one embodiment, the magnetic device also includes an adjustment mechanism, the magnetic member is connected to the adjustment mechanism, and the adjustment mechanism is used to adjust the distance between the magnetic member and the test plate in the thickness direction of the test plate, thereby changing the magnetic field strength of the magnetic field provided by the magnetic member to the test piece.

[0020] In one embodiment, the adjustment mechanism includes an adjustment plate, which is connected to the testing mechanism, and the position of at least one of the magnetic member and the testing mechanism and the adjustment plate in the thickness direction is adjustable to adjust the distance between the magnetic member and the testing plate.

[0021] In one embodiment, the magnetic device further includes a guiding mechanism, and when the adjusting mechanism adjusts the distance between the magnetic member and the test plate, the guiding mechanism is used to guide the magnetic member. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] Figure 1 An axonometric diagram of a test system provided in one embodiment of the present application;

[0023] Figure 2 for Figure 1 A cross-sectional view of a partial structure of the test system shown in;

[0024] Figure 3 for Figure 1 An axonometric view of the partial structure of the test system shown in;

[0025] Figure 4 for Figure 1 An isometric view of the magnetic device of the test system shown in;

[0026] Figure 5 for Figure 3 Axonometric view of a partial structure of the structure shown in;

[0027] Figure 6 for Figure 4 An axonometric view of a partial structure of the magnetic device shown in;

[0028] Figure 7 for Figure 6 An exploded view of the local structure shown in;

[0029] Figure 8 An isometric diagram of a magnetic device of a test system provided in another embodiment of the present application;

[0030] Fig. 9 for Figure 8 An axonometric view of a partial structure of the magnetic device shown in;

[0031] Fig.10 for Fig. 9 Layout of the structure shown in the exploded view of the structure.

[0032] Description of reference numerals:

[0033] 100. Test system; 10. Test device; 11. Test mechanism; 111. Sealed chamber; 112. Test seat; 113. Panel; 114. Mounting seat; 115. Frost cover; 12. Test board; 20. Magnetic device; 21. Driving mechanism; 211. Driving member; 212. Transmission assembly; 2121. Driving wheel; 2122. Synchronous belt; 2123. Driven wheel assembly; 2124. Rotating shaft; 2125. Driven wheel; 213. Tensioning wheel; 214. First bearing; 22. Magnetic member; 23. Magnetic isolation member; 24. Support seat; 25. Baffle; 26. Sensor; 27. Adjustment mechanism; 271. Adjustment plate; 2711. First waist-shaped hole; 272. Adapter plate; 28. Guide mechanism; 281. Linear bearing; 29. ​​Fixed seat; 210. Heat insulation board; 30. Press head device. DETAILED DESCRIPTION

[0034] In order to make the above-mentioned purposes, features and advantages of the utility model more obvious and easy to understand, the specific implementation methods of the utility model are described in detail below in conjunction with the accompanying drawings. In the following description, many specific details are set forth to facilitate a full understanding of the utility model. However, the utility model can be implemented in many other ways different from those described herein, and those skilled in the art can make similar improvements without violating the connotation of the utility model, so the utility model is not limited by the specific embodiments disclosed below.

[0035] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present invention.

[0036] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of the features. In the description of the present utility model, the meaning of "plurality" is at least two, such as two, three, etc., unless otherwise clearly and specifically defined.

[0037] In the present invention, unless otherwise clearly specified and limited, the terms "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements, unless otherwise clearly defined. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0038] In the present utility model, unless otherwise clearly specified and limited, a first feature being "above" or "below" a second feature may mean that the first and second features are in direct contact, or the first and second features are in indirect contact through an intermediate medium. Moreover, a first feature being "above", "above" or "above" a second feature may mean that the first feature is directly above or obliquely above the second feature, or simply means that the first feature is higher in level than the second feature. A first feature being "below", "below" or "below" a second feature may mean that the first feature is directly below or obliquely below the second feature, or simply means that the first feature is lower in level than the second feature.

[0039] It should be noted that when an element is referred to as being "fixed to" or "disposed on" another element, it may be directly on the other element or there may be a central element. When an element is considered to be "connected to" another element, it may be directly connected to the other element or there may be a central element at the same time. The terms "vertical", "horizontal", "upper", "lower", "left", "right" and similar expressions used herein are for illustrative purposes only and are not intended to be the only implementation method.

[0040] See also Figure 1-Figure 3 In one embodiment of the present application, a test system 100 is provided for testing the performance of a device under test. Specifically, the device under test is a magnetic chip (magnetic IC). Of course, in other embodiments, the type of the device under test tested by the test system 100 is not limited.

[0041] The test system 100 includes a test device 10 and a magnetic device 20. The test device 10 includes a test mechanism 11 and a test board 12. The test mechanism 11 has a sealed cavity 111. The test board 12 and the magnetic device 20 are both arranged in the sealed cavity 111. The test board 12 is electrically connected to the device to be tested. Specifically, the test board 12 is a PCB board. Figure 4 , wherein the magnetic device 20 includes a driving mechanism 21 and a magnetic member 22 connected to each other, the driving mechanism 21 is used to drive the magnetic member 22 to rotate, and the rotating magnetic member 22 is used to provide a changing magnetic field environment to the test object. Specifically, the magnetic member 22 rotates around an axis, and the axis is perpendicular to the plane where the test board 12 is located.

[0042] In the test system 100 provided in the embodiment of the present application, the test board 12 and the magnetic device 20 are both arranged in the sealed chamber 111. In this way, when the test piece is subjected to a low-temperature test, the outside gas will not contact the test board 12, thereby avoiding frost on the surface of the test board 12. At the same time, it is avoided that the magnetic member 22 is arranged on the pressure head device 30, thereby reducing the volume of the pressure head device 30. Moreover, the driving mechanism 21 can drive the magnetic member 22 to rotate, and the rotating magnetic member 22 can provide a changing magnetic field environment to the test piece to test the performance of the test piece in the changing magnetic field environment.

[0043] In some embodiments, continue to refer to Figure 1 and Figure 2 The test mechanism 11 includes a panel 113, a mounting seat 114, a test seat 112 and an anti-frost cover 115. The panel 113 is provided with a mounting groove in the thickness direction, the mounting seat 114 is mounted in the mounting groove, the test seat 112 is mounted in the mounting seat 114, and the anti-frost cover 115 is mounted on one side of the panel 113 in the thickness direction (such as Figure 1 As shown, the frost shield 115 is installed on Figure 1 The panel 113, the mounting seat 114, the test seat 112 and the anti-frost cover 115 define a sealed chamber 111. The test board 12 is arranged in the sealed chamber 11. The test seat 112 is electrically connected to the test board 12 through a probe. One test seat 112 is used to carry one DUT. That is, the DUT is placed in the test seat 112 and electrically connected to the test board 12 through a probe.

[0044] For further information, see Figure 5 The test system 100 further includes a pressure head device 30 located on the other side of the panel 113 in the thickness direction. The pressure head device 30 can drive the test piece to move relative to the test device 10 to press the test piece into the test seat 112. Specifically, a flow channel is provided on the pressure head device 30, and the flow channel is connected to the refrigeration system. The refrigeration system can provide refrigerant to the flow channel so that the pressure head device 30 maintains a low temperature environment, thereby performing low temperature control on the test piece, so as to facilitate low temperature testing of the test piece.

[0045] In some embodiments, the number of magnetic components 22 is equal to the number of test sockets 112 and corresponds one to one. The corresponding test sockets 112 and magnetic components 22 are respectively arranged on opposite sides of the test plate 12 in the thickness direction, and each magnetic component 22 is used to provide a magnetic field environment to the test piece in the corresponding test socket 112. In some specific embodiments, the test mechanism 11 includes at least two test sockets 112, and the magnetic device 20 includes at least two magnetic components 22. In other specific embodiments, the test mechanism 11 can also include a test socket 112, and the magnetic device 20 includes a magnetic component 22. In this way, relative to the method in which multiple test pieces share one magnetic component 22 or multiple magnetic components 22 jointly provide a magnetic field environment to one test piece, each test piece is provided with a corresponding magnetic component 22 to ensure that the magnetic component 22 provides a suitable magnetic field environment to the test piece.

[0046] In other embodiments, the number of magnetic members 22 may be different from the number of test sockets 112. In this case, one magnetic member 22 may correspond to multiple test sockets 112, or one test socket 112 may correspond to multiple magnetic members 22, or multiple magnetic members 22 may correspond to multiple test sockets 112.

[0047] In some other embodiments, the number of magnetic members 22 may be equal to the number of test sockets 112, but the magnetic members 22 and the test sockets 112 are not arranged one-to-one. For example, one magnetic member 22 may correspond to multiple test sockets 112, and one test socket 112 may correspond to multiple magnetic members 22.

[0048] In some embodiments, the magnetic member 22 is a magnet. Of course, in some other embodiments, the magnetic member 22 can also be made of other materials that can generate magnetism, which is not limited here.

[0049] For further information, see Figure 6 In order to avoid the influence between the magnetic parts 22, the magnetic device 20 also includes a magnetic isolation member 23, which is made of magnetic isolation material and is used to isolate the magnetism between the magnetic parts 22 to prevent the magnetic fields generated by adjacent magnetic parts 22 from interfering with each other and affecting the test results. The magnetic device 20 also includes a support seat 24, and the driving mechanism 21, the magnetic parts 22 and the magnetic isolation member 23 are all installed on the support seat 24.

[0050] In some specific embodiments, the support seat 24 is a flat plate structure, the magnetic isolation member 23 is arranged in parallel with the support seat 24, and a plurality of holes are provided on the magnetic isolation member 23 in a direction perpendicular to the plane where the support seat 24 is located, and the number of holes is equal to the number of magnetic members 22. The magnetic isolation member 23 is respectively sleeved outside the plurality of magnetic members 22 through the plurality of holes to prevent magnetic transmission between the magnetic members 22. In other specific embodiments, the magnetic isolation member 23 includes a plurality of magnetic isolation plates, which are arranged between the magnetic members 22 to isolate the magnetism between the magnetic members 22.

[0051] In one embodiment, continue to refer to Figure 6 , the driving mechanism 21 includes a driving member 211 and a transmission assembly 212 mounted on the support seat 24. The number of driving members 211 is one, and one driving member 211 is connected to multiple magnetic members 22 through the transmission assembly 212, and drives all magnetic members 22 to rotate synchronously through the transmission assembly 212. At this time, all magnetic members 22 can rotate synchronously under the action of the same driving member 211, so as to provide a magnetic field environment to the test piece at the same time. For example, in a specific embodiment, the magnetic device 20 includes 8 magnetic members 22, and the 8 magnetic members 22 are arranged in two rows, each row having 4 magnetic members 22. At this time, one driving member 211 can drive the 8 magnetic members 22 to rotate synchronously. It can be imagined that in other specific embodiments, the number of magnetic members 22 is not limited, such as the magnetic device 20 can also include 2, 3, 4, 5, 6, 7 and more than 8 magnetic members 22.

[0052] It should be noted that when the magnetic device 20 includes only one magnetic member 22 , one driving member 211 drives one magnetic member 22 to rotate.

[0053] Furthermore, the conventional assembly includes a driving wheel 2121, a synchronous belt 2122 and a driven wheel assembly 2123. The driving wheel 2121 is connected to the driving member 211, the driven wheel assembly 2123 is installed on the support seat 24, each magnetic member 22 is connected to a driven wheel assembly 2123, and the synchronous belt 2122 is sleeved outside the driving wheel 2121 and all the driven wheel assemblies 2123. In this way, when the driving member 211 drives the driving wheel 2121 to rotate, all the driven wheel assemblies 2123 rotate synchronously under the action of the synchronous belt 2122, and then drive all the magnetic members 22 to rotate synchronously. The driving member 211 can be a motor or a rotary cylinder, etc.

[0054] See also Figure 7The driven wheel assembly 2123 includes a rotating shaft 2124 and a driven wheel 2125. The rotating shaft 2124 is connected to the support seat 24 through the first bearing 214, and the driven wheel 2125 is sleeved outside the rotating shaft 2124. The rotating shaft 2124 rotates relative to the support seat 24 through the first bearing 214, thereby driving the driven wheel 2125 to rotate. The magnetic device 20 also includes a fixed seat 29, which is fixedly connected to the rotating shaft 2124 through a top screw, and the magnetic member 22 is nested on the fixed seat 29.

[0055] In some other embodiments, the transmission assembly 212 can also be configured in other ways, such as configuring the transmission assembly 212 to include a driving gear and a driven gear, wherein the driving gear is connected to the driving member 211, each driven gear is connected to a magnetic member 22, and all driven gears are meshed with the driving gear. The driving member 211 drives the driving gear to rotate, the driven gear rotates with the rotation of the driving gear, and the magnetic member 22 rotates synchronously with the driven gear.

[0056] Further reading Figure 6 The driving mechanism 21 also includes a tensioning wheel 213, which is used to tension the synchronous belt 2122 so that the synchronous belt 2122 drives the driven wheel assembly 2123 to rotate under a suitable tensioning force.

[0057] In some other embodiments, see Figure 8 and Fig. 9 There are at least two magnetic members 22, and the driving mechanism 21 includes at least two driving members 211, each driving member 211 is used to drive a magnetic member 22 to rotate. In this way, each driving member 211 can independently drive the magnetic member 22 corresponding thereto, so that the magnetic member 22 can be independently controlled.

[0058] In some embodiments, see Fig.10 In order to prevent the driver 211 from overheating and failing, the driver 211 is arranged on the side of the support seat 24 facing away from the test board 12, and a heat insulation board 210 is arranged between the driver 211 and the support seat 24. The driving end of the driver 211 is penetrated through the support seat 24, the fixing seat 29 is arranged on the side of the support seat 24 facing the test board 12 and connected to the driving end of the driver 211, and the magnetic member 22 is installed on the fixing seat 29.

[0059] In some embodiments, continue to refer to Fig. 9 and Fig.10 The magnetic device 20 further includes a baffle 25 and a sensor 26, one of which can rotate with the magnetic member 22, and the other is mounted on the support seat 24. The baffle 25 cooperates with the sensor 26 to reset and find the zero of the magnetic member 22. Since the magnetic member 22 is connected to the driving member 211, the baffle 25 cooperates with the sensor 26 to reset and find the zero of the driving member 211.

[0060] In some embodiments, the magnetic device 20 also includes an adjustment mechanism 27, which is connected to the support base 24. The adjustment mechanism 27 is used to adjust the distance between the magnetic member 22 and the test plate 12 in the thickness direction of the test plate 12, thereby changing the magnetic field strength of the magnetic field provided by the magnetic member 22 to the test piece to be tested to meet the requirements of different test pieces for magnetic field strength.

[0061] It should be noted that the thickness direction of the panel 113 is parallel to the thickness direction of the test board 12, and is also parallel to the connection direction of the corresponding magnetic member 22 and the test seat 112. Figure 5 As shown, the thickness direction of the panel 113 is Figure 5 Middle Z direction.

[0062] Further reading Figure 3 The adjustment mechanism 27 further includes an adjustment plate 271, which is connected to the support seat 24 and the panel 111 of the test mechanism 11. The positions of at least one of the support seat 24 and the panel 111 and the adjustment plate 271 in the thickness direction are adjustable to adjust the spacing between the magnetic member 22 and the test plate 12. Optionally, the adjustment mechanism 27 further includes an adapter plate 272, through which the adjustment plate 271 is connected to the panel 111.

[0063] In some specific implementations, please refer to Figure 4 and Figure 8 A first waist-shaped hole 2711 extending along the thickness direction of the test plate 12 is provided at one end of the adjustment plate 271 close to the support seat 24, and the support seat 24 is provided with a first fixing hole. By changing the positions of the first fixing hole and the first waist-shaped hole 2711, the position of the adjustment plate 271 relative to the support seat 24 can be adjusted, thereby adjusting the position of the magnetic component 22 relative to the test plate 12, thereby changing the magnetic field strength of the magnetic field provided by the magnetic component 22 to the test piece.

[0064] In some other specific embodiments, a second waist-shaped hole extending along the thickness direction of the test plate 12 is provided at one end of the adjustment plate 271 close to the adapter plate 272, and a second fixing hole is provided on the adapter plate 272. The position of the adjustment plate 271 relative to the adapter plate 272 can be adjusted by changing the positions of the second fixing hole and the second waist-shaped hole, thereby adjusting the position of the magnetic component 22 relative to the test plate 12, thereby changing the magnetic field strength of the magnetic field provided by the magnetic component 22 to the test piece.

[0065] In some further embodiments, the first waist-shaped hole 2711 may be provided on the support base 24 , and the first fixing hole is provided on the adjustment plate 271 . Alternatively, the second waist-shaped hole is provided on the adapter plate 272 , and the second fixing hole is provided on the adjustment plate 271 .

[0066] In some other embodiments, an adjustment mechanism 27 may also be provided to include a driving component, which drives the support seat 24 to move along the thickness direction of the test plate 12, thereby driving the magnetic component 22 to move along the thickness direction of the test plate 12, thereby changing the magnetic field strength of the magnetic field provided by the magnetic component 22 to the test piece.

[0067] In some embodiments, continue to refer to Figure 3 The magnetic device 20 further includes a guide mechanism 28, and when the adjustment mechanism 27 adjusts the distance between the magnetic member 22 and the test plate 12, the guide mechanism 28 is used to guide the magnetic member 22. Optionally, the guide mechanism 28 includes a linear bearing 281, and when the position of the support seat 24 relative to the adapter plate 272 along the thickness direction of the test plate 12 is adjusted, the linear bearing 281 can guide the magnetic member 22 by guiding the support seat 24, so as to prevent the support seat 24 from deviating, thereby preventing the magnetic member 22 from deviating. For details, continue to refer to Figure 4 The guide mechanism 28 includes four linear bearings 281, which are respectively arranged at four corners of the support base 24 to ensure that various parts of the support base 24 move synchronously, thereby ensuring the consistency of the spacing between each magnetic member 22 and its corresponding test base 112.

[0068] It is conceivable that in other embodiments, the guide mechanism 28 may also be arranged in other ways, as long as the guiding effect can be achieved, and no limitation is made here.

[0069] The technical features of the above-described embodiments may be arbitrarily combined. To make the description concise, not all possible combinations of the technical features in the above-described embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0070] The above-mentioned embodiments only express several implementation methods of the utility model, and the description is relatively specific and detailed, but it cannot be understood as limiting the scope of the utility model patent. It should be pointed out that for ordinary technicians in this field, several modifications and improvements can be made without departing from the concept of the utility model, which all belong to the protection scope of the utility model. Therefore, the protection scope of the utility model patent shall be based on the attached claims.

Claims

1. A test system for testing a device under test, characterized in that: include: A testing device (10) comprises a testing mechanism (11) and a testing board (12), wherein the testing mechanism (11) has a sealed cavity (111), the testing board (12) is arranged in the sealed cavity (111), and the testing board (12) is electrically connected to the device to be tested; The magnetic device (20) disposed in the sealed cavity (111) comprises a driving mechanism (21) and a magnetic member (22) connected to each other, wherein the driving mechanism (21) is used to drive the magnetic member (22) to rotate, and the rotating magnetic member (22) is used to provide a changing magnetic field environment to the test object.

2. The test system according to claim 1, characterized in that: The testing mechanism (11) comprises a testing seat (112), wherein the testing seat (112) is electrically connected to the testing board (12) via a probe; the testing seat (112) is used to carry the device to be tested, wherein the device to be tested is electrically connected to the testing board (12) via the testing seat (112); The test seat (112) and the magnetic component (22) are respectively arranged on two opposite sides of the test board (12); the magnetic component (22) is used to provide a magnetic field environment for the test object in the test seat (112).

3. The test system according to claim 1, characterized in that: The number of the magnetic members (22) is at least two; the driving mechanism (21) comprises a driving member (211) and a transmission assembly (212); the driving member (211) is connected to all the magnetic members (22) via the transmission assembly (212), and drives all the magnetic members (22) to rotate synchronously via the transmission assembly (212); Alternatively, the driving mechanism (21) comprises driving members (211), and each of the driving members (211) is used to drive one of the magnetic members (22) to rotate.

4. The test system according to claim 3, characterized in that: The transmission assembly (212) comprises a driving wheel (2121), a synchronous belt (2122) and a driven wheel assembly (2123); the driving wheel (2121) is connected to the driving member (211); each magnetic member (22) is connected to one driven wheel assembly (2123); and the synchronous belt (2122) is sleeved outside the driving wheel (2121) and all the driven wheel assemblies (2123).

5. The test system according to claim 4, characterized in that: The driving mechanism (21) further comprises a tensioning wheel (213), wherein the tensioning wheel (213) is used for tensioning the synchronous belt (2122).

6. The test system according to claim 1, characterized in that: The number of the magnetic members (22) is at least two; The magnetic device (20) further comprises a magnetic isolation member (23), wherein the magnetic isolation member (23) is used to isolate the magnetism between the magnetic members (22).

7. The test system according to claim 1, characterized in that: The magnetic device (20) further comprises a baffle (25) and a sensor (26); one of the baffle (25) and the sensor (26) is capable of rotating with the magnetic member (22), and the other is relatively fixed to the testing mechanism (11); the baffle (25) cooperates with the sensor (26) to reset and find the zero of the magnetic member (22).

8. The test system according to any one of claims 1 to 7, characterized in that: The magnetic device (20) further comprises an adjustment mechanism (27), the magnetic member (22) being connected to the adjustment mechanism (27), and the adjustment mechanism (27) being used to adjust the distance between the magnetic member (22) and the test plate (12) in the thickness direction of the test plate (12), thereby changing the magnetic field strength of the magnetic field provided by the magnetic member (22) to the test piece.

9. The test system according to claim 8, characterized in that: The adjustment mechanism (27) comprises an adjustment plate (271), the adjustment plate (271) being connected to the test mechanism (11), and the position of at least one of the magnetic member (22) and the test mechanism (11) and the adjustment plate (271) in the thickness direction is adjustable so as to adjust the distance between the magnetic member (22) and the test plate (12).

10. The test system according to claim 8, characterized in that: The magnetic device (20) further comprises a guiding mechanism (28), and when the adjusting mechanism (27) adjusts the distance between the magnetic member (22) and the test plate (12), the guiding mechanism (28) is used to guide the magnetic member (22).

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