An integrated microscopic observation device for small-angle X-ray scattering experiments

Abstract

The utility model provides an integrated microscopic observation device for small-angle X-ray scattering experiments, and relates to the technical field of material analysis. It is composed of a microscope and a microscope adjustment component, an illumination component, a sample coarse bar component, a sample fine adjustment component, a light shield and a base. The microscope and the microscope adjustment component, the illumination component, the sample coarse adjustment component and the light shield are threadedly mounted on the base, wherein the microscope and the microscope adjustment component, the illumination component and the sample coarse adjustment component are coaxial. The sample fine adjustment component is threadedly mounted on the platform of the sample coarse adjustment component. The microscopic movement of the sample and the change of the sample surface morphology can be observed through the microscope, which facilitates the fine adjustment of the sample and improves the accuracy of the experimental results.

Description

Technical Field

[0001] The utility model relates to the technical field of material analysis, and more specifically to an integrated microscopic observation device for small-angle X-ray scattering experiments. Background Art

[0002] Small-angle X-ray scattering refers to the scattering phenomenon that occurs when X-rays are irradiated onto a sample within a small angle range of 2°~5° around the incident X-ray beam. According to the theory of small-angle X-ray scattering, as long as there are microstructures or scatterers with uneven electron density in the system, coherent scattering will occur within a small angle range near the incident X-ray beam. By calculating and analyzing the small-angle X-ray scattering diagram or scattering curve, the shape, size, distribution and content of the microstructure can be derived. In small-angle X-ray scattering, the wavelength of the incident X-ray is usually comparable to the scale of the microstructure in the sample. When the X-ray passes through the sample, the X-ray interacts with the electron cloud in the sample. These interactions cause the X-rays to be deflected and scattered, forming a scattering pattern. By analyzing this scattering pattern, information about the internal microstructure of the sample, such as particle size, shape, distribution, etc., can be obtained. In small-angle X-ray scattering, the observed scattering pattern is usually related to the repeatability of the microstructure in the sample, so the characteristics of the microstructure in the sample can also be inferred from the scattering pattern. Small-angle X-ray scattering technology has the advantages of high resolution, non-destructiveness, fast measurement speed, convenient sample preparation, and rich information. Small-angle X-ray scattering technology is used to characterize the long-periodic and quasi-periodic structures, interface layers, and irregularly distributed nanosystems of materials; it can also be used for the determination of nanoscale micropores formed in metal and non-metal nanopowders, colloidal solutions, biomacromolecules, and various materials, inhomogeneous areas in alloys, and the size distribution of precipitated phases.

[0003] The resolution size of the human eye is about 0.1 mm. When conducting small-angle X-ray scattering experiments on micron-sized samples, the experimenter cannot observe the samples intuitively, and there are also certain difficulties in making fine adjustments to the sample position. Utility Model Content

[0004] In view of this problem encountered in the experiment, the utility model proposes an integrated microscopic observation device for small-angle X-ray scattering experiments. A microscope is used to align the sample material so that the human eye can intuitively observe changes in the sample surface morphology, which helps to fine-tune the sample position, improves the convenience of the experiment, and improves the accuracy of the experimental results.

[0005] The technical solution of this utility model is as follows:

[0006] An integrated microscopic observation device for small-angle X-ray scattering experiments includes a microscope and a microscope adjustment component, an illumination component, a sample coarse adjustment component, a sample fine adjustment component, a light shield and a base. The microscope and the microscope adjustment component, the illumination component, the sample coarse adjustment component and the light shield are threadedly mounted on the base, wherein the microscope and the microscope adjustment component, the illumination component and the sample coarse adjustment component are coaxial. The sample fine adjustment component is threadedly mounted on the platform of the sample coarse adjustment component.

[0007] In one embodiment of the present application, the base is a thick metal plate with more than one through hole and more than one straight slot, and two handles are threadedly connected to the upper side of the base.

[0008] In one embodiment of the present application, the microscope and microscope adjustment component include a microscope and a three-dimensional adjustment component. The lens barrel of the microscope is clamped and fixed by a connecting component, and the connecting component is threadedly connected to the three-dimensional adjustment component.

[0009] In one embodiment of the present application, the lighting component includes a column and an annular lamp. The lower end of the column is threadedly fixed to the base, and the upper end of the column passes through the annular lamp base and is threadedly fastened through the side through hole of the lamp base. The annular lamp emits flexible light, the center of the annular lamp and the center of the microscope light entrance are on the same axis, and the base of the annular lamp and the annular lighting tube are connected by a bendable and deformable lamp connecting wire.

[0010] In one embodiment of the present application, the sample coarse adjustment component includes three translation stages. The translation stages are connected to a computer via a motor control interface, and the computer controls the motor to adjust the position.

[0011] In one embodiment of the present application, the sample fine adjustment component includes a three-dimensional translation stage, a sample base and a sample placement column. The sample base is a metal plate with more than one through hole, and the sample base is threadedly connected to the three-dimensional translation stage; the sample placement column is a nearly cylindrical metal plate, the diameter of the sample placement column is the same as the diameter of the through hole of the sample base, the lower end of the sample placement column is inserted into the through hole of the sample base and fixed, the cross-section of the upper end of the sample placement column is a trapezoid, and the upper plane of the sample placement column is a circular surface with a very small diameter, which is used to place the sample.

[0012] In one embodiment of the present application, the light baffle is a metal plate with an L-shaped side, and the bottom plate of the light baffle is punched with more than one through hole and connected to the base; the front surface of the light baffle is punched with more than one through hole with a very small diameter, and the experimental light can just pass through the through hole.

[0013] The benefits of the utility model are:

[0014] The utility model is an integrated component. The microscope and the sample holder are provided with a three-dimensional translation stage to ensure that the corresponding components remain coaxial in space, thereby ensuring the accuracy of the experiment; the light shield limits the direction of incident light to ensure the collimation of the incident light; the lighting component emits flexible light to increase the brightness of the sample surface, thereby facilitating microscopic observation; the microscope is aligned with the sample, through which the subtle movement of the sample and the change of the sample surface morphology can be observed, thereby facilitating the fine adjustment of the sample and improving the accuracy of the experimental results. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Figure 1 Axonometric view of the integrated microscopic observation equipment for small-angle X-ray scattering experiments.

[0016] Figure 2 Front view of the integrated microscopic observation equipment for small-angle X-ray scattering experiments.

[0017] Figure 3 Schematic diagram of a microscope and its adjustment components.

[0018] Figure 4 A schematic diagram of the lighting components.

[0019] Figure 5 Schematic diagram of sample fine-tuning components.

[0020] Figure 6 Schematic diagram of the sample coarse adjustment components.

[0021] Figure 7 Schematic diagram of light baffle.

[0022] In the figure: 1-microscope and microscope adjustment parts, 2-illumination parts, 3-sample coarse adjustment parts, 4-sample fine adjustment parts, 5-light baffle, 6-base, 101-microscope, 102-connecting parts, 103-three-dimensional adjustment components, 201-annular lighting tube, 202-lamp connecting wire, 203-lamp base, 204-fastening screws, 205-column, 301-sample placement column, 302-sample base, 303-fine adjustment three-dimensional translation stage, 401-motor, 402-motor control interface, 403-coarse adjustment translation stage plane, 501-light hole, 502-light baffle bottom plate. DETAILED DESCRIPTION

[0023] In order to more clearly illustrate the present application example, the following is a detailed description of an actual embodiment of an integrated microscopic observation device for small-angle X-ray scattering experiments in conjunction with the drawings in the embodiments of the present utility model. The described example is only a part of the application embodiment of the present utility model, not all of the embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by ordinary engineering and technical personnel in this field without creative work are within the protection scope of the present utility model.

[0024] like Figure 1 The microscope and the microscope adjustment component 1, the column 205 of the lighting component 2, the sample coarse adjustment component 4 and the light shielding plate bottom plate 502 of the light shielding plate 5 are fixed on the base 6 by threads, the sample fine adjustment component 3 is fixed on the coarse adjustment translation stage platform 403 by threads, the sample base 302 is threadedly connected with the fine adjustment three-dimensional translation stage 303, and the sample placement column 301 is inserted into the through hole on the sample base 302 for fixing. The column 205 passes through the lamp base 203, and the lighting lamp is fixed by the through hole on the side of the lamp base 203 with the fastening screw 204. The microscope 101 is connected to the three-dimensional adjustment component 103 through the connecting component 102. After all the components are fixed, first use a computer to control the motor 401 through the motor control interface 402 to adjust the coarse adjustment three-dimensional translation stage 403, so that the light hole 501 on the light shield 5 is basically aligned with the center of the upper surface of the sample placement column, and then adjust the three-dimensional adjustment component 103, the lamp base 203, the lamp connecting line 202 and the fine adjustment three-dimensional translation stage 303, so that the central axis of the microscope 101 barrel and the central axis of the annular lighting tube 201 coincide with each other and pass through the center of the upper surface of the sample placement column 301.

[0025] During the experiment, the experimental light beam enters from the light hole 501, the sample is placed on the upper surface of the sample placement column 301, the lighting component 2 is started, and the lighting component 2 emits flexible light to illuminate the sample surface. The sample surface morphology and the alignment of the experimental light beam are observed through the microscope 101, and the three-dimensional translation stage 303 is fine-tuned to ensure the alignment of the microscopic observation light path. During the experimental image acquisition process, the surface morphology of the sample can be intuitively observed through the microscope. Comparing the acquired image with the image observed by the microscope can help the experimenter understand the meaning of the experimental image more deeply.

[0026] Finally, it should be noted that the above is only a preferred example of the present invention and is not intended to limit the present invention. Based on the above description of the embodiments, a person skilled in the art can easily modify the technical solutions recorded in the above embodiments, or replace some of the technical features therein by equivalents. Any modification, equivalent replacement, improvement, etc. made within the spirit and scope of the present invention should be included in the content of the present invention.

Claims

1. An integrated microscopic observation device for small-angle X-ray scattering experiments, characterized in that The invention comprises a microscope and a microscope adjustment component, an illumination component, a sample coarse adjustment component, a sample fine adjustment component, a light shield and a base; the microscope and the microscope adjustment component, the illumination component, the sample coarse adjustment component and the light shield are threadedly mounted on the base, wherein the microscope and the microscope adjustment component, the illumination component and the sample coarse adjustment component are coaxial; the sample fine adjustment component is threadedly mounted on the platform of the sample coarse adjustment component.

2. An integrated microscopic observation device for small-angle X-ray scattering experiments as claimed in claim 1, characterized in that: The base is a thick metal plate with more than one through hole and more than one straight slot, and two handles are threadedly connected on the upper side of the base.

3. The integrated microscopic observation device for small-angle X-ray scattering experiments according to claim 1, characterized in that: The microscope and microscope adjustment component include a microscope and a three-dimensional adjustment component; the lens barrel of the microscope is clamped and fixed by a connecting component, and the connecting component is threadedly connected to the three-dimensional adjustment component.

4. The integrated microscopic observation device for small-angle X-ray scattering experiments according to claim 1, characterized in that: The lighting component includes a column and a ring-shaped lamp; the lower end of the column is threadedly fixed to the base, and the upper end of the column passes through the ring-shaped lamp base and is threadedly fastened through the side through hole of the lamp base; the ring-shaped lamp emits flexible light, the center of the ring-shaped lamp and the center of the microscope light entrance are on the same axis, and the base of the ring-shaped lamp and the ring-shaped lighting tube are connected by a bendable and deformable lamp connecting wire.

5. The integrated microscopic observation device for small-angle X-ray scattering experiments according to claim 1, characterized in that: The sample coarse adjustment component includes three translation stages; the translation stages are connected to a computer via a motor control interface, and the computer controls the motor to adjust the position.

6. The integrated microscopic observation device for small-angle X-ray scattering experiments according to claim 1, characterized in that: The sample fine adjustment component includes a three-dimensional translation stage, a sample base and a sample placement column; the sample base is a metal plate with more than one through hole, and the sample base is threadedly connected to the three-dimensional translation stage; the sample placement column is a nearly cylindrical metal plate, the diameter of the sample placement column is the same as the diameter of the through hole of the sample base, the lower end of the sample placement column is inserted into the through hole of the sample base and fixed, the cross-section of the upper end of the sample placement column is a trapezoid, and the upper plane of the sample placement column is a circular surface with a very small diameter, which is used to place the sample.

7. The integrated microscopic observation device for small-angle X-ray scattering experiments according to claim 1, characterized in that: The light shielding plate is a metal plate with an L-shaped side surface. The bottom plate of the light shielding plate is punched with more than one through hole and connected to the base. The front surface of the light shielding plate is punched with more than one light through hole with a very small diameter.

Images