A long-term chip stability testing platform

Abstract

The utility model belongs to the field of testing, and in particular to a long-term testing platform for chip stability. In view of the problem that the existing chip testing time is too long, the chip needs to be manually replaced and the tested chips need to be transferred to good product areas and defective product areas after the test, which greatly reduces the testing efficiency, the following scheme is proposed, which includes a transmission mechanism, a conveying mechanism for conveying chips is provided on the right side of one side of the transmission mechanism, a detection mechanism for detecting chips is provided in the middle of one side of the transmission mechanism, a screening mechanism for screening chips is provided on the left side of one side of the transmission mechanism, and a clamping mechanism for clamping chips is provided in the transmission mechanism. In the utility model, the chip to be tested can be automatically clamped, good product and defective chips can be automatically screened, and the screened chips can be collected, thereby improving the testing efficiency.

Description

Technical Field

[0001] The utility model relates to the technical field of testing, and in particular to a chip stability long-term testing platform. Background Art

[0002] Before the chip is shipped, it needs to undergo temperature cycle testing, humidity testing, vibration and shock testing, and power supply fluctuation testing to evaluate whether the chip performance stability is qualified.

[0003] The current chip testing platform technology is relatively mature, but the chip testing time is too long. After the test, the chip needs to be replaced manually and the tested chips need to be transferred to the good product area and the defective product area, which greatly reduces the testing efficiency. Therefore, a long-term chip stability testing platform is proposed. Utility Model Content

[0004] The purpose of the utility model is to solve the shortcomings of the prior art that chip testing time is too long, chips need to be manually replaced and the tested chips need to be transferred to good product areas and defective product areas after the test, which greatly reduces the test efficiency, and to propose a long-term chip stability testing platform.

[0005] In order to achieve the above purpose, the utility model adopts the following technical solutions:

[0006] A chip stability long-term test platform, comprising a transmission mechanism, a conveying mechanism for conveying chips is provided on the right side of one side of the transmission mechanism, a detection mechanism for detecting chips is provided in the middle of one side of the transmission mechanism, a screening mechanism for screening chips is provided on the left side of one side of the transmission mechanism, the screening mechanism comprises a supporting mechanism for supporting, a flipping mechanism for flipping screening is provided above the supporting mechanism, and a chip placement table for placing chips is provided above the flipping mechanism;

[0007] The transmission mechanism comprises a frame, one side of the frame is provided with a sliding groove, inner walls of two sides of the sliding groove close to each other are rotatably connected with a same threaded rod, and a clamping mechanism for clamping a chip is provided in the sliding groove.

[0008] In a possible design, the clamping mechanism includes a test box, the bottom of the test box is fixedly connected to a limiting plate, one side of the outer wall of the test box is fixedly connected to a mounting plate, a side of the mounting plate connected to the test box is provided with a receiving groove, the side of the test box connected to the mounting plate is fixedly connected to a mounting block, the bottom of the mounting block is fixedly connected to a telescopic rod, the mounting block and the telescopic rod are both accommodated in the receiving groove, the other end of the telescopic rod is fixedly connected to an extension rod, the top of the extension rod is fixedly connected to a storage plate, and one side of the outer wall of the mounting plate is fixedly connected to a slider, the slider is slidably connected in the sliding groove, and the threaded rod thread passes through the slider.

[0009] In a possible design, the conveying mechanism includes multiple supporting legs, and the same conveyor belt is provided on the side where the multiple supporting legs are close to each other. The same limiting plate 2 is fixedly connected to the side where the multiple supporting legs are close to each other, and the limiting plate 2 is located above the conveyor belt.

[0010] In a possible design, a groove 1 and a groove 2 for passing the extension rod are respectively formed on one side of the top of the second limiting plate.

[0011] In a possible design, the support mechanism includes a base, the left and right sides of the outer wall of one side of the base are fixedly connected with support rods, the bottoms of the two support rods and one side of the base are fixedly connected with the same support block, the top ends of the support rods are fixedly connected with a slide seat, the top of the slide seat is provided with an arc-shaped rotation groove, the top of the slide seat is provided with a slide groove 1, and one side of the slide seat is provided with a through slide groove 2;

[0012] The flip mechanism includes two sliding rods, the sliding rods are slidably connected in the slide grooves 2 of the two slide seats on the same side, the two sliding rods are fixedly connected to the same rack on one side close to each other, the two ends of the top of the sliding rods are fixedly connected to locking buckles, the locking buckles are slidably connected in the slide groove 1, the top of the base is fixedly connected to a driving box, and the driving box and one of the sliding rods are fixedly connected to the same telescopic rod 2 on one side close to each other;

[0013] The chip placement table includes two rotating shafts, which are rotatably connected in two rotating grooves on the same side. The circumferential outer walls of the two rotating shafts are fixedly connected with connecting plates, one end of the rotating shaft is fixedly connected with a half-tooth gear, and the tops of the two connecting plates are fixedly connected with the same placement plate, and the top of the placement plate is provided with a through hole for passing the placement plate.

[0014] In a possible design, a good product collection box for collecting good chips is provided on one side of the screening mechanism, and a defective product collection box for collecting defective chips is provided on the other side of the screening mechanism.

[0015] In the present application, when people need to test the chip, the chip to be tested is placed on the conveyor belt, and then the conveyor belt transports the chip to be tested to one side of the limiting plate 2, and then the clamping mechanism moves above the chip to be tested, and the extension rod is driven by contracting the telescopic rod 1 to drive the placement plate to move upward, and then the placement plate lifts the chip to be tested into the limiting plate 1 and contacts the test box, and then the threaded rod is rotated to drive the clamping mechanism to move horizontally, and then the clamping mechanism brings the chip to be tested into the detection mechanism to start testing. When the test is completed, the threaded rod continues to rotate to drive the clamping mechanism to move horizontally, and then the clamping mechanism moves the tested chip horizontally to the top of the screening mechanism, and then the telescopic rod 1 is extended, and the tested chip is placed on the placement plate through the placement plate, and at the same time, the detection mechanism is used to test and determine whether the chip is qualified, and the test structure is sent to the drive box. , and then the driving box extends and retracts the telescopic rod two according to the test result, and then the telescopic rod two drives the sliding rod to slide in the slide groove two and then drives the locking buckle to slide in the slide groove one. When the detection mechanism tests and determines that the chip is a good product, the driving box extends the telescopic rod two, and the two locking buckles connected to one side of the good product collection box slide to the top of the rotating shaft to lock the rotating shaft on the same side, and the gear teeth on the same side of the rack mesh with the half-tooth gear on the same side and rotate the half-tooth gear. The half-tooth gear drives the connected rotating shaft to rotate in the rotating groove and then drives the connected connecting plate to rotate. Then the connecting plate rotates to drive the connected placement plate to flip over and let the good chip placed above slide into the good product collection box. When the detection mechanism tests and determines that the chip is a defective product, it only needs to let the driving box retract the telescopic rod two to make the defective chip placed above the placement plate slide into the defective collection box to complete the chip screening.

[0016] In the utility model, the chip stability long-term test platform can realize the effect of automatically clamping the chip to be tested by using the telescopic rod and the storage tray through the setting of the clamping mechanism;

[0017] In the utility model, the chip stability long-term testing platform can achieve the effect of screening good and defective chips through the setting of the screening mechanism;

[0018] In the utility model, the chip stability long-term testing platform can achieve the effect of collecting the screened chips by setting a good product collection box and a defective product collection box;

[0019] The utility model can realize the effects of automatically clamping the chips to be tested, automatically screening good and defective chips, and collecting the screened chips, thereby improving the test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] Figure 1 This is a schematic diagram of the overall three-dimensional structure of a chip stability long-term testing platform proposed by the utility model;

[0021] Figure 2This is an exploded diagram of a clamping mechanism in a chip stability long-term testing platform proposed by the utility model;

[0022] Figure 3 This is a three-dimensional structural schematic diagram of a transmission mechanism in a chip stability long-term testing platform proposed by the utility model;

[0023] Figure 4 This is an exploded diagram of a screening mechanism in a chip stability long-term testing platform proposed by the utility model.

[0024] In the figure: 1. Transmission mechanism; 2. Clamping mechanism; 3. Conveying mechanism; 4. Detection mechanism; 5. Support mechanism; 6. Turning mechanism; 7. Chip placement table; 8. Good product collection box; 9. Defective product collection box; 11. Frame; 12. Sliding groove; 13. Threaded rod; 21. Test box; 22. Limiting plate 1; 23. Mounting plate; 24. Accommodating groove; 25. Mounting block; 26. Telescopic rod 1; 27. Extension rod; 28. Storage tray; 29. Slider; 31. Support leg; 32. Conveyor belt; 33. Limit plate 2; 34. Groove 1; 35. Groove 2; 51. Base; 52. Support rod; 53. Support block; 54. Sliding seat; 55. Rotating groove; 56. Slide groove 1; 57. Slide groove 2; 61. Sliding rod; 62. Rack; 63. Drive box; 64. Telescopic rod 2; 65. Locking buckle; 71. Rotating shaft; 72. Connecting plate; 73. Half-tooth gear; 74. Storage plate. DETAILED DESCRIPTION

[0025] The technical solutions in the embodiments of the present invention will be described clearly and completely below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all of the embodiments.

[0026] Example 1

[0027] Reference Figure 1-Figure 4 A test platform includes a transmission mechanism 1, a conveying mechanism 3 is provided on the right side of one side of the transmission mechanism 1, which is used to transport the chip to be tested from the starting point to the test position, a detection mechanism 4 is provided in the middle of one side of the transmission mechanism 1, which is used to perform a long-term stability test on the chip, and a screening mechanism is provided on the left side of one side of the transmission mechanism 1, which is used to screen the tested chips, and the screening mechanism includes a supporting mechanism 5 and a turning mechanism 6, and a chip placement table 7 is provided above the supporting mechanism 5 for placing the chip to be screened;

[0028] The transmission mechanism 1 includes a frame 11, a sliding groove 12 is provided on one side of the frame 11, and a clamping mechanism 2 is provided in the sliding groove 12 for clamping the chip and moving it under the drive of the transmission mechanism 1;

[0029] The clamping mechanism 2 includes a test box 21, a limit plate 22 is provided at the bottom of the test box 21 to ensure the stability of the test box 21 during movement, a mounting plate 23 is fixedly connected to the outer wall of one side of the test box 21, a receiving groove 24 is provided on the mounting plate 23, a mounting block 25 is fixedly connected to the outer wall of one side of the test box 21, a telescopic rod 26 is provided at the bottom of the mounting block 25, the mounting block 25 and the telescopic rod 26 are both accommodated in the receiving groove 24, an extension rod 27 is provided at the other end of the telescopic rod 26, a storage tray 28 is provided on the top of the extension rod 27 for placing chips to be tested or tested, a slider 29 is provided on one side of the mounting plate 23, the slider 29 is slidably connected in the sliding groove 12, the threaded rod 13 threads through the slider 29, and the slider 29 and the test box 21 can be driven to move along the sliding groove 12 by rotating the threaded rod 13;

[0030] The conveying mechanism 3 includes a plurality of supporting legs 31, on which a conveyor belt 32 is provided for conveying the chip from the starting point to the test position. A second limiting plate 33 is provided on one side of the supporting leg 31, which is located above the conveyor belt 32 to prevent the chip from shifting during the conveying process. A first groove 34 and a second groove 35 are provided on the top of the second limiting plate 33 for passing the extension rod 27.

[0031] The screening mechanism includes a supporting mechanism 5 and a flipping mechanism 6. The supporting mechanism 5 includes a base 51, a supporting rod 52, a supporting block 53, a slide seat 54 and other components for providing stable support. The flipping mechanism 6 includes a sliding rod 61, a rack 62, a driving box 63, a telescopic rod 64 and other components. The telescopic movement of the telescopic rod 64 drives the sliding rod 61 and the rack 62 to move, thereby driving the chip placement table 7 to flip. The chip placement table 7 includes a rotating shaft 71, a connecting plate 72, a half-tooth gear 73, a placement plate 74 and other components. The flipping of the placement plate 74 is achieved by the engagement of the half-tooth gear 73 with the rack 62. A through hole is provided on the top of the placement plate 74, which is used to pass the placement tray 28 so that the clamping mechanism 2 can place the chip on the placement plate 74.

[0032] The present application can be used in the field of chip testing, and can also be used in other fields applicable to the present application.

[0033] Example 2

[0034] refer to Figure 1-Figure 4 , improved on the basis of embodiment 1: a chip stability long-term testing platform, which is applied to the field of chip testing, is provided with a good product collection box 8 on one side of the screening mechanism for collecting chips that have passed the test, and a defective product collection box 9 on the other side for collecting chips that have failed the test.

[0035] The above description is only a preferred specific implementation manner of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can make equivalent replacements or changes within the technical scope disclosed by the present invention according to the technical scheme and the utility model concept of the present invention, which should be covered by the protection scope of the present invention.

Claims

1. A chip stability long-term testing platform, comprising a transmission mechanism (1), characterized in that: A conveying mechanism (3) for conveying chips is provided on the right side of one side of the transmission mechanism (1), a detection mechanism (4) for detecting chips is provided in the middle of one side of the transmission mechanism (1), a screening mechanism for screening chips is provided on the left side of one side of the transmission mechanism (1), the screening mechanism includes a supporting mechanism (5) for supporting, a flipping mechanism (6) for flipping screening is provided above the supporting mechanism (5), and a chip placement table (7) for placing chips is provided above the flipping mechanism (6); The transmission mechanism (1) comprises a frame (11), one side of the frame (11) is provided with a sliding groove (12), the inner walls of the sliding groove (12) on both sides close to each other are rotatably connected to the same threaded rod (13), and a clamping mechanism (2) for clamping a chip is provided in the sliding groove (12).

2. A chip stability long-term testing platform according to claim 1, characterized in that: The clamping mechanism (2) comprises a test box (21), the bottom of the test box (21) is fixedly connected to a limiting plate (22), one side outer wall of the test box (21) is fixedly connected to a mounting plate (23), a side of the mounting plate (23) connected to the test box (21) is provided with a receiving groove (24), a side of the test box (21) connected to the mounting plate (23) is fixedly connected to a mounting block (25), the bottom of the mounting block (25) is fixedly connected to a telescopic rod (26), the mounting block (25) and the telescopic rod (26) are both received in the receiving groove (24), the other end of the telescopic rod (26) is fixedly connected to an extension rod (27), the top of the extension rod (27) is fixedly connected to a storage tray (28), and one side outer wall of the mounting plate (23) is fixedly connected to a slider (29), the slider (29) is slidably connected in the sliding groove (12), and the threaded rod (13) threadably penetrates the slider (29).

3. A chip stability long-term testing platform according to claim 1, characterized in that: The conveying mechanism (3) comprises a plurality of supporting legs (31), a common conveyor belt (32) is provided on the side where the plurality of supporting legs (31) are close to each other, a common limiting plate 2 (33) is fixedly connected to the side where the plurality of supporting legs (31) are close to each other, and the limiting plate 2 (33) is located above the conveyor belt (32).

4. A chip stability long-term testing platform according to claim 3, characterized in that: A groove 1 (34) and a groove 2 (35) for passing the extension rod (27) are respectively formed on one side of the top of the second limiting plate (33).

5. A chip stability long-term testing platform according to claim 1, characterized in that: The support mechanism (5) comprises a base (51), the left and right sides of the outer wall of one side of the base (51) are fixedly connected with support rods (52), the bottoms of the two support rods (52) and one side of the base (51) are fixedly connected with a same support block (53), the top ends of the support rods (52) are fixedly connected with a slide seat (54), the top of the slide seat (54) is provided with an arc-shaped rotation groove (55), the top of the slide seat (54) is provided with a slide groove 1 (56), and one side of the slide seat (54) is provided with a through slide groove 2 (57); The flip mechanism (6) comprises two sliding rods (61), the sliding rods (61) are slidably connected in the second slide groove (57) of the two sliding seats (54) on the same side, the two sliding rods (61) are fixedly connected to the same rack (62) on the side close to each other, the two ends of the top of the sliding rod (61) are fixedly connected to locking buckles (65), the locking buckles (65) are slidably connected in the first slide groove (56), the top of the base (51) is fixedly connected to a driving box (63), and the driving box (63) and one of the sliding rods (61) are fixedly connected to the same telescopic rod (64) on the side close to each other; The chip placement table (7) comprises two rotating shafts (71), the rotating shafts (71) are rotatably connected in two rotating grooves (55) on the same side, the circumferential outer walls of the two rotating shafts (71) are fixedly connected with connecting plates (72), one end of the rotating shaft (71) is fixedly connected with a half-tooth gear (73), the tops of the two connecting plates (72) are fixedly connected with the same storage plate (74), and the top of the storage plate (74) is provided with a through hole for passing the storage tray (28).

6. A chip stability long-term testing platform according to claim 5, characterized in that: A good product collection box (8) for collecting good chips is provided on one side of the screening mechanism, and a defective product collection box (9) for collecting defective chips is provided on the other side of the screening mechanism.

Images