Dimming system of X-ray high energy resolution spectrometer for analyzing crystal simulation light source

Abstract

The utility model discloses a dimming system of an X-ray high-energy resolution spectrometer analysis crystal simulation light source, which is characterized by comprising a 4pi-emission point light source, an analysis crystal and a white board, the 4pi-emission point light source is arranged at the position of a sample and is used for simulating a fluorescence signal excited by X-rays irradiated on the sample; the analysis crystal is used for reflecting the incident fluorescence signal; and the white board is used for receiving the point light source signal reflected by the analysis crystal and determining the position of the surface detector according to the optimal receiving position. The light modulation system provided by the utility model is low in cost and easy to operate, can be used for rapid light modulation of von Hamos type and Johann type X-ray emission spectrometers, and also can realize rapid light modulation of von Hamos total cylindrical emission spectrometers.

Description

Technical Field

[0001] The utility model belongs to the field of optical technology and relates to a dimming system of a simulated light source for an X-ray high energy resolution spectrometer analyzing a crystal. The simulated light source is used to quickly collimate the X-ray high energy resolution spectrometer analyzing the crystal. Background Art

[0002] The wavelength dispersion experimental method mainly uses the specific index plane of Si / Ge single crystal, such as Si(220) and Si(111), to split the X-ray fluorescence energy emitted by the sample, and uses the surface detector to receive the fluorescence signal reflected by the crystal analyzer. This method is called high-resolution X-ray fluorescence spectrum or X-ray emission spectrum (XES). At present, the mainstream spectrometers in the international synchrotron radiation experimental station are divided into two types of emission spectrometers: Johann and von Hamos. Valence-to-Core XES (valence to core X-ray emission spectrum) and Core-to-Core XES (core to core X-ray emission spectrum) experiments of elements such as 3d, 4f and 5d can be carried out. In-situ XES experimental measurements can be realized with high pressure, photo / electrochemical in-situ devices, high temperature, catalysis, etc., mainly to obtain the electronic orbital splitting, spin state, valence state and surrounding ligand information of the target element. It is an important method for characterizing the electronic structure and atomic structure of materials. X-ray emission spectrometers contain two important components, analysis crystals and detectors. It is worth noting that XES experiments measuring different elements, or even the same element in different energy ranges (K α or K β ) emission spectrum experiment, it is necessary to calibrate and analyze the relative positions of the crystal and the detector one by one.

[0003] At present, whether it is a Johann type emission spectrometer or a von Hamos type emission spectrometer, the main method of adjusting the light is to collect the signal through the detector and adjust the K α or K β etc., for user experiments.

[0004] It often takes a long time to call up the XES signal through the surface detector. It takes about 3 hours to change the X-ray emission spectrum element experiment. Users of the experimental machine at the synchrotron radiation experimental station often need to measure a variety of experimental samples and perform XES measurements on different elements. The dimming procedure is cumbersome and time-consuming. In order to save time on the synchrotron experiment machine, beamline scientists often adjust the XES spectrum signal of a certain energy range of a certain element, such as adjusting the K of Fe. β13 signal, concentrate all K applying Fe element β13The purpose of improving the efficiency of machine time is to unify the experiments of users with different needs. However, it is not friendly to users in different places or even foreign countries, and it takes a long time to complete the XES experiments of multiple elements. Utility Model Content

[0005] In view of the problems existing in the prior art, the purpose of the utility model is to provide a dimming system for analyzing crystal simulation light sources with an X-ray high energy resolution spectrometer. The application can be quickly used for dimming von Hamos and Johann emission spectra, and can quickly adjust the emission spectrum signal of the von Hamos full cylindrical emission spectrometer. The utility model patent is also applicable to dimming of crystals analyzed by fast collimated X-ray high energy resolution spectrometers such as high energy absorption spectra, resonant reflection spectra, resonant inelastic spectra and X-ray Raman spectra.

[0006] The utility model utilizes a 4π emission point light source to simulate the fluorescence signal excited by X-rays irradiating a sample; the combined application of the 4π emission light source and a white board can quickly complete the collimation and dimming process of both von Hamos and Johann emission spectrometers in a wide range.

[0007] The technical solution of this application is:

[0008] A dimming system for an X-ray high energy resolution spectrometer analyzing a crystal simulating light source, characterized in that it comprises a 4π emitting point light source 1, an analyzing crystal 3 and a white board 6;

[0009] The 4π-emitting point light source 1 is arranged at the location of the sample to simulate the fluorescence signal excited by X-rays irradiating the sample;

[0010] The analysis crystal 3 is used to reflect the incident fluorescence signal;

[0011] The white board 6 is used to receive the point light source signal reflected by the analysis crystal 3 and determine the position of the surface detector 2 according to the best receiving position.

[0012] Furthermore, the X-ray high energy resolution spectrometer is a von Hamos full cylindrical emission spectrometer; the white plate 6 is located in a plane outside the focus of the analysis crystal 3, and the plane is parallel to the focal plane of the analysis crystal 3; the analysis crystal 3 is used to reflect the incident fluorescence signal, and the white plate 6 is used to receive the point light source signal reflected by the analysis crystal 3.

[0013] Furthermore, the 4π emitting point light source 1 is located in the z-axis direction of the rectangular coordinate system, the analysis crystal 3 is adjustable along the x-axis and y-axis directions of the rectangular coordinate system, and can be rotated along the x-axis and y-axis of the rectangular coordinate system; the whiteboard 6 is adjustable along the x-axis, y-axis, and z-axis directions of the rectangular coordinate system, and can be rotated along the x-axis and y-axis of the rectangular coordinate system.

[0014] Furthermore, the position of the circle formed by the point light source signal on the whiteboard 6 is taken as the best receiving position.

[0015] Furthermore, the X-ray high energy resolution spectrometer is a John type emission spectrometer; the 4π emitting point light source 1 is located at one focus of the analytical crystal 3, the white plate 6 is located at another focus of the analytical crystal 3, the 4π emitting point light source 1, the analytical crystal 3 and the white plate 6 are located on the Rowland circle; the analytical crystal 3 is used to reflect the incident fluorescence signal, and the white plate 6 is used to receive the point light source signal reflected by the analytical crystal 3.

[0016] Furthermore, the position of the white board 6 is adjusted on the Rowland circle, and the position of the circular spot formed by the fluorescent signal on the white board 6 is used as the optimal receiving position.

[0017] The advantages of the utility model are as follows:

[0018] The dimming system provided by the utility model is low-cost and easy to operate, and can be used for fast dimming of von Hamos and Johann X-ray emission spectrometers, and can also realize fast dimming of von Hamos full-cylindrical emission spectrometers. The dimming time is completed within 10-30 minutes, which greatly shortens the dimming time and facilitates the same user to complete XES experiments of different elements and different energy ranges within a specific machine time. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 It is a von Hamos type full-cylindrical XES experimental device.

[0020] Figure 2 Diagram of the dimming system for von Hamos-type full cylindrical X-ray emission spectrum dimming, which simulates the fluorescence signal excited by X-rays irradiating the sample from a 4π emitting point light source.

[0021] Figure 3 Diagram of the dimming system for Johann-type X-ray emission spectrum dimming, which simulates the fluorescence signal excited by X-rays irradiated on the sample by a 4π emitting point light source.

[0022] Figure numbers: 1-4π emitting point light source, 2-face detector, 3-analysis crystal, 4-beryllium window at the front end of face detector, 5-face detector chip, 6-white board, 7-Rowland circle, 8-sample. DETAILED DESCRIPTION

[0023] The present invention will be described in further detail below in conjunction with the accompanying drawings. The examples given are only used to explain the present invention and are not used to limit the scope of the present invention.

[0024] In a von Hamos type full cylindrical XES experimental setup such as Figure 1 As shown, we first establish a rectangular coordinate system and place the experimental sample, analysis crystal and surface detector in the z direction. The distance between the experimental sample and the center of the analysis crystal is L 1 , the focal distance from the analysis crystal to the other side is L 2 .L 1 With L 2 The distance is equal and is determined by the energy range of the element to be measured and the crystal face index of the analysis crystal. The analysis crystal with an inner diameter of 360mm can be moved in x, y, and z respectively, and can be rotated in the Yaw (shaking head) and Pitch (nodding) directions, that is, rotated along the y-axis and z-axis, so that the analysis of multi-element XES signals can be realized to the greatest extent. The detector used in this device is a PILATUS100K (Dectris, Switzerland) surface detector, which is used to collect XES signals near the over-focus (i.e., far away from the focus) position. In order to better receive the fluorescence signal reflected by the analysis crystal, the detector also needs to realize the adjustment of five degrees of freedom, such as x, y, z, Yaw and Pitch. However, the adjustment of the five degrees of freedom of the two devices brings great difficulties to the emission spectrum modulation. For example, if the analysis crystal moves slightly in the x direction, shaking head or nodding direction, such as 5mm in the x direction and 1° deviation in the rotation direction, it is difficult for the detector to receive a complete XES signal, or even no signal. There are two difficulties in the actual dimming process: First, some elements with low energy, such as Cr, V, etc., L 1 With L 2 The distance is short, and scattered light enters the detector, affecting the XES signal. The analysis crystal and the detector need to be moved in the x or y direction to eliminate the influence of scattered light. The expansion of the spatial range increases the difficulty of dimming. Second, there is a 50mm thick beryllium window at the front end of the detector chip, and the diameter of the surface detector chip is only 50mm. The position of the detector is difficult to determine, which also increases the difficulty of dimming.

[0025] Figure 2As shown in the figure, a point light source with 4π emission is placed at the position of the experimental sample to simulate the fluorescence signal excited by X-rays irradiating the sample, and a thin white board is placed in front of the detector to receive the light signal reflected by the analysis crystal. By adjusting the analysis crystal in the four degrees of freedom directions of Yaw, Pitch, x and y, a relatively complete circular signal can be achieved on the white board. Finally, the detector chip position is moved to the white board position, which can quickly complete the dimming of the von Hamos full cylindrical emission spectrometer.

[0026] A similar principle can be used to simulate the fluorescence signal excited by X-rays irradiating the sample using a 4π point light source, which can also be quickly used in the Johann type X-ray emission spectrum modulation process, such as Figure 3 shown.

[0027] Although the specific embodiments of the present invention are disclosed for the purpose of illustration, the purpose is to help understand the content of the present invention and implement it accordingly. Those skilled in the art can understand that various substitutions, changes and modifications are possible without departing from the spirit and scope of the present invention and the attached claims. Therefore, the present invention should not be limited to the content disclosed in the best embodiment, and the scope of protection claimed by the present invention shall be based on the scope defined in the claims.

Claims

1. A dimming system for analyzing crystal simulation light source by X-ray high energy resolution spectrometer, characterized in that: It includes a 4π emitting point light source (1), an analysis crystal (3) and a white board (6); The 4π-emitting point light source (1) is arranged at the location of the sample to simulate the fluorescence signal excited by X-rays irradiating the sample; The analysis crystal (3) is used to reflect the incident fluorescent signal; The white board (6) is used to receive the point light source signal reflected by the analysis crystal (3) and determine the position of the surface detector (2) according to the best receiving position.

2. The dimming system for analyzing crystal simulation light source of X-ray high energy resolution spectrometer according to claim 1, characterized in that: The X-ray high energy resolution spectrometer is a von Hammers full cylindrical emission spectrometer; the white plate (6) is located in a plane outside the focus of the analysis crystal (3), and the plane is parallel to the focal plane of the analysis crystal (3); the analysis crystal (3) is used to reflect the incident fluorescent signal, and the white plate (6) is used to receive the point light source signal reflected by the analysis crystal (3).

3. The dimming system for analyzing crystal simulation light source of X-ray high energy resolution spectrometer according to claim 2, characterized in that: The 4π emitting point light source (1) is located in the z-axis direction of the rectangular coordinate system, the analysis crystal (3) is adjustable along the x-axis and y-axis directions of the rectangular coordinate system, and can be rotated along the x-axis and y-axis of the rectangular coordinate system; the whiteboard (6) is adjustable along the x-axis, y-axis, and z-axis directions of the rectangular coordinate system, and can be rotated along the x-axis and y-axis of the rectangular coordinate system.

4. The dimming system for analyzing crystal simulation light source by X-ray high energy resolution spectrometer according to claim 1, 2 or 3, characterized in that: The position of the circular ring formed by the point light source signal appearing on the whiteboard (6) is taken as the best receiving position.

5. The dimming system for analyzing crystal simulation light source of X-ray high energy resolution spectrometer according to claim 1, characterized in that: The X-ray high energy resolution spectrometer is a John type emission spectrometer; the 4π emission point light source (1) is located at one focus of the analysis crystal (3), the white plate (6) is located at another focus of the analysis crystal (3), and the 4π emission point light source (1), the analysis crystal (3) and the white plate (6) are located on a Rowland circle; the analysis crystal (3) is used to reflect the incident fluorescence signal, and the white plate (6) is used to receive the point light source signal reflected by the analysis crystal (3).

6. The dimming system for analyzing crystal simulation light source of X-ray high energy resolution spectrometer according to claim 5, characterized in that: The position of the white plate (6) is adjusted on the Rowland circle, and the position of the circular spot formed by the fluorescent signal on the white plate (6) is taken as the optimal receiving position.

Images