Infrared imager auxiliary device and infrared imager component
By designing an infrared imager auxiliary device, the defect data of composite material structural parts are directly read using high emissivity scale lines, and the spatial resolution is calculated through the detection lines, the problems of inaccurate defect positions and low detection efficiency in the prior art are solved, and high-precision and high-efficiency detection are achieved.
Patent Information
- Application Number
- CN202421147412.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-05-24
- Publication Date
- 2025-04-11
- Estimated Expiration
- 2034-05-24
AI Technical Summary
When existing infrared imagers detect composite structural parts, defect position data is not accurate enough, detection efficiency is low, and spatial resolution calculation is inaccurate.
An infrared imager auxiliary device is designed, including first and second scales. By the first and second scale lines arranged in the detection area, the emissivity is higher than the scale body, the defect position and dimension data on the test board are directly read, and the spatial resolution of the infrared imager is calculated through the detection line.
It improves detection accuracy and detection efficiency, directly read defect data without determining relative objects, simplifies spatial resolution calculation and improves calculation accuracy.
Smart Images
Figure CN222748510U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of infrared imaging detection, in particular to an infrared imager auxiliary device and an infrared imager component. Background Art
[0002] Composite materials are widely used in aviation, aerospace, and automotive fields due to their excellent properties such as high strength, high stiffness, and high temperature resistance. However, the complex structure of composite structural parts can lead to defects such as delamination and debonding during manufacturing and use, seriously affecting their mechanical properties and significantly reducing the reliability and safety of the structure. Therefore, quality inspection of composite structural parts is crucial.
[0003] Currently, infrared imagers are often used to inspect the quality of composite structural parts. During actual inspection, it is necessary to determine the position and size of defects on the test piece. The defect position is determined by the relative position relationship between the imaging of the feature points on the test piece and the defect imaging. When determining the defect position, multiple comparisons and measurements are required, which causes obvious transmission errors and makes the defect position data inaccurate. The defect size is determined by determining the scale of the infrared thermal image of an object of known size and then quantifying the size of the defect. However, each time the working distance of the inspection is changed, the scale of the image will also change. The scale needs to be re-determined before accurate size measurement can be performed, which seriously affects the inspection efficiency.
[0004] Therefore, it is urgent to propose an infrared imager auxiliary device and an infrared imager component to solve the above technical problems. Utility Model Content
[0005] The first object of the present utility model is to provide an infrared imaging auxiliary device, which can directly read the position data and size data of defects on the test board, thereby improving the detection accuracy and detection efficiency.
[0006] To achieve this purpose, the present invention adopts the following technical solutions:
[0007] Infrared imager auxiliary equipment, including:
[0008] a first scale, the first scale comprising a first scale body and first scale lines disposed on the first scale body, wherein the emissivity of the first scale lines is greater than the emissivity of the first scale body;
[0009] a second scale, the second scale comprising a second scale body and second scale lines disposed on the second scale body, wherein the emissivity of the second scale lines is greater than the emissivity of the second scale body;
[0010] The first scale body is connected to the second scale body and is perpendicular to each other. The first scale body and the second scale body cooperate to enclose a detection area, and the zero scale line in the first scale line contacts the zero scale line in the second scale line.
[0011] Optionally, the first scale line is located on a side of the first ruler body facing the detection area; and / or the second scale line is located on a side of the second ruler body facing the detection area.
[0012] Optionally, both the first ruler body and the second ruler body are flexible members.
[0013] Optionally, the first ruler body and the second ruler body are both adhesive members or magnetic members.
[0014] Optionally, at least one of the first scale body and the second scale body is provided with a detection line, and the detection line is used to determine the spatial resolution of the infrared imager.
[0015] Optionally, the detection line includes multiple line groups, each line group includes a first detection line, a second detection line and a third detection line arranged in sequence. In the same line group, the widths of the first detection line, the second detection line and the third detection line are equal, the emissivity of the first detection line and the third detection line are equal, and the emissivity of the first detection line is greater than the emissivity of the second detection line. In multiple line groups, the emissivity of multiple first detection lines is equal, the emissivity of multiple second detection lines is equal, and the widths of multiple first detection lines are different.
[0016] Optionally, the plurality of line groups are arranged at intervals along a preset direction.
[0017] Optionally, along a preset direction, the widths of the plurality of first detection lines gradually decrease.
[0018] Optionally, along a preset direction, a distance between two adjacent line groups is greater than a width of a first detection line of an upstream line group.
[0019] A second object of the present invention is to provide an infrared imager assembly that can directly read the position data and size data of defects on a test board, thereby improving detection accuracy and detection efficiency.
[0020] To achieve this purpose, the present invention adopts the following technical solutions:
[0021] The infrared imager assembly comprises an infrared imager and the above-mentioned infrared imager auxiliary device.
[0022] Beneficial effects of the utility model:
[0023] The present invention provides an infrared imaging auxiliary device in which a first scale body is connected to a second scale body and is perpendicular to each other. The first and second scale bodies cooperate to enclose a detection area, and the zero scale line of the first scale line contacts the zero scale line of the second scale line. The infrared imaging auxiliary device is placed on a test board so that the test area of the test board is located within the detection area. Infrared thermal imaging is then performed. Because the emissivity of the first scale line is greater than that of the first scale body, and the emissivity of the second scale line is greater than that of the second scale body, defects on the first scale line, the second scale line, and the test board can be directly observed in the infrared thermal image. The point where the zero scale line of the first scale line and the zero scale line of the second scale line contact each other is used as the zero point. The specific location and size data of the defect are then determined by reading the corresponding scale values of the defect on the first and second scales. This indicates that the infrared imaging auxiliary device can directly read the location and size data of the defect on the test board, eliminating the need for using a relative object to determine the location and size data of the defect, thereby improving detection accuracy and efficiency. BRIEF DESCRIPTION OF THE DRAWINGS
[0024] Figure 1 This is a schematic structural diagram of an infrared imager auxiliary device provided by an embodiment of the present utility model;
[0025] Figure 2 It is a partially enlarged structural schematic diagram of the infrared imager auxiliary device provided by an embodiment of the utility model.
[0026] In the picture:
[0027] 10. Test board; 11. Defect;
[0028] 110, first scale body; 120, first scale line; 210, second scale body; 220, second scale line; 300, detection area; 400, line group; 410, first detection line; 420, second detection line; 430, third detection line; 440, first line group; 450, second line group. DETAILED DESCRIPTION
[0029] The present invention will be further described in detail below with reference to the accompanying drawings and examples. It should be understood that the specific embodiments described herein are intended only to illustrate the present invention and are not intended to limit the present invention. It should also be noted that, for ease of description, the accompanying drawings only illustrate portions relevant to the present invention, not all of its components.
[0030] In the description of this utility model, unless otherwise specified or limited, the terms "connected," "connect," and "fixed" should be understood in a broad sense. For example, they can refer to fixed connection, detachable connection, or integration; mechanical connection or electrical connection; direct connection or indirect connection through an intermediate medium; internal communication between two components or interaction between two components. Those skilled in the art will understand the specific meanings of the above terms in this utility model based on the specific circumstances.
[0031] In the present invention, unless otherwise expressly specified or limited, a first feature being "above" or "below" a second feature may include the first and second features being in direct contact, or may include the first and second features being in contact not directly but through another feature between them. Moreover, a first feature being "above," "above," and "above" a second feature may include the first feature being directly above or obliquely above the second feature, or may simply mean that the first feature is higher in level than the second feature. A first feature being "below," "below," and "below" a second feature may include the first feature being directly below or obliquely below the second feature, or may simply mean that the first feature is lower in level than the second feature.
[0032] In the description of this embodiment, the terms "upper," "lower," "right," and other orientations or positional relationships are based on the orientations or positional relationships shown in the accompanying drawings and are intended solely for ease of description and simplified operation. They do not indicate or imply that the devices or components referred to must have a specific orientation, be constructed, or operate in a specific orientation. Therefore, they should not be construed as limitations on the present invention. Furthermore, the terms "first" and "second" are used solely for descriptive purposes and have no special meaning.
[0033] This embodiment provides an infrared imaging auxiliary device, which can directly read the position data and size data of defects (delamination, debonding or inclusions, etc.) inside the test board, thereby improving the detection accuracy and detection efficiency.
[0034] Specifically, if Figure 1 and Figure 2As shown, the infrared imager auxiliary device includes a first scale and a second scale. The first scale includes a first body 110 and first scale lines 120 disposed on the first body 110. The first scale lines 120 are distributed along the extension direction of the first body 110 (the x-direction in the figure). The emissivity of the first scale lines 120 is greater than the emissivity of the first body 110. The second scale includes a second body 210 and second scale lines 220 disposed on the second body 210. The second scale lines 220 are distributed along the extension direction of the second body 210 (the y-direction in the figure). The emissivity of the second scale lines 220 is greater than the emissivity of the second body 210. The first body 110 and the second body 210 are connected and perpendicular to each other. The first body 110 and the second body 210 cooperate to enclose a detection area 300. The zero scale line of the first scale lines 120 contacts the zero scale line of the second scale lines 220.
[0035] Based on the above design, the first scale body 110 and the second scale body 210 are connected and perpendicular to each other. The first scale body 110 and the second scale body 210 cooperate to enclose a detection area 300. The zero scale line of the first scale line 120 contacts the zero scale line of the second scale line 220. The infrared imaging auxiliary device is placed on the test plate 10 so that the test area of the test plate 10 is located within the detection area 300. Infrared thermal imaging is then performed. Because the emissivity of the first scale line 120 is greater than that of the first scale body 110, and the emissivity of the second scale line 220 is greater than that of the second scale body 210, the first scale line 120, the second scale line 220, and the defect 11 on the test plate 10 can be directly observed in the infrared thermal image. The point where the zero scale line of the first scale line 120 and the zero scale line of the second scale line 220 contact each other is used as the zero point. The specific location and size of the defect 11 can then be determined by reading the corresponding scale values of the defect 11 on the first and second scales. It can be seen that the infrared imaging auxiliary device can directly read the position data and size data of the defect 11 on the test board 10, eliminating the need to use relative objects to determine the position data and size data of the defect 11, and has the effect of improving detection accuracy and detection efficiency.
[0036] It should be noted that the length and width of the first scale body 110 and the second scale body 210 can be determined according to the surface condition of the test board 10 and the monitoring area of the infrared imager.
[0037] Further, if Figure 1 and Figure 2As shown, the first scale lines 120 are located on the side of the first scale body 110 facing the detection area 300, and the second scale lines 220 are located on the side of the second scale body 210 facing the detection area 300, so as to facilitate reading the data values on the first scale lines 120 and the second scale lines 220. Of course, in other embodiments, the first scale lines 120 may be located on the side of the first scale body 110 facing the detection area 300, while the second scale lines 220 are located in other directions of the second scale body 210; or the first scale lines 120 may be located in other directions of the first scale body 110, while the second scale lines 220 are located on the side of the second scale body 210 facing the detection area 300.
[0038] Optionally, both the first ruler body 110 and the second ruler body 210 are flexible members, so that the first ruler body 110 and the second ruler body 210 can be laid flat on the test board 10 .
[0039] Furthermore, the first scale body 110 and the second scale body 210 are both adhesive members, such as stickers, which have a certain degree of softness and stickiness. When the test board 10 is not horizontal, the first scale body 110 and the second scale body 210 can be attached to the test board 10, facilitating the testing operation and improving the detection accuracy. Moreover, after the test is completed, the first scale body 110 and the second scale body 210 can be peeled off from the test board 10 for easy reuse. Of course, in other embodiments, the first scale body 110 and the second scale body 210 can also be magnetic members. When the test board 10 is magnetic, the first scale body 110 and the second scale body 210 can be magnetically attracted to the test board 10, which can also facilitate operation and improve detection accuracy.
[0040] Spatial resolution refers to the minimum distance between two adjacent objects that an infrared imager can identify. It is also the smallest dimension an infrared imager can measure and determines the imager's clarity. Currently, the main method for determining the spatial resolution of an infrared imager is through calculation using the formula (spatial resolution = pixel pitch / lens focal length). However, in existing technology, pixel pitch is generally unmeasurable and can only be estimated. Therefore, the spatial resolution value calculated using this formula is inaccurate. To address the above technical issues, the infrared imager auxiliary device provided in this embodiment has detection lines on at least one of the first scale body 110 and the second scale body 210. The detection lines are used to determine the spatial resolution of the infrared imager.
[0041] Specifically, if Figure 1 and Figure 2As shown, the detection lines include multiple line groups 400, each line group 400 includes a first detection line 410, a second detection line 420 and a third detection line 430 arranged in sequence. In the same line group 400, the widths of the first detection line 410, the second detection line 420 and the third detection line 430 are equal, the emissivity of the first detection line 410 and the third detection line 430 are equal, and the emissivity of the first detection line 410 is greater than the emissivity of the second detection line 420. In the multiple line groups 400, the emissivity of the multiple first detection lines 410 is equal, the emissivity of the multiple second detection lines 420 is equal, and the widths of the multiple first detection lines 410 are different. That is, the widths of the first detection line 410, the second detection line 420 and the third detection line 430 in the same line group 400 are equal, but the widths of the first detection lines 410 in different line groups 400 are different.
[0042] Since the relationship between spatial resolution and line pair width can be expressed by the formula R=1 / (2×d), where R represents spatial resolution and d represents half of the line pair width (i.e., the width of the first detection line 410 in this embodiment), after infrared thermal imaging using the infrared imager auxiliary device, multiple line groups 400 in the infrared thermal image are observed to observe whether the first detection line 410, the second detection line 420, and the third detection line 430 can be distinguished in each line group 400. If the first detection line 410, the second detection line 420, and the third detection line 430 in a certain line group 400 cannot be distinguished (here, the width of the first detection line 410 of the line group 400 is regarded as d1), it indicates that the spatial resolution of the infrared imager used does not reach 1 / (2×d1). Find all line groups 400 that can distinguish the first detection line 410, the second detection line 420 and the third detection line 430, and find the first detection line 410 with the smallest width among these line groups 400. Here, the width of the first detection line 410 is regarded as d2, which indicates that the spatial resolution of the infrared imager used is 1 / (2×d2). For example, if d2 is 0.1mm, the spatial resolution of the infrared imager is 5LP / mm.
[0043] Based on the above design, the user can calculate the spatial resolution of the infrared imager by observing whether the first detection line 410, the second detection line 420 and the third detection line 430 in the same line group 400 can be distinguished and combined with the formula R = 1 / (2×d). This eliminates the need to use estimated values such as pixel spacing to calculate the spatial resolution of the infrared imager, and has the effect of improving the accuracy of spatial resolution calculation.
[0044] It should be noted that the above formula of spatial resolution and line pair width R=1 is common knowledge in the art.
[0045] Furthermore, the plurality of line groups 400 are spaced apart along a preset direction, so that the arrangement of the plurality of line groups 400 is relatively regular.
[0046] Furthermore, along a preset direction, the widths of the plurality of first inspection lines 410 gradually decrease. When observing the first inspection lines 410, second inspection lines 420, and third inspection lines 430 in each line group 400, the plurality of line groups 400 can be observed one by one in a direction opposite to the preset direction. When the first line group 400 that can distinguish the first inspection lines 410, second inspection lines 420, and third inspection lines 430 in the same line group 400 is found, the width of the first inspection line 410 in that line group 400 is substituted into the formula R = 1 / (2×d) for calculation. The remaining line groups 400 after that line group 400 do not need to be observed. This design can simplify the observation process and improve the efficiency of determining the spatial resolution of the infrared imager.
[0047] Optionally, along the preset direction, the distance between two adjacent line groups 400 is greater than the width of the first detection line 410 of the line group 400 located upstream. For ease of understanding, as shown in FIG. Figure 2 As shown, in the two adjacent line groups 400, in a preset direction, the upstream line group 400 is considered the first line group 440, and the downstream line group 400 is considered the second line group 450. The width of the first detection line 410 in the first line group 440 is a1, and the distance between the first line group 440 and the second line group 450 (i.e., the distance between the third detection line 430 of the first line group 440 and the first detection line 410 of the second line group 450) is L1, where L1 is greater than a1. This structural design facilitates the observer to distinguish between different line groups 400 (especially two adjacent line groups 400), and also facilitates the observation of the first detection line 410, second detection line 420, and third detection line 430 in each line group 400, thereby preventing the observer from making observation errors due to visual fatigue. It should be noted that because the widths of the first detection lines 410 in different line groups 400 are different, the distances between different adjacent line groups 400 are also different.
[0048] In this embodiment, Figure 1 and Figure 2As shown, detection lines are provided on both the first scale body 110 and the second scale body 210. The preset directions include a first preset direction (the x-direction in the figure) and a second preset direction (the y-direction in the figure). Multiple line groups on the first scale body 110 are spaced apart along the first preset direction, and multiple line groups on the second scale body 210 are spaced apart along the second preset direction. The first and third detection lines on the first scale body 110 are spaced apart so that the first detection line on the first scale body 110 between the first and third detection lines forms a second detection line, and the emissivity of the first and third detection lines on the first scale body 110 is greater than that of the first scale body 110. The first and third detection lines on the second scale body 210 are spaced apart so that the second detection line on the second scale body 210 between the first and third detection lines forms a second detection line, and the emissivity of the first and third detection lines on the second scale body 210 is greater than that of the second scale body 210. During actual measurement, the detection lines on the first and second scale bodies can be observed simultaneously to improve the accuracy of determining the spatial resolution of the infrared imager. It is understandable that in other embodiments, second detection lines may be provided on the first scale body 110 and the second scale body 210, respectively. That is, the first scale body 110 may be provided with a first detection line, a second detection line, and a third detection line, and the emissivity of the first detection line, the second detection line, and the third detection line on the first scale body 110 may be greater than the emissivity of the first scale body 110; and the second scale body 210 may be provided with a first detection line, the second detection line, and the third detection line, and the emissivity of the first detection line, the second detection line, and the third detection line on the second scale body 210 may be greater than the emissivity of the second scale body 210.
[0049] In this embodiment, Figure 1 and Figure 2 As shown, the detection line on the first scale body 110 is located on the side of the first scale body 110 facing away from the detection area 300, so as to facilitate the distinction between the detection line on the first scale body 110 and the first scale lines 120, thereby facilitating reading. The detection line on the second scale body 210 is located on the side of the second scale body 210 facing away from the detection area 300, so as to facilitate the distinction between the detection line on the second scale body 210 and the second scale lines 220, thereby facilitating reading.
[0050] This embodiment also provides an infrared imager assembly that can directly read the position data and size data of the defect 11 on the test board 10, thereby improving the detection accuracy and detection efficiency.
[0051] Specifically, the infrared imager assembly includes an infrared imager and the aforementioned infrared imager auxiliary device. When using the infrared imager assembly to inspect a test board 10, the corresponding values of a defect 11 on the test board 10 at the first scale line 120 and the second scale line 220 can be directly read from the infrared thermal image, thereby determining the specific location and size of the defect 11. Furthermore, by observing the inspection lines on the first scale body 110 and the second scale body 210 and combining them with the formula R = 1 / (2×d), the infrared imager assembly can directly calculate the spatial resolution of the infrared imager, thereby improving the accuracy of spatial resolution calculations.
[0052] The following is a brief description of the method for using the infrared imager auxiliary device provided in this embodiment:
[0053] See Figure 1 and Figure 2 , stick the first scale body 110 and the second scale body 210 on the test board 10, adjust the parameters of the infrared imager to appropriate detection parameters, and then start infrared thermal imaging to obtain an infrared thermal map.
[0054] On the infrared thermal image, the detection line is observed and combined with the formula R=1 / (2×d), the high spatial resolution of the infrared imager is calculated.
[0055] On the infrared thermal image, the specific position and size data of the defect 11 can be determined by reading the corresponding values of the defect 11 on the first scale line 120 and the second scale line 220.
[0056] Remove the first scale body 110 and the second scale body 210 and replace the locations of the first scale body 110 and the second scale body 210 on the test board 10 , that is, replace the locations of the inspection area 300 . Repeat the above steps for the next round of inspection until the entire test board 10 is inspected.
[0057] Obviously, the above-described embodiments of the present invention are merely examples for the purpose of clearly illustrating the present invention and are not intended to limit the manner in which the present invention is to be implemented. A person skilled in the art would be able to make various obvious changes, readjustments, and substitutions without departing from the scope of protection of the present invention. It is not necessary and impossible to enumerate all embodiments here. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of the present invention shall be included within the scope of protection of the claims of the present invention.
Claims
1. An infrared imager auxiliary device, characterized in that: include: A first scale, the first scale comprising a first scale body (110) and first scale lines (120) arranged on the first scale body (110), the emissivity of the first scale lines (120) being greater than the emissivity of the first scale body (110); A second scale, the second scale comprising a second scale body (210) and second scale lines (220) arranged on the second scale body (210), the emissivity of the second scale lines (220) being greater than the emissivity of the second scale body (210); The first ruler body (110) is connected to the second ruler body (210) and is perpendicular to the first ruler body (110). The first ruler body (110) and the second ruler body (210) cooperate to enclose a detection area (300). The zero scale line in the first scale line (120) is in contact with the zero scale line in the second scale line (220).
2. The infrared imager auxiliary device according to claim 1, characterized in that: The first scale line (120) is located on a side of the first scale body (110) facing the detection area (300); and / or the second scale line (220) is located on a side of the second scale body (210) facing the detection area (300).
3. The infrared imager auxiliary device according to claim 1, characterized in that: The first ruler body (110) and the second ruler body (210) are both flexible members.
4. The infrared imager auxiliary device according to claim 1, characterized in that: The first ruler body (110) and the second ruler body (210) are both adhesive or magnetic.
5. The infrared imager auxiliary device according to claim 1, characterized in that: At least one of the first scale body (110) and the second scale body (210) is provided with a detection line, and the detection line is used to determine the spatial resolution of the infrared imager.
6. The infrared imager auxiliary device according to claim 5, characterized in that: The detection lines include a plurality of line groups (400), each of the line groups (400) includes a first detection line (410), a second detection line (420) and a third detection line (430) arranged in sequence; in the same line group (400), the widths of the first detection line (410), the second detection line (420) and the third detection line (430) are equal, the emissivity of the first detection line (410) and the third detection line (430) are equal, and the emissivity of the first detection line (410) is greater than the emissivity of the second detection line (420); in a plurality of the line groups (400), the emissivity of a plurality of the first detection lines (410) is equal, the emissivity of a plurality of the second detection lines (420) is equal, and the widths of a plurality of the first detection lines (410) are different.
7. The infrared imager auxiliary device according to claim 6, characterized in that: A plurality of the line groups (400) are arranged at intervals along a preset direction.
8. The infrared imager auxiliary device according to claim 7, characterized in that: Along the preset direction, the widths of the plurality of first detection lines (410) gradually decrease.
9. The infrared imager auxiliary device according to claim 8, characterized in that: Along the preset direction, the distance between two adjacent line groups (400) is greater than the width of the first detection line (410) of the line group (400) located upstream.
10. An infrared imager assembly, characterized in that: It comprises an infrared imager and the infrared imager auxiliary device according to any one of claims 1 to 9.