Jig for testing memory chip

Abstract

The utility model relates to a memory chip testing jig which comprises a chip testing main board, clamping assemblies used for fixing the chip testing main board and a plurality of positioning pieces used for limiting the position of a memory chip, the chip testing main board comprises a main board body and a golden finger part arranged on one side of the main board body, the clamping assemblies are clamped on the two sides of the main board body, and the positioning pieces are arranged on the main board body. The golden finger part extends out of the clamping assembly and is used for being connected with a mainboard slot, a plurality of chip probes are arranged on one side of the mainboard body in the length direction of the mainboard body, containing grooves used for containing memory chips are formed in the positions, corresponding to the chip probes, of the clamping assembly, one end of the positioning piece is rotationally connected to the side, provided with the containing grooves, of the clamping assembly, and the other end of the positioning piece is rotationally connected with the clamping assembly. The rotatably-connected end of the positioning piece is arranged close to the golden finger part, and the other end of the positioning piece is connected with the clamping assembly in a buckled mode. The golden finger part is arranged on the other side of the opening position of the positioning piece, so that the positioning piece can stably limit the position of the memory chip.

Description

Technical Field

[0001] The present application relates to the technical field of memory chip testing jigs, and in particular to a memory chip testing jig. Background Art

[0002] Before the DDR4 memory chip is soldered to the circuit board, the performance of the memory chip needs to be tested. Currently, the memory chip is usually placed on the motherboard through a fixture, and then the motherboard is inserted into the motherboard slot for testing.

[0003] A Chinese patent with application number CN202221743237.5 discloses a chip testing fixture, which includes a base, a first surface cover, a second surface cover and a test board, wherein the first surface cover and the second surface cover are respectively located on both sides of the base and are movably connected thereto; wherein, a first test slot and a second test slot are respectively provided on opposite sides of the base, and the first test slot and the second test slot are used to accommodate chips to be tested; a first pressing member is protruding from a side of the first surface cover facing the first test slot, and a second pressing member is protruding from a side of the second surface cover facing the second test slot; the test board is installed on the base, and at least part of it is located in the first test slot and the second test slot, and is used to contact and electrically connect with the chips placed in the first test slot and the second test slot.

[0004] In the above scheme, in the process of connecting the gold fingers on the motherboard to the motherboard slot, the motherboard needs to be moved toward the motherboard slot, and the opening position of the cover used to press the chip is also facing the gold fingers. Therefore, if an object comes into contact with the cover during the movement, the locking effect of the cover will loosen, affecting the positioning of the chip by the cover.

[0005] Therefore, it is necessary to propose a new technical solution to solve the above problems. Utility Model Content

[0006] In order to connect the memory chip to a chip test motherboard and ensure that the memory chip can maintain a stable connection with the chip test motherboard when the chip test motherboard is inserted into a motherboard slot, the present application provides a memory chip test fixture.

[0007] The present application provides a memory chip test fixture, which adopts the following technical solution:

[0008] A jig for testing a memory chip comprises a chip testing mainboard, a clamping assembly for fixing the chip testing mainboard, and a plurality of positioning members for limiting the position of a memory chip, wherein the chip testing mainboard comprises a mainboard body and a gold finger portion arranged on one side of the mainboard body, the clamping assembly is clamped on both sides of the mainboard body, the gold finger portion extends out of the clamping assembly and is used to connect to the mainboard slot, a plurality of chip probes are arranged on one side of the mainboard body along its length direction, a receiving groove for placing a memory chip is provided on the clamping assembly at a corresponding position of each chip probe, one end of the positioning member is rotatably connected to a side of the clamping member provided with the receiving groove, the rotatably connected end of the positioning member is arranged close to the gold finger portion, and the other end of the positioning member is snap-fitted and connected to the clamping member.

[0009] By adopting the above technical solution, the gold finger part is set on the other side of the open position of the positioning piece, so that in the process of moving the gold finger part toward the motherboard slot, the force exerted on the positioning piece will push the positioning piece to move toward the top plate, so that the position of the positioning piece relative to the clamping assembly will not change, and the positioning piece can stably limit the position of the memory chip.

[0010] Optional: The clamping assembly includes a bottom plate arranged on one side of the mainboard body, a top plate arranged on the other side of the mainboard body and a plurality of guide members arranged on the top plate, the bottom plate and the top plate are respectively arranged on both sides of the mainboard body, the top plate is provided with installation grooves corresponding to multiple chip probes at the same time, the guide members are embedded in the installation grooves and fill the installation grooves, and the accommodating grooves are opened on the guide members and correspond one-to-one with the chip probes.

[0011] By adopting the above technical solution, the guide members with receiving grooves of different sizes can be replaced, so that memory chips of different sizes can be tested on the fixture as needed.

[0012] Optionally, the opening of the receiving slot for receiving the memory chip is configured to be expanded.

[0013] By adopting the above technical solution, the size of the opening of the receiving slot is increased by expanding the opening, and the expanding opening can also guide the movement of the memory chip toward the receiving slot, so that the memory chip can enter the receiving slot more easily.

[0014] Optionally: A locking assembly is provided at one end of the positioning member away from its rotation axis, and the locking assembly includes a lock buckle rotatably connected to the positioning member, an elastic member driving the lock buckle to rotate, and a locking rod provided on the top plate, the lock buckle is hooked on the side of the locking rod close to the bottom plate, and the elastic member pushes the lock buckle to rotate toward the direction of the locking rod.

[0015] By adopting the above technical solution, the rotation of the positioning member is restricted by utilizing the connection between the lock catch and the lock rod, so that the positioning member can stably limit the position of the memory chip.

[0016] Optionally: the lock includes a rotating part rotatably connected to the positioning member and a locking part that limits the rotation of the rotating part, the locking part is arranged at an end of the rotating part away from its own rotation axis, the locking part abuts against a side of the locking rod close to the base plate, and an end of the side wall of the locking part close to the base plate is inclined toward the direction of the positioning member.

[0017] By adopting the above technical solution, when the locking part moves toward the locking rod, the inclined side wall on the locking part will move with the locking rod and automatically rotate under the guidance of the inclined side wall, so that the locking part moves to the direction where the locking rod is close to the bottom plate, thereby making the cooperation between the locking part and the locking rod more convenient.

[0018] Optionally: an opening portion is provided on the end surface of the rotating portion away from the locking portion.

[0019] By adopting the above technical solution, when it is necessary to disconnect the locking part from the locking rod, force is directly applied to the opening part to drive the locking part to move in a direction away from the locking rod, so that the locking part is no longer connected to the locking rod. During the process of rotating the locking part, there is a larger room for movement at the force application position, thereby making the process of driving the locking part to rotate more convenient.

[0020] Optionally: the positioning member is also provided with abutment blocks for pushing the memory chip to maintain abutment with the chip probe, and the abutment blocks correspond to the chip probes respectively.

[0021] By adopting the above technical solution, the abutment block is used to apply force to the memory chip toward the chip probe, so that the memory chip can maintain abutment with the chip probe, and the abutment block can also be replaced according to the size of the memory chip.

[0022] Optionally: a clearance groove is provided on one side of the top plate and the side plate away from the gold finger part, and a mounting seat is provided on the locking rod, and the mounting seat is embedded in the corresponding clearance groove and fixed.

[0023] By adopting the above technical solution, the locking rod will not protrude too much from the surface of the clamping assembly, so that it is more convenient to place during production and transportation.

[0024] Optionally: a partition plate is provided between the main board body and the top plate, a clearance groove is provided on the partition plate at a position corresponding to the chip probe, and the chip probe passes through the clearance groove and abuts against the memory chip.

[0025] By adopting the above technical solution, after the memory chip is placed in the receiving slot, the memory chip will not directly contact the circuit on the mainboard body, so that the detection result is not easily affected.

[0026] Optionally: a bearing seat is provided on the top plate, the positioning member is rotatably connected to the bearing seat, the bearing seat is used to abut against an adjacent motherboard slot, and the side wall of the bottom plate adjacent to the gold finger portion is used to abut against another adjacent motherboard slot.

[0027] By adopting the above technical solution, the bearing seat and the bottom plate are used to apply force to the openings of the two adjacent motherboard slots of the motherboard slot into which the gold finger part is inserted, so that the two adjacent motherboard slots are used to apply force to the two side walls of the motherboard slot into which the gold finger part is inserted, so that the overall shape of the motherboard slot into which the gold finger part is inserted is not easy to change, thereby increasing the service life of the motherboard slot.

[0028] In summary, the present application includes at least one of the following beneficial technical effects:

[0029] 1. Use the bearing seat and the bottom plate to apply force to the two adjacent motherboard slots of the motherboard slot to which the gold finger part is inserted, so that the two adjacent motherboard slots can limit the positions of the two side walls of the motherboard slot connected to the gold finger part, thereby increasing the service life of the motherboard slot;

[0030] 2. By moving the gold finger part and the locking assembly away from each other, the locking assembly can stably limit the rotation of the positioning piece during the process of inserting the gold finger part into the motherboard slot, so that the memory chip maintains a stable connection with the chip probe. BRIEF DESCRIPTION OF THE DRAWINGS

[0031] Figure 1 This is a schematic diagram of the structure of an embodiment of the present application;

[0032] Figure 2 This is a schematic diagram of the structure of the locking assembly used to illustrate an embodiment of the present application.

[0033] In the figure, 1, chip test main board; 11, main board body; 12, gold finger part; 13, chip probe; 2, clamping assembly; 21, bottom plate; 22, top plate; 221, mounting groove; 23, partition plate; 231, clearance groove; 24, guide member; 241, accommodating groove; 25, bearing seat; 26, limit groove; 27, mounting seat; 3, positioning member; 31, indentation groove; 32, abutment block; 4, locking assembly; 41, lock; 411, rotating part; 412, locking part; 413, opening part; 43, locking rod; DETAILED DESCRIPTION

[0034] The present application is further described in detail below in conjunction with the accompanying drawings.

[0035] The present application discloses a memory chip testing fixture, such as Figure 1As shown, it includes a chip test motherboard 1, a clamping assembly 2 for fixing the chip test motherboard 1, and a plurality of positioning members 3 for limiting the position of the memory chip. In this embodiment, the highest frequency of the memory chip to be tested can reach 3600MHz. The chip test motherboard 1 includes a motherboard body 11 and a gold finger portion 12 arranged on one side of the motherboard body 11. The motherboard body 11 is also provided with a plurality of chip probes 13 along its length direction. The chip probes 13, the gold finger portion 12 and the motherboard body 11 are electrically connected. The chip probes 13 can abut against the memory chip to achieve electrical connection between the motherboard body 11 and the memory chip.

[0036] The clamping assembly 2 includes a bottom plate 21 disposed on the side of the main board body 11 where the chip probe 13 is not disposed, and a top plate 22 disposed on the side of the main board body 11 where the probe is disposed. A partition plate 23 is also disposed between the top plate 22 and the chip body. The top plate 22, the partition plate 23, the main board body 11 and the bottom plate 21 are abutted in sequence and fixed by bolts. The gold finger portion 12 extends from between the partition plate 23 and the bottom plate 21 and can be inserted into the main board slot, and is used to detect the memory chip connected to the main board body 11.

[0037] like Figure 1 and Figure 2 As shown, the positions corresponding to the chip probes 13 on the partition plate 23 are all provided with clearance grooves 231, and the chip probes 13 pass through the clearance grooves 231, so that the memory chip can abut against the side wall of the partition plate 23 away from the main board body 11. The surface of the top plate 22 is provided with a mounting groove 221 that is connected to multiple clearance grooves 231 at the same time, and a guide member 24 is embedded in the mounting groove 221, and the guide member 24 fills the mounting groove 221. The guide member 24 is provided with a receiving groove 241 that is connected to the clearance groove 231 at the position corresponding to the chip probe 13. During the detection, the memory chip can be directly placed in the receiving groove 241, so that the chip probe 13 and the memory chip are accurately connected. At the same time, the guide member 24 can be replaced according to the size of the memory chip, so that the receiving groove 241 can position memory chips of different sizes. In this embodiment, the receiving groove 241 can position memory chips between 512Mx8 and 2Gx8.

[0038] The side wall of the memory chip is in contact with the inner wall of the receiving groove 241 , and the opening of the receiving groove 241 away from the chip probe 13 is expanded, thereby increasing the opening area of ​​the receiving groove 241 away from the chip probe 13 , making it easier to place the chip in the receiving groove 241 .

[0039] like Figure 2As shown, the surface of the top plate 22 is fixed with a bearing seat 25 by bolts along its length direction. The bearing seat 25 is arranged close to the gold finger part 12. The positioning member 3 is rotatably connected to the bearing seat 25. The positioning member 3 can abut against the surface of the memory chip embedded in the receiving groove 241, so that the memory chip can be stably connected with the chip probe 13. And when the gold finger part 12 is inserted into the motherboard slot, the bearing seat 25 can abut against the position of the adjacent motherboard slot for inserting the gold finger part 12, and the bottom plate 21 can abut against the position of another adjacent motherboard slot for inserting the gold finger part 12, so that by positioning the adjacent motherboard slot, the motherboard slot into which the gold finger part 12 is inserted is not easily deformed away from the gold finger part 12, thereby increasing the service life of the motherboard slot.

[0040] The end of the positioning member 3 away from the bearing seat 25 is provided with a locking assembly 4 for limiting its rotation, and the locking assembly 4 includes a lock catch 41 rotatably connected to the positioning member 3, an elastic member driving the lock catch 41 to rotate, and a locking rod 43 provided on the top plate 22. The end of the positioning member 3 away from the rotation axis is provided with a retracting groove 31, and the lock catch 41 includes a rotating portion 411 arranged to rotate in the retracting groove 31 and a locking portion 412 hooked on the locking rod 43, one end of the rotating portion 411 is arranged to rotate in the retracting groove 31, and the other end of the rotating portion 411 extends toward the bottom plate 21, and the locking portion 412 is arranged at one end of the rotating portion 411 away from its own rotation axis, and the locking portion 412 extends toward the main board body 11. The top plate 22, the partition plate 23 and the side wall of the bottom plate 21 away from the gold finger part 12 are commonly provided with a limiting groove 26 corresponding to the positioning member 3, and a mounting seat 27 is fixed in the limiting groove 26 by bolts, and the locking rods 43 are respectively penetrated on the mounting seat 27, and the axis of the locking rod 43 is parallel to the rotation axis of the positioning member 3. The locking portion 412 is provided on the side of the locking rod 43 away from the gold finger part 12, and the locking portion 412 is in contact with the side of the locking rod 43 close to the bottom plate 21, so that the position of the positioning member 3 is limited. The side wall of the locking portion 412 away from the rotation axis of the rotating portion 411 is inclined, and the end of the inclined side wall of the locking portion 412 close to the gold finger portion 12 is inclined toward the direction of the rotating portion 411. When the locking portion 412 moves toward the locking rod 43, the inclined side wall of the locking portion 412 contacts the locking rod 43, thereby rotating the locking portion 412 and enabling the locking portion 412 to move to the side of the locking rod 43 close to the bottom plate 21.

[0041] An opening portion 413 is provided at one end of the rotating portion 411 away from the locking portion 412. The opening portion 413 is arranged perpendicular to the rotating portion 411, and one end of the opening portion 412 abuts against the side wall of the positioning member 3 away from the top plate 22. When the positioning member 3 needs to be rotated, a force can be directly applied to the opening portion 413 to disconnect the locking portion 412 from the locking rod 43, so that the positioning member 3 can rotate normally. In this embodiment, the elastic member is a spring, which is arranged between the opening portion 413 and the top plate 22, with one end of the elastic member abutting against the opening portion 413 and the other end of the elastic member abutting against the top plate 22.

[0042] The end surface of the positioning member 3 close to the memory chip is provided with a contact block 32 corresponding to the memory chip. The contact block 32 is made of rubber in this embodiment. The contact block 32 can correspond to the chip probe 13 abutted by the memory chip respectively, so that the contact block 32 is used to apply pressure to the memory chip so that the memory chip can maintain abutment with the chip probe 13.

[0043] The implementation principle of this embodiment is as follows: after placing the memory chips in the receiving slots 241 respectively, the positioning member 3 is rotated in the direction of the top plate 22, so that the locking portion 412 is hooked on the locking rod 43 to complete the stable connection between the memory chip and the chip probe 13, and then the gold finger portion 12 is inserted into the motherboard slot and the bearing seat 25 and the bottom plate 21 are respectively abutted against the openings of the adjacent motherboard slots, and then the memory chip is tested. After the test is completed, the gold finger portion 12 is pulled out of the motherboard slot, and the opening portion 413 is moved in the direction away from the bottom plate 21, so that the locking portion 412 is disconnected from the locking rod 43, and then the positioning member 3 is rotated in the direction away from the top plate 22, and the tested memory chip is taken out of the receiving slot 241 and a new memory chip to be tested is loaded.

[0044] The embodiments of this specific implementation method are all preferred embodiments of the present application, and are not intended to limit the protection scope of the present application. Therefore, all equivalent changes made based on the structure, shape, and principle of the present application should be included in the protection scope of the present application.

Claims

1. A memory chip testing fixture, characterized in that: The invention comprises a chip test mainboard (1), a clamping assembly (2) for fixing the chip test mainboard (1), and a plurality of positioning members (3) for limiting the position of a memory chip. The chip test mainboard (1) comprises a mainboard body (11) and a gold finger portion (12) arranged on one side of the mainboard body (11). The clamping assembly (2) is clamped on both sides of the mainboard body (11). The gold finger portion (12) extends out of the clamping assembly (2) and is used to connect to a mainboard slot. A plurality of chip probes (13) are arranged on one side of the mainboard body (11) along its length direction. A receiving groove (241) for placing a memory chip is provided on the clamping assembly (2) at a corresponding position of each chip probe (13). One end of the positioning member (3) is rotatably connected to a side of the clamping assembly (2) where the receiving groove (241) is arranged. The rotatably connected end of the positioning member (3) is arranged close to the gold finger portion (12). The other end of the positioning member (3) is buckled and connected to the clamping assembly (2).

2. A memory chip testing fixture according to claim 1, characterized in that: The clamping assembly (2) comprises a bottom plate (21) arranged on one side of the main board body (11), a top plate (22) arranged on the other side of the main board body (11), and a plurality of guide members (24) arranged on the top plate (22), wherein the bottom plate (21) and the top plate (22) are respectively arranged on both sides of the main board body (11), and the top plate (22) is provided with a mounting groove (221) corresponding to a plurality of chip probes (13) at the same time, the guide member (24) is embedded in the mounting groove (221) and fills the mounting groove (221), and the receiving groove (241) is provided on the guide member (24) and corresponds one-to-one with the chip probes (13).

3. A memory chip testing fixture according to claim 2, characterized in that: The opening of the receiving groove (241) for placing the memory chip is arranged to be expanded.

4. The memory chip testing fixture according to claim 1, characterized in that: A locking assembly (4) is provided at one end of the positioning member (3) away from its rotation axis, and the locking assembly (4) includes a lock catch (41) rotatably connected to the positioning member (3), an elastic member driving the lock catch (41) to rotate, and a locking rod (43) provided on the top plate (22), the lock catch (41) is hooked on a side of the locking rod (43) close to the bottom plate (21), and the elastic member pushes the lock catch (41) to rotate in the direction of the locking rod (43).

5. The memory chip testing fixture according to claim 4, characterized in that: The lock buckle (41) comprises a rotating part (411) rotatably connected to the positioning member (3) and a locking part (412) limiting the rotation of the rotating part (411); the locking part (412) is arranged at an end of the rotating part (411) away from its own rotation axis; the locking part (412) abuts against a side of the locking rod (43) close to the bottom plate (21); and an end of the side wall of the locking part (412) close to the bottom plate (21) is inclined toward the positioning member (3).

6. The memory chip testing fixture according to claim 5, characterized in that: An opening portion (413) is provided at one end of the rotating portion (411) away from the locking portion (412).

7. The memory chip testing fixture according to claim 1, characterized in that: The positioning member (3) is also provided with abutment blocks (32) for pushing the memory chip to maintain abutment with the chip probe (13), and the abutment blocks (32) correspond to the chip probes (13) respectively.

8. The memory chip testing fixture according to claim 5, characterized in that: A side of the top plate (22) and the side plate away from the gold finger portion (12) is provided with a clearance groove (231), and a mounting seat (27) is provided on the locking rod (43), and the mounting seat (27) is embedded in the corresponding clearance groove (231) and fixed.

9. The memory chip testing fixture according to claim 1, characterized in that: A partition plate (23) is provided between the mainboard body (11) and the top plate (22), and a clearance groove (231) is provided on the partition plate (23) at a position corresponding to the chip probe, and the chip probe (13) passes through the clearance groove (231) and abuts against the memory chip.

10. The memory chip testing fixture according to claim 2, characterized in that: A bearing seat (25) is provided on the top plate (22), the positioning member (3) is rotatably connected to the bearing seat (25), the bearing seat (25) is used to abut against an adjacent mainboard slot, and the side wall of the bottom plate (21) adjacent to the gold finger portion (12) is used to abut against another adjacent mainboard slot.

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