Electrical performance testing device of discrete Hall device

Abstract

The utility model provides an electrical performance testing device of a discrete Hall device, comprising a testing platform which comprises a base plate and a slide way plate, the base plate is provided with a slide way, the slide way plate is arranged in the slide way and slides under the guide of the slide way, and the slide way plate is provided with an installation position used for fixing a testing seat; the magnetic ring assembly comprises an open magnetic ring and a winding, and the winding is wound on the open magnetic ring and used for generating a magnetic field in the open magnetic ring; the open magnetic ring comprises a detection port, the open magnetic ring is fixed on the bottom plate in the mode that the detection port is located above the slide way, and the discrete Hall device to be tested in the test seat arranged on the installation position is pushed into the detection port along with the slide way plate. According to the utility model, the position and the posture of the discrete Hall device to be tested at the detection port can be relatively fixed, and the consistency and the stability of the detection result are improved.

Description

Technical Field

[0001] The utility model relates to the field of electronic component testing, and more specifically to an electrical performance testing device for a discrete Hall device. Background Art

[0002] Discrete Hall devices are sensors that detect magnetic fields based on the Hall effect. They can convert changing magnetic fields into changes in output voltage and are currently widely used in proximity switches, position measurement, speed measurement, and current measurement.

[0003] The quality of discrete Hall devices is directly related to their detection accuracy. To ensure detection accuracy, it is usually necessary to test the electrical performance of discrete Hall devices before they are applied to equipment. Most existing devices for testing the electrical performance of discrete Hall devices have the problem of large deviation in detection results. Utility Model Content

[0004] The technical problem to be solved by the utility model is to provide an electrical performance testing device for a discrete Hall device in view of the problem that the above-mentioned device for testing the electrical performance of a discrete Hall device has a large deviation in the test results.

[0005] The utility model solves the above technical problems by providing a discrete Hall device electrical performance test device, comprising:

[0006] The test platform comprises a bottom plate and a slide plate, wherein the bottom plate is provided with a slide, the slide plate is installed in the slide and slides under the guidance of the slide, and the slide plate has a mounting position for fixing the test seat;

[0007] A magnetic ring assembly comprises an open magnetic ring and a winding, wherein the winding is wound on the open magnetic ring and is used to generate a magnetic field in the open magnetic ring; the open magnetic ring comprises a detection port, and the open magnetic ring is fixed to the base plate in such a way that the detection port is located above the slide, and a discrete Hall device to be tested installed in a test socket on the mounting position is pushed into the detection port following the slide plate.

[0008] As a further improvement of the present invention, the testing device includes a test socket, which includes a first connector for plugging in the discrete Hall device to be tested, and the first connector includes a plurality of plug holes, and the plurality of plug holes respectively correspond to a plurality of pins of the discrete Hall device to be tested.

[0009] As a further improvement of the utility model, the test socket includes a printed circuit board and a second connector for connecting an external detection device, the printed circuit board has a conductive circuit, the first connector and the second connector are respectively soldered to the printed circuit board and are respectively electrically connected to the conductive circuit.

[0010] As a further improvement of the utility model, the open magnetic ring includes two end faces parallel to each other, the detection port is located between the two end faces, and when the discrete Hall device to be tested is pushed into the detection port following the slide plate, the working surface of the discrete Hall device to be tested is parallel to the end face of the open magnetic ring.

[0011] As a further improvement of the present invention, the area of ​​the end surface of the open magnetic ring is not less than 50 times the area of ​​the working surface of the discrete Hall device to be tested.

[0012] As a further improvement of the utility model, the end surface is rectangular, and the size of the end surface is not less than 3×3 mm; the distance between the two end surfaces is not less than 10 mm.

[0013] As a further improvement of the utility model, the testing device includes a magnetic ring fixing frame, the open magnetic ring is fixed to the edge of the base plate through the magnetic ring fixing frame, and the part of the open magnetic ring where the detection port is located is located above the base plate, and the part where the winding is located protrudes from the edge of the base plate.

[0014] As a further improvement of the utility model, the bottom plate is provided with strip-shaped through holes, and the slideway is formed by the strip-shaped through holes.

[0015] As a further improvement of the utility model, the base plate is provided with a slide lower plate and a slide upper plate, the slide lower plate is fixed to the lower surface of the base plate and protrudes from the two side edges below the strip-shaped through hole, the slide upper plate is fixed to the upper surface of the base plate and protrudes from the two side edges above the strip-shaped through hole; the slide plate is installed in the strip-shaped through hole and is limited by the slide lower plate and the slide upper plate.

[0016] As a further improvement of the present invention, the slide board is provided with a slide handle, the slide handle protrudes from the top surface of the slide upper plate, and the slide board is pushed by the slide handle to slide in the slide.

[0017] The utility model has the following beneficial effects: by arranging a slideway on the bottom plate, and arranging a slideway plate inside the slideway with a mounting position for fixing the test socket, the discrete Hall device to be tested enters the detection port of the open magnetic ring under the guidance of the slideway, so that the position and posture of the discrete Hall device to be tested at the detection port are relatively fixed, thereby improving the consistency and stability of the detection result. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 It is a structural schematic diagram of an electrical performance testing device for a discrete Hall device provided in an embodiment of the utility model.

[0019] Figure 2 yes Figure 1 A partial enlarged schematic diagram of part A in the middle.

[0020] Figure 3 It is a schematic diagram of an open magnetic ring in an electrical performance testing device for a discrete Hall device provided in an embodiment of the utility model. DETAILED DESCRIPTION

[0021] In order to make the purpose, technical solution and advantages of the utility model more clear, the utility model is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the utility model and are not used to limit the utility model.

[0022] Those skilled in the art should understand that hardware manufacturers may use different names to refer to the same component. This specification and claims do not use differences in names as a way to distinguish components, but use differences in components' functions as the criteria for distinction. As mentioned throughout the specification and claims, "including" is an open term and should be interpreted as "including but not limited to". "Approximately" means that within an acceptable error range, those skilled in the art can solve technical problems within a certain error range and basically achieve technical effects.

[0023] In the description of the application, it should be understood that the terms "upper", "lower", "front", "rear", "left", "right", "horizontal", etc., indicating directions or positional relationships, are based on the directions or positional relationships shown in the drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific direction, be constructed and operate in a specific direction, and therefore cannot be understood as limiting the present invention.

[0024] In the description of this application, unless otherwise clearly specified and limited, the terms "first", "second", and "third" are used for descriptive purposes only and cannot be understood as indicating or implying relative importance; the term "plurality" refers to two or more; unless otherwise specified or explained, the terms "connected", "fixed", etc. should be understood in a broad sense, for example, "connected" can be a fixed connection, a detachable connection, an integral connection, or an electrical connection; "connected" can be a direct connection or an indirect connection through an intermediate medium. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to specific circumstances.

[0025] like Figure 1 , Figure 2 , is a schematic diagram of the structure of the electrical performance test device for discrete Hall devices provided by an embodiment of the utility model, and the test device can be used to perform electrical performance tests on discrete Hall devices, such as electrical performance tests of discrete Hall devices before leaving the factory, or electrical performance tests of discrete Hall devices before use. The electrical performance test device for discrete Hall devices of this embodiment includes a test platform and a magnetic ring assembly, wherein the test platform is used to fix the discrete Hall device to be tested, and the magnetic ring assembly is used to generate a controllable magnetic field, that is, to provide a test environment for the discrete Hall device to be tested.

[0026] The test platform includes a bottom plate 11 and a slide plate 15, which can be made of insulating materials respectively. The bottom plate 11 is in the shape of a flat plate, on which a slide 12 is arranged. The slide plate 15 is installed in the slide 12 of the bottom plate 11 and slides under the guidance of the slide 12, that is, the size of the slide plate 15 is adapted to the size of the slide 12, for example, the width of the slide plate 15 is equal to or slightly smaller than the width of the slide 12, and the length of the slide plate 15 is smaller than the length of the slide 12, so that the slide plate 15 can slide in the slide 12 along the length direction of the slide 12. The slide plate 15 has a mounting position for fixing a test seat, and the test seat is used to load a discrete Hall device 40 to be tested, that is, the test platform can achieve the fixation and directional movement of the discrete Hall device 40 to be tested.

[0027] The magnetic ring assembly includes an open magnetic ring 21 and a winding 22. The open magnetic ring 21 can be made of a material with a relatively high magnetic permeability (e.g., manganese-zinc ferrite, iron powder core, etc.), and the whole can be in a C-shape or a frame shape with a notch, etc. The winding 22 is wound on the open magnetic ring 21 and is used to generate a magnetic field in the open magnetic ring 21, that is, when the winding 22 is energized, a magnetic field is generated in the open magnetic ring 21 under the action of electromagnetic induction. Specifically, the winding 22 can include a wire frame (e.g., made of insulating material and sleeved on the open magnetic ring 21) and an enameled wire wound on the wire frame, and the enameled wire can be connected to a controllable power supply. By adjusting the current input to the enameled wire, the field strength of the magnetic field in the open magnetic ring 21 can be controlled. In addition, by designing the number of winding turns of the enameled wire, the effect of small current and large magnetic field can be achieved.

[0028] The open magnetic ring 21 includes a detection port 211, and the open magnetic ring 21 is fixed on the bottom plate 11 in such a way that the detection port 211 is located above the slide 12, and the discrete Hall device 40 to be tested installed in the test seat on the mounting position is pushed into the detection port 211 following the slide plate 15, and generates a corresponding output voltage according to the magnetic field in the detection port 211. By controlling the current input to the enameled wire, a magnetic field of corresponding field strength is generated in the detection port 211, and the output of the discrete Hall device 40 to be tested is converted with the current input to the enameled wire, the parameters of the discrete Hall device 40 to be tested can be obtained, thereby confirming whether the discrete Hall device 40 to be tested meets the design parameters.

[0029] Since the discrete Hall device 40 to be tested is loaded on the test socket on the mounting position of the slide plate 15, and the slide plate 15 moves in a directional manner under the guidance of the slide 12, the discrete Hall device 40 to be tested maintains an unchanged posture during the process of moving into the detection port 211, thereby improving the consistency and stability of the detection results of the discrete Hall device 40 to be tested.

[0030] In one embodiment of the utility model, the electrical performance test device of the discrete Hall device includes a test socket, which specifically includes a first connector 32 for plugging in the discrete Hall device 40 to be tested, and the first connector 32 includes a plurality of plug holes, each of which has an electrical connection structure, and the plurality of plug holes respectively correspond to a plurality of pins of the discrete Hall device 40 to be tested, for example, the first connector 32 includes three plug holes, and the three plug holes respectively correspond to a positive voltage pin, an output pin, and a negative voltage pin. The first connector 32 can specifically adopt the conventional structure in the art, which will not be described in detail here.

[0031] In the above manner, the discrete Hall device can be assembled to the test socket by plugging and unplugging, avoiding welding operations or other complex electrical connection operations, and ensuring the stability of the discrete Hall device fixation, greatly improving the convenience of discrete Hall device testing.

[0032] In one embodiment of the utility model, the above-mentioned test socket includes, in addition to the first connector 32, a printed circuit board 31 (Printed Circuit Board, PCB) and a second connector (not shown in the figure), wherein the printed circuit board 31 has a conductive circuit (the conductive circuit may include a signal processing module, etc.), the first connector 32 and the second connector are respectively soldered to the printed circuit board and electrically connected to the conductive circuit, that is, the first connector 32 and the second connector are electrically connected through the conductive circuit in the printed circuit board 31, and the test socket is connected to the external detection equipment through the second connector, so that the detection signal of the discrete Hall device can be output to the external detection equipment.

[0033] When it is necessary to perform electrical performance testing on a discrete Hall device, the printed circuit board 31 can be first fixed to the slide board 15 (for example, by screws), and then the discrete Hall device to be tested can be plugged into the first connector 32. Then, the slide board 15 is pushed so that the discrete Hall device to be tested reaches the detection port 211 of the open magnetic ring 21, and the test signal of the discrete Hall device is exported to an external detection device by the first connector 32, the printed circuit board 31 and the second connector, thereby realizing electrical performance testing of the discrete Hall device.

[0034] In one embodiment of the utility model, the above-mentioned open magnetic ring 21 includes two parallel end faces, the detection port 211 is located between the two end faces, and when the discrete Hall device 40 to be tested is pushed into the detection port 211 following the slide plate 15, the working surface of the discrete Hall device 40 to be tested is parallel to the end face of the open magnetic ring 21. Specifically, when the test socket is fixed, the arrangement direction of the plug holes on the first connector 32 can be parallel to the end faces on both sides of the detection port 211, so that when the discrete Hall device 40 to be tested is plugged into the first connector 32, its working surface is parallel to the end face. The above method is used to improve the accuracy of the detection result and avoid complex compensation calculations.

[0035] In one embodiment of the utility model, the area of ​​the end face of the open magnetic ring 21 is not less than 50 times the area of ​​the working face of the discrete Hall device 40 to be tested. Since there is a stable magnetic field within the detection port 211 of the open magnetic ring 21, through the above structure, even if there is a certain deviation in the height of the test discrete Hall device 40 plugged into the first connector 32 and / or there is a certain deviation in the distance pushed by the slide plate 15, the consistency and stability of the test output value of the discrete Hall device 40 to be tested can still be guaranteed.

[0036] In particular, the end face of the open magnetic ring 21 is rectangular, and the size of the end face is not less than 3×3 mm; the distance d between the two end faces is not less than 10 mm. Figure 3 With this structure, the magnetic field in the detection port 211 is relatively uniform, and the discrete Hall device 40 to be tested can be easily inserted into the detection port 211 .

[0037] In one embodiment of the utility model, the above-mentioned discrete Hall device electrical performance test device further includes a magnetic ring fixing frame 23, which can be made of insulating material and is in an "Ω" shape. The open magnetic ring 21 is fixed to the edge of the bottom plate 11 through the magnetic ring fixing frame 23, and the part where the detection port 211 of the open magnetic ring 21 is located is located above the bottom plate 11, and the part where the winding 22 is located protrudes from the edge of the bottom plate 11. In order to ensure the stability of the fixation, the open magnetic ring 21 can be fixed by multiple magnetic ring fixing frames 23.

[0038] Since the portion where the winding 22 is located protrudes from the edge of the base plate 11, a portion of the winding 22 can protrude below the base plate 11, thereby preventing the detection port 211 on the open magnetic ring 21 from protruding too high from the upper surface of the base plate 11, affecting the electrical performance detection of the discrete Hall device.

[0039] In an embodiment of the present invention, the bottom plate 11 has strip-shaped through holes, and the slideway 12 is formed by the strip-shaped through holes.

[0040] Correspondingly, the bottom plate 11 has a slide lower plate 13 and a slide upper plate 14, wherein the slide lower plate 13 is fixed to the lower surface of the bottom plate 11 and protrudes from the two side edges below the strip-shaped through hole, and the slide upper plate 14 is fixed to the upper surface of the bottom plate 11 and protrudes from the two side edges above the strip-shaped through hole; the slide plate 15 is installed in the strip-shaped through hole and is limited by the slide lower plate 13 and the slide upper plate 14, that is, the two side edges of the slide plate 15 are clamped between the slide lower plate 13 and the slide upper plate 14, so as to avoid escaping from the strip-shaped through hole.

[0041] Compared with the method of setting the slideway 12 on the upper surface of the bottom plate 11, since the slideway plate 15 is only in contact with the slideway lower plate 13 on two sides, the sliding friction of the sliding plate 15 is reduced, so that the slideway plate 15 slides more smoothly. Of course, in actual applications, the slideway 12 can also be formed in other ways.

[0042] In addition, a slide handle 16 can be provided on the slide plate 15. The slide handle 16 protrudes from the top surface of the slide upper plate 14, and the slide plate 15 is pushed to slide in the slide 12 by the slide handle 16, thereby making it easier to push the slide plate 15, thereby ensuring smooth movement of the discrete Hall device to be tested.

[0043] The above is only a preferred specific implementation of the utility model, but the protection scope of the utility model is not limited thereto. Any changes or substitutions that can be easily thought of by a person skilled in the art within the technical scope disclosed by the utility model should be included in the protection scope of the utility model. Therefore, the protection scope of the utility model should be based on the protection scope of the claims.

Claims

1. An electrical performance test device for a discrete Hall device, characterized in that: include: The test platform comprises a bottom plate and a slide plate, wherein the bottom plate is provided with a slide, the slide plate is installed in the slide and slides under the guidance of the slide, and the slide plate has a mounting position for fixing the test seat; A magnetic ring assembly comprises an open magnetic ring and a winding, wherein the winding is wound on the open magnetic ring and is used to generate a magnetic field in the open magnetic ring; the open magnetic ring comprises a detection port, and the open magnetic ring is fixed to the base plate in such a way that the detection port is located above the slide, and a discrete Hall device to be tested installed in a test socket on the mounting position is pushed into the detection port following the slide plate.

2. The electrical performance testing device of a discrete Hall device according to claim 1, characterized in that: The test device comprises a test socket, which comprises a first connector for plugging in a discrete Hall device to be tested, wherein the first connector comprises a plurality of plug holes, and the plurality of plug holes respectively correspond to a plurality of pins of the discrete Hall device to be tested.

3. The electrical performance testing device of a discrete Hall device according to claim 2, characterized in that: The test socket comprises a printed circuit board and a second connector for connecting an external detection device. The printed circuit board has a conductive circuit inside. The first connector and the second connector are respectively welded on the printed circuit board and are respectively electrically connected to the conductive circuit.

4. The electrical performance testing device of a discrete Hall device according to any one of claims 1 to 3, characterized in that: The open magnetic ring includes two end faces parallel to each other, the detection port is located between the two end faces, and when the discrete Hall device to be tested is pushed into the detection port following the slide plate, the working surface of the discrete Hall device to be tested is parallel to the end face of the open magnetic ring.

5. The electrical performance testing device of a discrete Hall device according to claim 4, characterized in that: The area of ​​the end surface of the open magnetic ring is not less than 50 times the area of ​​the working surface of the discrete Hall device to be tested.

6. The electrical performance testing device of a discrete Hall device according to claim 5, characterized in that: The end surface is rectangular, and the size of the end surface is not less than 3×3 mm; the distance between the two end surfaces is not less than 10 mm.

7. The electrical performance testing device of a discrete Hall device according to any one of claims 1 to 3, characterized in that: The testing device comprises a magnetic ring fixing frame, the open magnetic ring is fixed to the edge of the bottom plate through the magnetic ring fixing frame, and the part where the detection port of the open magnetic ring is located is located above the bottom plate, and the part where the winding is located protrudes from the edge of the bottom plate.

8. The electrical performance testing device of a discrete Hall device according to any one of claims 1 to 3, characterized in that: The bottom plate is provided with strip-shaped through holes, and the slideway is formed by the strip-shaped through holes.

9. The electrical performance testing device of a discrete Hall device according to claim 8, characterized in that: The bottom plate is provided with a slide lower plate and a slide upper plate, the slide lower plate is fixed to the lower surface of the bottom plate and protrudes from the two side edges below the strip-shaped through hole, the slide upper plate is fixed to the upper surface of the bottom plate and protrudes from the two side edges above the strip-shaped through hole; the slide plate is installed in the strip-shaped through hole and is limited by the slide lower plate and the slide upper plate.

10. The electrical performance testing device of a discrete Hall device according to claim 9, characterized in that: The slide plate is provided with a slide handle, the slide handle protrudes from the top surface of the slide upper plate, and the slide plate is pushed by the slide handle to slide in the slide.

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