Fixing tool for testing non-contact strip chip

Abstract

The utility model relates to the technical field of strip chip testing, and discloses a fixing tool for non-contact strip chip testing, which is characterized by comprising a fixed base plate, a strip track backing plate, a probe mounting plate and a probe plate driving mechanism, the test driving mechanism comprises a driving mounting frame and a driving telescopic rod, the bottom end of the driving mounting frame is fixedly connected with the bottom end of the fixed base plate, the top end of the driving mounting frame is fixedly connected with the top end of the driving telescopic rod, and the bottom end of the driving telescopic rod is fixedly connected with one end of the probe mounting plate; the bottom end of the strip track base plate is fixedly connected with the top surface of the fixed base plate, the strip track base plate is arranged below the other end of the probe mounting plate, the top of the strip track base plate is provided with a limiting track groove matched with a non-contact strip chip, and the probe mounting plate is provided with a plurality of probe mounting holes at positions corresponding to the limiting track groove. And elastic probes are arranged in the probe mounting holes and are used for connecting chip contacts on the non-contact strip chip.

Description

Technical Field

[0001] The utility model relates to the technical field of strip chip testing, and more specifically, to a fixing tool for testing non-connected strip chips. Background Art

[0002] IC card, also known as smart card, is a card made by embedding a microelectronic chip in a card base that complies with ISO7816 standard. IC card is increasingly used in identity authentication, banking, telecommunications, public transportation, parking lot management and other fields due to its inherent information security, portability and relatively complete standardization. However, the batch pre-personalization production and testing of IC cards make many small and medium-sized enterprises feel tormented.

[0003] During the production and processing of non-contact strip chips on the market, during the process of information filling and chip testing of non-contact strip chips, corresponding chip tests need to be performed. The testing process involves the fixation of the non-contact strip chips. Since the non-contact strip chips are packaged in strips and are light in weight, the chips contained in them are small in size and the corresponding chip contact structure has low strength, which makes it difficult to fix the non-contact strip chips without damage during the testing process. If the chips cannot be accurately fixed, the test results will be inaccurate, or the test staff will be required to repeatedly adjust the position of the non-contact strip chips, reducing the actual test efficiency. Utility Model Content

[0004] The utility model aims to provide a fixing tool for testing a non-jointed strip chip, which has a simple structure, low manufacturing cost, and is easy to operate, and can conveniently and accurately fix the non-jointed strip chip, thus facilitating practical application.

[0005] The above technical purpose of the utility model is achieved through the following technical solutions: a fixed fixture for non-contact strip chip testing, comprising: a fixed base plate, a strip track pad, a probe mounting plate, and a probe plate driving mechanism;

[0006] The test drive mechanism comprises a drive mounting frame and a drive telescopic rod, wherein the bottom end of the drive mounting frame is fixedly connected to the bottom end of the fixed base plate, the top end of the drive mounting frame is fixedly connected to the top end of the drive telescopic rod, and the bottom end of the drive telescopic rod is fixedly connected to one end of the probe mounting plate;

[0007] The bottom end of the strip track pad is fixedly connected to the top surface of the fixed base plate, and the strip track pad is arranged below the other end of the probe mounting plate. The top of the strip track pad is provided with a limiting track groove matching the non-contact strip chip, and the probe mounting plate is provided with a plurality of probe mounting holes at positions corresponding to the limiting track grooves. Elastic probes are provided in the probe mounting holes, and the elastic probes are used to connect the chip contacts on the non-contact strip chip.

[0008] As a preferred technical solution of the utility model, the strip rail pad is provided with a mounting through hole, and a screw is provided in the mounting through hole, and the screw passes through the mounting through hole to be fixedly connected to the top surface of the fixed base plate.

[0009] As a preferred technical solution of the utility model, a plurality of positioning columns are arranged on the outside of the probe mounting plate on the bottom surface of the limiting track groove, and the positioning columns are used to pass through the positioning holes of the non-contact strip chip to position the non-contact strip chip.

[0010] As a preferred technical solution of the utility model, a positioning protrusion is provided at the bottom of the limiting track groove below the probe mounting plate, and the positioning protrusion corresponds to the position of the positioning hole of the non-connected strip chip.

[0011] As a preferred technical solution of the utility model, a plurality of elastic pressing columns are further provided on the bottom surface of the probe installation plate, and the elastic pressing columns are arranged at the edge of the bottom surface of the limiting track groove.

[0012] As a preferred technical solution of the utility model, the drive mounting frame includes a transverse frame plate and a longitudinal frame plate, the bottom end of the longitudinal frame plate is fixedly connected to the top surface of the fixed base plate, the top end of the longitudinal frame plate is fixedly vertically connected to one end of the transverse frame plate, and the top end of the drive telescopic rod is vertically fixedly connected to the bottom surface of the transverse frame plate.

[0013] As a preferred technical solution of the utility model, the test drive mechanism is also provided with two driving rail rods, the top ends of the two driving rail rods are respectively connected to the bottom surface of the horizontal frame plate, the two driving rail rods are arranged on both sides of the driving telescopic rod, and the probe mounting plate is provided with a rail through-hole, and the bottom end of the driving rail rod passes through the rail through-hole and is fixedly connected to the top surface of the fixed base plate.

[0014] As a preferred technical solution of the present utility model, the probe mounting plate is a transparent plate.

[0015] In summary, the utility model has the following beneficial effects: when it is actually necessary to test the non-contact strip chip, the non-contact strip chip is placed in the limiting track groove of the strip track pad, the non-contact strip chip is roughly positioned through the limiting track groove, and the position of the non-contact strip chip is adjusted according to the position of the test probe, and then the test drive mechanism is controlled to control the extension of the telescopic rod, driving the probe mounting plate to move down until the test probe presses against the chip contacts on the non-contact strip chip, thereby achieving the fixation of the non-contact strip chip, and at the same time enabling the test probe to complete the crimping with the chip contacts of the non-contact strip chip, which is convenient for subsequent testing. The fixing tool of the utility model has a simple structure, low manufacturing cost, and is easy to operate. It can conveniently and accurately fix the non-contact strip chip, is convenient for practical application, and reduces the impact on test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 It is a structural schematic diagram of the utility model;

[0017] Figure 2 It is a schematic diagram of the strip track pad of the utility model.

[0018] In the figure: 1. Fixed base plate; 2. Strip track pad; 3. Probe mounting plate; 4. Driving telescopic rod; 5. Limiting track groove; 6. Elastic probe; 7. Screw; 8. Positioning column; 9. Positioning protrusion; 10. Elastic downward pressure column; 11. Horizontal frame plate; 12. Longitudinal frame plate; 13. Driving track rod. DETAILED DESCRIPTION

[0019] In order to make the purpose, technical solutions and advantages of the embodiments of the utility model clearer, the technical solutions in the embodiments of the utility model will be clearly and completely described below in conjunction with the drawings in the embodiments of the utility model. Obviously, the described embodiments are part of the embodiments of the utility model, not all of the embodiments. Therefore, the following detailed description of the embodiments of the utility model provided in the drawings is not intended to limit the scope of the utility model for which protection is sought, but merely represents the selected embodiments of the utility model. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the utility model.

[0020] like Figure 1 and 2 As shown, the utility model provides a fixing fixture for non-connected strip chip testing, comprising: a fixing base plate 1, a strip track pad 2, a probe mounting plate 3, and a probe plate driving mechanism;

[0021] The test drive mechanism includes a drive mounting frame and a drive telescopic rod 4. The bottom end of the drive mounting frame is fixedly connected to the bottom end of the fixed base plate 1, the top end of the drive mounting frame is fixedly connected to the top end of the drive telescopic rod 4, and the bottom end of the drive telescopic rod 4 is fixedly connected to one end of the probe mounting plate 3. When the drive telescopic rod 4 is shortened, the probe mounting plate 3 is driven to rise, and when the drive telescopic rod 4 is extended, the probe mounting plate 3 is driven to descend to perform pressure-contact connection between the elastic probe 6 and the chip contact.

[0022] The bottom end of the strip track pad 2 is fixedly connected to the top surface of the fixed base plate 1. The strip track pad 2 is arranged below the other end of the probe mounting plate 3. The top of the strip track pad 2 is provided with a limit track groove 5 that matches the non-contact strip chip. The limit track groove 5 can limit the position of the non-contact strip chip, so that the position of the non-contact strip chip can be determined in one direction. In actual operation, only another direction needs to be adjusted, which can reduce the adjustment range, improve the position accuracy and improve the efficiency of chip positioning. The probe mounting plate 3 is provided with a plurality of probe mounting holes at the position corresponding to the limit track groove 5. The probe mounting hole is provided with an elastic probe 6. The elastic probe 6 is used to connect the chip contact on the non-contact strip chip. The lower part of the probe mounting hole is the active end of the elastic probe 6. The upper part of the probe mounting hole can connect the corresponding line, which is convenient for the actual wiring operation. The upper and lower ends of the elastic probe 6 are isolated through the probe mounting plate 3 to reduce the influence of the line on the active end of the elastic probe 6, which is convenient for practical application.

[0023] The working principle, use process and technical advantages of the non-contact strip chip test fixture of the utility model are: when the non-contact strip chip needs to be tested, the non-contact strip chip is placed in the limit track groove 5 of the strip track pad 2, and the non-contact strip chip is roughly positioned through the limit track groove 5, and the position of the non-contact strip chip is adjusted according to the position of the test probe, and then the test drive mechanism is controlled to control the extension of the telescopic rod 4, driving the probe mounting plate 3 to move downward until the test probe presses the chip contact on the non-contact strip chip, thereby achieving the fixation of the non-contact strip chip, and at the same time enabling the test probe to complete the crimping with the chip contact of the non-contact strip chip, which is convenient for subsequent testing. The utility model fixing fixture has a simple structure, low manufacturing cost, and is easy to operate. It can conveniently and accurately fix the non-contact strip chip, which is convenient for practical low-cost application.

[0024] As an embodiment of the utility model, a mounting through hole is provided on the strip rail pad 2, and a screw 7 is provided in the mounting through hole. The screw 7 passes through the mounting through hole and is fixedly connected to the top surface of the fixed base plate 1 to realize the installation connection between the strip rail pad 2 and the fixed base plate 1.

[0025] As an embodiment of the utility model, a plurality of positioning posts 8 are arranged on the bottom surface of the limiting track groove 5 on the outside of the probe mounting plate 3. The positioning posts 8 are used to pass through the positioning holes of the non-contact strip chip to position the non-contact strip chip. The non-contact strip chip includes a plurality of chip bodies distributed in a neat array. Connecting plates are arranged between the chips, and the connecting plates are provided with positioning holes. Positioning can be achieved by fitting the positioning holes on the positioning posts 8.

[0026] Furthermore, a positioning protrusion 9 is provided at the bottom of the limiting track groove 5 below the probe mounting plate 3. The positioning protrusion 9 corresponds to the position of the positioning hole of the non-connected strip chip and is used to limit all the positioning holes between the chips below the probe mounting hole, thereby greatly improving the positioning accuracy of the non-connected strip chip.

[0027] As an embodiment of the utility model, a plurality of elastic pressure columns 10 are further provided on the bottom surface of the probe mounting plate 3. The elastic pressure columns 10 are arranged at the edge position of the bottom surface of the limiting track groove 5. The elastic pressure columns 10 are longer than the elastic probes 6. Before the elastic probes 6 contact the chip, the non-contact strip chip can be fixed and flattened, which facilitates the subsequent accurate and tight crimping of the elastic probes 6 with the contacts on the non-contact strip chip, and can also play a buffering role for the elastic probes 6.

[0028] As an embodiment of the utility model, the driving mounting frame includes a transverse frame plate 11 and a longitudinal frame plate 12, the bottom end of the longitudinal frame plate 12 is fixedly connected to the top surface of the fixed base plate 1, the top end of the longitudinal frame plate 12 is fixedly vertically connected to one end of the transverse frame plate 11, and the top end of the driving telescopic rod 4 is vertically fixedly connected to the bottom surface of the transverse frame plate 11.

[0029] Furthermore, the test drive mechanism is also provided with two driving rail rods 13, the top ends of the two driving rail rods 13 are respectively connected to the bottom surface of the horizontal frame plate 11, the two driving rail rods 13 are arranged on both sides of the driving telescopic rod 4, and the probe mounting plate 3 is provided with a rail through hole, and the bottom end of the driving rail rod 13 passes through the rail through hole and is fixedly connected to the top surface of the fixed base plate 1, so that the probe mounting plate 3 can move stably when moving up and down.

[0030] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. For those skilled in the art, the present invention may have various modifications and changes. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A fixture for testing non-connected strip chips, characterized by: include: A fixed base plate (1), a strip track pad (2), a probe mounting plate (3), and a probe plate driving mechanism; The test drive mechanism comprises a drive mounting frame and a drive telescopic rod (4), wherein the bottom end of the drive mounting frame is fixedly connected to the bottom end of the fixed base plate (1), the top end of the drive mounting frame is fixedly connected to the top end of the drive telescopic rod (4), and the bottom end of the drive telescopic rod (4) is fixedly connected to one end of the probe mounting plate (3); The bottom end of the strip track pad (2) is fixedly connected to the top surface of the fixed base plate (1); the strip track pad (2) is arranged below the other end of the probe mounting plate (3); a limiting track groove (5) matching the non-contact strip chip is arranged on the top of the strip track pad (2); the probe mounting plate (3) is provided with a plurality of probe mounting holes at positions corresponding to the limiting track groove (5); elastic probes (6) are arranged in the probe mounting holes; the elastic probes (6) are used to connect chip contacts on the non-contact strip chip.

2. The fixture for testing a non-contacted chip according to claim 1, characterized in that: The strip track pad (2) is provided with a mounting through hole, in which a screw (7) is provided, and the screw (7) passes through the mounting through hole to be fixedly connected to the top surface of the fixed base plate (1).

3. The fixture for testing a non-contacted chip according to claim 2, characterized in that: A plurality of positioning posts (8) are arranged on the bottom surface of the limiting track groove (5) on the outside of the probe mounting plate (3), and the positioning posts (8) are used to pass through the positioning holes of the non-contact strip chip to position the non-contact strip chip.

4. The fixture for testing a non-contacted chip according to claim 3, characterized in that: A positioning protrusion (9) is provided at the bottom of the limiting track groove (5) below the probe mounting plate (3), and the positioning protrusion (9) corresponds to the position of the positioning hole of the non-connected strip chip.

5. The fixture for testing a non-contacted chip according to claim 4, characterized in that: The bottom surface of the probe mounting plate (3) is also provided with a plurality of elastic downward pressing columns (10), and the elastic downward pressing columns (10) are arranged at the edge of the bottom surface of the limiting track groove (5).

6. The fixture for testing a non-contacted chip according to claim 5, characterized in that: The driving mounting frame comprises a transverse frame plate (11) and a longitudinal frame plate (12), the bottom end of the longitudinal frame plate (12) is fixedly connected to the top surface of the fixed base plate (1), the top end of the longitudinal frame plate (12) is fixedly connected vertically to one end of the transverse frame plate (11), and the top end of the driving telescopic rod (4) is fixedly connected vertically to the bottom surface of the transverse frame plate (11).

7. The fixture for testing a non-contacted chip according to claim 6, characterized in that: The test drive mechanism is also provided with two drive track rods (13), the top ends of the two drive track rods (13) are respectively connected to the bottom surface of the horizontal frame plate (11), the two drive track rods (13) are arranged on both sides of the drive telescopic rod (4), the probe mounting plate (3) is provided with a track through hole, and the bottom end of the drive track rod (13) passes through the track through hole and is fixedly connected to the top surface of the fixed base plate (1).

8. The fixture for testing a non-contacted chip according to claim 7, characterized in that: The probe mounting plate (3) is a transparent plate.

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