Capacitance magnetic bead test fixture and test tool

Abstract

The utility model is suitable for the technical field of semiconductors, and provides a capacitor magnetic bead test fixture and a test tooling, and the test fixture comprises a fixed plate and a movable plate. The fixing plate is provided with at least one first preformed hole used for placing a to-be-tested capacitance magnetic bead, and the first preformed hole is internally provided with a first wiring terminal. The movable plate is provided with at least one second preformed hole corresponding to the positions of the first preformed holes, and the second preformed hole is internally provided with a second wiring terminal; and the first wiring terminal and the second wiring terminal with corresponding positions are used for connecting a test device to form a test loop. The test fixture provided by the utility model is convenient for fixing the capacitance magnetic bead, facilitates the subsequent test of the capacitance magnetic bead, and can also shorten the test time.

Description

Technical Field

[0001] The present application belongs to the field of semiconductor technology, and in particular relates to a capacitor magnetic bead test fixture and a test tool. Background Art

[0002] Capacitor beads are welded on both ends of the capacitor iron shell, and the capacitor core lead wires are led out from the beads. The capacitor beads play the role of insulating the core and the shell. In actual production, poor insulation between the core and the shell often occurs. After investigation, it is found that the insulation performance of the capacitor beads is unqualified. Therefore, it is necessary to perform insulation testing on the capacitor beads. Due to the special shape and structure of the capacitor beads, it is not easy to fix and test, and it takes a long time to test them one by one. Therefore, it is necessary to develop a capacitor bead test fixture. Utility Model Content

[0003] In order to overcome the problem that capacitor beads are inconvenient to fix and test, and that testing them one by one takes a long time, an embodiment of the present application provides a capacitor bead test fixture and a test tool.

[0004] This application is implemented through the following technical solutions:

[0005] In a first aspect, an embodiment of the present application provides a capacitor magnetic bead test fixture, comprising: a fixed plate and a movable plate;

[0006] The fixing plate is provided with at least one first reserved hole for placing the capacitor magnetic bead to be tested, and the first reserved hole is provided with a first wiring terminal;

[0007] The movable plate is provided with at least one second reserved hole corresponding to the position of each of the first reserved holes, and a second wiring terminal is provided in the second reserved hole;

[0008] The first wiring terminal and the second wiring terminal corresponding to each other in position are used to connect a test device to form a test loop.

[0009] In some embodiments, the fixing plate includes an upper base plate and a lower base plate;

[0010] The upper base plate and the lower base plate are connected via a spring support mechanism, the upper base plate is provided with at least one first reserved hole, one end of the first wiring terminal is fixed on the lower base plate, and the other end extends into the first reserved hole.

[0011] In some embodiments, the spring support mechanism includes at least one support column and a spring;

[0012] The at least one supporting column passes through the fixed plate and the movable plate, and the movable plate can move up and down along the supporting column;

[0013] The spring is located on a support column between the upper base plate and the lower base plate.

[0014] In some embodiments, the moving plate includes a lower moving plate and an upper moving plate;

[0015] The lower movable plate and the upper movable plate are connected via a spring support mechanism, the lower movable plate is provided with at least one second reserved hole, one end of the second wiring terminal is fixed to the upper movable plate, and the other end extends into the second reserved hole.

[0016] In some embodiments, the spring support mechanism includes at least one support column and a spring;

[0017] The at least one supporting column passes through the fixed plate and the movable plate, and the movable plate can move up and down along the supporting column;

[0018] The spring is located on a supporting column between the lower moving plate and the upper moving plate.

[0019] In some embodiments, the test fixture further comprises: a stepping mechanism;

[0020] The stepping mechanism is connected to the moving plate and is used to control the moving plate to move up and down.

[0021] In some embodiments, the test fixture further comprises a test wiring board;

[0022] The first wiring terminal and the second wiring terminal are both connected to the test wiring board through wires;

[0023] The test wiring board is used to connect with the test device to form the test loop.

[0024] In some embodiments, the fixed plate and the movable plate are both made of insulating materials.

[0025] In some embodiments, the first connecting terminal and the second connecting terminal are both made of brass.

[0026] In a second aspect, an embodiment of the present application provides a capacitor bead test tool, including: a test fixture and a test device as described in any one of the first aspects above;

[0027] The first wiring terminal and the second wiring terminal corresponding to the position on the test fixture are respectively connected to the test device to form a test loop.

[0028] It can be understood that the beneficial effects of the second aspect mentioned above can be found in the relevant description of the first aspect mentioned above, and will not be repeated here.

[0029] Compared with the related art, the embodiments of the present application have the following beneficial effects: the magnetic bead to be tested is placed in the first reserved hole of the test fixture described in the embodiments of the present application, and then the movable plate and the fixed plate are pressed tightly, and then the capacitor magnetic bead to be tested is pressed tightly, so that the capacitor magnetic bead to be tested is in close contact with the first terminal and the second terminal respectively, and then the test device is connected to the first terminal and the second terminal to form a complete test circuit to test the insulation of the capacitor magnetic bead to be tested. The capacitor magnetic bead test fixture provided in the embodiments of the present application can simplify the test process of the capacitor magnetic bead to be tested, and because the test fixture can be provided with multiple groups of terminals, multiple magnetic beads to be tested can be clamped at the same time, thereby performing batch testing and shortening the test time.

[0030] It is to be understood that the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the present specification. BRIEF DESCRIPTION OF THE DRAWINGS

[0031] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the embodiments or related technical descriptions will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative labor.

[0032] Figure 1 It is a structural schematic diagram of a capacitor magnetic bead test fixture provided in one embodiment of the present application;

[0033] Figure 2 is a structural schematic diagram of a fixing plate provided in one embodiment of the present application;

[0034] Figure 3 is a structural schematic diagram of a mobile plate provided in an embodiment of the present application;

[0035] Figure 4 is a schematic structural diagram of a first wiring terminal provided in an embodiment of the present application;

[0036] Figure 5 It is a schematic diagram of the structure of a second terminal provided in one embodiment of the present application. DETAILED DESCRIPTION

[0037] In the following description, specific details such as specific system structures, technologies, etc. are provided for the purpose of illustration rather than limitation, so as to provide a thorough understanding of the embodiments of the present application. However, it should be clear to those skilled in the art that the present application may also be implemented in other embodiments without these specific details. In other cases, detailed descriptions of well-known systems, devices, circuits, and methods are omitted to prevent unnecessary details from obstructing the description of the present application.

[0038] It should be understood that when used in the present specification and the appended claims, the term "comprising" indicates the presence of described features, wholes, steps, operations, elements and / or components, but does not exclude the presence or addition of one or more other features, wholes, steps, operations, elements, components and / or combinations thereof.

[0039] It should also be understood that the term “and / or” used in the specification and appended claims refers to any and all possible combinations of one or more of the associated listed items, and includes these combinations.

[0040] As used in the specification and appended claims of this application, the term "if" can be interpreted as "when" or "uponce" or "in response to determining" or "in response to detecting", depending on the context. Similarly, the phrase "if it is determined" or "if [described condition or event] is detected" can be interpreted as meaning "uponce it is determined" or "in response to determining" or "uponce [described condition or event] is detected" or "in response to detecting [described condition or event]", depending on the context.

[0041] In addition, in the description of the present application specification and the appended claims, the terms "first", "second", "third", etc. are only used to distinguish the descriptions and cannot be understood as indicating or implying relative importance.

[0042] References to "one embodiment" or "some embodiments" etc. described in the specification of this application mean that one or more embodiments of the present application include specific features, structures or characteristics described in conjunction with the embodiment. Therefore, the statements "in one embodiment", "in some embodiments", "in some other embodiments", "in some other embodiments", etc. that appear in different places in this specification do not necessarily refer to the same embodiment, but mean "one or more but not all embodiments", unless otherwise specifically emphasized in other ways. The terms "including", "comprising", "having" and their variations all mean "including but not limited to", unless otherwise specifically emphasized in other ways.

[0043] The capacitor beads are welded to both ends of the capacitor iron shell, and the capacitor core lead wires are led out from the beads. The capacitor beads play the role of insulating the core and the shell. In actual production, there is often poor insulation between the core and the shell. After investigation, it is found that the insulation performance of the capacitor beads is unqualified, so the capacitor beads need to be tested for insulation. However, the special shape and structure of the capacitor beads make it difficult to fix and test them, and it takes a long time to test them one by one.

[0044] Based on the above problems, an embodiment of the present application proposes a capacitor bead test fixture to fix the capacitor bead to facilitate subsequent insulation testing of the capacitor bead.

[0045] Figure 1 is a schematic diagram of the structure of a capacitor magnetic bead test fixture provided in an embodiment of the present application, referring to Figure 1 , the capacitor bead test fixture is described in detail:

[0046] The test fixture includes a fixed plate 1 and a movable plate 2 .

[0047] The fixing plate 1 is provided with at least one first reserved hole 101 for placing the capacitor bead to be tested, and a first wiring terminal 102 is provided in the first reserved hole 101 .

[0048] At least one second reserved hole 201 corresponding to the position of each first reserved hole 101 is provided on the movable plate 2 , and a second wiring terminal 202 is provided in the second reserved hole 201 .

[0049] The first wiring terminal 102 and the second wiring terminal 202 which are in corresponding positions are used to connect the test device to form a test loop.

[0050] It should be noted that the first wiring terminal 102 and the second wiring terminal 202, which are located opposite to each other, form a set of wiring terminals. Figure 1 As shown, the test fixture is equipped with 4 sets of terminals. To facilitate the distinction of capacitor beads in subsequent tests, the terminals of the test fixture can be marked with Figure 1 The "1 up", "1 down", "2 up", "2 down", "3 up", "3 down", "4 up" and "4 down" signs shown can be set according to actual conditions and actual needs.

[0051] In an embodiment of the present application, the magnetic bead to be tested is placed in the first reserved hole 101, and then the movable plate 2 is pressed against the fixed plate 1, and then the capacitor magnetic bead to be tested is pressed, so that the capacitor magnetic bead to be tested is in close contact with the first wiring terminal 102 and the second wiring terminal 202 respectively, and then the test device is connected to the first wiring terminal 102 and the second wiring terminal 202 to form a complete test loop, and the insulation of the capacitor magnetic bead to be tested can be tested by detecting the conduction of the test loop. The capacitor magnetic bead test fixture provided in the embodiment of the present application can simplify the test process of the capacitor magnetic bead to be tested, and since the test fixture can be provided with multiple groups of wiring terminals, the test fixture can clamp multiple magnetic beads to be tested at the same time, and then batch test is performed to shorten the test time.

[0052] Optional, see Figure 2 The fixed plate 1 includes an upper base plate 11 and a lower base plate 12 .

[0053] The upper base plate 11 and the lower base plate 12 are connected via a spring support mechanism 3 . The upper base plate 11 is provided with at least one first reserved hole 101 . One end of a first terminal 102 is fixed on the lower base plate, and the other end extends into the first reserved hole 101 .

[0054] Optionally, the spring support mechanism 3 includes at least one support column 31 and a spring 32 .

[0055] At least one supporting column 31 passes through the fixed plate 1 and the movable plate 2 , and the movable plate 2 can move up and down along the supporting column 31 .

[0056] The spring 32 is located on the support column 31 between the upper base plate 11 and the lower base plate 12 .

[0057] In an embodiment of the present application, when the capacitor bead to be tested is pressed by the fixed plate 1 and the movable plate 2, the lower base plate 12 is fixed, and the upper base plate 11 has a certain movable range through the spring 32, which can achieve buffering and ensure good contact.

[0058] Optional, see Figure 3 , the movable plate 2 includes a lower movable plate 21 and an upper movable plate 22;

[0059] The lower movable plate 21 and the upper movable plate 22 are connected by a spring support mechanism 3 . The lower movable plate 21 is provided with at least one second reserved hole 201 . One end of the second terminal 202 is fixed on the upper movable plate 22 , and the other end extends into the second reserved hole 201 .

[0060] Optionally, the spring 32 is located on the support column 31 between the lower moving plate 21 and the upper moving plate 22 .

[0061] In an embodiment of the present application, when the capacitor bead to be tested is pressed by the fixed plate 1 and the movable plate 2, the lower movable plate 21 and the upper movable plate 22 can both move within a certain range, and since a spring 32 is provided between the lower movable plate 21 and the upper movable plate 22, buffering can be achieved, thereby ensuring that the capacitor bead to be tested has good contact with the first terminal 102 and the second terminal 202, respectively.

[0062] It should be understood that the spring is provided to ensure a certain movable range between the upper base plate 11 and the lower base plate 12, and between the lower movable plate 21 and the upper movable plate 22, so as to press the capacitor bead to be tested so that it is in full contact with the first terminal 102 and the second terminal 202.

[0063] Optionally, the test fixture further includes: a stepping mechanism 4 .

[0064] The stepping mechanism 4 is connected to the moving plate 2 and is used to control the moving plate 2 to move up and down. The moving plate can be controlled more accurately through the stepping motor.

[0065] Optionally, the test fixture further includes a test wiring board 5 .

[0066] The first wiring terminal 102 and the second wiring terminal 202 are both connected to the test wiring board 5 through wires; the test wiring board 5 is used to connect to a test device to form a test loop.

[0067] Optionally, the test wiring board is provided with at least one set of test terminals, such as Figure 1 As shown, four groups of test terminals are provided on the test wiring board 5, and each group of terminals on the test fixture is connected one-to-one with each group of test terminals on the test wiring board 5 through wires. In order to facilitate the distinction of the tested capacitor beads in subsequent tests, each group of test terminals can be marked with the same mark as the mark next to each group of terminals.

[0068] In an embodiment of the present application, the magnetic bead to be tested is placed in the first reserved hole 101, and then the moving plate 2 is controlled to move downward by controlling the stepping mechanism 4 until the capacitive magnetic bead to be tested is pressed, so that the capacitive magnetic bead to be tested is in close contact with the first terminal 102 and the second terminal 202, respectively, and then the test device is connected to the corresponding test terminal on the test wiring board 5 to form a complete test circuit to test the insulation of the capacitive magnetic bead to be tested. The capacitive magnetic bead test fixture provided in the embodiment of the present application can simplify the test process of the capacitive magnetic bead to be tested, and since the test fixture can be provided with multiple groups of terminals, the test fixture can clamp multiple magnetic beads to be tested at the same time, and then batch test is performed to shorten the test time.

[0069] Optionally, the fixed plate 1 and the movable plate 2 are both made of insulating materials.

[0070] Optionally, the first wiring terminal 102 and the second wiring terminal 202 are both made of brass.

[0071] Optionally, the shapes and sizes of the first wiring terminal 102 and the second wiring terminal 202 may be the same or different. Figure 4 and Figure 5 As shown, the shapes of the first connecting terminal 102 and the second connecting terminal 202 are different.

[0072] Corresponding to the capacitor bead test fixture described in the above embodiment, the present application also proposes a capacitor bead test tool, which includes the above capacitor bead test fixture and a test device.

[0073] The first wiring terminal 102 and the second wiring terminal 202 corresponding to the position on the test fixture are respectively connected to the test device to form a test loop. For example, the insulation performance of the magnetic bead to be tested can be determined by detecting the current size in the test loop.

[0074] In an embodiment of the present application, the capacitor beads to be tested are fixedly clamped by the above-mentioned test fixture, and then the insulation test of the capacitor beads to be tested is performed by the test device, which can simplify the test process of the capacitor beads to be tested, and because the test fixture can be provided with multiple groups of wiring terminals, the test fixture can clamp multiple beads to be tested at the same time, thereby performing batch testing and reducing the test time.

[0075] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described or recorded in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0076] The embodiments described above are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, a person skilled in the art should understand that the technical solutions described in the aforementioned embodiments may still be modified, or some of the technical features may be replaced by equivalents. Such modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present application, and should all be included in the protection scope of the present application.

Claims

1. A capacitor bead test fixture, characterized in that: include: Fixed plates and movable plates; The fixing plate is provided with at least one first reserved hole for placing the capacitor magnetic bead to be tested, and the first reserved hole is provided with a first wiring terminal; The movable plate is provided with at least one second reserved hole corresponding to the position of each of the first reserved holes, and a second wiring terminal is provided in the second reserved hole; The first wiring terminal and the second wiring terminal corresponding to each other in position are used to connect a test device to form a test loop.

2. The capacitor bead test fixture as claimed in claim 1, characterized in that: The fixing plate comprises an upper base plate and a lower base plate; The upper base plate and the lower base plate are connected via a spring support mechanism, the upper base plate is provided with at least one first reserved hole, one end of the first wiring terminal is fixed on the lower base plate, and the other end extends into the first reserved hole.

3. The capacitor bead test fixture as claimed in claim 2, characterized in that: The spring support mechanism includes at least one support column and a spring; The at least one supporting column passes through the fixed plate and the movable plate, and the movable plate can move up and down along the supporting column; The spring is located on a support column between the upper base plate and the lower base plate.

4. The capacitor bead test fixture as claimed in claim 1, characterized in that: The movable plate comprises a lower movable plate and an upper movable plate; The lower movable plate and the upper movable plate are connected via a spring support mechanism, the lower movable plate is provided with at least one second reserved hole, one end of the second wiring terminal is fixed to the upper movable plate, and the other end extends into the second reserved hole.

5. The capacitor bead test fixture as claimed in claim 4, characterized in that: The spring support mechanism includes at least one support column and a spring; The at least one supporting column passes through the fixed plate and the movable plate, and the movable plate can move up and down along the supporting column; The spring is located on a supporting column between the lower moving plate and the upper moving plate.

6. The capacitor bead test fixture as claimed in claim 1, characterized in that: The test fixture further comprises: a stepping mechanism; The stepping mechanism is connected to the moving plate and is used to control the moving plate to move up and down.

7. The capacitor bead test fixture as claimed in claim 1, characterized in that: The test fixture also includes a test wiring board; The first wiring terminal and the second wiring terminal are both connected to the test wiring board through wires; The test wiring board is used to connect with the test device to form the test loop.

8. The capacitor bead test fixture as claimed in claim 1, characterized in that: The fixed plate and the movable plate are both made of insulating materials.

9. The capacitor bead test fixture as claimed in claim 1, characterized in that: The first wiring terminal and the second wiring terminal are both made of brass.

10. A capacitor bead test tool, characterized in that: The test tooling comprises a test fixture and a test device as described in any one of claims 1 to 9; The first wiring terminal and the second wiring terminal corresponding to the position on the test fixture are respectively connected to the test device to form a test loop.

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