Automatic sorting device for chip packaging test

Abstract

The utility model provides an automatic sorting device for chip packaging test, which relates to the technical field of sorting devices, and comprises a rack, the top of the rack is fixedly connected with two support plates, a top plate is arranged between the tops of the two support plates, the top of the top plate is provided with a sorting assembly and a driving assembly, the sorting assembly comprises a gear, and the gear is connected with the top of the rack. And the gears are rotationally connected to the top of the top plate, a rotating shaft is fixedly connected between the inner surface walls of the gears, and the rotating shaft movably penetrates through the top of the top plate and extends to the lower portion. The whole conveying channel is divided into the front channel and the rear channel through the first partition plate and the second partition plate, the classification plate can rotate forwards or backwards under the driving of the driving assembly and the classification assembly, so that tested chips are guided into different channels to be classified, and the chip sorting device is simple in design structure, low in manufacturing cost and high in practicability. And unqualified chips can be effectively removed.

Description

Technical Field

[0001] The utility model relates to the technical field of classification devices, in particular to an automatic classification device for chip packaging testing. Background Art

[0002] A chip is an integrated circuit formed by a large number of microelectronic components (transistors, resistors, capacitors, etc.) placed on a plastic substrate to make a chip. Chip packaging testing is a test to see if the chip packaging is qualified after the chip is packaged. It is a process that must be carried out for finished chips. After testing, the chips must be classified as qualified or unqualified.

[0003] Existing, such as China Patent No.: CN216880481U, a chip packaging test automatic classification device includes a test body, the left and right end surfaces of the test body are fixedly connected with a connecting plate, and the right end surface of the connecting plate is fixedly connected with a control center, the bottom surface of the connecting plate is fixedly connected with a trapezoidal plate, and the surface of the trapezoidal plate is fixedly connected with a rectangular plate, and the right end surface of the connecting plate is fixedly connected with an L plate. The utility model has a simple structure, is easy to operate, and is very suitable for popularization and use. Through the test body and the control center, it solves the problem that the existing chip detection is generally machine-detected and then manually selected, and the manual selection has low efficiency, high error rate, and high waste rate. By placing the chip to be tested on the top of the conveyor belt, starting the servo motor 2, the servo motor 2 drives the pulley 2 to rotate, and the pulley 1 is driven to rotate through the pulley 2, thereby driving the rotating roller and the conveyor belt to work, thereby improving work efficiency.

[0004] Although the above patent can solve the problem that the existing chip detection is generally machine detection and then manual selection, the manual selection is inefficient, and the error rate and waste rate are high. However, the existing chip detection and automatic removal of mixed unqualified products usually requires the use of a large number of electrical components, which is not only complex in structure but also high in cost. Therefore, in order to solve the above problems, we propose a new type of chip packaging test automatic classification device. Utility Model Content

[0005] The utility model mainly provides a chip packaging test automatic classification device which can automatically remove unqualified chip products and has a simple structure and low manufacturing cost.

[0006] In order to achieve the above-mentioned purpose, the utility model adopts the following technical scheme: an automatic classification device for chip packaging testing, comprising a frame, two support plates are fixedly connected to the top of the frame, a top plate is installed between the tops of the two support plates, a classification component and a drive component are arranged on the top of the top plate, the classification component comprises a gear, the gear is rotatably connected to the top of the top plate, a rotating shaft is fixedly connected between the inner surface walls of the gear, the rotating shaft movably passes through the top of the top plate and extends to the bottom, and a classification plate is fixedly connected to the outer surface of the rotating shaft near the bottom.

[0007] Compared with the prior art, the advantages and positive effects of the utility model are:

[0008] 1. In the utility model, the entire transmission channel is divided into two channels, front and rear, by the first partition plate and the second partition plate. Driven by the driving component and the classification component, the classification plate can rotate forward or backward, so as to guide the tested chips into different channel types for classification. The design has a simple structure and low cost, and can effectively remove unqualified chips.

[0009] 2. In the utility model, when the gear cooperates with the rotating shaft to drive the classification plate to rotate, the fixed rod on the top of the rotating shaft cooperates with the fixed shaft to synchronously drive the classification plate to rotate. This design enables the classification plate to be driven by two different points, making it more stable during operation. BRIEF DESCRIPTION OF THE DRAWINGS

[0010] Figure 1 A three-dimensional diagram of a chip packaging test automatic classification device proposed by the utility model;

[0011] Figure 2 The utility model proposes an expanded diagram of a chip packaging test automatic classification device;

[0012] Figure 3 Another perspective view of a chip packaging test automatic classification device proposed by the utility model;

[0013] Figure 4 A partial structural schematic diagram of a chip packaging test automatic classification device is proposed for the utility model;

[0014] Figure 5 The utility model provides a schematic diagram of the structure of a classification component of an automatic classification device for chip packaging testing;

[0015] Figure 6 The utility model provides a schematic diagram of the structure of a driving component of a chip packaging test automatic classification device;

[0016] Legend: 1. Frame; 11. Mounting frame; 12. Test equipment; 13. Discharge channel; 14. Second partition; 15. Support leg; 2. Motor; 21. Conveyor belt; 22. Support plate; 23. Top plate; 24. Notch; 25. First partition; 3. Classification component; 301. Gear; 302. Rotating shaft; 303. Fixed rod; 304. Classification plate; 305. Fixed shaft; 4. Drive component; 401. Fixed block; 402. Sliding rod; 403. Rack; 404. Connecting block; 405. Electric push rod. DETAILED DESCRIPTION

[0017] In order to more clearly understand the above-mentioned purpose, features and advantages of the utility model, the utility model is further described below in conjunction with the accompanying drawings and embodiments. It should be noted that the embodiments of the present application and the features in the embodiments can be combined with each other without conflict.

[0018] See also Figure 1-Figure 6 The utility model provides a technical solution: an automatic classification device for chip packaging testing, comprising a frame 1, wherein two support plates 22 are fixedly connected to the top of the frame 1, a top plate 23 is installed between the tops of the two support plates 22, a classification component 3 and a driving component 4 are arranged on the top of the top plate 23, the classification component 3 comprises a gear 301, the gear 301 is rotatably connected to the top of the top plate 23, a rotating shaft 302 is fixedly connected between the inner surface walls of the gear 301, the rotating shaft 302 movably passes through the top of the top plate 23 and extends to the bottom, and a classification plate 304 is fixedly connected to the outer surface of the rotating shaft 302 near the bottom.

[0019] like Figure 1-Figure 4 and Figure 6 As shown, the driving assembly 4 includes a rack 403, and the rack 403 is meshed with the gear 301. A sliding rod 402 is slidably arranged inside the rack 403. Both sides of the sliding rod 402 are fixedly connected with fixed blocks 401. The fixed blocks 401 are fixedly connected to the top of the top plate 23. The fixed blocks 401 are arranged to fix the sliding rod 402 to the top plate 23. Under the action of the sliding rod 402, the rack 403 can only move forward and backward. Since the rack 403 is meshed with the gear 301, the gear 301 can be driven to rotate when the rack 403 moves.

[0020] like Figure 1-Figure 4 and Figure 6As shown, the right surface of the rack 403 is fixedly connected with a connecting block 404, and the front surface of the connecting block 404 is fixedly connected with an electric push rod 405, and the electric push rod 405 is arranged on the top of the top plate 23. The electric push rod 405 is arranged on the top of the top plate 23, and the telescopic end of the electric push rod 405 cooperates with the connecting block 404, so that the telescopic end of the electric push rod 405 can drive the rack 403 to move when it is telescoped.

[0021] like Figure 1-Figure 3 As shown, two mounting frames 11 are fixedly connected to the top of the rack 1, and a test device 12 is arranged between the outer surfaces of the two mounting frames 11. The mounting frames 11 are used to fix the test device 12. The test device 12 is arranged on the top of the rack 1 mainly for testing chip packaged products. The working principle of the test device 12 has been fully disclosed in the above-mentioned comparative documents and is an existing mature technology, which will not be elaborated here.

[0022] like Figure 1 and Figure 2 As shown, a motor 2 is fixedly connected to the left surface of the frame 1, and a conveyor belt 21 is arranged inside the frame 1. The motor 2 and the conveyor belt 21 are supporting facilities. The conveyor belt 21 and the supporting motor 2 are existing mature technologies and are mainly used to transport chip packages that need to be tested.

[0023] like Figure 1-Figure 5 As shown, a slot 24 is provided on the left surface of the top plate 23, and a fixed shaft 305 is arranged inside the slot 24. A fixed rod 303 is fixedly connected to the top of the fixed shaft 305, and the bottom of the fixed rod 303 is fixedly connected to the top of the rotating shaft 302. A first partition 25 is fixedly connected to the bottom of the top plate 23 near the right side. The first partition 25 is used to separate two conveying channels on the right side of the top of the conveyor belt 21. When the rotating shaft 302 rotates with the gear 301, the fixed rod 303 at its top will rotate with it, and transmit power to the classification plate 304 through the fixed shaft 305. This design makes the classification plate 304 more stable when rotating. The slot 24 is mainly designed to avoid the fixed shaft 305.

[0024] like Figure 1-Figure 3 As shown, a discharge channel 13 is fixedly connected to the right surface of the frame 1, a second partition 14 is fixedly connected to the inner bottom of the discharge channel 13 near the middle, and support legs 15 are fixedly connected to the bottom of the frame 1 near the four corners. The discharge channel 13 is inclined, and the chip package after testing will slide downward through the discharge channel 13. The second partition 14 is used to separate the discharge channel 13 into two channels, and the support legs 15 are mainly used to support the device.

[0025] The use method and working principle of this device: When using this device, put the chips to be tested on the conveyor belt 21. Under the action of the motor 2, the conveyor belt 21 will convey the chips in sequence. After the test equipment 12 is tested, the qualified chips will be conveyed out through the front discharge channel 13 under the action of the classification plate 304 and the first partition plate 25. The unqualified chips will be started by starting the electric push rod 405. When the electric push rod 405 moves backward, the connecting block 404 will drive the rack 403 to move backward, thereby causing the gear 301 to rotate, and then driving the rotating shaft 302 to rotate. The rotation of the rotating shaft 302 will cause the classification plate 304 to move forward. At this time, the unqualified chips will be conveyed out through the rear discharge channel 13. The overall design structure is simple and the cost is low. The unqualified chips can be effectively eliminated and are suitable for large-scale market promotion.

[0026] The above description is only a preferred embodiment of the present invention and does not limit the present invention in other forms. Any technician familiar with the profession may use the technical content disclosed above to change or modify it into an equivalent embodiment with equivalent changes and apply it to other fields. However, any simple modification, equivalent change and modification made to the above embodiment based on the technical essence of the present invention without departing from the content of the technical solution of the present invention still falls within the protection scope of the technical solution of the present invention.

Claims

1. A chip packaging test automatic classification device, comprising a frame (1), characterized in that: Two support plates (22) are fixedly connected to the top of the frame (1), a top plate (23) is installed between the tops of the two support plates (22), and a classification component (3) and a driving component (4) are arranged on the top of the top plate (23); The classification component (3) includes a gear (301), the gear (301) is rotatably connected to the top of the top plate (23), a rotating shaft (302) is fixedly connected between the inner surface wall of the gear (301), the rotating shaft (302) movably passes through the top of the top plate (23) and extends to the bottom, and a classification plate (304) is fixedly connected to the outer surface of the rotating shaft (302) near the bottom.

2. The chip packaging test automatic classification device according to claim 1, characterized in that: The driving assembly (4) comprises a rack (403), the rack (403) and the gear (301) are meshingly connected, a sliding rod (402) is slidably arranged inside the rack (403), and both sides of the sliding rod (402) are fixedly connected with fixed blocks (401), and the fixed blocks (401) are fixedly connected to the top of the top plate (23).

3. The chip packaging test automatic classification device according to claim 2, characterized in that: The right surface of the rack (403) is fixedly connected to a connection block (404), the front surface of the connection block (404) is fixedly connected to an electric push rod (405), and the electric push rod (405) is arranged on the top of the top plate (23).

4. The chip packaging test automatic classification device according to claim 1, characterized in that: Two mounting frames (11) are fixedly connected to the top of the frame (1), and a testing device (12) is arranged between the outer surfaces of the two mounting frames (11).

5. The chip packaging test automatic classification device according to claim 1, characterized in that: A motor (2) is fixedly connected to the left surface of the frame (1), a conveyor belt (21) is arranged inside the frame (1), and the motor (2) and the conveyor belt (21) are supporting facilities.

6. The chip packaging test automatic classification device according to claim 1, characterized in that: A notch (24) is provided on the left surface of the top plate (23), a fixed shaft (305) is provided inside the notch (24), the top of the fixed shaft (305) is fixedly connected to a fixed rod (303), the bottom of the fixed rod (303) is fixedly connected to the top of the rotating shaft (302), and a first partition plate (25) is fixedly connected to the bottom of the top plate (23) near the right side.

7. The chip packaging test automatic classification device according to claim 1, characterized in that: A discharge channel (13) is fixedly connected to the right surface of the frame (1), a second partition plate (14) is fixedly connected to the inner bottom of the discharge channel (13) near the middle, and support legs (15) are fixedly connected to the bottom of the frame (1) near the four corners.

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