Special sample table for metal broken end of SEM (scanning electron microscope)

Abstract

The utility model discloses a special sample table for a metal broken end of an SEM (Scanning Electron Microscope), which comprises a sample table surface, a support column is arranged at the lower part of the sample table surface, a side wall is arranged on one side of the upper part of the sample table surface, a transverse shaft is horizontally arranged on the side surface of the side wall facing the other side of the sample table surface, and a broken end clamping device is adjustably connected onto the transverse shaft. The broken end clamping device comprises a horizontally-arranged broken end clamping block, a broken end clamping cavity is formed in the broken end clamping block in the width direction of the broken end clamping block in a penetrating mode, and a locking threaded shaft is horizontally and adjustably arranged at the end, away from the transverse shaft, of the broken end clamping cavity in a penetrating mode. The device is simple in structure, convenient to operate, low in manufacturing cost and good in stability, can be used for angle adjustment and fixation when a scanning electron microscope is used for inspecting metal broken end traces, and not only improves the inspection quality, but also greatly improves the working efficiency.

Description

Technical Field

[0001] The utility model relates to the technical field of trace inspection devices, in particular to a special sample table for metal decapitation of a SEM scanning electron microscope. Background Art

[0002] Tool marks are one of the most common and important trace evidence at the scene of a case (incident). They are an important branch of the trace inspection and identification technology system (hand, foot, work, gun, special), and an important link in the development of criminal science and technology. Theft cases of cable lines under the jurisdiction of local public security organs and theft and railway damage cases under the jurisdiction of railway public security organs often involve the inspection and identification of pliers and scissors tool marks. The inspection and analysis of the marks on the broken ends of the cables left at the scene often play a vital role in determining the type of tools, linking cases and proving crimes.

[0003] Line-like marks are one of the main marks on broken ends, and the inspection of line-like marks is mainly carried out using a comparison microscope. A comparison microscope is an optical microscope, which is affected by magnification, resolution, depth of field and light distribution. It is only suitable for observing thick and obvious line marks, and does not have the ability to detect subtle (small) and small amounts of line marks. A scanning electron microscope (abbreviated as "SEM") has high magnification, high resolution, large depth of field, and is not affected by light, making it more suitable for inspecting subtle line marks. In actual work, when a broken end is severely damaged and the thicker line features cannot be used, a scanning electron microscope is needed for inspection and identification.

[0004] When using a scanning electron microscope to inspect the traces of broken lines, it is crucial to correctly adjust the broken angle (make the broken slope horizontal) and fix it. Currently, most sample stages used with scanning electron microscopes are flat sample stages. When using them, first paste conductive glue on the surface of the sample stage (both sides are sticky), and then place (paste) the sample to be inspected horizontally on the conductive glue for sampling; such a sample stage is not suitable for fixing and sampling broken samples. Therefore, designing a special sample stage for SEM scanning electron microscope metal broken is an urgent problem that technicians in related fields need to solve. Utility Model Content

[0005] In order to solve the above technical problems, the technical solution provided by the utility model is: a special sample stage for metal decapitation of a SEM scanning electron microscope, comprising a sample table, a pillar is arranged at the lower part of the sample table, a side wall is arranged on one side of the upper part of the sample table, a horizontal axis is horizontally arranged on the side of the side wall facing the other side of the sample table, and a decapitation clamping device is adjustably connected to the horizontal axis, the decapitation clamping device comprises a horizontally arranged decapitation clamping block, a decapitation clamping cavity is penetrated along the width direction of the decapitation clamping block, a locking threaded shaft is horizontally adjustable and penetrated at one end of the decapitation clamping cavity away from the horizontal axis, one end of the locking threaded shaft located in the decapitation clamping cavity is connected to the decapitation clamping plate, and the other end protrudes from the decapitation clamping block and is connected to a rotating handle.

[0006] The advantages of the utility model compared with the prior art are: the utility model has a simple structure, convenient operation, low cost and good stability by setting a broken head clamping device, and can be used for angle adjustment and fixation when using a scanning electron microscope to inspect metal broken head marks, which not only improves the inspection quality, but also greatly improves the work efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0007] Figure 1 The utility model is a structural schematic diagram of a special sample table for metal decapitation of a SEM scanning electron microscope.

[0008] Figure 2 The utility model is a schematic diagram of the top view structure of a special sample stage for metal decapitation of a SEM scanning electron microscope.

[0009] Figure 3 The utility model is a side view structural schematic diagram of a special sample stage for metal decapitation of a SEM scanning electron microscope.

[0010] Figure 4 The utility model is a schematic diagram of the disassembly structure of a cut-off clamping device in a special sample platform for metal cut-off of a SEM scanning electron microscope.

[0011] Figure 5 The utility model is a schematic diagram of the end structure of a cut-off clamping device in a special sample platform for metal cut-off of a SEM scanning electron microscope.

[0012] Figure 6 The utility model discloses a structural schematic diagram of a horizontal axis and a locking bolt in a special sample platform for metal decapitation of a SEM scanning electron microscope. DETAILED DESCRIPTION

[0013] In order to make the purpose, technical scheme and advantages of the embodiments of the utility model clearer, the technical scheme in the embodiments of the utility model will be clearly and completely described below in conjunction with the drawings in the embodiments of the utility model. Obviously, the described embodiments are part of the embodiments of the utility model, not all of the embodiments. Generally, the components of the embodiments of the utility model described and shown in the drawings here can be arranged and designed in various different configurations.

[0014] In the description of the embodiments of the present utility model, it should be noted that if the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inside", "outside", etc. indicate an orientation or position relationship based on the orientation or position relationship shown in the accompanying drawings, or the orientation or position relationship in which the utility model product is usually placed when in use, it is only for the convenience of describing the utility model and simplifying the description, and does not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present utility model. In addition, the terms "first", "second", "third", etc. are only used to distinguish the description, and cannot be understood as indicating or implying relative importance.

[0015] In addition, the terms "horizontal", "vertical", "overhanging" and the like do not mean that the components must be absolutely horizontal or overhanging, but can be slightly tilted. For example, "horizontal" only means that its direction is more horizontal than "vertical", and does not mean that the structure must be completely horizontal, but can be slightly tilted.

[0016] In the description of the embodiments of the present invention, "multiple" means at least 2.

[0017] In the description of the embodiments of the present utility model, it is also necessary to explain that, unless otherwise clearly specified and limited, the terms "set", "install", "connect", and "connect" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present utility model can be understood according to specific circumstances.

[0018] Example:

[0019] Combined with Figure 1-6The present embodiment discloses a special sample stage for metal decapitation of a SEM scanning electron microscope, comprising a sample table 1, a pillar 2 is arranged at the lower part of the sample table 1, a side wall 3 is arranged on one side of the upper part of the sample table 1, a horizontal axis 4 is horizontally arranged on the side of the side wall 3 facing the other side of the sample table 1, and a decapitation clamping device 5 is adjustably connected to the horizontal axis 4, and the decapitation clamping device 5 comprises a horizontally arranged decapitation clamping block 501, and a decapitation clamping cavity 502 is penetrated along the width direction of the decapitation clamping block 501, and a locking threaded shaft 503 is horizontally adjustable and penetrated at one end of the decapitation clamping cavity 502 away from the horizontal axis 4, and the locking threaded shaft 503 is connected to the decapitation clamping device at one end located in the decapitation clamping cavity 502. Plate 504, the other end of which extends out of the decapitation clamping block 501 and is connected to a rotating handle 505; the end of the decapitation clamping block 501 connected to the transverse axis 4 is provided with a transverse axis mounting hole 506, and the transverse axis 4 is inserted into the transverse axis mounting hole 506, and the decapitation supporting block is circumferentially provided with three locking holes 507 that are perpendicular to and connected to the transverse axis mounting hole 506, and a locking bolt 6 in contact with the outer wall of the transverse axis 4 is provided in the locking hole 507, and the locking bolt 6 does not protrude from the decapitation clamping block 501, and a hexagonal hole 602 is provided on the top of the locking bolt 6; an arc-shaped groove 401 is circumferentially provided on the part of the transverse axis 4 located in the locking hole 507, and an arc-shaped end 601 corresponding to the arc-shaped groove 401 is provided at the bottom of the locking bolt 6.

[0020] In the specific implementation, the broken heads of different diameters can be fixed by the broken head clamping cavity on the broken head clamping device in cooperation with the locking threaded shaft; the broken heads can be rotated to an appropriate angle by cooperation with the horizontal axis and the horizontal axis mounting hole on the broken head clamping device, and then fixed by the built-in locking bolts on the broken head clamping device. Of course, the horizontal axis and the hole can be set to a connection with a certain friction resistance, and can be locked and fixed without the locking bolts; finally, the metal broken heads adjusted to a suitable angle and locked and fixed can be fixed in the scanning electron microscope detection chamber through pillars (also called "feet"); in addition, in the specific design, the SEM scanning electron microscope metal broken head special sample stage must be made of a material with good conductivity and a certain strength / hardness; the sample table is not limited to the single-layer cylindrical (cake) shape shown in the figure, and can be set to an upper and lower double-layer cylindrical (cake) shape or other shapes, which is convenient for using special tweezers to clamp and inject samples; the broken head clamping cavity is not limited to the angular shape shown in the figure, but can also be cylindrical, etc.

[0021] The above description of the utility model and its implementation methods is not restrictive. The drawings show only one implementation method of the utility model, and the actual structure is not limited thereto. In short, if ordinary technicians in this field are inspired by it and design structural methods and embodiments similar to the technical solution without creativity without departing from the purpose of the invention of the utility model, they should all fall within the protection scope of the utility model.

Claims

1. A special sample stage for metal decapitation of a SEM scanning electron microscope, characterized in that: It includes a sample table, a pillar is provided at the lower part of the sample table, a side wall is provided on one side of the upper part of the sample table, a horizontal axis is horizontally provided on the side of the side wall facing the other side of the sample table, a decapitation clamping device is adjustably connected to the horizontal axis, the decapitation clamping device includes a horizontally arranged decapitation clamping block, a decapitation clamping cavity is penetrated through the decapitation clamping block along its width direction, a locking threaded shaft is horizontally and adjustably penetrated through one end of the decapitation clamping cavity away from the horizontal axis, one end of the locking threaded shaft located in the decapitation clamping cavity is connected to the decapitation clamping plate, and the other end protrudes out of the decapitation clamping block and is connected to a rotating handle.

2. The SEM scanning electron microscope metal decapitation special sample stage according to claim 1, characterized in that: A transverse axis mounting hole is provided at one end of the decapitation clamping block connected to the transverse axis, and the transverse axis is inserted into the transverse axis mounting hole. The decapitation clamping block is circumferentially provided with three locking holes that are perpendicular to and connected to the transverse axis mounting hole, and a locking bolt that contacts the outer wall of the transverse axis is provided in the locking hole.

3. The SEM scanning electron microscope metal decapitation special sample stage according to claim 2, characterized in that: The locking bolt does not protrude from the broken head clamping block, and a hexagonal hole is arranged on the top of the locking bolt.

4. The SEM scanning electron microscope metal decapitation special sample stage according to claim 1, characterized in that: The part of the horizontal axis located at the locking hole is provided with an arc-shaped groove in the circumference, and the bottom of the locking bolt is provided with an arc-shaped end corresponding to the arc-shaped groove.

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