Chip capacitor test equipment

Abstract

The utility model belongs to the technical field of capacitor testing, and particularly relates to chip capacitor testing equipment, which comprises a carrying substrate, a driving platform, a transmission platform, a blanking system and a testing system. According to the utility model, the driving platform, the transmission platform and the carrying transmission structure are utilized, the transmission push rod and the linear rotating arm are driven by a group of driving motors to do reciprocating motion, and the operation of pushing the capacitor into the test system and releasing the capacitor from the blanking system is simultaneously carried out, so that the technical effect of automatically conveying a single capacitor is realized; the technical problem that the automation degree is low during traditional testing is solved. A test system is arranged, a test motor is used for driving a circular bottom table to rotate, when the circular bottom table rotates, a rotary connecting rod is pulled, the rotary connecting rod pulls an electrode sliding plate, a contact electrode is close to two stages of a capacitor through the electrode sliding plate, and the capacitor is connected into a test circuit, so that detection of the capacitor is achieved, and after detection is completed, the circular bottom table is reset. And the detection can be stopped.

Description

Technical Field

[0001] The utility model belongs to the technical field of capacitor testing, in particular to a chip capacitor testing device. Background Art

[0002] Chip multilayer ceramic capacitors, also known as chip capacitors, are made by stacking ceramic dielectric diaphragms with printed electrodes (inner electrodes) in an offset manner, sintering them at a high temperature once to form a ceramic chip, and then sealing the two ends of the chip with a metal layer (outer electrode) to form a monolithic structure, so it is also called a monolithic capacitor.

[0003] In the prior art, capacitors are usually installed in circuit boards by manual identification and installation. Since batch testing is required, this manual installation method has the problems of low efficiency and low automation. Utility Model Content

[0004] In view of the above situation, in order to overcome the defects of the prior art, the utility model provides a chip capacitor testing equipment, which utilizes a driving platform and a transmission platform and a transmission structure, and drives a transmission push rod and a linear rotating arm to reciprocate through a group of driving motors, and simultaneously pushes the capacitor into the testing system and releases the capacitor from the feeding system, thereby realizing the technical effect of automatic conveying of a single capacitor and solving the technical problem of low degree of automation in traditional testing.

[0005] The technical solution adopted by the utility model is as follows: The utility model provides a chip capacitor testing device, including a mounting substrate, a driving platform, a transmission platform, a feeding system and a testing system, wherein the transmission platform is arranged at the rear end of the mounting substrate, the driving platform is arranged above the transmission platform, the feeding system is arranged in the middle of the testing system, and the testing system is arranged at the front end of the mounting substrate.

[0006] Furthermore, a driving motor is provided above the driving platform, the output end of the driving motor is drivingly connected to a driving rotating arm, and a driving rotating shaft is rotatably provided on the driving rotating arm.

[0007] Furthermore, a transmission slide rail is provided on the transmission platform, a transmission push head is slidably connected to the inner side of the transmission slide rail, a synchronous slide rod is provided on the transmission push head, a transmission slide frame is slidably connected to the outer side of the transmission slide rail, the synchronous slide rod is connected to the lower end of the transmission slide frame, a transmission push rod is connected to the side wall of the transmission push head, a transmission slide groove is provided on the top of the transmission slide rail, and the transmission slide groove is located between the transmission slide rails.

[0008] Furthermore, the driving shaft is slidably connected to the transmission slide frame, and the driving motor drives the driving arm to rotate. During the driving rotation process, the transmission slide frame and the transmission push head are driven to reciprocate.

[0009] Furthermore, a connecting rod base is provided at the rear end of the mounting substrate, an angled rotating arm is rotatably connected to the connecting rod base, a connecting shaft is provided on the angled rotating arm, a linear rotating arm is rotatably provided on the connecting rod base, the angled rotating arm is transmission-connected to the linear rotating arm via the connecting shaft, and an angled sliding groove is provided on the angled rotating arm.

[0010] Furthermore, the angled slide groove is slidably connected to the synchronous slide rod, and when the synchronous slide rod slides with the transmission push head, the synchronous slide rod will push the angled rotating arm to rotate.

[0011] Furthermore, the unloading system includes an unloading base, an unloading frame, a feeding side plate, a pushing side plate, a feeding folding plate and a testing chamber, the unloading base is arranged in the middle part of the mounting substrate, a combination rod is arranged on the unloading base, the unloading frame is fixedly connected to the combination rod, the feeding side plate is fixedly connected to one end of the combination rod, the pushing side plate is fixedly connected to the other end of the combination rod, the feeding folding plate is slidably connected to the unloading frame, and the testing chamber is fixedly connected to the feeding side plate and the pushing side plate. During testing, the capacitor to be tested can be stored in the testing chamber, and the capacitor in the testing chamber can be pushed by the feeding folding plate for subsequent transportation and testing operations.

[0012] Furthermore, the pusher side plate is slidably connected to the transmission push rod.

[0013] Furthermore, a linkage bottom shaft is provided at the bottom of the feeding folding plate, and the linkage bottom shaft is slidably connected to the linear rotating arm.

[0014] Furthermore, the test system includes a test base, a test platform, a test motor, a circular base and a test shaft. The test base is arranged at the front end of the mounting substrate, the test platform is arranged above the test base, the circular base is rotatably arranged on the test platform, the test shaft is arranged at the bottom of the circular base, the test shaft is transmission-connected to the output end of the test motor, and the circular base is driven to rotate by the test motor.

[0015] Furthermore, a symmetrical sliding limit plate is provided on the test platform, a symmetrical electrode slide is slidably provided on the test platform, a contact electrode is provided on one side of the electrode slide, and a terminal is provided on the other side of the electrode slide. The contact electrode is slidably connected to the sliding limit plate, a reset spring is connected between the sliding limit plate and the electrode slide, the contact electrode is electrically connected to the terminal, and the terminal is used to connect an external test equipment to input a test current to the capacitor.

[0016] Furthermore, an outer shaft is provided at the bottom of the electrode slide, and an inner shaft is symmetrically provided at the bottom of the circular base. A rotating connecting rod is rotatably connected to the outer shaft, and a rotating connecting rod is rotatably connected to the inner shaft. When the circular base rotates, the electrode slide is pulled through the rotating connecting rod, and the contact electrode is brought close to the two poles of the capacitor through the electrode slide, and the capacitor is connected to the test circuit, thereby realizing the detection of the capacitor.

[0017] The beneficial effects of a chip capacitor testing device provided by this solution are as follows:

[0018] (1) Using the driving platform, transmission platform and transmission structure, a set of driving motors are used to drive the transmission push rod and linear rotating arm to reciprocate, and at the same time, the capacitor is pushed into the test system and released from the unloading system, realizing the automatic conveying technology effect of a single capacitor, solving the technical problem of low automation in traditional testing;

[0019] (2) Setting up a material unloading system, using the test chamber to store multiple capacitors, and testing the capacitors one by one, improving automated operation, reducing manual intervention, and increasing test speed;

[0020] (3) A test system is set up, and a test motor is used to drive the circular base to rotate. When the circular base rotates, it will pull the rotating connecting rod, and the rotating connecting rod will pull the electrode slide. The electrode slide will bring the contact electrode close to the two poles of the capacitor, and the capacitor will be connected to the test circuit, thereby realizing the detection of the capacitor. After the detection is completed, the circular base is reset to stop the detection. The subsequent capacitors will push the capacitors that have completed the detection out of the circular base, thereby realizing automatic replacement and automatic detection of the capacitors, greatly improving the test efficiency, avoiding human errors, and improving the accuracy of the test. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] Figure 1 This is a structural schematic diagram of a chip capacitor testing device proposed by the utility model;

[0022] Figure 2 A top view of a chip capacitor testing device proposed by the utility model;

[0023] Figure 3 A side view of a chip capacitor testing device proposed by the utility model;

[0024] Figure 4 This is a schematic diagram of the mounting structure of the drive platform;

[0025] Figure 5 It is a schematic diagram of the mounting structure of the transmission platform;

[0026] Figure 6 It is a schematic diagram of the top structure of the transmission platform;

[0027] Figure 7 Schematic diagram I of the transmission relationship between the angled rotating arm and the straight rotating arm;

[0028] Figure 8 Schematic diagram II of the transmission relationship between the angled rotating arm and the straight rotating arm;

[0029] Fig. 9 It is a schematic diagram of the transmission relationship of the transmission push head;

[0030] Fig.10 It is a structural schematic diagram of the feeding system;

[0031] Fig.11 This is the exploded diagram of the material feeding system;

[0032] Fig.12 It is a schematic diagram of the transmission relationship of the feeding folding plate;

[0033] Fig.13 It is a partial structural diagram of the test system;

[0034] Fig.14 It is a side view of the test system;

[0035] Fig.15 Schematic diagram of partial structural transmission relationship of the test system.

[0036] Among them, 1. Mounting substrate, 2. Driving platform, 3. Transmission platform, 4. Unloading system, 5. Testing system, 6. Capacitor, 201. Driving motor, 202. Driving arm, 203. Driving shaft, 301. Transmission slide rail, 302. Transmission push head, 303. Transmission slide frame, 304. Transmission push rod, 305. Transmission slide groove, 306. Synchronous slide rod, 307. Connecting rod base, 308. Angle arm, 309. Connecting shaft, 310. Linear arm, 311. Angle slide groove, 401. Unloading base , 402, unloading frame, 403, feeding side plate, 404, pushing side plate, 405, feeding folding plate, 406, test cabin, 407, linkage bottom shaft, 408, combination rod, 501, test base, 502, test platform, 503, test motor, 504, circular base, 505, test shaft, 506, sliding limit plate, 507, electrode slide plate, 508, contact electrode, 509, reset spring, 510, outer shaft, 511, rotating connecting rod, 512, inner shaft, 513, terminal.

[0037] The accompanying drawings are used to provide a further understanding of the present invention and constitute a part of the specification. They are used together with the embodiments of the present invention to explain the present invention and do not constitute a limitation to the present invention. DETAILED DESCRIPTION

[0038] The technical solutions in the embodiments of the utility model will be clearly and completely described below in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the utility model, rather than all of the embodiments; based on the embodiments of the utility model, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the utility model.

[0039] In the description of the present invention, it should be understood that terms such as "upper", "lower", "front", "back", "left", "right", "top", "bottom", "inside" and "outside" indicating directions or positional relationships are based on the directions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific direction, be constructed and operated in a specific direction, and therefore should not be understood as a limitation on the present invention.

[0040] like Figure 1-Figure 15 As shown, the utility model provides a chip capacitor testing device, including a mounting substrate 1, a driving platform 2, a transmission platform 3, a feeding system 4 and a testing system 5, the transmission platform 3 is arranged at the rear end of the mounting substrate 1, the driving platform 2 is arranged above the transmission platform 3, the feeding system 4 is arranged in the middle of the testing system 5, and the testing system 5 is arranged at the front end of the mounting substrate 1.

[0041] Among them, a driving motor 201 is provided above the driving platform 2, and the output end of the driving motor 201 is drivingly connected to a driving arm 202, and a driving shaft 203 is rotatably provided on the driving arm 202; a transmission slide rail 301 is provided on the transmission platform 3, and a transmission push head 302 is slidably connected to the inner side of the transmission slide rail 301, and a synchronous slide bar 306 is provided on the transmission push head 302, and a transmission slide frame 303 is slidably connected to the outer side of the transmission slide rail 301, and the synchronous slide bar 306 is connected to the lower end of the transmission slide frame 303, and a transmission push rod 304 is connected to the side wall of the transmission push head 302, and a transmission slide groove 305 is provided on the top of the transmission slide rail 301, and the transmission slide groove 305 is located between the transmission slide rails 301; the driving shaft 203 is slidably connected to the transmission slide frame 303; the substrate 1 is mounted A connecting rod base 307 is provided at the rear end, and an angled rotating arm 308 is rotatably connected to the connecting rod base 307, and a connecting shaft 309 is provided on the angled rotating arm 308, and a linear rotating arm 310 is rotatably provided on the connecting rod base 307, and the angled rotating arm 308 is transmission-connected to the linear rotating arm 310 through the connecting shaft 309, and an angled sliding groove 311 is provided on the angled rotating arm 308; the angled sliding groove 311 is slidably connected to the synchronous sliding rod 306; the unloading system 4 includes an unloading base 401, an unloading frame 402, a feeding side plate 403, a pushing side plate 404, a feeding folding plate 405 and a testing cabin 406, the unloading base 401 is arranged in the middle of the mounting substrate 1, a combination rod 408 is provided on the unloading base 401, the unloading frame 402 is fixedly connected to the combination rod 408, and the feeding side plate 403 is fixedly connected to the synchronous sliding rod 306 One end of the combination rod 408 is fixed, the pushing side plate 404 is fixed to the other end of the combination rod 408, the feeding folding plate 405 is slidably connected to the unloading frame 402, and the test cabin 406 is fixed to the feeding side plate 403 and the pushing side plate 404; the pushing side plate 404 is slidably connected to the transmission push rod 304; the bottom of the feeding folding plate 405 is provided with a linkage bottom shaft 407, and the linkage bottom shaft 407 is slidably connected to the linear rotating arm 310; the test system 5 includes a test base 501, a test platform 502, a test motor 503, a circular base 504 and a test rotating shaft 505, the test base 501 is arranged at the front end of the mounting substrate 1, the test platform 502 is arranged above the test base 501, the circular base 504 is rotatably arranged on the test platform 502, and the test rotating shaft 505 is arranged At the bottom of the circular base 504, the test shaft 505 is transmission-connected with the output end of the test motor 503; a symmetrical sliding limit plate 506 is provided on the test platform 502, and a symmetrical electrode slide 507 is slidingly provided on the test platform 502, a contact electrode 508 is provided on one side of the electrode slide 507, and a terminal 513 is provided on the other side of the electrode slide 507, the contact electrode 508 is slidingly connected to the sliding limit plate 506, and a reset spring 509 is connected between the sliding limit plate 506 and the electrode slide 507; an outer shaft 510 is provided at the bottom of the electrode slide 507, and an inner shaft 512 is symmetrically provided at the bottom of the circular base 504, a rotating connecting rod 511 is rotatably connected to the outer shaft 510, and a rotating connecting rod 511 is rotatably connected to the inner shaft 512.

[0042] When in use, first put the capacitor 6 to be tested into the test chamber 406, and connect the two terminals 513 to the positive and negative electrodes of the external test equipment respectively; feed a single capacitor 6, start the drive motor 201, let the drive motor 201 output and rotate 360 ​​degrees, the drive motor 201 drives the drive arm 202 to rotate, the drive arm 202 rotates and drives the transmission slide frame 303 to slide through the drive shaft 203, the transmission slide frame 303 slides back and forth on the transmission slide rail 301, and the sliding direction of the transmission slide frame 303 moves from the rear end (the side where the transmission platform 3 is located) to the front end (the side where the test system 5 is located), and then moves from the front end to the rear end. During the sliding process of the transmission slide frame 303, the transmission push head 302 will be driven to slide together; the transmission push head 303 02 will drive the transmission push rod 304 to move back and forth once. During the transmission push rod 304 process, the capacitor 6 located in the unloading frame 402 will be pushed onto the circular bottom platform 504; during the sliding process of the transmission slide frame 303, the synchronous slide bar 306 will be driven to slide back and forth once in the bevel slide groove 311. During the sliding process of the synchronous slide bar 306 moving from the rear end to the front end, the sliding of the synchronous slide bar 306 will push the bevel arm 308 to rotate. The rotation of the bevel arm 308 drives the linear arm 310 to rotate through the connecting shaft 309. The rotation of the linear arm 310 drives the feeding folding plate 405 to slide toward the test chamber 406 through the linkage bottom shaft 407. After that, the capacitor 6 in the test chamber 406 slides to the feeding folding plate 405. The synchronous slide bar 306 moves from the front end to During the sliding process of the rear end, the synchronous slide bar 306 slides and drives the bevel arm 308 to rotate. The rotation of the bevel arm 308 drives the linear arm 310 to rotate through the connecting shaft 309. The rotation of the linear arm 310 drives the feeding folding plate 405 to slide away from the test chamber 406 through the linkage bottom shaft 407, and the capacitor 6 is sent to the pushing track of the transmission push rod 304 through the feeding folding plate 405; when the capacitor 6 is sent to the circular base 504, the test of the capacitor 6 is started, and the test motor 503 is started. The test motor 503 rotates 90 degrees in the forward direction, and the test motor 503 drives the test shaft 505 to rotate. The rotation of the test shaft 505 drives the circular base 504 to rotate, and the rotation of the circular base 504 pulls the electrode slide plate through the rotating connecting rod 511 507 slides, the sliding direction of the electrode slide plate 507 is toward the circular base 504, the sliding of the electrode slide plate 507 pushes the contact electrode 508 to be close to the electrode of the capacitor 6, and the sliding of the electrode slide plate 507 squeezes the reset spring 509, and the external test equipment passes the current, and the test of the capacitor 6 can be completed through the rapid charge and discharge test, and then the test motor 503 reverses the output and rotates 90 degrees, and the test motor 503 drives the test shaft 505 to rotate, and the rotation of the test shaft 505 drives the circular base 504 to rotate, and the rotation of the circular base 504 pulls the electrode slide plate 507 to slide through the rotating connecting rod 511, and the electrode slide plate 507 moves away from the circular base 504, and the sliding of the electrode slide plate 507 pulls the contact electrode 508 away from the electrode of the capacitor 6;After the test is completed, the drive motor 201 is started again, and the subsequent capacitor 6 will push the tested capacitor out of the circular base 504. ;

[0043] The above is the specific working process of the utility model, and you can repeat this step next time you use it.

[0044] It should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device.

[0045] Although the embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention.

[0046] The above description of the utility model and its implementation methods is not restrictive. The drawings show only one implementation method of the utility model, and the actual structure is not limited thereto. In short, if ordinary technicians in this field are inspired by it and design structural methods and embodiments similar to the technical solution without creativity without departing from the purpose of the invention of the utility model, they should all fall within the protection scope of the utility model.

Claims

1. A chip capacitor testing device, characterized in that: The invention comprises a mounting substrate (1), a driving platform (2), a transmission platform (3), a material unloading system (4) and a testing system (5), wherein the transmission platform (3) is arranged at the rear end of the mounting substrate (1), the driving platform (2) is arranged above the transmission platform (3), the material unloading system (4) is arranged at the middle of the testing system (5), and the testing system (5) is arranged at the front end of the mounting substrate (1); the testing system (5) comprises a testing base (501), a testing platform (502), a testing motor (503), a circular base (504) and a testing shaft (505), wherein the testing base (501) is arranged at the front end of the mounting substrate (1), the testing platform (502) is arranged above the testing base (501), the circular base (504) is rotatably arranged on the testing platform (502), the testing shaft (505) is arranged at the bottom of the circular base (504), and the testing shaft (505) is arranged at the bottom of the circular base (504). 05) is drivingly connected to the output end of the test motor (503); a symmetrical sliding limit plate (506) is provided on the test platform (502); a symmetrical electrode slide plate (507) is slidingly provided on the test platform (502); a contact electrode (508) is provided on one side of the electrode slide plate (507); a terminal (513) is provided on the other side of the electrode slide plate (507); the contact electrode (508) is slidingly connected to the sliding limit plate (506); a return spring (509) is connected between the sliding limit plate (506) and the electrode slide plate (507); an outer shaft (510) is provided at the bottom of the electrode slide plate (507); an inner shaft (512) is symmetrically provided at the bottom of the circular base (504); a rotating connecting rod (511) is rotatably connected to the outer shaft (510); and a rotating connecting rod (511) is rotatably connected to the inner shaft (512).

2. A chip capacitor testing device according to claim 1, characterized in that: A driving motor (201) is provided above the driving platform (2); the output end of the driving motor (201) is drivingly connected to a driving rotating arm (202); and a driving rotating shaft (203) is rotatably provided on the driving rotating arm (202).

3. The chip capacitor testing device according to claim 2, characterized in that: The transmission platform (3) is provided with a transmission rail (301), the inner side of the transmission rail (301) is slidably connected to a transmission push head (302), the transmission push head (302) is provided with a synchronous slide bar (306), the outer side of the transmission rail (301) is slidably connected to a transmission slide frame (303), the synchronous slide bar (306) is connected to the lower end of the transmission slide frame (303), the side wall of the transmission push head (302) is connected to a transmission push rod (304), and the top of the transmission rail (301) is provided with a transmission slide groove (305), and the transmission slide groove (305) is located between the transmission rails (301).

4. The chip capacitor testing device according to claim 3, characterized in that: The driving shaft (203) is slidably connected to the transmission sliding frame (303).

5. The chip capacitor testing device according to claim 4, characterized in that: A connecting rod base (307) is provided at the rear end of the mounting base (1); an angled rotating arm (308) is rotatably connected to the connecting rod base (307); a connecting shaft (309) is provided on the angled rotating arm (308); a linear rotating arm (310) is rotatably provided on the connecting rod base (307); the angled rotating arm (308) is transmission-connected to the linear rotating arm (310) via the connecting shaft (309); and an angled sliding groove (311) is provided on the angled rotating arm (308).

6. The chip capacitor testing device according to claim 5, characterized in that: The angled sliding groove (311) is slidably connected to the synchronous sliding rod (306).

7. The chip capacitor testing device according to claim 6, characterized in that: The unloading system (4) comprises an unloading base (401), an unloading frame (402), a feeding side plate (403), a pushing side plate (404), a feeding folding plate (405) and a testing chamber (406); the unloading base (401) is arranged at the middle part of the mounting substrate (1); a combination rod (408) is arranged on the unloading base (401); the unloading frame (402) is fixedly connected to the combination rod (408); the feeding side plate (403) is fixedly connected to one end of the combination rod (408); the pushing side plate (404) is fixedly connected to the other end of the combination rod (408); the feeding folding plate (405) is slidably connected to the unloading frame (402); and the testing chamber (406) is fixedly connected to the feeding side plate (403) and the pushing side plate (404).

8. The chip capacitor testing device according to claim 7, characterized in that: The material pushing side plate (404) is slidably connected to the transmission push rod (304).

9. The chip capacitor testing device according to claim 8, characterized in that: A linkage bottom shaft (407) is provided at the bottom of the feeding folding plate (405), and the linkage bottom shaft (407) is slidably connected to the linear rotating arm (310).

Images