Magnetic potential matrix defect detection probe

Abstract

The utility model provides a magnetic type potential matrix defect detection probe. The probe comprises an outer shell, a probe assembly, a wire and a permanent magnet, a first through hole is formed in the outer shell, and the permanent magnet is arranged in the first through hole facing one side of an object to be detected; the probe assembly penetrates through the permanent magnet and is arranged in the first through hole; the lead is connected with one end of the probe assembly; the first through hole is filled with an electronic pouring sealant; thus, the wire and the probe assembly are fixed through the electronic pouring sealant, the stability between the wire and the probe assembly is guaranteed, the detection precision is improved, and meanwhile the wire can be prevented from falling off from the probe assembly; the bottom of the outer shell is also provided with a groove with an opening facing an object to be detected, and the groove is filled with an adhesive; therefore, the probe not only can be adsorbed on a magnetic detected object, but also can be further fixed by filling the adhesive in the groove, and can be conveniently adhered on a non-magnetic detected object, so that the application range of the probe is expanded.

Description

Technical Field

[0001] The present application relates to the technical field of pipeline defect detection equipment, and in particular to a magnetic potential matrix defect detection probe. Background Art

[0002] Potential matrix defect detection technology is a high-precision, high-sensitivity non-destructive testing technology. It mainly detects the internal defects, cracks, corrosion and their extension of metal structures with high precision based on the tiny voltage changes on the surface of the object being tested. Potential matrix defect detection technology can remotely obtain the corrosion status of high-risk parts of pipelines, track the corrosion initiation and development process, and use corrosion assessment and pipeline remaining life, prediction, and master the safety status of the pipeline.

[0003] In the prior art, commonly used potential matrix defect surface detection probes include the following two types: such as the application number 202223286993.2, the patent name is a magnetic probe in a magnetic probe for potential matrix defect surface detection and monitoring, such as the application number 202223294996.0, the patent name is a flexible probe in a flexible probe for potential matrix defect surface detection and monitoring. However, the magnetic probe has the following problems during use: 1) The magnetic probe can only be fixed on the surface of the pipeline by a permanent magnet. During use, if a large external force acts on the magnetic probe, the probe position will be offset; 2) The wire of the magnetic probe is connected to the side of the protective shell, which will make the distance between the probes too large and reduce the detection accuracy; 3) The magnetic probe is only suitable for the condition that the object to be measured is magnetic. If the object to be measured is not magnetic, such as stainless steel, copper, etc., the magnetic probe cannot be adsorbed on the surface of the object to be measured, and therefore cannot be used. However, the above-mentioned flexible probe requires the use of a large amount of adhesive, resulting in a long sticking time. If the adhesive is not dry, the position of the probe will be shifted. Utility Model Content

[0004] In order to solve the above technical problems, the present application provides a magnetic potential matrix defect detection probe, including an outer shell, a probe assembly, a wire and a permanent magnet; a first through hole is arranged in the outer shell, and the permanent magnet is arranged in the first through hole facing the side of the object to be tested; the probe assembly passes through the permanent magnet and is arranged in the first through hole; the wire is connected to one end of the probe assembly away from the permanent magnet; the first through hole is filled with electronic potting glue; the bottom of the outer shell is also provided with a groove with an opening facing the object to be tested, and the groove is filled with adhesive.

[0005] In some embodiments of the present application, the outer shell is made of high temperature resistant material.

[0006] In some embodiments of the present application, the probe assembly includes a needle, a needle tube and an elastic member; the needle is clamped at the end of the needle tube; the elastic member is arranged in the needle tube, one end of which abuts against the top of the needle tube and the other end abuts against the end of the needle.

[0007] In some embodiments of the present application, the elastic member is a spring.

[0008] In some embodiments of the present application, an inner shell is further included. The inner shell is arranged in the outer shell, a second through hole is arranged inside the inner shell, and a bottom of the inner shell is arranged on the top surface of the permanent magnet. The probe assembly and the wire are arranged in the second through hole.

[0009] In some embodiments of the present application, the second through hole is filled with electronic potting glue.

[0010] In some embodiments of the present application, the wire is connected to the probe assembly by welding.

[0011] Compared with the prior art, the utility model has the following advantages and beneficial effects: the magnetic potential matrix defect detection probe of the present application includes an outer shell, a probe assembly, a wire and a permanent magnet; a first through hole is arranged in the outer shell, and the permanent magnet is arranged in the first through hole on the side facing the object to be tested; the probe assembly passes through the permanent magnet and is arranged in the first through hole; the wire is connected to one end of the probe assembly far from the permanent magnet; the first through hole is filled with electronic potting glue; in this way, the wire and the probe assembly are directly connected, and are further fixed by the electronic potting glue, thereby ensuring the stability between the wire and the probe assembly, improving the detection accuracy, and preventing the wire from falling off the probe assembly; a groove with an opening facing the object to be tested is also opened at the bottom of the outer shell, and the groove is filled with adhesive; in this way, the probe can not only be adsorbed on the magnetic object to be tested, but also can be further fixed by filling the groove with adhesive, and can be conveniently adhered to the non-magnetic object to be tested, thereby expanding the scope of use of the probe.

[0012] It is to be understood that the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] The accompanying drawings constituting a part of this document are used to provide a further understanding of this document. The exemplary embodiments and descriptions of this document are used to explain this document and do not constitute an improper limitation on this document. In the accompanying drawings:

[0014] Figure 1 It is a structural schematic diagram of a magnetic potential matrix defect detection probe provided by the first exemplary embodiment of the present application;

[0015] Figure 2It is a structural schematic diagram of a magnetic potential matrix defect detection probe provided by a second exemplary embodiment of the present application;

[0016] Figure 3 It is a schematic structural diagram of a magnetic potential matrix defect detection probe provided by the third exemplary embodiment of the present application.

[0017] In the figure:

[0018] 101, outer shell; 102, first through hole; 103, permanent magnet; 104, probe assembly; 105, wire; 106, groove; 107, inner shell; 108, second through hole. DETAILED DESCRIPTION

[0019] In order to make the purpose, technical scheme and advantages of the embodiments of the present application clearer, the technical scheme in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, rather than all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in the field without making creative work are within the scope of protection of the present application. It should be noted that, in the absence of conflict, the embodiments in the present application and the features in the embodiments can be combined with each other arbitrarily.

[0020] Potential matrix defect detection technology is a high-precision, high-sensitivity non-destructive testing technology. It mainly detects the internal defects, cracks, corrosion and their extension of metal structures with high precision based on the tiny voltage changes on the surface of the object being tested. Potential matrix defect detection technology can remotely obtain the corrosion status of high-risk parts of pipelines, track the corrosion initiation and development process, and use corrosion assessment and pipeline remaining life, prediction, and master the safety status of the pipeline.

[0021] In the prior art, commonly used potential matrix defect surface detection probes include the following two types: such as the application number 202223286993.2, the patent name is a magnetic probe in a magnetic probe for potential matrix defect surface detection and monitoring, such as the application number 202223294996.0, the patent name is a flexible probe in a flexible probe for potential matrix defect surface detection and monitoring. However, the magnetic probe has the following problems during use: 1) The magnetic probe can only be fixed on the surface of the pipeline by a permanent magnet. During use, if a large external force acts on the magnetic probe, the probe position will be offset; 2) The wire of the magnetic probe is connected to the side of the protective shell, which will make the distance between the probes too large and reduce the detection accuracy; 3) The magnetic probe is only suitable for the condition that the object to be measured is magnetic. If the object to be measured is not magnetic, such as stainless steel, copper, etc., the magnetic probe cannot be adsorbed on the surface of the object to be measured, and therefore cannot be used. However, the above-mentioned flexible probe requires the use of a large amount of adhesive, resulting in a long sticking time. If the adhesive is not dry, the position of the probe will be shifted.

[0022] Based on this, an exemplary embodiment of the present application provides a magnetic potential matrix defect detection probe, which includes an outer shell, a probe assembly, a wire and a permanent magnet; a first through hole is provided in the outer shell, and the permanent magnet is provided in the first through hole on the side facing the object to be tested; the probe assembly passes through the permanent magnet and is arranged in the first through hole; the wire is connected to one end of the probe assembly far from the permanent magnet; the first through hole is filled with electronic potting glue; in this way, the wire and the probe assembly are directly connected, and are further fixed by the electronic potting glue, thereby ensuring the stability between the wire and the probe assembly, improving the detection accuracy, and preventing the wire from falling off the probe assembly; a groove with an opening facing the object to be tested is also provided at the bottom of the outer shell, and the groove is filled with adhesive; in this way, the probe can not only be adsorbed on the magnetic object to be tested, but also can be further fixed by filling the groove with adhesive, and can be conveniently adhered to the non-magnetic object to be tested, thereby expanding the scope of use of the probe.

[0023] An exemplary embodiment of the present application provides a magnetic potential matrix defect detection probe, such as Figure 1As shown, the probe comprises an outer shell 101, a probe assembly 104, a wire 105 and a permanent magnet 103. A first through hole 102 is provided in the outer shell 101. Preferably, in order to facilitate the fixing of the permanent magnet 103, the first through hole 102 is a stepped hole; the permanent magnet 103 is arranged in the first through hole 102 on the side facing the object to be measured. Preferably, the size of the first hole of the stepped hole is adapted to the size of the permanent magnet 103, the size of the second hole of the stepped hole is smaller than the size of the first hole, and the permanent magnet 103 is arranged in the first hole. The probe assembly 104 penetrates the permanent magnet 103 and is arranged in the first through hole 102; the wire 105 is connected to one end of the probe assembly 104 away from the permanent magnet 103; the first through hole 102 is filled with electronic potting glue to fix the permanent magnet 103, the probe assembly 104 and the wire 105; in this way, the wire 105 is directly connected to the probe assembly 104, and is further fixed by the electronic potting glue, which ensures the stability between the wire 105 and the probe assembly 104, improves the detection accuracy, and prevents the wire 105 from falling off the probe assembly 104. The bottom of the outer shell 101 is also provided with a groove 106 with an opening facing the object to be tested, and the groove 106 is filled with adhesive; in this way, the probe can not only be adsorbed on the magnetic object to be tested, but also can be further fixed by filling the groove 106 with adhesive, and can be conveniently adhered to the non-magnetic object to be tested, which expands the scope of use of the probe.

[0024] The wire 105 is welded to the probe assembly 104, which completely solves the risk of the wire 105 falling off and improves the conductivity of the probe assembly 104. At the same time, the electronic potting glue is used to seal and fill the first through hole 102, so that the electronic potting glue covers the welding point between the wire 105 and the probe assembly 104, fixes the welding point, and effectively prolongs the life of the probe. The groove 106 can be an annular groove 106 or a plurality of groove groups distributed at intervals. In order to enhance the stability of the probe, an annular groove is preferred.

[0025] In an exemplary embodiment, the outer shell 101 is made of a high temperature resistant material. For example, the outer shell 101 is made of a flexible material, such as soft silicone, elastic resin, etc.; the outer shell 101 can also be made of a hard material, such as ceramic, non-magnetic metal, etc.

[0026] In one embodiment, the probe assembly 104 includes a needle, a needle tube and an elastic member; the needle is clamped at the end of the needle tube; the elastic member is arranged in the needle tube, one end of which abuts against the top of the needle tube, and the other end abuts against the end of the needle; the elastic member is preferably a spring. When not working, the needle of the probe assembly 104 extends a certain distance outside the needle tube. When the probe is installed on the object to be measured, the needle first abuts against the object to be measured. Under the action of external force, the needle compresses the spring, so that the needle moves inside the needle tube until the bottom surface of the outer shell 101 contacts the object to be measured. At this time, if the object to be measured is magnetic, the permanent magnet 103 can be adsorbed on the object to be measured, and it is determined whether it is necessary to fill the groove 106 with adhesive to further fix the probe according to the working environment on site. If the object to be measured is non-magnetic, the adhesive is filled in the groove 106 to fix the probe.

[0027] In an exemplary embodiment, Figure 2 As shown, in order to reduce the volume of the probe and reduce the space occupied by the probe, the top of the outer shell 101 is retracted inwardly, which does not affect the performance and can make the probe have a small volume and be easy to carry.

[0028] In an exemplary embodiment, Figure 3 As shown, in order to facilitate processing and installation, the probe also includes an inner shell 107, which is arranged in the outer shell 101. The material of the inner shell 107 can be consistent with that of the outer shell 101, and a second through hole 108 is arranged inside the inner shell 107, and the bottom of the inner shell 107 is arranged on the top surface of the permanent magnet 103. The probe assembly 104 and the wire 105 are arranged in the second through hole 108; the second through hole 108 is filled with electronic potting glue to fix the inner shell 107, the permanent magnet 103, the probe assembly 104 and the wire 105.

[0029] In this application, the terms "comprises", "comprising" or any other variations thereof are intended to cover non-exclusive inclusion, so that an article or device comprising a series of elements includes not only those elements, but also other elements not explicitly listed, or elements inherent to such article or device. In the absence of more restrictions, the elements defined by the sentence "comprising..." do not exclude the presence of other identical elements in the article or device comprising the elements.

[0030] Although the preferred embodiments of the present application have been described, those skilled in the art may make other changes and modifications to these embodiments once they have learned the basic creative concept. Therefore, the appended claims are intended to be interpreted as including the preferred embodiments and all changes and modifications falling within the scope of the present application.

[0031] Obviously, those skilled in the art can make various changes and modifications to the present application without departing from the spirit and scope of the present application. Thus, if these modifications and variations of the present application fall within the scope of the claims of the present application and their equivalents, the intention of the present application also includes these modifications and variations.

Claims

1. A magnetic potential matrix defect detection probe, characterized in that: It includes an outer shell, a probe assembly, a wire and a permanent magnet; a first through hole is arranged in the outer shell, and the permanent magnet is arranged in the first through hole on the side facing the object to be tested; the probe assembly passes through the permanent magnet and is arranged in the first through hole; the wire is connected to one end of the probe assembly away from the permanent magnet; the first through hole is filled with electronic potting glue; the bottom of the outer shell is also provided with a groove opening toward the object to be tested, and the groove is filled with adhesive.

2. The magnetic potential matrix defect detection probe according to claim 1 is characterized in that: The outer shell is made of high temperature resistant material.

3. The magnetic potential matrix defect detection probe according to claim 1 is characterized in that: The probe assembly includes a needle, a needle tube and an elastic member; the needle is clamped at the end of the needle tube; the elastic member is arranged in the needle tube, one end of which abuts against the top of the needle tube and the other end abuts against the end of the needle.

4. The magnetic potential matrix defect detection probe according to claim 3 is characterized in that: The elastic member is a spring.

5. The magnetic potential matrix defect detection probe according to claim 1 is characterized in that: It also includes an inner shell, which is arranged in the outer shell, has a second through hole arranged inside, and a bottom arranged on the top surface of the permanent magnet, and the probe assembly and the wire are arranged in the second through hole.

6. The magnetic potential matrix defect detection probe according to claim 5, characterized in that: The second through hole is filled with electronic potting glue.

7. The magnetic potential matrix defect detection probe according to claim 1 is characterized in that: The wire is connected to the probe assembly by welding.

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