Metallographic analysis auxiliary film

Abstract

The utility model provides a metallographic analysis auxiliary film which comprises a grid coordinate film, the grid coordinate film is used for being attached to an observation surface of a sample, the grid coordinate film is of a grid-shaped hollow structure, the grid coordinate film comprises a plurality of solid structure lines which are arranged in a staggered mode, the plurality of solid structure lines are divided into a plurality of hollow observation holes, and the observation holes are communicated with the grid coordinate film. The observation holes are exposed out of the observation surface, positioning coordinates are marked on the solid structure line, and the positions of the observation holes are respectively positioned through the positioning coordinates. By adopting the scheme, the position of each observation hole can be accurately distinguished through the positioning coordinates on the solid structure line, so that after the characteristic tissue of the metallographic sample is observed under the metallographic microscope, the position of the characteristic tissue can be recorded through the coordinates, and when the metallographic sample is observed under the scanning electron microscope, the position of the characteristic tissue can be accurately distinguished. And the position of the characteristic tissue can be quickly found through the recorded coordinates, so that quick observation is realized, the analysis efficiency is improved, and the use cost is reduced.

Description

Technical Field

[0001] The utility model relates to the technical field of metallographic testing, in particular to a metallographic analysis auxiliary film. Background Art

[0002] Microstructure analysis of metal materials is a key means to deeply explore the internal structure of materials. This process usually relies on various types of equipment to observe the structure. These devices have different magnifications, so the organizational information obtained is also unique. If the microstructure observation equipment is classified according to magnification and operation complexity, it can be divided into metallographic microscopes, scanning electron microscopes, and transmission electron microscopes.

[0003] Metallographic microscopes are widely popular in enterprises and universities due to their relatively low cost and convenient operation. However, their magnification is relatively limited, and they cannot be combined with energy spectrum equipment like scanning electron microscopes and transmission electron microscopes to analyze micro-area components. Therefore, if characteristic structures are observed under a metallographic microscope, further analysis of the morphology or composition needs to be performed under a scanning electron microscope.

[0004] At present, the common operation process is to first use a metallographic microscope to make a preliminary observation of the microstructure, identify the characteristic structure, and then manually mark a macroscopic characteristic area on the sample. Subsequently, the manually marked macroscopic characteristic area is further observed under a scanning electron microscope, and the characteristic structure is located, so as to further magnify and analyze the characteristic structure or perform energy spectrum analysis. However, this operation method has significant problems: the characteristic structure magnified hundreds of times under a metallographic microscope is difficult to accurately correspond under the macroscopic mark, especially when looking for these characteristic areas under a scanning electron microscope, the difficulty of finding is increased due to inconsistent image contrast, which is not only inefficient, but also wastes the precious machine time of the scanning electron microscope, and increases unnecessary usage costs. Utility Model Content

[0005] The utility model provides a metallographic analysis auxiliary film, so as to realize that characteristic structures observed under a metallographic microscope can also be quickly observed under a scanning electron microscope, so as to improve analysis efficiency and reduce use cost.

[0006] In order to achieve the above-mentioned purpose, the utility model provides a metallographic analysis auxiliary film, including a grid coordinate film, which is used to be attached to the observation surface of the metallographic sample. The grid coordinate film is a grid-shaped hollow structure, and the grid coordinate film includes a plurality of staggered solid structure lines, and the plurality of solid structure lines divide a plurality of hollow observation holes, and the observation holes expose the observation surface. Positioning coordinates are marked on the solid structure lines, and the position of each observation hole is located respectively by the positioning coordinates.

[0007] Further, the multiple entity structure lines are straight lines arranged in rows and columns, and the multiple observation holes are rectangular holes arranged in rows and columns.

[0008] Further, each entity structure line is divided into multiple line segments, and at least a part of the line segments are marked with individual positioning coordinates. Each observation hole is surrounded by four of the line segments.

[0009] Further, the grid coordinate film is made of an opaque conductive material.

[0010] Further, the material of the grid coordinate film is indium tin oxide or polyethylenedioxythiophene.

[0011] Further, the line width of the entity structure lines of the grid coordinate film is 0.01 mm to 1 mm.

[0012] Further, the area of the observation hole is 0.0001 mm 2 ~2 mm 2 .

[0013] Further, the thickness of the grid coordinate film is 0.01 mm to 0.5 mm.

[0014] Further, the metallographic analysis auxiliary film also includes a first protective film and a second protective film. The grid coordinate film is located between the first protective film and the second protective film. One side of the first protective film facing the grid coordinate film has an adhesive material and is bonded to the grid coordinate film. One side of the grid coordinate film facing the second protective film has an adhesive material and is bonded to the second protective film.

[0015] Further, the first protective film and the second protective film are made of a transparent material.

[0016] Applying the technical solution of the present invention, there is provided a metallographic analysis auxiliary film, including a grid coordinate film. The grid coordinate film is used to be attached to the observation surface of a sample. The grid coordinate film is a grid-like hollow structure. The grid coordinate film includes multiple intersecting entity structure lines. The multiple entity structure lines divide into multiple hollow observation holes. The observation holes expose the observation surface. The entity structure lines are marked with positioning coordinates, and the positions of each observation hole are respectively located through the positioning coordinates. With this solution, the observation surface of the metallographic sample is divided into multiple observation areas by the grid coordinate film, that is, the positions corresponding to the multiple observation holes, and the positions of each observation hole and observation area can be accurately distinguished through the positioning coordinates on the entity structure lines. In this way, after observing the characteristic structure of the metallographic sample under a metallographic microscope, the position of the characteristic structure can be recorded through the coordinates. Then, when observing the metallographic sample under a scanning electron microscope, the position of the characteristic structure can be quickly found through the recorded coordinates, thereby realizing rapid observation, improving the analysis efficiency and reducing the usage cost. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] The accompanying drawings forming a part of this application are used to provide a further understanding of the present utility model. The schematic embodiments and descriptions thereof of the present utility model are used to explain the present utility model and do not constitute an improper limitation to the present utility model. In the drawings:

[0018] Figure 1 A schematic diagram of the metallographic analysis auxiliary film provided by the embodiment of the present utility model is shown;

[0019] Figure 2 Another schematic diagram of the metallographic analysis auxiliary film provided by the embodiment of the present utility model is shown;

[0020] Figure 3 Shows Figure 1 A cross-sectional view of the metallographic analysis auxiliary film in the thickness direction in;

[0021] Figure 4 A partial enlarged view of the grid coordinate film in the metallographic analysis auxiliary film in the embodiment of the present utility model is shown;

[0022] Figure 5 A schematic diagram of the use of the metallographic analysis auxiliary film provided by the embodiment of the present utility model is shown.

[0023] Among them, the above-mentioned drawings include the following drawing coordinates:

[0024] 100, grid coordinate film;

[0025] 110, solid structure line;

[0026] 120, observation hole;

[0027] 130, positioning coordinate;

[0028] 200, first protective film;

[0029] 300, second protective film;

[0030] 400, metallographic sample. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0031] The technical solutions in the embodiments of the present utility model will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present utility model. Obviously, the described embodiments are only a part of the embodiments of the present utility model, rather than all the embodiments. The following description of at least one exemplary embodiment is actually illustrative only and in no way serves as any limitation to the present utility model and its application or use. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present utility model without creative efforts shall fall within the scope of protection of the present utility model.

[0032] As Figures 1 to 5 shown in the figure, an embodiment of the present utility model provides an auxiliary film for metallographic analysis, including a grid coordinate film 100. The grid coordinate film 100 is used to adhere to the observation surface of a metallographic sample 400. The grid coordinate film 100 is a grid-like hollow structure. The grid coordinate film 100 includes a plurality of intersecting solid structure lines 110. The plurality of solid structure lines 110 divide into a plurality of hollow observation holes 120. The observation holes 120 expose the observation surface. Positioning coordinates 130 are marked on the solid structure lines 110. The positions of each of the observation holes 120 are located respectively through the positioning coordinates 130.

[0033] Adopting this solution, the observation surface of the metallographic sample is divided into a plurality of observation areas through the grid coordinate film 100, that is, the positions corresponding to the plurality of observation holes 120. And the positions of each observation hole 120 and the observation area can be accurately distinguished through the positioning coordinates 130 on the solid structure lines 110. After observing the characteristic tissue of the metallographic sample 400 under a metallographic microscope, the position of the characteristic tissue can be recorded through the coordinates. Then when observing the metallographic sample 400 under a scanning electron microscope, the position of the characteristic tissue can be quickly found through the recorded coordinates, thus realizing rapid observation, improving the analysis efficiency and reducing the use cost.

[0034] Among them, the plurality of solid structure lines 110 are straight lines arranged in rows and columns, and the plurality of observation holes 120 are rectangular holes arranged in rows and columns. Through the above settings, the plurality of observation holes 120 are regularly distributed, which is convenient for regularly dividing the observation surface, convenient for setting the positioning coordinates 130 and finding the positions.

[0035] As Figure 2 and Figure 4 shown in the figure, each of the solid structure lines 110 is divided into a plurality of line segments. At least a part of the line segments are marked with separate positioning coordinates 130. Each of the observation holes 120 is surrounded by four of the line segments. In this way, the observation holes 120 at the corresponding positions can be located through the positioning coordinates 130 on the line segments.

[0036] In Figure 4 , (1, 1), (1, 2), (2, 1), (2, 2) are the schematic diagrams of the positioning coordinates 130.

[0037] Among them, the grid coordinate film 100 is made of an opaque conductive material. By using an opaque material, the positions of the solid structure lines 110 and the observation holes 120 can be clearly seen. The grid coordinate film 100 adopts a conductive material to meet the use requirements of a scanning electron microscope.

[0038] Specifically, the material of the grid coordinate film 100 is indium tin oxide or polyethylenedioxythiophene.

[0039] In this solution, the line width of the solid structure line 110 of the grid coordinate film 100 is 0.01 mm to 1 mm. The specific line width value is set according to the usage requirements, and it is necessary to ensure that the solid structure line 110 is not easily broken and does not overly block the observation surface. The solid structure line 110 can be processed by laser etching to ensure accuracy.

[0040] Among them, the area of the observation hole 120 is 0.0001 mm 2 ~2 mm 2 . The specific size of the observation hole 120 is set according to the usage requirements.

[0041] In this solution, the thickness of the grid coordinate film 100 is 0.01 mm to 0.5 mm.

[0042] Furthermore, the metallographic analysis auxiliary film also includes a first protective film 200 and a second protective film 300. The grid coordinate film 100 is located between the first protective film 200 and the second protective film 300. The side of the first protective film 200 facing the grid coordinate film 100 has an adhesive material and is bonded to the grid coordinate film 100. The side of the grid coordinate film 100 facing the second protective film 300 has an adhesive material and is bonded to the second protective film 300.

[0043] The first protective film 200 and the second protective film 300 can protect the grid coordinate film 100. When using the grid coordinate film 100, the first protective film 200 and the second protective film 300 are removed.

[0044] Among them, the first protective film 200 and the second protective film 300 are made of transparent materials. This makes it convenient to determine the position of the grid coordinate film 100 and the direction of the solid structure line 110 during pasting.

[0045] During use, first tear off the second protective film 300, and stick the first protective film 200 and the grid coordinate film 100 together on the observation surface of the metallographic sample 400. The grid coordinate film 100 covers the entire observation surface. Then tear off the first protective film 200 from the grid coordinate film 100, and only leave the grid coordinate film 100 on the sample. Then place the sample under a metallographic microscope to observe the tissue. After finding the characteristic tissue that needs further analysis, record the coordinates of the grid where the characteristic tissue is located. Then place the sample under a scanning electron microscope, and quickly locate the characteristic tissue according to the recorded coordinates and conduct further analysis. In this way, it is possible to realize that the tissue obtained under a metallographic microscope can also be observed and analyzed in situ under a scanning electron microscope.

[0046] The above are only optional embodiments of this solution and are not used to limit this solution. For those skilled in the art, this solution can have various changes and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of this solution shall be included within the protection scope of this solution.

[0047] It should be noted that the terms used herein are only for describing specific embodiments and are not intended to limit the exemplary embodiments according to the present application. As used herein, unless the context clearly indicates otherwise, the singular form is also intended to include the plural form. In addition, it should be understood that when the terms "comprise" and / or "include" are used in this specification, they indicate the presence of features, steps, operations, devices, components, and / or combinations thereof.

[0048] Unless otherwise specifically stated, the relative arrangements, numerical expressions, and numerical values of the components and steps set forth in these embodiments do not limit the scope of this solution. At the same time, it should be understood that for the convenience of description, the dimensions of the various parts shown in the drawings are not drawn in actual proportional relationships. Technologies, methods, and devices known to those of ordinary skill in the relevant art may not be discussed in detail, but where appropriate, the said technologies, methods, and devices should be regarded as part of the specification. In all the examples shown and discussed herein, any specific value should be construed as merely exemplary and not as a limitation. Therefore, other examples of the exemplary embodiments may have different values. It should be noted that like reference numerals and letters denote like items in the following drawings, and thus, once an item is defined in one drawing, it does not need to be further discussed in subsequent drawings.

[0049] In the description of this solution, it should be understood that the orientation or positional relationships indicated by orientation words such as "front, rear, upper, lower, left, right", "lateral, vertical, perpendicular, horizontal", and "top, bottom" are generally based on the orientation or positional relationships shown in the drawings, and are only for the convenience of describing this solution and simplifying the description. Without contrary instructions, these orientation words do not indicate and imply that the device or element referred to must have a specific orientation or be constructed and operated in a specific orientation, and thus cannot be construed as limiting the protection scope of this solution; the orientation words "inside, outside" refer to the inside and outside relative to the contour of each component itself.

[0050] For ease of description, spatial relative terms, such as "above", "over", "on the upper surface", "upper", etc., may be used herein to describe the spatial positional relationship of one device or feature to other devices or features as shown in the figures. It should be understood that the spatial relative terms are intended to encompass different orientations in use or operation in addition to the orientation depicted in the figures. For example, if the device in the figures is inverted, a device described as "above" or "over" other devices or structures will then be positioned "below" or "under" the other devices or structures. Thus, the exemplary term "above" can include both the orientations of "above" and "below". The device may also be positioned in other different ways (rotated 90 degrees or in other orientations), and the corresponding interpretations of the spatial relative descriptions used herein will be made accordingly.

[0051] In addition, it should be noted that the use of terms such as "first" and "second" to limit components is only for the convenience of differentiating the corresponding components. Without additional statements, the above terms have no special meanings, and thus should not be construed as limiting the protection scope of the present solution.

Claims

1. A metallographic analysis auxiliary film, characterized in that: The invention comprises a grid coordinate film (100), wherein the grid coordinate film (100) is used to be attached to the observation surface of a metallographic sample (400), the grid coordinate film (100) is a grid-shaped hollow structure, the grid coordinate film (100) comprises a plurality of staggered solid structure lines (110), the plurality of solid structure lines (110) divide a plurality of hollow observation holes (120), the observation holes (120) expose the observation surface, and positioning coordinates (130) are marked on the solid structure lines (110), and the position of each observation hole (120) is respectively located by the positioning coordinates (130).

2. The metallographic analysis auxiliary film according to claim 1, characterized in that: The plurality of entity structure lines (110) are straight lines arranged in rows and columns, and the plurality of observation holes (120) are rectangular holes arranged in rows and columns.

3. The metallographic analysis auxiliary film according to claim 2, characterized in that: Each of the physical structure lines (110) is divided into a plurality of line segments, at least a portion of the line segments are marked with separate positioning coordinates (130), and each of the observation holes (120) is surrounded by four of the line segments.

4. The metallographic analysis auxiliary film according to claim 1, characterized in that: The grid coordinate film (100) is made of an opaque conductive material.

5. The metallographic analysis auxiliary film according to claim 4, characterized in that: The material of the grid coordinate film (100) is indium tin oxide or polyethylene dioxythiophene.

6. The metallographic analysis auxiliary film according to claim 1, characterized in that: The line width of the entity structure line (110) of the grid coordinate film (100) is 0.01 mm to 1 mm.

7. The metallographic analysis auxiliary film according to claim 1, characterized in that: The area of ​​the observation hole (120) is 0.0001 mm 2 ~2mm 2 .

8. The metallographic analysis auxiliary film according to claim 1, characterized in that: The grid coordinate film (100) has a thickness of 0.01 mm to 0.5 mm.

9. The metallographic analysis auxiliary film according to claim 1, characterized in that: The metallographic analysis auxiliary film further comprises a first protective film (200) and a second protective film (300); the grid coordinate film (100) is located between the first protective film (200) and the second protective film (300); a side of the first protective film (200) facing the grid coordinate film (100) has an adhesive and is bonded to the grid coordinate film (100); a side of the grid coordinate film (100) facing the second protective film (300) has an adhesive and is bonded to the second protective film (300).

10. The metallographic analysis auxiliary film according to claim 9, characterized in that: The first protective film (200) and the second protective film (300) are made of transparent materials.

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