Test fixture for direct insertion device

Abstract

The utility model discloses a test fixture for a direct insertion device. The test fixture comprises a device clamping groove, a spring ejector pin, a PCB and a fixing module. The spring ejector pin is arranged in the device clamping groove, the PCB is electrically connected with the spring ejector pin, and the fixing module fixes a device to be tested in the device clamping groove. According to the utility model, through the arrangement of the spring ejector pin, test points can be accurately arranged on the pins of the in-line device, so that errors of different test results caused by different insertion depths of the pins in the test process of the conventional clamp are solved, and more accurate on-resistance can be tested when the in-line device is tested; through cooperation of the device clamping groove, the spring ejector pin and the fixing module, direct insertion device testing is achieved, the insertion and extraction process of an existing testing clamp is avoided, and therefore the problem that a pin coating is abraded due to friction between an electrode plate of the existing clamp and a pin is solved.

Description

Technical Field

[0001] The utility model belongs to the technical field of device testing, and particularly relates to a test fixture for through-hole devices. Background Art

[0002] At present, most of the test fixtures used for through-hole devices are plug-and-play types. As Figure 5 shown, during the test process of such fixtures, the device legs need to be inserted into the contact electrode pieces of the fixture. In order to ensure ohmic contact, such fixtures often need to clamp the legs with a large force, which causes the plating layer of the device legs to be scratched by the fixture electrodes during the plugging and unplugging process of the test, affecting the appearance quality. On the other hand, due to the long contact electrodes of the plug-and-play fixture, when testing some low on-resistance devices with such a fixture, the test result of the on-resistance has a large error, affecting the accuracy of the product test result. Summary of the Utility Model

[0003] To solve the above problems, the utility model provides a test fixture for through-hole devices.

[0004] The utility model is achieved through the following technical solutions.

[0005] A test fixture for through-hole devices provided by the utility model includes a device card slot, spring pins, a PCB board, and a fixing module; the spring pins are arranged in the device card slot, the PCB board is electrically connected to the spring pins, and the fixing module fixes the device to be tested in the device card slot.

[0006] Preferably, the fixing module includes a pressure knob and a spring pressing block, the spring pressing block is connected to the device card slot, and the pressure knob is connected to the spring pressing block.

[0007] Preferably, test leads are arranged on the PCB board, and the test leads are electrically connected to the spring pins.

[0008] Preferably, it further includes a wire management box, and the test leads pass through the wire management box.

[0009] Preferably, wiring posts are arranged on the wire management box, and the wiring posts are electrically connected to the test leads.

[0010] Preferably, it further includes fixture pins, and the fixture pins are connected to the PCB board.

[0011] Preferably, a hinge is arranged on the device card slot, and the hinge is connected to the spring pressing block.

[0012] The beneficial effects of the utility model are as follows:

[0013] 1. Through the setting of the spring pin, the test points can be accurately set on the pins of through-hole devices, solving the error that the test results are different due to different insertion depths of the pins in the previous fixture during the test, enabling a more accurate conduction resistance to be measured when testing through-hole devices;

[0014] 2. Through the cooperation of the device slot, spring pin and fixing module, the testing of through-hole devices is realized, avoiding the plugging and unplugging process of the previous test fixture, thus solving the problem of the wear of the pin plating layer caused by the friction between the electrode plate of the previous fixture and the pin. Brief Description of the Drawings

[0015] Figure 1 is the schematic diagram of the overall structure provided by the embodiment of the present invention;

[0016] Figure 2 is the schematic diagram of the closed structure of the fixing module provided by the embodiment of the present invention;

[0017] Figure 3 is the side sectional view of the overall structure provided by the embodiment of the present invention;

[0018] Figure 4 is the schematic diagram of the spring pin structure provided by the embodiment of the present invention;

[0019] Figure 5 is the schematic diagram of the plug-in type test fixture structure of the prior art.

[0020] In the figure: 1 - device slot, 2 - spring pin, 3 - PCB board, 4 - pressure knob, 5 - spring pressing block, 6 - test lead, 7 - wire management box, 8 - terminal, 9 - fixture pin, 10 - hinge, 11 - device under test. Detailed Embodiments

[0021] The technical solutions of the present invention will be further described below, but the scope of protection is not limited thereto.

[0022] As Figures 1-4 shown, a test fixture for through-hole devices includes a device slot 1, a spring pin 2, a PCB board 3 and a fixing module; the spring pin 2 is arranged in the device slot 1, the PCB board 3 is electrically connected to the spring pin 2, and the fixing module fixes the device under test 11 in the device slot 1.

[0023] The device slot 1 is used to place the device under test 11 and fix the spring pin 2;

[0024] The spring pin 2 is used to form an ohmic contact with the device under test 11 during the test. Due to the use of a spring, the spring pin 2 ensures stable contact with the device under test 11 under the action of elastic force, is not easily broken, and ensures accurate and reliable test results;

[0025] The PCB board 3 has circuits and forms an electrical connection with the spring thimble 2 to lead out the circuit of the spring thimble 2, serving as test pins and can be connected to other circuits;

[0026] The fixing module is used to fix the device to be tested, ensuring that the device under test 11 is stably placed in the device slot 1 and ensuring a stable contact connection between the spring thimble 2 and the device under test 11.

[0027] The fixing module includes a pressure knob 4 and a spring pressing block 5. The spring pressing block 5 is connected to the device slot 1, and the pressure knob 4 is connected to the spring pressing block 5.

[0028] The spring pressing block 5 directly contacts the device under test 11 to fix the device under test 11; the pressure knob 4 is used to adjust the pressure of the spring pressing block 5 so that the test fixture is applicable to different through-hole devices.

[0029] The PCB board 3 is provided with test leads 6, and the test leads 6 are electrically connected to the spring thimbles 2.

[0030] The test leads 6 are used to lead out the test pins, electrically connect with the spring thimbles 2 to form a current path, and are convenient to be connected to other PCB boards or circuits.

[0031] It further includes a wire management box 7, and the test leads 6 pass through the wire management box 7.

[0032] After setting the wire management box 7, the test leads 6 can pass through the wire management box 7 and be placed therein to ensure that the test leads 6 will not be entangled and knotted, which is convenient for taking and transportation.

[0033] The wire management box 7 is provided with terminal posts 8, and the terminal posts 8 are electrically connected to the test leads 6.

[0034] After setting the terminal posts 8, the test leads 6 can be directly electrically connected to the terminal posts 8. Just connect the power supply and the test instrument directly to the terminal posts 8 to realize the test of the through-hole device, making the test fixture an independent module and facilitating use.

[0035] It further includes fixture pins 9, and the fixture pins 9 are connected to the PCB board 3.

[0036] The fixture pins 9 are used to fix the test fixture and can be connected to other equipment or PCB boards. In this embodiment, the fixture is fixed on the wire management box 7 through the fixture pins 9, making the test fixture an independent module, which is convenient for use, taking and transportation.

[0037] The device slot 1 is provided with a hinge 10, and the hinge 10 is connected to the spring pressing block 5.

[0038] The fixed module and the device slot 1 can be connected or separated. In this embodiment, a hinge 10 is provided to connect the spring pressing block 5, and the spring pressing block 5 can be pressed down to fix the device under test 11. The setting of the hinge 10 makes the test fixture easy to carry and avoids the loss of the fixed module, resulting in the inability to use the test fixture.

[0039] The usage method of the present utility model: Place the device to be tested into the device slot 1, lower the spring pressing block 5, and the pressure of the spring pressing block 5 can be controlled by adjusting the pressure knob 4 according to different products. The device under test 11 is fixed in the device slot 1, and at the same time, the pins of the device will form an ohmic contact with the spring thimble 2 below. The PCB board 3 is electrically connected to the spring thimble 2, and the test pins of the test fixture are led out. After connecting the test pins to the test station, the test can be carried out.

[0040] The present utility model enables through-hole devices such as TO-220, TO-247, TO-264, etc. to measure more accurate on-resistance during testing.

[0041] Using the test fixture provided by the present utility model and the plug-in test fixture of the prior art to test the same through-hole device, the test is carried out at the same test station and under the same test conditions. The test results are as follows in the table:

[0042]

[0043]

[0044] From the test results, it can be seen that the on-resistance measured by the fixture of the present utility model has better consistency, effectively reducing the on-resistance of the test fixture itself, and thus making the test results more accurate.

[0045] Through the setting of the spring thimble 2 in the present utility model, the test points can be accurately set on the pins of through-hole devices, solving the error in the prior fixture during testing due to different depths of pin insertion, enabling more accurate on-resistance to be measured during the testing of through-hole devices;

[0046] Through the cooperation of the device slot 1, the spring thimble 2 and the fixed module, the testing of through-hole devices is realized, avoiding the plugging and unplugging process of the prior test fixture, thus solving the problem of pin plating wear caused by the friction between the electrode plate of the prior fixture and the pins.

Claims

1. A test fixture for a through-hole device, characterized in that: The device comprises a device slot (1), a spring ejector pin (2), a PCB board (3) and a fixing module; the spring ejector pin (2) is arranged in the device slot (1), the PCB board (3) is electrically connected to the spring ejector pin (2), and the fixing module fixes the device to be tested in the device slot (1).

2. A test fixture for a through-hole device as claimed in claim 1, characterized in that: The fixing module comprises a pressure knob (4) and a spring pressure block (5), wherein the spring pressure block (5) is connected to the device slot (1), and the pressure knob (4) is connected to the spring pressure block (5).

3. A test fixture for a through-hole device as claimed in claim 1, characterized in that: A test lead (6) is provided on the PCB board (3), and the test lead (6) is electrically connected to the spring ejector pin (2).

4. A test fixture for a through-hole device as claimed in claim 3, characterized in that: It also comprises a wire management box (7), through which the test lead (6) passes.

5. A test fixture for a through-hole device as claimed in claim 4, characterized in that: The wire management box (7) is provided with a terminal post (8), and the terminal post (8) is electrically connected to the test lead (6).

6. A test fixture for a through-hole device as claimed in claim 1, characterized in that: It also includes a clamp pin (9), wherein the clamp pin (9) is connected to the PCB board (3).

7. A test fixture for a through-hole device as claimed in claim 1, characterized in that: The device slot (1) is provided with a hinge (10), and the hinge (10) is connected to a spring pressure block (5).

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