Universal LED test fixture

Abstract

The utility model relates to the technical field of flexible circuit board production, in particular to a universal LED test fixture which comprises a base, a support and a test assembly, and the base is provided with a placement area for a circuit board to be tested; the bracket is arranged on the base; the testing assembly is arranged on the support and comprises a lifting adjusting piece, a testing frame, an adjusting rod, a first probe and a second probe, the lifting assembly is connected to the support in a sliding mode, the testing frame is arranged at the bottom end of the lifting assembly, the first probe and the second probe are arranged at the bottom end of the testing frame, and after the adjusting rod adjusts the distance between the first probe and the second probe, the first probe and the second probe are arranged on the lifting assembly. The lifting assembly moves downwards to enable the first probe and the second probe to move downwards to be in butt joint with positive and negative electrodes of the to-be-tested circuit board. The distance between the first probe and the second probe can be adjusted, so that the device can adapt to testing of circuit boards of various different models, and is high in universality. Meanwhile, the jig is used for testing, so that the defects of bonding pad pressure points, pressure damage, scratches, false testing and the like caused by manual testing by using a universal meter are reduced, and the product quality is improved.

Description

Technical Field

[0001] The utility model relates to the technical field of flexible circuit board production, and particularly relates to a general-purpose LED test fixture. Background Art

[0002] An LED lamp is a light-emitting diode, which is a commonly used light-emitting device. Usually, a solid semiconductor chip is used as the light-emitting material. Compared with traditional lamps, LED lamps are energy-saving, environmentally friendly, have good color rendering and response speed, and have a wide range of uses in modern society, such as lighting, flat panel displays, medical devices, smartphones, etc. The LED lamps used in smartphones mainly provide lighting for the camera module. LEDs are usually attached to the surface of the flexible circuit board in the SMT manner. After SMT, the product needs to be subjected to functional tests to test the welding performance and conduction performance of the LEDs and the flexible circuit board.

[0003] Due to the differences in the internal camera module structures of mobile phones, the shapes of FPCs are also different. Therefore, different products require different test fixtures, resulting in a relatively high cost of the fixtures. If an artificial multimeter is used for testing, it is easy to cause defects such as pad pressing points, pressing injuries, scratches, and mismeasurement, resulting in a decline in product quality and yield. Therefore, there is an urgent need to design a brand-new structure of LED test fixture that can be freely adjusted according to the shapes of different products to make it a general-purpose LED test fixture, thereby reducing production costs and improving product quality and yield. Summary of the Utility Model

[0004] The purpose of the utility model is to provide a general-purpose LED test fixture to solve the problem of LED function testing for flexible circuit boards of different shapes.

[0005] To achieve the above purpose, the technical solution adopted by the utility model is to provide a general-purpose LED test fixture, which includes a base, a bracket, and a test component. A placement area for the circuit board to be tested is provided on the base; the bracket is arranged on the base; the test component is arranged on the bracket and includes a lifting adjustment member, a test frame, an adjustment rod, a first probe, and a second probe. The lifting adjustment member is slidably connected to the bracket. The test frame is provided at the bottom end of the lifting adjustment member. The first probe and the second probe are provided at the bottom end of the test frame. After the adjustment rod adjusts the distance between the first probe and the second probe, the lifting adjustment member moves downward so that the first probe and the second probe move downward to be connected to the positive and negative poles of the circuit board to be tested.

[0006] Further, the test fixture includes a fixing plate, a first mounting block, and a second mounting block. The fixing plate is fixed to the bottom end of the lifting adjustment member. The first mounting block is fixed to the fixing plate, and the first probe is fixed on the first mounting block. The second probe is fixed on the second mounting block. The adjusting rod drives the second mounting block to be slidably connected to the fixing plate.

[0007] Further, a chute is provided on the fixing plate, and a slider is provided on the second mounting block. The slider is embedded in the chute and slides along the chute. The adjusting rod is a threaded rod, and the threaded rod passes through the slider and is threadedly connected to the slider.

[0008] Further, a rotating knob is provided at the end of the adjusting rod.

[0009] Further, the lifting adjustment member includes a guiding plate. A guiding column is provided on the bracket. The bottom end of the guiding plate is fixed with the fixing plate, and the guiding plate is slidably connected to the guiding column.

[0010] Further, the guiding column passes through the guiding plate. There are at least two guiding columns, and at least two of the guiding columns are arranged near the two ends of the guiding plate.

[0011] Further, the lifting adjustment member further includes a sliding rod. A limiting groove is provided on the bracket, and the sliding rod is slidably connected to the limiting groove.

[0012] Further, the lifting adjustment member further includes a handle. The top end of the sliding rod extends out of the limiting groove, and the handle is provided at the top end of the sliding rod. The handle can lift and lower the sliding rod.

[0013] Further, the handle is rotatably connected to the circumference of the sliding rod.

[0014] Further, the test jig further includes a display screen, and the display screen is fixed on the base.

[0015] The beneficial effects of the present utility model are as follows:

[0016] 1. According to the positions of the positive and negative electrode pads of the circuit board to be tested, the distance between the first spring needle and the second spring needle is adjusted by the adjusting rod, so that the positions of the two probes finally match the positive and negative electrode pads of the circuit board to be tested. By moving down the lifting adjustment member, the test fixture drives the two probes to move down as a whole to contact the positive and negative electrode pads, and the circuit board can be tested after being powered on. The distance between the first probe and the second probe in this application can be adjusted, which can be adapted to the testing of various different types of circuit boards, has strong versatility and high testing efficiency. At the same time, using the jig for testing reduces the defects such as pad pressing points, pressing injuries, scratches and mismeasurement caused by manually using a multimeter for testing, thereby achieving the purpose of improving the product quality and yield.

[0017] 2. The fixing plate is provided with a sliding groove, and the second mounting block is provided with a sliding block. The sliding block is embedded in the sliding groove and slides along the sliding groove. The adjusting rod is a threaded rod, and the threaded rod passes through the sliding block and is threadedly connected to the sliding block. After rotating the threaded rod, the sliding block can slide along the sliding groove. After the sliding block slides, it drives the whole of the second mounting block to move. At this time, the second probe moves synchronously with the second mounting block, realizing the adjustment of the distance between the first probe and the second probe.

[0018] 3. The lifting adjustment member includes a guide plate. The bracket is provided with a guide post, and the bottom end of the guide plate is fixed with a fixing plate. The guide plate is slidably connected to the guide post. By setting the guide plate, the test frame can only move in the vertical direction, which is convenient for the probe to accurately dock with the pad of the circuit board to be tested.

[0019] 4. The lifting adjustment member further includes a handle. The top end of the sliding rod extends out of the sliding groove, and the top end of the sliding rod is provided with a handle. The handle can lift and lower the sliding rod. The handle is rotatably connected to the circumference of the sliding rod. After the handle is rotated to a suitable position, the sliding rod can be lifted and lowered. Description of the Drawings

[0020] In order to more clearly illustrate the specific embodiments of the present invention or the technical solutions in the prior art, the following will briefly introduce the drawings required for use in the description of the specific embodiments or the prior art. Obviously, the drawings in the following description are some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings.

[0021] Figure 1 It is a schematic three-dimensional structure diagram of a general-purpose LED test fixture provided by an embodiment of the present invention;

[0022] Figure 2 It is Figure 1 An enlarged view of part A in

[0023] Description of the Reference Numerals:

[0024] 1. Base; 2. Bracket; 21. Limit groove; 3. Test assembly; 31. Lifting adjustment member; 311. Guide plate; 312. Sliding rod; 313. Handle; 32. Test frame; 321. Fixing plate; 3211. Sliding groove; 322. First mounting block; 323. Second mounting block; 3231. Sliding block; 33. Adjusting rod; 331. Rotating knob; 34. First probe; 35. Second probe; 4. Circuit board; 41. Positive pad; 42. Negative pad; 43. LED module; 5. Display screen. Detailed Embodiments

[0025] The technical solution of the present utility model will be clearly and completely described below in conjunction with the accompanying drawings. Obviously, the described embodiments are part of the embodiments of the present utility model, rather than all embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present utility model without creative work shall fall within the protection scope of the present utility model.

[0026] In the description of the present utility model, it should be noted that the orientation or positional relationship indicated by the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc. is based on the orientation or positional relationship shown in the accompanying drawings. It is only for the convenience of describing the present utility model and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be construed as a limitation to the present utility model. In addition, the terms "first", "second", and "third" are only used for descriptive purposes and cannot be understood as indicating or implying relative importance.

[0027] In the description of the present utility model, it should be noted that unless otherwise clearly specified and limited, the terms "installation", "connection", and "connection" should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be directly connected or indirectly connected through an intermediate medium, and it can be the communication inside two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the present utility model can be understood according to specific situations.

[0028] In addition, the technical features involved in different embodiments of the present utility model described below can be combined with each other as long as they do not conflict with each other.

[0029] Referring to Figure 1 and 2 , as a general-purpose LED test fixture provided by an embodiment of the present utility model, it includes a base 1, a bracket 2, and a test component 3. A placement area for a circuit board 4 to be tested is provided on the base 1; the bracket 2 is arranged on the base 1; the test component 3 is arranged on the bracket 2 and includes a lifting adjustment member 31, a test frame 32, an adjustment rod 33, a first probe 34, and a second probe 35. The lifting adjustment member 31 is slidably connected to the bracket 2. A test frame 32 is provided at the bottom end of the lifting adjustment member 31. The first probe 34 and the second probe 35 are provided at the bottom end of the test frame 32. After the adjustment rod 33 adjusts the distance between the first probe 34 and the second probe 35, the lifting adjustment member 31 moves downward so that the first probe 34 and the second probe 35 move downward to dock with the positive and negative electrodes of the circuit board 4 to be tested.

[0030] According to the positions of the positive and negative pads 42 of the circuit board 4 to be tested, the distance between the first spring pin and the second spring pin is adjusted by the adjusting rod 33, and finally the positions of the two probes are matched with the positive and negative pads 42 of the circuit board 4 to be tested. By moving down the lifting adjustment member 31, the test frame 32 drives the two probes to move down as a whole to contact the positive and negative pads 42, and the circuit board 4 can be tested after being powered on. The distance between the first probe 34 and the second probe 35 in this application can be adjusted, which can adapt to the testing of various different models of circuit boards 4, has strong versatility and high testing efficiency. At the same time, using a jig for testing reduces defects such as pad pressing points, pressing injuries, scratches and mismeasurement caused by manually using a multimeter for testing, thereby achieving the purpose of improving product quality and yield.

[0031] Specifically, the test frame 32 includes a fixing plate 321, a first mounting block 322 and a second mounting block 323. The fixing plate 321 is fixed to the bottom end of the lifting adjustment member 31. The first mounting block 322 is fixed on the fixing plate 321, the first probe 34 is fixed on the first mounting block 322, the second probe 35 is fixed on the second mounting block 323, and the adjusting rod 33 drives the second mounting block 323 to be slidably connected to the fixing plate 321. In this embodiment, a chute 3211 is provided on the fixing plate 321, a slider 3231 is provided on the second mounting block 323, the slider 3231 is embedded in the chute 3211 and slides along the chute 3211. The adjusting rod 33 is a threaded rod, and the threaded rod passes through the slider 3231 and is threadedly connected to the slider 3231. After rotating the threaded rod, the slider 3231 can slide along the chute 3211. After the slider 3231 slides, it drives the whole of the second mounting block 323 to move. At this time, the second probe 35 moves synchronously with the second mounting block 323, realizing the adjustment of the distance between the first probe 34 and the second probe 35. In order to facilitate the hand to drive the rotation of the adjusting rod 33, a rotating knob 331 is fixedly provided at the end of the adjusting rod 33.

[0032] As a variable embodiment, it is also possible to only provide a slider 3231 on the first mounting block 322. The slider 3231 is embedded in the chute 3211 and slides along the chute 3211. The adjusting rod 33 is a threaded rod, and the threaded rod passes through the slider 3231 and is threadedly connected to the slider 3231. Or sliders 3231 are provided on both the first mounting block 322 and the second mounting block 323. At this time, the adjusting rod 33 is a threaded rod, which is provided with a forward thread and a reverse thread. The threaded rod passes through the two sliders 3231 and is threadedly connected to the sliders 3231 respectively. After the adjusting rod 33 rotates, it drives the first mounting block 322 and the second mounting block 323 to move simultaneously, so that the two approach or move away from each other, realizing the adjustment of the distance between the first probe 34 and the second probe 35.

[0033] Further, the lifting and adjusting member 31 includes a guide plate 311. Guide posts are provided on the bracket 2. A fixing plate 321 is fixed to the bottom end of the guide plate 311, and the guide plate 311 is slidably connected to the guide posts. By providing the guide plate 311, the test fixture 32 can only move in the vertical direction, facilitating the precise docking of the probes with the pads of the circuit board 4 to be tested.

[0034] Specifically, the guide posts pass through the guide plate 311. There are at least two guide posts, and at least two guide posts are arranged near the two ends of the guide plate 311. In this embodiment, there are two guide posts, and the two guide posts are arranged near the two ends of the guide plate 311. The guide plate 311 is slidably connected to the guide posts through the provided bushings. The lifting and adjusting member 31 further includes a slide rod 312. A limiting groove 21 is provided on the bracket 2, and the slide rod 312 is slidably connected to the limiting groove 21. The limiting groove 21 is specifically arranged at the middle position of the bracket 2 and is arranged in the vertical direction. The lifting and adjusting member 31 further includes a handle 313. The top end of the slide rod 312 extends out of the limiting groove 21, and a handle 313 is provided at the top end of the slide rod 312. The handle 313 can lift and lower the slide rod 312. The bottom of the slide rod 312 is fixed with the guide plate 311. The slide rod 312 is located at the middle position between the two guide posts. At this time, under the external force drive of the handle 313, the guide plate 311 can be evenly stressed and slide in the guiding direction.

[0035] Further, the handle 313 is rotatably connected to the circumference of the slide rod 312. The handle 313 can be rotated to a suitable position and then the slide rod can be lifted and lowered.

[0036] Further, the general-purpose LED test fixture further includes a display screen 5. The display screen 5 is fixed on the base 1. The display screen 5 is electrically connected to the first probe 34 and the second probe 35, and displays the test results on the display screen 5. After the test, if the display screen 5 shows "pass", it is a good product; if it shows "fail", it is a defective product.

[0037] The use process of the test fixture in this embodiment is as follows:

[0038] First, place the circuit board 4 to be tested on the test area on the base 1. There are an LED module 43, a positive pad 41, and a negative pad 42 on the circuit board 4. Rotate the adjusting rod 33 to adjust the distance between the first probe 34 and the second probe 35, so that the first probe 34 is opposite to the positive pad 41 and the second probe 35 is opposite to the negative pad 42. Turn on the power of the fixture. By pressing down the handle 313, the test fixture 32 drives the probes to move downward as a whole to contact the positive and negative pads 42. After power-on, if the display screen 5 shows "pass", it is a good product; if it shows "fail", it is a defective product. The above steps complete the detection of the LED module 43 on the circuit board 4.

[0039] After the test, lift the handle 313 to open the test fixture 32, take out the products, and place the qualified and unqualified products separately. Pay special attention that the polar positions of the fixture probes should be consistent with the polar positions marked on the positive and negative pads 42 of the circuit board 4.

[0040] The embodiments of this specific implementation manner are all preferred embodiments of the present invention, and do not limit the protection scope of the present invention accordingly. Therefore, all equivalent changes made according to the structure, shape, and principle of the present invention should be covered within the protection scope of the present invention.

Claims

1. A universal LED test fixture, characterized in that: include: A base (1) having an area for placing a circuit board (4) to be tested; A bracket (2) is arranged on the base (1); The test assembly (3) is arranged on the support (2), and comprises a lifting adjustment member (31), a test frame (32), an adjustment rod (33), a first probe (34) and a second probe (35); the lifting adjustment member (31) is slidably connected to the support (2); the test frame (32) is arranged at the bottom end of the lifting adjustment member (31); the first probe (34) and the second probe (35) are arranged at the bottom end of the test frame (32); after the adjustment rod (33) adjusts the distance between the first probe (34) and the second probe (35), the lifting adjustment member (31) moves downward so that the first probe (34) and the second probe (35) move downward to connect with the positive and negative electrodes of the circuit board (4) to be tested.

2. The universal LED test fixture as claimed in claim 1, characterized in that: The test stand (32) comprises a fixed plate (321), a first mounting block (322) and a second mounting block (323); the fixed plate (321) is fixed to the bottom end of the lifting adjustment member (31); the first mounting block (322) is fixed to the fixed plate (321); the first probe (34) is fixed to the first mounting block (322); the second probe (35) is fixed to the second mounting block (323); and the adjusting rod (33) drives the second mounting block (323) to be slidably connected to the fixed plate (321).

3. The universal LED test fixture as claimed in claim 2, characterized in that: The fixing plate (321) is provided with a slide groove (3211), the second mounting block (323) is provided with a slider (3231), the slider (3231) is embedded in the slide groove (3211) and slides along the slide groove (3211), and the adjusting rod (33) is a threaded rod, the threaded rod passes through the slider (3231) and is threadedly connected to the slider (3231).

4. The universal LED test fixture as claimed in claim 3, characterized in that: A rotating knob (331) is provided at the end of the adjusting rod (33).

5. The universal LED test fixture as claimed in claim 2, characterized in that: The lifting and lowering adjusting member (31) comprises a guide plate (311), a guide column is provided on the bracket (2), the fixing plate (321) is fixed to the bottom end of the guide plate (311), and the guide plate (311) is slidably connected to the guide column.

6. The universal LED test fixture as claimed in claim 5, characterized in that: The guide post is passed through the guide plate (311), at least two guide posts are provided, and at least two guide posts are provided near two ends of the guide plate (311).

7. The universal LED test fixture as claimed in claim 5, characterized in that: The lifting and lowering adjustment member (31) further comprises a sliding rod (312), a limiting groove (21) is provided on the bracket (2), and the sliding rod (312) is slidably connected to the limiting groove (21).

8. The universal LED test fixture as claimed in claim 7, characterized in that: The lifting adjustment member (31) further comprises a handle (313), the top end of the sliding rod (312) extends out of the limiting groove (21), the top end of the sliding rod (312) is provided with the handle (313), and the handle (313) can lift and lower the sliding rod (312).

9. The universal LED test fixture as claimed in claim 8, characterized in that: The handle (313) is rotatably connected to the circumference of the slide bar (312).

10. The universal LED test fixture as claimed in claim 1, characterized in that: It also comprises a display screen (5), wherein the display screen (5) is fixed on the base (1).

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