Calibration device for fixing micro hemisphere in grinding and polishing jig

Abstract

The utility model discloses a calibration device for fixing a micro-hemisphere in a grinding and polishing jig, the micro-hemisphere comprises a hemisphere shell and a skirt integrally formed on the outer edge of the opening end of the hemisphere shell, the top surface of the jig is provided with a mounting hole, the device comprises an equal-height column, the equal-height column is provided with a cavity for accommodating the jig, and the cavity is provided with a cavity for accommodating the jig. The top of the equal-height column is provided with a calibration platform, the cavity extends upwards to the lower surface of the calibration platform, and the calibration platform is provided with a through hole with the diameter larger than or equal to the diameter of the outer circle of the hemispherical shell but smaller than the diameter of the outer circle of the skirt edge, so that after the micro hemisphere with the skirt edge penetrates through the through hole, the lower surface of the skirt edge can be attached to the upper surface of the calibration platform. And the lower part of the micro hemisphere can extend into the mounting hole of the jig and is in contact with the bonding material in the mounting hole. According to the utility model, the coaxiality of the micro hemisphere and the jig can be ensured, and the asymmetry of installation is eliminated.

Description

Technical Field

[0001] The utility model relates to the technical field of the preparation of hemispherical resonant gyroscopes, and particularly relates to a calibration device for fixing a micro-hemisphere in a grinding and polishing jig. Background Technique

[0002] The micro-hemisphere belongs to a hemispherical resonant gyroscope, which is a solid wave gyroscope based on the Coriolis effect, has the advantage of low cost, and is an important direction for the future development of gyroscopes. Conventional micro-hemispheres are formed by blowing a planar quartz sheet. Before becoming a finished product for assembly, it is necessary to grind the excess skirt after forming to remove the excess mass and form a smooth, non-chipping, and uniform lip edge to ensure a high quality factor Q value.

[0003] To ensure the accuracy of grinding, multiple measurements are required for feedback. The repeated grinding and measurement are prone to cumulative errors, and it is necessary to solve the error problem of multiple clamping. For this reason, generally, the spherical shell of the micro-hemisphere is bonded into the mounting hole on the top surface of a jig, and the micro-hemisphere and the jig are used as a whole for calibration measurement during the entire grinding stage, so as to ensure the consistency of clamping, measurement, and grinding and avoid the errors caused by repeated positioning.

[0004] The micro-hemisphere targeted by the utility model includes a hemispherical shell and a skirt integrally formed on the outer edge of the opening end of the hemispherical shell, and the top surface of the jig is provided with a mounting hole. Since it is necessary to calibrate the coaxiality of the micro-hemisphere and the jig after the micro-hemisphere is bonded to the mounting hole of the jig to eliminate the asymmetry of the installation, especially for the working condition where the skirt needs to be point-ground, a certain gap is required between the lower surface of the skirt and the upper surface of the jig, so it is impossible to ensure the coaxiality of the micro-hemisphere and the jig by fitting the lower surface of the skirt of the micro-hemisphere with the upper surface of the jig, and a special tooling needs to be set up to calibrate the coaxiality of the two. Summary of the Invention

[0005] The technical problem to be solved by the present invention is to overcome the deficiencies of the prior art and provide a calibration device for fixing a micro-hemisphere in a grinding and polishing jig, which can ensure the coaxiality of the micro-hemisphere and the jig and eliminate the asymmetry of the installation.

[0006] To solve the above technical problem, the present invention adopts the following technical solutions:

[0007] A calibration device for fixing a micro-hemisphere in a grinding and polishing jig, the micro-hemisphere includes a hemispherical shell and a skirt integrally formed on the outer edge of the opening end of the hemispherical shell, the top surface of the jig is provided with a mounting hole, and the device includes an equal-height column,

[0008] The equal-height column has a cavity for accommodating the fixture, and the top of the equal-height column has a calibration platform. The cavity extends upward to the lower surface of the calibration platform. A through-hole is formed on the calibration platform, and the diameter of the through-hole is greater than or equal to the outer diameter of the hemispherical shell but less than the outer diameter of the skirt. After the micro-hemisphere with a skirt passes through the through-hole, the lower surface of the skirt can be attached to the upper surface of the calibration platform, and the lower part of the micro-hemisphere can extend into the mounting hole of the fixture and contact the bonding material in the mounting hole.

[0009] Optionally, a temperature adjustment structure is provided on the outer circumferential surface of the equal-height column.

[0010] Optionally, the temperature adjustment structure includes a water jacket sleeved on the equal-height column and a plurality of fins provided on the circumferential surface of the water jacket. The plurality of fins are arranged in an array.

[0011] Optionally, the equal-height column is formed by horizontally butting two half-columns, so that the adhered fixture and micro-hemisphere can be removed from the equal-height column.

[0012] Optionally, the side wall of the cavity matches the outer circumferential wall of the fixture.

[0013] Optionally, a receiving hole matching the skirt of the micro-hemisphere is formed on the top surface of the equal-height column, and the bottom surface of the receiving hole forms the upper surface of the calibration platform.

[0014] Optionally, the device further includes a reference platform, a height gauge and a flat sheet. The reference platform is used for placing the equal-height column and the height gauge. The flat sheet is horizontally placed on the height gauge and can move down until the lower surface of the flat sheet abuts against the upper end surface of the skirt of the micro-hemisphere.

[0015] Optionally, the flat sheet matches the skirt of the micro-hemisphere.

[0016] Optionally, the height gauge includes a column and a dial indicator. The dial indicator is slidably arranged on the column through a clamp and can slide up and down relative to the column. The flat sheet is horizontally placed at the lower end of the dial indicator.

[0017] Optionally, a measuring needle is provided at the lower end of the dial indicator, and the flat sheet is horizontally bonded to the bottom end of the measuring needle.

[0018] Optionally, the cavity extends downward to penetrate the bottom surface of the equal-height column.

[0019] Optionally, the distance between the upper surface of the calibration platform of the equal-height column and the reference platform is equal to the set distance from the lower surface of the skirt of the micro-hemisphere to the bottom surface of the fixture.

[0020] Compared with the prior art, the advantages of the present utility model are as follows:

[0021] The utility model designs an equal-height column, which has a cavity for accommodating a jig, and the top of the equal-height column has a calibration platform. The cavity extends upward to the lower surface of the calibration platform. A through hole with a diameter greater than or equal to the outer diameter of the hemispherical shell but smaller than the outer diameter of the skirt is provided on the calibration platform, so that after the micro-hemisphere with a skirt passes through the through hole, the lower surface of the skirt can be attached to the upper surface of the calibration platform, and the lower part of the micro-hemisphere can extend into the mounting hole of the jig and contact the bonding material in the mounting hole, thereby enabling coaxiality calibration of the uncured micro-hemisphere and the jig on the standard equal-height column, making the height planes of the micro-hemisphere and the jig parallel to improve the asymmetry of installation. Description of the Drawings

[0022] Figure 1 Schematic perspective view of the equal-height column of the present utility model.

[0023] Figure 2 Schematic perspective view of the equal-height column of the present utility model (temperature adjustment structure not shown).

[0024] Figure 3 Schematic view of the micro-hemisphere and the jig placed on one semi-column of the equal-height column (temperature adjustment structure not shown).

[0025] Figure 4 Exploded schematic view of the coaxiality calibration of the micro-hemisphere cured in the jig in the present invention.

[0026] Figure 5 Schematic view of the coaxiality calibration structure of the micro-hemisphere cured in the jig in the present invention (one semi-column of the equal-height column is shown).

[0027] Legend:

[0028] 1. Height gauge; 11. Upright rod; 12. Gauge head; 13. Measuring needle; 2. Reference platform; 3. Jig; 31. Mounting hole; 4. Flat sheet; 5. Micro-hemisphere; 51. Skirt; 6. Equal-height column; 61. Cavity; 62. Calibration platform; 63. Through hole; 64. Semi-column; 7. Temperature adjustment structure; 71. Water jacket; 72. Fins. Detailed Embodiment

[0029] The following further describes the present invention with reference to specific preferred embodiments, but does not limit the protection scope of the present invention accordingly.

[0030] Embodiment 1:

[0031] As Figures 1 - 5 shown, this embodiment provides a calibration device for fixing a micro-hemisphere in a grinding and polishing jig. The micro-hemisphere 5 includes a hemispherical shell and a skirt 51 integrally formed on the outer edge of the open end of the hemispherical shell. The top surface of the jig 3 is provided with a mounting hole 31. The device includes an equal-height column 6.

[0032] The equal-height column 6 has a cavity 61 for accommodating the jig 3, and the top of the equal-height column 6 has a calibration platform 62. The cavity 61 extends upward to the lower surface of the calibration platform 62. A through hole 63 with a diameter greater than or equal to the outer diameter of the hemispherical shell but less than the outer diameter of the skirt 51 is formed on the calibration platform 62. After the micro-hemisphere 5 with the skirt 51 passes through the through hole 63, the lower surface of the skirt 51 can be attached to the upper surface of the calibration platform 62, and the lower part of the micro-hemisphere 5 can extend into the mounting hole 31 of the jig 3 and contact the bonding material in the mounting hole 31.

[0033] Before grinding the micro-hemisphere, the un-cured micro-hemisphere 5 and the jig 3 are coaxiality calibrated on the equal-height column 6 to make the height planes of the micro-hemisphere 5 and the jig 3 parallel, thus improving the asymmetry of the installation.

[0034] In this embodiment, a temperature adjustment structure 7 is provided on the outer circumferential surface of the equal-height column 6. Specifically, the temperature adjustment structure 7 includes a water jacket 71 sleeved on the equal-height column 6 and a plurality of fins 72 provided on the circumferential surface of the water jacket 71. The plurality of fins 72 are arranged in an array.

[0035] Since the bonding of the micro-hemisphere and the jig requires heating to make the filler between the micro-hemisphere and the jig in a softened state, which is convenient for double calibration of the flat sheet and the calibration platform. After the calibration is completed, the filler needs to be cooled to achieve the curing effect. To improve the heating / dissipating effect and accelerate the curing of the micro-hemisphere on the jig, a water jacket 71 with a polygonal structure is designed on the outer surface of the standard equal-height block. Circulating hot water is added when heating is required, and circulating cold water is added when cooling is required to increase the heating / dissipating area. In this embodiment, it is a twenty-sided polygon, and the number of sides can be adjusted according to the actual situation; in addition, a plurality of fins 72 are added on the outer surface of the water jacket to further increase the heating / dissipating effect.

[0036] In this embodiment, the equal-height column 6 is formed by horizontally butting two half-columns 64 so that the adhered jig 3 and micro-hemisphere 5 can be removed from the equal-height column 6.

[0037] The following two schemes can be adopted to fix the micro-hemisphere in the jig:

[0038] Method 1: The lower and middle parts of the hemispherical shell of the micro-hemisphere 5 are semi-cured in the mounting hole 31 of the jig 3 by the bonding material. The jig 3 and the micro-hemisphere 5 connected by semi-curing are horizontally moved onto one of the half-columns 64, and then the two half-columns 64 are horizontally butted to form the equal-height column 6, so that the jig 3 is placed in the cavity 61 of the equal-height column 6, the hemispherical shell of the micro-hemisphere 5 passes through the through hole 63 of the equal-height column 6, and the lower surface of the skirt of the micro-hemisphere 5 is attached to the upper surface of the calibration platform 62.

[0039] Method 2: Move the fixture 3 with bonding material in the mounting hole 31 into the semi-cavity of one of the semi-columns 64, then pass the lower and middle parts of the hemispherical shell of the micro-hemisphere 5 through the semi-through hole of the semi-column 64 and extend them into the mounting hole 31 of the fixture 3 to contact the bonding material; then enclose the two semi-columns 64 to form an equal-height column 6, so that the fixture 3 is placed in the cavity 61 of the equal-height column 6, the hemispherical shell of the micro-hemisphere 5 passes through the through hole 63 of the equal-height column 6, and the lower surface of the skirt 51 of the micro-hemisphere 5 fits against the upper surface of the calibration platform 62.

[0040] In this embodiment, the side wall of the cavity 61 matches the outer circumferential wall of the fixture 3. Thus, the side wall of the cavity 61 forms the mounting reference surface of the fixture 3. When using Method 1, when the semi-cured connected fixture 3 and micro-hemisphere 5 are horizontally moved into one of the semi-columns 64 until the outer circumferential wall of the fixture 3 abuts against the side wall of the cavity 61, the fixture 3 is installed in place.

[0041] In this embodiment, a receiving hole matching the skirt 51 of the micro-hemisphere 5 is provided on the top surface of the equal-height column 6, and the bottom surface of the receiving hole forms the upper surface of the calibration platform 62. Thus, the hole side wall of the receiving hole forms the mounting reference surface of the skirt 51. When using Method 1, when the semi-cured connected fixture 3 and micro-hemisphere 5 are horizontally moved into one of the semi-columns 64 until the outer circumferential wall of the skirt 51 abuts against the side wall of the receiving hole, the micro-hemisphere 5 is installed in place.

[0042] In this embodiment, the device further includes a reference platform 2, a height gauge 1 and a flat sheet 4. The reference platform 2 is used to place the equal-height column 6 and the height gauge 1. The flat sheet 4 is horizontally placed on the height gauge 1, and it can move down until the lower surface of the flat sheet 4 abuts against the upper end surface of the skirt 51 of the micro-hemisphere 5.

[0043] Place the equal-height column 6 containing the fixture 3 and the micro-hemisphere 5 on the reference platform 2, horizontally place the flat sheet 4 at the bottom end of the height gauge 1, move the flat sheet 4 down until its lower surface abuts against the upper end surface of the skirt 51 of the micro-hemisphere 5. After the bonding material in the mounting hole 31 of the fixture 3 is cured, move the flat sheet 4 up to release the docking of the two semi-columns 64, and then the micro-hemisphere and the fixture bonded together can be removed. The double calibration of the flat sheet and the calibration platform can completely eliminate the asymmetry of the installation.

[0044] In this embodiment, the flat sheet 4 matches the skirt 51 of the micro-hemisphere 5.

[0045] In this embodiment, the height gauge 1 includes a column 11 and a dial gauge head 12. The dial gauge head 12 is slidably arranged on the column 11 through a fixture and can slide up and down relative to the column 11. The flat sheet 4 is horizontally placed at the lower end of the dial gauge head 12.

[0046] In this embodiment, the lower end of the dial gauge head 12 has a measuring needle 13, and the flat sheet 4 is horizontally bonded to the bottom end of the measuring needle 13.

[0047] In this embodiment, the cavity 61 extends downward to penetrate through the bottom surface of the equal-height column 6, so that the lower surface of the jig abuts against the reference platform, thereby further improving the accuracy of the coaxiality calibration of the micro hemisphere 5 and the jig 3.

[0048] In this embodiment, to adapt to the installation requirements of the micro hemisphere, the distance between the upper surface of the calibration platform 62 of the equal-height column 6 and the reference platform 2 is equal to the set distance from the lower surface of the skirt 51 of the micro hemisphere 5 to the bottom surface of the jig 3.

[0049] The calibration process of fixing the micro hemisphere to the grinding and polishing jig in this embodiment is as follows:

[0050] The lower and middle parts of the hemisphere shell of the micro hemisphere 5 are semi-cured in the mounting hole 31 of the jig 3 through an adhesive material. The jig 3 and the micro hemisphere 5 connected by semi-curing are horizontally moved onto one of the half-columns 64, and then the two half-columns 64 are butted to form an equal-height column 6, so that the jig 3 is placed in the cavity 61 of the equal-height column 6. The hemisphere shell of the micro hemisphere 5 passes through the through-hole 63 of the equal-height column 6, and the lower surface of the skirt 51 of the micro hemisphere 5 fits against the upper surface of the calibration platform 62.

[0051] The measuring needle 13 with the flat piece 4 is installed on the dial head 12 of the height gauge 1. The dial head 12 is pressed down so that the lower surface of the skirt 51 of the micro hemisphere 5 can completely fit against the upper surface of the calibration platform 62 of the standard equal-height column 6, so that the micro hemisphere 5 has good symmetry after being bonded to the jig 3, and the central axes of the two objects are prevented from skewing.

[0052] After the adhesive material is cured, the adhered jig 3 and micro hemisphere 5 are removed from the equal-height column 6.

[0053] The above is only the preferred embodiment of the present invention. The protection scope of the present invention is not limited to the above embodiments. All technical solutions falling within the idea of the present invention belong to the protection scope of the present invention. It should be noted that for those of ordinary skill in the art, without departing from the principle of the present invention, several improvements and refinements should also be regarded as the protection scope of the present invention.

Claims

1. A calibration device in which a micro-hemisphere is fixed in a grinding and polishing fixture, characterized in that: The device comprises a contour column (6), the contour column (6) having a cavity (61) for accommodating a fixture (3), and a calibration platform (62) at the top of the contour column (6), the cavity (61) extending upward to the lower surface of the calibration platform (62), and a through hole (63) having a diameter greater than or equal to the outer diameter of the hemispherical shell but less than the outer diameter of the skirt (51) is opened on the calibration platform (62), so that after the micro-hemispherical (5) having the skirt (51) passes through the through hole (63), the lower surface of the skirt (51) can be fitted with the upper surface of the calibration platform (62), and the lower part of the micro-hemispherical (5) can extend into the mounting hole (31) of the fixture (3) and contact the adhesive material in the mounting hole (31); A temperature regulating structure (7) is provided on the outer circumferential surface of the equal-height column (6).

2. The calibration device for fixing a micro-hemisphere in a grinding and polishing fixture according to claim 1 is characterized in that: The temperature regulating structure (7) comprises a water jacket (71) sleeved outside the equal-height column (6), and a plurality of fins (72) arranged on the circumferential surface of the water jacket (71), wherein the plurality of fins (72) are distributed in an array.

3. The calibration device for fixing a micro-hemisphere in a grinding and polishing fixture according to claim 1 is characterized in that: The contour column (6) is formed by two half columns (64) being horizontally connected so that the adhered jig (3) and micro-hemisphere (5) can be removed from the contour column (6).

4. The calibration device for fixing a micro-hemisphere in a grinding and polishing fixture according to claim 1 is characterized in that: The top surface of the equal-height column (6) is provided with a receiving hole that matches the skirt (51) of the micro-hemispheric (5), and the bottom surface of the receiving hole forms the upper surface of the calibration platform (62).

5. The calibration device for fixing a micro-hemispherical ball in a grinding and polishing fixture according to any one of claims 1 to 4, characterized in that: The device further comprises a reference platform (2), a height gauge (1) and a plane sheet (4); the reference platform (2) is used to place the equal height column (6) and the height gauge (1); the plane sheet (4) is horizontally placed on the height gauge (1) and can be moved downward to the lower surface of the plane sheet (4) to abut against the upper end surface of the skirt (51) of the micro-hemispherical (5).

6. The calibration device for fixing a micro-hemisphere in a grinding and polishing fixture according to claim 5, characterized in that: The cavity (61) extends downward to penetrate the bottom surface of the equal-height column (6).

7. The calibration device for fixing a micro-hemisphere in a grinding and polishing fixture according to claim 6 is characterized in that: The distance between the upper surface of the calibration platform (62) of the equal height column (6) and the reference platform (2) is equal to the set distance from the lower surface of the skirt (51) of the micro-hemispheric (5) to the bottom surface of the fixture (3).

8. The calibration device for fixing a micro-hemisphere in a grinding and polishing fixture according to claim 5, characterized in that: The flat sheet (4) matches the skirt (51) of the micro-hemispherical (5).

9. The calibration device for fixing a micro-hemisphere in a grinding and polishing fixture according to claim 5, characterized in that: The height gauge (1) comprises a column (11) and a gauge head (12); the gauge head (12) is slidably mounted on the column (11) via a clamp and is capable of sliding up and down relative to the column (11); a measuring needle (13) is provided at the lower end of the gauge head (12); and the plane sheet (4) is horizontally bonded to the bottom end of the measuring needle (13).

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