Positioning mechanism for chip testing

Abstract

The utility model relates to the technical field of chip testing and positioning, and discloses a positioning mechanism for chip testing, which comprises a testing plate, a cavity is arranged on the upper surface of the testing plate, a first positive and negative thread bolt and a second positive and negative thread bolt respectively penetrate through two adjacent sides of the testing plate, and the first positive and negative thread bolt and the second positive and negative thread bolt are distributed in a staggered manner. The first positive and negative thread bolt and the second positive and negative thread bolt are rotationally connected with the test plate, a bottom plate is installed in the cavity, and four sliding grooves corresponding to the first positive and negative thread bolt and the second positive and negative thread bolt respectively are formed in the upper surface of the bottom plate; according to the utility model, the first positive and negative thread bolt and the second positive and negative thread bolt are respectively used for controlling the plurality of stop levers to move, so that a chip is placed on the bottom plate, and the four stop levers are controlled to move, so that multiple sides of the chip are blocked, positioned and fixed, and the chip is centered, thereby being convenient for positioning, fixing and detecting the chip; and meanwhile, the device is suitable for detecting chips with different sizes and is convenient to use.

Description

Technical Field

[0001] The utility model relates to the technical field of chip test positioning, in particular to a positioning mechanism for chip test. Background Art

[0002] Before a chip is delivered to a customer upon leaving the factory, a series of strict chip tests need to be carried out. Currently, the traditional chip test method is to customize a chip test board according to the type and style of the chip to be tested. The chip to be tested is installed on the test position of the chip test board, and the chip test board serves as a carrier for the chip tester to test the chip to be tested.

[0003] The prior art such as the patent with the publication number CN213750212U discloses a general-purpose chip test board, which includes a test bottom plate, two clamping mechanisms, a chip body, and two popping-up mechanisms. The two clamping mechanisms are respectively fixedly connected to the left and right sides of the top of the test bottom plate. The chip body is arranged above the test bottom plate and at a position between the two clamping mechanisms. The two popping-up mechanisms are symmetrically arranged on the top of the test bottom plate and at positions corresponding to the chip body. The clamping mechanism includes a support rod, a clamping spring, a connecting block, a clamping block, and two limiting slide rods. The connecting block is fixedly connected to the top of the side of the support rod through the connecting spring. Through the mutual cooperation among the test bottom plate, the clamping mechanism, the chip body, and the popping-up mechanism, the utility model realizes a general-purpose chip test board, which is convenient for fixing the chip to be detected, makes the chip positioning more accurate and faster, thus facilitating the testing of the chip, and further improving the efficiency of chip detection.

[0004] The prior art still has deficiencies:

[0005] In the above prior art, the chip body is fixed through the mutual cooperation among the test bottom plate, the clamping mechanism, and the popping-up mechanism. However, in actual use, the chip body can still move horizontally between the clamping block and the rubber pad, and at the same time, due to the elastic force of the popping-up spring, the chip body is also prone to move downward, resulting in poor stability of the chip body during the test. At the same time, the position of the clamping mechanism is fixed, and it is difficult to fix chips of different sizes. Therefore, a positioning mechanism for chip test is proposed. Content of the Utility Model

[0006] Aiming at the deficiencies of the prior art, the utility model provides a positioning mechanism for chip test, which can adapt to the positioning of chips of different sizes, improve adaptability, and keep the chip stable during the test.

[0007] To achieve the above object, the present utility model provides the following technical solutions: A positioning mechanism for chip testing, including a test board. A cavity is provided on the upper surface of the test board. The first right-left threaded bolt and the second right-left threaded bolt penetrate through two adjacent sides of the test board respectively. The first right-left threaded bolt and the second right-left threaded bolt are arranged in a staggered manner. Both the first right-left threaded bolt and the second right-left threaded bolt are rotatably connected to the test board. A bottom board is installed in the cavity. Four chutes corresponding to the first right-left threaded bolt and the second right-left threaded bolt are provided on the upper surface of the bottom board. Two retaining rods are threadedly connected to the outer walls of the first right-left threaded bolt and the second right-left threaded bolt respectively. Multiple retaining rods are respectively slidably connected to the inner walls of the multiple chutes. The upper ends of the retaining rods extend above the bottom board. A limiting unit for blocking the chip is fixedly installed at the upper ends of the retaining rods.

[0008] Preferably, the limiting unit includes an adjusting plate fixedly installed on the upper end surface of the retaining rod. A baffle is installed on the upper surface of the adjusting plate. One end of the baffle extends outside the adjusting plate.

[0009] Preferably, the limiting unit further includes a limiting adjustment groove provided on the upper surface of the adjusting plate. A limiting block is fixedly connected to the bottom surface of the baffle. The limiting block is slidably connected in the limiting adjustment groove. A spring is fixedly connected to the inner wall of the limiting adjustment groove. The other end of the spring is fixedly connected to the side wall of the limiting block. An inclined groove is provided at one end of the baffle.

[0010] Preferably, the limiting unit further includes a waist-shaped hole provided on the side wall of the baffle. A limiting rod is slidably connected in the waist-shaped hole. Two retaining rings are fixedly connected to the outer wall of the limiting rod. Two retaining strips are fixedly connected to the outer walls on both sides of the adjusting plate. A bayonet is provided on one side of the retaining strip. The limiting rod is movably clamped in the bayonet.

[0011] Preferably, limiting columns are fixedly connected to three corners of the inner bottom surface of the cavity. A third bolt is rotatably connected to the remaining corner of the inner bottom surface of the cavity. Both the limiting column and the third bolt penetrate through the bottom board. The bottom board is slidably connected to the outer wall of the limiting column. The third bolt is threadedly connected to the bottom board.

[0012] Preferably, a height scale line is provided on the outer wall of one of the limiting columns. The height scale line is used to measure the height of the adjustment of the bottom board.

[0013] Compared with the prior art, the present utility model has the following beneficial effects:

[0014] 1. The present utility model controls the movement of multiple retaining rods respectively through the first right-left threaded bolt and the second right-left threaded bolt. Then, by placing the chip on the bottom board and controlling the movement of the four retaining rods, the multi-sides of the chip are blocked, positioned and fixed, and the chip is centered, which is convenient for positioning and fixing the chip for detection. At the same time, it can adapt to chips of different sizes for detection, which is convenient to use.

[0015] 2. The utility model installs a limiting unit at the upper end of the shift lever. The baffle in the limiting unit can block the upper side edge of the chip, thereby stably restricting the chip and improving the practicability.

[0016] 3. The height of the bottom plate in the utility model is adjustable, and thus the distance between the bottom plate and the baffle can be adjusted to adapt to positioning detection of chips with different thicknesses, improving the practicability.

[0017] Other features and advantages of the utility model will be described in the subsequent description. Moreover, some of them will become obvious from the description, or be understood by implementing the utility model. The objectives and other advantages of the utility model can be achieved and obtained through the structures pointed out in the description, claims, and drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 is a schematic diagram of the overall structure of the utility model;

[0019] Figure 2 is a schematic cross-sectional structure diagram of the test board of the utility model;

[0020] Figure 3 is a schematic structure diagram of the limiting unit of the utility model;

[0021] Figure 4 is a schematic diagram of another state structure of the baffle of the utility model.

[0022] In the figure: 1. Test board; 2. Cavity; 3. First right and left hand thread bolt; 4. Second right and left hand thread bolt; 5. Bottom plate; 6. Chute; 7. Shift lever; 8. Limiting unit; 81. Adjusting plate; 82. Baffle; 83. Limiting adjustment groove; 84. Limiting block; 85. Spring; 86. Waist-shaped hole; 87. Limiting rod; 88. Retaining ring; 89. Retaining strip; 810. Bayonet; 811. Inclined groove; 9. Limiting column; 10. Third bolt; 11. Height scale line. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0023] Next, the technical solutions in the embodiments of the utility model will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the utility model. Obviously, the described embodiments are only a part of the embodiments of the utility model, rather than all of the embodiments. Based on the embodiments of the utility model, all other embodiments obtained by those of ordinary skill in the art in the technical field without creative efforts shall fall within the protection scope of the utility model.

[0024] Please refer to Figures 1-4, the positioning mechanism for chip testing in this embodiment includes a test board 1. A cavity 2 is formed on the upper surface of the test board 1. The first right-left thread bolt 3 and the second right-left thread bolt 4 penetrate through two adjacent sides of the test board 1 respectively. The first right-left thread bolt 3 and the second right-left thread bolt 4 are arranged in a staggered manner. Both the first right-left thread bolt 3 and the second right-left thread bolt 4 are rotatably connected to the test board 1. A bottom plate 5 is installed in the cavity 2. Four chutes 6 corresponding to the first right-left thread bolt 3 and the second right-left thread bolt 4 respectively are formed on the upper surface of the bottom plate 5. Two retaining rods 7 are threadedly connected to the outer walls of both the first right-left thread bolt 3 and the second right-left thread bolt 4. Multiple retaining rods 7 are respectively slidably connected to the inner walls of multiple chutes 6. The upper ends of the retaining rods 7 extend above the bottom plate 5. A limiting unit 8 for blocking the chip is fixedly installed at the upper ends of the retaining rods 7.

[0025] As Figure 1 , Figure 2 shown, the structure of the positioning mechanism for chip testing in the present utility model is similar to that of the existing positioning mechanism for chip testing. For example, the prior art is CN213750212U. The main improvement of the present utility model lies in adapting to the positioning of chips with different sizes, improving adaptability, and keeping the chip stable during testing. When the chip needs to be detected in the present utility model, the chip is placed on the bottom plate 5 on the test board 1. At this time, the first right-left thread bolt 3 is rotated. The first right-left thread bolt 3 drives the two retaining rods 7 on its outer wall to approach each other. The retaining rods 7 slide in the chutes 6 on the bottom plate 5. The chutes 6 limit the retaining rods 7 so that they will not rotate, making the two retaining rods 7 on the outer wall of the first right-left thread bolt 3 contact the chip, positioning two sides of the chip. Then the second right-left thread bolt 4 is rotated. The second right-left thread bolt 4 drives the two retaining rods 7 on its outer wall to approach each other, and then these two retaining rods 7 contact the other two sides of the chip, realizing the positioning of the chip and making the chip centered, so that the chip will not move, and then stable testing can be carried out. Moreover, chips with different sizes can be positioned, which is convenient to use and improves the practicability and adaptability.

[0026] As Figures 2-4 shown, the limiting unit 8 includes an adjusting plate 81 fixedly installed on the upper end surface of the retaining rod 7. A baffle 82 is installed on the upper surface of the adjusting plate 81. One end of the baffle 82 extends outside the adjusting plate 81. After multiple retaining rods 7 position the chip, the retaining rods 7 drive the baffle 82 to move above the chip through the adjusting plate 81, thereby limiting the upper part of the chip and preventing the chip from moving upward, improving the limitation of the chip and ensuring the stability during chip testing.

[0027] As Figure 2 , Figure 4As shown, the limit unit 8 further includes a limit adjustment groove 83 formed on the upper surface of the adjustment plate 81. A limit block 84 is fixedly connected to the bottom surface of the baffle 82. The limit block 84 is slidably connected in the limit adjustment groove 83. A spring 85 is fixedly connected to the inner wall of the limit adjustment groove 83. The other end of the spring 85 is fixedly connected to the side wall of the limit block 84. An inclined groove 811 is formed at one end of the baffle 82. When batch testing chips of the same size, the positions of multiple blocking rods 7 can be adjusted according to the size of the chips first. By pressing the chip downward between multiple baffles 82, the chip is guided by the inclined groove 811 at the end of the baffle 82, squeezing the baffle 82 to move. The baffle 82 drives the limit block 84 to slide in the limit adjustment groove 83, and the limit block 84 drives the spring 85 to compress until the chip completely slides past the baffle 82. At this time, under the elastic force of the spring 85, one end of the baffle 82 moves back above the chip to block the chip. After the chip needs to be taken out, pull the baffle 82 backward so that it does not block above the chip, and then the chip can be taken out, improving the practicability and facilitating the positioning and use of the chip.

[0028] As Figure 3 、 Figure 4 shown, the limit unit 8 further includes a waist-shaped hole 86 formed on the side wall of the baffle 82. A limit rod 87 is slidably connected in the waist-shaped hole 86. Two retaining rings 88 are fixedly connected to the outer wall of the limit rod 87. Two retaining strips 89 are fixedly connected to the outer walls on both sides of the adjustment plate 81. A bayonet 810 is formed on one side of the retaining strip 89. The limit rod 87 is movably clamped in the bayonet 810. When the chip needs to be taken out, lift the limit rod 87. The limit rod 87 moves upward along the waist-shaped hole 86. The two retaining rings 88 limit the limit rod 87 so that it will not slide out of the waist-shaped hole 86. At this time, pull the limit rod 87. The limit rod 87 drives the baffle 82 to move, and then the limit block 84 drives the spring 85 to compress until the limit rod 87 slides behind the retaining strip 89. At this time, lower the limit rod 87 so that the limit rod 87 is clamped in the bayonet 810 on the retaining strip 89. The retaining strip 89 restricts the baffle 82 through the limit rod 87, so that the spring 85 cannot drive the baffle 82 to move outward through the limit block 84. At this time, the baffle 82 will not block the chip, and the chip can be taken out, which is convenient to use.

[0029] As Figure 1 、 Figure 2 shown, limit posts 9 are fixedly connected to the inner bottom surface of the cavity 2 at each of the triangular corners. A third bolt 10 is rotatably connected to the remaining corner of the inner bottom surface of the cavity 2. The limit posts 9 and the third bolt 10 both penetrate the bottom plate 5. The bottom plate 5 is slidably connected to the outer wall of the limit post 9. The third bolt 10 is threadedly connected to the bottom plate 5. According to the thickness of the chip, the third bolt 10 can be rotated. The third bolt 10 drives the bottom plate 5 to rise or fall. The bottom plate 5 slides on the outer wall of the limit post 9, thereby adjusting the distance between the bottom plate 5 and the baffle 82 to adapt to the thickness of the chip and meeting the positioning tests for chips of different thicknesses, improving the adaptability.

[0030] As shown Figure 2 in the figure, a height scale line 11 is provided on the outer wall of one of the limit posts 9. The height scale line 11 is used to measure the adjusted height of the bottom plate 5. With reference to the height scale line 11, it is convenient to adjust the height of the bottom plate 5 through the third bolt 10, which is convenient for use.

[0031] The implementation steps in this embodiment are as follows: When it is necessary to detect the chip, according to the thickness of the chip, the third bolt 10 can be rotated. The third bolt 10 drives the bottom plate 5 to rise or fall. The bottom plate 5 slides on the outer wall of the limit post 9, thereby adjusting the distance between the bottom plate 5 and the baffle 82 to adapt to the thickness of the chip. Then, rotate the first left-right thread bolt 3. The first left-right thread bolt 3 drives the two rods 7 on its outer wall to approach or move away from each other. The rods 7 slide in the chute 6 on the bottom plate 5. The chute 6 restricts the rods 7 so that they will not rotate. Then, rotate the second left-right thread bolt 4. The second left-right thread bolt 4 drives the two rods 7 on its outer wall to approach or move away from each other, so that the distances between the two symmetrically distributed rods 7 correspond to the length and width of the chip respectively. Press the chip down between multiple baffles 82. The chip is guided by the inclined groove 811 at the end of the baffle 82, squeezing the baffle 82 to move. The baffle 82 drives the limit block 84 to slide in the limit adjustment groove 83. The limit block 84 drives the spring 85 to compress until the chip completely slides past the baffle 82 and is placed on the bottom plate 5. At this time, under the elastic force of the spring 85, one end of the baffle 82 moves back above the chip to block the upper part of the chip. Multiple rods 7 position the chip and make the chip centered so that the chip will not move, and then stable testing can be carried out. After the testing is completed, lift the limit rod 87. The limit rod 87 moves upward along the kidney-shaped hole 86. The two retaining rings 88 restrict the limit rod 87 so that it will not slide out of the kidney-shaped hole 86. At this time, pull the limit rod 87. The limit rod 87 drives the baffle 82 to move, thereby causing the limit block 84 to drive the spring 85 to compress until the limit rod 87 slides behind the stop bar 89. At this time, lower the limit rod 87 so that the limit rod 87 is stuck in the bayonet 810 on the stop bar 89. The stop bar 89 restricts the baffle 82 through the limit rod 87, so that the spring 85 cannot drive the baffle 82 to move outward through the limit block 84. At this time, the baffle 82 will not block the chip, and the chip can be taken out.

[0032] Obviously, the above-mentioned embodiments of the present invention are only examples for clearly explaining the present invention, and are not intended to limit the implementation manners of the present invention. For those of ordinary skill in the art in the technical field, other different forms of changes or modifications can be made based on the above description. It is not necessary and impossible to list all the implementation manners here. Any modifications, equivalent replacements, and improvements made within the spirit and principle of the present invention shall be included in the protection scope of the claims of the present invention.

Claims

1. A positioning mechanism for chip testing, comprising a testing board (1), characterized in that: A cavity (2) is provided on the upper surface of the test board (1), and a first positive and negative thread bolt (3) and a second positive and negative thread bolt (4) are respectively penetrated on adjacent two sides of the test board (1), the first positive and negative thread bolt (3) and the second positive and negative thread bolt (4) are staggered and distributed, and the first positive and negative thread bolt (3) and the second positive and negative thread bolt (4) are both rotatably connected to the test board (1), a base plate (5) is installed in the cavity (2), and four slide grooves (6) corresponding to the first positive and negative thread bolt (3) and the second positive and negative thread bolt (4) are respectively provided on the upper surface of the base plate (5), and two blocking rods (7) are threadedly connected to the outer walls of the first positive and negative thread bolt (3) and the second positive and negative thread bolt (4), and the plurality of blocking rods (7) are respectively slidably connected to the inner walls of the plurality of slide grooves (6), and the upper end of the blocking rod (7) extends to the top of the base plate (5), and a limiting unit (8) for blocking the chip is fixedly installed on the upper end of the blocking rod (7).

2. A chip testing positioning mechanism according to claim 1, characterized in that: The limiting unit (8) comprises an adjusting plate (81) fixedly mounted on the upper end surface of the blocking rod (7); a blocking plate (82) is mounted on the upper surface of the adjusting plate (81); one end of the blocking plate (82) extends outside the adjusting plate (81).

3. A chip testing positioning mechanism according to claim 2, characterized in that: The limit unit (8) also includes a limit adjustment groove (83) provided on the upper surface of the adjustment plate (81); a limit block (84) is fixedly connected to the bottom surface of the baffle plate (82); the limit block (84) is slidably connected in the limit adjustment groove (83); a spring (85) is fixedly connected to the inner wall of the limit adjustment groove (83); the other end of the spring (85) is fixedly connected to the side wall of the limit block (84); and an oblique groove (811) is provided at one end of the baffle plate (82).

4. A chip testing positioning mechanism according to claim 3, characterized in that: The limiting unit (8) further comprises a waist-shaped hole (86) formed on the side wall of the baffle plate (82), a limiting rod (87) being slidably connected in the waist-shaped hole (86), two retaining rings (88) being fixedly connected to the outer wall of the limiting rod (87), two retaining bars (89) being fixedly connected to the outer walls of both sides of the adjustment plate (81), a bayonet (810) being formed on one side of the retaining bar (89), and the limiting rod (87) being movably engaged in the bayonet (810).

5. A chip testing positioning mechanism according to claim 3, characterized in that: The inner bottom surface of the cavity (2) has three corners fixedly connected to the limiting column (9), the inner bottom surface of the cavity (2) has a remaining corner rotatably connected to the third bolt (10), the limiting column (9) and the third bolt (10) both penetrate the bottom plate (5), the bottom plate (5) is slidably connected to the outer wall of the limiting column (9), and the third bolt (10) is threadedly connected to the bottom plate (5).

6. A chip testing positioning mechanism according to claim 5, characterized in that: The outer wall of one of the limiting columns (9) is provided with a height scale line (11), and the height scale line (11) is used to measure the height of the adjustment of the bottom plate (5).

Images