Base convenient for wafer insertion and monocrystalline silicon wafer tester
By designing a base that is easy to insert, and using the mechanical structure of the sliding base and connecting rod, the automatic roll-out and testing of single crystal silicon wafers is realized, solving the problem of cumbersome operation in the existing technology and improving the testing efficiency.
Patent Information
- Application Number
- CN202421837800.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-07-31
- Publication Date
- 2025-06-17
- Estimated Expiration
- 2034-07-31
AI Technical Summary
During the testing process of the existing single crystal silicon wafer tester, it is necessary to manually open the insertion base to remove the single crystal silicon wafer for testing, and manually cover the cover after the test is completed, which is cumbersome.
A base for easy insertion is designed, including a insertion base, a push portion and a single crystal silicon wafer body. The sliding base moves upwards, causing the rotating connecting rod to push the flap to open, while the rising sliding base pushes the single crystal silicon wafer out.
Automatic roll-out and testing of single crystal silicon wafers is realized, reducing manual operation steps and improving testing efficiency and convenience.
Smart Images
Figure CN222994529U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of single crystal silicon wafers, in particular to a base convenient for inserting wafers and a single crystal silicon wafer tester. Background Technique
[0002] Single crystal silicon is a relatively active non-metallic element, an important part of crystal materials, and at the forefront of the development of new materials. Its main uses are as semiconductor materials and for solar photovoltaic power generation, heating, etc. Due to the many advantages of solar energy such as cleanliness, environmental protection, and convenience, single crystal silicon can be used in the production and deep processing of diode-level, rectifier device-level, circuit-level, and solar cell-level single crystal products. Its subsequent products, integrated circuits and semiconductor discrete devices, have been widely used in various fields and also play an important role in military electronic equipment. After the production of single crystal silicon wafers, it is necessary to test their thickness and resistance.
[0003] In the process of testing with existing single crystal silicon wafer testers, the single crystal silicon wafers to be tested are usually placed in an insertion base for storage. During testing, it is necessary to manually open the insertion base, take out the single crystal silicon wafers inside for testing, and manually cover the lid after the testing is completed. Content of the Utility Model
[0004] The purpose of the utility model is to provide a base convenient for inserting wafers and a single crystal silicon wafer tester, so as to solve the problem that in the process of testing with existing single crystal silicon wafer testers, the single crystal silicon wafers to be tested are usually placed in an insertion base for storage, it is necessary to manually open the insertion base, take out the single crystal silicon wafers inside for testing, and manually cover the lid after the testing is completed as mentioned in the above background technique.
[0005] To achieve the above purpose, the utility model provides the following technical solutions: On the one hand, the utility model provides a base convenient for inserting wafers, including an insertion base, a pushing part, and a single crystal silicon wafer body:
[0006] A plurality of slots are opened inside the insertion base, and a single crystal silicon wafer body and a pushing part are arranged in the slots. The pushing part is arranged inside the insertion base. The pushing part includes a sliding base slidably arranged inside the insertion base, connecting blocks arranged on both sides of the sliding base, connecting rods rotatably arranged on one side of the connecting blocks, and a flip cover rotatably connected to one end of the connecting rods. The flip cover is rotatably connected to the insertion base. When the sliding base moves upward, it drives the connecting blocks to move to drive the connecting rods to push the flip cover to rotate and open.
[0007] By adopting the above technical solution, the upward movement of the sliding base can drive the connecting blocks to move upward, so that the connecting rods rotatably arranged on one side of the connecting blocks can rotate to push the flip cover to open. At the same time, the rising sliding base will push out the single crystal silicon wafer body placed inside the insertion base.
[0008] Preferably, a plurality of slots are provided on both inner sides of the chip socket, and both sides of the sliding base are embedded in the slots and slidably connected thereto.
[0009] By adopting the above technical solution, the single-crystal silicon wafer body can be placed into the chip socket along the slots.
[0010] Preferably, the pushing part includes a sliding base, connecting blocks provided on both sides of the sliding base, and connecting rods. There are four connecting rods, and two connecting rods are rotatably provided on the outer sides of the two connecting blocks respectively.
[0011] By adopting the above technical solution, the movement of the connecting blocks can drive the four connecting rods to rotate and move.
[0012] Preferably, sliding grooves are provided on both sides of the chip socket, and the connecting blocks pass through the sliding grooves and are slidably connected thereto.
[0013] By adopting the above technical solution, the connecting blocks can slide up and down along the sliding grooves.
[0014] Preferably, the pushing part includes a flip cover, a rotating shaft a provided on both sides of the flip cover, and a rotating shaft b provided on both sides of the flip cover. A rotating groove is provided on the top of the chip socket, and the rotating shaft a is embedded in the rotating groove and rotatably connected thereto. The rotating shaft b passes through one end of the connecting rod and is rotatably connected thereto.
[0015] By adopting the above technical solution, the moving connecting blocks can drive the connecting rods to rotate, so that the connecting rods push the two flip covers to open.
[0016] Preferably, the top surface of the sliding base is an inwardly concave arc surface, which fits the outer edge of the single-crystal silicon wafer body.
[0017] By adopting the above technical solution, the sliding base can better fit the single-crystal silicon wafer body.
[0018] On the other hand, the present utility model provides a single-crystal silicon wafer tester, which includes the above-mentioned base convenient for inserting chips, and the single-crystal silicon wafer tester further includes a tester body:
[0019] The tester body is arranged below the chip socket, and the tester body includes a test head arranged at the center of the tester body and a display screen arranged above the test head.
[0020] By adopting the above technical solution, the test head arranged in the tester body can test the single-crystal silicon wafer body.
[0021] Preferably, a top block is arranged on one side of the tester body. The top block is a solid cube, and the top block is slidably connected to the chip socket.
[0022] By adopting the above technical solution, the top block can slide into the insert seat, and the top block can make the sliding base move upward through the earth hole.
[0023] Compared with the prior art, the beneficial effect of the present utility model is that by providing a pushing part, the upper movement of the sliding base can drive the connecting block to move upward, so that the connecting rod rotatably arranged on one side of the connecting block can rotate to push the flip cover to open. At the same time, the rising sliding base will push out the monocrystalline silicon wafer body placed inside the insert seat. BRIEF DESCRIPTION OF THE DRAWINGS
[0024] Figure 1 It is a schematic diagram of the overall structure of the present application;
[0025] Figure 2 It is a schematic diagram of the overall structure of the present application;
[0026] Figure 3 It is a schematic diagram of the side sectional structure of the insert seat of the present application;
[0027] Figure 4 It is a schematic diagram of the sectional structure of the insert seat of the present application;
[0028] Figure 5 It is a schematic diagram of the structure of the pushing part of the present application;
[0029] Figure 6 It is a schematic diagram of the connection structure between the insert seat and the base of the present application.
[0030] In the figure: 1. Insert seat; 101. Slot; 102. Rotation slot; 103. Slide slot; 2. Pushing part; 201. Sliding base; 202. Connecting block; 203. Connecting rod; 204. Flip cover; 205. Rotation shaft a; 206. Rotation shaft b; 3. Monocrystalline silicon wafer body; 4. Top block; 5. Tester body; 501. Test head; 502. Display screen. DETAILED DESCRIPTION OF THE EMBODIMENTS
[0031] The technical solutions in the embodiments of the present utility model will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present utility model. Obviously, the described embodiments are only a part of the embodiments of the present utility model, rather than all of the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present utility model without creative efforts shall fall within the protection scope of the present utility model.
[0032] Embodiment 1
[0033] Please refer to Figure 1 , Figure 2 and Figure 3, the present utility model provides a technical solution: a base facilitating the insertion of wafers, including a wafer insertion seat 1, a pushing part 2 and a monocrystalline silicon wafer body 3:
[0034] The wafer insertion seat 1 is of a metal frame structure. A number of slots 101 are provided on both inner sides of the wafer insertion seat 1. The monocrystalline silicon wafer body 3 is arranged in the slots 101. Both sides of the monocrystalline silicon wafer body 3 slide into the slots 101 and are slidably connected thereto. The pushing part 2 includes a sliding base 201 slidably arranged inside the wafer insertion seat 1, connecting blocks 202 arranged on both sides of the sliding base 201, connecting rods 203 rotatably arranged on one side of the connecting blocks 202, and a flip cover 204 rotatably connected to one end of the connecting rod 203. There are two flip covers 204, and the flip cover 204 is rotatably connected to the wafer insertion seat 1. The upward movement of the sliding base 201 drives the connecting blocks 202 to move so as to drive the connecting rods 203 to push the flip cover 204 to rotate and open. The upward movement of the sliding base 201 drives the connecting blocks 202 to move upward, so that the connecting rods 203 rotatably arranged on one side of the connecting blocks 202 can rotate to push the flip cover 204 to open. At the same time, the rising sliding base 201 will push out the monocrystalline silicon wafer body 3 placed inside the wafer insertion seat 1
[0035] Embodiment 2
[0036] Please refer to Figure 1 , Figure 2 and Figure 3 , the present utility model provides a technical solution: a base facilitating the insertion of wafers includes a pushing part 2, a sliding base 201 and a flip cover 204:
[0037] The pushing part 2 includes a sliding base 201, connecting blocks 202 and connecting rods 203 arranged on both sides of the sliding base 201. There are four connecting rods 203. Two connecting rods 203 are respectively rotatably arranged on the outer sides of the two connecting blocks 202. Slide grooves 103 are provided on both sides of the wafer insertion seat 1. The connecting blocks 202 pass through the slide grooves 103 and are slidably connected thereto.
[0038] It can enable the connecting blocks 202 to slide up and down along the slide grooves 103. There are also four flip covers 204. Through the movement of the connecting blocks 202, the four connecting rods 203 can be driven to rotate and move. The pushing part 2 includes flip covers 204, rotating shafts a 205 arranged on both sides of the flip covers 204, and rotating shafts b 206 arranged on both sides of the flip covers 204. Rotating grooves 102 are provided at the top of the wafer insertion seat 1. The rotating shafts a 205 are embedded in the rotating grooves 102 and are rotatably connected thereto. The rotating shafts b 206 pass through one end of the connecting rods 203 and are rotatably connected thereto. The movement of the connecting blocks 202 drives the connecting rods 203 to rotate, so that the connecting rods 203 push the two flip covers 204 to open. The top surface of the sliding base 201 is an inwardly concave arc surface, which fits the outer edge of the monocrystalline silicon wafer body 3, so that the sliding base 201 can better fit the monocrystalline silicon wafer body 3.
[0039] Embodiment 2
[0040] Please refer to Figure 4 , Figure 5 and Figure 6 , the present utility model provides a technical solution: a base of a monocrystalline silicon wafer tester includes a tester body 5, a test head 501 and a flip cover 204:
[0041] The tester body 5 is arranged below the wafer insertion base 1. The tester body 5 includes a test head 501 arranged at the center of the tester body 5 and a display screen 502 arranged above the test head 501. The test head 501 arranged inside the tester body 5 is used to test the monocrystalline silicon wafer body 3. A top block 4 is arranged on one side of the tester body 5. The top block 4 is a solid cube and is slidably connected to the wafer insertion base 1. The top block 4 can slide into the wafer insertion base 1 and push the sliding base 201 to move upward.
[0042] Working principle: First, press the wafer insertion base 1 against the top block 4. The top block 4 pushes the sliding base 202 to move upward, thereby driving the connecting rod 203 rotatably arranged on one side of the connecting block 202 to rotate and push the flip cover 204 to open. At the same time, since the sliding base 201 rises inside the wafer insertion base 1, the sliding base 201 will push several monocrystalline silicon wafer bodies 3 inside the wafer insertion base 1 upward by a certain distance, which is convenient for the operator to take. Then, the test head 501 arranged inside the tester body 5 is used to test the monocrystalline silicon wafer body 3. When the test is completed, the wafer insertion base 1 is removed from the top block 4. Then, under the influence of gravity, the sliding base 201 will move downward, thereby driving the monocrystalline silicon wafer body 3 to be received inside the wafer insertion base 1. At the same time, the downward-moving connecting block 201 will drive the connecting rod 203 to rotate, thereby driving the flip cover 204 to close. A plurality of slots 101 are provided on both sides inside the wafer insertion base 1. Both sides of the sliding base 201 are embedded in the slots 101 and are slidably connected thereto, so that the monocrystalline silicon wafer body 3 can be placed into the wafer insertion base 1 along the slots 101.
[0043] Although the embodiments of the present utility model have been shown and described, for those of ordinary skill in the art, it can be understood that various changes, modifications, substitutions and variations can be made to these embodiments without departing from the principles and spirits of the present utility model. The scope of the present utility model is defined by the appended claims and their equivalents.
Claims
1. A base for easy insertion of a piece, characterized in that: include: A wafer inserting seat, wherein a plurality of slots are provided inside the wafer inserting seat, and a single crystal silicon wafer body is arranged in the slots; The pushing part is arranged inside the insert seat, and the pushing part includes a sliding base slidably arranged inside the insert seat, connecting blocks arranged on both sides of the sliding base, a connecting rod rotatably arranged on one side of the connecting block, and a flip cover rotatably connected to one end of the connecting rod, the flip cover is rotationally connected to the insert seat, and the sliding base moves upward to drive the connecting block to move, so as to drive the connecting rod to push the flip cover to rotate and open.
2. A base for easy insertion of a piece according to claim 1, characterized in that: A plurality of slots are provided on both sides of the inserting seat, and both sides of the sliding base are embedded in the slots and slidably connected therewith.
3. A base for easy insertion of a sheet according to claim 1, characterized in that: The pushing part comprises a sliding base, connecting blocks and connecting rods arranged on both sides of the sliding base. Four connecting rods are arranged, and two connecting rods are rotatably arranged on the outer sides of the two connecting blocks respectively.
4. A base for easy insertion of a sheet according to claim 3, characterized in that: Slide grooves are provided on both sides of the insert seat, and the connecting block passes through the slide grooves and is slidably connected thereto.
5. The base for easy insertion of a piece according to claim 1, characterized in that: The pushing part includes a flip cover, a rotating shaft a arranged on both sides of the flip cover, and a rotating shaft b arranged on both sides of the flip cover. A rotating groove is arranged on the top of the insert seat. The rotating shaft a is embedded in the rotating groove and is rotatably connected to the rotating shaft. The rotating shaft b passes through one end of the connecting rod and is rotatably connected to the connecting rod.
6. The base for easy insertion of a piece according to claim 1, characterized in that: The top surface of the sliding base is a concave arc surface, which fits the outer edge of the single crystal silicon wafer body.
7. A single crystal silicon wafer tester, characterized in that: The single crystal silicon wafer tester comprises a base for facilitating wafer insertion as claimed in any one of claims 1 to 4, and further comprises: The tester body is arranged below the inserting seat, and the tester body comprises a test head arranged at the center of the tester body and a display screen arranged above the test head.
8. The single crystal silicon wafer tester according to claim 7, characterized in that: A top block is arranged on one side of the tester body. The top block is a solid cube and is slidably connected to the insert seat.