Performance test tool for VDmos tube

Abstract

The utility model discloses a VDmos tube performance test tool, and relates to the technical field of electronic device production. The device comprises a working plate, a test board, a fixed hemispherical cover, a movable hemispherical cover and a cleaning assembly, the test board is fixed at the center of the top of the working plate, and a placing groove is formed in the top of the test board and used for placing a VDmos tube; the fixed semispherical cover is also fixed at the top of the working plate, the movable semispherical cover is arranged on the fixed semispherical cover in a sliding manner, and a complete spherical cover formed by splicing the fixed semispherical cover and the movable semispherical cover wraps the test board; the cleaning assembly is located at the front end of the fixed hemispherical cover, and the bottom end of the cleaning assembly is fixed to the top of the working plate. According to the VDmos tube testing tool, the fixed hemispherical cover and the movable hemispherical cover are arranged, so that a closed testing space can be formed, the testing temperature can be accurately controlled, a protection function is achieved, and the problems that an existing VDmos tube testing tool is open, the testing temperature is difficult to accurately control, and potential safety hazards exist are solved.

Description

Technical Field

[0001] The utility model belongs to the technical field of electronic device production, and particularly relates to a performance test tooling for a VDmos transistor. Background Art

[0002] The VDmos transistor is a vertical double-diffused metal oxide semiconductor device, which is a common power MOSFET structure and is often used in power amplifiers and switching circuits.

[0003] The VDmos transistor changes transistor characteristics by verticalizing, enhancing, and reorganizing the parallel channels of semiconductor transistors. This structure can greatly improve the dynamic response characteristics and bias control ability of transistors, so it has important applications in high-frequency amplification. In addition, it also has characteristics such as low power consumption, wide dynamic range, high frequency response, and high efficiency, and has a wide operating temperature range. Therefore, it can also be applied to engineering fields such as power amplification, low-voltage control, and line buffering, has a certain reliability, and can meet the requirements of various applications.

[0004] The performance test tooling for a VDmos transistor is a special device used to perform various performance tests on a VDmos transistor. It usually includes a series of test circuits, measuring instruments, and necessary fixtures and connectors to ensure the accuracy and reliability of the test.

[0005] After retrieval, the patent with the publication number CN109633400B and the publication date of October 9, 2020 discloses a performance detection device for a VDMOS vertical gate field effect transistor, including a circuit board and a transistor. A baffle is fixedly connected to the top of the circuit board, a horizontally arranged heating wire is fixedly connected to one side of the top of the baffle, a steel wire is electrically connected to the top of the circuit board, the other end of the steel wire is fixedly connected to a horizontally arranged pressing plate, and a vertically arranged spring is fixedly connected to the top of the pressing plate, and the top of the spring is fixedly connected to the bottom of the circuit board.

[0006] The following are the deficiencies of this patent:

[0007] 1. This performance detection device realizes the stability test of the transistor under high temperature through a heating wire, a curved rod, and a metal wire. However, since the test space is an open space, it is difficult to accurately control the test temperature, resulting in less than ideal test accuracy.

[0008] 2. This performance detection device lacks necessary safety protection measures to prevent electric shock or short circuit that may occur during the test, posing a safety risk to the operator.

[0009] Therefore, we provide a performance test tooling for a VDmos transistor to solve the above problems. Summary of the Utility Model

[0010] The purpose of the present utility model is to provide a performance testing tooling for VDmos transistors. By setting a fixed hemispherical cover and a movable hemispherical cover, a sealed testing space can be formed, the testing temperature can be accurately controlled, and it has a protective effect, solving the problems that the existing testing tooling for VDmos transistors is open, the testing temperature is difficult to accurately control, and there are potential safety hazards.

[0011] To solve the above technical problems, the present utility model is realized through the following technical solutions:

[0012] The present utility model is a performance testing tooling for VDmos transistors, including a working plate, a testing table, a fixed hemispherical cover, a movable hemispherical cover, and a cleaning component; the testing table is fixed at the center of the top of the working plate, and an installation groove is arranged at the top of the testing table for placing VDmos transistors; the fixed hemispherical cover is also fixed at the top of the working plate, the movable hemispherical cover is slidably arranged on the fixed hemispherical cover, and the complete spherical cover formed by splicing the fixed hemispherical cover and the movable hemispherical cover wraps the testing table inside it; the cleaning component is located at the front end position of the fixed hemispherical cover, and its bottom end is fixed at the top of the working plate for cleaning the inner and outer spherical surfaces of the movable hemispherical cover; a pressing mechanism is also included; the pressing mechanism is located above the testing table for pressing the VDmos transistors in the installation groove.

[0013] The present utility model is further arranged such that movable blocks are arranged on three side surfaces inside the installation groove, and each movable block is driven to move by its respective adjusting screw; guide rods are fixed at both ends of the movable block, and the guide rods movably penetrate through the side plates of the testing table.

[0014] The present utility model is further arranged such that a first cooling fan is embedded on the inner bottom surface of the installation groove.

[0015] The present utility model is further arranged such that both the fixed hemispherical cover and the movable hemispherical cover are arranged as transparent cover bodies.

[0016] The present utility model is further arranged such that a sliding groove is arranged at the lower end of the inner surface of the fixed hemispherical cover, and a sliding rail is fixed at the lower end of the outer surface of the movable hemispherical cover; the sliding rail is slidably matched with the sliding groove.

[0017] The present utility model is further arranged such that a first support plate is fixed on one side of the end face of the fixed hemispherical cover, a card slot is arranged on the first support plate, a second support plate is fixed on one side of the end face of the movable hemispherical cover, and a card block that is snap-fitted with the card slot is arranged on the second support plate; the specification of the second support plate is larger than that of the first support plate.

[0018] The present utility model is further configured such that the cleaning assembly includes an outer cleaning cotton block, an inner cleaning cotton block, an outer arc-shaped support plate, and an inner arc-shaped support plate; the outer cleaning cotton block is bonded to the outer arc-shaped support plate and abuts against the outer surface of the movable hemispherical cover, the inner cleaning cotton block is bonded to the inner arc-shaped support plate and abuts against the inner surface of the movable hemispherical cover; the bottom ends of the outer arc-shaped support plate and the inner arc-shaped support plate are both fixed on the working plate.

[0019] The present utility model is further configured such that the pressing mechanism includes a mounting plate, a U-shaped rod, a second cooling fan, and a cylinder; a plurality of the U-shaped rods are fixedly arranged at equal intervals at the bottom of the mounting plate, the U-shaped rods press the VDmos tube, and the second cooling fan is further fixedly arranged at the bottom of the mounting plate, and the second cooling fan is located above the U-shaped rods; the top of the mounting plate is fixedly connected to the end of the movable rod of the cylinder, and the cylinder is fixed on the top of the fixed hemispherical cover.

[0020] The present utility model has the following beneficial effects:

[0021] 1. By providing the fixed hemispherical cover and the movable hemispherical cover, the present utility model can form a sealed test space, so that when performing the stability test of the transistor under high temperature conditions, the test temperature can be accurately controlled, and the test accuracy is better. Moreover, the fixed hemispherical cover and the movable hemispherical cover also have a protective effect, avoiding possible electric shock or short circuit during the test, which may pose a safety risk to the operator.

[0022] 2. By providing the cleaning assembly, the movable hemispherical cover is convenient to clean, enabling the operator to more clearly see the internal condition. During the opening and closing process of the movable hemispherical cover, the inner and outer spherical surfaces of the movable hemispherical cover can be cleaned through the cleaning assembly, and only the outer cleaning cotton block and the inner cleaning cotton block need to be replaced regularly.

[0023] Of course, it is not necessary for any product implementing the present utility model to achieve all the above advantages simultaneously. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] In order to more clearly illustrate the technical solutions of the embodiments of the present utility model, the following will briefly introduce the drawings required for the description of the embodiments. Obviously, the following drawings are only some embodiments of the present utility model. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0025] Figure 1 Overall structural three-dimensional schematic of a performance test tooling for a VDmos tube Figure 1 .

[0026] Figure 2Schematic three-dimensional view of the overall structure of a performance test tooling for a VDmos transistor Figure 2 。

[0027] Figure 3 Explosion diagram of the fixed hemispherical cover, movable hemispherical cover and cleaning component of a performance test tooling for a VDmos transistor

[0028] Figure 4 For a performance test tooling of a VDmos transistor Figure 3 Enlarged view of the structure at position A

[0029] Figure 5 Schematic diagram of the test bench structure of a performance test tooling for a VDmos transistor

[0030] Figure 6 Schematic diagram of the pressing mechanism structure of a performance test tooling for a VDmos transistor

[0031] In the attached drawings, the list of components represented by each reference numeral is as follows

[0032] 1 - working plate, 2 - test bench, 201 - placement groove, 202 - first cooling fan, 203 - movable block, 204 - adjusting screw, 205 - guide rod, 3 - fixed hemispherical cover, 301 - sliding groove, 302 - first support plate, 303 - clamping groove, 4 - movable hemispherical cover, 401 - sliding rail, 402 - second support plate, 5 - cleaning component, 501 - outer cleaning cotton block, 502 - inner cleaning cotton block, 503 - outer arc-shaped support plate, 504 - inner arc-shaped support plate, 6 - pressing mechanism, 601 - mounting plate, 602 - U-shaped rod, 603 - second cooling fan, 604 - cylinder Detailed implementation manners

[0033] Next, the technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without making creative efforts belong to the scope of protection of the present invention Specific embodiment one

[0035] Please refer to Figure 1 、 5 -6. The present invention is a performance test tooling for a VDmos transistor, including a working plate 1 and a test bench 2; the test bench 2 is fixed at the center of the top of the working plate 1, and a placement groove 201 is provided on the top of the test bench 2 for placing the VDmos transistor; it further includes a pressing mechanism 6; the pressing mechanism 6 is located above the test bench 2 and is used to press the VDmos transistor in the placement groove 201

[0036] Specifically, movable blocks 203 are provided at three inner side surfaces of the placement groove 201, and each movable block 203 is driven to move by its respective adjusting screw 204; guide rods 205 are fixed at both ends of the movable block 203, and the guide rods 205 movably penetrate through the side plates of the test bench 2; a first cooling fan 202 is embedded in the inner bottom surface of the placement groove 201.

[0037] Furthermore, the pressing mechanism 6 includes a mounting plate 601, a U-shaped rod 602, a second cooling fan 603, and a cylinder 604; a plurality of U-shaped rods 602 are evenly distributed and fixed at the bottom of the mounting plate 601, and the U-shaped rods 602 press the VDmos transistor. A second cooling fan 603 is also fixed at the bottom of the mounting plate 601, and the second cooling fan 603 is located above the U-shaped rods 602; the top of the mounting plate 601 is fixedly connected to the end of the movable rod of the cylinder 604, and the cylinder 604 is fixed at the top of the fixed hemispherical cover 3.

[0038] The operation process of this embodiment is as follows: Based on the specifications of the VDmos transistor, adjust the positions of the three movable blocks 203, place the VDmos transistor to be tested into the placement groove 201, drive the mounting plate 601 and the U-shaped rod 602 to descend through the cylinder 604, and press the VDmos transistor through the U-shaped rod 602; during the high-power test process, the VDMOS transistor will generate a large amount of heat. Through the cooperation of the first cooling fan 202 and the second cooling fan 603, the temperature of the VDMOS transistor is effectively reduced to ensure its normal operation. Specific Embodiment Two

[0040] Please refer to Figures 1-3 , on the basis of Specific Embodiment One, it further includes a fixed hemispherical cover 3 and a movable hemispherical cover 4; the fixed hemispherical cover 3 is also fixed on the top of the working plate 1, the movable hemispherical cover 4 is slidably arranged on the fixed hemispherical cover 3, and the complete spherical cover formed by splicing the fixed hemispherical cover 3 and the movable hemispherical cover 4 wraps the test bench 2 inside; both the fixed hemispherical cover 3 and the movable hemispherical cover 4 are provided as transparent cover bodies.

[0041] Specifically, a sliding groove 301 is provided at the lower end of the inner surface of the fixed hemispherical cover 3, and a sliding rail 401 is fixed at the lower end of the outer surface of the movable hemispherical cover 4; the sliding rail 401 is slidably matched with the sliding groove 301.

[0042] Furthermore, a first support plate 302 is fixed on one side of the end face of the fixed hemispherical cover 3, a card slot 303 is provided on the first support plate 302, a second support plate 402 is fixed on one side of the end face of the movable hemispherical cover 4, and a clamping block that is clamped and matched with the card slot 303 is provided on the second support plate 402; the specification of the second support plate 402 is larger than that of the first support plate 302.

[0043] The operation process of this embodiment is as follows: when the movable hemispherical cover 4 needs to be opened, pull the second support plate 402 so that the clamping block leaves the clamping groove 303. At this time, the movable hemispherical cover 4 rotates along the sliding groove 301 until the movable hemispherical cover 4 completely rotates into the fixed hemispherical cover 3, so as to completely expose the test bench 2 for operation; the fixed hemispherical cover 3 and the movable hemispherical cover 4 can form a sealed test space. Thus, when performing the transistor stability test under high temperature conditions, the test temperature can be accurately controlled, and the test accuracy is better. Moreover, the fixed hemispherical cover 3 and the movable hemispherical cover 4 also have a protective effect, avoiding the possible electric shock or short circuit during the test, which may pose a safety risk to the operator. Specific Embodiment Three

[0045] Please refer to Figures 3-4 , on the basis of Specific Embodiment One and Specific Embodiment Two, it further includes a cleaning component 5; the cleaning component 5 is located at the front end position of the fixed hemispherical cover 3, and its bottom end is fixed on the top of the working plate 1, and is used to clean the inner and outer spherical surfaces of the movable hemispherical cover 4.

[0046] Specifically, the cleaning component 5 includes an outer cleaning cotton block 501, an inner cleaning cotton block 502, an outer arc-shaped support plate 503 and an inner arc-shaped support plate 504; the outer cleaning cotton block 501 is bonded to the outer arc-shaped support plate 503 and abuts against the outer surface of the movable hemispherical cover 4, and the inner cleaning cotton block 502 is bonded to the inner arc-shaped support plate 504 and abuts against the inner surface of the movable hemispherical cover 4; the bottom ends of the outer arc-shaped support plate 503 and the inner arc-shaped support plate 504 are both fixed on the working plate 1.

[0047] The operation process of this embodiment is as follows: during the opening and closing process of the movable hemispherical cover 4, the inner and outer spherical surfaces of the movable hemispherical cover 4 can be cleaned through the cleaning component 5, and only the outer cleaning cotton block 501 and the inner cleaning cotton block 502 need to be replaced regularly; the setting of the cleaning component 5 makes the movable hemispherical cover 4 easy to clean, and it is convenient for the operator to see the internal condition more clearly.

[0048] In the description of this specification, the description with reference to terms such as "one embodiment", "example", "specific example", etc. means that the specific features, structures, materials or characteristics described in connection with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described can be combined in any one or more embodiments or examples in a suitable manner.

[0049] The preferred embodiments of the present utility model disclosed above are only used to help illustrate the present utility model. The preferred embodiments do not describe all the details in detail, nor do they limit the present utility model to the specific embodiments described. Obviously, many modifications and variations can be made according to the content of this specification. These embodiments are selected and specifically described in this specification to better explain the principle and practical application of the present utility model, so that those skilled in the art can well understand and utilize the present utility model. The present utility model is only limited by the claims and their full scope and equivalents.

Claims

1. A VDmos tube performance test tool, comprising a working plate (1), a test bench (2), a fixed hemispherical cover (3), a movable hemispherical cover (4) and a cleaning component (5); characterized in that: The test bench (2) is fixed at the top center of the working plate (1), and a placement groove (201) is provided on the top of the test bench (2), and the placement groove (201) is used to place the VDmos tube; The fixed hemispherical cover (3) is also fixed on the top of the working plate (1), and the movable hemispherical cover (4) is slidably arranged on the fixed hemispherical cover (3). The fixed hemispherical cover (3) and the movable hemispherical cover (4) are spliced ​​together to form a complete hemispherical cover, which wraps the test bench (2) inside. The cleaning component (5) is located at the front end of the fixed hemispherical cover (3), and its bottom end is fixed to the top of the working plate (1), and is used to clean the inner and outer spherical surfaces of the movable hemispherical cover (4); It also comprises a pressing mechanism (6); the pressing mechanism (6) is located above the test bench (2) and is used to press the VDmos tube in the placement groove (201).

2. A VDmos tube performance testing tool according to claim 1, characterized in that: Movable blocks (203) are arranged on the three inner side surfaces of the placement groove (201), and each movable block (203) is driven to move by its own adjusting screw rod (204); Guide rods (205) are fixed at both ends of the movable block (203), and the guide rods (205) movably penetrate the side plates of the test bench (2).

3. A VDmos tube performance testing tool according to claim 2, characterized in that: A first heat dissipation fan (202) is embedded on the inner bottom surface of the placement groove (201).

4. A VDmos tube performance testing tool according to claim 1, characterized in that: The fixed hemispherical cover (3) and the movable hemispherical cover (4) are both configured as transparent cover bodies.

5. The performance testing tool for VDmos tube according to claim 1, characterized in that: A slide groove (301) is provided at the lower end of the inner surface of the fixed hemispherical cover (3), and a slide rail (401) is fixed at the lower end of the outer surface of the movable hemispherical cover (4); The slide rail (401) is slidably matched with the slide groove (301).

6. The performance testing tool for a VDmos tube according to claim 1, characterized in that: A first support plate (302) is fixed to one side of the end surface of the fixed hemispherical cover (3), and a clamping groove (303) is provided on the first support plate (302); a second support plate (402) is fixed to one side of the end surface of the movable hemispherical cover (4), and a clamping block that is clamped and matched with the clamping groove (303) is provided on the second support plate (402); The specification of the second support plate (402) is greater than that of the first support plate (302).

7. A VDmos tube performance testing tool according to claim 1, characterized in that: The cleaning assembly (5) comprises an outer cleaning cotton block (501), an inner cleaning cotton block (502), an outer arc-shaped support plate (503) and an inner arc-shaped support plate (504); The outer cleaning cotton block (501) is bonded to the outer arc-shaped support plate (503) and abuts against the outer surface of the movable hemispherical cover (4); the inner cleaning cotton block (502) is bonded to the inner arc-shaped support plate (504) and abuts against the inner surface of the movable hemispherical cover (4); The bottom ends of the outer arc-shaped support plate (503) and the inner arc-shaped support plate (504) are both fixed on the working plate (1).

8. The performance testing tool for VDmos tube according to claim 1, characterized in that: The pressing mechanism (6) comprises a mounting plate (601), a U-shaped rod (602), a second cooling fan (603) and a cylinder (604); A plurality of U-shaped rods (602) distributed at equal intervals are fixed to the bottom of the mounting plate (601), and the U-shaped rods (602) press the VDmos tubes tightly. The second cooling fan (603) is also fixed to the bottom of the mounting plate (601), and the second cooling fan (603) is located above the U-shaped rods (602); The top of the mounting plate (601) is fixedly connected to the end of the movable rod of the cylinder (604), and the cylinder (604) is fixed to the top of the fixed hemispherical cover (3).

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