Consumable chip
By setting a positioning part on the burning contacts of the consumable chip, the burning failure caused by the burning tool alignment difficulties and hand shaking is solved, and a stable burning process is achieved.
Patent Information
- Application Number
- CN202422374007.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Priority Date
- 2024-07-02
- Filing Date
- 2024-09-27
- Publication Date
- 2025-06-24
- Estimated Expiration
- 2034-09-27
AI Technical Summary
After the consumable chip is assembled, it is difficult to properly align the metal test probe and the burning contacts of the burning tool, resulting in failure of burning or successful burning multiple times, and hand shaking may lead to failure of burning.
The positioning part is provided on the burning contact of the consumable chip so that the protruding part of the test probe of the burning device can extend into the positioning part to form a positioning, and guide the positioning to avoid burning failure.
By setting the positioning part, ensure the correct alignment of the burning tool, avoid burning failure, and reduce deviation problems caused by hand shaking and other factors.
Smart Images
Figure CN223014167U_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of printing consumables, and particularly to a consumable chip. Background Art
[0002] Printers are commonly used office equipment. Printers have consumables such as ink cartridges and developing cartridges. A chip is provided on the consumable for storing relevant information about the consumable, such as consumable model, production date, manufacturer, serial number, chip program version and other attribute information. As the consumable model and the like are updated, it is necessary to overwrite and update the current program content in the chip, which requires the use of a chip reading and writing device to burn the chip program, that is, to perform a "rework" process on the chip to be upgraded.
[0003] Consumable chips usually have burning contacts, which can be the same as the printing contacts or additional burning contacts. Due to the limitations of some consumable installation positions, the chip has a small length and width, a small distance between each contact, and the length and width of the burning contact are usually less than 6*6 mm. Further, after additional burning contacts are provided on the consumable chip, the contact size is even less than 4*4 mm.
[0004] After the consumable chip is assembled on the consumable and data is burned using a burning tool, it is difficult for the protruding part of the metal test probe of the burning tool to form correct alignment with the corresponding burning contact, resulting in burning failure or multiple burns to succeed; even if the initial alignment is successful, during the burning process, due to factors such as hand shaking, the test probe may deviate from the contact, causing burning failure. Utility Model Content
[0005] An embodiment of this application provides a consumable chip to solve the problem that after the consumable chip is assembled on the consumable and data is burned using a burning tool, it is difficult for the protruding part of the metal test probe of the burning tool to form correct alignment with the corresponding burning contact, resulting in burning failure or multiple burns to succeed; even if the initial alignment is successful, during the burning process, due to factors such as hand shaking, the test probe may deviate from the contact, causing burning failure.
[0006] An embodiment of this application provides a consumable chip, including:
[0007] A chip substrate;
[0008] Printing contacts, which are arranged on the chip substrate;
[0009] Burning contacts, which are arranged on the chip substrate, the area of the burning contacts is smaller than that of the printing contacts, and positioning parts are arranged on the burning contacts.
[0010] In a possible implementation, the positioning portion is provided on at least one of the printing contacts.
[0011] In a possible implementation, a plurality of the printing contacts and a plurality of the programming contacts are provided on the chip substrate, and one positioning portion is respectively provided on at least two of the printing contacts and at least two of the programming contacts.
[0012] In a possible implementation, there is a first spacing between two adjacent programming contacts, and a second spacing between two adjacent printing contacts, and the first spacing is greater than the second spacing.
[0013] In a possible implementation, the positioning portions are arranged at intervals, there is a center spacing between two adjacent positioning portions, and at least two of the center spacings are not equal.
[0014] In a possible implementation, the center spacing between the positioning portions on two adjacent programming contacts is greater than the center spacing between the positioning portions on two adjacent printing contacts.
[0015] In a possible implementation, each center spacing is 1 mm to 6 mm.
[0016] In a possible implementation, the positioning portion is a hole structure or a groove structure.
[0017] In a possible implementation, in the length direction or the width direction of the chip substrate, the size of the positioning portion is 0.4 mm to 2 mm.
[0018] In a possible implementation, the positioning portion is provided at the center of the printing contact, and the positioning portion is provided at the center of the programming contact.
[0019] The embodiment of the present application provides a consumable chip. By providing the positioning portion on the programming contact, the convex portion of the test probe of the programming device can extend into the positioning portion to form positioning. During the chip programming process, the positioning portion can guide and position the test probe, and programming failure can be avoided.
[0020] By providing the positioning portion on the programming contact, the convex portion of the test probe of the programming device can extend into the positioning portion to form positioning, and it can also avoid the test probe deviating from the contact due to factors such as hand shaking during the programming process, resulting in programming failure. Description of the Drawings
[0021] To more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the following will briefly introduce the accompanying drawings required for the description of the embodiments or the prior art. Obviously, the accompanying drawings in the following description are some embodiments of the present application. For those of ordinary skill in the art, without creative efforts, other accompanying drawings can also be obtained based on these drawings.
[0022] Figure 1 It is the installation diagram of the consumable chip provided in Embodiment 1 of the present application;
[0023] Figure 2 For Figure 1 the burning test diagram of the consumable chip in
[0024] Figure 3 For Figure 1 the structural schematic diagram of the consumable chip in
[0025] Figure 4 It is the structural schematic diagram of the consumable chip provided in Embodiment 2 of the present application;
[0026] Figure 5 It is the structural schematic diagram of the consumable chip provided in Embodiment 3 of the present application.
[0027] Explanation of the reference numerals:
[0028] 1 - Consumable chip;
[0029] 10 - Chip substrate;
[0030] 11 - Printing contact;
[0031] 12 - Burning contact;
[0032] 121 - Positioning part;
[0033] 2 - Consumable cartridge;
[0034] 3 - Test probe. Detailed implementation manners
[0035] To make the objectives, technical solutions, and advantages of the embodiments of the present application clearer, the following will clearly and completely describe the technical solutions in the embodiments of the present application with reference to the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are some, rather than all, of the embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative efforts belong to the scope of protection of the present application.
[0036] It should be noted that the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the quantity of the indicated technical features. Thus, features defined with "first" and "second" may explicitly or implicitly include at least one of such features. In the description of the present application, the meaning of "a plurality" is at least two, such as two, three, etc., unless otherwise specifically defined.
[0037] In the present application, unless otherwise clearly defined and limited, terms such as "installed", "connected", "fixed", etc. shall be understood in a broad sense. For example, it may be a fixed connection, a detachable connection, or integrated; it may be a mechanical connection, an electrical connection, or communicable with each other; it may be directly connected, or indirectly connected through an intermediate medium, and may be the communication inside two components or the interaction relationship between two components, unless otherwise clearly limited. For those of ordinary skill in the art, the specific meanings of the above terms in the present application can be understood according to specific circumstances.
[0038] In the present application, unless otherwise clearly defined and limited, the first feature being "on" or "under" the second feature may be that the first and second features are in direct contact, or the first and second features are indirectly in contact through an intermediate medium. Moreover, the first feature being "above", "over" and "on" the second feature may be that the first feature is directly above or obliquely above the second feature, or merely indicates that the first feature is at a higher level than the second feature in terms of horizontal height. The first feature being "under", "beneath" and "under" the second feature may be that the first feature is directly below or obliquely below the second feature, or merely indicates that the first feature is at a lower level than the second feature in terms of horizontal height.
[0039] In the above description, the description referring to terms such as "one embodiment", "some embodiments", "examples", "specific examples", or "some examples" means that the specific features, structures, materials, or characteristics described in connection with the embodiment or example are included in at least one embodiment or example of the present application. In this specification, the schematic descriptions of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials, or characteristics described may be combined in a suitable manner in any one or more embodiments or examples. In addition, without contradiction, those skilled in the art can combine and combine the different embodiments or examples described in this specification and the features of different embodiments or examples.
[0040] In the related art, after the consumable chip is assembled to the consumable, a burning tool is used to burn data, making it difficult for the protruding parts of the metal test probes of the burning tool and the corresponding burning contacts to form correct alignment, resulting in burning failure, or multiple burns are required to succeed; even if the initial alignment is successful, during the burning process, due to factors such as hand shaking, the test probes may deviate from the contacts, causing burning failure.
[0041] To solve the above problems, an embodiment of the present application provides a consumable chip. A positioning portion is provided on the programming contact, so that the protruding portion of the test probe of the programming device can extend into the positioning portion to form positioning. During the chip programming process, the positioning portion can guide and position the test probe, which can avoid programming failure and avoid the test probe deviating from the contact due to factors such as hand shaking during the programming process, resulting in programming failure.
[0042] The following specifically describes the consumable chip provided by the embodiment of the present application in conjunction with specific embodiments.
[0043] Figure 1 The present application provides an installation diagram of a consumable chip 1 on a consumable cartridge 2. A chip installation position is provided on the consumable cartridge 2, and the consumable chip 1 is installed on the chip installation position. Due to the structural limitations of the chip installation position, the consumable chip 1 is set to be very small.
[0044] See Figure 2 As shown, the consumable chip 1 includes a chip substrate 10. The length direction of the chip substrate 10 is the Y-axis direction, and the width direction of the chip substrate 10 is the X-axis direction.
[0045] The consumable chip 1 further includes a printing contact 11 for electrically connecting with the stylus of the printer. The printing contact 11 is provided on the chip substrate 10.
[0046] When reworking the consumable chip 1 that needs to be upgraded, the printing contact 11 can also function as a programming contact, that is, it can be used as a contact with programming function to program the chip program.
[0047] The number of the printing contacts 11 can be set according to actual needs. In some examples, two printing contacts 11 are provided on the chip substrate 10, and the two printing contacts 11 are spaced along the width direction of the chip substrate 10.
[0048] The shape of the printing contact 11 is not specifically set. In some examples, in the length direction of the chip substrate 10, the size of the printing contact 11 is less than 6 mm. In the width direction of the chip substrate 10, the size of the printing contact 11 is less than 6 mm.
[0049] The consumable chip 1 further includes a programming contact 12. The programming contact 12 is an additional contact added when reworking the consumable chip 1 that needs to be upgraded. It can be understood that when reworking the consumable chip 1 that needs to be upgraded, the test probe 3 of the programming device programs the chip program through the programming contact 12. The programming contact 12 is not electrically connected to the stylus of the printer, that is, the programming contact 12 cannot contact and communicate with the stylus of the printer.
[0050] The programming contact 12 is disposed on the chip substrate 10. Exemplarily, the printing contact 11 and the programming contact 12 are located on the same side of the chip substrate 10.
[0051] The shape of the programming contact 12 is not specifically set. In some examples, in the length direction of the chip substrate 10, the size of the programming contact 12 is less than 4 mm. In the width direction of the chip substrate 10, the size of the programming contact 12 is less than 4 mm.
[0052] In some examples, in the length direction of the chip substrate 10, the programming contact 12 is located on one side of the printing contact 11.
[0053] The area of the programming contact 12 is smaller than the area of the printing contact 11. Specifically, in the plane defined by the X-axis and the Y-axis, the area of the side of the programming contact 12 facing away from the chip substrate 10 is smaller than the area of the side of the printing contact 11 facing away from the chip substrate 10. It can be understood that the projected area of the programming contact 12 on the chip substrate 10 is smaller than the projected area of the printing contact 11 on the chip substrate 10.
[0054] A positioning portion 121 is provided on the programming contact 12, which can enable the protruding portion of the test probe 3 of the programming device to extend into the positioning portion 121 to form a positioning. During the chip programming process, the positioning portion 121 can guide and position the test probe 3, which can avoid programming failures and also avoid programming failures caused by factors such as hand shaking during the programming process, which may cause the test probe 3 to deviate from the contact.
[0055] It should be noted that the printing contact 11 may or may not be provided with the positioning portion 121.
[0056] The positioning portion 121 can be a hole structure or a groove structure. In some examples, the positioning portion 121 can be a positioning hole. In other examples, the positioning portion 121 can be a positioning groove.
[0057] In a possible implementation, in the length direction of the chip substrate 10, the size of the positioning portion 121 may be 0.4 mm to 2 mm; in the width direction of the chip substrate 10, the size of the positioning portion 121 may be 0.4 mm to 2 mm. With such a setting, when the size of the positioning portion in the length direction or the width direction of the chip substrate 10 is less than 0.4 mm, since the size of the positioning portion 121 is too small, positioning of the test probe 3 of the programming device cannot be achieved. When the size of the positioning portion in the length direction or the width direction of the chip substrate 10 is greater than 2 mm, since the size of the positioning portion 121 is too large, the test probe 3 of the programming device is likely to move on the positioning portion 121. When the size of the positioning portion in the length direction or the width direction of the chip substrate is 0.4 mm to 2 mm, the protruding portion of the test probe 3 of the programming device can extend into the positioning portion 121 to form positioning. During the chip programming process, the positioning portion 121 can guide and position the test probe 3, which can avoid programming failures and can also prevent the test probe 3 from deviating from the contact due to factors such as hand shaking during the programming process, resulting in programming failures.
[0058] Further, the test probe 3 of the programming device has a protruding portion. In the length direction of the chip substrate 10, the size of the protruding portion is slightly larger than the size of the positioning portion 121. In the width direction of the chip substrate 10, the size of the protruding portion is slightly larger than the size of the positioning portion 121, so that the protruding portion and the positioning portion 121 form a clamping position, forming an interference fit, being not easy to move, and forming a stable electrical connection, which can prevent the test probe 3 from deviating from the contact due to jitter during the test process. Or, in the length direction of the chip substrate 10, the size of the protruding portion is equal to the size of the positioning portion 121. In the width direction of the chip substrate 10, the size of the protruding portion is equal to the size of the positioning portion 121, so that the protruding portion and the positioning portion 121 form a clamping position, forming an interference fit, being not easy to move, and forming a stable electrical connection, which can prevent the test probe 3 from deviating from the contact due to jitter during the test process.
[0059] In this embodiment, the protruding portion of the test probe 3 may include one protrusion, and one positioning portion 121 may be provided on the contact corresponding to each test probe 3. In other embodiments, the protruding portion of the test probe 3 may include multiple protrusions, and multiple positioning portions 121 may be provided on the contact corresponding to each test probe 3, and the positioning portions 121 correspond to the protrusions one by one.
[0060] In a possible implementation, at least one programming contact 12 is provided on the chip substrate 10.
[0061] Among them, the number of the programming contacts 12 may be one or multiple.
[0062] In some examples, refer to Figure 2 and Figure 3As shown, two printing contacts 11 and two programming contacts 12 are provided on the chip substrate 10. In the length direction of the chip substrate 10, the two programming contacts 12 are located on one side of the two printing contacts 11; in the width direction of the chip substrate 10, the two printing contacts 11 are spaced apart, and the two programming contacts 12 are spaced apart. With such a setting, contact between each contact is avoided.
[0063] In a possible implementation, a positioning portion 121 is provided on at least one printing contact 11.
[0064] Among them, the number of printing contacts 11 provided with the positioning portion 121 may be less than the number of all printing contacts 11, or may also be equal to the number of all printing contacts 11.
[0065] In other implementations, the positioning portion 121 may not be provided on the printing contact 11, and the positioning portion 121 is provided on at least one programming contact 12.
[0066] See Figure 4 As shown, the number of programming contacts 12 provided with the positioning portion 121 is one, the number of all programming contacts 12 is two, and the number of programming contacts 12 provided with the positioning portion 121 may be less than the number of all programming contacts 12.
[0067] See Figure 5 As shown, the number of programming contacts 12 provided with the positioning portion 121 may be equal to the number of all programming contacts 12, and the number of programming contacts 12 provided with the positioning portion 121 and the number of all programming contacts 12 are both two.
[0068] In a possible implementation, a plurality of printing contacts 11 and a plurality of programming contacts 12 are provided on the chip substrate 10, and a positioning portion 121 is respectively provided on at least two printing contacts 11 and at least two programming contacts 12.
[0069] Exemplarily, see Figure 2 and Figure 3 As shown, two printing contacts 11 and two programming contacts 12 are provided on the chip substrate 10, and a positioning portion 121 is respectively provided on each printing contact 11 and each programming contact 12. With such a setting, the protruding portions of the four test probes 3 of the programming device can be positioned by the four positioning portions 121 respectively. During the chip programming process, the four positioning portions 121 can guide and position the four test probes 3 to avoid programming failure.
[0070] In a possible implementation, a positioning portion 121 may be provided at the center of the printing contact 11, and a positioning portion 121 may be provided at the center of the programming contact 12. With such a setting, after the test probe 3 disengages from the positioning portion 121, it can contact the remaining part of the contact, so that the test probe 3 is not easily deviated from the contact.
[0071] In a possible implementation, the positioning portions 121 are arranged at intervals, and there is a center distance between two adjacent positioning portions 121, and at least two center distances are not equal. With such a setting, when positioning each test probe 3 of the programming device, it is possible to prevent each test probe 3 from being wrongly connected to the positioning portion 121, for anti-fooling.
[0072] Wherein, the center distance is the distance between the center of one positioning portion 121 and the center of another positioning portion 121 among two adjacent positioning portions 121 in the length direction or the width direction of the chip substrate 10.
[0073] Exemplarily, as shown in Figure 3 As shown, two printing contacts 11 and two programming contacts 12 are provided on the chip substrate 10. The two printing contacts 11 are the first printing contact and the second printing contact in sequence in the +X axis direction, and the two programming contacts 12 are the first programming contact and the second programming contact in sequence in the +X axis direction. In the width direction of the chip substrate 10, a positioning portion 121 is provided on each of the first programming contact and the second programming contact, and the center distance between the positioning portion 121 on the first programming contact and the positioning portion 121 on the second programming contact is A; a positioning portion 121 is provided on each of the first printing contact and the second printing contact, and the center distance between the positioning portion 121 on the first printing contact and the positioning portion 121 on the second printing contact is C. In the length direction of the chip substrate 10, the center distance between the positioning portion 121 on the first programming contact and the positioning portion 121 on the first printing contact is B.
[0074] The size of A may be 1 mm to 6 mm. The size of B may be 1 mm to 6 mm. The size of C may be 1 mm to 6 mm.
[0075] Further, the size of A may not be equal to the size of B. Or, the size of A may not be equal to the size of C. Or, the size of B may not be equal to the size of C. Or, the size of A may not be equal to the size of B, the size of A may not be equal to the size of C, and the size of B may not be equal to the size of C.
[0076] In a possible implementation, the center distance between the positioning portions 121 on two adjacent programming contacts 12 is greater than the center distance between the positioning portions 121 on two adjacent printing contacts 11. Specifically, in Figure 3The center distance between the positioning portions 121 on two adjacent programming contacts 12 is A, and the center distance between the positioning portions 121 on two adjacent printing contacts 11 is C. The size of A is greater than the size of C.
[0077] Since the area of the programming contact 12 is smaller than the area of the printing contact 11, making the size of A greater than the size of C can reduce the possibility that the test probe 3 on one programming contact 12 shorts with another programming contact 12 after detaching from the positioning portion 121 in the event of sudden situations such as severe jitter.
[0078] In a possible implementation manner, two adjacent programming contacts 12 have a first spacing. Specifically, referring to Figure 3 As shown, in the width direction of the chip substrate 10, the spacing between two adjacent programming contacts 12 is the first spacing.
[0079] Two adjacent printing contacts 11 have a second spacing. Specifically, referring to Figure 3 As shown, in the width direction of the chip substrate 10, the spacing between two adjacent printing contacts 11 is the second spacing.
[0080] The first spacing is greater than the second spacing. With such a setting, it is possible to avoid increasing the possibility of short - circuit between two programming contacts 12 due to the close distance between the two programming contacts 12.
[0081] Finally, it should be noted that: the above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them; although the present application has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that: they can still modify the technical solutions recorded in the foregoing embodiments, or perform equivalent replacements on some or all of the technical features; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the scope of the technical solutions of the embodiments of the present application.
Claims
1. A consumable chip (1), characterized in that: include: Chip substrate (10); Printing contacts (11), the printing contacts (11) being arranged on the chip substrate (10); A burning contact (12), wherein the burning contact (12) is arranged on the chip substrate (10), the area of the burning contact (12) is smaller than the area of the printing contact (11), and a positioning portion (121) is arranged on the burning contact (12).
2. The consumable chip (1) according to claim 1, characterized in that: The positioning portion (121) is provided on at least one of the printing contacts (11).
3. The consumable chip (1) according to claim 2, characterized in that: A plurality of printing contacts (11) and a plurality of burning contacts (12) are arranged on the chip substrate (10), and a positioning portion (121) is respectively arranged on at least two of the printing contacts (11) and at least two of the burning contacts (12).
4. The consumable chip (1) according to claim 3, characterized in that: Two adjacent burning contacts (12) have a first spacing, and two adjacent printing contacts (11) have a second spacing, and the first spacing is greater than the second spacing.
5. The consumable chip (1) according to claim 3, characterized in that: The positioning portions (121) are arranged at intervals, and there is a center distance between two adjacent positioning portions (121), and at least two center distances are unequal.
6. The consumable chip (1) according to claim 5, characterized in that: The center distance between the positioning parts (121) on two adjacent burning contacts (12) is greater than the center distance between the positioning parts (121) on two adjacent printing contacts (11).
7. The consumable chip (1) according to claim 5, characterized in that: Each center distance is 1 mm to 6 mm.
8. The consumable chip (1) according to any one of claims 1 to 7, characterized in that: The positioning portion (121) is a hole structure or a groove structure.
9. The consumable chip (1) according to any one of claims 1 to 7, characterized in that: In the length direction or the width direction of the chip substrate (10), the size of the positioning portion (121) is 0.4 mm to 2 mm.
10. The consumable chip (1) according to any one of claims 2 to 7, characterized in that: The center of the printing contact (11) is provided with the positioning portion (121), and the center of the burning contact (12) is provided with the positioning portion (121).