X-ray diffraction sample table

Abstract

The utility model belongs to the technical field of detection, and relates to an X-ray diffraction sample table which comprises an objective table, a supporting piece and a fixing piece, long guide holes are formed in the middles of the two side faces of the objective table, and the two long guide holes are oppositely arranged. Through holes are formed in the positions, close to the top ends, of the middles of the other two side faces of the objective table, the two through holes are oppositely formed, and the fixing pieces penetrate through the through holes. The supporting piece is provided with a long through threaded hole and arranged in the inner cavity of the objective table, and the fixing piece penetrates through the long guide hole to be connected with the long threaded hole. The device is suitable for testing powder samples, blocky samples with various volumes and sizes and film samples, is convenient to mount, is simple in operation of adjusting the height of a sample test surface according to the sizes of the samples, does not have height deviation caused by rebound of plasticine, and ensures the accuracy of diffraction test data; and the sample does not need to be cut or damaged, so that the sample is not dirtied, and the sample is convenient to recycle.

Description

Technical Field

[0001] The utility model belongs to the technical field of detection, and specifically relates to an X-ray diffraction sample stage. Background Art

[0002] X-ray diffraction is a powerful means for analyzing the internal structure of crystals and has become a conventional method for characterizing the structures of various materials. When X-rays irradiate a sample, since the crystals in the sample are composed of unit cells formed by regularly arranged atoms, the distances between these regularly arranged atoms are of the same order of magnitude as the wavelength of the incident X-rays. Therefore, the X-rays scattered by different atoms will interfere with each other, and strong X-ray diffraction will occur in certain special directions. In the diffraction phase test experiment, the height of the sample test surface affects the diffraction test result. When the height of the test sample surface is not at the standard test position, the light after the X-rays are diffracted by the sample will not irradiate the detector to the greatest extent, resulting in a weakening of the signal received by the detector. At the same time, it will also cause a shift in the diffraction peak position and may even make the diffraction peak undetectable, thereby causing calculation errors in phase analysis, interplanar spacing, and lattice constant. The deviation of the sample surface height from the test standard position will affect the accuracy and reliability of the test results.

[0003] In existing diffraction tests, the side tilt method is often used to test stress. This method requires tilting the entire sample stage and setting multiple tilt angles to test the change rate of the azimuth angles of different crystal planes of the sample. When the height of the test sample surface is not at the standard test position or there is movement during the test, the diffraction angle 2θ of the crystal plane will deviate, thereby causing a calculation error in stress. For existing X-ray diffractometers, the methods for testing bulk samples are as follows: (1) Using a sample holder with grooves, the bulk sample needs to be directly placed in the groove. If the thickness of the sample is less than the thickness of the groove, plasticine needs to be placed under the sample to ensure that the height of the sample surface is flush with the upper surface of the sample holder, and then the sample holder is placed on the sample stage for testing. The disadvantages of this method are: generally, the thickness of the grooves in the sample holder is very small, only a few millimeters, which is only suitable for testing bulk samples with very thin thickness and small area. Larger samples cannot be directly tested and need to be cut into a suitable volume for testing, which requires time and effort to prepare the sample; the sample cannot be fixed, which is not suitable for stress testing; and it damages the sample and affects the recycling of the sample. (2) Directly using plasticine to fix the sample on the sample stage, the height of the plasticine can be changed according to the size of the sample to make the height of the sample test surface reach the test standard height. However, the disadvantages of using plasticine are: plasticine is a soft substance with elastic deformation, and there will be a phenomenon of plasticine rebound after fixing the sample, resulting in a deviation between the sample test height and the standard position, thereby causing inaccurate test data. At the same time, plasticine has oiliness, and when it fits and wraps the sample, it will dirty the sample and affect the recycling of the sample. Summary of the Utility Model

[0004] To solve the problems existing in the prior art, the main object of the present utility model is to propose an X-ray diffraction sample stage.

[0005] To solve the above technical problems, according to one aspect of the present utility model, the following technical solutions are provided:

[0006] An X-ray diffraction sample stage, comprising a loading platform, a support member, and a fixing member;

[0007] Long guiding holes are formed in the middle of two side surfaces of the loading platform, and the two long guiding holes are arranged oppositely;

[0008] Through holes are formed in the middle of the other two side surfaces of the loading platform near the top end, and the two through holes are arranged oppositely, and the fixing member passes through the through holes;

[0009] The support member is provided with a through long threaded hole and is placed in the inner cavity of the loading platform, and the fixing member passes through the long guiding hole and is connected to the long threaded hole.

[0010] As a preferred scheme of the X-ray diffraction sample stage described in the present utility model, wherein: the shape of the long guiding hole is a semi-circular long strip opening.

[0011] As a preferred scheme of the X-ray diffraction sample stage described in the present utility model, wherein: the through hole is a threaded hole.

[0012] As a preferred scheme of the X-ray diffraction sample stage described in the present utility model, wherein: the support member is a block.

[0013] As a preferred scheme of the X-ray diffraction sample stage described in the present utility model, wherein: the fixing member is a bolt, and the diameter of the bolt is 3-7% smaller than the diameters of the long threaded hole and the threaded hole.

[0014] As a preferred scheme of the X-ray diffraction sample stage described in the present utility model, wherein: the loading platform is rectangular, square or circular, and the shape of the support member is the same as that of the inner cavity of the loading platform.

[0015] As a preferred scheme of the X-ray diffraction sample stage described in the present utility model, wherein: fixing holes are formed in the bottom surface of the loading platform for fixing the loading platform at the corresponding sample stage position on the X-ray diffractometer.

[0016] The beneficial effects of the present utility model are as follows:

[0017] The present utility model provides an X-ray diffraction sample stage, which includes a stage, a support member, and a fixing member. Long guiding holes are formed in the middle of two side surfaces of the stage, and the two long guiding holes are arranged oppositely. Through holes are formed in the middle of the other two side surfaces of the stage near the top, and the two through holes are arranged oppositely. The fixing member passes through the through holes. The support member is provided with a through long threaded hole and is placed in the inner cavity of the stage. The fixing member passes through the long guiding hole and is connected to the long threaded hole. The present invention is applicable to the testing of powder samples, bulk samples of various sizes, and thin film samples. It is easy to install, and the operation of adjusting the height of the sample testing surface according to the sample size is simple. There is no height deviation caused by the rebound of plasticine, ensuring the accuracy of diffraction test data. It is not necessary to perform operations such as cutting the sample that damage the sample, and it does not dirty the sample, facilitating the recycling of the sample. Description of the Drawings

[0018] In order to more clearly illustrate the technical solutions in the embodiments of the present utility model or the prior art, the following will briefly introduce the drawings required for use in the description of the embodiments or the prior art. Obviously, the following drawings are only some embodiments of the present utility model. For those of ordinary skill in the art, without creative efforts, other drawings can be obtained based on the structures shown in these drawings.

[0019] Figure 1 It is a schematic diagram of the overall structure of an X-ray diffraction sample stage of the present utility model.

[0020] Figure 2 It is a schematic diagram of the stage and the fixing member of an X-ray diffraction sample stage of the present utility model.

[0021] Figure 3 It is a top view of the stage of an X-ray diffraction sample stage of the present utility model.

[0022] Figure 4 It is a front view of the stage of an X-ray diffraction sample stage of the present utility model.

[0023] Figure 5 It is a schematic diagram of the support member of an X-ray diffraction sample stage of the present utility model.

[0024] Figure 6 It is a front view of the support member of an X-ray diffraction sample stage of the present utility model.

[0025] Among them, 1-stage; 2-support member; 3-fixing member; 4-through hole; 5-long guiding hole.

[0026] The realization of the purpose, functional features, and advantages of the present utility model will be further described in conjunction with the embodiments and with reference to the drawings. Detailed Embodiments

[0027] The technical solutions in the embodiments will be clearly and completely described below. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts shall fall within the protection scope of the present invention.

[0028] The present invention provides an X-ray diffraction sample stage as Figure 1-6 shown, which includes a sample stage 1, a support member 2 and a plurality of fixing members 3.

[0029] Long guide holes 5 are formed in the middle of two side surfaces of the sample stage 1. The shape of the long guide holes 5 is a semi-circular long strip opening, and the two long guide holes are arranged oppositely; the support member 2 is located in the inner cavity of the sample stage 1 and is a block body. The support member 2 is provided with threaded holes for connecting the fixing members 3 passing through the long guide holes 5; the fixing members 3 can be bolts, and the diameter of the bolts is 3-7% smaller than the diameter of the threaded holes to ensure that the bolts can enter smoothly and be tightly fixed; the sample stage 1, the support member 2 and the fixing members 3 can form a sample stage with adjustable height of the support member 2. When the thickness of the sample is different, loosen the bolts on both sides. The bolts can move up and down in the long guide holes 5. After adjusting the height of the support member 2, tighten the bolts on both sides to fix the support member 2. So that the surface of the sample placed on the support member 2 is consistent with the test standard position. This diffraction sample stage is suitable for testing powder samples and block samples of different sizes, with convenient installation and simple operation for adjusting the sample height; there is no phenomenon of the rebound of plasticine, ensuring the accuracy of test data; it does not damage or dirty the sample, facilitating the recycling of the sample.

[0030] Through holes 4 are formed in the middle of the other two side surfaces of the sample stage 1 near the top end. The through holes 4 and the long guide holes 5 are located on different side surfaces of the sample stage, and the two through holes 4 are arranged oppositely. The through holes 4 can be threaded holes; the fixing members 3 provided on the threaded holes of the sample stage 1 can be bolts, and the diameter of the bolts is 3-7% smaller than the diameter of the threaded holes to ensure that the bolts can enter smoothly and be tightly fixed, for fixing the test sample. For samples with irregular shapes that cannot be stably placed on the support member 2, they can be fixed with the fixing members 3 and then tested; in the stress test by the side tilt method, it is ensured that the sample does not move when tilted, ensuring the accuracy of test data.

[0031] In an embodiment of the present invention, the sample stage 1 can be of various shapes, such as a rectangular, square or circular cross-section in the inner cavity, and the support member 2 can also be of various shapes, such as rectangular, square or circular. The shape of the support member 2 is preferably the same as the shape of the inner cavity of the sample stage 1.

[0032] In an embodiment of the present utility model, the stage 1 and the support member 2 are made of light alloy materials, such as aluminum alloy, magnesium alloy, titanium alloy, etc. A monocrystalline silicon coating or a monocrystalline silicon wafer is added to the surface of the support member 2. Monocrystalline silicon has no diffraction peak in diffraction testing and will not generate a background. Adding a monocrystalline silicon coating to the surface of the support member 2 ensures that there is no interfering peak of the background during the diffraction testing of the sample.

[0033] In an embodiment of the present utility model, four fixing holes may be provided on the bottom surface of the stage 1 for fixing the stage 1 at the corresponding sample stage position on the X-ray diffractometer.

[0034] When the X-ray diffraction sample stage of the present utility model is in use, the stage 1 is fixed at the corresponding sample stage position on the X-ray diffractometer through the four fixing holes provided on the bottom surface of the stage 1. When the thickness of the sample is different, loosen the two side bolts. The bolts can move up and down in the long guide holes 5. After adjusting the height of the support member 2, tighten the two side bolts to fix the support member 2. Thus, the surface of the sample placed on the support member 2 is kept consistent with the test standard position. This diffraction sample stage is suitable for testing powder samples and block samples of different sizes. It is easy to install and the operation of adjusting the height of the sample is simple; there is no phenomenon of the rebound of plasticine, ensuring the accuracy of the test data; it does not damage or dirty the sample, facilitating the recycling of the sample. For samples with irregular shapes that cannot be stably placed on the support member 2, they can be fixed with the fixing member 3 and then tested; in the stress testing by the side-tilt method, it ensures that the sample does not move when tilted, ensuring the accuracy of the test data.

[0035] The above are only the preferred embodiments of the present utility model, and do not limit the patent scope of the present utility model accordingly. All equivalent structural transformations made under the inventive concept of the present utility model by using the content of the specification of the present utility model, or directly / indirectly applied in other related technical fields are included in the patent protection scope of the present utility model.

Claims

1. An X-ray diffraction sample stage, characterized in that: Including a stage, a support, and a fixing part; A long guide hole is provided in the middle of two side surfaces of the loading platform, and the two long guide holes are arranged opposite to each other; A through hole is provided in the middle of the other two side surfaces of the stage near the top, the two through holes are arranged opposite to each other, and the fixing member passes through the through holes; The support member is provided with a long threaded hole extending therethrough and is placed in the inner cavity of the stage. The fixing member passes through the long guide hole and is connected to the long threaded hole.

2. The X-ray diffraction sample stage according to claim 1, characterized in that: The long guide hole is in the shape of a semicircular long strip opening.

3. The X-ray diffraction sample stage according to claim 1, characterized in that: The through hole is a threaded hole.

4. The X-ray diffraction sample stage according to claim 1, characterized in that: The supporting member is a block-shaped body.

5. The X-ray diffraction sample stage according to claim 1, characterized in that: The fixing member is a bolt, and the diameter of the bolt is 3-7% smaller than the diameter of the long threaded hole and the threaded hole.

6. The X-ray diffraction sample stage according to claim 1, characterized in that: The loading platform is rectangular, square or circular, and the support member has the same shape as the inner cavity of the loading platform.

7. The X-ray diffraction sample stage according to claim 1, characterized in that: The bottom surface of the stage is provided with a fixing hole for fixing the stage at a corresponding sample stage position on the X-ray diffractometer.

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