Interface for testing equipment

Abstract

The utility model discloses an interface for testing equipment, which comprises a first base, a second base, a clamping groove fixing plate, a fixing piece, an elastic piece fixing plate, an elastic piece and a supporting piece, the clamping groove fixing plate is arranged between the first base and the second base, the fixing piece is arranged on the clamping groove fixing plate, communicated clamping grooves are arranged on the clamping groove fixing plate and the fixing piece, and the elastic piece is arranged on the elastic piece fixing plate. Two elastic piece fixing plates are symmetrically arranged on a clamping groove in the fixing piece, elastic pieces are arranged on the opposite sides of the elastic piece fixing plates and at the ends close to the fixing piece, an elastic contact area is formed between the two elastic pieces, and a supporting piece is arranged between the ends, away from the fixing piece, of the elastic piece fixing plates. Compared with the prior art, the interface has the advantages that the overall structure is simple, the manufacturing cost is low, the two groups of elastic sheets are arranged on the elastic sheet fixing plate to form the elastic contact area, the elastic contact improves the contact reliability, the elastic sheets are convenient to replace regularly, and the stray inductance of the interface can be controlled within a certain range due to the fact that the elastic sheets are very short, so that low inductance is realized.

Description

Technical Field

[0001] The utility model relates to the technical field of semiconductor testing equipment, and particularly relates to an interface for testing equipment. Background Art

[0002] At present, semiconductors are widely used in fields such as artificial intelligence, Internet of Things, 5G, and new energy. The technology develops rapidly and the update iteration accelerates. It has now developed into the fourth-generation semiconductor material. Using gallium oxide and diamond compounds as semiconductor materials can achieve higher voltage resistance, smaller volume, and lower energy consumption, and can effectively reduce energy losses in fields such as new energy vehicles, rail transit, and renewable energy power generation. In this environment, the demand for semiconductor product testing equipment is increasing day by day. The requirements for equipment are also getting higher and higher. The control of performance, accuracy, cost, etc. are the key expansion directions for major host manufacturers.

[0003] Now there are various types of interfaces. Most interfaces use DB head wire connections. This type of interface is inconvenient to connect. The working conditions suitable for a single connecting wire are limited. In the case of a large number, it seriously affects the space of the test chamber, and there is a risk of errors through manual plugging. There are also interfaces that connect the test equipment through the insertion of male and female European terminals welded to the PCB. This method belongs to hard connection, which has high requirements for the processing and assembly of equipment parts. In addition, it also has high requirements for welding technology and high manufacturing costs. In addition, current test requirements have relatively high requirements for the amount of stray inductance (stray inductance is the unwanted inductance generated by conductors in a circuit, such as connecting wires, component leads, and component bodies, due to electromagnetic induction). The design of mechanical interfaces is also a factor that increases stray inductance in test equipment. Summary of the Utility Model

[0004] The technical problem to be solved by the utility model is how to provide an interface with convenient connection, low cost, and low inductance.

[0005] To solve the above technical problem, the utility model provides the following technical solutions:

[0006] An interface for testing equipment, comprising a first base, a second base, a slot fixing plate, a fixing member, a shrapnel fixing plate, shrapnel, and a support member. A slot fixing plate is arranged between the first base and the second base. A fixing member is arranged on the slot fixing plate. Both the slot fixing plate and the fixing member are provided with communicating slots. Two shrapnel fixing plates are symmetrically arranged on the slot of the fixing member. Shrapnel are arranged at one ends of the opposite sides of the shrapnel fixing plates close to the fixing member. An elastic contact area is formed between the two groups of shrapnel. A support member is arranged between the ends of the shrapnel fixing plates far from the fixing member.

[0007] The overall structure of the interface is simple, with low manufacturing cost. There are two sets of elastic pieces arranged on the elastic piece fixing plate to form an elastic contact area. The elastic contact improves the reliability of contact, and it is also convenient to regularly replace the elastic pieces. The elastic pieces can be stacked and used according to the thickness of the inserted electrodes, increasing the test types. Since the length of the elastic piece is very short and has a high conductivity, the stray inductance of the interface can be controlled within a certain range to achieve low inductance.

[0008] Preferably, the slot fixing plate is an epoxy resin plate.

[0009] Preferably, the fixing member is fixed on the slot fixing plate by screws.

[0010] Preferably, the elastic piece fixing plate is fixed on the upper and lower inner walls of the slot on the fixing member by screws.

[0011] Preferably, the elastic piece fixing plate is a copper bar.

[0012] Preferably, the elastic piece is a beryllium copper elastic piece.

[0013] Preferably, the support member is fixed between the two sets of elastic piece fixing plates by screws.

[0014] Preferably, a limiting groove is formed at the end of the support member extending between the two sets of elastic piece fixing plates.

[0015] Preferably, both between the first base and the upper elastic piece fixing plate and between the second base and the lower elastic piece fixing plate are connected by fixing frames.

[0016] Preferably, the fixing frame and the elastic piece fixing plate are also connected by a transition plate.

[0017] Compared with the prior art, the beneficial effects of the present utility model are as follows:

[0018] The overall structure of the interface is simple, with low manufacturing cost. There are two sets of elastic pieces arranged on the elastic piece fixing plate to form an elastic contact area. The elastic contact improves the reliability of contact, and it is also convenient to regularly replace the elastic pieces. The elastic pieces can be stacked and used according to the thickness of the inserted electrodes, increasing the test types. Since the length of the elastic piece is very short and has a high conductivity, the stray inductance of the interface can be controlled within a certain range to achieve low inductance. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 is a schematic structural diagram of an embodiment of the present utility model;

[0020] Figure 2 is another schematic structural diagram of an embodiment of the present utility model;

[0021] Figure 3 is a partial structural schematic diagram of an embodiment of the present utility model;

[0022] Figure 4 is Figure 3 a sectional view of;

[0023] Figure 5 is a schematic diagram of the installation structure of the shrapnel fixing plate and the shrapnel in the embodiment of the present utility model;

[0024] Figure 6 is a schematic diagram of the structure of the shrapnel in the embodiment of the present utility model;

[0025] Figure 7 is a schematic diagram of the structure of the support member in the embodiment of the present utility model. Detailed implementation manners

[0026] For the convenience of those skilled in the art to understand the technical solution of the present utility model, the technical solution of the present utility model will be further described below in conjunction with the accompanying drawings of the specification.

[0027] In this application, unless otherwise clearly specified and limited, the terms "installation", "connection", "connection", "fixation" and other terms should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or integrated; it can be a mechanical connection, an electrical connection, or a communication connection; it can be directly connected, or indirectly connected through an intermediate medium, and it can be the communication inside two elements or the interaction relationship between two elements. For those of ordinary skill in the art, the specific meanings of the above terms in this application can be understood according to specific situations.

[0028] In this application, unless otherwise clearly specified and limited, the terms "first" and "second" are only used for descriptive purposes, and cannot be understood as indicating or implying relative importance or implicitly indicating the quantity of the indicated technical features. Thus, the features defined with "first" and "second" may explicitly or implicitly include one or more of such features. In the description of this application, "a plurality" means two or more, unless otherwise clearly specifically limited.

[0029] Refer to Figures 1 to 7 , this embodiment discloses an interface for a testing device, including a first base 1, a second base 2, a slot fixing plate 3, a fixing member 4, a shrapnel fixing plate 5, a shrapnel 6, a support member 7, and a fixing frame 8. A slot fixing plate 3 is arranged between the first base 1 and the second base 2. In this embodiment, both the first base 1 and the second base 2 are made of aluminum alloy and are used to fix the entire structural framework; the slot fixing plate 3 is an epoxy resin plate and plays a role in insulation and improving voltage resistance; a fixing member 4 is fixed on the slot fixing plate 3 by screws, and both the slot fixing plate 3 and the fixing member 4 are provided with connected slots for the later insertion of the PCB board and also play a guiding role.

[0030] On the upper and lower inner walls of the card slot on the fixing member 4, two shrapnel fixing plates 5 are symmetrically fixed by screws. On one side of the shrapnel fixing plates 5 facing each other and near one end of the fixing member 4, shrapnels 6 are fixed by screws. An elastic contact area is formed between the two groups of shrapnels 6. This detachable structure facilitates the regular replacement of beryllium copper shrapnels. The beryllium copper shrapnels can be stacked and used according to the thickness of the inserted electrodes, increasing the test types and also increasing the elasticity of the beryllium copper shrapnels. Since the length of the beryllium copper shrapnels is very short and the beryllium copper material has a very high conductivity, the stray inductance of the interface can be controlled within a certain range, and this interface can ensure that a voltage of 8 - 10 KV can pass through, with good contact and avoiding the phenomenon of arcing.

[0031] In this embodiment, the shrapnel fixing plate 5 is a copper bar made of copper material, and the shrapnel 6 is a beryllium copper shrapnel, so that there is a large contact elasticity between the two groups of shrapnels 6. After the PCB board at the test equipment end is inserted, it can contact the upper and lower beryllium copper shrapnels and then conduct electricity.

[0032] Between the ends of the two groups of shrapnel fixing plates 5 away from the fixing member 4, a support member 7 is fixed by screws to fix the two groups of shrapnel fixing plates 5 and also provide support for the installation of the devices behind this interface.

[0033] Furthermore, a limit groove 71 is provided at the end of the support member 7 extending between the two groups of shrapnel fixing plates 5. It not only plays a certain guiding role, but also the bottom of the limit groove 71 is the limiting position for the inserted PCB board. Such a structural combination will limit the structure of the subsequent connecting parts to a certain extent.

[0034] Between the first base 1 and the upper shrapnel fixing plate 5 and between the second base 2 and the lower shrapnel fixing plate 5, they are all connected by a fixing frame 8.

[0035] Furthermore, the fixing frame 8 and the shrapnel fixing plate 5 are also connected by a transition plate 9.

[0036] The overall structure of the interface in this embodiment is simple, with low manufacturing cost. It is installed in the equipment test chamber, occupying a small space. And two groups of shrapnels 6 are arranged on the shrapnel fixing plate 5 to form an elastic contact area. The elastic contact improves the contact reliability and also facilitates the regular replacement of beryllium copper shrapnels. The beryllium copper shrapnels can be stacked and used according to the thickness of the inserted electrodes, increasing the test types. Since the length of the beryllium copper shrapnels is very short and the beryllium copper material has a very high conductivity, the stray inductance of the interface can be controlled within a certain range to achieve low inductance, and this interface can ensure that a voltage of 8 - 10 KV can pass through, with good contact and avoiding the phenomenon of arcing.

[0037] For those skilled in the art, it is obvious that the present utility model is not limited to the details of the above-mentioned exemplary embodiments, and the present utility model can be implemented in other specific forms without departing from the spirit or basic characteristics of the present utility model. Therefore, from any point of view, the embodiments should be regarded as exemplary and non-restrictive. The scope of the present utility model is defined by the appended claims rather than the above description. Therefore, all changes falling within the meaning and scope of the equivalent elements of the claims are intended to be embraced within the present utility model, and any reference signs in the claims should not be regarded as limiting the claims involved.

[0038] The above-described embodiments only represent the implementation modes of the utility model. The protection scope of the present utility model is not limited to the above embodiments. For those skilled in the art, without departing from the concept of the present utility model, several deformations and improvements can be made, and these all belong to the protection scope of the present utility model.

Claims

1. An interface for testing equipment, characterized in that: It includes a first base, a second base, a slot fixing plate, a fixing member, a spring fixing plate, a spring, and a support member. A slot fixing plate is arranged between the first base and the second base, a fixing member is arranged on the slot fixing plate, a connected slot is arranged on the slot fixing plate and the fixing member, two spring fixing plates are symmetrically arranged on the slot on the fixing member, springs are arranged on the opposite side of the spring fixing plate and at one end close to the fixing member, an elastic contact area is formed between the two groups of springs, and a support member is arranged between the ends of the spring fixing plate away from the fixing member.

2. The interface for testing equipment according to claim 1, characterized in that: The card slot fixing plate is an epoxy resin plate.

3. The interface for testing equipment according to claim 1, characterized in that: The fixing piece is fixed on the card slot fixing plate by screws.

4. The interface for testing equipment according to claim 1, characterized in that: The spring sheet fixing plate is fixed to the upper and lower inner walls of the slot on the fixing member by screws.

5. The interface for testing equipment according to claim 1, characterized in that: The spring fixing plate is a copper bar.

6. The interface for testing equipment according to claim 5, characterized in that: The shrapnel is a beryllium copper shrapnel.

7. The interface for testing equipment according to claim 1, characterized in that: The support member is fixed between two groups of spring sheet fixing plates by means of screws.

8. The interface for testing equipment according to claim 1, characterized in that: A limiting groove is provided at the end of the support member extending between the two sets of spring sheet fixing plates.

9. The interface for testing equipment according to claim 1, characterized in that: The first base and the upper spring sheet fixing plate as well as the second base and the lower spring sheet fixing plate are connected via a fixing frame.

10. An interface for a test device according to claim 9, characterized in that: The fixing frame and the spring sheet fixing plate are also connected via a transition plate.

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