Display card chip test equipment

By designing graphics card chip testing equipment, using the suction and ventilation system connected to the movable card connector and the cooling cover, the existing equipment has been solved by complex operation, low testing efficiency and lack of cooling measures, and fast and efficient chip testing has been achieved.

CN223038115UActive Publication Date: 2025-06-27SHENZHEN HAIRUIXIN TECH CO LTD
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Patent Information

Application Number
CN202421969674.8
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-08-14
Publication Date
2025-06-27
Estimated Expiration
2034-08-14

AI Technical Summary

Technical Problem

The operating process of existing graphics card chip testing equipment is complex, with low testing efficiency and lack of effective cooling measures, resulting in long chip detection time intervals and waste of resources.

Method used

A graphics card chip testing equipment is designed, using a movable card connector to connect the upper seat and the lower seat. The chip test body and the lower seat are connected through the second movable card connector. A cooling cover is provided at the bottom of the lower seat. The cooling cover is equipped with a suction main body and a ventilation main body, and rapid cooling and hot air discharge is achieved through the suction pump and the ventilation fan blade.

Benefits of technology

It simplifies the operation process, improves testing efficiency, reduces the chip detection time interval through rapid cooling measures, avoids waste of resources, and ensures the stability of the equipment during long-term use.

✦ Generated by Eureka AI based on patent content.

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    Figure CN223038115U_ABST
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Abstract

The utility model discloses a display card chip test device, comprising an upper seat and a lower seat, the upper seat and the lower seat are connected through a plurality of first movable clamping members, the upper seat is provided with a chip test main body, and the chip test main body and the lower seat are connected through a plurality of second movable clamping members. The multiple second movable clamping pieces are evenly distributed on the lower base, a cooling cover is movably connected to the bottom wall of the lower base in a clamped mode, a suction body is arranged in the cooling cover, and a ventilation body is arranged on the bottom wall of the cooling cover. According to the utility model, the chip is rapidly tested by arranging the chip testing main body, and the arrangement of the suction main body and the ventilation main body facilitates the improvement of the testing speed of the chip.
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Description

Technical Field

[0001] The utility model relates to the technical field of chip testing, in particular to a graphics card chip testing device. Background Art

[0002] A graphics card chip, also known as a Graphics Processing Unit (GPU), is the core component in computer hardware responsible for processing graphics and images. The main function of a graphics card chip is to process and render graphic data, especially in the generation and display of 3D graphics. Different from the Central Processing Unit (CPU), a graphics card chip is designed specifically for parallel computing and can process a large amount of data simultaneously, which makes it perform excellently in high-performance computing fields such as image processing, video rendering, and gaming. The performance of a graphics card chip usually depends on multiple factors such as its architecture, manufacturing process, number of cores, video memory capacity, and speed. They are not only used in personal computers and game consoles but also widely applied in professional workstations, data centers, artificial intelligence, and machine learning fields.

[0003] After retrieval, it is found that a Chinese patent with the application number / announcement number CN 214895656 U discloses a display chip testing device, including: a processor electrically connected to a graphics card module, the graphics card module electrically connected to an image storage module, and a testing interface connected to the graphics card module is also provided on the circuit board. During testing, the encapsulated display chip can be inserted into the testing interface on the housing, so that the graphics card module can retrieve the data information pre-stored in the image storage module and then drive the encapsulated display chip by the graphics card module to display the corresponding image, completing the verification of the display characteristics of the encapsulated display chip, thereby judging whether it is qualified, and further ensuring the normal display characteristics of the encapsulated display chip after leaving the factory, and further improving the quality of the product when leaving the factory. At the same time, when the display chip testing device performs display characteristic testing on the encapsulated display chip, it can perform automated testing through the cooperation of the processor, graphics card module, etc. with the testing program, thereby improving the testing efficiency.

[0004] The above-mentioned utility model has the following problems:

[0005] The operation process of the testing device is relatively complex, the testing efficiency is low, the testing device lacks effective cooling measures, the time interval between the detections of two groups of chips is long, and it is easy to cause unnecessary waste of various resources.

[0006] Therefore, those skilled in the art provide a graphics card chip testing device to solve the problems raised in the above background art. Summary of the Utility Model

[0007] The purpose of the present utility model is to provide a graphics card chip testing device to solve the problems raised in the above background art.

[0008] To achieve the above object, the utility model provides the following technical solutions:

[0009] A graphics card chip testing device includes an upper seat and a lower seat. The upper seat and the lower seat are connected by a plurality of first movable clamping members. A chip testing main body is provided on the upper seat, and the chip testing main body and the lower seat are connected by a plurality of second movable clamping members. The plurality of second movable clamping members are evenly distributed on the lower seat. A cooling cover is movably clamped on the bottom wall of the lower seat. A suction main body is provided in the cooling cover, and a ventilation main body is provided on the bottom wall of the cooling cover.

[0010] As a further scheme of the utility model: The chip testing main body includes a testing upper cover and a testing lower cover. Two symmetrically arranged rotating members are provided on the testing lower cover, and the two rotating members are matched with the testing upper cover. A detection groove is provided in the testing lower cover, and a burning-in groove is provided in the detection groove. Two symmetrically arranged double-headed micro needles are provided in the detection groove, and the two double-headed micro needles are respectively located on both sides of the burning-in groove. A plurality of heat dissipation holes are provided in the detection groove, and the plurality of heat dissipation holes sequentially penetrate through the side walls of the testing lower cover and the lower seat. The plurality of heat dissipation holes are matched with the cooling cover.

[0011] As a further scheme of the utility model: The suction main body includes a moving plate, and the moving plate is slidably connected to the inner wall of the cooling cover. A suction pump is provided on the moving plate. A plurality of suction pipes are fixedly communicated with the suction pump, and two symmetrically arranged exhaust pipes are fixedly communicated with the suction pump. The plurality of suction pipes are matched with the heat dissipation holes.

[0012] As a further scheme of the utility model: The ventilation main body includes a ventilation cover. A first ventilation port matched with the ventilation cover is provided on the bottom wall of the cooling cover. A second ventilation port is provided on the ventilation cover, and the second ventilation port penetrates through the side wall of the ventilation cover. A ventilation pump is provided on the side wall of the second ventilation port, and a rotating shaft is movably clamped at the output end of the ventilation pump. A plurality of ventilation fan blades are movably clamped on the rotating shaft.

[0013] As a further scheme of the utility model: A plurality of support pads are movably clamped on the bottom wall of the lower seat, and the plurality of support pads are evenly distributed on the bottom wall of the lower seat.

[0014] As a further scheme of the utility model: A rotating disk is movably clamped on the testing upper cover, and two symmetrically arranged lifting handles are movably clamped on the rotating disk.

[0015] As a further scheme of the utility model: A first buckle is movably clamped on the testing upper cover, and a second buckle is movably clamped on the testing lower cover, and the first buckle is matched with the second buckle.

[0016] As a further solution of the utility model: A driver is movably clamped on the side wall of the cooling cover, and the output end of the driver is movably clamped with a transmission gear, and the transmission gear is a semi-gear. An activity opening penetrating the moving plate is arranged on the moving plate, the transmission gear is located in the activity opening, and tooth grooves meshed with the transmission gear are arranged on the side walls on both sides of the activity opening.

[0017] Compared with the prior art, the beneficial effects of the utility model are as follows:

[0018] 1. The chip is quickly tested through the chip test main body, and the suction main body and the ventilation main body are arranged to facilitate the improvement of the chip test speed;

[0019] 2. Through the cooperation of the lifting handle and the rotating disc, the test upper cover can be conveniently and quickly opened, the chip can be placed in the detection slot for programming and testing, the operation process is simplified, the test efficiency is improved, and during the test, the suction pump extracts the hot air in the detection slot through the heat dissipation holes through the suction pipe, so as to quickly cool down. The driver drives the transmission gear and the moving plate, so that the suction pump moves uniformly in the cooling cover, ensuring the uniform extraction of hot air;

[0020] 3. The hot air extracted by the suction pump is discharged into the cooling cover through the exhaust pipe and then discharged outside the device through the ventilation pump and the ventilation fan blades, ensuring that the device can perform long-term cooling work and support continuous test operations. The upper seat and the lower seat are connected by a plurality of first movable clamping parts, and the chip test main body and the lower seat are connected by a plurality of second movable clamping parts. These designs make the device have high flexibility and adaptability, facilitating replacement and maintenance;

[0021] 4. The heat dissipation holes are matched with the cooling cover, and the suction pump and the ventilation pump are used in combination, so that the device can efficiently manage heat during operation, avoiding device damage or inaccurate testing caused by overheating. The lifting handle and the rotating disc on the test upper cover and the buckle design on the test upper cover and the test lower cover all make the device more convenient to operate and reduce the complexity of manual operation. Description of the Drawings

[0022] Figure 1 It is a schematic structural diagram of a graphics card chip testing device.

[0023] Figure 2 It is a schematic top view structural diagram of a graphics card chip testing device.

[0024] Figure 3 It is Figure 1 The structural diagram at position A in

[0025] Figure 4 It is Figure 2 The structural diagram at position B in

[0026] Figure 5 It is a schematic structural diagram of a cooling cover in a graphics card chip testing device.

[0027] In the figure: 1 upper seat, 2 lower seat, 3 first movable clamping part, 4 second movable clamping part, 5 cooling cover, 6 test upper cover, 7 test lower cover, 8 rotating part, 9 detection groove, 10 programming groove, 11 double-headed micro needle, 12 heat dissipation holes, 13 moving plate, 14 suction pump, 15 suction pipe, 16 exhaust pipe, 17 ventilation cover, 18 ventilation pump, 19 rotating shaft, 20 ventilation fan blade, 21 support pad, 22 rotating disk, 23 lifting handle, 24 first buckle, 25 second buckle, 26 driver, 27 transmission gear, 28 movable opening. Specific embodiments

[0028] Next, the technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0029] Referring to Figures 1-5 , this embodiment provides a graphics card chip testing device, including an upper seat 1 and a lower seat 2. The upper seat 1 and the lower seat 2 are connected by a plurality of first movable clamping parts 3. A chip testing main body is provided on the upper seat 1, and the chip testing main body and the lower seat 2 are connected by a plurality of second movable clamping parts 4. The plurality of second movable clamping parts 4 are evenly distributed on the lower seat 2. A cooling cover 5 is movably clamped on the bottom wall of the lower seat 2. A suction main body is provided in the cooling cover 5, and a ventilation main body is provided on the bottom wall of the cooling cover 5.

[0030] The chip testing main body includes a test upper cover 6 and a test lower cover 7. Two symmetrically arranged rotating parts 8 are provided on the test lower cover 7, and the two rotating parts 8 are matched with the test upper cover 6. A detection groove 9 is provided in the test lower cover 7, and a programming groove 10 is provided in the detection groove 9. Two symmetrically arranged double-headed micro needles 11 are provided in the detection groove 9, and the two double-headed micro needles 11 are respectively located on both sides of the programming groove 10. A plurality of heat dissipation holes 12 are provided in the detection groove 9, and the plurality of heat dissipation holes 12 sequentially penetrate through the side walls of the test lower cover 7 and the lower seat 2. The plurality of heat dissipation holes 12 are matched with the cooling cover 5.

[0031] The suction main body includes a moving plate 13, and the moving plate 13 is slidably connected to the inner wall of the cooling cover 5. A suction pump 14 is provided on the moving plate 13. A plurality of suction pipes 15 are fixedly communicated with the suction pump 14, and two symmetrically arranged exhaust pipes 16 are fixedly communicated with the suction pump 14. The plurality of suction pipes 15 are matched with the heat dissipation holes 12.

[0032] The ventilation main body includes a ventilation hood 17. A first ventilation opening matching the ventilation hood 17 is provided on the bottom wall of the cooling hood 5. A second ventilation opening is provided on the ventilation hood 17, and the second ventilation opening penetrates through the side wall of the ventilation hood 17. A ventilation pump 18 is provided on the side wall of the second ventilation opening, and the output end of the ventilation pump 18 is movably clamped with a rotating shaft 19. A plurality of ventilation fan blades 20 are movably clamped on the rotating shaft 19.

[0033] A plurality of support pads 21 are movably clamped on the bottom wall of the lower seat 2, and the plurality of support pads 21 are evenly distributed on the bottom wall of the lower seat 2.

[0034] A rotating disk 22 is movably clamped on the test upper cover 6, and two symmetrically arranged lifting handles 23 are movably clamped on the rotating disk 22.

[0035] A first buckle 24 is movably clamped on the test upper cover 6, and a second buckle 25 is movably clamped on the test lower cover 7, and the first buckle 24 and the second buckle 25 are arranged in a matching manner.

[0036] A driver 26 is movably clamped on the side wall of the cooling hood 5, and the output end of the driver 26 is movably clamped with a transmission gear 27. The transmission gear 27 is a semi-gear. An activity opening 28 penetrating through the moving plate 13 is provided on the moving plate 13. The transmission gear 27 is located in the activity opening 28, and tooth grooves meshing with the transmission gear 27 are provided on both side walls of the activity opening 28.

[0037] In the present utility model, when chip testing is required, the test upper cover 6 is opened by cooperating the lifting handle 23 and the rotating disk 22. The chip to be tested is placed in the detection slot 9. The test upper cover 6 is covered. Communication is achieved by connecting the chip to the main board through the double-headed micro needles 11. The chip is programmed through the programming slot 10, and then the detection work of the chip is completed. During the detection, the driver 26 and the suction pump 14 are turned on. A plurality of suction pipes 15 on the suction pump 14 extract the hot air in the detection slot 9 through a plurality of heat dissipation holes 12, so as to facilitate the rapid cooling of the testing device and facilitate the rapid progress of the next detection work. The driver 26 can drive the transmission gear 27 to rotate. Since the transmission gear 27 is a semi-gear, the rotation of the transmission gear 27 can drive the moving plate 13 and the suction pump 14 to move evenly in the cooling hood 5, which is convenient for evenly sucking the hot air. The hot air extracted by the suction pump 14 is transported to the inside of the cooling hood 5 through the exhaust pipe 16. The ventilation pump 18 is turned on to drive the rotating shaft 19 to rotate, thereby driving a plurality of ventilation fan blades 20 to rotate, and discharging the hot air through the first ventilation opening, which is convenient for long-term cooling work.

[0038] For those skilled in the art, it is obvious that the present utility model is not limited to the details of the above-mentioned exemplary embodiments, and the present utility model can be implemented in other specific forms without departing from the spirit or basic characteristics of the present utility model. Therefore, from any point of view, the embodiments should be regarded as exemplary and non-restrictive. The scope of the present utility model is defined by the appended claims rather than the above description. Therefore, all changes falling within the meaning and scope of the equivalent elements of the claims are intended to be embraced within the present utility model. Any reference signs in the claims should not be construed as limiting the claims involved.

[0039] In addition, it should be understood that although this specification is described according to the embodiments, not every embodiment only contains an independent technical solution. This narrative way of the specification is only for clarity. Those skilled in the art should regard the specification as a whole, and the technical solutions in each embodiment can also be appropriately combined to form other embodiments that can be understood by those skilled in the art.

Claims

1. A graphics card chip testing device, comprising an upper seat (1) and a lower seat (2), characterized in that: The upper seat (1) and the lower seat (2) are connected via a plurality of first movable snap-in parts (3); a chip test body is provided on the upper seat (1); and a plurality of second movable snap-in parts (4) are provided between the chip test body and the lower seat (2); the plurality of second movable snap-in parts (4) are evenly distributed on the lower seat (2); a cooling hood (5) is movably snap-connected to the bottom wall of the lower seat (2); a suction body is provided in the cooling hood (5); and a ventilation body is provided on the bottom wall of the cooling hood (5).

2. A graphics card chip testing device according to claim 1, characterized in that: The chip test body comprises a test upper cover (6) and a test lower cover (7); the test lower cover (7) is provided with two symmetrically arranged rotating parts (8), and the two rotating parts (8) are matched with the test upper cover (6); the test lower cover (7) is provided with a detection slot (9), and the detection slot (9) is provided with a burning slot (10); the detection slot (9) is provided with two symmetrically arranged double-headed microneedles (11), and the two double-headed microneedles (11) are respectively located on both sides of the burning slot (10); the detection slot (9) is provided with a plurality of heat dissipation holes (12), and the plurality of heat dissipation holes (12) are sequentially arranged through the side walls of the test lower cover (7) and the lower seat (2); and the plurality of heat dissipation holes (12) are matched with the cooling cover (5).

3. A graphics card chip testing device according to claim 2, characterized in that: The suction body comprises a movable plate (13), and the movable plate (13) is slidably connected to the inner wall of the cooling cover (5); a suction pump (14) is provided on the movable plate (13); a plurality of suction pipes (15) are fixedly connected to the suction pump (14); and two symmetrically arranged exhaust pipes (16) are fixedly connected to the suction pump (14); the plurality of suction pipes (15) are arranged to match the heat dissipation holes (12).

4. The graphics card chip testing device according to claim 1, characterized in that: The ventilation body comprises a ventilation hood (17); a first ventilation port matched with the ventilation hood (17) is provided on the bottom wall of the cooling hood (5); a second ventilation port is provided on the ventilation hood (17), and the second ventilation port penetrates the side wall of the ventilation hood (17); a ventilation pump (18) is provided on the side wall of the second ventilation port, and a rotating shaft (19) is movably connected to the output end of the ventilation pump (18); and a plurality of ventilation blades (20) are movably connected to the rotating shaft (19).

5. The graphics card chip testing device according to claim 1, characterized in that: A plurality of support pads (21) are movably clamped on the bottom wall of the lower seat (2), and the plurality of support pads (21) are evenly distributed on the bottom wall of the lower seat (2).

6. The graphics card chip testing device according to claim 2, characterized in that: A rotating disk (22) is movably clamped on the test upper cover (6), and two symmetrically arranged lifting handles (23) are movably clamped on the rotating disk (22).

7. The graphics card chip testing device according to claim 2, characterized in that: The test upper cover (6) is movably snap-connected with a first snap-on (24), and the test lower cover (7) is movably snap-connected with a second snap-on (25), and the first snap-on (24) and the second snap-on (25) are matched and arranged.

8. The graphics card chip testing device according to claim 3, characterized in that: A driver (26) is movably connected to the side wall of the cooling cover (5), and a transmission gear (27) is movably connected to the output end of the driver (26), wherein the transmission gear (27) is a half gear; a movable opening (28) penetrating the movable plate (13) is provided on the movable plate (13), the transmission gear (27) is located in the movable opening (28), and tooth grooves meshing with the transmission gear (27) are provided on both side walls of the movable opening (28).

Citation Information

Patent Citations

  • Display chip test equipment

    CN214895656U