S-shaped EL test faller gill mechanism
By designing an S-type EL test needle arrangement including upper and lower symmetric testing components, the problem of difficulty in testing S-type grid wire cells in the prior art is solved, and effective detection and quality evaluation of these cells are achieved.
Patent Information
- Application Number
- CN202421644467.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-07-12
- Publication Date
- 2025-06-27
- Estimated Expiration
- 2034-07-12
AI Technical Summary
The existing EL test needle row mechanism is not suitable for testing S-type gate wire batteries, making it difficult to detect internal defects of these batteries.
An S-type EL test needle row mechanism is designed, including an upper test assembly and a lower test assembly. Six S-type EL copper needle rows and six EL lower brass needle rows are fixedly installed by six pairs of upper probe fixing blocks and six pairs of lower probe fixing blocks to form an upper and lower symmetrical test assembly to achieve effective testing of S-type battery cells.
This design improves the testing function of S-type battery cells by conventional testing machines, realizes effective detection of S-type grid wire battery cells, and ensures the quality and performance evaluation of the battery cells.
Smart Images

Figure CN223039988U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the field of photovoltaic equipment, and particularly relates to an S-shaped EL test needle row mechanism. Background Technique
[0002] Photovoltaic: It is short for solar photovoltaic power generation system. It is a new type of power generation system that uses the photovoltaic effect of solar cell semiconductor materials to directly convert solar radiation energy into electrical energy. A photovoltaic panel assembly is a power generation device that generates direct current when exposed to sunlight and is composed of thin solid photovoltaic cells made almost entirely of semiconductor materials (such as silicon). Photovoltaic modules composed of solid photovoltaic cells must be tested for EL at each key link in production, transportation, and installation to ensure the integrity of the components inside before entering the next link. It can be said that this test is an important means to detect the quality of the components. The EL test of the components is a project to detect internal defects of the components using the principle of electroluminescence. Photovoltaic modules need to be tested for EL to clearly see whether there are defect problems inside.
[0003] In the existing EL test needle row mechanism, the conventional test mechanism is not convenient for testing S-shaped grid line battery wafers. Therefore, it is urgent to design an S-shaped EL test needle row mechanism to solve the above problems. Content of the Utility Model
[0004] To solve the above technical problems, an S-shaped EL test needle row mechanism is provided. This technical solution solves the problem that the conventional test mechanism is not convenient for testing S-shaped grid line battery wafers mentioned in the above background technique.
[0005] To achieve the above purpose, the technical solution adopted by the utility model is as follows:
[0006] An S-shaped EL test needle row mechanism includes a corresponding upper test component and a lower test component:
[0007] Among them, the upper test component includes:
[0008] Upper probe fixing blocks. The number of the upper probe fixing blocks is six pairs. Two upper needle row mounting holes are respectively opened at the lower ends of the six pairs of upper probe fixing blocks;
[0009] S-shaped EL copper needle rows. The number of the S-shaped EL copper needle rows is six. The six S-shaped EL copper needle rows are respectively installed between the six pairs of upper probe fixing blocks, and a plurality of probe fixing grooves are opened at the tops of the six S-shaped EL copper needle rows. Probes are fixedly installed inside the probe fixing grooves;
[0010] The lower test component includes:
[0011] Lower probe fixing block, the number of the lower probe fixing blocks is six pairs, and two lower needle row mounting holes are respectively opened at the upper ends of the six pairs of lower probe fixing blocks;
[0012] EL lower brass needle row, the number of the EL lower brass needle rows is six, and the six EL lower brass needle rows are respectively installed between six pairs of lower probe fixing blocks.
[0013] Furthermore, six pairs of S-shaped EL copper needle rows are arranged in parallel and installed between six pairs of upper probe fixing blocks on both sides, and the six EL lower brass needle rows are arranged in parallel and installed between six pairs of lower probe fixing blocks on both sides.
[0014] Furthermore, the upper test component and the lower test component are symmetrically arranged up and down.
[0015] Furthermore, mounting blocks are fixedly connected to both ends of the S-shaped EL copper needle row, and three upper needle row fixing holes are arranged at the front end of the mounting block, and the sizes of the upper needle row fixing holes are adapted to the sizes of the upper needle row mounting holes.
[0016] Furthermore, three lower needle row fixing holes are symmetrically opened at both ends of the EL lower brass needle row, and the sizes of the lower needle row fixing holes are adapted to the sizes of the lower needle row mounting holes.
[0017] Furthermore, the mechanism of the probe includes a needle sleeve and a needle head, and the needle head is arranged inside the needle sleeve.
[0018] As a preferred technical solution of the present invention, compared with the prior art, the present invention provides an S-shaped EL test needle row mechanism, which has the following beneficial effects:
[0019] 1. The present invention fixedly installs an S-shaped EL copper needle row through a pair of upper probe fixing blocks, and several probes are installed inside the S-shaped EL copper needle row, improving the test function of a new product S-shaped battery cell that the conventional testing machine does not have, and realizing the test function of the S-shaped grid line battery cell;
[0020] 2. Six S-shaped EL copper needle rows of the present invention are arranged in parallel and installed between the upper probe fixing blocks on both sides to form an upper test component, and six EL lower brass needle rows are arranged in parallel and installed between the lower probe fixing blocks on both sides to form a lower test component, and the upper test component and the lower test component are respectively fixedly connected to an external machine table through a shaft rod, and the structure is simple and convenient to use. Description of the Drawings
[0021] Figure 1 is a schematic diagram of the overall structure of the present invention;
[0022] Figure 2 is a schematic diagram of the structure of the upper probe fixing block assembly of the present invention;
[0023] Figure 3 This is a schematic structural diagram of the lower probe fixing block assembly in the present utility model;
[0024] Figure 4 This is a schematic structural diagram of the S-shaped EL copper needle row assembly in the present utility model;
[0025] Figure 5 This is a schematic structural diagram of the EL lower brass needle row assembly in the present utility model;
[0026] Figure 6 This is a schematic structural diagram of the probe assembly in the present utility model.
[0027] The reference numerals in the figure are:
[0028] 1. Upper probe fixing block; 11. Upper needle row mounting hole;
[0029] 2. Lower probe fixing block; 21. Lower needle row mounting hole;
[0030] 3. S-shaped EL copper needle row; 31. Mounting block; 32. Upper needle row fixing hole; 33. Probe fixing groove;
[0031] 4. EL lower brass needle row; 41. Lower needle row fixing hole;
[0032] 5. Probe; 51. Needle sleeve; 52. Needle tip. Detailed implementation manners
[0033] The following description is used to disclose the present utility model so that those skilled in the art can implement the present utility model. The preferred embodiments in the following description are only examples, and those skilled in the art can think of other obvious variations.
[0034] Referring to Figure 1-6 As shown, an S-shaped EL test needle row mechanism includes an upper probe fixing block 1: the number of the upper probe fixing blocks 1 is six pairs, and two upper needle row mounting holes 11 are respectively opened at the lower ends of the six pairs of upper probe fixing blocks 1; the number of the lower probe fixing blocks 2 is six pairs, and two lower needle row mounting holes 21 are respectively opened at the upper ends of the six pairs of lower probe fixing blocks 2; the number of the S-shaped EL copper needle rows 3 is six, and the six S-shaped EL copper needle rows 3 are respectively installed between the six pairs of upper probe fixing blocks 1 to form an upper test assembly, and a plurality of probe fixing grooves 33 are respectively opened at the tops of the six S-shaped EL copper needle rows 3, and a plurality of probes 5 are fixedly installed inside the probe fixing grooves 33;
[0035] There are six EL lower brass pin rows 4. The six EL lower brass pin rows 4 are respectively installed between six pairs of lower probe fixing blocks 2. The six EL lower brass pin rows 4 are arranged in parallel between the six pairs of lower probe fixing blocks 2 on both sides, forming a lower test component. The upper test component and the lower test component are symmetrically arranged up and down, and the upper test component and the lower test component are respectively fixedly connected to an external machine table through a shaft rod, and the fixing positions are also symmetrically adjustable up and down.
[0036] In another embodiment provided by the present utility model, as Figure 3 shown, both ends of the S-shaped EL copper pin row 3 are fixedly connected with mounting blocks 31. Three upper pin row fixing holes 32 are arranged at the front end of the mounting block 31. The size of the upper pin row fixing holes 32 is adapted to the size of the upper pin row mounting holes 11. The purpose of designing the S-shaped EL copper pin row 3 is to meet the requirements of the actual S-shaped grid lines of the test product and ensure the stable testing of the defects of the battery sheet product.
[0037] In another embodiment provided by the present utility model, as Figure 4 shown, three lower pin row fixing holes 41 are symmetrically arranged at both ends of the EL lower brass pin row 4. The size of the lower pin row fixing holes 41 is adapted to the size of the lower pin row mounting holes 21. The EL lower brass pin row 4 and the S-shaped EL copper pin row 3 are symmetrically arranged up and down, and the purpose is to play a symmetrical supporting role to ensure problem testing.
[0038] In another embodiment provided by the present utility model, as Figure 5 shown, the mechanism of the probe 5 includes a needle sleeve 51 and a needle tip 52. The needle tip 52 is arranged inside the needle sleeve 51.
[0039] Working principle: In the present utility model, six S-shaped EL copper pin rows 3 are respectively arranged in parallel between the upper probe fixing blocks 1 on both sides, forming an upper test component; six EL lower brass pin rows 4 are respectively arranged in parallel between the lower probe fixing blocks 2 on both sides, forming a lower test component. The upper test component and the lower test component are respectively fixedly connected to the shaft rod on the machine table and the upper probe fixing block 1 and the lower probe fixing block 2. Confirm that the S-shaped EL test instrument has been correctly set and calibrated. Confirm that the S-shaped solar cell to be tested has been cleaned. Place the S-shaped solar cell on the EL test equipment to ensure that it is stable and correctly aligned. Turn on the EL test instrument. The instrument will apply a voltage excitation to the battery sheet and record the electron emission image on the surface of the battery sheet. The EL image shows the defects and non-uniformities on the surface of the battery sheet, such as cracks, hot spots, etc. Analyze the EL image to check whether there are any abnormalities or defects, and pay special attention to whether the grid lines and other design features of the S-shaped battery sheet are normal. According to the analysis results, evaluate the quality and performance of the battery sheet, and effectively use the S-shaped EL tester to conduct a comprehensive electron emission test on the S-shaped solar cell to evaluate its quality and performance.
[0040] The above has shown and described the basic principles, main features and advantages of the present utility model. Those skilled in the art should understand that the present utility model is not limited by the above embodiments. What is described in the above embodiments and the specification is only the principle of the present utility model. Without departing from the spirit and scope of the present utility model, various changes and improvements will occur to the present utility model, and all these changes and improvements fall within the scope of the present utility model claimed. The scope of protection claimed by the present utility model is defined by the appended claims and their equivalents.
Claims
1. An S-type EL test pin row mechanism, characterized in that: Including the upper test component and the lower test component with corresponding settings: Among them, the test components include: Upper probe fixing blocks (1), the number of the upper probe fixing blocks (1) being six pairs, and the lower ends of the six pairs of upper probe fixing blocks (1) are respectively provided with two upper needle row mounting holes (11); S-type EL copper needle rows (3), the number of the S-type EL copper needle rows (3) is six, the six S-type EL copper needle rows (3) are respectively installed between six pairs of upper probe fixing blocks (1), and the tops of the six S-type EL copper needle rows (3) are each provided with a plurality of probe fixing grooves (33), and probes (5) are fixedly installed inside the probe fixing grooves (33); The following test components include: Lower probe fixing blocks (2), the number of the lower probe fixing blocks (2) being six pairs, the upper ends of the six pairs of lower probe fixing blocks (2) each being provided with two lower needle row mounting holes (21), and the lower probe fixing blocks (2) being arranged below the upper probe fixing blocks (1); EL lower brass needle rows (4), the number of the EL lower brass needle rows (4) is six, and the six EL lower brass needle rows (4) are respectively installed between six pairs of lower probe fixing blocks (2).
2. The S-type EL test pin row mechanism according to claim 1, characterized in that: The six S-shaped EL copper needle rows (3) are arranged in parallel and installed between the six pairs of upper probe fixing blocks (1) on both sides, and the six EL lower brass needle rows (4) are arranged in parallel and installed between the six pairs of lower probe fixing blocks (2) on both sides.
3. The S-type EL test pin row mechanism according to claim 1, characterized in that: The upper test assembly and the lower test assembly are arranged symmetrically in the vertical direction.
4. The S-type EL test pin row mechanism according to claim 1, characterized in that: Both ends of the S-shaped EL copper needle row (3) are fixedly connected to mounting blocks (31), and the front end of the mounting block (31) is provided with three upper needle row fixing holes (32), and the size of the upper needle row fixing holes (32) is adapted to the size of the upper needle row mounting holes (11).
5. The S-type EL test pin row mechanism according to claim 1, characterized in that: Three lower needle row fixing holes (41) are symmetrically provided at both ends of the EL lower brass needle row (4), and the size of the lower needle row fixing holes (41) is compatible with the size of the lower needle row mounting holes (21).
6. The S-type EL test pin row mechanism according to claim 1, characterized in that: The structure of the probe (5) comprises a needle sleeve (51) and a needle (52), wherein the needle (52) is arranged inside the needle sleeve (51).