Multifunctional lifting test trolley for chip test machine

Abstract

The utility model relates to the technical field of chip testing, in particular to a multifunctional lifting testing trolley for a chip testing machine. Comprising a base and a lifting mechanism arranged on one side of the base, and further comprises a positioning assembly arranged on the lifting mechanism and used for limiting the position of a testing head, and a locking assembly is arranged between the testing head and the lifting mechanism; the lifting mechanism comprises a lead screw lifting machine arranged on one side of the base; the two supporting columns are arranged at the two ends of the lead screw lifting machine correspondingly, and the locking assemblies are arranged on the inner sides of the supporting columns; the sliding assembly is arranged at the output end of the lead screw lifting machine, and the sliding assembly is correspondingly connected to the supporting columns in a sliding mode. The multifunctional lifting test trolley for the chip test machine has the advantages of being good in stability and firmness, more accurate in test result, high in working efficiency, easy to operate, convenient to disassemble and assemble and the like.

Description

Technical Field

[0001] The utility model relates to the technical field of chip testing, in particular to a multifunctional lifting test trolley for a chip tester. Background Art

[0002] A chip tester is a device specifically used to detect and evaluate the performance and reliability of semiconductor chips (such as integrated circuits, microprocessors, memories, etc.). They play a crucial role in the semiconductor manufacturing process to ensure that the chips meet the design specifications and quality standards before leaving the factory. Its structure mainly includes components such as a test head, a test interface board, a power supply, and a signal source. Before the formal use of the chip, it needs to be tested in many aspects. Specifically, the test head needs to be transported to different test stations.

[0003] Chinese Patent CN213651724U discloses a lifting trolley, which includes a working platform, a lifting control handle, a ball screw assembly, a lifting assembly, a plurality of wheel assemblies, and a base installed on the plurality of wheel assemblies; the working platform is arranged above the base, and both ends of the working platform are respectively connected to both ends of the base through two lifting assemblies; a ball screw assembly is arranged on the bottom surface of the working platform, the ball screw assembly is connected to the lifting control handle, and the ball screw assembly is located between the two lifting assemblies and is connected to the lifting assemblies on both sides thereof through a connecting rod. The utility model uses a lifting control handle to adjust the ball screw assembly to drive the lifting assembly to realize the lifting of the working platform of the trolley, so that the height of the working platform of the trolley matches the workstation, facilitating the transfer of the fixture and realizing the switching of the fixtures on workstations at different heights, reducing the labor intensity and improving the work efficiency.

[0004] However, this technical solution will cause the test head to be unstable and firm enough. During the transfer process, the test head is extremely likely to shift, shake, etc., resulting in inaccurate test results of the test head. Summary of the Utility Model

[0005] The purpose of the utility model is to provide a multifunctional lifting test trolley for a chip tester aiming at the deficiencies of the prior art. Through the positioning component on the lifting structure combined with the locking component between the test head and the lifting mechanism, the test head is more stable and firm during the transfer process, solving the problems that the test head in the prior art is extremely likely to shift, shake, etc.

[0006] To achieve the above purpose, the utility model provides the following technical solutions:

[0007] A multi-functional lifting test trolley for a chip tester, comprising: a base and a lifting mechanism provided on one side of the base, further comprising: a positioning component provided on the lifting mechanism for defining the position of the test head, and a locking component is provided between the test head and the lifting mechanism.

[0008] Preferably, the lifting mechanism comprises:

[0009] A screw jack, provided on one side of the base;

[0010] Two struts, respectively provided at both ends of the screw jack, and the locking component is provided inside the struts; and

[0011] A sliding component, provided at the output end of the screw jack, and the sliding component is correspondingly slidably connected to the struts.

[0012] Preferably, the sliding component comprises:

[0013] A sliding plate, provided on one side of the strut, and the positioning component is provided at the top of the sliding plate;

[0014] A fixing plate, provided on the other side of the strut, and the fixing plate is perpendicularly and fixedly connected to the sliding plate; and

[0015] A limiting plate, provided at the top of the fixing plate and closely adjacent to the fixing plate, and the limiting plate is provided directly above the strut.

[0016] Preferably, the positioning component comprises: a limiting block closely provided on the side wall of the sliding plate and a positioning groove provided on the limiting block, and the positioning groove completely penetrates the sliding plate, and the limiting block is provided adjacent to the limiting plate, and the two do not interfere with each other.

[0017] Preferably, the locking component comprises: a locking block provided at the inner extension of the strut and a locking member penetrating through the locking block and the extension, and the end of the locking member faces the test head.

[0018] Preferably, a guide rail is provided on one side of the strut, and a plurality of sliders are slidably connected to the guide rail, and the sliders are all fixedly connected to the sliding plate.

[0019] Preferably, it further comprises an adjusting component for adjusting the level of the base, and the adjusting component comprises: connecting pieces provided on both sides of the base, support rods fixedly connected to the connecting pieces, and adjustable feet provided at both ends of the support rods.

[0020] Preferably, a clamping component for clamping the test head is detachably connected to one side of the positioning component;

[0021] The clamping assembly includes:

[0022] A plurality of fixing blocks respectively abutting against the top ends of the struts;

[0023] A connecting plate fixedly connected to one end of the fixing block, and the end of the locking member abuts against the connecting plate;

[0024] A connecting rod passing through the fixing block, and both ends of the connecting rod extend outward respectively and are correspondingly inserted into the positioning grooves;

[0025] A rotating member disposed on the connecting plate;

[0026] A clamping arm fixedly connected to the rotating member; and

[0027] An adjusting member disposed on one side of the rotating member.

[0028] Preferably, it further includes: a test bracket detachably connected with the clamping assembly and a probe station disposed on one side of the test bracket for testing the performance of the test head. The test bracket includes: a base, a support seat disposed on the base, and a support arm rotatably connected to one side of the support seat. The connecting rod is detachably connected to the support arm, and is fixed between the mounting bracket of the connecting rod and the support arm through a fastener.

[0029] Preferably, it further includes a sorter for detecting the test head, and a test trolley installed with the test head clamped by the clamping assembly is disposed below the sorter.

[0030] The beneficial effects of the present utility model are as follows:

[0031] (1) By installing adjusting components on both sides of the base, the present utility model can not only support the entire test trolley, improve the stability of the test trolley, prevent the test head from shaking during the test, ensure the accuracy of the test results, but also adjust the levelness of the entire test trolley by adjusting the levelness of the base, thereby ensuring the levelness of the test head 3 and making the test results more accurate.

[0032] (2) The present utility model first clamps the test head by the clamping assembly and then installs the clamping assembly on the trolley, which reduces a large amount of manual operation, improves work efficiency, and directly inserts the connecting rod on the clamping assembly into the positioning groove of the positioning assembly, realizing the function of quick positioning, with simple operation and convenient use.

[0033] (3) The present utility model controls the rotation of the entire clamping assembly through a rotating member and an adjusting member, enabling the clamping assembly to have the function of rotating along the axis, and further realizing the rotation of the test head. That is, the rotation of the test head can be controlled through the adjusting member, making the test head more stable for detection, convenient to use, and having a simple structure and convenient disassembly and assembly.

[0034] (4) The present utility model controls the up and down movement of the screw jack through a control handle. The combination of the two makes the position of the test head more accurate, ensuring the normal progress of the test. Moreover, the screw jack has the advantages of good stability, strong load-bearing capacity, compact structure, small volume, light weight, and easy control, and can achieve precise control of the lifting movement, which is convenient to use.

[0035] In summary, the present utility model has the advantages of good stability and firmness, more accurate test results, high work efficiency, simple operation, and convenient disassembly and assembly. BRIEF DESCRIPTION OF THE DRAWINGS

[0036] Figure 1 It is a schematic diagram of the overall structure of the first embodiment of the present utility model;

[0037] Figure 2 It is a schematic diagram of the internal structure of the screw jack in the first embodiment of the present utility model;

[0038] Figure 3 It is a schematic diagram of the state when the test bench handover is completed in the first embodiment of the present utility model;

[0039] Figure 4 It is Figure 3 The enlarged view of part A;

[0040] Figure 5 It is Figure 3 The enlarged view of part B;

[0041] Figure 6 It is a schematic diagram of the state when the test bench is working on the probe station in the second embodiment of the present utility model;

[0042] Figure 7 It is a schematic diagram of the handover between the probe station and the test trolley after the work is completed in the second embodiment of the present utility model;

[0043] Figure 8 It is Figure 7 The enlarged view of part C;

[0044] Figure 9 It is a schematic diagram of the state when the test trolley is working in the sorter in the third embodiment of the present utility model.

[0045] Reference numerals: 1 - base; 2 - lifting mechanism; 21 - screw jack; 211 - screw rod; 212 - driving device; 213 - control handle; 214 - outer cover; 22 - support pillar; 221 - extension part; 23 - sliding assembly; 231 - sliding plate; 232 - fixing plate; 233 - limiting plate; 24 - guide rail; 25 - slider; 3 - test head; 4 - positioning assembly; 41 - limiting block; 42 - positioning groove; 5 - locking assembly; 51 - locking block; 52 - locking member; 6 - adjusting assembly; 61 - connecting member; 62 - support rod; 63 - adjustable support foot; 7 - clamping assembly; 71 - fixing block; 72 - connecting plate; 73 - connecting rod; 74 - rotating member; 75 - clamping arm; 76 - adjusting member; 8 - test bracket; 81 - base; 82 - support seat; 83 - support arm; 831 - mounting bracket; 832 - fastener; 9 - probe station; 10 - sorter. Detailed implementation manner

[0046] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0047] In the description of the present invention, it should be understood that the orientation or positional relationship indicated by the terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", etc. is based on the orientation or positional relationship shown in the accompanying drawings, and is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus should not be construed as a limitation to the present invention. In addition, the terms "first" and "second" are only used for descriptive purposes and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Thus, the features defined with "first" and "second" may explicitly or implicitly include one or more of such features. In the description of the present invention, "a plurality" means two or more, unless otherwise specifically defined.

[0048] Embodiment 1

[0049] As Figures 1-5As shown in the figure, this embodiment provides a multifunctional lifting test trolley for a chip tester, including: a base 1 and a lifting mechanism 2 provided on one side of the base 1. It further includes: a test head 4 provided on the lifting mechanism 2 for defining the position of the test head 3. A locking assembly 5 is fixedly connected between the test head 3 and the lifting assembly. The combination of the test head 4 and the locking assembly 5 makes the test head 3 more stable and firm, without shaking or other situations, ensuring the stability of the test head 3 during transportation.

[0050] Among them, the lifting mechanism 2 includes: a screw jack 21 provided on one side of the base 1, two struts 22 respectively provided at both ends of the screw jack 21, and a sliding assembly 23 provided at the output end of the screw jack 21. The locking assembly 5 is provided inside the strut 22. The sliding assembly 23 is correspondingly slidably connected to the strut 22. The screw jack 21 has the advantages of good stability, strong load-bearing capacity, compact structure, small volume, light weight, and easy control. It can achieve precise control of the lifting movement, is easy to use, thereby ensuring that the test head 3 can quickly move to the designated station, saving time and improving work efficiency.

[0051] At the same time, the screw jack 21 includes: a vertically arranged screw rod 211, a driving device 212 provided at the bottom end of the screw rod 211, a control handle 213 provided on one side of the driving device 212, and an outer cover 214 provided on the outer periphery of the driving device 212 and other components. The screw rod 211 is in threaded connection with the fixing plate 232. Rotating the control handle 213 drives the screw rod 211 to rotate, and then drives the fixing plate 232 to move up and down reciprocally. The outer cover 214 plays a protective role, isolating external dust and other impurities, and prolonging the service life of the screw jack 21.

[0052] In this embodiment, the sliding assembly 23 includes: a sliding plate 231 provided on one side of the strut 22, a fixing plate 232 provided on the other side of the strut 22, and a limiting plate 233 provided at the top end of the fixing plate 232 and closely arranged against the fixing plate 232. The test head 4 is provided at the top end of the sliding plate 231. The fixing plate 232 is perpendicularly and fixedly connected to the sliding plate 231. The limiting plate 233 is provided directly above the strut 22. The initial position of the limiting plate 233 is just in contact with the top end of the strut 22. The output end of the screw jack 21 is provided on the fixing plate 232 to drive the fixing plate 232 to move up and down reciprocally, and then drive the entire sliding assembly 23 to move up and down reciprocally. The process is simple to operate and easy to use.

[0053] In this embodiment, the test head 4 includes a limit block 41 disposed close to the side wall of the sliding plate 231 and a positioning groove 42 provided on the limit block 41. The positioning groove 42 completely penetrates the sliding plate 231. The limit block 41 is disposed adjacent to the limit plate 233, and the two do not interfere with each other. The top end of the sliding plate 231 is preferably slightly higher than the top end of the fixing plate 232 to avoid interference between the limit block 41 and the limit plate 233.

[0054] In this embodiment, the locking assembly 5 includes a locking block 51 disposed on the inner extension 221 of the column 22 and a locking member 52 passing through the locking block 51 and the extension 221. The end of the locking member 52 faces the test head 3. The locking member 52 is preferably a bolt that fixes the locking block 51 and the extension 221 together.

[0055] In this embodiment, a guide rail 24 is provided on one side of the column 22. A plurality of sliders 25 are slidably connected to the guide rail 24. The sliders 25 are all fixedly connected to the sliding plate 231. The sliders 25 drive the sliding plate 231 to move on the guide rail 24, thereby driving the entire sliding assembly 23 to move. Its structure is simple and it is convenient to disassemble and assemble.

[0056] Of course, the test trolley further includes an adjusting assembly 6 for adjusting the level of the base 1. The adjusting assembly 6 includes connecting members 61 provided on both sides of the base 1, support rods 62 fixedly connected to the connecting members 61, and adjustable feet 63 provided at both ends of the support rods 62. The adjustable feet 63 can not only support the entire test trolley, improve the stability of the test trolley, so that the test head 3 will not shake during the test, ensuring the accuracy of the test results, but also adjust the level of the entire test trolley by adjusting the level of the support rod 62, thereby ensuring the level of the test head 3 and making its test results more accurate.

[0057] In addition, a clamping assembly 7 for clamping the test head 3 is detachably connected to one side of the test head 4. The clamping assembly 7 includes a plurality of fixing blocks 71 respectively abutted against the top end of the column 22, a connecting plate 72 fixedly connected to one end of the fixing block 71, a connecting rod 73 passing through the fixing block 71, a rotating member 74 provided on the connecting plate 72, a clamping arm 75 fixedly connected to the rotating member 74, and an adjusting member 76 provided on one side of the rotating member 74. The end of the locking member 52 abuts against the connecting plate 72. Both ends of the connecting rod 73 extend outward and are respectively inserted into the positioning groove 42. The adjusting member 76 is used to adjust the position of the clamping arm 75, thereby adjusting the position of the test head 3.

[0058] Example 2

[0059] As Figures 6-8 shown, where the same or corresponding components as in Example 1 are labeled with the corresponding reference numerals in Example 1. For simplicity, only the differences from Example 1 will be described below. The differences between this Example 2 and Example 1 are as follows:

[0060] It further includes: a test bracket 8 detachably connected to the clamping assembly 7 and a probe station 9 disposed on one side of the test bracket 8 for testing the performance of the test head 3. The test bracket 8 includes: a base 81, a base 82 disposed on the base 81, and a support arm 83 rotatably connected to one side of the base 82. The connecting rod 73 is detachably connected to the support arm 83, and is fixed between the mounting bracket 831 of the support arm 83 and the connecting rod 73 by a fastener 832.

[0061] Among them, the probe station 9 is an important device for electrically testing semiconductor devices. It can directly perform electrical performance tests on semiconductor chips, integrated circuits, and other microelectronic devices, providing valuable information for research and production. The functions of the probe station 9 include placing electrical probes, optical probes, or radio frequency probes on silicon wafers and cooperating with test instruments or semiconductor test systems to test chips or semiconductor devices, from simple continuity or isolation checks to complex microcircuit function tests.

[0062] The working process of this embodiment is as follows: First, the clamping assembly 7 is installed on the test bracket 8 and then fixed by the fastener 832. Then, the test head 3 is clamped by the clamping assembly 7. The test trolley is moved directly below the clamping assembly 7, and the limiting rod in the clamping assembly 7 is aligned with the positioning groove 42 on the test trolley and inserted. Then, the fastener 832 is loosened, the clamping assembly 7 is detached from the test bracket 8 and installed on the test trolley. Finally, the position of the locking member 52 is adjusted so that its end just abuts against the connecting plate 72. At this time, the handover of the test head 3 is completed.

[0063] Example 3

[0064] As Figure 9 shown, where the same or corresponding components as in Example 1 are labeled with the corresponding reference numerals in Example 1. For simplicity, only the differences from Example 1 will be described below. The differences between this Example 3 and Example 1 are as follows:

[0065] It further includes a sorter 10 for detecting the test head 3. A test carriage installed with the test head 3 clamped by the clamping assembly 7 is arranged below the sorter 10. The carriage is fixed by an adjusting assembly 6 to make the test head 3 stable without shaking. Then, the adjustable feet 63 are adjusted to adjust the levelness of the test head 3, and the control handle 213 is rotated to adjust the vertical position of the test head 3, and the adjusting member 76 is adjusted to adjust the rotation amplitude of the test head 3, so that the test head 3 meets the station requirements of the sorter 10. When the positioning of the test head 3 is completed, the test carriage is moved to transfer the test head 3 to a specified test position, i.e., a specified station, below the sorter 10. The process is simple to operate and convenient to use.

[0066] Among them, the sorter 10 is a device for weight classification and screening of products. Under the action of pneumatic conveying, the material passes through the rotary air lock and the feed hopper and falls on the high-speed rotating distribution plate. Under the action of centrifugal force, the material is fully dispersed and thrown towards the buffer ring. During the falling process, the heavier material, under the action of the cross airflow generated by the rotor, passes through the blades of the adjusting ring and slides into the coarse material collector of the separator for collection, and then is discharged through the rotary air lock.

[0067] Meanwhile, the lifting test carriage is located directly below the stress point of the sorter 10. Due to the existence of the adjustable feet 63, the distance between the support point and the center of gravity is small, the moment is smaller, and the stress is better, so as to achieve a more stable support effect and enable the test head 3 to work normally on the sorter 10.

[0068] The working process of this embodiment is as follows: First, the clamping assembly 7 clamping the test head 3 is installed on the test carriage, then the test bracket 8 is disassembled and removed, and then the carriage is pushed. The vertical position of the test head 3 is adjusted by manually adjusting the control handle 213 of the screw jack 21 according to the actual requirements of the sorter 10, and finally it is transferred to the specified station below the sorter 10.

[0069] The above are only the preferred embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent replacements, and improvements made within the spirit and principles of the present invention shall be included within the protection scope of the present invention.

Claims

1. A multifunctional lifting test trolley for a chip tester, comprising: The base and the lifting mechanism arranged on one side of the base are characterized in that they also include: a positioning component arranged on the lifting mechanism for limiting the position of the test head, and a locking component is arranged between the test head and the lifting mechanism.

2. The multifunctional lifting test vehicle for a chip tester according to claim 1, characterized in that: The lifting mechanism comprises: A screw lifter is arranged on one side of the base; Two pillars are respectively arranged at two ends of the screw lift, and the locking assembly is arranged on the inner side of the pillars; and The sliding component is arranged at the output end of the screw lifter, and the sliding component is correspondingly slidably connected to the support.

3. The multifunctional lifting test vehicle for a chip tester according to claim 2 is characterized in that: The sliding assembly comprises: A sliding plate is arranged on one side of the pillar, and the positioning assembly is arranged on the top of the sliding plate; A fixed plate, disposed on the other side of the support column, wherein the fixed plate is vertically fixedly connected to the sliding plate; and The limiting plate is arranged on the top of the fixing plate and close to the fixing plate, and the limiting plate is arranged just above the pillar.

4. The multifunctional lifting test vehicle for a chip tester according to claim 3 is characterized in that: The positioning assembly comprises: a limiting block arranged close to the side wall of the sliding plate and a positioning groove arranged on the limiting block, wherein the positioning groove completely penetrates the sliding plate, and the limiting block is arranged at an adjacent side of the limiting plate.

5. The multifunctional lifting test vehicle for a chip tester according to claim 2, characterized in that: The locking assembly comprises: a locking block arranged at the inner extension portion of the pillar and a locking member penetrating the locking block and the extension portion, wherein the end of the locking member is arranged facing the test head.

6. The multifunctional lifting test vehicle for a chip tester according to claim 3, characterized in that: A guide rail is arranged on one side of the pillar, and a plurality of sliding blocks are slidably connected to the guide rail, and the sliding blocks are all fixedly connected to the sliding plate.

7. The multifunctional lifting test vehicle for a chip tester according to claim 1, characterized in that: It also includes an adjustment component for adjusting the horizontality of the base, and the adjustment component includes: connecting members arranged on both sides of the base, a support rod fixedly connected to the connecting members, and adjustable feet arranged at both ends of the support rod.

8. The multifunctional lifting test vehicle for a chip tester according to claim 4, characterized in that: A clamping assembly for clamping the test head is detachably connected to one side of the positioning assembly; The clamping assembly comprises: A plurality of fixing blocks are respectively abutted against the top ends of the pillars; A connecting plate, fixedly connected to one end of the fixing block, the locking assembly abutting against the connecting plate; A connecting rod passes through the fixing block, and two ends of the connecting rod extend outwards and are correspondingly inserted into the positioning grooves; A rotating member, arranged on the connecting plate; a clamping arm fixedly connected to the rotating member; and The adjusting member is arranged on one side of the rotating member.

9. The multifunctional lifting test vehicle for a chip tester according to claim 8, characterized in that: Also includes: A test bracket detachably connected to the clamping assembly and a probe station arranged on one side of the test bracket for testing the performance of the test head, the test bracket includes: a base, a support base arranged on the base, and a support arm rotatably connected to one side of the support base, the connecting rod is detachably connected to the support arm, and the connecting rod is fixed to the mounting frame of the support arm by fasteners.

10. The multifunctional lifting test vehicle for a chip tester according to claim 9, characterized in that: It also includes a sorting machine for detecting the test head, and a test trolley for clamping the test head through the clamping assembly is installed below the sorting machine.

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