Full-automatic chip testing seat

Abstract

The utility model discloses a full-automatic chip test seat comprising an upper cover which is fixedly connected with two groups of symmetrical vertical rods; the base is matched with the upper cover, symmetrical notches are formed in the base, and the two sets of symmetrical vertical rods are matched with the symmetrical notches; the symmetrical hand buckles are provided with arc grooves respectively, the two sets of symmetrical vertical rods are fixedly connected with third steel pins respectively, and the symmetrical hand buckles are rotationally connected with the corresponding third steel pins respectively; and the symmetrical hand buckle swing arms are arranged in the corresponding arc grooves respectively, the symmetrical hand buckles are fixedly connected with second steel pins respectively, the symmetrical hand buckle swing arms are rotationally connected with the corresponding second steel pins respectively, and the base is fixedly connected with symmetrical first steel pins. The utility model relates to the technical field of test bases, in particular to a full-automatic chip test seat. The technical problem to be solved by the utility model is to provide a full-automatic chip testing seat which is beneficial to realizing chip testing.

Description

Technical Field

[0001] The utility model relates to the technical field of test bases, and specifically relates to a full-automatic chip test socket. Background Art

[0002] A chip test socket, also known as an IC test socket, a chip test fixture or a DUT fixture, is a key device in the electronics industry to ensure the quality and performance of chips. By providing functions such as stable physical and electrical interfaces, connecting the chip to the test equipment, simulating different working conditions and signal inputs, etc., it provides reliable guarantee for chip testing.

[0003] In the prior art, for example, a utility model of a chip test socket with the authorization announcement number CN218180924U. By setting a motor assembly to drive the pressing cover assembly, it can realize that the pressing cover assembly presses down along the direction perpendicular to the chip, meet the requirement of the force balance on the contact surface of the pressing cover assembly acting on the target chip to be tested, and avoid the oblique cutting contact between the pressing cover assembly and the contact surface of the target chip to be tested.

[0004] Currently, there is still a lack of a test socket suitable for full-automatic chip testing and burn-in aging to improve the testing efficiency of chips and extend the service life of the test socket. Summary of the Utility Model

[0005] The technical problem to be solved by the utility model is to provide a full-automatic chip test socket, which is beneficial to realizing chip testing.

[0006] The utility model adopts the following technical scheme to achieve the utility model purpose:

[0007] A full-automatic chip test socket, characterized by comprising: an upper cover, the upper cover is fixedly connected with two groups of symmetric vertical rods; a base, matching the upper cover, the base is provided with symmetric notches, and the two groups of symmetric vertical rods match the symmetric notches; symmetric handholds, each provided with an arc groove, the two groups of symmetric vertical rods are respectively fixedly connected with third steel pins, and the symmetric handholds are respectively rotatably connected with the corresponding third steel pins; symmetric handhold swing arms, respectively arranged in the corresponding arc grooves, the symmetric handholds are respectively fixedly connected with second steel pins, and the symmetric handhold swing arms are respectively rotatably connected with the corresponding second steel pins, the base is fixedly connected with symmetric first steel pins, and the symmetric handhold swing arms are respectively rotatably connected with the corresponding first steel pins.

[0008] As a further limitation of this technical scheme, the base is fixedly connected with a lower needle plate, the lower needle plate is fixedly connected with a group of probes, the lower needle plate is fixedly connected with an upper needle plate, and the group of probes passes through the upper needle plate.

[0009] As a further limitation of the technical solution, a floating plate is provided on the upper side of the upper needle plate, and a set of needle holes are provided on the floating plate, and a set of the probes are matched with a set of the needle holes.

[0010] As a further limitation of the technical solution, the floating plate is matched with the chip to be measured.

[0011] As a further limitation of the technical solution, the upper cover is fixedly connected with two groups of symmetric guide rods, and two groups of symmetric guide grooves are provided on the base, and each of the guide rods is respectively arranged in the corresponding guide groove.

[0012] As a further limitation of the technical solution, fixed clamping blocks are fixedly connected to the base corresponding to each of the guide grooves, hooks are fixedly connected to each of the guide rods, and each of the hooks is respectively matched with the corresponding fixed clamping block.

[0013] Compared with the related art, a fully automatic chip test socket provided by the utility model has the following beneficial effects:

[0014] (1) The device is applicable to fully automatic chip testing, programming and aging, improves the testing efficiency of the chip, and prolongs the service life of the test socket.

[0015] (2) The overall height of the device is 17.5 MM, which meets the height requirements of the testing equipment and also meets the space requirements of the aging equipment. Especially for the size of the base, the length and width are 21.5X26, the volume is smaller, and the utilization rate of the PCB is higher. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 is an exploded view of the utility model;

[0017] Figure 2 is a partial exploded view of the utility model;

[0018] Figure 3 is a partial three-dimensional structural schematic Figure 1 ;

[0019] Figure 4 is a partial three-dimensional structural schematic Figure 2 ;

[0020] Figure 5 is a partial three-dimensional structural schematic Figure 3 ;

[0021] Figure 6 is a three-dimensional structural schematic diagram of the utility model.

[0022] In the figure: 1. Upper cover, 2. Hand buckle, 3. Hand buckle swing arm, 4. Base, 5. Floating plate, 6. Upper needle plate, 7. Probe, 8. Lower needle plate, 9. First steel pin, 10. Second steel pin, 11. Third steel pin, 12. Chip under test, 101. Vertical rod, 102. Guide rod, 103. Hook, 201. Arc groove, 401. Guide groove, 402. Fixed clamping block, 403. Notch. Detailed implementation mode

[0023] Next, the technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0024] Embodiment 1: A fully automatic chip test socket, comprising: an upper cover 1, the upper cover 1 is fixedly connected with two groups of symmetric vertical rods 101; a base 4, matching the upper cover 1, the base 4 is provided with symmetric notches 403, and the two groups of symmetric vertical rods 101 match the symmetric notches 403; symmetric hand buckles 2, each provided with an arc groove 201, the two groups of symmetric vertical rods 101 are respectively fixedly connected with third steel pins 11, and the symmetric hand buckles 2 are respectively rotatably connected with the corresponding third steel pins 11; symmetric hand buckle swing arms 3, respectively arranged in the corresponding arc grooves 201, the symmetric hand buckles 2 are respectively fixedly connected with second steel pins 10, and the symmetric hand buckle swing arms 3 are respectively rotatably connected with the corresponding second steel pins 10, the base 4 is fixedly connected with symmetric first steel pins 9, and the symmetric hand buckle swing arms 3 are respectively rotatably connected with the corresponding first steel pins 9.

[0025] The base 4 is fixedly connected with a lower needle plate 8, the lower needle plate 8 is fixedly connected with a group of probes 7, the lower needle plate 8 is fixedly connected with an upper needle plate 6, and a group of probes 7 pass through the upper needle plate 6.

[0026] A floating plate 5 is arranged on the upper side of the upper needle plate 6, the floating plate 5 is provided with a group of needle holes, and a group of probes 7 match a group of needle holes.

[0027] The floating plate 5 matches the chip under test 12.

[0028] The upper cover 1 is fixedly connected with two groups of symmetric guide rods 102, the base 4 is provided with two groups of symmetric guide grooves 401, and each guide rod 102 is respectively arranged in the corresponding guide groove 401.

[0029] The floating plate 5 is not connected to the upper needle plate 6, so when the robot arm presses down the edge of the upper cover 1 and moves downward, the floating plate 5 can not slowly lift the chip 12 to leave the top of the contact probe 7. Therefore, it is added that the floating plate 5 and the upper needle plate 6 are connected by a spring (not shown in the figure).

[0030] The lower needle plate 8 is mounted on the test board of the test equipment. When no external force is applied, the contact surface of the probe 7 and the test board has a contact margin of 0.3 to 0.5 mm, which can more effectively connect and conduct. For example, the probe 7 adopts an inner and outer rod method, the outer rod is connected to the lower needle plate 8, the inner rod can move along the outer rod, and the inner rod is connected to the outer rod through a spring. When no external force is applied, the inner rod is away from the test board. When an external force is applied, the inner rod moves along the outer rod to contact the test board. After the external force is removed, the inner rod is reset.

[0031] The upper cover 1 is connected to the mechanical arm provided on the testing device.

[0032] The working principle of a fully automatic chip test socket provided by the utility model is as follows:

[0033] Use the vacuum suction head to place the chip 12 under test on the floating plate 5. Control the mechanical arm to drive the upper cover 1 to move upward, the upper cover 1 drives the vertical rod 101 to move along the notch 403, drives the guide rod 102 to move along the guide groove 401, the upper cover 1 drives the third steel pin 11 to move, the third steel pin 11 drives the hand buckle 2 to swing, the hand buckle 2 drives the second steel pin 10 and the hand buckle swing arm 3 to swing, so that the hand buckle 2 clamps the chip under test 12, drives the chip under test 12 to move downward, the chip under test 12 drives the floating plate 5 to move downward, so that the spring is compressed, so that the chip under test 12 contacts the probe 7, and the probe 7 contacts the test board to achieve the test, after the test is completed, control the mechanical arm to drive the upper cover 1 to move downward, so that the hand buckle 2 swings in the direction away from the chip under test 12, so that the probe 7 and the spring are restored, so that the floating plate 5 slowly lifts the chip under test 12 and leaves the top of the contact probe 7, so that the suction nozzle can take the chip under test 12 more easily, thereby improving the removal rate.

[0034] Embodiment 2: This embodiment is further elaborated on the basis of embodiment 1, wherein the base 4 is respectively fixedly connected to a fixed block 402 corresponding to each of the guide grooves 401 , each of the guide rods 102 is respectively fixedly connected to a hook 103 , and each of the hooks 103 is respectively matched with a corresponding fixed block 402 .

[0035] The working principle of a fully automatic chip test socket provided by the utility model is as follows:

[0036] When the mechanical arm drives the upper cover 1 to move upward, the guide rod 102 drives the hook 103 to move, and after the hook 103 contacts the fixed block 402, the mechanical handle is controlled to stop moving.

[0037] The above are only embodiments of the present utility model, and thus do not limit the patent scope of the present utility model. Any equivalent structural or equivalent process transformation made by using the content of the specification and drawings of the present utility model, or directly or indirectly applied in other related technical fields, shall similarly be included within the patent protection scope of the present utility model.

Claims

1. A fully automatic chip test socket, characterized in that: include: An upper cover (1), wherein the upper cover (1) is fixedly connected to two groups of symmetrical vertical rods (101); A base (4) matching the upper cover (1), the base (4) being provided with symmetrical notches (403), and two groups of symmetrical vertical rods (101) matching the symmetrical notches (403); The symmetrical hand buckles (2) are respectively provided with arc grooves (201); the two groups of symmetrical vertical rods (101) are respectively fixedly connected to the third steel pins (11); and the symmetrical hand buckles (2) are respectively rotatably connected to the corresponding third steel pins (11); Symmetrical hand buckle swing arms (3) are respectively arranged in the corresponding arc grooves (201); the symmetrical hand buckles (2) are respectively fixedly connected to the second steel pins (10); the symmetrical hand buckle swing arms (3) are respectively rotatably connected to the corresponding second steel pins (10); the base (4) is fixedly connected to the symmetrical first steel pins (9); the symmetrical hand buckle swing arms (3) are respectively rotatably connected to the corresponding first steel pins (9).

2. The fully automatic chip test socket according to claim 1 is characterized in that: The base (4) is fixedly connected to a lower needle plate (8), the lower needle plate (8) is fixedly connected to a group of probes (7), the lower needle plate (8) is fixedly connected to an upper needle plate (6), and a group of probes (7) passes through the upper needle plate (6).

3. The fully automatic chip test socket according to claim 2, characterized in that: A floating plate (5) is arranged on the upper side of the upper needle plate (6), and the floating plate (5) is provided with a group of pinholes, and a group of the probes (7) matches a group of the pinholes.

4. The fully automatic chip test socket according to claim 3 is characterized in that: The floating plate (5) matches the chip (12) under test.

5. The fully automatic chip test socket according to claim 1, characterized in that: The upper cover (1) is fixedly connected to two groups of symmetrical guide rods (102); the base (4) is provided with two groups of symmetrical guide grooves (401); and each guide rod (102) is respectively arranged in a corresponding guide groove (401).

6. The fully automatic chip test socket according to claim 5, characterized in that: The base (4) is respectively fixedly connected to a fixed block (402) corresponding to each guide groove (401), each guide rod (102) is respectively fixedly connected to a hook (103), and each hook (103) matches the corresponding fixed block (402).

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