Measuring clamp

Abstract

The utility model discloses a measuring clamp which is characterized in that the measuring clamp comprises a conductive plate, a conductive probe mounting plate and a plurality of conductive probes, the conductive plate is matched with the conductive probe mounting plate, and the upper surface of the conductive plate is provided with a plurality of placing grooves; the conductive probes are mounted on the conductive probe mounting plate, and the conductive probes and the placement grooves are the same in number and are in one-to-one correspondence; the conductive plate and the conductive probe are made of conductive materials, and the conductive probe mounting plate is made of insulating materials. According to the measuring clamp, the position of the piezoresistor chip can be kept stable in the testing process, performance testing can be conveniently carried out on the piezoresistor chips in batches, and the detection efficiency can be effectively improved.

Description

Technical Field

[0001] The utility model relates to the field of electronic component detection equipment, and particularly relates to a measuring fixture. Background Technique

[0002] A varistor is a voltage-limiting protection device. Utilizing the non-linear characteristic of the varistor, when an overvoltage appears between the two poles of the varistor, the varistor can clamp the voltage to a relatively fixed voltage value, thereby achieving the protection of the subsequent circuit.

[0003] After the varistor is processed, a varistor tester is required to perform performance tests, generally testing the varistor voltage, leakage current, and non-linear coefficient alpha value of the varistor. Two test wire ends of the varistor tester are respectively connected with a conductive clip. During the performance test, it is usually tested manually. It is necessary to clamp the two conductive clips to the two pins of a varistor respectively, observe the reading of the varistor tester with eyes, wait for the specified time to arrive, and judge whether the performance of the varistor is qualified, so as to complete the test of a varistor, and so on and repeat continuously. This test method is relatively cumbersome to operate, consumes a long time, has low work efficiency, and has a large labor intensity.

[0004] The Chinese utility model patent specification with the authorization announcement number CN216351005U discloses a rapid test device for varistor chips, including a varistor tester, a first test wire, and a second test wire. One end of each of the first test wire and the second test wire is inserted into the corresponding test hole of the varistor tester. It is characterized in that: it further includes an insulating support platform, a conductive plate, and a test pen. The conductive plate is installed on the upper surface of the insulating support platform, and the conductive plate is electrically connected to the other end of the first test wire. The test pen includes an insulating pen rod and a conductive pen tip, and the conductive pen tip is electrically connected to the other end of the second test wire. After forming electrodes on both sides of the varistor dielectric sheet to obtain the varistor chip, performance parameters such as the varistor voltage, leakage current, and nonlinear coefficient alpha value of the corresponding varistor can be tested. During the test, multiple processed varistor chips can be laid flat on the conductive plate, so that the electrode on the lower side of the varistor chip contacts the conductive plate. The tester only needs to hold the insulating pen rod of the test pen with one hand, make the conductive pen tip of the test pen contact the electrode on the upper side of a certain varistor chip, and press down slightly, then a complete test circuit can be formed among the varistor chip, the conductive plate, the first test wire, the varistor tester, the second test wire, and the test pen. The circuit is conducted, and the varistor tester will display the data of the varistor. The tester judges whether the performance test of the varistor is qualified by reading the data, that is, the test of one varistor chip is completed; for the test of other varistor chips, it only needs to make the conductive pen tip of the test pen contact the electrode on their upper side. The other hand of the tester can be appropriately relaxed and rested, reducing the labor intensity. This rapid test device for varistor chips speeds up the test speed of the tester, improves production efficiency, reduces the labor intensity, and is suitable for the mass testing of varistor chips. However, when testing, the varistor chips are laid flat on the conductive plate, and the position of the varistor chips on the conductive plate is unstable. Especially when the conductive pen tip presses down, the varistor chips are prone to dislocation, affecting the normal progress of the test. Utility Model Content

[0005] The technical problem to be solved by the present utility model is to provide a measuring fixture that can keep the position of the varistor chip stable during the test process, facilitate the performance test of the varistor chips in batches, and can effectively improve the detection efficiency.

[0006] To solve the above technical problems, the following technical solutions are adopted:

[0007] A measuring fixture, characterized in that: it includes a conductive plate, a conductive probe mounting plate, and a plurality of conductive probes. The conductive plate matches the conductive probe mounting plate, and a plurality of placement grooves are opened on the upper surface of the conductive plate; each conductive probe is installed on the conductive probe mounting plate, and the number of conductive probes is the same as that of the placement grooves and they correspond one by one; the conductive plate and the conductive probes are made of conductive materials, and the conductive probe mounting plate is made of insulating materials.

[0008] The above conductive plate is electrically connected to the varistor tester through a test wire, and the test pen is electrically connected to the varistor tester through another test wire. When using the measuring fixture to test the performance of the varistor chip, multiple varistor chips can be respectively placed in the respective placement grooves, so that the electrodes on the lower side of the varistor chip are in contact with the bottom of the placement groove, and the placement groove positions the varistor chip; then the conductive probe mounting plate is stacked on the conductive plate. At this time, each conductive probe is located above the corresponding placement groove, and the conductive probe is in contact with the electrode on the upper side of the varistor chip; finally, the conductive tip of the test pen can be in close contact with the conductive probe, so that a complete test circuit is formed among the conductive plate, the varistor chip, the conductive probe and the varistor tester. After the circuit is turned on, the performance of the varistor chip can be tested; the conductive tip of the test pen can be in close contact with the upper ends of each conductive probe in turn to test the performance of each varistor chip separately. This measuring fixture can quickly test the performance of varistor chips in batches and can keep the position of the varistor chip stable during the test, effectively improving the detection efficiency.

[0009] In a preferred solution, a plurality of first guiding holes are provided on the conductive probe mounting plate. The number of the first guiding holes is the same as that of the conductive probes and they correspond to each other one by one. The conductive probes are movably arranged up and down in the corresponding first guiding holes.

[0010] In a further preferred solution, a plurality of first compression springs are provided on the conductive probe mounting plate. The number of the first compression springs is the same as that of the conductive probes and they correspond to each other one by one. A first clamping block is provided at the lower part of the conductive probe. The first compression spring is sleeved on the conductive probe, and the upper end of the first compression spring is connected or in close contact with the lower side surface of the conductive probe mounting plate, and the lower end of the first compression spring is connected or in close contact with the first clamping block; a second clamping block is provided at the upper part of the conductive probe, and the conductive probe mounting plate is located between the first clamping block and the second clamping block. When the conductive probe mounting plate is stacked on the conductive plate, after the lower end of the conductive probe contacts the electrode on the upper side of the corresponding varistor chip, the first compression spring will be compressed. Under the action of the first compression spring, the lower end of the conductive probe keeps in close contact with the electrode on the upper side of the varistor chip and applies a downward pressure to the varistor chip, so that the electrode on the lower side of the varistor chip keeps in close contact with the bottom of the placement groove.

[0011] In a further preferred solution, both the first clamping block and the second clamping block are annular clamping blocks.

[0012] In another preferred embodiment, a plurality of probe mounting holes are provided on the conductive probe mounting plate, and the number of probe mounting holes is the same as that of the conductive probes and they correspond to each other one by one; the conductive probe includes a probe body, a probe head, and a second compression spring. The probe body, the probe head, and the second compression spring are all made of conductive materials. The probe body is fixedly installed in the corresponding probe mounting hole. A probe head cavity is provided in the probe body. Openings are provided at both the upper and lower ends of the probe head cavity. An upper limit step is provided at the inner edge of the upper opening of the probe head cavity, and a lower limit step is provided at the inner edge of the lower opening of the probe head cavity. The probe head is installed in the probe head cavity. A limit convex edge that can be in contact and cooperation with the lower limit step is provided at the outer edge of the upper end of the probe head. The limit convex edge is located above the lower limit step. The lower end of the probe head extends out from the lower opening of the probe head cavity. The second compression spring is installed in the probe head cavity. The upper end and the lower end of the second compression spring are in close contact with the upper limit step and the upper end of the probe head respectively. When the conductive probe mounting plate is stacked on the conductive plate, after the lower end of the probe head touches the electrode on the upper side of the corresponding varistor chip, the second compression spring will be compressed. Under the action of the second compression spring, the lower end of the probe head remains in close contact with the electrode on the upper side of the varistor chip, and applies a downward pressure to the varistor chip, so that the electrode on the lower side of the varistor chip remains in close contact with the bottom of the placement groove.

[0013] In a preferred embodiment, a plurality of vertically extending guide posts are provided on the conductive plate, and a plurality of second guide holes are provided on the conductive probe mounting plate. The number of guide posts is the same as that of the second guide holes and they correspond to each other one by one. The guide posts and the second guide holes can make the position of the conductive probe mounting plate accurate when it is stacked on the conductive plate and prevent misalignment, further improving stability.

[0014] In a further preferred embodiment, the number of both the guide posts and the second guide holes is four. The four guide posts are respectively arranged at the four top corners of the conductive plate, and the four second guide holes are respectively arranged at the four top corners of the conductive probe mounting plate.

[0015] In a preferred embodiment, the conductive plate is made of a metal plate.

[0016] The beneficial effect of the present utility model is that this measuring fixture can keep the position of the varistor chip stable during the test process, facilitate batch performance testing of the varistor chip, and effectively improve the detection efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 is a schematic structural diagram of the measuring fixture in Embodiment 1 of the present utility model;

[0018] Figure 2 is a partial cross-sectional view of the conductive probe on the conductive probe mounting plate in Embodiment 2 of the present utility model. DETAILED DESCRIPTION OF THE INVENTION

[0019] The present utility model will be further described below in conjunction with the accompanying drawings and specific embodiments.

[0020] Embodiment 1

[0021] As Figure 1 A measuring fixture as shown includes a conductive plate 1, a conductive probe mounting plate 2, and a plurality of conductive probes 3. The conductive plate 1 matches the conductive probe mounting plate 2. A plurality of placement grooves 101 are formed on the upper surface of the conductive plate 1; each conductive probe 3 is mounted on the conductive probe mounting plate 2. The number of conductive probes 3 is the same as that of the placement grooves 101 and they correspond one by one; the conductive plate 1 and the conductive probes 3 are both made of conductive materials, and the conductive probe mounting plate 2 is made of insulating materials.

[0022] The above-mentioned conductive plate 1 is electrically connected to a varistor tester through a test line, and a test pen is electrically connected to the varistor tester through another test line. When using the measuring fixture to perform performance testing on a varistor chip, multiple varistor chips can be respectively placed in the respective placement grooves 101, so that the electrodes on the lower side of the varistor chip are in contact with the bottom of the placement grooves 101, and the placement grooves 101 position the varistor chips; then the conductive probe mounting plate 2 is stacked on the conductive plate 1. At this time, each conductive probe 3 is located above the corresponding placement groove 101, and the conductive probe 3 is in contact with the electrode on the upper side of the varistor chip; finally, the conductive tip of the test pen can be closely contacted with the conductive probe 3, so that a complete test circuit can be formed among the conductive plate 1, the varistor chip, the conductive probe 3, and the varistor tester. After the circuit is turned on, the performance of the varistor chip can be tested; the conductive tip of the test pen can be closely contacted with the upper ends of each conductive probe 3 in turn to perform performance testing on each varistor chip separately. This kind of measuring fixture can quickly perform performance testing on varistor chips in batches, and can keep the position of the varistor chips stable during the testing process, effectively improving the detection efficiency.

[0023] The conductive probe mounting plate 2 is provided with a plurality of first guiding holes. The number of the first guiding holes is the same as that of the conductive probes 3 and they correspond one by one. The conductive probes 3 are movably arranged up and down in the corresponding first guiding holes.

[0024] A plurality of first compression springs 4 are provided on the conductive probe mounting plate 2. The number of the first compression springs 4 is the same as that of the conductive probes 3 and they correspond to each other one by one. A first clamping block 301 is provided at the lower part of the conductive probe 3. The first compression spring 4 is sleeved on the conductive probe 3, and the upper end of the first compression spring 4 is connected to or in close contact with the lower side surface of the conductive probe mounting plate 2, and the lower end of the first compression spring 4 is connected to or in close contact with the first clamping block 301. A second clamping block 302 is provided at the upper part of the conductive probe 3. The conductive probe mounting plate 2 is located between the first clamping block 301 and the second clamping block 302. When the conductive probe mounting plate 2 is stacked on the conductive plate 1, after the lower end of the conductive probe 3 touches the electrode on the upper side of the corresponding varistor chip, the first compression spring 4 will be compressed. Under the action of the first compression spring 4, the lower end of the conductive probe 3 remains in close contact with the electrode on the upper side of the varistor chip, and applies a downward pressure to the varistor chip, so that the electrode on the lower side of the varistor chip remains in close contact with the bottom of the placement groove 101.

[0025] Both the first clamping block 301 and the second clamping block 302 are annular clamping blocks.

[0026] Four vertically extending guide posts 102 are provided on the conductive plate 1. The four guide posts 102 are respectively arranged at the four top corners of the conductive plate 1. Four second guide holes 201 are provided on the conductive probe mounting plate 2. The four second guide holes 201 are respectively arranged at the four top corners of the conductive probe mounting plate 2. The positions of the second guide holes 201 correspond to those of the guide posts 102. The guide posts 102 and the second guide holes can make the position accurate when the conductive probe mounting plate is stacked on the conductive plate and prevent dislocation, further improving the stability.

[0027] The conductive plate 1 is made of a metal plate.

[0028] Embodiment 2

[0029] The difference between this embodiment and Embodiment 1 is that as Figure 2As shown, a plurality of probe mounting holes 201' are provided on the conductive probe mounting plate 2'. The number of probe mounting holes 201' is the same as that of the conductive probes 3' and they correspond one by one. The conductive probe 3' includes a probe body 301', a probe head 302' and a second compression spring 303'. The probe body 301', the probe head 302' and the second compression spring 303' are all made of conductive materials. The probe body 301' is fixedly installed in the corresponding probe mounting hole 201'. A probe head cavity 3011' is provided in the probe body 301'. Both the upper and lower ends of the probe head cavity 3011' are provided with openings. An upper limit step 3012' is provided at the inner edge of the upper end opening of the probe head cavity 3011'. A lower limit step 3013' is provided at the inner edge of the lower end opening of the probe head cavity 3011'. The probe head 302' is installed in the probe head cavity 3011'. A limit convex edge 3021' capable of contacting and cooperating with the lower limit step 3013' is provided at the outer edge of the upper end of the probe head 302'. The limit convex edge 3021' is located above the lower limit step 3013'. The lower end of the probe head 302' extends out from the lower end opening of the probe head cavity 3011'. The second compression spring 303' is installed in the probe head cavity 3011'. The upper end and the lower end of the second compression spring 303' are in close contact with the upper limit step 3012' and the upper end of the probe head 302' respectively. When the conductive probe mounting plate 2' is stacked on the conductive plate, after the lower end of the probe head 302' touches the electrode on the upper side of the corresponding varistor chip, the second compression spring 303' will be compressed. Under the action of the second compression spring 303', the lower end of the probe head 302' remains in close contact with the electrode on the upper side of the varistor chip, and applies a downward pressure to the varistor chip, so that the electrode on the lower side of the varistor chip remains in close contact with the bottom of the placement groove.

Claims

1. A measuring fixture, characterized in that: It includes a conductive plate, a conductive probe mounting plate, and a plurality of conductive probes. The conductive plate matches the conductive probe mounting plate, and a plurality of placement grooves are formed on the upper surface of the conductive plate; each conductive probe is mounted on the conductive probe mounting plate, and the number of conductive probes is the same as that of the placement grooves and they correspond one by one; the conductive plate and the conductive probes are both made of conductive materials, and the conductive probe mounting plate is made of insulating materials.

2. The measuring fixture according to claim 1, wherein: A plurality of first guiding holes are provided on the conductive probe mounting plate. The number of the first guiding holes is the same as that of the conductive probes and they correspond one by one. The conductive probes are arranged to be movable up and down in the corresponding first guiding holes.

3. A measuring fixture according to claim 2, characterized in that: A plurality of first compression springs are provided on the conductive probe mounting plate. The number of the first compression springs is the same as that of the conductive probes and they correspond one by one. A first clamping block is provided at the lower part of the conductive probe. The first compression spring is sleeved on the conductive probe, and the upper end of the first compression spring is connected or in close contact with the lower side surface of the conductive probe mounting plate, and the lower end of the first compression spring is connected or in close contact with the first clamping block; a second clamping block is provided at the upper part of the conductive probe, and the conductive probe mounting plate is located between the first clamping block and the second clamping block.

4. A measuring fixture according to claim 3, characterized in that: Both the first clamping block and the second clamping block are annular clamping blocks.

5. A measuring fixture according to claim 1, wherein: A plurality of probe mounting holes are provided on the conductive probe mounting plate. The number of the probe mounting holes is the same as that of the conductive probes and they correspond one by one; the conductive probe includes a probe body, a probe head, and a second compression spring. The probe body, the probe head, and the second compression spring are all made of conductive materials. The probe body is fixedly mounted in the corresponding probe mounting hole. A probe head cavity is provided in the probe body. Openings are provided at both the upper and lower ends of the probe head cavity. An upper limiting step is provided at the inner edge of the upper end opening of the probe head cavity, and a lower limiting step is provided at the inner edge of the lower end opening of the probe head cavity. The probe head is mounted in the probe head cavity. A limiting convex edge capable of being in contact and cooperation with the lower limiting step is provided at the outer edge of the upper end of the probe head. The limiting convex edge is located above the lower limiting step. The lower end of the probe head extends out from the lower end opening of the probe head cavity. The second compression spring is mounted in the probe head cavity, and the upper end and the lower end of the second compression spring are in close contact with the upper limiting step and the upper end of the probe head respectively.

6. A measuring fixture as claimed in claim 1, wherein: A plurality of vertically extending guiding columns are provided on the conductive plate. A plurality of second guiding holes are provided on the conductive probe mounting plate. The number of the guiding columns is the same as that of the second guiding holes and they correspond one by one.

7. A measuring fixture according to claim 6, characterized in that: The number of both the guiding columns and the second guiding holes is four. The four guiding columns are respectively arranged at the four top corners of the conductive plate, and the four second guiding holes are respectively arranged at the four top corners of the conductive probe mounting plate.

8. A measuring fixture as claimed in claim 1, wherein: The conductive plate is made of a metal plate.

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