Testing device
By designing an adjustable angle load-bearing structure and driving part in the test device, the problem of inaccurate probe crimping caused by cell offset is solved, and the accuracy and intelligent control of cell performance testing is achieved.
Patent Information
- Application Number
- CN202421658532.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-07-12
- Publication Date
- 2025-07-11
- Estimated Expiration
- 2034-07-12
AI Technical Summary
电池片在被运送至测试区域时容易出现偏移,导致探针无法与其有效压接,影响测试结果的精准性。
A test device is designed, including a support base, a cantilever beam and a load-bearing structure. The load-bearing structure is arranged on the cantilever beam at an adjustable angle. By driving the probe row to rotate to align with the main gate line of the battery cell, and using the shooting device to obtain offset information, the driving part controls the rotation of the load-bearing structure to achieve accurate alignment.
Ensure reliable crimping between the probe and the main gate line of the battery cell, improving the accuracy and intelligence of the battery cell performance test.
Smart Images
Figure CN223091997U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of test equipment for testing the performance of battery wafers, and particularly to a test device. Background Art
[0002] In the prior art, when testing the performance of battery wafers, since the battery wafers are prone to offset when being transported to the test area, the probes cannot be effectively pressed against the offset battery wafers, seriously affecting the accuracy of the test results. Summary of the Utility Model
[0003] The main purpose of the utility model is to provide a test device to solve the problem that the probes cannot be effectively pressed after the battery wafers in the prior art are offset, resulting in poor accuracy of the test results.
[0004] To achieve the above purpose, the utility model provides a test device for testing the performance of battery wafers. The test device includes a support base, a cantilever beam, and a bearing structure. Among them, the cantilever beam is arranged on the support base; the bearing structure is used to bear the probe row, and the bearing structure is arranged on the cantilever beam with an adjustable angle. The bearing structure drives the probe row to rotate so that each probe of the probe row is aligned with the main grid line of the battery wafer.
[0005] Further, the rotation axis of the bearing structure extends in the vertical direction so that the bearing structure rotates in the horizontal plane.
[0006] Further, the cantilever beam is slidably arranged on the support base in the vertical direction.
[0007] Further, the number of the cantilever beams is two. At least one of the two cantilever beams is slidably arranged on the support base; the number of the bearing structures is two. The two bearing structures are arranged on the corresponding two cantilever beams with adjustable angles, and the two bearing structures are arranged oppositely to form a test area between the two bearing structures; the test device further includes a conveying mechanism, and the conveying mechanism is used to bear the battery wafers to be tested and transport the battery wafers to the test area.
[0008] Further, the conveying mechanism includes a rotating body and a support arm. Among them, the rotating body is rotatably arranged; the first end of the support arm is connected to the rotating body, and the second end of the support arm has a suction cup structure. The rotating body rotates and drives the suction cup structure to rotate into and out of the test area through the support arm.
[0009] Furthermore, the testing device further includes a photographing device, a processor, and a driving unit. Among them, the photographing device is arranged on the support base and above the bearing structure. The photographing device is used to photograph and obtain the offset information between the actual position and the preset position of the battery cell; the processor is in signal connection with the photographing device, and the processor is used to define the rotation angle of the bearing structure according to the offset information; the driving unit is in signal connection with the processor, and the driving unit is drivingly connected to the bearing structure. The driving unit is used to control the bearing structure to rotate by the rotation angle defined by the processor.
[0010] Furthermore, the driving unit includes a driving motor, a first bevel gear structure, and a second bevel gear structure. Among them, the driving shaft of the driving motor extends horizontally; the driving shaft is drivingly connected to the first bevel gear structure; the second bevel gear structure is meshed and cooperated with the first bevel gear structure, and the second bevel gear structure is drivingly connected to the bearing structure through a vertically arranged transmission shaft (631).
[0011] Furthermore, the driving unit drives the bearing structure to rotate to the preset position along a first direction, and the driving unit can also drive the bearing structure to rotate to the initial position along a second direction opposite to the first direction.
[0012] Furthermore, the bearing structure includes a rotating disk body and a fixture structure. Among them, the rotating disk body is arranged on the cantilever beam with adjustable angle; the fixture structure is arranged on the rotating disk body, and the fixture structure is used to carry the probe row.
[0013] Furthermore, the rotating disk body is detachably connected to the fixture structure.
[0014] Furthermore, the fixture structure has a first guiding chute, and at the position of the bearing structure opposite to the first guiding chute, there is a first limiting protrusion. The bearing structure is detachably connected to the fixture structure through the cooperation of the first limiting protrusion and the first guiding chute; or, the bearing structure has a second guiding chute, and at the position of the fixture structure opposite to the second guiding chute, there is a second limiting protrusion. The bearing structure is detachably connected to the fixture structure through the cooperation of the second guiding chute and the second limiting protrusion.
[0015] Applying the technical solution of the present utility model, by arranging the bearing structure on the cantilever beam with adjustable angle, in this way, before performing the performance test on the battery cell, for the battery cell with offset, the probe row is driven by the bearing structure to rotate a preset angle, so that each probe of the probe row is aligned with the main grid line of the battery cell, ensuring the crimping reliability between each probe and the main grid line of the battery cell, and thus ensuring the accuracy of the subsequent performance test of the battery cell. Description of the Drawings
[0016] The accompanying drawings forming a part of this application are used to provide a further understanding of the present utility model. The schematic embodiments and descriptions thereof of the present utility model are used to explain the present utility model and do not constitute an improper limitation to the present utility model. In the drawings:
[0017] Figure 1 A partial structural schematic diagram of a test device according to an alternative embodiment of the present utility model is shown;
[0018] Figure 2 Shows Figure 1 A structural schematic diagram of the conveying mechanism of the test device in
[0019] Figure 3 Shows Figure 1 A structural schematic diagram of two carrying structures of the test device in
[0020] Figure 4 A structural schematic diagram showing the driving part of the test device drivingly connected to the carrying structure according to an alternative embodiment of the present utility model.
[0021] Among them, the above-mentioned drawings include the following reference numerals:
[0022] 10, support base;
[0023] 20, cantilever beam;
[0024] 30, carrying structure; 31, rotating disk body; 32, fixture structure; 321, first guiding chute;
[0025] 40, probe row; 41, probe;
[0026] 50, conveying mechanism; 51, suction cup structure; 52, rotating body; 53, support arm;
[0027] 60, driving part; 61, driving motor; 611, driving shaft; 62, first bevel gear structure; 63, second bevel gear structure; 631, transmission shaft;
[0028] 100, test area. Detailed implementation manners
[0029] Next, the technical solutions in the embodiments of the present utility model will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present utility model. Obviously, the described embodiments are only a part of the embodiments of the present utility model, rather than all the embodiments. The following description of at least one exemplary embodiment is actually only illustrative and in no way limits the present utility model and its application or use. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present utility model without creative efforts belong to the scope of protection of the present utility model.
[0030] In order to solve the problem that the probe cannot be effectively pressed after the battery chip in the prior art is offset, resulting in poor accuracy of the test results, the present utility model provides a test device.
[0031] As Figures 1 to 4 shown, the test device is used for performing performance tests on battery chips. The test device includes a support base 10, a cantilever beam 20, and a bearing structure 30. Among them, the cantilever beam 20 is arranged on the support base 10; the bearing structure 30 is used for bearing a probe row 40, and the bearing structure 30 is arranged on the cantilever beam 20 in an angle-adjustable manner. The bearing structure 30 drives the probe row 40 to rotate so that each probe 41 of the probe row 40 is aligned with the main grid line of the battery chip.
[0032] Applying the technical solution of the present utility model, by arranging the bearing structure 30 on the cantilever beam 20 in an angle-adjustable manner, in this way, before performing performance tests on the battery chip, for the offset battery chip, the bearing structure 30 drives the probe row 40 to rotate, so that each probe of the probe row 40 is aligned with the main grid line of the battery chip, ensuring the crimping reliability between each probe and the main grid line of the battery chip, and thus ensuring the accuracy of the subsequent performance tests of the battery chip.
[0033] It should be noted that in the present application, considering that the battery chip is prone to offset in the horizontal plane when placed, preferably, the rotation axis of the bearing structure 30 extends in the vertical direction so that the bearing structure 30 rotates in the horizontal plane. In this way, it is ensured that the bearing structure 30 generates a corresponding offset in the horizontal plane for the offset of the battery chip.
[0034] It should be noted that in the present application, the test device further includes a photographing device, a processor, and a driving part 60. Among them, the photographing device is arranged on the support base 10 and is located above the bearing structure 30. The photographing device is used for photographing the actual position of the battery chip. The processor is used for determining the rotation angle of the bearing structure 30 according to the offset information between the actual position and the preset position of the battery chip; the driving part 60 is in signal connection with the processor, and the driving part 60 is in driving connection with the bearing structure 30. The driving part 60 is used for controlling the bearing structure 30 to rotate by the rotation angle according to the rotation angle. In this way, the degree of intelligence of the test device is greatly improved.
[0035] It should be noted that in a preferred embodiment of the present application, the "angle-adjustable of the bearing structure 30" in the above-mentioned "the bearing structure 30 is arranged on the cantilever beam 20 in an angle-adjustable manner" is realized by the driving of the driving part 60.
[0036] As Figure 4As shown, the driving part 60 includes a driving motor 61, a first bevel gear structure 62 and a second bevel gear structure 63. Among them, the driving shaft 611 of the driving motor 61 extends horizontally; the driving shaft 611 is drivingly connected to the first bevel gear structure 62; the second bevel gear structure 63 is meshed and cooperated with the first bevel gear structure 62, and the second bevel gear structure 63 is drivingly connected to the bearing structure 30 through a vertically arranged transmission shaft 631.
[0037] Further, the driving part 60 drives the bearing structure 30 to rotate to a preset position along a first direction, and the driving part 60 can also drive the bearing structure 30 to rotate to an initial position along a second direction opposite to the first direction.
[0038] It should be noted that the above-mentioned first direction can be Figure 4 clockwise (counterclockwise) rotation in Figure 4 and the above-mentioned second direction can be
[0039] counterclockwise (clockwise) rotation in
[0040] It should be noted that in the present application, the cantilever beam 20 is slidably arranged on the support base 10 in the vertical direction.
[0041] As Figure 1 shown, the number of the cantilever beams 20 is two, and at least one of the two cantilever beams 20 is slidably arranged on the support base 10; the number of the bearing structures 30 is two, and the angles of the two bearing structures 30 are both adjustably arranged on the corresponding two cantilever beams 20, and the two bearing structures 30 are arranged oppositely to form a test area 100 between the two bearing structures 30; the testing device further includes a conveying mechanism 50, and the conveying mechanism 50 is used for transporting the battery cells to the test area 100. As a possible situation, the conveying mechanism 50 has a suction cup structure 51, and the suction cup structure 51 is used for carrying and adsorbing the battery cells to be tested and transporting the battery cells to the test area 100.
[0042] It can be understood that by the structural form of slidably arranging at least one of the two cantilever beams 20 on the support base 10, it is convenient to adjust the spatial size of the test area 100 formed between the two in the vertical direction.
[0043] As Figure 2As shown, the conveying mechanism 50 includes a rotating body 52 and a support arm 53. Among them, the rotating body 52 is rotatably arranged; the first end of the support arm 53 is connected to the rotating body 52, and the second end of the support arm 53 has a suction cup structure 51. The rotating body 52 rotates and drives the suction cup structure 51 to rotate into and out of the test area 100 through the support arm 53. In this way, while ensuring that the overall structure of the conveying mechanism 50 is simple and compact, it can also ensure the conveying reliability of the conveying mechanism 50 for the battery wafers.
[0044] As Figure 3 shown, the carrying structure 30 includes a rotating disk body 31 and a fixture structure 32. Among them, the rotating disk body 31 is arranged on the cantilever beam 20 with adjustable angle; the fixture structure 32 is arranged on the rotating disk body 31, and the fixture structure 32 is used to carry the probe row 40. In this way, by setting the carrying structure 30 into a structural form including a rotating disk body 31 and a fixture structure 32, while ensuring the connection reliability between the rotating disk body 31 and the cantilever beam 20, it can also ensure the rotation reliability of the rotating disk body 31 relative to the cantilever beam 20, and the setting of the fixture structure 32 ensures the installation reliability of the probe row 40.
[0045] As a possible way, the rotating disk body 31 is detachably connected to the fixture structure 32. In this way, it ensures the installation and disassembly reliability between the rotating disk body 31 and the fixture structure 32.
[0046] As Figure 1 shown, the fixture structure 32 has a first guiding chute 321, and the carrying structure 30 has a first limiting protrusion at a position opposite to the first guiding chute 321. The carrying structure 30 is detachably connected to the fixture structure 32 through the cooperation of the first limiting protrusion and the first guiding chute 321. In this way, while ensuring the assembly convenience between the carrying structure 30 and the fixture structure 32, it ensures the assembly stability between the two.
[0047] As a possible way, in an embodiment not shown in the present application, the carrying structure 30 has a second guiding chute, and the fixture structure 32 has a second limiting protrusion at a position opposite to the second guiding chute. The carrying structure 30 is detachably connected to the fixture structure 32 through the cooperation of the second guiding chute and the second limiting protrusion. In this way, while ensuring the assembly convenience between the carrying structure 30 and the fixture structure 32, it ensures the assembly stability between the two.
[0048] It should be noted that the terms used herein are only for describing specific embodiments and are not intended to limit the exemplary embodiments according to the present application. As used herein, unless the context clearly indicates otherwise, the singular form is also intended to include the plural form. In addition, it should be understood that when the terms "comprise" and / or "include" are used in this specification, they specify the presence of features, steps, operations, devices, components, and / or combinations thereof.
[0049] Unless otherwise specifically stated, the relative arrangements of components and steps, numerical expressions, and numerical values set forth in these embodiments do not limit the scope of the present invention. At the same time, it should be understood that, for the sake of convenience of description, the dimensions of the various parts shown in the drawings are not drawn in actual proportional relationships. Technologies, methods, and devices known to those of ordinary skill in the relevant art may not be discussed in detail, but where appropriate, the said technologies, methods, and devices should be regarded as part of the authorized specification. In all the examples shown and discussed here, any specific value should be construed as merely exemplary and not as a limitation. Therefore, other examples of the exemplary embodiments may have different values. It should be noted that like reference numerals and letters denote like items in the following drawings, and thus, once an item is defined in one drawing, it does not need to be further discussed in subsequent drawings.
[0050] For the sake of convenience of description, spatial relative terms such as "above", "on top of", "on the upper surface", "above" can be used herein to describe the spatial positional relationship of one device or feature shown in the figure with other devices or features. It should be understood that the spatial relative terms are intended to encompass different orientations in use or operation in addition to the orientation depicted in the figure for the device. For example, if the device in the figure is inverted, the device described as "above" or "on top of" other devices or structures will then be positioned "below" or "beneath" other devices or structures. Thus, the exemplary term "above" can include both the orientations of "above" and "below". The device can also be positioned in other different ways (rotated 90 degrees or in other orientations), and corresponding interpretations should be made for the spatial relative descriptions used herein.
[0051] It should be noted that the terms used herein are only for describing specific embodiments and are not intended to limit the exemplary embodiments according to the present application. As used herein, unless the context clearly indicates otherwise, the singular form is also intended to include the plural form. In addition, it should be understood that when the terms "comprise" and / or "include" are used in this specification, they specify the presence of features, steps, operations, devices, components, and / or combinations thereof.
[0052] It should be noted that the terms "first", "second", etc. in the description, claims and above-mentioned drawings of this application are used to distinguish similar objects, and do not necessarily have to be used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged under appropriate circumstances, so that the embodiments of the present application described here can be implemented in an order other than those illustrated or described here.
[0053] The above are only the preferred embodiments of the present utility model, and are not used to limit the present utility model. For those skilled in the art, the present utility model can have various changes and modifications. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present utility model shall be included within the protection scope of the present utility model.
Claims
1. A testing device, characterized in that, For performing performance tests on solar cells, the test device includes: A support base (10); A cantilever beam (20), which is arranged on the support base (10); A carrying structure (30) for carrying a probe row (40), the carrying structure (30) is arranged on the cantilever beam (20) with an adjustable angle, and the carrying structure (30) drives the probe row (40) to rotate so that each probe (41) of the probe row (40) is aligned with the main grid line of the solar cell.
2. The test device according to claim 1, wherein, The rotation axis of the carrying structure (30) extends in the vertical direction so that the carrying structure (30) rotates in the horizontal plane.
3. The test device according to claim 1, characterized in that, The cantilever beam (20) is slidably arranged on the support base (10) in the vertical direction.
4. The test device according to claim 1, characterized in that The number of the cantilever beams (20) is two, and at least one of the two cantilever beams (20) is slidably arranged on the support base (10); The number of the carrying structures (30) is two, and the two carrying structures (30) are both arranged on the corresponding two cantilever beams (20) with adjustable angles, and the two carrying structures (30) are arranged oppositely to form a test area (100) between the two carrying structures (30); The test device further includes: A conveying mechanism (50) for carrying the solar cell to be tested and transporting the solar cell to the test area (100).
5. The test device according to claim 4, characterized in that, The conveying mechanism (50) includes: A rotating body (52) which is rotatably arranged; A support arm (53), the first end of the support arm (53) is connected to the rotating body (52), and the second end of the support arm (53) has a suction cup structure (51), and the rotating body (52) rotates and drives the suction cup structure (51) to rotate into and out of the test area (100) through the support arm (53).
6. The test device according to claim 1, wherein The test device further includes: A photographing device which is arranged on the support base (10) and above the carrying structure (30), and the photographing device is used for photographing and obtaining the offset information between the actual position and the preset position of the solar cell; A processor, which is signal-connected to the photographing device, and the processor is used for defining the rotation angle of the carrying structure (30) according to the offset information; A driving part (60), the driving part (60) is signal-connected to the processor, and the driving part (60) is drivingly connected to the carrying structure (30), and the driving part (60) is used for controlling the carrying structure (30) to rotate by the rotation angle defined by the processor according to the rotation angle.
7. The testing device according to claim 6, wherein, The driving part (60) includes: A driving motor (61), and the driving shaft (611) of the driving motor (61) extends in the horizontal direction; A first bevel gear structure (62), and the driving shaft (611) is drivingly connected to the first bevel gear structure (62); Second bevel gear structure (63), the second bevel gear structure (63) is meshed and cooperated with the first bevel gear structure (62), and the second bevel gear structure (63) is drivingly connected to the bearing structure (30) through a vertically arranged transmission shaft (631).
8. The test device according to claim 6, wherein, The driving part (60) drives the bearing structure (30) to rotate to a preset position along a first direction, and the driving part (60) can also drive the bearing structure (30) to rotate to an initial position along a second direction opposite to the first direction.
9. The test device according to claim 1, wherein The bearing structure (30) includes:[[]] A rotating disk body (31), the rotating disk body (31) is arranged on the cantilever beam (20) with an adjustable angle; A jig structure (32), the jig structure (32) is arranged on the rotating disk body (31), and the jig structure (32) is used for carrying the probe row (40).
10. The testing device according to claim 9, wherein The rotating disk body (31) is detachably connected to the jig structure (32).
11. The testing device according to claim 9, wherein The jig structure (32) has a first guiding chute (321), and a first limiting protrusion is provided at a position of the bearing structure (30) opposite to the first guiding chute (321). The bearing structure (30) is detachably connected to the jig structure (32) through the cooperation of the first limiting protrusion and the first guiding chute (321); or, The bearing structure (30) has a second guiding chute, and a second limiting protrusion is provided at a position of the jig structure (32) opposite to the second guiding chute. The bearing structure (30) is detachably connected to the jig structure (32) through the cooperation of the second guiding chute and the second limiting protrusion.