Connecting structure for aging test

Abstract

The utility model discloses a connecting structure for aging test, which comprises a test device and a test frame, the test device comprises a test board, a first display module and a second display module, a golden finger layer is extended, so that the display modules connected with the golden finger layer are multiplied, and the service life of the test board is prolonged. According to the technical scheme, the test board which can lighten one display module originally can lighten two display modules, so that the aging test efficiency is improved, the resources of the test board and the test frame are saved, and the aging test cost is reduced.

Description

Technical Field

[0001] The utility model relates to the field of industrial products, and particularly to a connection structure for aging test. Background Art

[0002] In order to verify and ensure that the functionality of the product meets the test requirements such as high temperature and high humidity, reliability tests or aging tests must be carried out on the display module in the early stage of the project. For the aging test of the display module, the display module must be lit, and this process requires using a gold finger to connect the display module. The existing gold finger position can only connect one display module, resulting in low efficiency of the aging test and relatively serious waste of resources. Summary of the Utility Model

[0003] The purpose of the utility model is to overcome the deficiencies in the prior art and provide a connection structure for aging test.

[0004] The purpose of the utility model is achieved by the following technical solutions:

[0005] A connection structure for aging test, comprising: a test device, the test device includes: a test board, a first display module and a second display module, the test board includes a gold finger layer, a first connection area is arranged on the upper surface of one end of the gold finger layer, a gold finger extension is arranged at the other end of the gold finger layer, and a second connection area is arranged on the lower surface of the gold finger layer extension; the first display module includes a first display screen and a first connection board, one end of the first connection board is connected to the first display screen, and the other end of the first connection board is connected to the first connection area; the second display module includes a second display screen and a second connection board, one end of the second connection board is connected to the second display screen, and the other end of the second connection board is connected to the second connection area.

[0006] In one embodiment, the first connection board and the second connection board are flexible printed circuit boards.

[0007] In one embodiment, the first connection board is welded to the first connection area.

[0008] In one embodiment, the second connection board is welded to the second connection area.

[0009] In one embodiment, a plurality of PIN1 pins are arranged on the test board.

[0010] In one embodiment, a plurality of gold fingers are arranged on the gold finger layer, and the gold fingers are arranged relatively neatly.

[0011] In one embodiment, it further includes a test rack, on which several test areas are provided. The test areas are arranged relatively parallel, and the test device is disposed on the test areas.

[0012] In one embodiment, several punching holes are provided on the test rack.

[0013] In one embodiment, it is characterized in that several positioning holes are provided on the test rack.

[0014] In one embodiment, a power input port is provided at one end of the test rack.

[0015] Compared with the prior art, the present utility model has at least the following advantages:

[0016] By extending the gold finger layer, the connection structure for aging test of the present utility model doubles the display modules connected by the gold finger layer. The test board that could originally light one display module can now light two display modules, improving the efficiency of aging test, thus saving resources of the test board and the test rack and reducing the cost of aging test. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the technical solutions of the embodiments of the present utility model, the drawings required for use in the embodiments will be briefly introduced below.

[0018] Figure 1 Schematic diagram of a connection structure for aging test in an embodiment of the present utility model;

[0019] Figure 2 For Figure 1 Schematic diagram of a test device of a connection structure for aging test in DETAILED DESCRIPTION OF THE EMBODIMENTS

[0020] To facilitate the understanding of the present utility model, the present utility model will be described more comprehensively below with reference to the relevant drawings.

[0021] Please refer to Figure 1 and Figure 2, A connection structure 10 for aging test, comprising: a test device 100, the test device 100 includes: a test board 110, a first display module 120 and a second display module 130, the test board 110 includes a gold finger layer 111, one end upper surface of the gold finger layer 111 is provided with a first connection area 111a, the other end of the gold finger layer 111 is provided with a gold finger extension 111b, and the lower surface of the gold finger layer extension 111b is provided with a second connection area 111c; the first display module 120 includes a first display screen 121 and a first connection board 122, one end of the first connection board 122 is connected to the first display screen 121, and the other end of the first connection board 122 is connected to the first connection area 111a; the second display module 130 includes a second display screen 131 and a second connection board 132, one end of the second connection board 132 is connected to the second display screen 131, and the other end of the second connection board 132 is connected to the second connection area 111c.

[0022] It should be noted that by extending the gold finger layer 111, the first display module 120 and the second display module 130 can be connected to the test board 110 for aging test. Thus, the number of display modules connected to the test board 110 is doubled, improving the test efficiency; because this connection structure is limited by space, when the second display module 130 is connected to the test board 110, the display surface needs to face down. However, since the display module and the test board 110 are electrically connected, it does not affect the normal result of the aging test. After the aging test is completed, only the second display module 130 needs to be folded over to confirm the display result.

[0023] Please refer to Figure 2 , In an embodiment, the first connection board 122 and the second connection board 132 are flexible circuit boards, which reduces the space limitation when the first display module 120 and the second display module 130 are connected to the test board 110. At the same time, it facilitates the folding process when the second module confirms the display result later.

[0024] Preferably, the first connection board 122 is welded to the first connection area 111a, and the second connection board 132 is welded to the second connection area 111c. This setting can make the connection between the display module and the test board 110 more stable, preventing it from falling off due to factors such as movement during the aging test.

[0025] Please refer to again Figure 2 , In an embodiment, a plurality of PIN1 pins 112 are provided on the test board 110. The PIN1 pins 112 are used as voltage input terminals, supporting a DC voltage input of 5V to 80V, and are used to eliminate noise interference at the input end in this embodiment.

[0026] Preferably, a plurality of gold fingers are provided on the gold finger layer 111, and the gold fingers are arranged relatively neatly. This setting further enables the display module to be stably connected to the test board 110, and is more conducive to the display module being lit by the test board 110 during the aging test. In this embodiment, the gold fingers are gold-plated columns welded to the test board.

[0027] Please refer to again Figure 2 , in one embodiment, it further includes a test rack 200. A plurality of test areas 210 are provided on the test rack 200, and the test areas 210 are arranged relatively parallel. The test device 100 is arranged on the test areas 210, so that one test rack 200 can satisfy multiple display modules to complete the aging test, improving the efficiency of the aging test. At the same time, the test rack 200 is fully utilized, avoiding waste of resources.

[0028] Please refer to Figure 1 , in one embodiment, a plurality of punching holes 220 and a plurality of positioning holes 230 are provided on the test rack 200. During the process of installing the test rack 200 to the customer's whole machine, the positioning holes 230 are used to complete the positioning of the test rack 200, and the punching holes 220 are used to complete the fixing of the test rack 200. In this embodiment, machine vision recognition automatic assembly is adopted.

[0029] Please refer to again Figure 1 , in one embodiment, a power input port 240 is provided at one end of the test rack 200. In this embodiment, by welding the plug into the power input port 240, the power input port not only provides power to the test rack 200 but also has a fixing function.

[0030] The above embodiments only represent several implementation manners of the present invention, and the description thereof is relatively specific and detailed, but it should not be construed as a limitation to the scope of the utility model patent. It should be noted that for those of ordinary skill in the art, without departing from the concept of the present invention, several deformations and improvements can still be made, and these all belong to the protection scope of the present invention. Therefore, the protection scope of the utility model patent shall be subject to the appended claims.

Claims

1. A connection structure for aging test, characterized in that, Comprising: A testing device, the testing device comprising: A test board, the test board comprising a gold finger layer, a first connection area is provided on the upper surface of one end of the gold finger layer, a gold finger extension is provided at the other end of the gold finger layer, and a second connection area is provided on the lower surface of the gold finger layer extension; A first display module, the first display module comprising a first display screen and a first connection board, one end of the first connection board is connected to the first display screen, and the other end of the first connection board is connected to the first connection area; and A second display module, the second display module comprising a second display screen and a second connection board, one end of the second connection board is connected to the second display screen, and the other end of the second connection board is connected to the second connection area.

2. The connection structure for aging test according to claim 1, characterized in that, The first connection board and the second connection board are flexible printed circuit boards.

3. The connection structure for aging test according to claim 1, wherein The first connection board is welded to the first connection area.

4. The connection structure for aging test according to claim 1, wherein The second connection board is welded to the second connection area.

5. A connection structure for aging test according to claim 1, characterized in that, A number of PIN1 pins are provided on the test board.

6. The connection structure for aging test according to claim 1, wherein, A number of gold fingers are provided on the gold finger layer, and the gold fingers are arranged relatively neatly.

7. The connection structure for aging test according to claim 1, characterized in that, It further comprises a test rack, a number of test areas are provided on the test rack, the test areas are arranged relatively parallel, and the testing device is arranged on the test areas.

8. A connection structure for aging test according to claim 7, characterized in that A number of punching holes are provided on the test rack.

9. The connection structure for aging test according to claim 7, wherein A number of positioning holes are provided on the test rack.

10. The connection structure for aging test according to claim 7, characterized in that A power input port is provided at one end of the test rack.

Images