Quick detection structure of wearable product

By setting the detection glass and quick inspection structure before cutting the display screen of the wearable product, the rapid detection of the display screen is achieved, and the problem of troublesome repair operation after binding the driver IC and FPC is solved, reducing losses.

CN223092551UActive Publication Date: 2025-07-11TRULY OPTO ELECTRONICS
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Patent Information

Application Number
CN202422101808.0
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-08-28
Publication Date
2025-07-11
Estimated Expiration
2034-08-28

AI Technical Summary

Technical Problem

Existing wearable products are troublesome to repair after binding the driver IC and FPC, resulting in unnecessary losses.

Method used

Cut out the detection glass before cutting the display screen, and set up the detection components on it. Connect the driver IC through the quick detection pilot and quick inspection lines to achieve rapid detection of the display screen, and bind the FPC after the secondary cutting.

Benefits of technology

Reduce unnecessary losses, and ensure that the display is normal through rapid detection and then perform secondary cutting and FPC binding.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model discloses a fast detection structure of a wearable product, comprising a display screen, the periphery of the display screen is provided with detection glass, the detection glass is provided with a detection assembly used for testing the display screen, the display screen is bound with a driving IC, the driving IC is connected with an internal circuit of the display screen, and the driving IC is connected with the internal circuit of the display screen. The driving IC is connected with the detection assembly, and the detection assembly is used for controlling an input signal to the driving IC so as to test whether a display picture of the display screen is normal or not. The quick detection structure has the effects that quick detection is carried out when the display screen is manufactured so as to test whether a display picture of the display screen is normal or not, and unnecessary loss is reduced.
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Description

Technical Field

[0001] The utility model relates to the technical field of wearable products, in particular to a quick inspection structure for wearable products. Background Art

[0002] At present, intelligence is becoming more and more common. With the development of technology, intelligence can be seen everywhere in people's lives. Smart wearable products have been very popular in recent years. There are various styles of smart watches and bracelets, which are not only used as watch sports equipment but also have a certain accessory function. Wearable products include a display screen, on which a driving IC and an FPC are bound. The driving IC is connected to the FPC, and the FPC is connected to the customer host. The customer host outputs a corresponding display signal to the FPC, and the FPC transmits it to the driving IC and then to the display screen through the driving IC for display.

[0003] Before leaving the factory, wearable products need to be functionally tested to detect whether the products can display images normally. If there are problems in the test, the wearable products need to be repaired. It is rather troublesome to perform repair operations after the driving IC and the FPC are bound to the wearable products. It is necessary to confirm the problems of the display screen, the driving IC, and the FPC, thus causing certain losses. Summary of the Utility Model

[0004] The purpose of the utility model is to overcome the deficiencies in the prior art and provide a quick inspection structure for wearable products.

[0005] The purpose of the utility model is achieved by the following technical solutions:

[0006] A quick inspection structure for wearable products includes: a display screen, a detection glass is arranged on the periphery of the display screen, a detection component for testing the display screen is arranged on the detection glass, a driving IC is bound on the display screen, the driving IC is connected to the internal circuit of the display screen, the driving IC is connected to the detection component, and the detection component is used to control the input signal to the driving IC to test whether the display image of the display screen is normal.

[0007] In one embodiment, a binding area is arranged near the lower edge of the display screen, the driving IC is bound in the binding area, and the detection component is located at a position on the detection glass close to the binding area.

[0008] In one embodiment, the detection component includes a quick detection point and a quick detection line, and the quick detection line connects the quick detection point and the driving IC.

[0009] In one embodiment, there are multiple quick-detection pilot points, and the multiple quick-detection pilot points are evenly distributed in the area of the detection glass close to the bonding area. The number of quick-inspection lines is adapted to the number of quick-detection pilot points, and the multiple quick-inspection lines connect the multiple quick-detection pilot points and the driving IC.

[0010] In one embodiment, multiple IC pins are arranged on the driving IC, and the multiple quick-inspection lines connect the multiple quick-detection pilot points to the multiple IC pins respectively.

[0011] In one embodiment, a detection fixture is arranged at one end of the quick-detection pilot point far from the driving IC. The detection fixture is used to connect to the multiple quick-detection pilot points and output corresponding detection voltages to the multiple quick-detection pilot points.

[0012] In one embodiment, a cutting line is arranged between the display screen and the detection glass. The cutting line is arranged along the outer shape of the display screen and is used to facilitate secondary cutting.

[0013] In one embodiment, a TFT switch for controlling conduction is arranged between the driving IC and the multiple quick-inspection lines. The TFT switch is connected to the multiple quick-inspection lines and is used to be set to the off state after the secondary cutting of the display screen.

[0014] In one embodiment, an FPC bonding position is arranged in the bonding area and is used to bond the FPC after secondary cutting.

[0015] In one embodiment, when performing the first cutting, multiple detection glasses form a group, and the detection glasses in a group are connected into one piece for testing.

[0016] Compared with the prior art, the present utility model has at least the following advantages:

[0017] The quick-inspection structure of a wearable product of the present utility model cuts out the detection glass before cutting the display screen and performs a quick-inspection test on the display screen to quickly detect whether the display picture of the display screen is normal. After passing the detection, it is then secondarily cut to form the display screen and the FPC is bonded, so as to reduce unnecessary losses. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the technical solutions of the embodiments of the present utility model, the drawings required for use in the embodiments will be briefly introduced below.

[0019] Figure 1 It is a schematic structural diagram of a quick-inspection structure of a wearable product provided by the present utility model;

[0020] Figure 2Schematic diagram of the structure of the display screen in the quick inspection structure of a wearable product provided by the present utility model.

[0021] Description of the drawings: 10. Display screen; 11. Binding area; 111. FPC binding position; 20. Detection glass; 30. Driving IC; 31. IC pin; 40. Quick detection point; 50. Quick inspection line; 60. Cutting line; 70. TFT switch. Detailed implementation manners

[0022] To facilitate the understanding of the present utility model, the present utility model will be described more comprehensively below with reference to the relevant drawings.

[0023] A quick inspection structure of a wearable product, referring to Figure 1 , includes a display screen 10. A detection glass 20 is arranged on the periphery of the display screen 10. During the production process of the display screen 10, the large glass plate needs to be cut, and the number of cuts is determined according to actual needs. In this embodiment, the first cut is along the periphery of the detection glass 20. After the display screen 10 is tested, the second cut is performed, and the second cut is along the outer shape of the display screen 10.

[0024] Further, referring to Figure 1 , the detection glass 20 is arranged in a rectangular shape and is arranged on the periphery of the display screen 10. A detection component for testing the display screen 10 is arranged on the detection glass 20.

[0025] Referring to Figure 1 , a driving IC 30 is bound on the display screen 10. The driving IC 30 is connected to the internal circuit of the display screen 10 and is used to receive external signals to control the display screen 10 to display images. The driving IC 30 is connected to the detection component so that the detection component can test whether the display screen 10 displays images normally by controlling the input signal to the driving IC 30.

[0026] Referring to Figure 1 and Figure 2 , a binding area 11 is arranged near the lower edge of the display screen 10. The driving IC 30 is bound in the binding area 11. The detection component is located at the position of the detection glass 20 near the binding area 11. The detection component includes a quick detection point 40 and a quick inspection line 50 connecting the quick detection point 40 and the driving IC 30. There are multiple quick detection points 40, and the multiple quick detection points 40 are evenly distributed in the area of the detection glass 20 near the binding area 11. The number of quick inspection lines 50 is adapted to the number of quick detection points 40, and the multiple quick inspection lines 50 connect the multiple quick detection points 40 and the driving IC 30.

[0027] Further, referring to Figure 1 and Figure 2, there are multiple IC pins 31 provided on the driving IC 30, and the multiple IC pins 31 are all necessary connection lines in the driving IC 30. Multiple quick inspection lines 50 connect multiple quick inspection points 40 to the multiple IC pins 31 respectively, so as to realize the line conduction between the quick inspection points 40 and the driving IC 30, input corresponding detection signals to the driving IC 30, and test the display screen of the display screen 10.

[0028] Refer to Figure 1 , a detection jig is provided at one end of the quick inspection point 40 away from the driving IC 30. The detection jig is not shown in the figure. The detection jig is used to connect to the multiple quick inspection points 40 and output corresponding detection voltages to the multiple quick inspection points 40, so as to detect whether the display screen of the display screen 10 is normal, thereby realizing the quick test of the display screen of the display screen 10 and facilitating maintenance when there are problems in the test.

[0029] Furthermore, refer to Figure 1 , a cutting line 60 is provided between the display screen 10 and the detection glass 20. The cutting line 60 is arranged along the outer shape of the display screen 10 and is used to facilitate cutting during secondary cutting.

[0030] Refer to Figure 1 and Figure 2 , a TFT switch 70 for controlling the conduction switch is provided between the driving IC 30 and the multiple quick inspection lines 50. The TFT switch 70 is connected to the multiple quick inspection lines 50, and the TFT switch 70 can control the switches of the multiple quick inspection lines 50. After secondary cutting, the wire ends of the multiple quick inspection lines 50 will be exposed outside, resulting in the failure of the static electricity test of the display screen 10 or the static electricity will damage the display screen 10. Therefore, the TFT switch 70 is set to a permanently closed state after the display screen 10 passes the test and undergoes secondary cutting, so that static electricity cannot enter the internal circuit of the product from the quick inspection lines 50, protecting the internal circuit and improving the anti-static ability of the product.

[0031] Furthermore, refer to Figure 1 and Figure 2 , an FPC binding position 111 is provided in the binding area 11. The FPC binding position 111 is used to bind the FPC on the display screen 10. The FPC is bound after the display screen 10 is tested and undergoes secondary cutting, so as to avoid the loss of the FPC when the display screen 10 fails the test.

[0032] Refer to Figure 1 , in order to facilitate the quick inspection test, after the first cutting, five detection glasses 20 are taken as a group, and a group of detection glasses 20 are connected into one piece for unified testing, so as to quickly detect the display screen 10.

[0033] The quick inspection structure cuts out the inspection glass 20 before cutting the product and conducts a quick inspection test on the display screen 10 to quickly detect whether the display screen 10 has a normal display picture. After passing the inspection, the display screen 10 is cut again and the FPC is bonded to reduce unnecessary losses.

[0034] The above-described embodiments merely represent several implementation manners of the present utility model. The description is relatively specific and detailed, but it should not be construed as a limitation on the scope of the utility model patent. It should be noted that for those of ordinary skill in the art, without departing from the concept of the present utility model, several modifications and improvements can still be made, and these all belong to the protection scope of the present utility model. Therefore, the protection scope of the present utility model patent shall be subject to the appended claims.

Claims

1. A quick inspection structure for a wearable product, characterized in that, Comprising: A display screen (10), a detection glass (20) is arranged around the display screen (10), a detection component for testing the display screen (10) is arranged on the detection glass (20), a driving IC (30) is bonded on the display screen (10), the driving IC (30) is connected to the internal circuit of the display screen (10), the driving IC (30) is connected to the detection component, and the detection component is used to control the input signal to the driving IC (30) to test whether the display picture of the display screen (10) is normal.

2. The quick inspection structure of a wearable product according to claim 1, wherein A bonding area (11) is arranged near the lower edge of the display screen (10), the driving IC (30) is bonded in the bonding area (11), and the detection component is located at a position on the detection glass (20) close to the bonding area (11).

3. The quick inspection structure of a wearable product according to claim 2, characterized in that, The detection component includes a fast detection pilot point (40) and a fast detection line (50), and the fast detection line (50) connects the fast detection pilot point (40) and the driving IC (30).

4. The quick inspection structure of a wearable product according to claim 3, characterized in that, There are multiple fast detection pilot points (40), and the multiple fast detection pilot points (40) are evenly distributed in the area of the detection glass (20) close to the bonding area (11). The number of the fast detection lines (50) is adapted to the number of the fast detection pilot points (40), and the multiple fast detection lines (50) connect the multiple fast detection pilot points (40) and the driving IC (30).

5. The quick inspection structure of a wearable product according to claim 4, characterized in that, Multiple IC pins (31) are arranged on the driving IC (30), and the multiple fast detection lines (50) connect the multiple fast detection pilot points (40) to the multiple IC pins (31) respectively.

6. The quick inspection structure of a wearable product according to claim 5, wherein A detection jig is arranged at one end of the fast detection pilot point (40) far from the driving IC (30), and the detection jig is used to connect to the multiple fast detection pilot points (40) and output corresponding detection voltages to the multiple fast detection pilot points (40).

7. The quick inspection structure of a wearable product according to claim 6, wherein, A cutting line (60) is arranged between the display screen (10) and the detection glass (20), and the cutting line (60) is arranged along the outer shape of the display screen (10), and the cutting line (60) is used to facilitate secondary cutting.

8. The quick inspection structure of a wearable product according to claim 7, characterized in that, A TFT switch (70) for controlling conduction is arranged between the driving IC (30) and the multiple fast detection lines (50), the TFT switch (70) is connected to the multiple fast detection lines (50), and the TFT switch (70) is used to be set to a closed state after the secondary cutting of the display screen (10).

9. The quick inspection structure of a wearable product according to claim 8, characterized in that An FPC bonding position (111) is arranged in the bonding area (11), and the FPC bonding position (111) is used to bond the FPC after secondary cutting.

10. The quick inspection structure of a wearable product according to claim 1, characterized in that, When performing the first cutting, multiple detection glasses (20) are in a group, and a group of detection glasses (20) are connected together for testing.