Production line

Abstract

The utility model discloses a production line. The production line comprises a test subassembly, an encapsulation structure and an encapsulation subassembly, the testing subassembly comprises a sorting rotary table mechanism and an automatic material supplementing mechanism; the sorting rotary table mechanism is arranged on the upstream of the packaging subassembly and used for feeding materials to the packaging structure, the packaging subassembly can enable the packaging structure to move in the first direction, and the automatic material supplementing mechanism is arranged between the sorting rotary table mechanism and the packaging subassembly and used for supplementing materials to the packaging structure. The production line is provided with the automatic material supplementing mechanism, automatic material supplementing can be achieved, and the automation degree and the production efficiency of the production line are improved.

Description

Technical Field

[0001] This application belongs to the technical field of capacitor production, and particularly relates to a production line. Background Art

[0002] A capacitor assembly production line usually has an inspection sub-assembly and a potting sub-assembly. After various tests on the assembled capacitors are qualified, they are potted and encapsulated through the potting sub-assembly to achieve automation of the production process. The potting of capacitors is usually carried out through a potting structure with multiple potting positions. If there are defective products, they need to be detected and replenished in a timely manner to avoid vacancies in the potting positions. However, the existing capacitor assembly production lines usually replenish materials manually, which affects production efficiency. Summary of the Utility Model

[0003] This application aims to provide a production line to solve at least one of the problems in the background art.

[0004] According to the first aspect of this application, a production line is provided, including:

[0005] An inspection sub-assembly, a potting structure, and a potting sub-assembly;

[0006] The inspection sub-assembly includes a sorting turntable mechanism and an automatic feeding mechanism;

[0007] The sorting turntable mechanism is arranged upstream of the potting sub-assembly and is used for feeding materials to the potting structure. The potting sub-assembly can move the potting structure in a first direction. The automatic feeding mechanism is arranged between the sorting turntable mechanism and the potting sub-assembly and is used for feeding materials to the potting structure.

[0008] Optionally, the inspection sub-assembly further includes a vision inspection device, which is used to obtain images of products on the potting structure to identify good products and defective products;

[0009] The vision inspection device is electrically connected to the automatic feeding mechanism so that the automatic feeding mechanism can unload defective products on the potting structure and then feed materials.

[0010] Optionally, the automatic feeding mechanism includes an execution part and a material suction part connected to the execution part. The execution part can drive the material suction part to move for unloading and feeding materials.

[0011] Optionally, the material suction part includes a first suction nozzle and a second suction nozzle. The first suction nozzle is used to suck good products for feeding, and the second suction nozzle is used to suck defective products for unloading.

[0012] Optionally, the test subassembly further includes a buffer turntable, on which a plurality of buffer structures are provided for storing qualified products. The execution unit can drive the material suction unit to move to the buffer turntable to suck materials for replenishing the encapsulation structure.

[0013] Optionally, the sorting turntable mechanism is further configured to feed materials onto the buffer structure.

[0014] Optionally, the test subassembly further includes an angle correction mechanism. The execution unit can also drive the material suction unit to move to the angle correction mechanism to correct the angle of the qualified products.

[0015] Optionally, the execution unit includes a first driving structure, a second driving structure disposed on the first driving structure, and a third driving structure disposed on the second driving structure. The material suction unit is connected to the third driving structure;

[0016] The first driving structure is configured to drive the material suction unit to move along the first direction, the second driving structure is configured to drive the material suction unit to move along the second direction, and the third driving structure is configured to drive the material suction unit to move along the third direction;

[0017] Wherein, the first direction, the second direction, and the third direction intersect pairwise.

[0018] Optionally, the test subassembly further includes a charging mechanism, on which a plurality of charging stations are provided;

[0019] The sorting turntable mechanism includes a sorting turntable and a plurality of material taking parts disposed on the sorting turntable. The material taking parts can rotate with the sorting turntable to reach the charging stations for material taking.

[0020] Optionally, the charging mechanism includes a charging turntable and a handling member;

[0021] The charging turntable is provided with a plurality of first charging stations and a plurality of second charging stations. The radial distance between the first charging station and the center of the charging turntable is greater than the radial distance between the second charging station and the center of the charging turntable;

[0022] The handling member is configured to be able to move between the first charging station and the second charging station, and the material taking part can reach the first charging station and / or the second charging station.

[0023] Optionally, the handling member can also reach a waste discharging station, which is located outside the charging turntable.

[0024] Optionally, the test subassembly further includes a waste discharging mechanism;

[0025] The waste discharging mechanism includes a fourth driving structure, a waste discharging turntable and a discharging structure. A plurality of waste discharging grooves are arranged on the waste discharging turntable, and the waste discharging grooves are located at the waste discharging station to receive waste materials.

[0026] The fourth driving structure can drive the waste discharging turntable to rotate, so that the plurality of waste discharging grooves pass through the discharging structure in sequence to discharge the waste materials in the waste discharging grooves.

[0027] Optionally, it further includes an assembling sub-assembly, and the assembling sub-assembly is used for feeding materials to the testing sub-assembly.

[0028] Optionally, the production line is applied to capacitors, and the assembling sub-assembly includes a pin flattening mechanism, and the pin flattening mechanism is used for flattening the pins of the capacitors.

[0029] Optionally, the pin flattening mechanism includes a fifth driving structure, a flattening structure and a pin centering structure. The flattening structure has two flattening parts, and the two flattening parts are respectively located on both sides of the pin centering structure. The pin centering structure is used for separating the positive and negative pins of the capacitor.

[0030] The fifth driving structure is connected to the flattening structure to drive the two flattening parts to move towards the pin centering structure respectively to flatten the positive and negative pins of the capacitor.

[0031] Optionally, the flattening structure includes an eccentric wheel, a first connecting rod, a second connecting rod, a third connecting rod, a fourth connecting rod, a first swing arm and a second swing arm.

[0032] The first end of the first connecting rod is rotatably connected to the eccentric wheel, the second end of the first connecting rod is rotatably connected to the first end of the second connecting rod, the second end of the second connecting rod is respectively rotatably connected to the first end of the third connecting rod and the first end of the fourth connecting rod, the first end of the first swing arm is rotatably connected to the second end of the third connecting rod, and the first end of the second swing arm is rotatably connected to the second end of the fourth connecting rod.

[0033] The second ends of the first swing arm and the second swing arm are respectively provided with a connecting part and a flattening part, and the two connecting parts are rotatably connected. The fifth driving structure drives the eccentric wheel to rotate, so that the two flattening parts can move relatively or away from each other.

[0034] Optionally, the pin flattening mechanism further includes a guide rail extending from the eccentric wheel to the pin centering structure. The first connecting rod and the second connecting rod are rotatably connected through a rotating shaft, and the rotating shaft can move along the guide rail.

[0035] Optionally, it further includes a sixth driving structure, and the sixth driving structure can drive the pin centering structure to move to avoid the capacitor.

[0036] Optionally, the test assembly further includes a height and capacity detection mechanism, which includes a pressing structure, a detection structure, a height detector, and a capacitance tester;

[0037] The pressing structure is used to press the capacitor onto the detection structure. A probe is provided on the detection structure, and the probe is connected to the capacitance tester to detect the capacitance of the capacitor. The height detector is used to detect the height dimension of the capacitor.

[0038] Optionally, the assembly part further includes a feeding turntable, and a plurality of feeding parts are provided on the feeding turntable. The plurality of feeding parts are used to pick up capacitors and feed them to the test assembly.

[0039] In the embodiment of the present application, by setting up an automatic feeding mechanism, after defective products on the encapsulation structure are detected, materials can be automatically fed to the vacant positions, eliminating the manual feeding process and improving the automation degree and production efficiency of the production line.

[0040] The additional aspects and advantages of the present application will be partly given in the following description, partly will become obvious from the following description, or be understood through the practice of the present application. Description of the Drawings

[0041] The above and / or additional aspects and advantages of the present application will become obvious and easy to understand from the description of the embodiments in conjunction with the following drawings, where:

[0042] Figure 1 is a schematic diagram of the production line provided by the embodiment of the present application;

[0043] Figure 2 is a schematic diagram of the automatic feeding mechanism provided by the embodiment of the present application;

[0044] Figure 3 is a schematic diagram of the discharge and waste removal mechanism provided by the embodiment of the present application;

[0045] Figure 4 is a schematic diagram of the height and capacity detection mechanism provided by the embodiment of the present application;

[0046] Figure 5 is a schematic diagram of the pin flattening mechanism provided by the embodiment of the present application.

[0047] Reference Signs:

[0048] 1. Automatic feeding mechanism; 101. First driving structure; 102. Second driving structure; 103. Third driving structure; 104. Suction part; 105. Buffer turntable;

[0049] 2. Height and Capacity Detection Mechanism; 201. Pressing Structure; 202. Detection Structure; 203. Height Detector

[0050] 3. Sorting Turntable Mechanism; 301. Sorting Turntable; 302. Material Taking Part

[0051] 4. Pin Flattening Mechanism; 401. Eccentric Wheel; 402. First Link; 403. Second Link; 404. Third Link; 405. Fourth Link; 406. First Swing Arm; 4061. Connection Part; 4062. Flattening Part; 407. Second Swing Arm; 408. Rotating Shaft; 409. Pin Centering Structure

[0052] 5. Visual Inspection Device; 6. Angle Correction Mechanism; 7. Charging Turntable

[0053] 8. Waste Discharging Mechanism; 801. Fourth Driving Structure; 802. Waste Discharging Turntable; 803. Discharging Structure; 804. Waste Discharging Groove

[0054] 9. Handling Part; 10. Encapsulation Structure

[0055] 11. Feeding Turntable; 1101. Feeding Part

[0056] 12. Encapsulation Subassembly Detailed Embodiment

[0057] Embodiments of the present application will be described in detail below. Examples of the embodiments are shown in the accompanying drawings, where the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the drawings are exemplary and are only used to explain the present application and should not be construed as a limitation to the present application. All other embodiments obtained by those of ordinary skill in the art based on the embodiments in the present application fall within the scope of protection of the present application.

[0058] The terms "first" and "second" in the description and claims of the present application may explicitly or implicitly include one or more of such features. In the description of the present application, unless otherwise specified, the meaning of "a plurality" is two or more. In addition, "and / or" in the description and claims means at least one of the connected objects, and the character " / " generally means an "or" relationship between the associated objects before and after.

[0059] In the description of the present application, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present application.

[0060] In the description of this application, it should be noted that, unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to specific circumstances.

[0061] Combine the following Figure 1 - Figure 5 A production line according to an embodiment of the present application is described.

[0062] like Figures 1 to 2 As shown, according to the first aspect of the present application, a production line is provided, comprising: a test assembly, an encapsulation structure 10 and an encapsulation assembly 12; the test assembly comprises a sorting turntable mechanism 3 and an automatic feeding mechanism 1; the sorting turntable mechanism 3 is arranged upstream of the encapsulation assembly 12, and is used to feed the encapsulation structure 10, and the encapsulation assembly 12 can make the encapsulation structure 10 move along a first direction ( Figure 2 The automatic feeding mechanism 1 is arranged between the sorting turntable mechanism 3 and the encapsulation device 12, and is used to feed the encapsulation structure 10.

[0063] Specifically, in this embodiment, the encapsulation structure 10 can be used to encapsulate the material loaded on the sorting turntable mechanism 3. For example, when this production line is used for capacitor assembly, the encapsulation structure 10 can be a plurality of encapsulation tapes for placing capacitors to facilitate the storage of the capacitors.

[0064] The sorting turntable mechanism 3 in this embodiment can feed the packaging structure 10 by rotating (refer to Figure 2 The loading position in the packaging structure 10 is then detected by the detection device in turn to see if the product on the packaging structure 10 is a good product (i.e., a qualified product). If it is a defective product, the defective product can be loaded and unloaded from the packaging structure 10, and then the automatic feeding mechanism 1 is used to fill the empty position (reference Figure 2Good products are replenished through the replenishment port) to facilitate the encapsulation of the encapsulation structure 10 for capacitors or other products.

[0065] In the above embodiment, by setting the automatic replenishment mechanism 1, automatic replenishment can be performed after defective products are detected on the encapsulation structure 10, eliminating the manual replenishment process and improving the automation level and production efficiency of the production line.

[0066] Optionally, as Figure 2 shown, the test subassembly further includes a vision inspection device 5. The vision inspection device 5 is used to obtain images of the products on the encapsulation structure 10 to identify good products and defective products; the vision inspection device 5 is electrically connected to the automatic replenishment mechanism 1 so that the automatic replenishment mechanism 1 can replenish materials after discharging the defective products on the encapsulation structure 10.

[0067] Specifically, in this embodiment, the vision inspection device 5 can identify whether there are defects in the appearance or structure of the products on the encapsulation structure 10 by obtaining images of the products on the encapsulation structure 10. For example, it can identify whether the printing on the capacitor is clear, etc. When a defective product is identified, the automatic replenishment mechanism 1 can obtain the information of the defective product, automatically detect and discharge it, and then perform automatic replenishment, realizing the automation of the two processes of discharging defective products and replenishing good products, and further improving the intelligence of the production line.

[0068] Among them, the vision inspection device 5 can be a device such as a camera, which can be set at one place of the encapsulation structure 10. When the encapsulation structure 10 moves in the first direction, the products on the encapsulation structure 10 can pass by the camera in turn to realize photographing and identifying the products on the encapsulation structure 10.

[0069] Optionally, as Figure 2 shown, the automatic replenishment mechanism 1 includes an execution part and a material suction part 104 connected to the execution part. The execution part can drive the material suction part 104 to move for discharging and replenishing materials.

[0070] Specifically, in this embodiment, the execution part of the automatic replenishment mechanism 1 can move the material suction part 104 to Figure 2 the replenishment port in) for replenishing or discharging materials.

[0071] In one embodiment, the material suction part 104 includes a first suction nozzle and a second suction nozzle. The first suction nozzle is used to suck good products for replenishment, and the second suction nozzle is used to suck defective products for discharging to improve the discharging and replenishing efficiency.

[0072] Optionally, as Figure 2 shown, the test subassembly further includes a buffer turntable 105. A plurality of buffer structures are provided on the buffer turntable 105. The buffer structures are used to store good products. The execution part can drive the material suction part 104 to move to the buffer turntable 105 to suck materials for replenishing the encapsulation structure 10.

[0073] Specifically, in this embodiment, the buffer turntable 105 realizes the function of storing materials through multiple buffer structures. The execution unit can drive the material suction unit 104 to move to the buffer turntable 105, and suck a qualified product through the suction nozzle part for replenishing materials when defective products are detected on the subsequent encapsulation structure 10. When the material suction unit 104 includes a first suction nozzle and a second suction nozzle, after the first suction nozzle sucks a qualified product on a buffer structure, the second suction nozzle discharges the defective product on the encapsulation structure 10, and then the replenishing material can be directly carried out, saving the replenishing time compared with the structure of one suction nozzle and further improving the replenishing efficiency.

[0074] Optionally, as Figure 2 shown, the sorting turntable mechanism 3 is also used for feeding materials onto the buffer structure.

[0075] Specifically, in practical applications, the qualified products on the buffer turntable 105 can be added manually or directly fed onto the buffer structure by the sorting turntable mechanism 3, further improving the automation degree and production efficiency of the production line.

[0076] Optionally, as Figure 2 shown, the test subassembly further includes an angle correction mechanism 6, and the execution unit can also drive the material suction unit 104 to move to the angle correction mechanism 6 to correct the angle of the qualified product. The angle correction mechanism 6 is used to adjust the placement angle of the qualified product after the material suction unit 104 sucks the qualified product on the buffer turntable 105, so that it can be consistent with the angles of other products on the encapsulation structure 10, improving the accuracy of replenishing materials.

[0077] Optionally, as Figures 1 to 2 shown, the execution unit includes a first driving structure 101, a second driving structure 102 arranged on the first driving structure 101, and a third driving structure 103 arranged on the second driving structure 102. The material suction unit 104 is connected to the third driving structure 103; the first driving structure 101 is used to drive the material suction unit 104 to move along the first direction, the second driving structure 102 is used to drive the material suction unit 104 to move along the second direction, and the third driving structure 103 is used to drive the material suction unit 104 to move along the third direction; wherein, the first direction, the second direction, and the third direction intersect pairwise.

[0078] Specifically, the first driving structure 101, the second driving structure 102, and the third driving structure 103 of the execution unit can all be realized by driving parts such as linear cylinders or motors, so that the material suction unit 104 connected to the execution unit has three degrees of freedom, which is convenient for discharging materials, replenishing materials at the replenishing material port, and taking materials on the buffer turntable 105, ensuring the flexibility of the movement of the material suction unit 104.

[0079] Optionally, as Figure 1As shown, the test sub-assembly further includes a charging mechanism, and a plurality of charging stations are provided on the charging mechanism; the sorting turntable mechanism 3 includes a sorting turntable 301 and a plurality of material taking parts 302 provided on the sorting turntable 301. The material taking parts 302 can rotate with the sorting turntable 301 to the charging stations to pick up materials.

[0080] Specifically, in this embodiment, the charging mechanism is used to perform a full charge test on the product to detect its product performance. The plurality of charging stations are used to place the products to be charged, such as capacitors, etc. After the charging is completed, the material taking parts 302 on the sorting turntable mechanism 3 can pick up the products at the charging stations one by one to transport them to the encapsulation structure 10.

[0081] Optionally, as Figure 1 shown, the charging mechanism includes a charging turntable 7 and a handling member 9; a plurality of first charging stations and a plurality of second charging stations are provided on the charging turntable 7. The radial distance between the first charging station and the center of the charging turntable 7 is greater than the radial distance between the second charging station and the center of the charging turntable 7; the handling member 9 is configured to be able to move between the first charging station and the second charging station, and the material taking part 302 can reach the first charging station and / or the second charging station.

[0082] Specifically, in this embodiment, by providing a circle of first charging stations and a circle of second charging stations on the charging turntable 7, when the diameter of the turntable is fixed, as many products as possible can be charged, saving space while ensuring the charging efficiency. Among them, the handling member 9 can move between the first charging station and / or the second charging station to realize transporting the product at the first charging station to the second charging station, or transporting the product at the second charging station to the first charging station, ensuring the charging time of a single product. In addition, the material taking part 302 reaches the first charging station or the second charging station to pick up the charged product and send it to the encapsulation structure 10.

[0083] Optionally, as Figure 1 shown, the handling member 9 can also reach the waste discharging station, and the waste discharging station is located outside the charging turntable 7.

[0084] Specifically, in practical applications, there may be defective products on the charging turntable 7. The handling member 9 can grab and place the defective products on the charging turntable 7 at the waste discharging station. A recycling device such as a waste bin can be set at the waste discharging station to avoid waste pollution of the environment.

[0085] Optionally, as Figure 3As shown in the figure, the test subassembly further includes a waste discharging mechanism 8; the waste discharging mechanism 8 includes a fourth driving structure 801, a waste discharging turntable 802 and a discharging structure 803. A plurality of waste discharging grooves 804 are provided on the waste discharging turntable 802, and the waste discharging grooves 804 are located at the waste discharging station to receive waste materials; the fourth driving structure 801 can drive the waste discharging turntable 802 to rotate, so that the plurality of waste discharging grooves 804 pass through the discharging structure 803 in sequence, so as to discharge the waste materials in the waste discharging grooves 804.

[0086] Specifically, in this embodiment, after the waste materials (defective products on the charging turntable 7) are transported to the waste material station, they can be placed in the waste discharging grooves 804. The waste discharging turntable 802 rotates under the drive of the fourth driving structure 801, so that each waste discharging groove 804 passes through the discharging structure 803 accordingly, so as to realize the discharging function of the waste materials and avoid environmental pollution or safety hazards caused by the waste materials.

[0087] Optionally, as Figure 1 and Figure 5 shown in the figure, the production line further includes an assembly subassembly, and the assembly subassembly is used for feeding materials to the test subassembly. The assembly subassembly can perform simple assembly on the products, and then convey them to the test subassembly for the next production process.

[0088] In one embodiment, the production line is applied to capacitor assembly, and the assembly subassembly includes a pin flattening mechanism 4; the pin flattening mechanism 4 is used for flattening the pins of the capacitor.

[0089] In the above structure, the assembly subassembly can also be provided with a feeding mechanism to sequentially send the capacitors to the mechanisms of the test subassembly for various performance tests. For example, the capacitors are conveyed to the charging mechanism for full charge performance test. At the same time, before sending the capacitors to the charging and testing subassembly, it is necessary to flatten the two pins of the capacitors to facilitate the next assembly of the capacitors. Before this process, the two pins of the capacitors can also be cut to the same length and the polarities of the two pins can be judged to facilitate subsequent processing. After the pins are flattened and before being sent to the test subassembly, the capacitors can also be subjected to seat board installation, lead wire bending and secondary cutting processes.

[0090] Optionally, as Figure 5 shown in the figure, the pin flattening mechanism 4 includes a fifth driving structure, a flattening structure and a pin middle dividing structure 409. The flattening structure has two flattening parts 4062, and the two flattening parts 4062 are respectively located on both sides of the pin middle dividing structure 409. The pin middle dividing structure 409 is used for separating the positive and negative pins of the capacitor; the fifth driving structure is connected to the flattening structure to drive the two flattening parts 4062 to move towards the pin middle dividing structure 409 respectively, so as to flatten the positive and negative pins of the capacitor.

[0091] Specifically, in this embodiment, the fifth driving structure drives the flattening structure to move, so that the two flattening parts 4062 located on both sides of the pin middle part structure 409 can move towards the pin middle part structure 409, thereby realizing the flattening of the two pins of the capacitors on both sides of the pin middle part structure 409. Among them, the pin middle part structure 409 separates the two capacitor pins, avoiding contact short - circuit between them, and improving the safety and reliability during the assembly process.

[0092] Optionally, as Figure 5 shown, the flattening structure includes an eccentric wheel 401, a first connecting rod 402, a second connecting rod 403, a third connecting rod 404, a fourth connecting rod 405, a first swing arm 406 and a second swing arm 407; the first end of the first connecting rod 402 is rotatably connected to the eccentric wheel 401, the second end of the first connecting rod 402 is rotatably connected to the first end of the second connecting rod 403, the second end of the second connecting rod 403 is rotatably connected to the first end of the third connecting rod 404 and the first end of the fourth connecting rod 405 respectively, the first end of the first swing arm 406 is rotatably connected to the second end of the third connecting rod 404, and the first end of the second swing arm 407 is rotatably connected to the second end of the fourth connecting rod 405; connecting parts 4061 and flattening parts 4062 are respectively arranged at the second ends of the first swing arm 406 and the second swing arm 407, the two connecting parts 4061 are rotatably connected, and the fifth driving structure drives the eccentric wheel 401 to rotate, so that the two flattening parts 4062 can move relatively or away from each other.

[0093] In this embodiment, the eccentric wheel 401 drives the connecting rod assembly to move, and further enables the two swing arms to realize the clamping and loosening of the two flattening parts 4062 through the connection of the connecting parts 4061, so as to realize the flattening of the pins. Its structure is simple and it occupies less space.

[0094] Optionally, as Figure 5 shown, the pin flattening mechanism 4 further includes a guide rail extending from the eccentric wheel 401 to the pin middle part structure 409. The first connecting rod 402 and the second connecting rod 403 are rotatably connected through a rotating shaft 408, and the rotating shaft 408 can move along the guide rail. Among them, the setting of the guide rail can guide the movement of the rotating shaft 408, and further realize the conversion of the rotational motion of the eccentric wheel 401 into the linear motion of the second connecting rod 403.

[0095] Optionally, the pin flattening mechanism 4 further includes a sixth driving structure, and the sixth driving structure can drive the pin middle part structure 409 to move to avoid the capacitor. Among them, the setting of the sixth driving structure enables the pin middle part structure 409 to avoid interference between the capacitor and the pin middle part structure 409 when the feeding mechanism feeds after the capacitor pins are flattened, further improving the reliability of this process.

[0096] Optionally, as Figure 4As shown, the test subassembly further includes a height and capacity detection mechanism 2. The height and capacity detection mechanism 2 includes a pressing-down structure 201, a detection structure 202, a height detector 203, and a capacitance tester. The pressing-down structure 201 is used to press the capacitance onto the detection structure 202. The detection structure 202 is provided with probes, and the probes are connected to the capacitance tester to detect the capacity of the capacitance. The height detector 203 is used to detect the height dimension of the capacitance. Among them, the capacitance is the capacitance before being fed to the test subassembly by the feeding mechanism.

[0097] Specifically, in this embodiment, the detection of the height dimension and the capacity of the capacitance are integrated on the same structure, which saves the occupied space while realizing the two functions. Among them, when the feeding mechanism feeds a capacitance between the pressing-down mechanism and the detection structure 202, the pressing-down structure 201 descends to clamp the capacitance between it and the detection structure 202, and the height detector 203 provided beside detects the height between the pressing-down mechanism and the detection structure 202, and calculates the height difference from the height when no capacitance is placed to obtain the height dimension of the capacitance.

[0098] When the capacitance is pressed between the pressing-down structure 201 and the detection structure 202, the four probes provided on the detection structure 202 can be connected to the capacitance detector through wires to obtain the capacitance parameter of the capacitance. This process can discharge defective products through detection before feeding to the test subassembly, improving the yield rate of the product.

[0099] Optionally, referring to Figure 1 and Figure 4 , the assembly subassembly further includes a feeding turntable. A plurality of feeding parts 1101 are provided on the feeding turntable 11. The plurality of feeding parts 1101 are used to pick up the capacitance and feed it to the test subassembly.

[0100] Specifically, the feeding turntable 11 is designed, and a plurality of feeding parts 1101 are provided on the feeding turntable 11, so that during the rotation of the feeding turntable 11, it is convenient for assembly or performance testing. For example, the capacitance picked up by the feeding part 1101 on the feeding turntable 11 can be rotated to the pin flattening mechanism 4, and the pins of the capacitance can be flattened by the pin flattening mechanism 4, which is convenient for subsequent assembly. Another example is that the feeding turntable 11 can be rotated to the height and capacity detection mechanism 2 to perform capacity and product height detection.

[0101] In the description of this specification, the descriptions referring to terms such as "one embodiment", "some embodiments", "schematic embodiments", "examples", "specific examples", or "some examples", etc., mean that the specific features, structures, materials, or characteristics described in connection with the embodiment or example are included in at least one embodiment or example of the present application. In this specification, the schematic expressions of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials, or characteristics described may be combined in a suitable manner in any one or more embodiments or examples.

[0102] Although the embodiments of the present application have been shown and described, those of ordinary skill in the art can understand that various changes, modifications, substitutions, and variations can be made to these embodiments without departing from the principles and spirit of the present application, and the scope of the present application is defined by the claims and their equivalents.

Claims

1. A production line, characterized in that, Including: A test subassembly, a packaging structure, and a packaging subassembly; The test subassembly includes a sorting turntable mechanism and an automatic feeding mechanism; The sorting turntable mechanism is arranged upstream of the packaging subassembly and is used for feeding materials to the packaging structure. The packaging subassembly can move the packaging structure in a first direction. The automatic feeding mechanism is arranged between the sorting turntable mechanism and the packaging subassembly and is used for feeding supplementary materials to the packaging structure.

2. The production line according to claim 1, characterized in that, The test subassembly further includes a vision inspection device, which is used for acquiring images of products on the packaging structure to identify qualified products and unqualified products; The vision inspection device is electrically connected to the automatic feeding mechanism, so that the automatic feeding mechanism can feed supplementary materials after discharging the unqualified products of the packaging structure.

3. The production line according to claim 2, wherein The automatic feeding mechanism includes an execution part and a material suction part connected to the execution part. The execution part can drive the material suction part to move for discharging and feeding.

4. The production line according to claim 3, characterized in that, The material suction part includes a first suction nozzle and a second suction nozzle. The first suction nozzle is used for sucking qualified products for feeding, and the second suction nozzle is used for sucking unqualified products for discharging.

5. The production line according to claim 3, characterized in that, The test subassembly further includes a buffer turntable, and a plurality of buffer structures are arranged on the buffer turntable. The buffer structures are used for storing qualified products. The execution part can drive the material suction part to move to the buffer turntable to suck materials for feeding the packaging structure.

6. The production line according to claim 5, wherein The sorting turntable mechanism is also used for feeding materials to the buffer structures.

7. The production line according to claim 5, characterized in that, The test subassembly further includes an angle correction mechanism. The execution part can also drive the material suction part to move to the angle correction mechanism to correct the angles of qualified products.

8. The production line according to claim 3, characterized in that, The execution part includes a first driving structure, a second driving structure arranged on the first driving structure, and a third driving structure arranged on the second driving structure. The material suction part is connected to the third driving structure; The first driving structure is used for driving the material suction part to move in the first direction, the second driving structure is used for driving the material suction part to move in a second direction, and the third driving structure is used for driving the material suction part to move in a third direction; Wherein, the first direction, the second direction, and the third direction intersect pairwise.

9. The production line according to claim 1, wherein, The test subassembly further includes a charging mechanism, and a plurality of charging stations are arranged on the charging mechanism; The sorting turntable mechanism includes a sorting turntable and a plurality of material taking parts arranged on the sorting turntable. The material taking parts can rotate with the sorting turntable to the charging stations for taking materials.

10. The production line according to claim 9, characterized in that, The charging mechanism includes a charging turntable and a handling part; A plurality of first charging stations and a plurality of second charging stations are arranged on the charging turntable. The radial distance between the first charging stations and the center of the charging turntable is greater than the radial distance between the second charging stations and the center of the charging turntable; The handling part is configured to be able to move between the first charging stations and the second charging stations. The material taking parts can reach the first charging stations and / or the second charging stations.

11. The production line according to claim 10, wherein The handling part can also reach a waste discharging station, and the waste discharging station is located outside the charging turntable.

12. The production line according to claim 11, characterized in that, The test subassembly further includes a waste discharging mechanism; The waste discharging mechanism includes a fourth driving structure, a waste discharging turntable and a discharging structure. A plurality of waste discharging grooves are arranged on the waste discharging turntable, and the waste discharging grooves are located at the waste discharging station to receive waste materials. The fourth driving structure can drive the waste discharging turntable to rotate, so that a plurality of the waste discharging grooves pass through the discharging structure in sequence to discharge the waste materials in the waste discharging grooves.

13. The production line according to claim 1, wherein It further includes an assembly sub-assembly, and the assembly sub-assembly is used for feeding materials to the testing sub-assembly.

14. The production line according to claim 13, characterized in that, Applied to capacitors, the assembly sub-assembly includes a pin flattening mechanism, and the pin flattening mechanism is used for flattening the pins of capacitors.

15. The production line according to claim 14, characterized in that, The pin flattening mechanism includes a fifth driving structure, a flattening structure and a pin centering structure. The flattening structure has two flattening parts, and the two flattening parts are respectively located on both sides of the pin centering structure. The pin centering structure is used for separating the positive and negative pins of the capacitor. The fifth driving structure is connected to the flattening structure to drive the two flattening parts to move towards the pin centering structure respectively to flatten the positive and negative pins of the capacitor.

16. The production line according to claim 15, characterized in that, The flattening structure includes an eccentric wheel, a first connecting rod, a second connecting rod, a third connecting rod, a fourth connecting rod, a first swing arm and a second swing arm. The first end of the first connecting rod is rotatably connected to the eccentric wheel, the second end of the first connecting rod is rotatably connected to the first end of the second connecting rod, the second end of the second connecting rod is respectively rotatably connected to the first ends of the third connecting rod and the fourth connecting rod, the first end of the first swing arm is rotatably connected to the second end of the third connecting rod, and the first end of the second swing arm is rotatably connected to the second end of the fourth connecting rod. Connection parts and the flattening parts are respectively arranged at the second ends of the first swing arm and the second swing arm, and the two connection parts are rotatably connected. The fifth driving structure drives the eccentric wheel to rotate, so that the two flattening parts can move relatively or away from each other.

17. The production line according to claim 16, wherein The pin flattening mechanism further includes a guide rail extending from the eccentric wheel to the pin centering structure. The first connecting rod and the second connecting rod are rotatably connected through a rotating shaft, and the rotating shaft can move along the guide rail.

18. The production line according to claim 17, characterized in that, The pin flattening mechanism further includes a sixth driving structure, and the sixth driving structure can drive the pin centering structure to move to avoid the capacitor.

19. The production line according to claim 14, characterized in that, The testing sub-assembly further includes a height and capacitance detection mechanism, and the height and capacitance detection mechanism includes a pressing structure, a detection structure, a height detector and a capacitance tester. The pressing structure is used for pressing the capacitor onto the detection structure. Probes are arranged on the detection structure, and the probes are connected to the capacitance tester to detect the capacitance of the capacitor. The height detector is used for detecting the height dimension of the capacitor.

20. The production line according to claim 13, 14 or 19, characterized in that, The assembly sub-assembly further includes a feeding turntable, and a plurality of feeding parts are arranged on the feeding turntable. The plurality of feeding parts are used for picking up capacitors and feeding them to the testing sub-assembly.

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