Optical switch testing device

Abstract

The utility model provides an optical switch testing device, relates to the technical field of optical switch detection, and aims to solve the problems that when an existing optical switch testing device is used for testing an optical switch, certain interference light exists in the outside and other optical switch channels, and the accuracy of testing data is poor. The device comprises a test box body and a light condensation assembly, a master control single-chip microcomputer, a memory and a power supply module are arranged in the test box body, the memory and the power supply module are both connected with the master control single-chip microcomputer, and the master control single-chip microcomputer can be connected with a to-be-detected optical switch and is used for collecting input of a to-be-detected optical switch channel; the light condensation assembly is arranged outside the test box body and comprises a sensor module and a light condensation module, and the sensor module is connected with the main control single-chip microcomputer and used for collecting output of a to-be-detected optical switch channel; the light gathering module is arranged on one side of the sensor module and used for focusing light rays on the sensor module, and the optical switch testing device is used for improving accuracy and reliability of optical switch testing data.

Description

Technical Field

[0001] The utility model relates to the technical field of optical switch detection, in particular to an optical switch testing device. Background Art

[0002] Optical switches are widely used in various optical systems, such as optical communication systems, optical sensing systems, optical testing and measurement, optical imaging systems, etc., as well as in fields such as medical diagnosis and treatment. When an optical switch is put into actual projects, the quality of the optical switch is particularly important, and how to detect whether the quality of the optical switch meets the standard has become an important issue.

[0003] Currently, an optical switch testing device is used to detect the quality of an optical switch. However, when the existing optical switch testing device tests the optical switch, there is certain interference light in the external environment and other optical switch channels, resulting in poor accuracy of the test data.

[0004] Therefore, there is an urgent need for an optical switch testing device to solve the above technical problems. Summary of the Utility Model

[0005] The purpose of the utility model is to provide an optical switch testing device to solve the technical problem that when the existing optical switch testing device tests the optical switch, there is certain interference light in the external environment and other optical switch channels, resulting in poor accuracy of the test data. The many technical effects that can be produced by the preferred technical solution among the many technical solutions provided by the utility model are described in detail below.

[0006] To achieve the above purpose, the utility model provides the following technical solutions:

[0007] An optical switch testing device provided by the utility model includes a test box body and a light condensing component, wherein:

[0008] A main control single-chip microcomputer, a memory and a power supply module are arranged in the test box body. The memory and the power supply module are both connected to the main control single-chip microcomputer. The main control single-chip microcomputer can be connected to the optical switch to be detected for collecting the input of the channel of the optical switch to be detected.

[0009] The light condensing component is arranged outside the test box body and includes a sensor module and a light condensing module. The sensor module is connected to the main control single-chip microcomputer for collecting the output of the channel of the optical switch to be detected. The light condensing module is arranged on one side of the sensor module for focusing light on the sensor module.

[0010] Preferably, the light condensing component further includes a housing, wherein:

[0011] The sensor module and the light condensing module are both arranged in the housing;

[0012] One end of the housing is an open end, and a wire passing hole is provided at the other end of the housing. The wire passing hole is for a signal wire to pass through, and the sensor module is connected to the main control single-chip microcomputer through the signal wire.

[0013] Preferably, a first accommodating portion for accommodating the sensor module and a second accommodating portion for accommodating the light condensing module are provided in the housing. The second accommodating portion is provided between the open end and the first accommodating portion.

[0014] Preferably, the housing adopts a hollow columnar structure.

[0015] Preferably, the housing is composed of a semi-columnar hollow first housing and a semi-columnar hollow second housing, wherein:

[0016] A first connection structure is provided on the first housing, and a second connection structure that cooperates with and connects to the first connection structure is provided on the second housing.

[0017] Preferably, the first accommodating portion and the second accommodating portion are both annular convex grooves formed by extending from the inner walls of the first housing and the second housing towards the center of the housing, and a gap is provided between the first accommodating portion and the second accommodating portion.

[0018] Preferably, the light condensing module includes a convex lens.

[0019] Preferably, the test box body further includes a display screen module. The display screen module is installed on the outer surface of the test box body, and the display screen module is connected to the main control single-chip microcomputer.

[0020] Preferably, the test box body further includes a power supply port. The power supply port is provided on one side of the test box body, and the power supply port is electrically connected to the power supply module.

[0021] Preferably, the test box body further includes a power switch. The power switch and the power supply port are provided on different sides of the test box body.

[0022] The optical switch test device provided by the present utility model collects the output of the optical switch channel through the sensor module, and the main control single-chip microcomputer processes the data of the sensor module in real time and collects the input of the optical switch channel. Then, data comparison and processing are performed inside the main control single-chip microcomputer, and the processed data is saved in the memory. The light condensing module of the light condensing component can focus light on the sensor module to isolate interfering light from the outside and other optical switch channels, thereby improving the accuracy and reliability of the data tested by the optical switch test device. Description of the Drawings

[0023] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings required for the description of the embodiments or the prior art. Obviously, the drawings in the following description are only some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other drawings can be obtained based on these drawings.

[0024] Figure 1 It is a schematic structural diagram of an embodiment of the optical switch testing device of the present invention;

[0025] Figure 2 It is a schematic structural diagram of the light condensing component in the optical switch testing device of the present invention.

[0026] In the figure: 1. Testing box body; 11. Main control single-chip microcomputer; 12. Memory; 13. Power supply module; 14. Display screen module; 15. Power supply port; 16. Power switch;

[0027] 2. Light condensing component; 20. Shell; 21. Sensor module; 22. Light condensing module; 201. Open end; 202. Wire passing hole; 210. First accommodating part; 220. Second accommodating part;

[0028] 3. Signal wire. Specific embodiments

[0029] To make the objectives, technical solutions and advantages of the present invention clearer, the following will describe the technical solutions of the present invention in detail. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all of the embodiments. Based on the embodiments of the present invention, all other implementation manners obtained by those of ordinary skill in the art without creative efforts fall within the scope of protection of the present invention.

[0030] In the description of the present invention, it should be understood that the orientation or positional relationships indicated by the terms "center", "lateral", "length", "width", "height", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "side", etc. are based on the orientation or positional relationships shown in the drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of the present invention.

[0031] In the description of the present utility model, it should also be noted that unless otherwise clearly defined and limited, the terms "installation", "connection", and "coupling" should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium. For those of ordinary skill in the art, the specific meanings of the above terms in the present utility model can be understood according to specific circumstances.

[0032] Figure 1 is a structural schematic diagram of this embodiment. As Figure 1 shown, this embodiment provides an optical switch testing device for testing the quality of an optical switch. The optical switch to be detected is an instrument for opening, closing, and switching optical channels. The optical switch testing device includes a testing box body 1 and a light condensing component 2.

[0033] Among them, a main control single-chip microcomputer 11, a memory 12, and a power supply module 13 are arranged inside the testing box body 1. The testing box body 1 in this embodiment is overall square, which can better protect the main control single-chip microcomputer 11, the memory 12, and the power supply module 13 inside it. The memory 12 and the power supply module 13 are both connected to the main control single-chip microcomputer 11. The main control single-chip microcomputer 11 can be connected to the optical switch to be detected and is used for collecting the input of the optical switch channels to be detected.

[0034] The light condensing component 2 is arranged outside the testing box body 1 and includes a sensor module 21 and a light condensing module 22. The sensor module 21 is connected to the main control single-chip microcomputer 11 and is used for collecting the output of the optical switch channels to be detected; the light condensing module 22 is arranged on one side of the sensor module 21 and is used for focusing light on the sensor module 21.

[0035] The main control single-chip microcomputer 11 in this embodiment uses an STM32F103C8T6 single-chip microcomputer. The 32-bit microcontroller and the 72 MHz clock frequency enable it to have low power consumption while also having strong performance. And there are sufficient peripherals to carry a sufficient number of sensor modules 21. The memory 12 uses a W25Q64, with sufficient memory, which better meets the need for storing data.

[0036] This optical switch testing device collects the output of the optical switch channels through the sensor module 21, and the main control single-chip microcomputer 11 processes the data of the sensor module 21 in real time and collects the input of the optical switch channels. Then, data comparison and processing are performed inside the main control single-chip microcomputer 11, and the processed data is saved in the memory 12. The light condensing module 22 of the light condensing component 2 can focus light on the sensor module 21 to isolate interference light from the outside and other optical switch channels, thereby improving the accuracy and reliability of the data tested by the optical switch testing device.

[0037] As an optional implementation manner,Figure 2 This is a schematic structural diagram of the light - collecting component in this embodiment. As Figure 2 shown, the light - collecting component 2 further includes a housing 20.

[0038] Among them, the sensor module 21 and the light - collecting module 22 are both arranged inside the housing 20. By setting the housing 20, the light - collecting component 2 is in an overall enclosed state, which can better isolate the interference light from the outside and other optical switch channels, so that the test data is accurate and reliable.

[0039] Specifically, in this embodiment, one end of the housing 20 is an open end 201, and the other end of the housing 20 is provided with a wire - passing hole 202. The wire - passing hole 202 is used for the signal wire 3 to pass through. The sensor module 21 is connected to the main control single - chip microcomputer 11 through the signal wire 3. This makes the overall structure of this optical switch test device simple. While excluding interference light, it can also collect test light, and there is no need for personnel to observe the changes of the optical switch test all the time, greatly improving the detection efficiency of the optical switch.

[0040] One end of the signal wire 3 in this embodiment is connected to the main control single - chip microcomputer 11 in the test box body 1, and the other end extends to the outside of the test box body 1 and is connected to the sensor module 21. And the signal wire 3 is made of a soft and bendable material, which better improves the adaptability of the optical switch test device.

[0041] Furthermore, to improve the use stability of the light - collecting component 2 and make the test data more accurate and reliable, a first accommodating part 210 for accommodating the sensor module 21 and a second accommodating part 220 for accommodating the light - collecting module 22 are arranged inside the housing 20. The second accommodating part 220 is arranged between the open end 201 and the first accommodating part 210.

[0042] Among them, the housing 20 adopts a hollow columnar structure, which is convenient for testing and has a better light - collecting effect. In actual production and use, the housing 20 can adopt an integral structure or a split structure.

[0043] Specifically, in this embodiment, the housing 20 adopts a split structure, that is, the housing 20 is composed of a semi - columnar hollow first housing and a semi - columnar hollow second housing. Both the first housing and the second housing are made of metal materials. Among them, a first connection structure is arranged on the first housing, and a second connection structure that cooperates with the first connection structure is arranged on the second housing. The first connection structure and the second connection structure can be in forms such as snap - connection, plug - connection, or connection through a connecting piece, which are convenient for connection and disassembly.

[0044] As an alternative embodiment, both the first accommodating portion 210 and the second accommodating portion 220 are annular convex grooves extending towards the center of the housing 20 along the inner walls of the first housing and the second housing. By wrapping the edges of the sensor module 21 and the light condensing module 22 with the annular grooves, the stability of the sensor module 21 and the light condensing module 22 installed in the housing 20 is better. In this embodiment, a gap is provided between the first accommodating portion 210 and the second accommodating portion 220 to facilitate better focusing of light.

[0045] As an alternative embodiment, the light condensing module 22 includes a convex lens, and the sensor module 21 includes a three-wire photodiode module. The convex lens has a good light condensing effect, enabling the sensor module 21 to more effectively collect the output of the optical switch channel. With the housing 20 configured to wrap the sensor module 21 and the light condensing module 22 therein, this optical switch testing device can remove interfering light from the outside and other optical switch channels, achieving accurate and effective test data.

[0046] As an alternative embodiment, the test box 1 further includes a display screen module 14. The display screen module 14 is installed on the outer surface of the test box 1 and is connected to the main control single-chip microcomputer 11. The display screen module 14 can display the data processed by the main control single-chip microcomputer 11 on the display screen in real time, realizing data visualization. In this embodiment, the display screen module 14 adopts an OLED module with 256×64 dot matrix, realizing data visualization and improving the convenience of testing the optical switch.

[0047] As an alternative embodiment, the test box 1 further includes a power supply port 15. The power supply port 15 is provided on one side of the test box 1 and is electrically connected to the power supply module 13.

[0048] As an alternative embodiment, the test box 1 further includes a power switch 16. To improve the convenience of use, the power switch 16 in this embodiment adopts a rocker switch. And the power switch 16 and the power supply port 15 are provided on different sides of the test box 1 to avoid interference.

[0049] The above is only the specific embodiment of the present invention, but the protection scope of the present invention is not limited thereto. Any person skilled in the art within the technical scope disclosed by the present invention can easily think of changes or substitutions, which should all be covered within the protection scope of the present invention. Therefore, the protection scope of the present invention should be subject to the protection scope of the claims.

Claims

1. An optical switch testing device, characterized in that, It includes a test box body and a light condensing component, where: A main control single-chip microcomputer, a memory, and a power supply module are arranged in the test box body. The memory and the power supply module are both connected to the main control single-chip microcomputer. The main control single-chip microcomputer can be connected to the optical switch to be detected and is used to collect the input of the channel of the optical switch to be detected. The light condensing component is arranged outside the test box body and includes a sensor module and a light condensing module. The sensor module is connected to the main control single-chip microcomputer and is used to collect the output of the channel of the optical switch to be detected. The light condensing module is arranged on one side of the sensor module and is used to focus light on the sensor module.

2. The optical switch testing device according to claim 1, wherein: The light condensing component further includes a housing, where: Both the sensor module and the light condensing module are arranged in the housing. One end of the housing is an open end, and a wire passing hole is arranged at the other end of the housing. The wire passing hole is used for a signal wire to pass through, and the sensor module is connected to the main control single-chip microcomputer through the signal wire.

3. The optical switch testing device according to claim 2, wherein: A first accommodating part for accommodating the sensor module and a second accommodating part for accommodating the light condensing module are arranged in the housing. The second accommodating part is arranged between the open end and the first accommodating part.

4. The optical switch testing device according to claim 3, wherein: The housing adopts a hollow columnar structure.

5. The optical switch testing device according to claim 4, wherein: The housing is composed of a semi-columnar hollow first housing and a semi-columnar hollow second housing, where: A first connection structure is arranged on the first housing, and a second connection structure that cooperates with the first connection structure is arranged on the second housing.

6. The optical switch testing device according to claim 5, wherein: Both the first accommodating part and the second accommodating part are annular raised grooves extending from the inner walls of the first housing and the second housing towards the center of the housing, and a gap is arranged between the first accommodating part and the second accommodating part.

7. The optical switch testing device according to any one of claims 1-6, characterized in that: The light condensing module includes a convex lens.

8. The optical switch testing device according to any one of claims 1-6, characterized in that: The test box body further includes a display screen module. The display screen module is installed on the outer surface of the test box body and is connected to the main control single-chip microcomputer.

9. The optical switch testing device according to any one of claims 1-6, characterized in that: The test box body further includes a power supply port. The power supply port is arranged on one side of the test box body and is electrically connected to the power supply module.

10. The optical switch testing device according to claim 9, wherein: The test box body further includes a power switch. The power switch and the power supply port are arranged on different sides of the test box body.

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