Guiding type pin header test connector and pin header test device

Abstract

The embodiment of the utility model provides a guiding type pin header test joint and a pin header test device, the guiding type pin header test joint comprises a housing comprising a male seat and a female seat which are connected, and the female seat is provided with an installation chamber; the plurality of first contact pins penetrate through the male seat and the female seat, each first contact pin comprises a first end and a second end which are opposite to each other, the first end extends into the mounting cavity, the mounting cavity is used for allowing a signal cable to extend into and be connected with the first end, the second end is sunken relative to the male seat, a guide bulge is arranged on the side surface of the male seat, and the guide bulge is used for guiding a test product; the test product slides relative to the male seat and is connected with the second end. The side surface of the male seat is provided with the guide projection, and the guide projection can guide the test product, so that the test product slides relative to the male seat and is connected with the second end of the first contact pin, and the risk that the test product is damaged by collision is reduced. And meanwhile, automatic testing can be conveniently realized, so that the testing efficiency is improved.

Description

Technical Field

[0001] The utility model relates to the technical field of pin testing, in particular to a guiding pin testing joint and a pin testing device. Background Art

[0002] A female header is a common connector, which is widely used as a general connector in electronics, electrical appliances, and instruments, mainly for current or signal transmission. The female header is usually used in combination with pins to form a board-to-board connection.

[0003] Before leaving the factory, pins and female headers usually need to be tested. In the related art, an artificial method is used to test pins and female headers, that is, an operator manually docks the test product to be tested with a signal cable for signal testing. In this way, the testing efficiency is low and it is not easy to align. When the test product and the signal are not aligned, it is easy to cause the test product to be damaged. Summary of the Utility Model

[0004] The utility model aims to solve at least one of the technical problems existing in the prior art. For this purpose, the utility model provides a guiding pin testing joint and a pin testing device, which can improve the testing efficiency and reduce the risk of damage to the test product.

[0005] In a first aspect, an embodiment of the utility model provides a guiding pin testing joint, which includes: a housing, including a connected male seat and a female seat, and the female seat is provided with an installation cavity; a plurality of first contact pins, all passing through the male seat and the female seat, the first contact pin includes a first end and a second end facing away from each other, the first end extends into the installation cavity, the installation cavity is for a signal cable to extend into and connect with the first end, the second end is recessed relative to the male seat, and a guiding protrusion is provided on the side surface of the male seat, and the guiding protrusion is used to guide the test product so that the test product slides relative to the male seat and connects with the second end.

[0006] The guiding pin testing joint provided by the first aspect embodiment of the utility model has at least the following beneficial effects:

[0007] By providing a guiding protrusion on the side surface of the male seat, the guiding protrusion can guide the test product so that the test product slides relative to the male seat and connects with the second end of the first contact pin, reducing the risk of damage to the test product. At the same time, the first end of the first contact pin is connected to the signal cable, which is convenient for realizing automatic testing, thereby improving the testing efficiency.

[0008] In one embodiment of this implementation manner, the male socket includes a first male socket and a second male socket that are spaced apart. The installation chamber is partitioned to form a first chamber and a second chamber. Part of the first contact pins penetrate through the first male socket and the female socket and extend into the first chamber, and part of the first contact pins penetrate through the second male socket and the female socket and extend into the second chamber.

[0009] In one embodiment of this implementation manner, a guiding protrusion is provided on a side of the first male socket facing away from the second male socket. An end face of the first male socket facing away from the female socket and an end face of the guiding protrusion facing away from the female socket are flush.

[0010] In one embodiment of this implementation manner, a side face and an end face of the first male socket and the guiding protrusion are transitioned through a first chamfered surface.

[0011] In one embodiment of this implementation manner, a guiding protrusion is provided on a side of the second male socket facing the first male socket. An end face of the second male socket facing away from the female socket and an end face of the guiding protrusion facing away from the female socket are flush.

[0012] In one embodiment of this implementation manner, a side face and an end face of the second male socket and the guiding protrusion are transitioned through a second chamfered surface.

[0013] In one embodiment of this implementation manner, the number of the guiding protrusions is multiple, and the multiple guiding protrusions are spaced apart.

[0014] In one embodiment of this implementation manner, the first contact pins are configured to be detachable from the housing in a direction from the first end towards the second end.

[0015] In one embodiment of this implementation manner, the guided pin test joint includes second contact pins. The housing includes a main body block and a disassembly and assembly block. The main body block and the disassembly and assembly block are detachably connected, and an installation hole is defined between the main body block and the disassembly and assembly block. The second contact pins are installed in the installation hole. One end of the second contact pins in the same direction as the first end protrudes relative to the installation hole, and the other end of the second contact pins in the same direction as the second end retracts relative to the installation hole.

[0016] In a second aspect, an embodiment of the present invention provides a pin test device. The pin test device includes a driving mechanism and the guided pin test joint according to any one of the embodiments of the first aspect. The driving mechanism is connected to the guided pin test joint to drive the guided pin test joint to approach or move away from the test product.

[0017] The pin test device provided by the embodiment of the second aspect of the present invention has at least the following beneficial effects:

[0018] By adding the guiding pin header test joint provided by the embodiment of the present utility model to the pin header test device, the pin header test device can achieve automated testing, thereby improving the testing efficiency and reducing the risk of damaging the tested products at the same time.

[0019] Additional aspects and advantages of the present utility model will be given in part in the following description, become apparent in part from the following description, or be learned through the practice of the present utility model. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] The following further describes the present utility model in conjunction with the drawings and embodiments, where:

[0021] Figure 1 is a three-dimensional structural schematic diagram of the guiding pin header test joint provided by the embodiment of the present utility model;

[0022] Figure 2 is Figure 1 the three-dimensional structural schematic diagram of the guiding pin header test joint in a sectional state;

[0023] Figure 3 is Figure 1 the three-dimensional structural schematic diagram of the guiding pin header test joint in a disassembled state;

[0024] Figure 4 is Figure 1 the three-dimensional structural schematic diagram of the guiding pin header test joint in a sectional state;

[0025] Figure 5 is Figure 1 the three-dimensional structural schematic diagram of the guiding pin header test joint from another perspective.

[0026] Reference numerals:

[0027] Guiding pin header test joint 100; housing 10; male seat 11; first male seat 111; second male seat 112; female seat 12; installation chamber 105; first chamber 1051; second chamber 1052; guiding protrusion 13; main body block 15; disassembly and assembly block 16; disassembly and assembly hole 101; first hole 1011; second hole 1012; third hole 1013; installation hole 102; card slot 103; first contact pin 20; first end 21; second end 22; first contact portion 23; connecting portion 24; second contact portion 25; second contact pin 30; first part 31; second part 32. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0028] Embodiments of the present utility model will be described in detail below. Examples of the embodiments are shown in the accompanying drawings, where the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the accompanying drawings are exemplary and are only used to explain the present utility model and should not be construed as a limitation to the present utility model.

[0029] In the description of the present utility model, it should be understood that for the orientation description, such as the orientation or positional relationship indicated by up, down, front, back, left, right, etc., is based on the orientation or positional relationship shown in the accompanying drawings. It is only for the convenience of describing the present utility model and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus should not be construed as a limitation to the present utility model.

[0030] In the description of the present utility model, the meaning of several is more than one, the meaning of multiple is more than two, greater than, less than, exceeding, etc. are understood as not including the present number, and above, below, within, etc. are understood as including the present number. If there is a description of first and second, it is only for the purpose of distinguishing technical features and should not be understood as indicating or implying relative importance or implicitly indicating the quantity of the indicated technical features or implicitly indicating the sequence relationship of the indicated technical features.

[0031] In the description of the present utility model, unless otherwise clearly defined, words such as setting, installing, connecting, etc. should be understood in a broad sense, and those skilled in the art can reasonably determine the specific meanings of the above words in the present utility model in combination with the specific content of the technical solution.

[0032] In the description of the present utility model, the description referring to terms such as "one embodiment", "some embodiments", "schematic embodiments", "examples", "specific examples", or "some examples", etc. means that the specific features, structures, materials, or characteristics described in connection with the embodiment or example are included in at least one embodiment or example of the present utility model. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials, or characteristics described can be combined in a suitable manner in any one or more embodiments or examples.

[0033] Please refer to Figure 1 and Figure 2 , Figure 1 is a three-dimensional structural schematic diagram of the guiding pin test joint 100 provided by the embodiment of the present utility model; Figure 2 is Figure 1Schematic three-dimensional structure diagram of the guiding pin test adapter 100 in a sectional view. An embodiment of the present utility model provides a guiding pin test adapter 100, which includes a housing 10 and a plurality of first contact pins 20. The plurality of first contact pins 20 are all inserted through the housing 10.

[0034] In an embodiment of this embodiment, please continue to refer to Figure 1 and Figure 2 , the housing 10 is provided with a plurality of disassembly and assembly holes 101, and the plurality of first contact pins 20 are correspondingly installed in the plurality of disassembly and assembly holes 101. The first contact pin 20 includes a first end 21 and a second end 22 facing away from each other. The first end 21 extends relative to the disassembly and assembly hole 101, and the second end 22 retracts relative to the disassembly and assembly hole 101. One of the first end 21 and the second end 22 is used to connect with the test product, and the other is used to connect with the signal cable. The first contact pin 20 is configured to be detachable from the disassembly and assembly hole 101 along a first direction, and the first direction is the direction in which the first end 21 faces the second end 22.

[0035] Specifically, in this embodiment, the first end 21 is used to connect with the signal cable, and the second end 22 is used to connect with the test product. And in this application scenario, the test product is a female header. In other embodiments, the first end 21 can also be set to be used to connect with the test product, and the second end 22 can be set to be used to connect with the signal cable. It can be understood that, compared with the manual testing method, the guiding pin test adapter 100 can connect the first end 21 of the first contact pin 20 with the signal cable, and then plug different test products onto the second end 22 of the first contact pin 20, so as to complete the test. In this way, the signal cable does not need to be frequently plugged and unplugged, which is beneficial to realizing automation and thus improving the test efficiency. And, since the type specifications (such as pin gauges) of different test products are different, in the guiding pin test adapter 100 provided by the present utility model, the first contact pin 20 is configured to be detachable from the disassembly and assembly hole 101 along the first direction, so as to facilitate replacement and thus meet different test requirements.

[0036] For the guiding pin test adapter 100 provided by the embodiment of the present utility model, one of the first end 21 and the second end 22 of the first contact pin 20 is used to connect with the test product, and the other is used to connect with the signal cable, so as to facilitate automated testing and thus improve the test efficiency. At the same time, the first contact pin 20 is configured to be detachable from the disassembly and assembly hole 101 along the first direction, so as to facilitate replacement and thus meet different test requirements.

[0037] In an embodiment of this embodiment, please refer to Figure 1 and Figure 2, the distance that the first end 21 extends relative to the disassembly and assembly hole 101 is greater than the distance that the second end 22 retracts relative to the disassembly and assembly hole 101. It can be understood that when detaching the first contact pin 20, a thrust force in the first direction needs to be applied to the first contact pin 20 so that the first contact pin 20 moves along the axial direction of the disassembly and assembly hole 101 and leaves the disassembly and assembly hole 101. In this embodiment, by setting the distance that the first end 21 extends relative to the disassembly and assembly hole 101 to be greater than the distance that the second end 22 retracts relative to the disassembly and assembly hole 101, after pushing the first contact pin 20 so that the first end 21 extends into the disassembly and assembly hole 101, the second end 22 can extend out of the disassembly and assembly hole 101, facilitating the extraction of the first contact pin 20 from the second end 22 and improving the convenience of detaching the first contact pin 20.

[0038] In an embodiment of this implementation manner, please refer to Figure 1 and Figure 2 , in the first direction, the disassembly and assembly hole 101 is a stepped hole with a gradually increasing diameter, and at least part of the inner wall of the stepped hole is connected to the outer wall of the first contact pin 20. Such a setting is to facilitate the relatively fixed installation and positioning of the first contact pin 20 in the disassembly and assembly hole 101 through friction.

[0039] In an embodiment of this implementation manner, please refer to Figure 1 and Figure 2 , the stepped hole includes a first hole 1011, a second hole 1012, and a third hole 1013 that are sequentially connected in the first direction. The first contact pin 20 includes a first contact portion 23, a connecting portion 24, and a second contact portion 25 that are sequentially connected in the first direction. The outer wall of the first contact portion 23 is connected to the inner wall of the first hole 1011, and / or the outer wall of the connecting portion 24 is connected to the inner wall of the second hole 1012, and the second contact portion 25 is accommodated in the third hole 1013. Specifically, the first end 21 is the end of the first contact portion 23 far from the connecting portion 24, and the second end 22 is the end of the second contact portion 25 far from the connecting portion 24. In this embodiment, the outer wall of the first contact portion 23 is connected to the inner wall of the first hole 1011, and the outer wall of the connecting portion 24 is connected to the inner wall of the second hole 1012. In other embodiments, it can also be set that the outer wall of the first contact portion 23 is connected to the inner wall of the first hole 1011, or the outer wall of the connecting portion 24 is connected to the inner wall of the second hole 1012. Preferably, the first end 21 is used to connect to the signal cable, and the second end 22 is connected to the test product. In this way, under frequent plugging and unplugging of the test product, the first contact pin 20 can still be in the disassembly and assembly hole 101. Through the above settings, it is convenient to be fixed in the disassembly and assembly hole 101 by the interference connection between the first contact portion 23 and / or the connecting portion 24 and the inner wall of the disassembly and assembly hole 101.

[0040] In an embodiment of this implementation manner, please refer to Figure 1 and Figure 2, there is a spacing distance between the outer wall of the second contact portion 25 and the inner wall of the third hole 1013 to facilitate the disassembly and assembly of the first contact pin 20.

[0041] In one embodiment of this embodiment, please refer to Figure 1 and Figure 2 , the radial dimension of the second contact portion 25 is greater than the diameter of the second hole 1012 to limit the second contact portion 25 from entering the second hole 1012 and reduce the risk of the first contact pin 20 being installed too deeply.

[0042] In one embodiment of this embodiment, please refer to Figure 3 , the guided pin test joint 100 includes a second contact pin 30. The housing 10 includes a main body block 15 and a disassembly and assembly block 16. The main body block 15 and the disassembly and assembly block 16 are detachably connected, and an installation hole 102 is defined between the main body block 15 and the disassembly and assembly block 16. The second contact pin 30 is installed in the installation hole 102. One end of the second contact pin 30 in the same direction as the first end 21 protrudes relative to the installation hole 102, and the other end of the second contact pin 30 in the same direction as the second end 22 retracts relative to the installation hole 102. It can be understood that the shape of the contact pins of some pin gauges is relatively special and it is difficult to disassemble and assemble them through the disassembly and assembly hole 101. By providing the detachably connected main body block 15 and the disassembly and assembly block 16, an installation hole 102 for installing the second contact pin 30 is defined between the main body block 15 and the disassembly and assembly block 16, so that the disassembly and assembly of the second contact pin 30 can be realized by disassembling and assembling the main body block 15 and the disassembly and assembly block 16, which is convenient for replacement, thereby improving the applicability of the test.

[0043] In one embodiment of this embodiment, please refer to Figure 3 and Figure 4 , Figure 3 is Figure 1 the three-dimensional structural schematic diagram of the guided pin test joint 100 in a disassembled state; Figure 4 is Figure 1 the three-dimensional structural schematic diagram of the guided pin test joint 100 in a sectional state. The main body block 15 and / or the disassembly and assembly block 16 are provided with a card slot 103. The card slot 103 communicates with the installation hole 102. The card slot 103 is used for partially clamping the second contact pin 30 to limit the axial movement of the second contact pin 30. In this embodiment, both the main body block 15 and the disassembly and assembly block 16 are provided with the card slot 103. In other embodiments, the card slot 103 can also be provided only in one of the main body block 15 and the disassembly and assembly block 16. Through the above settings, the axial movement of the second contact pin 30 can be restricted to ensure the smooth progress of the test.

[0044] In one embodiment of this embodiment, please refer to Figure 3 and Figure 4, the second contact pin 30 includes a first part 31 and a second part 32 that are detachably connected. One end of the first part 31 facing away from the second part 32 protrudes relative to the mounting hole 102, and one end of the second part 32 facing away from the first part 31 retracts relative to the mounting hole 102. With such a setting, the second contact pin 30 has a segmented design, thereby reducing the difficulty of disassembling and assembling the second contact pin 30.

[0045] Specifically, a part of the first part 31 is snap-fitted into the card slot 103, thereby realizing the axial limit of the first part 31. The second part 32 is limited by the mounting hole 102 configured as a stepped hole, thereby realizing the axial limit of the second part 32.

[0046] In an embodiment of this embodiment, please refer to Figure 1 , Figure 2 and Figure 5 , Figure 5 is Figure 1 The perspective three-dimensional structure schematic diagram of the guiding pin header test adapter 100 from another perspective. The housing 10 includes a connected male seat 11 and a female seat 12, and the female seat 12 is provided with a mounting chamber 105. A plurality of first contact pins 20 are all inserted through the male seat 11 and the female seat 12. The first contact pin 20 includes a first end 21 and a second end 22 facing away from each other. The first end 21 extends into the mounting chamber 105, and the mounting chamber 105 is used for a signal cable to extend into and connect with the first end 21. The second end 22 is recessed relative to the male seat 11, and a guiding protrusion 13 is provided on the side surface of the male seat 11. The guiding protrusion 13 is used to guide the test product so that the test product slides relative to the male seat 11 to connect with the second end 22. Specifically, in this embodiment, the test product is a female header, and the test cable is a pin header. Among the plurality of first contact pins 20, there is a spacing distance between any two adjacent first contact pins 20, and the extending directions of the plurality of first contact pins 20 are the same. By providing the guiding protrusion 13 on the side surface of the male seat 11, the guiding protrusion 13 can guide the test product so that the test product slides relative to the male seat 11 to connect with the second end 22 of the first contact pin 20, reducing the risk of the test product being damaged. At the same time, the first end 21 of the first contact pin 20 is connected to the signal cable, so as to facilitate the realization of automated testing, thereby improving the testing efficiency.

[0047] It should be noted that the test product is usually provided with a fixed buckle position and an anti-fooling buckle position. The fixed buckle position is used for clamping and relatively fixing with the cable, and the anti-fooling buckle position is used to cooperate with the anti-fooling structure on the cable to reduce the risk of incorrect installation. Since the specifications and types of the test products are different, the settings of the fixed buckle position and the anti-fooling buckle position on the test products are also different. In order not to let the fixed buckle position and the anti-fooling buckle position affect the test efficiency, it is necessary to avoid them. The guiding pin test joint 100 provided by the present utility model guides the test product through the guiding protrusion 13, that is, the guiding protrusion 13 and the side surfaces (113 and 117) of the male seat 11 are connected to the inner side surface of the housing of the test product for guiding, so as to avoid the fixed buckle position and the anti-fooling buckle position on the housing to ensure the convenience of disassembly and assembly of both.

[0048] In an embodiment of this embodiment, please refer to Figure 1 、 Figure 2 and Figure 5 , the male seat 11 includes a first male seat 111 and a second male seat 112 arranged at intervals. The installation chamber 105 is partitioned to form a first chamber 1051 and a second chamber 1052. Part of the first contact pins 20 are inserted through the first male seat 111 and the female seat 12 and extend into the first chamber 1051, and part of the first contact pins 20 are inserted through the second male seat 112 and the female seat 12 and extend into the second chamber 1052. Specifically, the first contact pins 20 inserted through the first male seat 111 and the female seat 12 and extending into the first chamber 1051 are distributed in two rows, and the second contact pins 30 inserted through the second male seat 112 and the female seat 12 and extending into the second chamber 1052 are also distributed in two rows. With such a setting, different test requirements can be adapted.

[0049] In an embodiment of this embodiment, please refer to Figure 1 、 Figure 2 and Figure 5 , a guiding protrusion 13 is provided on the side of the first male seat 111 facing away from the second male seat 112, and the end face 114 of the first male seat 111 facing away from the female seat 12 is flush with the end face 114 of the guiding protrusion 13 facing away from the female seat 12. With such a setting, it is convenient for the first male seat 111 to guide the test product configured as a female row through the guiding protrusion 13. Specifically, the side surface 113 of the guiding protrusion 13 is used for guiding with the inner wall of the housing of the test product.

[0050] In an embodiment of this embodiment, please refer to Figure 1 、 Figure 2 and Figure 5 , the side surface 113 and the end face 114 of the first male seat 111 and the guiding protrusion 13 are transitioned through a first chamfered surface 115. By providing the first chamfered surface 115, the error tolerance rate of the first contact pins 20 on the first male seat 111 docking with the test product can be improved.

[0051] In an embodiment of this implementation manner, please refer to Figure 1 , Figure 2 and Figure 5 . On one side of the second male socket 112 facing the first male socket 111, a guiding protrusion 13 is provided. The end face 118 of the second male socket 112 facing away from the female socket 12 and the end face 118 of the guiding protrusion 13 facing away from the female socket 12 are flush. With such a setting, it is convenient for the second male socket 112 to guide the test product configured as a female header through the guiding protrusion 13.

[0052] In an embodiment of this implementation manner, please refer to Figure 1 , Figure 2 and Figure 5 . The side surface 117 and the end face 118 of the second male socket 112 and the guiding protrusion 13 are transitioned through a second chamfered surface 119. By providing the second chamfered surface 119, the error tolerance rate of the docking between the first contact pins 20 on the second male socket 112 and the test product can be improved.

[0053] In an embodiment of this implementation manner, please refer to Figure 5 . The number of the guiding protrusions 13 is multiple, and the multiple guiding protrusions 13 are arranged at intervals. Specifically, in this embodiment, the first male socket 111 is provided with one guiding protrusion 13, and the second male socket 112 is provided with two guiding protrusions 13. In other embodiments, the arrangement and the number of the guiding protrusions 13 can also be different, and can be specifically designed according to the test product to be tested. By providing multiple guiding protrusions 13 on the second male socket 112 and arranging the multiple guiding protrusions 13 at intervals, on the one hand, the purpose of avoiding the fixing buckle positions and the anti-fooling buckle positions on the test product can be achieved, and on the other hand, there is sufficient contact area, thereby ensuring the guiding effect.

[0054] Please refer to Figure 1 . This implementation manner of the present utility model further provides a pin test device. The pin test device includes a driving mechanism (not shown) and a guiding type pin test joint 100. The driving mechanism is connected to the guiding type pin test joint 100 to drive the guiding type pin test joint 100 to approach or move away from the test product. Specifically, the guiding type pin test joint 100 is slidably arranged on the base, the driving mechanism is installed on the base, the driving mechanism is configured as a power source such as a motor, a hydraulic cylinder, and a cylinder, and the driving mechanism drives the guiding type pin test joint 100 to slide relative to the base, so as to approach or move away from the test product. By adding the guiding type pin test joint 100 provided by this implementation manner of the present utility model to the pin test device, the pin test device can realize automatic testing, thereby improving the testing efficiency, and at the same time, the risk of the test product being damaged can be reduced. The pin test device can be applied to the testing of test products of different specifications and types, and the applicability of the pin test device is improved.

[0055] The embodiments of the present utility model have been described in detail above in conjunction with the accompanying drawings. However, the present utility model is not limited to the above embodiments, and various changes can be made without departing from the spirit of the present utility model within the scope of knowledge possessed by those of ordinary skill in the relevant art. In addition, the embodiments of the present utility model and the features in the embodiments can be combined with each other without conflict.

Claims

1. A guiding pin test adapter, characterized in that Comprising: A housing, including a male connector and a female connector connected to each other, and an installation chamber is formed in the female connector; A plurality of first contact pins, all of which penetrate through the male connector and the female connector. The first contact pin includes a first end and a second end facing away from each other. The first end extends into the installation chamber, and the installation chamber is for a signal cable to extend into and connect to the first end. The second end is recessed relative to the male connector, and a guiding protrusion is provided on the side surface of the male connector. The guiding protrusion is used to guide a test product so that the test product slides relative to the male connector to connect to the second end.

2. The guiding pin test joint according to claim 1, wherein, The male connector includes a first male connector and a second male connector arranged at intervals. The installation chamber is partitioned into a first chamber and a second chamber. Part of the first contact pins penetrate through the first male connector and the female connector and extend into the first chamber, and part of the first contact pins penetrate through the second male connector and the female connector and extend into the second chamber.

3. The guiding pin test adapter according to claim 2, characterized in that, The guiding protrusion is provided on the side of the first male connector facing away from the second male connector, and the end surface of the first male connector facing away from the female connector is flush with the end surface of the guiding protrusion facing away from the female connector.

4. The guiding pin test adapter according to claim 3, wherein, The side surface and the end surface of the first male connector and the guiding protrusion are transitioned through a first chamfered surface.

5. The guiding pin test adapter according to claim 2, wherein, The guiding protrusion is provided on the side of the second male connector facing the first male connector, and the end surface of the second male connector facing away from the female connector is flush with the end surface of the guiding protrusion facing away from the female connector.

6. The guiding pin test joint according to claim 5, characterized in that, The side surface and the end surface of the second male connector and the guiding protrusion are transitioned through a second chamfered surface.

7. The guiding pin test adapter according to claim 5, wherein The number of the guiding protrusions is multiple, and the multiple guiding protrusions are arranged at intervals.

8. The guiding pin test adapter according to claim 1, wherein, The first contact pin is configured to be detachable from the housing in the direction from the first end towards the second end.

9. The guiding pin test joint according to claim 1, wherein The guided pin test joint includes a second contact pin. The housing includes a main body block and a disassembly and assembly block. The main body block and the disassembly and assembly block are detachably connected, and an installation hole is defined between the main body block and the disassembly and assembly block. The second contact pin is installed in the installation hole. One end of the second contact pin in the same direction as the first end protrudes relative to the installation hole, and the other end of the second contact pin in the same direction as the second end is retracted relative to the installation hole.

10. Pin test device, characterized in that Comprising a driving mechanism and the guided pin test joint according to any one of claims 1 to 9, the driving mechanism is connected to the guided pin test joint to drive the guided pin test joint to approach or move away from the test product.

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