High-frequency phase shifter S parameter test tool

Abstract

The utility model belongs to the technical field of phase shifter testing, and particularly relates to a high-frequency phase shifter S parameter testing tool. The reflecting plate is installed on the support, two testing areas are arranged on the reflecting plate in parallel, reflecting assemblies are further arranged on the reflecting plate, and the reflecting assemblies are located on the two sides of the testing areas; the test cover is connected with the reflecting plate; the multiple positioning mechanisms are installed on the surface, opposite to the reflection assembly, of the reflection plate. The tool can perform S parameter testing on two high-frequency phase shifters at the same time or alternately, so that the testing efficiency is remarkably improved, in addition, the reflection assemblies on the reflection plate are located on the two sides of the testing area, a stable electromagnetic field environment can be formed in the testing process, and the influence of external interference on the testing result is reduced. Meanwhile, due to the design of the test cover, the external environment is further isolated, and the accuracy and reliability of the test result are ensured.

Description

Technical Field

[0001] This application relates to the technical field of phase shifter testing, and particularly to a high-frequency phase shifter S-parameter testing tooling. Background Art

[0002] In high-frequency electronic fields such as wireless communication, radar systems, and satellite communication, the phase shifter, as a key component, its performance directly affects the performance of the entire system. The main function of the phase shifter is to adjust the phase of the signal without changing the signal amplitude. Therefore, it is particularly important to accurately test its S-parameters (scattering parameters) before the overall assembly of the phase shifter. S-parameters are important parameters for measuring the performance of RF devices, including reflection coefficients (such as S11, S22) and transmission coefficients (such as S21, S12), which can comprehensively reflect key performance indicators such as the matching characteristics, transmission characteristics, and isolation of the phase shifter.

[0003] In the related art, during the testing of the existing testing tooling, the signal is prone to divergence, resulting in inaccurate test results.

[0004] It should be noted that the information disclosed in the above background art section is only used to enhance the understanding of the background of the present disclosure, and thus may include information that does not constitute the prior art known to those of ordinary skill in the art. Summary of the Invention

[0005] In view of at least one of the above technical problems, this application provides a high-frequency phase shifter S-parameter testing tooling.

[0006] This application provides a high-frequency phase shifter S-parameter testing tooling, including:

[0007] A bracket;

[0008] A reflector, installed on the bracket, with two testing areas arranged in parallel on the reflector, and a reflection component is also provided on the reflector, which is located on both sides of the testing area;

[0009] A testing cover, connected to the reflector;

[0010] A positioning mechanism, with multiple ones and installed on the surface of the reflector facing away from the reflection component.

[0011] One of the above technical solutions has at least the following advantages or beneficial effects: This tooling can simultaneously or alternately perform S-parameter testing on two high-frequency phase shifters, thereby significantly improving the testing efficiency. In addition, the reflection components on the reflector are located on both sides of the testing area, which helps to form a stable electromagnetic field environment during the testing process and reduce the influence of external interference on the test results. At the same time, the design of the testing cover further isolates the external environment, ensuring the accuracy and reliability of the test results.

[0012] In some alternative implementation manners, the edge of the test cover is bent to form a folding block, and a connecting component is arranged between the folding block and the reflector.

[0013] In some alternative implementation manners, the connecting component includes a horizontal plate and connecting leaves. The horizontal plate is connected to the folding block and extends along the length direction of the reflector. There are multiple connecting leaves. One end of each connecting leaf is connected to the horizontal plate, and the other end of each connecting leaf is connected to the reflector.

[0014] In some alternative implementation manners, the number of the connecting leaves is four.

[0015] In some alternative implementation manners, an avoidance groove is formed in the edge of the test cover, and an extension block is arranged on the edge of the reflector. The extension block penetrates through the avoidance groove and is connected to the bracket.

[0016] In some alternative implementation manners, a plurality of positioning posts are arranged on the reflector and are located in the test area.

[0017] In some alternative implementation manners, a cable fixing clamp is arranged on the reflector.

[0018] In some alternative implementation manners, the positioning mechanism includes an installation post and a positioning plate. There are four installation posts which are installed on the surface of the reflector facing away from the reflection component. The positioning plate is sleeved on the installation post, and a positioning groove is formed in the positioning plate.

[0019] In some alternative implementation manners, an absorbing material is arranged on the bracket.

[0020] The present application will be further described below in conjunction with the accompanying drawings and embodiments. Description of the Drawings

[0021] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the following will briefly introduce the drawings required to be used in the embodiments or the prior art. Obviously, the following described drawings are only some embodiments of the present application. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0022] Figure 1 It is a schematic structural diagram of a high-frequency phase shifter S-parameter test tooling provided by an embodiment of the present application;

[0023] Figure 2 It is a side view of a high-frequency phase shifter S-parameter test tooling provided by an embodiment of the present application;

[0024] In the figure: 100, bracket; 110, absorbing material;

[0025] 200, Reflector; 210, Test Area; 220, Reflection Component; 230, Extension Block; 240, Positioning Post; 250, Cable Fixing Fixture;

[0026] 300, Test Cover; 310, Folding Block; 320, Connection Component; 330, Avoidance Groove; 321, Horizontal Plate; 322, Connection Leaf;

[0027] 400, Positioning Mechanism; 410, Mounting Post; 420, Positioning Plate; Detailed Embodiment

[0028] To make the above objects, features, and advantages of the present application more apparent and understandable, the following will describe in detail the specific embodiments of the present application with reference to the accompanying drawings. Many specific details are set forth in the following description to facilitate a thorough understanding of the present application. However, the present application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar improvements without departing from the connotation of the present application. Therefore, the present application is not limited by the specific embodiments disclosed below.

[0029] As Figure 1 shown, this embodiment provides a high-frequency phase shifter S-parameter test tooling, including: a bracket 100, a reflector 200, a test cover 300, and a positioning mechanism 400.

[0030] The following introduces the specific structure of the high-frequency phase shifter S-parameter test tooling.

[0031] Bracket 100; Reflector 200, installed on the bracket 100, with two test areas 210 arranged in parallel on the reflector 200, and a reflection component 220 is also provided on the reflector 200, and the reflection component 220 is located on both sides of the test area 210; Test cover 300, connected to the reflector 200; Positioning mechanism 400, having multiple and installed on the surface of the reflector 200 facing away from the reflection component 220.

[0032] In this embodiment, the reflection component 220 may include: reflection baffles symmetrically arranged on both sides of the test area 210, for reducing signal energy emission.

[0033] During use, only need to place the phase shifter in the test area 210, that is, between the reflection components 220, and then the test can start.

[0034] This tooling can simultaneously or alternately perform S-parameter tests on two high-frequency phase shifters, thus significantly improving the test efficiency. In addition, the reflection components 220 on the reflector 200 are located on both sides of the test area 210, which helps to form a stable electromagnetic field environment during the test and reduces the influence of external interference on the test results. At the same time, the design of the test cover 300 further isolates the external environment, ensuring the accuracy and reliability of the test results.

[0035] As Figure 1 shown, in some embodiments, the edge of the test cover 300 is bent to form a folding block 310, and a connecting component 320 is provided between the folding block 310 and the reflector 200.

[0036] Specifically, the connecting component 320 may include: a transverse plate 321 and connecting leaves 322. The transverse plate 321 is connected to the folding block 310 and extends along the length direction of the reflector 200. There are multiple connecting leaves 322. One end of each connecting leaf 322 is connected to the transverse plate 321, and the other end of each connecting leaf 322 is connected to the reflector 200. The number of connecting leaves 322 is four.

[0037] In this way, through the transverse plate 321 and the connecting leaves 322, a stable connection between the test cover 300 and the reflector 200 is achieved.

[0038] As Figure 1 shown, in some embodiments, an avoidance groove 330 is provided at the edge of the test cover 300, and an extension block 230 is provided at the edge of the reflector 200. The extension block 230 passes through the avoidance groove 330 and is connected to the bracket 100.

[0039] In this way, by providing the avoidance groove 330 for the extension block 230 of the reflector 200 to pass through, the reflector 200 is installed on the bracket 100, realizing the connection between the reflector 200 and the bracket 100.

[0040] As Figure 1 shown, in some embodiments, a plurality of positioning posts 240 are provided on the reflector 200, and the positioning posts 240 are located in the test area 210. In this way, the phase shifter can be positioned through the positioning posts 240.

[0041] As Figure 1 shown, in some embodiments, a cable fixing clamp 250 is provided on the reflector 200. In this way, the cable fixing clamp 250 can prevent the cables on the tooling table from being messy, which is beneficial to the orderly progress of the test.

[0042] As Figure 1 shown, in some embodiments, the positioning mechanism 400 includes: mounting posts 410 and a positioning plate 420. There are four mounting posts 410 and they are installed on the surface of the reflector 200 facing away from the reflection component 220. The positioning plate 420 is sleeved on the mounting posts 410, and the positioning plate 420 is provided with a positioning groove.

[0043] The positioning mechanism 400 is installed on the surface of the reflector 200 facing away from the reflection assembly 220, and is used to accurately fix the high-frequency phase shifter to be measured, which ensures the stable position of the high-frequency phase shifter during the test, avoids test errors caused by position deviation, and improves the test accuracy and repeatability. In this embodiment, the positioning plate 420 is located directly below the test area 210. In this way, when the phase shifter is placed in the test area 210, the oscillator of the phase shifter passes through the reflector 200 and is placed in the positioning groove, thereby achieving positioning.

[0044] As Figure 1 shown, in some embodiments, an absorbing material 110 is provided on the bracket 100. The absorbing material 110 can be an alloy absorbing material component, a carbon fiber absorbing material component, a magnetic material absorbing material component, a porous material absorbing material component, and a coating absorbing material component, but is not limited thereto.

[0045] In the description of the present application, it should be understood that the orientation or positional relationship indicated by the terms "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc. is based on the orientation or positional relationship shown in the drawings, and is only for the convenience of describing the present application and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be construed as a limitation to the present application.

[0046] In the description of the present application, unless otherwise clearly specified and limited, the first feature being "on" or "under" the second feature may be that the first and second features are in direct contact, or the first and second features are indirectly in contact through an intermediate medium. Moreover, the first feature being "above", "over" and "on" the second feature may be that the first feature is directly above or obliquely above the second feature, or merely indicates that the first feature has a higher horizontal height than the second feature. The first feature being "under", "below" and "beneath" the second feature may be that the first feature is directly below or obliquely below the second feature, or merely indicates that the first feature has a lower horizontal height than the second feature.

[0047] It should be noted that if an element is referred to as being "fixed to" or "disposed on" another element, it can be directly on the other element or there may also be an intermediate element. If an element is considered to be "connected" to another element, it can be directly connected to the other element or there may be an intermediate element at the same time. If so, the terms "vertical", "horizontal", "upper", "lower", "left", "right" and similar expressions used in the present application are only for the purpose of illustration and do not represent the only implementation manner.

[0048] In the description of the present application, it should be understood that the terms "first" and "second" are only used for descriptive purposes and cannot be construed as indicating or implying relative importance or implicitly specifying the quantity of the indicated technical features. Thus, features defined with "first" and "second" may explicitly or implicitly include at least one of such features. In the description of the present application, the meaning of "a plurality" is at least two, such as two, three, etc., unless otherwise specifically defined.

[0049] In the embodiments of the present application, unless otherwise clearly specified and limited, terms such as "mounted", "connected", "coupled", "fixed", etc. shall be construed in a broad sense. For example, it may be a fixed connection, a detachable connection, or integrated; it may be a mechanical connection or an electrical connection; it may be directly connected or indirectly connected through an intermediate medium, and it may be the communication inside two components or the interaction relationship between two components. For those of ordinary skill in the art, the specific meanings of the above terms in the embodiments of the present application can be understood according to specific circumstances.

[0050] The above are only the preferred embodiments of the present application and do not impose any formal limitations on the present application. Any person skilled in the art can make many possible changes and modifications to the technical solution of the present application, or modify it into an equivalent embodiment with equivalent changes, without departing from the scope of the technical solution of the present application. Therefore, all equivalent changes made according to the shape, structure, and principle of the present application without departing from the content of the technical solution of the present application shall be covered by the protection scope of the present application.

Claims

1. A test tool for S-parameters of a high-frequency phase shifter, characterized in that Comprising: A bracket; A reflector, installed on the bracket, two test areas are arranged in parallel on the reflector, and a reflection component is also arranged on the reflector, and the reflection component is located on both sides of the test area; A test cover, connected to the reflector; A positioning mechanism, there are multiple of them and installed on the surface of the reflector facing away from the reflection component.

2. The S-parameter test tooling for the high-frequency phase shifter according to claim 1, wherein The edge of the test cover is bent to form a folding block, and a connection component is arranged between the folding block and the reflector.

3. The S-parameter test tooling for the high-frequency phase shifter according to claim 2, characterized in that The connection component includes: a cross plate and connection leaves, the cross plate is connected to the folding block, the cross plate extends along the length direction of the reflector, there are multiple connection leaves, one end of the connection leaf is connected to the cross plate, and the other end of the connection leaf is connected to the reflector.

4. The high-frequency phase shifter S-parameter test tooling according to claim 3, characterized in that The number of the connection leaves is four.

5. The S-parameter test tooling for the high-frequency phase shifter according to claim 1, characterized in that, An avoidance groove is opened at the edge of the test cover, an extension block is arranged at the edge of the reflector, and the extension block passes through the avoidance groove and is connected to the bracket.

6. The S-parameter test tooling for the high-frequency phase shifter according to claim 1, characterized in that, A plurality of positioning posts are arranged on the reflector, and the positioning posts are located in the test area.

7. The S-parameter test tooling for the high-frequency phase shifter according to claim 1, wherein A cable fixing clamp is arranged on the reflector.

8. The high-frequency phase shifter S-parameter test tooling according to claim 1, wherein The positioning mechanism includes: mounting posts and a positioning plate, there are four mounting posts and they are installed on the surface of the reflector facing away from the reflection component, the positioning plate is sleeved on the mounting posts, and the positioning plate is provided with a positioning groove.

9. The S-parameter test tooling for the high-frequency phase shifter according to claim 1, characterized in that, Absorbing material is arranged on the bracket.

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